TWI411763B - Micrometer caliper - Google Patents
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- TWI411763B TWI411763B TW96144428A TW96144428A TWI411763B TW I411763 B TWI411763 B TW I411763B TW 96144428 A TW96144428 A TW 96144428A TW 96144428 A TW96144428 A TW 96144428A TW I411763 B TWI411763 B TW I411763B
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Abstract
Description
本發明涉及一種長度、厚度等線性尺寸之量具，尤其涉及一種分厘卡。The invention relates to a measuring device of linear size such as length and thickness, in particular to a centring card.
目前，分厘卡廣泛應用於精確測量元件之長度、厚度等線性尺寸(請參見“The second Sucker Technique”,Journal of Bone and Joint Surgery,Vol 86－B,Issue SUPP_I,100,2004)。傳統之分厘卡具有兩個相對之測頭，分厘卡之讀數為兩個測頭之間之距離。測量元件厚度時，該兩個測頭分別接觸待測元件，此時分厘卡之讀數即為待測元件之厚度。At present, the centimeter card is widely used for accurately measuring the linear dimensions such as the length and thickness of the component (see "The second Sucker Technique", Journal of Bone and Joint Surgery, Vol 86-B, Issue SUPP_I, 100, 2004). The conventional centimeter card has two opposite probes, and the centimeter card reads the distance between the two probes. When measuring the thickness of the component, the two probes respectively contact the component to be tested, and the reading of the centimeter card is the thickness of the component to be tested.
然而，同一分厘卡之測頭端部之面積不變，若測量厚度不均且接觸面較小之元件，如一小型鏡片之外圍裙邊，或底部尺寸小於分厘卡之端部表面尺寸之槽形體之底部厚度等時，此種分厘卡則無法測量，此時則需要更換其他規格之分厘卡，給測量造成不便。However, the area of the end of the probe of the same centimeter is the same, if the component with uneven thickness and small contact surface is measured, such as the outer skirt of a small lens, or the bottom surface is smaller than the end surface size of the centimeter card. When the thickness of the bottom of the trough body is equal, such a centimeter card cannot be measured. In this case, it is necessary to replace the card of other specifications, which is inconvenient for measurement.
有鑒於此，有必要提供一種可測量厚度不均元件之較薄部分厚度之分厘卡。In view of the above, it is necessary to provide a card which can measure the thickness of a thin portion of a thickness unevenness element.
一種分厘卡，用於測量厚度不均之元件之較薄部分之厚度，該分厘卡包括兩相對測頭及一輔助治具。該輔助治具包括一固定套及一接觸部，該固定套套設於其中之一個測頭，該固定套具有與該另一測頭相對之端面。該接觸部固定於該端面，該接觸部用於與該待測元件之較薄部分相接觸，該接觸部與待測元件之接觸面相對於該固定套之端面之距離為第一距離，該待測元件之較厚部分於該固定套相對之一側之部分相對於該接觸部與該待測元件之接觸面之距離為第二距離，該第一距離大於該第二距離。A centimeter card for measuring the thickness of a thin portion of an element having an uneven thickness, the card comprising two opposing probes and an auxiliary fixture. The auxiliary fixture includes a fixing sleeve and a contact portion, and the fixing sleeve is disposed on one of the measuring heads, and the fixing sleeve has an end surface opposite to the other measuring head. The contact portion is fixed to the end surface, and the contact portion is configured to be in contact with a thin portion of the component to be tested, and a distance between a contact surface of the contact portion and the component to be tested is a first distance from an end surface of the fixing sleeve, and the The portion of the thicker portion of the measuring member on the opposite side of the fixing sleeve is at a second distance from the contact surface of the contact portion with the element to be tested, and the first distance is greater than the second distance.
相對於先前技術，該分厘卡採用輔助治具，因為該接觸面與該固定套之端面之距離大於待測元件較厚部分相對於該接觸面凸出之距離，所以可測量厚度不均元件之較薄部分之厚度，而無需更換其他規格之分厘卡，測量更加方便。Compared with the prior art, the PCT card adopts an auxiliary fixture because the distance between the contact surface and the end surface of the fixing sleeve is greater than the distance from the thick portion of the component to be tested relative to the contact surface, so that the thickness unevenness component can be measured. The thickness of the thinner part, without the need to replace the other specifications of the centimeter card, the measurement is more convenient.
下面將結合附圖，對本發明作進一步之詳細說明。The invention will be further described in detail below with reference to the accompanying drawings.
請參閱圖1與圖2，本發明第一實施例提供一分厘卡100，待測物為一雙凸透鏡30，該雙凸透鏡30包括一主體部302以及設置於主體部302周邊之裙邊304，本實施例之分厘卡100用於測量裙邊304之厚度。該分厘卡100包括一弓形尺架10、一測量部12、及一第一測頭14。該測量部12安裝於弓形尺架10之一端，該第一測頭14固定於弓形尺架10之另一端。Referring to FIG. 1 and FIG. 2, a first embodiment of the present invention provides a centimeter card 100. The object to be tested is a lenticular lens 30. The lenticular lens 30 includes a main body portion 302 and a skirt 304 disposed around the periphery of the main body portion 302. The centring card 100 of the present embodiment is used to measure the thickness of the skirt 304. The centimeter card 100 includes an arcuate ruler 10, a measuring portion 12, and a first probe 14. The measuring portion 12 is mounted to one end of the arcuate frame 10, and the first probe 14 is fixed to the other end of the arcuate frame 10.
該測量部12包括一固定套筒16、一微分筒18及一第二測頭20。該固定套筒16固定於該弓形尺架10之一端，該第二測頭20之一端與固定套筒16內徑面螺紋連接，並穿過該固定套筒16與微分筒18內側底部固定相接，第二測頭20之另一端與固定於弓形尺架10另一端之第一測頭14相對，微分筒18套於固定套筒16表面。固定套筒16之表面沿其軸向設置有刻度尺22，微分筒18靠近弓形尺架10之一端沿其外圓周設置有刻度尺24。The measuring portion 12 includes a fixing sleeve 16, a differential cylinder 18 and a second probe 20. The fixing sleeve 16 is fixed to one end of the arcuate ruler 10. One end of the second probe 20 is screwed to the inner diameter surface of the fixing sleeve 16, and is fixed through the fixing sleeve 16 and the inner bottom of the differential cylinder 18. The other end of the second probe 20 is opposite to the first probe 14 fixed to the other end of the arcuate frame 10, and the differential cylinder 18 is sleeved on the surface of the fixed sleeve 16. The surface of the fixed sleeve 16 is provided with a scale 22 along its axial direction, and the differential cylinder 18 is provided with a scale 24 along its outer circumference near one end of the arched frame 10.
該分厘卡100進一步包括一第一輔助治具26與第二輔助治具28，該第一輔助治具26與第二輔助治具28分別套於該第一測頭14與第二測頭20之端部，且可拆卸。第一輔助治具26包括一第一固定套32與一第一接觸部34。該第一固定套32為一杯狀體，該杯狀體具有一底部322及與垂直於底部322設置之環狀側壁324，該底部322與環狀側壁324之形狀分別與第一測頭14之端部表面與側面形狀相匹配並套於第一測頭14，第一固定套32具有一與第二測頭20相對之表面36。該第一接觸部34為一中空圓環狀柱體，該第一接觸部34之一端固定於第一固定套32之表面36，該第一接觸部34之軸向與第一測頭14之軸向重合或平行，第一接觸部34與第一固定套32之固定方式可為黏接或一體成型等。該第一接觸部34之內徑大於該雙凸透鏡30之主體部302之外徑，且小於裙邊304之外徑，第一接觸部34與透鏡30接觸之端面至第一固定套32之表面36之高度大於雙凸透鏡30之主體部302之與表面36相對之一側相對於裙邊304凸出之高度。該第二輔助治具28之結構與第一輔助治具26相同且位置相對。The PCT card 100 further includes a first auxiliary fixture 26 and a second auxiliary fixture 28, and the first auxiliary fixture 26 and the second auxiliary fixture 28 are respectively sleeved on the first probe 14 and the second probe. End of 20, and detachable. The first auxiliary fixture 26 includes a first fixing sleeve 32 and a first contact portion 34. The first fixing sleeve 32 is a cup-shaped body having a bottom portion 322 and an annular side wall 324 disposed perpendicular to the bottom portion 322. The bottom portion 322 and the annular side wall 324 are respectively shaped to the first probe 14 The end surface is matched to the side shape and sleeved over the first probe 14, and the first fixing sleeve 32 has a surface 36 opposite to the second probe 20. The first contact portion 34 is a hollow annular cylinder. One end of the first contact portion 34 is fixed to the surface 36 of the first fixing sleeve 32. The axial direction of the first contact portion 34 and the first probe 14 are The first contact portion 34 and the first fixing sleeve 32 can be fixed in a manner of being bonded or integrally formed. The inner diameter of the first contact portion 34 is larger than the outer diameter of the main body portion 302 of the lenticular lens 30, and is smaller than the outer diameter of the skirt 304, and the end surface of the first contact portion 34 contacting the lens 30 to the surface of the first fixing sleeve 32. The height of 36 is greater than the height of one side of the body portion 302 of the lenticular lens 30 opposite the surface 36 with respect to the skirt 304. The structure of the second auxiliary jig 28 is the same as that of the first auxiliary jig 26 and is opposite in position.
該第二輔助治具28包括一第二固定套54與一第二接觸部42。該第二固定套54之形狀與結構與第一固定套32相同，且與第二測頭20之形狀相匹配並套於第二測頭20，第二固定套54具有一與第一接觸部34相對之表面56。該第二接觸部42為一中空圓環狀柱體，該第二接觸部42之一端固定於第二固定套54之表面56，該第二接觸部42之軸向與第二測頭20之軸向重合或平行，第二接觸部42與第二固定套54之固定方式可為黏接或一體成型等。該第二接觸部42之內徑大於該雙凸透鏡30之主體部302之外徑，且小於裙邊304之外徑，第二接觸部42與透鏡30之接觸之端面至第二固定套54之表面36之高度大於透鏡30之主體部302之與表面56相對之一側相對於裙邊304凸出之高度。The second auxiliary fixture 28 includes a second fixing sleeve 54 and a second contact portion 42. The second fixing sleeve 54 has the same shape and structure as the first fixing sleeve 32, and is matched with the shape of the second measuring head 20 and sleeved on the second measuring head 20. The second fixing sleeve 54 has a first contact portion. 34 opposite surface 56. The second contact portion 42 is a hollow annular cylinder. One end of the second contact portion 42 is fixed to the surface 56 of the second fixing sleeve 54. The axial direction of the second contact portion 42 and the second probe 20 are The second contact portion 42 and the second fixing sleeve 54 may be fixed or integrally formed by being axially overlapped or parallel. The inner diameter of the second contact portion 42 is larger than the outer diameter of the main body portion 302 of the lenticular lens 30, and is smaller than the outer diameter of the skirt 304, and the end surface of the contact portion of the second contact portion 42 with the lens 30 reaches the second fixing sleeve 54. The height of the surface 36 is greater than the height of the body portion 302 of the lens 30 opposite the surface 56 relative to the skirt 304.
使用該分厘卡100測量該雙凸透鏡30之裙邊304厚度之方法如下：1)請參閱圖1，旋轉微分筒18，帶動第二測頭20向第一測頭14之方向移動，使第一輔助治具26與第二輔助治具28相接觸，通過刻度尺22與24讀出一第一數值。The method for measuring the thickness of the skirt 304 of the lenticular lens 30 by using the centimeter card 100 is as follows: 1) Referring to FIG. 1, the rotating differential cylinder 18 drives the second probe 20 to move in the direction of the first probe 14, so that An auxiliary jig 26 is in contact with the second auxiliary jig 28, and a first value is read through the scales 22 and 24.
2)請參閱圖2，將雙凸透鏡30置於第一輔助治具26與第二輔助治具28之間，並使該第一輔助治具26之第一接觸部34與第二輔助治具28之接觸部42分別與裙邊304之兩表面相接觸，此時通過刻度尺22與24讀出一第二數值，該第二數值與該第一數值之差值即為雙凸透鏡30之裙邊304之厚度。2) Referring to FIG. 2, the lenticular lens 30 is placed between the first auxiliary jig 26 and the second auxiliary jig 28, and the first contact portion 34 of the first auxiliary jig 26 and the second auxiliary jig are placed. The contact portions 42 of 28 are respectively in contact with the two surfaces of the skirt 304. At this time, a second value is read by the scales 22 and 24, and the difference between the second value and the first value is the skirt of the lenticular lens 30. The thickness of the edge 304.
可理解，分厘卡100還可測量僅有一面為凸面之透鏡之裙邊厚度，或其他中心厚度大於周邊厚度之元件之周邊厚度。另外，於測量僅有一面為凸面之透鏡之裙邊厚度時，分厘卡可僅安裝第一輔助治具26與第二輔助治具28之其中之一，並不限於本實施例。It will be appreciated that the centimeter card 100 can also measure the thickness of the skirt of a lens having only one convex surface, or the thickness of the periphery of other components having a central thickness greater than the peripheral thickness. In addition, when measuring the thickness of the skirt of the lens having only one convex surface, the centring card may mount only one of the first auxiliary jig 26 and the second auxiliary jig 28, and is not limited to the embodiment.
請參閱圖3，本發明第二實施例提供一種分厘卡200，本實施例之待測元件44為一槽體，該元件包括底部442和垂直凸出於底部周邊之側壁444，形成一柱狀結構，該分厘卡200用於測量該底部442之厚度，其中底部442之底面面積小於第一測頭14與第二測頭20之端部表面之面積。該分厘卡200之結構與第一實施例之分厘卡100之結構基本相同，不同之處在於該分厘卡200包括一第三輔助治具46，該第三輔助治具46具有一第三固定套48與一第三接觸部50，該第三固定套48與第一輔助治具46之第一固定套32之結構相同並套於第二測頭20。該第三接觸部50為一實心柱體，其軸向與第二測頭20之軸向重合或平行，該第三接觸部50之截面形狀與待測元件44之底部442之形狀相同，截面面積小於底部442之位於側壁444之間之部分之面積，且第三接觸部50與待測元件44之接觸面相對於表面52之高度大於待測元件44之側壁444凸出於底部442之高度。該第三固定套48之外側具有一與第一測頭14相對之表面52，第三接觸部50之一端固定於第三固定套48之表面52，其固定方式可為黏接或一體成型等。該接觸部50之另一端面為平面，用於與該待測元件44之底部442相接觸。利用分厘卡200測量待測元件44之原理與第一實施例之分厘卡100測量原理基本相同，此處不再贅述。Referring to FIG. 3, a second embodiment of the present invention provides a centring card 200. The device under test 44 of the present embodiment is a slot body, and the component includes a bottom portion 442 and a sidewall 444 extending perpendicularly from the periphery of the bottom portion to form a pillar. The centring structure 200 is used to measure the thickness of the bottom portion 442, wherein the bottom surface area of the bottom portion 442 is smaller than the area of the end surface of the first probe 14 and the second probe 20. The structure of the card 200 is substantially the same as that of the card 100 of the first embodiment, except that the card 200 includes a third auxiliary fixture 46, and the third auxiliary fixture 46 has a first The third fixing sleeve 48 and the third fixing portion 50 are identical in structure to the first fixing sleeve 32 of the first auxiliary fixture 46 and are sleeved on the second probe 20 . The third contact portion 50 is a solid cylinder whose axial direction coincides or is parallel with the axial direction of the second probe 20, and the cross-sectional shape of the third contact portion 50 is the same as the shape of the bottom portion 442 of the element to be tested 44. The area is smaller than the area of the portion of the bottom portion 442 between the side walls 444, and the height of the contact surface of the third contact portion 50 with the device under test 44 relative to the surface 52 is greater than the height of the side wall 444 of the element under test 44 that protrudes from the bottom portion 442. The outer side of the third fixing sleeve 48 has a surface 52 opposite to the first measuring head 14. One end of the third connecting portion 50 is fixed to the surface 52 of the third fixing sleeve 48, and the fixing manner thereof can be adhesive or integral molding. . The other end surface of the contact portion 50 is a flat surface for contacting the bottom portion 442 of the device under test 44. The principle of measuring the device under test 44 by using the centimeter card 200 is basically the same as that of the card 100 of the first embodiment, and details are not described herein again.
可以理解，該接觸部50之截面形狀還可為其他形狀，只要第三接觸部50可伸入到槽體內與底部442接觸即可。一般地，第三接觸部50之截面面積小於第二測頭20之端面之面積，以測量尺寸小於第二測頭20之端部尺寸之元件。進一步地，該第三接觸部50還可為一探針等，並不限於本實施例。It can be understood that the cross-sectional shape of the contact portion 50 can also be other shapes as long as the third contact portion 50 can protrude into the groove body to contact the bottom portion 442. Generally, the cross-sectional area of the third contact portion 50 is smaller than the area of the end surface of the second probe 20 to measure an element having a size smaller than the end portion of the second probe 20. Further, the third contact portion 50 may also be a probe or the like, and is not limited to the embodiment.
另外，該分厘卡200也可測量具有台體(截去頭部之錐體)狀槽之槽形體之底部厚度，只要第三接觸部50能夠完全接觸到被測部。該第三輔助治具46還可套於第一測頭14，或第一測頭14與第二測頭20上皆套有第三輔助治具46來測量“H”字型槽體之底部之厚度。另外，該第三輔助治具46還可為探針，並不限於本實施例。In addition, the centimeter card 200 can also measure the thickness of the bottom of the trough body having the trough of the trough (the truncated cone of the head) as long as the third contact portion 50 can completely contact the portion to be tested. The third auxiliary fixture 46 can also be sleeved on the first probe 14, or the first probe 14 and the second probe 20 are sleeved with a third auxiliary fixture 46 to measure the bottom of the "H" shaped trough body. The thickness. In addition, the third auxiliary jig 46 may also be a probe, and is not limited to the embodiment.
相對於先前技術，分厘卡100採用第一輔助治具26與第二輔助治具28可測量中心厚度大於周邊厚度之元件之周邊厚度，分厘卡200採用了第三輔助治具46可測量中心厚度小於周邊厚度之元件之中心厚度，無須更換其他量具，只需於先前分厘卡上裝設輔助治具即可，使測量更加方便。Compared with the prior art, the centimeter card 100 can measure the peripheral thickness of the component whose center thickness is greater than the peripheral thickness by using the first auxiliary fixture 26 and the second auxiliary fixture 28, and the centimeter card 200 can be measured by using the third auxiliary fixture 46. The center thickness of the component whose center thickness is smaller than the peripheral thickness does not need to be replaced with other gauges. It is only necessary to install an auxiliary fixture on the previous centimeter card to make the measurement more convenient.
綜上所述，本發明確已符合發明專利之要件，遂依法提出專利申請。惟，以上所述者僅為本發明之較佳實施方式，自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化，皆應涵蓋於以下申請專利範圍內。In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.
弓形尺架．．．10Bow ruler. . . 10
測量部．．．12Measurement department. . . 12
第一測頭．．．14The first probe. . . 14
固定套筒．．．16Fix the sleeve. . . 16
微分筒．．．18Differential tube. . . 18
第二測頭．．．20The second probe. . . 20
刻度尺．．．22,24Scale. . . 22,24
第一輔助治具．．．26The first auxiliary fixture. . . 26
第二輔助治具．．．28Second auxiliary fixture. . . 28
透鏡．．．30lens. . . 30
第一固定套．．．32The first fixed set. . . 32
第一接觸部．．．34First contact. . . 34
表面．．．36，52，56surface. . . 36,52,56
接觸部．．．42，50Contact part. . . 42,50
待測元件．．．44The component to be tested. . . 44
輔助治具．．．46Auxiliary fixture. . . 46
第三固定套．．．48The third fixed set. . . 48
第二固定套．．．54Second fixed set. . . 54
分厘卡．．．100，200Centimeter card. . . 100,200
主體部．．．302Main body. . . 302
裙邊．．．304Skirt. . . 304
底部．．．322，442bottom. . . 322,442
環狀側壁．．．324Annular side wall. . . 324
側壁．．．444Side wall. . . 444
圖1係本發明第一實施例之分厘卡之示意圖。1 is a schematic view of a centimeter card of a first embodiment of the present invention.
圖2係本發明第一實施例之分厘卡與一待測元件之配合示意圖。FIG. 2 is a schematic diagram of the cooperation between the centring card and the device to be tested according to the first embodiment of the present invention.
圖3係本發明第二實施例之分厘卡與另一待測元件之配合示意圖。3 is a schematic view showing the cooperation of the centring card of the second embodiment of the present invention with another component to be tested.
弓形尺架．．．10Bow ruler. . . 10
接觸部．．．50Contact part. . . 50
測量部．．．12Measurement department. . . 12
待測元件．．．44The component to be tested. . . 44
第一測頭．．．14The first probe. . . 14
輔助治具．．．46Auxiliary fixture. . . 46
固定套筒．．．16Fix the sleeve. . . 16
第三固定套．．．48The third fixed set. . . 48
微分筒．．．18Differential tube. . . 18
分厘卡．．．200Centimeter card. . . 200
第二測頭．．．20The second probe. . . 20
底部．．．442bottom. . . 442
刻度尺．．．22,24Scale. . . 22,24
側壁．．．444Side wall. . . 444
表面．．．52surface. . . 52
Claims (9)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96144428A TWI411763B (en) | 2007-11-23 | 2007-11-23 | Micrometer caliper |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96144428A TWI411763B (en) | 2007-11-23 | 2007-11-23 | Micrometer caliper |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200923323A TW200923323A (en) | 2009-06-01 |
| TWI411763B true TWI411763B (en) | 2013-10-11 |
Family
ID=44728532
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW96144428A TWI411763B (en) | 2007-11-23 | 2007-11-23 | Micrometer caliper |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI411763B (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0791801B1 (en) * | 1996-02-26 | 2001-07-04 | Mitutoyo Corporation | Micrometer |
| US6260286B1 (en) * | 1998-04-03 | 2001-07-17 | Mitutoyo Corporation | Micrometer |
| TWM314852U (en) * | 2006-12-14 | 2007-07-01 | Univ Cheng Shiu | Improved micrometer |
-
2007
- 2007-11-23 TW TW96144428A patent/TWI411763B/en not_active IP Right Cessation
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0791801B1 (en) * | 1996-02-26 | 2001-07-04 | Mitutoyo Corporation | Micrometer |
| US6260286B1 (en) * | 1998-04-03 | 2001-07-17 | Mitutoyo Corporation | Micrometer |
| TWM314852U (en) * | 2006-12-14 | 2007-07-01 | Univ Cheng Shiu | Improved micrometer |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200923323A (en) | 2009-06-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |