TWI346201B - Method for inspecting a transparent film for foreign material - Google Patents
Method for inspecting a transparent film for foreign materialInfo
- Publication number
- TWI346201B TWI346201B TW093120966A TW93120966A TWI346201B TW I346201 B TWI346201 B TW I346201B TW 093120966 A TW093120966 A TW 093120966A TW 93120966 A TW93120966 A TW 93120966A TW I346201 B TWI346201 B TW I346201B
- Authority
- TW
- Taiwan
- Prior art keywords
- inspecting
- transparent film
- foreign material
- foreign
- transparent
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Optics & Photonics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003204497A JP4396160B2 (en) | 2003-07-31 | 2003-07-31 | Foreign film inspection method for transparent film |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200506354A TW200506354A (en) | 2005-02-16 |
TWI346201B true TWI346201B (en) | 2011-08-01 |
Family
ID=34263485
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093120966A TWI346201B (en) | 2003-07-31 | 2004-07-14 | Method for inspecting a transparent film for foreign material |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4396160B2 (en) |
KR (1) | KR101125997B1 (en) |
CN (1) | CN100582752C (en) |
TW (1) | TWI346201B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI593958B (en) * | 2012-05-10 | 2017-08-01 | 東友精細化工有限公司 | Method for discriminating defect of optical film |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006275843A (en) * | 2005-03-30 | 2006-10-12 | Nitto Denko Corp | Method of inspecting contamination in insulating film for wiring circuit board |
KR100688094B1 (en) | 2006-05-04 | 2007-03-02 | 삼성전기주식회사 | Exposure method and apparatus |
JP4960161B2 (en) * | 2006-10-11 | 2012-06-27 | 日東電工株式会社 | Inspection data processing apparatus and inspection data processing method |
JP5024935B2 (en) * | 2007-01-16 | 2012-09-12 | 富士フイルム株式会社 | Device and method for detecting defect of light transmitting member |
JP5167731B2 (en) * | 2007-09-06 | 2013-03-21 | 大日本印刷株式会社 | Inspection apparatus and method |
KR101428816B1 (en) | 2007-09-28 | 2014-08-12 | 엘지전자 주식회사 | Method for reselecting a cell and detecting whether a terminal is stationay in mobile telecommunications system |
US8207508B2 (en) * | 2008-03-08 | 2012-06-26 | Lawless John L | Device and method for quantifying a surface's cleanliness |
JP5258349B2 (en) * | 2008-03-28 | 2013-08-07 | 富士フイルム株式会社 | Defect detection apparatus and method |
JP5446232B2 (en) * | 2008-04-10 | 2014-03-19 | 凸版印刷株式会社 | Defect inspection apparatus and defect inspection method for color filter substrate |
CN101672803B (en) * | 2008-09-08 | 2011-12-07 | 中国建筑材料科学研究总院 | Method and device for detecting impurities and defects of tempered glass curtain wall |
CN101968453B (en) * | 2009-12-01 | 2012-05-09 | 北京理工大学 | Polarization detection method and device for white and colorless foreign matters in cotton |
JP5274622B2 (en) * | 2011-06-27 | 2013-08-28 | 富士フイルム株式会社 | Defect inspection apparatus and method |
KR101349662B1 (en) * | 2013-05-16 | 2014-01-13 | 동우 화인켐 주식회사 | Method for discriminating defect of optical films |
JP6156820B2 (en) * | 2013-08-22 | 2017-07-05 | 住友化学株式会社 | Defect inspection apparatus, optical member manufacturing system, and optical display device production system |
JP6220653B2 (en) * | 2013-11-28 | 2017-10-25 | シャープ株式会社 | Optical position detection device and electronic apparatus using the same |
KR101697071B1 (en) * | 2014-04-18 | 2017-01-17 | 동우 화인켐 주식회사 | Method for discriminating defect of polarizing plate |
KR101581385B1 (en) * | 2014-05-21 | 2015-12-31 | 주식회사 넥스트아이 | Instant boiledrice container examination method |
CN104390976A (en) * | 2014-11-12 | 2015-03-04 | 河北铠朗新型材料科技有限公司 | Online film coating monitoring system |
WO2016194874A1 (en) * | 2015-06-05 | 2016-12-08 | 住友化学株式会社 | Inspection method for defects in light transmissive film, manufacturing method for linear polarizer film, and manufcturing method for polarizing plate |
CN206583816U (en) * | 2015-12-15 | 2017-10-24 | 住友化学株式会社 | Defect inspection filming apparatus, defect inspecting system and film manufacturing device |
CN105699395A (en) * | 2016-02-04 | 2016-06-22 | 成都泓睿科技有限责任公司 | Method for detecting liquid surface foreign matter of transparent glass bottles |
CN109781743A (en) * | 2017-11-14 | 2019-05-21 | 鹤立精工股份有限公司 | Optical detecting method |
CN108254426A (en) * | 2017-12-15 | 2018-07-06 | 新乡医学院 | It is prepared for dopamine concentration detection miniature electrochemical in animal brain |
CN109187577A (en) * | 2018-08-29 | 2019-01-11 | 深圳市盛波光电科技有限公司 | A kind of polaroid recessiveness defect light detection means and method |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4440485B2 (en) * | 2000-03-08 | 2010-03-24 | 富士フイルム株式会社 | Film defect inspection apparatus, defect inspection system, defect inspection method, and method for manufacturing film having birefringence characteristics |
-
2003
- 2003-07-31 JP JP2003204497A patent/JP4396160B2/en not_active Expired - Fee Related
-
2004
- 2004-07-14 TW TW093120966A patent/TWI346201B/en not_active IP Right Cessation
- 2004-07-27 KR KR1020040058780A patent/KR101125997B1/en not_active IP Right Cessation
- 2004-07-29 CN CN200410055732A patent/CN100582752C/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI593958B (en) * | 2012-05-10 | 2017-08-01 | 東友精細化工有限公司 | Method for discriminating defect of optical film |
Also Published As
Publication number | Publication date |
---|---|
KR20050014684A (en) | 2005-02-07 |
CN1580749A (en) | 2005-02-16 |
JP4396160B2 (en) | 2010-01-13 |
CN100582752C (en) | 2010-01-20 |
TW200506354A (en) | 2005-02-16 |
KR101125997B1 (en) | 2012-03-19 |
JP2005049158A (en) | 2005-02-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |