TWI416178B - Inspection device and operation method thereof - Google Patents

Inspection device and operation method thereof Download PDF

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Publication number
TWI416178B
TWI416178B TW97151856A TW97151856A TWI416178B TW I416178 B TWI416178 B TW I416178B TW 97151856 A TW97151856 A TW 97151856A TW 97151856 A TW97151856 A TW 97151856A TW I416178 B TWI416178 B TW I416178B
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optical film
film
platform
groove
roll
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TW97151856A
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Chinese (zh)
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TW201024816A (en
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Jian Hung Wu
Ya Chieh Chuang
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Benq Materials Corp
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Abstract

An inspection device and an operation method thereof are provided. The inspection device is used for analyzing an optical film. The inspection device includes a light source, an analyzer, a platform, a roller and two first rollers. The light source is used for emitting a light to one measuring point of the optical film. The analyzer is used for receiving and analyzing the light which passes through the optical film. The platform has a penetrating hole and the light is passed through the penetrating hole. The roller has a slot. One edge of the optical film is fixed on the slot and the edge of the optical film leans on a bottom of the slot. The roller is used for rolling up the optical film so that the measuring point is located between the penetrating hole and the light source. The optical film is driven between the first rollers.

Description

檢測裝置及其操作方法Detection device and operation method thereof

本發明是有關於一種檢測裝置及其操作方法，且特別是有關於一種光學膜之檢測裝置及其操作方法。The present invention relates to a detecting device and a method of operating the same, and more particularly to an optical film detecting device and a method of operating the same.

光學膜，例如是偏光膜，其具有光學方向性。偏光膜的光學方向一般稱為光軸，光軸的精度對偏光膜的影響很大。因此，若精度差異太大，會導致偏光膜直交時產生漏光。所以偏光膜製造廠商為了控管品質，會對整捲偏光膜進行光學方向性之取樣檢查。The optical film is, for example, a polarizing film which has optical directivity. The optical direction of the polarizing film is generally referred to as an optical axis, and the accuracy of the optical axis greatly affects the polarizing film. Therefore, if the difference in accuracy is too large, light leakage may occur when the polarizing film is orthogonal. Therefore, in order to control the quality of the polarizing film manufacturer, the optical orientation of the entire roll of polarizing film is sampled and inspected.

請參照第1A圖~第1C圖，其繪示習知偏光膜檢測裝置之示意圖。如第1A圖所示，沿著橫向裁切線102裁切偏光膜100，以取得裁切偏光膜110。橫向裁切線102係垂直於偏光膜100之幅寬基準邊106。然後，如第1B圖所示，橫向基準邊112為沿著橫向裁切線102所裁切出的邊。而沿著取樣裁切線108可裁切出多片取樣膜104。如第1C圖所示，將取樣膜104放置於平台114上，並將橫向基準邊112與對準片118對準，然後，就可以利用光源120發射一光線L通過取樣膜104及貫穿孔116，至分析器122。分析器122在接收到光線L後，再進行光學分析，例如是光軸方向性之分析。Please refer to FIG. 1A to FIG. 1C for a schematic diagram of a conventional polarizing film detecting device. As shown in FIG. 1A, the polarizing film 100 is cut along the lateral cutting line 102 to obtain the cut polarizing film 110. The transverse cutting line 102 is perpendicular to the width reference edge 106 of the polarizing film 100. Then, as shown in FIG. 1B, the lateral reference edge 112 is the edge cut along the transverse cutting line 102. A plurality of sampling films 104 can be cut along the sampling cut line 108. As shown in FIG. 1C, the sampling film 104 is placed on the stage 114, and the lateral reference edge 112 is aligned with the alignment sheet 118. Then, the light source 120 can be used to emit a light L through the sampling film 104 and the through hole 116. , to the analyzer 122. After receiving the light L, the analyzer 122 performs optical analysis, for example, analysis of the optical axis directivity.

然而，取樣膜104之產生多以人為裁切完成，所裁切出的取樣膜104會因為操作熟練度而異，使得橫向裁切線 102(繪示於第1A圖)不一定垂直於幅寬基準邊106，如此，會影響檢測結果之正確性。此外，將取樣膜104與對準片118對準的動作也容易因人為熟練度而發生偏差。如此，將影響光學方向性之判讀。此外，每一個量測點都要裁切出一取樣膜104，使得裁切偏光膜的次數及定位偏光膜的次數太多，整個檢測過程變得較繁雜。However, the generation of the sampling film 104 is mostly done by human cutting, and the cut sampling film 104 may vary depending on the operational proficiency, so that the transverse cutting line 102 (shown in Figure 1A) is not necessarily perpendicular to the width reference edge 106, thus affecting the correctness of the test results. Further, the operation of aligning the sampling film 104 with the alignment sheet 118 is also likely to be deviated due to human skill. In this way, the interpretation of the optical directivity will be affected. In addition, a sampling film 104 is cut out at each measuring point, so that the number of times of cutting the polarizing film and the number of times the polarizing film is positioned are too large, and the entire detecting process becomes complicated.

本發明係有關於一種檢測裝置及其操作方法，藉由捲動之方式，捲動光學膜，例如是偏光膜，使其上之量測點移動至光源與貫穿孔之間。如此，不但使量測過程變得快速、便利，也省去許多量測的前置作業，例如裁切動作及對準動作。The invention relates to a detecting device and an operating method thereof. By rolling, an optical film, such as a polarizing film, is moved, and the measuring point thereon is moved between the light source and the through hole. In this way, not only the measurement process is made quick and convenient, but also many measurement pre-operations, such as cutting action and alignment action, are omitted.

根據本發明之一方面，提出一種檢測裝置。檢測裝置用以分析一光學膜。檢測裝置包括一光源、一分析器、一平台、一捲膜滾輪及二第一滾輪。光源用以發射一光線至光學膜之一量測點。分析器用以接收並分析通過光學膜之光線。平台位於光學膜與分析器之間且實質上平行光學膜，平台具有一貫穿孔，用以讓通過光學膜之光線通過。捲膜滾輪具有一溝槽，設置於捲膜滾輪上，光學膜之一邊固定於溝槽且此邊係抵靠於溝槽之一槽底，捲膜滾輪用以捲動光學膜，使其上之量測點移動至貫穿孔與光源之間。光學膜係被傳動於第一滾輪之間。According to an aspect of the invention, a detection device is proposed. The detecting device is for analyzing an optical film. The detecting device comprises a light source, an analyzer, a platform, a roll of film rolls and two first rollers. The light source is used to emit a light to a measuring point of the optical film. The analyzer is used to receive and analyze the light passing through the optical film. The platform is located between the optical film and the analyzer and is substantially parallel to the optical film, the platform having a consistent perforation for the passage of light through the optical film. The roll film roller has a groove disposed on the roll of the film roll, one side of the optical film is fixed on the groove and the edge is abutted against a groove bottom of the groove, and the roll film roll is used to roll the optical film to make it The measuring point moves between the through hole and the light source. The optical film system is driven between the first rollers.

根據本發明之另一方面，提出一種檢測裝置之操作方 法。操作方法用以分析一光學膜。操作方法包括以下步驟。捲動一光學膜，使其上之一第一量測點移動至一平台之一貫穿孔與一光源之間；發射一光線至光學膜，光線通過光學膜及貫穿孔；接收並分析通過光學膜及貫穿孔之光線。According to another aspect of the present invention, an operator of a detecting device is proposed law. The method of operation is used to analyze an optical film. The method of operation includes the following steps. Rolling an optical film such that a first measuring point thereof is moved between a through hole of a platform and a light source; a light is emitted to the optical film, the light passes through the optical film and the through hole; and the optical film is received and analyzed through the optical film And the light through the hole.

為讓本發明之上述內容能更明顯易懂，下文特舉較佳實施例，並配合所附圖式，作詳細說明如下：In order to make the above-mentioned contents of the present invention more comprehensible, the preferred embodiments are described below, and the detailed description is as follows:

請參照第2圖，其繪示依照本發明較佳實施例之檢測裝置示意圖。檢測裝置200用以分析一光學膜，例如是一偏光膜202。檢測裝置200包括一光源204、一分析器206、一平台208、一捲膜滾輪210、二個第一滾輪212及一第二滾輪214。偏光膜202被傳動於第一滾輪212之間及捲膜滾輪210與第二滾輪214之間，第二滾輪214抵靠捲膜滾輪210，而捲膜滾輪210用以捲動偏光膜202，使其上之一量測點，例如是第一量測點P1及第二量測點P2移動至貫穿孔216與光源204之間。Please refer to FIG. 2, which is a schematic diagram of a detecting device according to a preferred embodiment of the present invention. The detecting device 200 is configured to analyze an optical film, such as a polarizing film 202. The detecting device 200 includes a light source 204, an analyzer 206, a platform 208, a film roll 210, two first rollers 212, and a second roller 214. The polarizing film 202 is driven between the first roller 212 and between the film roll 210 and the second roller 214. The second roller 214 abuts the film roll 210, and the roll film 210 is used to roll the polarizing film 202. One of the measurement points, for example, the first measurement point P1 and the second measurement point P2 are moved between the through hole 216 and the light source 204.

光源204用以發射一光線L(未繪示於第2圖)至偏光膜202之一量測點。分析器206用以接收並分析通過偏光膜202之光線。The light source 204 is configured to emit a light L (not shown in FIG. 2) to a measuring point of the polarizing film 202. The analyzer 206 is configured to receive and analyze light rays that pass through the polarizing film 202.

平台208位於偏光膜202與分析器206之間且實質上平行偏光膜202。平台208具有一貫穿孔216，用以讓通過偏光膜202之光線通過。The platform 208 is located between the polarizing film 202 and the analyzer 206 and substantially parallel to the polarizing film 202. The platform 208 has a uniform aperture 216 for passing light through the polarizing film 202.

請參照第3圖，其繪示裁切出第2圖之偏光膜之示意圖。沿著橫向裁切線230裁切整捲偏光膜232，以取得第2圖之偏光膜202。其中，整捲偏光膜232之一邊，例如是幅寬基準邊220係平行於整捲偏光膜232之製程方向。另外，本實施例之橫向裁切線230不一定要垂直幅寬基準邊220。也就是說，檢測員隨意於整捲偏光膜232上劃兩刀所取得的偏光膜202就能作為檢測用的偏光膜。Please refer to FIG. 3, which is a schematic view showing the polarizing film of FIG. The entire roll of polarizing film 232 is cut along the lateral cutting line 230 to obtain the polarizing film 202 of FIG. Wherein, one side of the whole roll of polarizing film 232, for example, the width reference datum 220 is parallel to the process direction of the entire roll of polarizing film 232. In addition, the transverse cutting line 230 of the present embodiment does not have to be perpendicular to the width reference edge 220. That is to say, the polarizing film 202 obtained by the inspector randomly arranging the two rolls on the entire roll of the polarizing film 232 can be used as a polarizing film for detection.

請參照第4A圖及第4B圖，第4A圖繪示第3圖之偏光膜固定於捲膜滾輪之示意圖，第4B圖繪示第4A圖中沿著方向V1觀看捲膜滾輪之示意圖。如第4A圖所示，捲膜滾輪210具有一溝槽218。檢測裝置200更包括一固膜元件222，設置於溝槽218內。固膜元件222為一磁性元件，例如是一鐵金屬。如第4B圖所示，偏光膜202之幅寬基準邊220係抵靠於溝槽218之一槽底224，且捲膜滾輪210更包括一固定元件226，例如是一磁鐵，其設置於溝槽218之一槽面228，而槽面228實質上垂直於槽底224。如此，藉由固膜元件222與固定元件226間的磁吸力，偏光膜202係被壓合於固定元件226與固膜元件222之間而不致脫落。Please refer to FIG. 4A and FIG. 4B. FIG. 4A is a schematic view showing the polarizing film of FIG. 3 fixed to the roll film roller, and FIG. 4B is a schematic view of the roll film roll viewed along the direction V1 in FIG. 4A. As shown in FIG. 4A, the film roll 210 has a groove 218. The detecting device 200 further includes a solid film member 222 disposed in the trench 218. The solid film member 222 is a magnetic member such as an iron metal. As shown in FIG. 4B, the width reference datum 220 of the polarizing film 202 abuts against the groove bottom 224 of the groove 218, and the roll film roller 210 further includes a fixing member 226, such as a magnet, which is disposed in the groove. One of the grooves 218 has a groove surface 228, and the groove surface 228 is substantially perpendicular to the groove bottom 224. Thus, by the magnetic attraction between the solid film member 222 and the fixing member 226, the polarizing film 202 is pressed between the fixing member 226 and the solid film member 222 without falling off.

此外，於另一實施例中，固定元件226也可以是一磁性元件，而固膜元件222也可以是一磁鐵。In addition, in another embodiment, the fixing component 226 can also be a magnetic component, and the solid film component 222 can also be a magnet.

此外，也可以使用磁吸力以外的方式來固定偏光膜202。例如，固膜元件222之寬度實質上等於或略大於溝槽218之槽寬，使固膜元件222緊配於溝槽218內，以將 偏光膜202固定於溝槽218內。Further, the polarizing film 202 may be fixed by means other than magnetic attraction. For example, the width of the solid-film element 222 is substantially equal to or slightly larger than the groove width of the groove 218, so that the solid-film element 222 fits within the groove 218 to The polarizing film 202 is fixed in the trench 218.

以下將介紹檢測偏光膜202之光學特性的步驟。請參照第5圖，其繪示依照本發明之較佳實施例之檢測裝置之操作流程圖。首先，如第3圖所示，於步驟S502中，裁切出偏光膜202。The step of detecting the optical characteristics of the polarizing film 202 will be described below. Please refer to FIG. 5, which is a flow chart showing the operation of the detecting apparatus according to the preferred embodiment of the present invention. First, as shown in FIG. 3, in step S502, the polarizing film 202 is cut out.

接著，如第4B圖所示，於步驟S504中，將偏光膜202之幅寬基準邊220固定於捲膜滾輪210之溝槽218內，並且，偏光膜202之幅寬基準邊220完全地抵靠於溝槽218之槽底224，以作為偏光膜202上之光軸方向的參考基準。Next, as shown in FIG. 4B, in step S504, the width reference side 220 of the polarizing film 202 is fixed in the groove 218 of the film roll 210, and the width reference side 220 of the polarizing film 202 is completely abutted. The groove bottom 224 of the groove 218 is used as a reference for the optical axis direction on the polarizing film 202.

再來，如第2圖所示，於步驟S506中，將偏光膜202設置於二個第一滾輪212之間。之後，捲膜滾輪210往方向D1捲動偏光膜202，使其上的量測點，例如是第一量測點P1移動至平台208的貫穿孔216與光源204之間。Further, as shown in FIG. 2, in step S506, the polarizing film 202 is disposed between the two first rollers 212. Thereafter, the film roll 210 rolls the polarizing film 202 in the direction D1, and the measurement point thereon, for example, the first measurement point P1 is moved between the through hole 216 of the stage 208 and the light source 204.

而捲膜滾輪210之材質、第一滾輪212之材質及第二滾輪214之材質為丁晴橡膠(NBR)、海綿(sponge)、PU橡膠或矽化物，其皆屬軟質材料。如此，在捲動偏光膜202時，對偏光膜202不會產生傷害，例如是擦傷、磨傷。The material of the film roll 210, the material of the first roller 212, and the material of the second roller 214 are NBR, sponge, PU rubber or bismuth, which are all soft materials. As described above, when the polarizing film 202 is rolled, no damage is caused to the polarizing film 202, such as scratches or abrasions.

然後，請同時參照第6圖，其繪示第2圖之偏光膜抵靠於平台之示意圖。於步驟S508中，往平台208之方向，即方向D2，移動偏光膜202，以使偏光膜202抵靠於平台208。偏光膜202抵靠於平台208可以使偏光膜202之膜面與平台208之接觸面積最大，此有助於檢測結果之準確性。Then, please refer to FIG. 6 at the same time, which shows a schematic view of the polarizing film of FIG. 2 abutting against the platform. In step S508, the polarizing film 202 is moved in the direction of the platform 208, that is, the direction D2, so that the polarizing film 202 abuts against the platform 208. The polarizing film 202 abuts against the platform 208 to maximize the contact area between the film surface of the polarizing film 202 and the platform 208, which contributes to the accuracy of the detection result.

然後，請再參照第6圖，於步驟S510中，發射一光 線L至偏光膜202，光線L通過偏光膜202及貫穿孔216。Then, referring to FIG. 6 again, in step S510, a light is emitted. The line L is directed to the polarizing film 202, and the light L passes through the polarizing film 202 and the through hole 216.

然後，請再參照第6圖，於步驟S512中，分析器206接收並分析通過偏光膜202及貫穿孔216之光線。至此，完成對偏光膜202量測點，例如是第一量測點P1之光學性檢測。Then, referring again to FIG. 6, in step S512, the analyzer 206 receives and analyzes the light passing through the polarizing film 202 and the through hole 216. So far, the measurement point of the polarizing film 202 is completed, for example, the optical detection of the first measuring point P1.

當然，本實施例之操作方法不只可以量測一個量測點。於步驟S514中，判斷是否有下一個量測點，例如還有第二量測點P2，則進入步驟S516。以下將繼續介紹檢測第二量測點P2之步驟。Of course, the operation method of this embodiment can not only measure one measurement point. In step S514, it is determined whether there is a next measurement point, for example, there is also a second measurement point P2, and the process proceeds to step S516. The steps of detecting the second measurement point P2 will be continued below.

請同時參照第7圖，其繪示第6圖之偏光膜脫離平台之示意圖。於步驟S516中，往遠離平台208之一方向D3，移動偏光膜202，以使偏光膜202脫離平台208。Please refer to FIG. 7 at the same time, which shows a schematic diagram of the polarizing film of FIG. 6 coming off the platform. In step S516, the polarizing film 202 is moved away from the platform D in one direction D3 to move the polarizing film 202 away from the platform 208.

然後，請同時參照第8圖，其繪示第2圖之下一個量測點位於貫穿孔216與光源204之間之示意圖。於步驟S518中，捲膜滾輪210往方向D1捲動偏光膜202，使下一個量測點，例如是偏光膜202上之第二量測點P2移動至平台208之貫穿孔216與光源204之間。由於步驟S516中已使偏光膜202脫離平台208，所以在步驟S518中之捲動偏光膜202的過程中，偏光膜202便不會與平台208互相接觸而造成偏光膜202的磨傷。因為若偏光膜202受到破壞，則會影響到檢測結果的正確性，而本實施例之檢測方式，係充分地保護到偏光膜202。Then, please refer to FIG. 8 at the same time, which shows a schematic diagram of a measurement point located between the through hole 216 and the light source 204 in FIG. 2 . In step S518, the film roll 210 rolls the polarizing film 202 in the direction D1, so that the next measuring point, for example, the second measuring point P2 on the polarizing film 202, moves to the through hole 216 of the platform 208 and the light source 204. between. Since the polarizing film 202 has been detached from the stage 208 in step S516, the polarizing film 202 does not contact the platform 208 during the rolling of the polarizing film 202 in step S518, causing the polarizing film 202 to be worn. If the polarizing film 202 is damaged, the correctness of the detection result is affected, and the detection mode of the embodiment is sufficiently protected to the polarizing film 202.

然後，於步驟S518之後，依序進入步驟S508~步驟S512，以對第二量測點P2進行檢測。Then, after step S518, steps S508 to S512 are sequentially performed to detect the second measurement point P2.

若是還有下一個量測點，例如是第三量測點P3(未繪示)、第四量測點P4(未繪示)等，則於步驟S514之後，依序重複步驟S516、S518、S508、S510及S512，直到所有的量測點被檢測完成。If there is a next measurement point, for example, a third measurement point P3 (not shown), a fourth measurement point P4 (not shown), etc., after step S514, steps S516, S518 are sequentially repeated. S508, S510 and S512 until all the measurement points are detected.

如第1B圖所示，於習知檢測技術中，每一個量測點都需要裁切出一取樣膜104，然後於下一次的量測時都必須更換上新的取樣膜，因此使量測過程顯得相當耗時。反觀本實施例之檢測裝置及其操作方法，只要捲動捲膜滾輪210，就能把下一個量測點捲動至光源204與貫穿孔216之間。如此，省去了許多更換偏光膜的動作，即省去許多取下偏光膜與定位偏光膜的動作，因此也減少了因人為因素所造成的檢測誤差。As shown in FIG. 1B, in the conventional detection technique, each sampling point needs to be cut out of a sampling film 104, and then a new sampling film must be replaced in the next measurement, thereby making measurement. The process is quite time consuming. In contrast, the detecting device and the operating method of the embodiment can scroll the next measuring point between the light source 204 and the through hole 216 as long as the film roll 210 is rolled. In this way, many actions of replacing the polarizing film are omitted, that is, many actions of removing the polarizing film and positioning the polarizing film are omitted, thereby reducing the detection error caused by human factors.

此外，本實施例之檢測裝置及其操作方法，只需要進行為了取得偏光膜202所進行之第一次的裁切動作。因此，也減少了因為人為因素所造成的檢測問題。Further, in the detecting device and the operating method of the present embodiment, it is only necessary to perform the first cutting operation for obtaining the polarizing film 202. Therefore, the detection problem caused by human factors is also reduced.

雖然，於步驟S508中，使偏光膜202與平台互相抵靠的方式是藉由移動偏光膜202之方式達成。然於其它實施例中，也可以往偏光膜202之方向來移動平台208，以使偏光膜202與平台208互相抵靠。Although, in step S508, the manner in which the polarizing film 202 and the stage abut each other is achieved by moving the polarizing film 202. In other embodiments, the platform 208 can also be moved in the direction of the polarizing film 202 such that the polarizing film 202 and the platform 208 abut each other.

雖然，於步驟S516中，使偏光膜202與平台互相分離的方式是藉由移動偏光膜202達成。然於其它實施例中，也可以是往遠離偏光膜202之方向來移動平台208，以使偏光膜202脫離平台208。Although the manner in which the polarizing film 202 and the stage are separated from each other in step S516 is achieved by moving the polarizing film 202. In other embodiments, the platform 208 may also be moved away from the polarizing film 202 to disengage the polarizing film 202 from the platform 208.

當然，此技術領域中具有通常知識者應明瞭，本實施 例之光學膜的種類並不侷限於偏光膜，凡是檢測方式需要應用到光學檢測的光學膜皆可應用本實施例之檢測裝置來執行其光學特性的檢測。Of course, those of ordinary skill in the art should understand that this implementation The type of the optical film is not limited to the polarizing film, and the detecting device of the present embodiment can be applied to perform the detection of the optical characteristics of any of the optical films to which the detecting method is applied to the optical detecting.

本發明上述實施例所揭露之檢測裝置及其操作方法，具有多項優點，以下僅列舉部分優點說明如下：The detecting device and the operating method thereof disclosed in the above embodiments of the present invention have a plurality of advantages, and only some of the advantages listed below are as follows:

(1).光學膜，例如是偏光膜，其被裁切的次數愈少，因人為裁切熟練度所造成的檢測差異也就愈少。而上述實施例對光學膜之裁切動作只有一次，即裁切出光學膜之裁切動作，所以可以把檢測差異性降至最低。(1) The optical film, for example, a polarizing film, the less the number of times it is cut, and the less the difference in detection due to the artificial cutting proficiency. In the above embodiment, the cutting action of the optical film is only one time, that is, the cutting action of the optical film is cut, so that the detection difference can be minimized.

(2).定位光學膜，例如是偏光膜202之動作只有一次，減少因人為裁切熟練度所造成的檢測差異。(2) Positioning the optical film, for example, the action of the polarizing film 202 is only once, reducing the detection difference caused by the artificial cutting proficiency.

(3).藉由捲動光學膜的方式就能輕易地變換至下一個量測點，而不用透過取下光學膜與定位光學膜的繁複動作，因此使整個檢測過程變得相當簡便且快速。(3). By rolling the optical film, it is easy to change to the next measuring point without removing the complicated action of removing the optical film and positioning the optical film, thereby making the whole detection process relatively simple and fast. .

綜上所述，雖然本發明已以較佳實施例揭露如上，然其並非用以限定本發明。本發明所屬技術領域中具有通常知識者，在不脫離本發明之精神和範圍內，當可作各種之更動與潤飾。因此，本發明之保護範圍當視後附之申請專利範圍所界定者為準。In conclusion, the present invention has been disclosed in the above preferred embodiments, and is not intended to limit the present invention. A person skilled in the art can make various changes and modifications without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

100、202‧‧‧偏光膜100, 202‧‧‧ polarizing film

102、230‧‧‧橫向裁切線102, 230‧‧‧ transverse cutting line

104‧‧‧取樣膜104‧‧‧Sampling membrane

106、220‧‧‧幅寬基準邊106, 220‧‧ ‧ wide reference edge

108‧‧‧取樣裁切線108‧‧‧Sampling cutting line

110‧‧‧裁切偏光膜110‧‧‧cut polarizing film

112‧‧‧橫向基準邊112‧‧‧ horizontal reference edge

114、208‧‧‧平台114, 208‧‧‧ platform

116、216‧‧‧貫穿孔116, 216‧‧‧through holes

118‧‧‧對準片118‧‧‧Alignment film

120、204‧‧‧光源120, 204‧‧‧ light source

122、206‧‧‧分析器122, 206‧‧‧ analyzer

200‧‧‧檢測裝置200‧‧‧Detection device

210‧‧‧捲膜滾輪210‧‧‧roller roller

212‧‧‧第一滾輪212‧‧‧First wheel

214‧‧‧第二滾輪214‧‧‧Second wheel

218‧‧‧溝槽218‧‧‧ trench

222‧‧‧固膜元件222‧‧‧Solid film components

224‧‧‧槽底224‧‧‧ bottom

226‧‧‧固定元件226‧‧‧Fixed components

228‧‧‧槽面228‧‧‧ slotted surface

232‧‧‧整捲偏光膜232‧‧‧Full roll of polarizing film

D1、D2、D3‧‧‧方向D1, D2, D3‧‧‧ direction

L‧‧‧光線L‧‧‧Light

P1‧‧‧第一量測點P1‧‧‧ first measuring point

P2‧‧‧第二量測點P2‧‧‧ second measuring point

V1‧‧‧方向V1‧‧ direction

第1A圖~第1C圖繪示習知偏光膜檢測裝置之示意圖。1A to 1C are schematic views showing a conventional polarizing film detecting device.

第2圖繪示依照本發明較佳實施例之檢測裝置示意圖。2 is a schematic view of a detecting device in accordance with a preferred embodiment of the present invention.

第3圖繪示裁切出第2圖之偏光膜之示意圖。Fig. 3 is a schematic view showing the polarizing film of Fig. 2 cut out.

第4A圖繪示第3圖之偏光膜固定於捲膜滾輪之示意圖。FIG. 4A is a schematic view showing the polarizing film of FIG. 3 fixed to the roll of the film roll.

第4B圖繪示第4A圖中沿著方向V1觀看捲膜滾輪之示意圖。FIG. 4B is a schematic view showing the film roll in the direction V1 in FIG. 4A.

第5圖繪示依照本發明之較佳實施例之檢測裝置之操作流程圖。Figure 5 is a flow chart showing the operation of the detecting device in accordance with a preferred embodiment of the present invention.

第6圖繪示第2圖之偏光膜抵靠於平台之示意圖。FIG. 6 is a schematic view showing the polarizing film of FIG. 2 abutting against the platform.

第7圖繪示第2圖之第二量測點位於貫穿孔與光源之間之示意圖。FIG. 7 is a schematic view showing the second measuring point of FIG. 2 between the through hole and the light source.

第8圖繪示第2圖之下一個量測點位於貫穿孔與光源之間之示意圖。Figure 8 is a schematic view showing a measurement point in the second figure between the through hole and the light source.

200‧‧‧檢測裝置200‧‧‧Detection device

202‧‧‧偏光膜202‧‧‧ polarizing film

204‧‧‧光源204‧‧‧Light source

206‧‧‧分析器206‧‧‧Analyzer

208‧‧‧平台208‧‧‧ platform

210‧‧‧捲膜滾輪210‧‧‧roller roller

212‧‧‧第一滾輪212‧‧‧First wheel

214‧‧‧第二滾輪214‧‧‧Second wheel

216‧‧‧貫穿孔216‧‧‧through holes

D1‧‧‧方向D1‧‧ Direction

P1‧‧‧第一量測點P1‧‧‧ first measuring point

P2‧‧‧第二量測點P2‧‧‧ second measuring point

Claims (15)

一種用以分析一光學膜之光學方向的檢測裝置，該檢測裝置包括：一光源，用以發射一光線至該光學膜之一量測點；一分析器，用以接收並分析通過該光學膜之該光線；一平台，係位於該光學膜與該分析器之間且實質上平行該光學膜，該平台具有一貫穿孔，用以讓通過該光學膜之該光線通過；一捲膜滾輪，具有一溝槽，該光學膜之一幅寬基準邊係固定於該溝槽且該光學膜之該幅寬基準邊係抵靠於該溝槽之一槽底，該捲膜滾輪係用以捲動該光學膜，使該量測點移動至該貫穿孔與該光源之間；以及二第一滾輪，該光學膜係被傳動於該些第一滾輪之間。 A detecting device for analyzing an optical direction of an optical film, the detecting device comprising: a light source for emitting a light to a measuring point of the optical film; and an analyzer for receiving and analyzing the optical film The light; a platform between the optical film and the analyzer and substantially parallel to the optical film, the platform having a uniform perforation for passing the light through the optical film; a roll of film roller having a groove, a width reference datum of the optical film is fixed to the groove, and the width reference edge of the optical film is abutted against a groove bottom of the groove, and the roll film roller is used for scrolling The optical film moves the measuring point between the through hole and the light source; and two first rollers, the optical film is driven between the first rollers. 如申請專利範圍第1項所述之檢測裝置，其中該捲膜滾輪及該些第一滾輪更用以往該平台之方向移動，以將該光學膜抵靠於該平台上。 The detecting device of claim 1, wherein the film roll and the first roller are moved in a direction of a conventional platform to abut the optical film against the platform. 如申請專利範圍第1項所述之檢測裝置，更包括：一第二滾輪，用以抵靠該捲膜滾輪，該光學膜係被傳動於該捲膜滾輪與該第二滾輪之間。 The detecting device of claim 1, further comprising: a second roller for abutting against the film roll, the optical film being driven between the film roll and the second roller. 如申請專利範圍第1項所述之檢測裝置，更包括：一固膜元件，設置於該溝槽內，用以將該光學膜之該幅寬基準邊固定於該溝槽內。 The detecting device of claim 1, further comprising: a solid-film element disposed in the groove for fixing the width reference side of the optical film in the groove. 如申請專利範圍第4項所述之檢測裝置，其中該 固膜元件之寬度實質上等於或略大於該溝槽之槽寬，該固膜元件係緊配於該溝槽內。 The detecting device of claim 4, wherein the detecting device The width of the solid-film element is substantially equal to or slightly larger than the groove width of the groove, and the solid-film element is tightly fitted in the groove. 如申請專利範圍第4項所述之檢測裝置，其中該捲膜滾輪更包括一固定元件，該固定元件設置於該溝槽之一槽面，該槽面實質上垂直於該槽底，該固膜元件與該固定元件之一者為一磁性元件，該固膜元件與該固定元件之另一者為磁鐵，該光學膜被壓合於該固定元件與該固膜元件之間。 The detecting device of claim 4, wherein the film roll further comprises a fixing member disposed on a groove surface of the groove, the groove surface being substantially perpendicular to the groove bottom, the solid One of the membrane element and the fixing element is a magnetic element, and the other of the fixed element and the fixing element is a magnet, and the optical film is press-fitted between the fixing element and the solid-film element. 如申請專利範圍第1項所述之檢測裝置，其中該捲膜滾輪之材質及該些第一滾輪為丁晴橡膠(NBR)、海綿(sponge)、PU橡膠或矽化物。 The detecting device according to claim 1, wherein the material of the film roll and the first roller are NBR, sponge, PU rubber or telluride. 一種檢測裝置之操作方法，用以分析一光學膜，該操作方法包括：固定該光學膜之一幅寬基準邊至一捲膜滾輪之一溝槽且該光學膜之該幅寬基準邊係抵靠於該溝槽之一槽底；該捲膜滾輪捲動該光學膜，使該光學膜上之一第一量測點移動至一平台之一貫穿孔與一光源之間；發射一光線至該光學膜，該光線通過該光學膜及該貫穿孔；以及接收並分析通過該光學膜及該貫穿孔之該光線；其中，該平台位於該光學膜之一側，該光源位於該光學膜相對於該平台之另外一側，且該平台、該貫穿孔及該光源係垂直對應。 A method of operating a detecting device for analyzing an optical film, the method comprising: fixing a width reference side of the optical film to a groove of a film roll and the width reference edge of the optical film is offset Relying on a groove bottom of the groove; the film roll rolls the optical film to move a first measuring point on the optical film between a through hole of a platform and a light source; emitting a light to the An optical film, the light passing through the optical film and the through hole; and receiving and analyzing the light passing through the optical film and the through hole; wherein the platform is located on one side of the optical film, the light source is located on the optical film relative to The other side of the platform, and the platform, the through hole and the light source are vertically corresponding. 如申請專利範圍第8項所述之操作方法，其中於固定該光學膜之該步驟包括：設置一固膜元件於該溝槽內，以將該光學膜之該幅寬基準邊固定於該溝槽內。 The method of claim 8, wherein the step of fixing the optical film comprises: disposing a solid film member in the trench to fix the width reference edge of the optical film to the trench Inside the slot. 如申請專利範圍第9項所述之操作方法，其中該固膜元件之寬度實質上等於或略大於該溝槽之槽寬，該固膜元件係緊配於該溝槽內。 The method of claim 9, wherein the width of the solid-state element is substantially equal to or slightly larger than the groove width of the groove, and the solid-film element is tightly fitted in the groove. 如申請專利範圍第9項所述之操作方法，該捲膜滾輪更包括一固定元件，該固定元件設置於該溝槽之一槽面，該槽面實質上垂直於該槽底，該固膜元件與該固定元件之一者為一磁性元件，該固膜元件與該固定元件之另一者為磁鐵，該光學膜係被壓合於該固定元件與該固膜元件之間。 The method of claim 9, wherein the film roll further comprises a fixing member disposed on a groove surface of the groove, the groove surface being substantially perpendicular to the groove bottom, the solid film One of the element and the fixing element is a magnetic element, and the other of the fixed element and the fixing element is a magnet, and the optical film is press-fitted between the fixing element and the solid-film element. 如申請專利範圍第8項所述之操作方法，更包括：往該平台之方向，移動該光學膜，以使該光學膜抵靠於該平台。 The method of operation of claim 8 further comprising: moving the optical film in the direction of the platform such that the optical film abuts the platform. 如申請專利範圍第12項所述之操作方法，更包括：往遠離該平台之方向，移動該光學膜，以使該光學膜脫離該平台；以及捲動該光學膜，使該光學膜上之一第二量測點移動至該平台之該貫穿孔與該光源之間。 The method of operation of claim 12, further comprising: moving the optical film away from the platform to disengage the optical film from the platform; and rolling the optical film to make the optical film A second measuring point is moved between the through hole of the platform and the light source. 如申請專利範圍第8項所述之操作方法，更包 括：往該光學膜之方向，移動該平台，以使該光學膜抵靠於該平台。 For example, the operation method described in item 8 of the patent application scope is further included. Included: moving the platform in the direction of the optical film to abut the optical film against the platform. 如申請專利範圍第14所述之操作方法，更包括：往遠離該光學膜之方向，移動該平台，以使該光學膜脫離該平台；以及捲動該光學膜，使該光學膜上之該第二量測點移動至該平台之該貫穿孔與該光源之間。 The method of operation of claim 14, further comprising: moving the platform away from the optical film to disengage the optical film from the platform; and rolling the optical film to cause the optical film to The second measuring point is moved between the through hole of the platform and the light source.
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