TWI347444B - Inspection method for display panels - Google Patents

Inspection method for display panels

Info

Publication number
TWI347444B
TWI347444B TW096112082A TW96112082A TWI347444B TW I347444 B TWI347444 B TW I347444B TW 096112082 A TW096112082 A TW 096112082A TW 96112082 A TW96112082 A TW 96112082A TW I347444 B TWI347444 B TW I347444B
Authority
TW
Taiwan
Prior art keywords
display panels
inspection method
inspection
panels
display
Prior art date
Application number
TW096112082A
Other languages
Chinese (zh)
Other versions
TW200841028A (en
Inventor
Hong Ji Huang
chao cheng Lin
Wei Yi Chien
Original Assignee
Au Optronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Au Optronics Corp filed Critical Au Optronics Corp
Priority to TW096112082A priority Critical patent/TWI347444B/en
Publication of TW200841028A publication Critical patent/TW200841028A/en
Application granted granted Critical
Publication of TWI347444B publication Critical patent/TWI347444B/en

Links

TW096112082A 2007-04-04 2007-04-04 Inspection method for display panels TWI347444B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW096112082A TWI347444B (en) 2007-04-04 2007-04-04 Inspection method for display panels

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW096112082A TWI347444B (en) 2007-04-04 2007-04-04 Inspection method for display panels

Publications (2)

Publication Number Publication Date
TW200841028A TW200841028A (en) 2008-10-16
TWI347444B true TWI347444B (en) 2011-08-21

Family

ID=44821403

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096112082A TWI347444B (en) 2007-04-04 2007-04-04 Inspection method for display panels

Country Status (1)

Country Link
TW (1) TWI347444B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI383151B (en) * 2009-04-02 2013-01-21 Cantilever probe card for image sensing wafer testing
TWI499788B (en) 2013-04-29 2015-09-11 E Ink Holdings Inc Method of inspection for pixel array substrate and inspection apparatus for pixel array substrate

Also Published As

Publication number Publication date
TW200841028A (en) 2008-10-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees