TWI394957B - Power measurement system for integrated circuit chip - Google Patents
Power measurement system for integrated circuit chip Download PDFInfo
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- TWI394957B TWI394957B TW98108389A TW98108389A TWI394957B TW I394957 B TWI394957 B TW I394957B TW 98108389 A TW98108389 A TW 98108389A TW 98108389 A TW98108389 A TW 98108389A TW I394957 B TWI394957 B TW I394957B
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Description
本發明係有關一種耗電量測系統,尤指一種可與一積體電路晶片或多個積體電路晶片之不同腳位並聯,以切換選擇量測各腳位耗電量之耗電量測系統。The invention relates to a power consumption measuring system, in particular to a power consumption test which can be connected in parallel with different foot positions of an integrated circuit chip or a plurality of integrated circuit chips to switch and select and measure the power consumption of each foot. system.
在積體電路晶片(integrated circuit chip,IC chip)的設計開發階段,研發工程師常常需要針對IC晶片不同腳位量測其耗電量,使IC晶片更符合設計以及安全需求。In the design and development stage of an integrated circuit chip (IC chip), R&D engineers often need to measure the power consumption of different IC chips, making the IC chip more in line with design and security requirements.
請參考第1圖,第1圖為積體電路晶片10之示意圖。積體電路晶片10具有一第一腳位11以及一第二腳位12,其分別電性連接於一第一電源端31以及一第二電源端32(第一電源端31以及第二電源端32可具有相同或相異之電壓輸出),為了對積體電路晶片10之腳位進行耗電量的量測,於第一腳位11以及第一電源端31之間串接一零歐姆電阻21,於第二腳位12以及第二電源端32之間串接一零歐姆電阻22,其中零歐姆電阻21、22係以電焊的方式焊接於積體電路晶片10所安裝之電路板上。當欲進行第一腳位11耗電量之量測時,習知的方式需先以點焊的方式將零歐姆電阻21之焊接端211(或焊接端212)斷開,再將一電流計(圖上未顯示)兩端分別連接於焊接端211以及焊接端212,以量測流經第一腳位11之電流,再依據所測得之電流以及第一電源端31之電壓數值,利用歐姆定律計算出第一腳位11之耗電量,第二腳位12或積體電路晶片10其他腳位之耗電量量測方式亦相同。然而這樣的耗電量量測方式必須每次在腳位的線路上進行電焊連接以及斷開的動作,相當費時費力。Please refer to FIG. 1 , which is a schematic diagram of the integrated circuit chip 10 . The integrated circuit chip 10 has a first pin 11 and a second pin 12 electrically connected to a first power terminal 31 and a second power terminal 32 (the first power terminal 31 and the second power terminal). 32 may have the same or different voltage output), in order to measure the power consumption of the pin of the integrated circuit chip 10, a zero ohm resistor is connected in series between the first pin 11 and the first power terminal 31. 21, a zero ohm resistor 22 is connected in series between the second pin 12 and the second power terminal 32, wherein the zero ohm resistors 21, 22 are soldered to the circuit board on which the integrated circuit chip 10 is mounted. When the measurement of the power consumption of the first pin 11 is to be performed, the conventional method needs to first disconnect the welding end 211 (or the welding end 212) of the zero ohm resistor 21 by spot welding, and then an galvanometer. The two ends (not shown) are respectively connected to the soldering end 211 and the soldering end 212 to measure the current flowing through the first pin 11, and then utilize the measured current and the voltage value of the first power terminal 31. Ohm's law calculates the power consumption of the first pin 11, and the second pin 12 or the other pin of the integrated circuit chip 10 measures the same amount of power. However, such a power consumption measurement method must perform an electric welding connection and a disconnection operation on the line of the foot every time, which is quite time consuming and laborious.
本發明係提供一種積體電路晶片之耗電量測系統,其包含有一第一晶片、一第一電阻、一第二電阻、一多工器、一控制器以及一類比 數位轉換器(analog/digital converter,ADC)。該第一晶片包含一第一腳位以及一第二腳位。該第一電阻係電性串聯於該第一腳位以及一第一電源端之間,該第二電阻係電性串聯於該第二腳位以及一第二電源端之間。該多工器係與該第一電阻以及該第二電阻並聯耦接,用來選擇性輸出該第一電阻或該第二電阻之電壓差訊號。該控制器電性連接於該多工器,用來控制該多工器選擇輸出該第一電阻或該第二電阻之電壓差訊號。該類比數位轉換器電性連接於該多工器以及該控制器之間,用來將該多工器輸出之電壓差訊號轉換為一數位訊號並將該數位訊號傳輸至該控制器以產生該第一腳位或該第二腳位之耗電量資料。其中該耗電量測系統係依據該多工器輸出之該第一電阻或該第二電阻之電壓差訊號以及對應之該第一電阻值或該第二電阻值產生該第一腳位或該第二腳位之耗電量資料。The invention provides a power consumption measuring system for an integrated circuit chip, which comprises a first chip, a first resistor, a second resistor, a multiplexer, a controller and an analog-to- digital converter (analog/ Digital converter, ADC). The first wafer includes a first pin and a second pin. The first resistor is electrically connected in series between the first pin and a first power terminal, and the second resistor is electrically connected in series between the second pin and a second power terminal. The multiplexer is coupled in parallel with the first resistor and the second resistor for selectively outputting a voltage difference signal of the first resistor or the second resistor. The controller is electrically connected to the multiplexer for controlling the multiplexer to selectively output a voltage difference signal of the first resistor or the second resistor. The analog-to-digital converter is electrically connected between the multiplexer and the controller, and is configured to convert the voltage difference signal outputted by the multiplexer into a digital signal and transmit the digital signal to the controller to generate the The power consumption data of the first pin or the second pin. The power consumption measuring system generates the first pin or the corresponding first or second resistors according to the voltage difference signal of the first resistor or the second resistor outputted by the multiplexer The power consumption data of the second pin.
請參考第2圖,第2圖為本發明用來量測積體電路晶片耗電量之耗電量測系統100第一實施例之示意圖。積體電路晶片10具有一第一腳位11以及一第二腳位12,其分別電性連接於一第一電源端31以及一第二電源端32(第一電源端31以及第二電源端32因不同腳位設計需求可具有相同或相異之電壓輸出),為了對積體電路晶片10之腳位進行耗電量的量測,於第一腳位11以及第一電源端31之間串聯一第一微歐姆電阻41,於第二腳位12以及第二電源端32之間串聯一第二微歐姆電阻42,而為了能方便快速量測不同腳位之耗電量,耗電量測系統100利用一多工器50分別與第一微歐姆電阻41以及第二微歐姆電阻42並聯耦接,由於第一微歐姆電阻41以及第二微歐姆電阻42具有精確之微量歐姆值,因此與兩微歐姆電阻41、42並聯之多工器50可輸出第一微歐姆電阻41或第二微歐姆電阻42之微量電壓差。控制器80則電性連接於多工器50,本發明之特徵即在利用控制器80(或由使用者直接外在操作控制多工器50)控制多工器50切換輸出不同腳位所串聯微歐姆電阻之電壓差以求得該腳位之耗電量,因此多工器50可選擇性地輸出第一微歐姆電阻41或第二微歐姆電阻42之電壓差訊號。多工器50輸出之電壓差訊號經由與多工器50電性連接之放大器60將訊號放大,再透過類比數位轉換器70將類比格式之電壓訊號轉換為數位訊號,最後由控制器80依據類比數位轉換器70所轉換之數位訊號依據歐姆定律計算 其中一腳位之耗電量。Please refer to FIG. 2, which is a schematic diagram of a first embodiment of a power consumption measuring system 100 for measuring the power consumption of an integrated circuit chip according to the present invention. The integrated circuit chip 10 has a first pin 11 and a second pin 12 electrically connected to a first power terminal 31 and a second power terminal 32 (the first power terminal 31 and the second power terminal). 32 may have the same or different voltage output due to different pin design requirements. In order to measure the power consumption of the pin of the integrated circuit chip 10, between the first pin 11 and the first power terminal 31 A first micro ohm resistor 41 is connected in series, and a second micro ohm resistor 42 is connected in series between the second pin 12 and the second power terminal 32, and the power consumption is conveniently measured in order to quickly and easily measure the power consumption of different pins. The measuring system 100 is coupled in parallel with the first micro ohmic resistor 41 and the second micro ohmic resistor 42 by a multiplexer 50. Since the first micro ohmic resistor 41 and the second micro ohmic resistor 42 have precise trace ohmic values, The multiplexer 50 in parallel with the two micro ohmic resistors 41, 42 can output a slight voltage difference between the first micro ohmic resistor 41 or the second micro ohmic resistor 42. The controller 80 is electrically connected to the multiplexer 50. The feature of the present invention is that the controller 50 is controlled by the controller 80 (or directly operated by the user to control the multiplexer 50) to switch the output of the different pins in series. The voltage difference of the micro ohmic resistor is used to determine the power consumption of the pin, so the multiplexer 50 can selectively output the voltage difference signal of the first micro ohm resistor 41 or the second micro ohm resistor 42. The voltage difference signal outputted by the multiplexer 50 is amplified by the amplifier 60 electrically connected to the multiplexer 50, and then converted into a digital signal by the analog digital converter 70, and finally converted by the controller 80 according to the analogy. The digital signal converted by the digital converter 70 is calculated according to Ohm's law One of the power consumption of one foot.
舉例而言,當工程師欲量測積體電路晶片10的第一腳位11的耗電量時,透過控制器80控制多工器50切換至輸出第一微歐姆電阻41之電壓差(假設第一微歐姆電阻41之電阻值為m,輸出之電壓差為v),則經過放大器60放大電壓差訊號,再經由類比數位轉換器70將電壓差訊號轉換為數位訊號,最後控制器80依據歐姆定律得出第一腳位11之耗電量P=(v2 /m)。當工程師欲量測積體電路晶片10的第二腳位12的耗電量時,只需要透過控制器80控制多工器50切換至輸出第二微歐姆電阻42之電壓差,即可如前述步驟取得第二腳位12之耗電量。For example, when the engineer wants to measure the power consumption of the first pin 11 of the integrated circuit chip 10, the controller 80 controls the multiplexer 50 to switch to the voltage difference of the output first micro ohmic resistor 41 (assuming the first The resistance value of a micro ohm resistor 41 is m, and the voltage difference of the output is v), the voltage difference signal is amplified by the amplifier 60, and the voltage difference signal is converted into a digital signal by the analog digital converter 70, and finally the controller 80 is based on ohms. The law gives the power consumption of the first pin 11 P = (v 2 /m). When the engineer wants to measure the power consumption of the second pin 12 of the integrated circuit chip 10, it is only necessary to control the voltage difference between the multiplexer 50 and the output second micro ohmic resistor 42 through the controller 80, as described above. The step takes the power consumption of the second pin 12.
此外,本發明所揭露之量測系統中,各微歐姆電阻之電壓差訊號亦可先經由放大器60放大後再輸出多工器50再進行選擇。如第3圖所示本發明第二實施例之耗電量測系統200,則分別設置一放大器60取得第一微歐姆電阻41以及第二微歐姆電阻42之電壓差訊號並放大該訊號再分別輸入多工器50以供選擇。而於本發明的實施例中,控制器80另電性連接各放大器60,以控制放大器60放大多工器50所輸出之電壓差訊號的倍率(如第2圖之第一實施例)或放大直接自各微歐姆電阻所取得之電壓差訊號(如第3圖之第二實施例)。In addition, in the measurement system disclosed in the present invention, the voltage difference signal of each micro-ohmic resistor may be first amplified by the amplifier 60 and then outputted to the multiplexer 50 for selection. As shown in FIG. 3, the power consumption measuring system 200 of the second embodiment of the present invention respectively sets an amplifier 60 to obtain a voltage difference signal between the first micro ohmic resistor 41 and the second micro ohmic resistor 42 and amplifies the signal and respectively respectively. The multiplexer 50 is input for selection. In the embodiment of the present invention, the controller 80 is electrically connected to each of the amplifiers 60 to control the amplifier 60 to amplify the magnification of the voltage difference signal output by the multiplexer 50 (as in the first embodiment of FIG. 2) or to amplify The voltage difference signal obtained directly from each micro-ohmic resistor (as in the second embodiment of Figure 3).
由於在積體電路晶片以及電子系統的設計研發過程中,常常需 要針對不同的使用條件,量測系統中多個積體電路晶片或電子元件某些特定組合(profile)的功率消耗,例如在系統待命狀態仍消耗電流之各電子元件之耗電量總和,因此除了於同一積體電路晶片之不同腳位切換以取得不同腳位之耗電量資訊外,本發明亦可結合第二、第三以及更多不同積體電路晶片或電子元件之不同腳位,以量測不同特定組合之總耗電量資訊。如第4圖之第三實施例之耗電量測系統300所示,除了如第2圖之第一實施例的元件外,第三實施例另加上一積體電路晶片10’,其具有一第三腳位13,且電性連接於一第三電源端33,在第三腳位13以及第三電源端33之間串聯一第三微歐姆電阻43,最後第三微歐姆電阻43亦與多工器50並聯,使多工器50亦可選擇輸出第三微歐姆電阻43之電壓差訊號,以獲得積體電路晶片10’之第三腳位13的耗電量。Due to the need to design and develop integrated circuit chips and electronic systems To measure the power consumption of certain integrated profiles of multiple integrated circuit chips or electronic components in the system for different usage conditions, such as the sum of the power consumption of each electronic component that still consumes current in the system standby state, therefore In addition to the different pin switching of the same integrated circuit chip to obtain the power consumption information of different pin positions, the present invention can also combine the different positions of the second, third and more different integrated circuit chips or electronic components. To measure the total power consumption information of different specific combinations. As shown in the power consumption measuring system 300 of the third embodiment of FIG. 4, in addition to the components of the first embodiment of FIG. 2, the third embodiment further includes an integrated circuit wafer 10' having a third pin 13 is electrically connected to a third power terminal 33, a third micro ohm resistor 43 is connected in series between the third pin 13 and the third power terminal 33, and finally the third micro ohm resistor 43 is also connected. In parallel with the multiplexer 50, the multiplexer 50 can also select the voltage difference signal of the third micro ohmic resistor 43 to obtain the power consumption of the third pin 13 of the integrated circuit wafer 10'.
本發明揭露一種可方便快速量測積體電路晶片各腳位耗電量之耗電量測系統,藉由在積體電路各腳位與電源端之間分別串接一微歐姆電阻,再將各微歐姆電阻兩端與一多工器並聯。透過控制器控制多工器選擇輸出欲量測之腳位所串聯之微歐姆電阻電壓差,藉由放大器放大電壓差訊號,並由類比數位轉換器將電壓差訊號轉換為數位訊號,最後由控制器依據歐姆定律計算該腳位之耗電量。當欲量測另一腳位之耗電量時,控制多工器切換輸出另一腳位之電壓差訊號即可迅速取得目的腳位之耗電量。The invention discloses a power consumption measuring system capable of conveniently and quickly measuring the power consumption of each pin of an integrated circuit chip, wherein a micro ohm resistor is connected in series between each pin and the power terminal of the integrated circuit, and then Each micro-ohmic resistor is connected in parallel with a multiplexer. Controlling the multiplexer through the controller to select the micro ohmic resistance voltage difference in series with the pin to be measured, amplifying the voltage difference signal by the amplifier, and converting the voltage difference signal into a digital signal by the analog digital converter, and finally controlling The device calculates the power consumption of the pin according to Ohm's law. When it is desired to measure the power consumption of another pin, the control multiplexer switches the output of the voltage difference signal of the other pin to quickly obtain the power consumption of the target pin.
以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍 所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。The above description is only a preferred embodiment of the present invention, and the patent application scope according to the present invention Equivalent changes and modifications made are intended to be within the scope of the present invention.
10、10’‧‧‧積體電路晶片10, 10'‧‧‧ integrated circuit chip
11‧‧‧第一腳位11‧‧‧First position
12‧‧‧第二腳位12‧‧‧second foot
13‧‧‧第三腳位13‧‧‧ third position
21、22‧‧‧零歐姆電阻21, 22‧‧‧ zero ohm resistor
31‧‧‧第一電源端31‧‧‧First power terminal
32‧‧‧第二電源端32‧‧‧second power terminal
33‧‧‧第三電源端33‧‧‧ Third power terminal
41‧‧‧第一微歐姆電阻41‧‧‧First micro ohm resistor
42‧‧‧第二微歐姆電阻42‧‧‧second micro ohm resistor
43‧‧‧第三微歐姆電阻43‧‧‧ Third micro ohm resistor
50‧‧‧多工器50‧‧‧Multiplexer
60‧‧‧放大器60‧‧‧Amplifier
70‧‧‧類比數位轉換器70‧‧‧ analog digital converter
80‧‧‧控制器80‧‧‧ controller
100、200、300‧‧‧耗電量測系統100, 200, 300‧‧‧ power consumption measurement system
211、212‧‧‧焊接端211, 212‧‧‧ welding end
第1圖為積體電路晶片之示意圖。Figure 1 is a schematic diagram of an integrated circuit chip.
第2圖為本發明用於積體電路晶片之耗電量測系統第一實施例之示意圖。2 is a schematic view showing a first embodiment of a power consumption measuring system for an integrated circuit chip according to the present invention.
第3圖為本發明用於積體電路晶片之耗電量測系統第二實施例之示意圖。Fig. 3 is a schematic view showing a second embodiment of the power consumption measuring system for the integrated circuit chip of the present invention.
第4圖為本發明用於積體電路晶片之耗電量測系統第三實施例之示意圖。Fig. 4 is a view showing a third embodiment of the power consumption measuring system for the integrated circuit chip of the present invention.
10...積體電路晶片10. . . Integrated circuit chip
11...第一腳位11. . . First position
12...第二腳位12. . . Second foot
31...第一電源端31. . . First power terminal
32...第二電源端32. . . Second power terminal
41...第一微歐姆電阻41. . . First micro ohm resistor
42...第二微歐姆電阻42. . . Second micro ohm resistor
50...多工器50. . . Multiplexer
60...放大器60. . . Amplifier
70...類比數位轉換器70. . . Analog digital converter
80...控制器80. . . Controller
100...耗電量測系統100. . . Power consumption measurement system
Claims (5)
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TW428086B (en) * | 1996-07-10 | 2001-04-01 | Matsushita Electric Ind Co Ltd | A multicircuit type watthour meter |
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TW428086B (en) * | 1996-07-10 | 2001-04-01 | Matsushita Electric Ind Co Ltd | A multicircuit type watthour meter |
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