TWI385368B

TWI385368B - Optic lens tester

Info

Publication number: TWI385368B
Application number: TW95143820A
Authority: TW
Inventors: Ga-Lane Chen
Original assignee: Hon Hai Prec Ind Co Ltd
Priority date: 2006-11-27
Filing date: 2006-11-27
Publication date: 2013-02-11
Also published as: TW200823445A

Description

光學鏡頭測試裝置 Optical lens tester

本發明涉及光學鏡頭制程，尤其涉及一種光學鏡頭測試裝置。 The present invention relates to an optical lens process, and more particularly to an optical lens test device.

隨著多媒體技術的飛速發展，數位相機、攝像機及帶有攝像頭的手機越來越受廣大消費者青睞，在人們對數位相機、攝像機及手機攝像頭拍攝物體的影像品質提出更高要求的同時，對數位相機、攝像機及帶有攝像頭的手機等產品需求量也在增加。 With the rapid development of multimedia technology, digital cameras, camcorders and mobile phones with cameras are increasingly favored by consumers. While people are demanding higher image quality for digital cameras, camcorders and mobile phone cameras, Demand for products such as digital cameras, camcorders and mobile phones with cameras is also increasing.

數位相機、攝像機及手機攝像頭等攝影裝置中，光學鏡頭係一個不可缺少的部件。數位相機、攝像機及手機攝像頭拍攝物體的影像品質主要取決於光學鏡頭的成像品質。對於光學鏡頭的製造而言，對光學鏡頭成像品質要求及把關的關鍵在於光學鏡頭的測試過程。 Optical cameras are an indispensable component in photographic devices such as digital cameras, camcorders, and cell phone cameras. The image quality of a digital camera, camera, and mobile phone camera is mainly determined by the imaging quality of the optical lens. For the manufacture of optical lenses, the key to the quality requirements and control of optical lenses is the testing process of optical lenses.

請參閱圖1，目前一般所採用的光學鏡頭測試裝置30由光源模組32、測試條紋圖樣34及一個取像模組36組成。光源模組32發出的光透過測試條紋圖樣34，用於提供測試光學鏡頭所需要的測試條紋圖樣。將待測光學鏡頭38放置在測試位處，用取像模組36獲取測試條紋圖樣34經光學鏡頭38所成的像。傳統的光學鏡頭測試裝置30由於光源模組32發出的光的不均勻性，可能會使得測試的結果出現較大的偏差。 Referring to FIG. 1 , the optical lens testing device 30 generally used by the present invention comprises a light source module 32 , a test strip pattern 34 and an image capturing module 36 . Light emitted by the light source module 32 passes through the test stripe pattern 34 for providing the test stripe pattern required to test the optical lens. The optical lens 38 to be tested is placed at the test position, and the image formed by the test strip pattern 34 via the optical lens 38 is obtained by the image capturing module 36. The conventional optical lens testing device 30 may cause a large deviation in the test result due to the unevenness of the light emitted by the light source module 32.

有鑒於此，有必要提供一種能夠提高測試精度的光學鏡頭測試裝置。 In view of this, it is necessary to provide an optical mirror that can improve the accuracy of the test. Head test device.

一種光學鏡頭測試裝置，依次包括：光源模組，測試條紋圖樣及取像模組。所述光源模組及測試條紋圖樣之間進一步包括一個均勻分佈有奈米級二氧化矽粒子的擴散板。 An optical lens testing device comprises: a light source module, a test stripe pattern and an image capturing module. The light source module and the test stripe pattern further include a diffusion plate uniformly distributed with nano-sized cerium oxide particles.

相對於先前技術，所述光學鏡頭測試裝置加入了含有奈米級粒子的擴散板，使得由光源模組發出的光經過擴散板後更加均勻，測量精度得到了提高。 Compared with the prior art, the optical lens testing device incorporates a diffusion plate containing nano-sized particles, so that the light emitted by the light source module is more uniform after passing through the diffusion plate, and the measurement accuracy is improved.

下面將結合附圖對本發明作進一步詳細說明。 The invention will now be described in further detail with reference to the accompanying drawings.

請參閱圖2，本發明實施例提供的光學鏡頭測試裝置10，其依次包括一個光源模組12，一個擴散板14，一個測試條紋圖樣16及一個取像模組18。 Referring to FIG. 2 , an optical lens testing device 10 according to an embodiment of the invention includes a light source module 12 , a diffusion plate 14 , a test strip pattern 16 and an image capturing module 18 .

所述光源模組12一般係冷陰極螢光燈(Cold Cathode Fluorescent Lamp,CCFL)或者發光二極體(Light emitting diode,LED)陣列。 The light source module 12 is generally a Cold Cathode Fluorescent Lamp (CCFL) or a Light Emitting Diode (LED) array.

請參閱圖3，所述擴散板14包括基板140及形成在所述基板140上的擴散膜142。所述基板140的材料可選用光學級塑膠材料，如聚甲基丙烯酸甲酯(Polymethyl Methacrylate，PMMA)，聚碳酸酯(Polycarbonate,PC)等。優選的，所述基板140的材料係光透過率高於90%的聚甲基丙烯酸甲酯。 Referring to FIG. 3 , the diffusion plate 14 includes a substrate 140 and a diffusion film 142 formed on the substrate 140 . The material of the substrate 140 can be selected from optical grade plastic materials, such as polymethyl methacrylate (PMMA), polycarbonate (PC), and the like. Preferably, the material of the substrate 140 is polymethyl methacrylate having a light transmittance higher than 90%.

所述擴散膜142採用PMMA或PC等製成，其中分佈有奈米級二氧化矽(silicon dioxide,SiO₂)粒子144。擴散膜142材料中奈米級SiO₂粒子144的品質百分比為2%至30%，優選為5%至20%。擴散膜142的厚度為200奈米至20000奈米，優選為500奈米至2000奈米。奈米級SiO₂粒子144的直徑範圍為10奈米至200奈米。其中奈米級二氧化矽粒子144可以是均勻分佈在擴散膜142中，也可以根據光源的分佈擴散其中。擴散板14對光源模組12發出的光起擴散作用，使得光源模組12發出的光經過擴散板14更加均勻。 The diffusion film 142 is made of PMMA or PC, etc., in which silicon dioxide (SiO ₂ ) particles 144 are distributed. The percentage by mass of the nano-sized SiO ₂ particles 144 in the material of the diffusion film 142 is from 2% to 30%, preferably from 5% to 20%. The diffusion film 142 has a thickness of 200 nm to 20,000 nm, preferably 500 nm to 2000 nm. The nano-sized SiO ₂ particles 144 have a diameter ranging from 10 nm to 200 nm. The nano-sized cerium oxide particles 144 may be uniformly distributed in the diffusion film 142 or may be diffused according to the distribution of the light source. The diffusing plate 14 diffuses the light emitted from the light source module 12, so that the light emitted by the light source module 12 passes through the diffusing plate 14 more uniformly.

所述測試條紋圖樣16由若干組具有不同空間頻率的黑白相間的條帶組成，其解析度範圍係每毫米36對線至每毫米200對線，優選係每毫米60對線至每毫米100對線。 The test strip pattern 16 consists of several sets of black and white strips having different spatial frequencies, ranging from 36 pairs per millimeter to 200 pairs per millimeter, preferably 60 pairs per millimeter to 100 pairs per millimeter. line.

所述取像模組18可以係電荷耦合器件(Charge Coupled Device,CCD)或互補式金屬氧化物半導體(Complementary Metal-oxide Semiconductor,CMOS)。取像模組18可在垂直於測試條紋圖樣16的方向移動，以便得到清晰的成像。所述取像模組18一般與一個資料處理裝置連接。 The image capturing module 18 can be a Charge Coupled Device (CCD) or a Complementary Metal-oxide Semiconductor (CMOS). The image capture module 18 is movable in a direction perpendicular to the test stripe pattern 16 for clear imaging. The image capturing module 18 is generally connected to a data processing device.

在使用時，由光源模組12發出的光通過擴散板14。擴散板14中的奈米級二氧化矽粒子144對光起擴散作用，使得從擴散板14發出的光更加均勻。將待測試的光學鏡頭20放置在測試條紋圖樣16與取像模組18之間。待測試的光學鏡頭20可以手動放置，也可以通過機器手等裝置放在測試臺上。擴散後的光透過測試條紋圖樣16經待測試光學鏡頭20成像在取像模組18上，對待測試的光學鏡頭20進行進一步測試。所述光學鏡頭測試裝置10加入了含有奈米級粒子的擴散板14，使得由光源模組12發出的光經過擴散板14後更加均勻，測量精度得到了提高。 Light emitted by the light source module 12 passes through the diffuser 14 during use. The nano-sized cerium oxide particles 144 in the diffusing plate 14 diffuse light to make the light emitted from the diffusing plate 14 more uniform. The optical lens 20 to be tested is placed between the test stripe pattern 16 and the image capturing module 18. The optical lens 20 to be tested can be placed manually or placed on a test stand by a robot or the like. The diffused light passes through the test stripe pattern 16 and is imaged on the image capturing module 18 via the optical lens 20 to be tested, and the optical lens 20 to be tested is further tested. The optical lens testing device 10 is added to contain The diffusion plate 14 of the nano-sized particles makes the light emitted by the light source module 12 more uniform after passing through the diffusion plate 14, and the measurement accuracy is improved.

綜上所述，本發明確已符合發明專利之要件，遂依法提出專利申請。惟，以上所述者僅係本發明之較佳實施例，自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化，皆應涵蓋於以下申請專利範圍內。 In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

10、30‧‧‧測試裝置 10, 30‧‧‧ test equipment

12、32‧‧‧光源模組 12, 32‧‧‧Light source module

14‧‧‧擴散板 14‧‧‧Diffuser

16、34‧‧‧測試條紋圖樣 16, 34‧‧‧ Test stripe pattern

18、36‧‧‧取像模組 18, 36‧‧‧ image capture module

20、38‧‧‧光學鏡頭 20, 38‧‧‧ optical lens

140‧‧‧基板 140‧‧‧Substrate

142‧‧‧擴散膜 142‧‧‧Diffuser film

144‧‧‧二氧化矽粒子 144‧‧‧2O2 particles

圖1係傳統光學鏡頭測試裝置示意圖。 Figure 1 is a schematic diagram of a conventional optical lens test device.

圖2係本發明的實施例提供的光學鏡頭測試裝置示意圖。 2 is a schematic diagram of an optical lens testing device provided by an embodiment of the present invention.

圖3係圖2中光學鏡頭測試裝置中擴散板的剖面示意圖。 3 is a schematic cross-sectional view of a diffuser plate in the optical lens test apparatus of FIG. 2.

10‧‧‧測試裝置 10‧‧‧Testing device

12‧‧‧光源模組 12‧‧‧Light source module

14‧‧‧擴散板 14‧‧‧Diffuser

16‧‧‧測試條紋圖樣 16‧‧‧Test stripe pattern

18‧‧‧取像模組 18‧‧‧Image capture module

20‧‧‧光學鏡頭 20‧‧‧Optical lens

Claims

一種光學鏡頭測試裝置，其依次包括：光源模組，測試條紋圖樣及取像模組，其中，所述光源模組及測試條紋圖樣之間進一步包括一個分佈有奈米級二氧化矽粒子的擴散板，所述擴散板包括基板及形成在所述基板上的擴散膜，所述奈米級二氧化矽粒子根據光源模組的分布擴散在所述擴散膜中。 An optical lens testing device comprises: a light source module, a test stripe pattern and an image capturing module, wherein the light source module and the test stripe pattern further comprise a diffusion of nano-sized cerium oxide particles; a plate comprising a substrate and a diffusion film formed on the substrate, wherein the nano-sized cerium oxide particles are diffused in the diffusion film according to a distribution of the light source module.

如申請專利範圍第1項所述之光學鏡頭測試裝置，其中，所述基板的材料係聚甲基丙烯酸甲酯或聚碳酸酯。 The optical lens testing device of claim 1, wherein the material of the substrate is polymethyl methacrylate or polycarbonate.

如申請專利範圍第1項所述之光學鏡頭測試裝置，其中，所述基板的材料係光透過率高於90%的聚甲基丙烯酸甲酯。 The optical lens testing device according to claim 1, wherein the material of the substrate is polymethyl methacrylate having a light transmittance higher than 90%.

如申請專利範圍第1項所述之光學鏡頭測試裝置，其中，所述擴散膜的材料為奈米級二氧化矽粒子與甲基丙烯酸甲酯的混合物或奈米級二氧化矽粒子與聚碳酸酯的混合物。 The optical lens testing device according to claim 1, wherein the material of the diffusion film is a mixture of nano-sized cerium oxide particles and methyl methacrylate or nano-sized cerium oxide particles and polycarbonate. a mixture of esters.

如申請專利範圍第4項所述之光學鏡頭測試裝置，其中，所述擴散膜的材料中，奈米級二氧化矽粒子的品質百分比為2%至30%。 The optical lens testing device of claim 4, wherein the material of the diffusion film has a quality percentage of the nano-sized cerium oxide particles of 2% to 30%.

如申請專利範圍第1項所述之光學鏡頭測試裝置，其中，所述擴散膜的厚度係200奈米至20000奈米。 The optical lens testing device of claim 1, wherein the diffusion film has a thickness of 200 nm to 20,000 nm.

如申請專利範圍第1項所述之光學鏡頭測試裝置，其中，所述擴散膜的厚度係500奈米至2000奈米。 The optical lens testing device according to claim 1, wherein the diffusion film has a thickness of 500 nm to 2000 nm.

如申請專利範圍第1項所述之光學鏡頭測試裝置，其中，所述奈米級二氧化矽粒子的直徑範圍係10奈米至200奈米。 The optical lens testing device according to claim 1, wherein the nanometer cerium oxide particles have a diameter ranging from 10 nm to 200 nm.

一種光學鏡頭測試裝置，其依次包括：光源模組，測試條紋圖樣及取像模組，其中，所述光源模組發出的光經過一擴散板後照射在測試條紋圖樣上，所述擴散板分佈有奈米級二氧化矽粒子。 An optical lens testing device includes: a light source module, a test stripe pattern, and an image capturing module, wherein the light emitted by the light source module is irradiated onto the test stripe pattern after passing through a diffusion plate, and the diffusing plate is distributed. There are nano-sized cerium oxide particles.