TWI315898B - Device probing using a matching device - Google Patents
Device probing using a matching deviceInfo
- Publication number
- TWI315898B TWI315898B TW095102079A TW95102079A TWI315898B TW I315898 B TWI315898 B TW I315898B TW 095102079 A TW095102079 A TW 095102079A TW 95102079 A TW95102079 A TW 95102079A TW I315898 B TWI315898 B TW I315898B
- Authority
- TW
- Taiwan
- Prior art keywords
- probing
- matching
- matching device
- device probing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/44—Modifications of instruments for temperature compensation
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/428,572 US6984996B2 (en) | 2003-05-01 | 2003-05-01 | Wafer probing that conditions devices for flip-chip bonding |
US10/718,031 US7405581B2 (en) | 2003-05-01 | 2003-11-19 | Probing system uses a probe device including probe tips on a surface of a semiconductor die |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200633108A TW200633108A (en) | 2006-09-16 |
TWI315898B true TWI315898B (en) | 2009-10-11 |
Family
ID=33310437
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095102079A TWI315898B (en) | 2003-05-01 | 2004-04-15 | Device probing using a matching device |
Country Status (3)
Country | Link |
---|---|
US (4) | US6984996B2 (zh) |
CN (2) | CN1798977B (zh) |
TW (1) | TWI315898B (zh) |
Families Citing this family (48)
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KR100714752B1 (ko) * | 2002-04-25 | 2007-05-07 | 가부시키가이샤 아드반테스트 | 전자부품 시험장치 |
TWI292196B (en) * | 2002-09-30 | 2008-01-01 | Via Tech Inc | Flip chip test structure |
US20040239350A1 (en) * | 2003-05-30 | 2004-12-02 | Nagar Mohan R. | Novel solution for low cost, speedy probe cards |
DE10345377B4 (de) * | 2003-09-30 | 2009-07-30 | Qimonda Ag | Halbleitermodul und Verfahren zur Herstellung eines Halbleitermoduls |
US20050073605A1 (en) * | 2003-10-06 | 2005-04-07 | Burns Jeffrey H. | Integrated optical filter |
WO2006002334A2 (en) * | 2004-06-24 | 2006-01-05 | Celerity Research Inc. | Intelligent probe chips/heads |
JP2006156544A (ja) * | 2004-11-26 | 2006-06-15 | Denso Corp | 基板の実装構造およびその実装方法 |
WO2006096549A2 (en) * | 2005-03-04 | 2006-09-14 | Omniprobe, Inc. | Apparatus and method for automated stress testing of flip-chip packages |
US7492146B2 (en) * | 2005-05-16 | 2009-02-17 | Teradyne, Inc. | Impedance controlled via structure |
US8436636B2 (en) * | 2006-10-10 | 2013-05-07 | Apple Inc. | Methods and apparatuses for testing circuit boards |
US8362793B2 (en) * | 2006-11-07 | 2013-01-29 | Apple Inc. | Circuit boards including removable test point portions and configurable testing platforms |
TW200918917A (en) * | 2007-10-16 | 2009-05-01 | Compal Electronics Inc | Testing probe and electrical connection method using the same |
US8131531B2 (en) * | 2007-11-30 | 2012-03-06 | Verigy (Singapore) Pte. Ltd. | System and method for simulating a semiconductor wafer prober and a class memory test handler |
US8056025B1 (en) * | 2008-02-21 | 2011-11-08 | Altera Corporation | Integration of open space/dummy metal at CAD for physical debug of new silicon |
JP5135585B2 (ja) * | 2008-07-25 | 2013-02-06 | セイコーインスツル株式会社 | サーマルヘッドの製造方法 |
US20100044416A1 (en) * | 2008-08-21 | 2010-02-25 | Nec Corporation | Method of manufacturing electronic components having bump |
WO2010038433A1 (ja) * | 2008-09-30 | 2010-04-08 | ローム株式会社 | プローブカードの製造方法、プローブカード、半導体装置の製造方法およびプローブの形成方法 |
US9110128B1 (en) | 2008-10-03 | 2015-08-18 | Altera Corporation | IC package for pin counts less than test requirements |
MY155882A (en) | 2009-03-10 | 2015-12-15 | Johnstech Int Corp | Electrically conductive pins for microcircuit tester |
JPWO2010109740A1 (ja) * | 2009-03-27 | 2012-09-27 | 株式会社アドバンテスト | 試験装置、試験方法および製造方法 |
US20130002285A1 (en) | 2010-03-10 | 2013-01-03 | Johnstech International Corporation | Electrically Conductive Pins For Microcircuit Tester |
US7987591B2 (en) * | 2009-08-13 | 2011-08-02 | International Business Machines Corporation | Method of forming silicon chicklet pedestal |
US8253431B2 (en) * | 2010-05-20 | 2012-08-28 | Advanced Semiconductor Engineering, Inc. | Apparatus and method for testing non-contact pads of a semiconductor device to be tested |
TWI534432B (zh) | 2010-09-07 | 2016-05-21 | 瓊斯科技國際公司 | 用於微電路測試器之電氣傳導針腳 |
US9007082B2 (en) | 2010-09-07 | 2015-04-14 | Johnstech International Corporation | Electrically conductive pins for microcircuit tester |
KR101109401B1 (ko) | 2010-10-05 | 2012-01-30 | 삼성전기주식회사 | 기판의 코이닝-전기검사 장치 |
CN102288858A (zh) * | 2011-05-19 | 2011-12-21 | 昆山鑫立电子科技有限公司 | 一种用于印制电路板的检测装置 |
US20140125352A1 (en) * | 2011-07-05 | 2014-05-08 | Nokia Corporation | Apparatus, system, method and computer program for testing an electrical connection |
US9194887B2 (en) * | 2012-11-15 | 2015-11-24 | Advantest America, Inc. | Fine pitch probes for semiconductor testing, and a method to fabricate and assemble same |
CN103730376B (zh) * | 2012-10-15 | 2018-04-03 | 华邦电子股份有限公司 | 封装测试方法 |
CN103779250B (zh) * | 2012-10-22 | 2017-02-15 | 展讯通信(上海)有限公司 | 用于倒装芯片的电学测试的装置和方法 |
US9207275B2 (en) * | 2012-12-14 | 2015-12-08 | International Business Machines Corporation | Interconnect solder bumps for die testing |
KR102090578B1 (ko) * | 2013-05-06 | 2020-03-19 | 삼성디스플레이 주식회사 | 전자 장치의 기판, 이를 포함하는 전자 장치 및 접속부의 저항 측정 방법 |
CN103926430B (zh) * | 2014-04-23 | 2016-09-21 | 华进半导体封装先导技术研发中心有限公司 | 一种硅通孔转接板测试方法 |
US20170023617A1 (en) * | 2015-06-10 | 2017-01-26 | Translarity, Inc. | Shaping of contact structures for semiconductor test, and associated systems and methods |
CN104914339A (zh) * | 2015-06-10 | 2015-09-16 | 中国航天科技集团公司第九研究院第七七一研究所 | 一种面向ate机台的高速测试***及其加工方法 |
TWI593982B (zh) * | 2016-03-04 | 2017-08-01 | 中華精測科技股份有限公司 | 探針卡檢測設備 |
US10001508B2 (en) * | 2016-06-17 | 2018-06-19 | International Business Machines Corporation | Integrated self-coining probe |
KR102252595B1 (ko) * | 2017-04-18 | 2021-05-17 | 삼성전자주식회사 | 프로브 및 이를 포함하는 프로브 카드 |
US20180358321A1 (en) * | 2017-06-13 | 2018-12-13 | International Business Machines Corporation | Pressing solder bumps to match probe profile during wafer level testing |
CN109115391B (zh) * | 2017-06-26 | 2024-06-04 | 华景传感科技(无锡)有限公司 | 一种mems压力传感器 |
TWI668058B (zh) * | 2017-07-18 | 2019-08-11 | 漢民測試系統股份有限公司 | 探針清潔裝置 |
US10269611B1 (en) * | 2017-11-30 | 2019-04-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and apparatus for bonding semiconductor devices |
CN109900931B (zh) * | 2017-12-08 | 2021-03-30 | 京元电子股份有限公司 | 半导体组件测试连接接口 |
CN110007117A (zh) * | 2018-01-05 | 2019-07-12 | 旺矽科技股份有限公司 | 探针卡 |
KR102457527B1 (ko) * | 2018-01-25 | 2022-10-21 | 한화정밀기계 주식회사 | 플립 칩의 플럭스 도포 상태 검사 방법 |
CN108710009A (zh) * | 2018-08-02 | 2018-10-26 | 上海泽丰半导体科技有限公司 | 一种悬臂式探针卡 |
CN112924844A (zh) * | 2019-12-06 | 2021-06-08 | 迪科特测试科技(苏州)有限公司 | 探测装置 |
Family Cites Families (38)
Publication number | Priority date | Publication date | Assignee | Title |
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US4585991A (en) * | 1982-06-03 | 1986-04-29 | Texas Instruments Incorporated | Solid state multiprobe testing apparatus |
US4916002A (en) * | 1989-01-13 | 1990-04-10 | The Board Of Trustees Of The Leland Jr. University | Microcasting of microminiature tips |
US5055778A (en) * | 1989-10-02 | 1991-10-08 | Nihon Denshizairyo Kabushiki Kaisha | Probe card in which contact pressure and relative position of each probe end are correctly maintained |
US5177439A (en) * | 1991-08-30 | 1993-01-05 | U.S. Philips Corporation | Probe card for testing unencapsulated semiconductor devices |
US5289631A (en) | 1992-03-04 | 1994-03-01 | Mcnc | Method for testing, burn-in, and/or programming of integrated circuit chips |
KR970010656B1 (ko) * | 1992-09-01 | 1997-06-30 | 마쯔시다 덴기 산교 가부시끼가이샤 | 반도체 테스트 장치, 반도체 테스트 회로칩 및 프로브 카드 |
JPH06232233A (ja) * | 1992-12-23 | 1994-08-19 | Honeywell Inc | 裸ダイの試験装置 |
JP2710544B2 (ja) * | 1993-09-30 | 1998-02-10 | インターナショナル・ビジネス・マシーンズ・コーポレイション | プローブ構造、プローブ構造の形成方法 |
US6064213A (en) * | 1993-11-16 | 2000-05-16 | Formfactor, Inc. | Wafer-level burn-in and test |
KR100248569B1 (ko) | 1993-12-22 | 2000-03-15 | 히가시 데쓰로 | 프로우브장치 |
US5513430A (en) | 1994-08-19 | 1996-05-07 | Motorola, Inc. | Method for manufacturing a probe |
JPH0883825A (ja) * | 1994-09-09 | 1996-03-26 | Tokyo Electron Ltd | プローブ装置 |
US5808474A (en) | 1994-11-30 | 1998-09-15 | Lsi Logic Corporation | Test socket for testing integrated circuit packages |
US5828225A (en) | 1995-07-05 | 1998-10-27 | Tokyo Electron Limited | Semiconductor wafer probing apparatus |
JPH09321102A (ja) | 1996-05-31 | 1997-12-12 | Tokyo Electron Ltd | 検査装置 |
US5909123A (en) | 1996-11-08 | 1999-06-01 | W. L. Gore & Associates, Inc. | Method for performing reliability screening and burn-in of semi-conductor wafers |
US6551844B1 (en) * | 1997-01-15 | 2003-04-22 | Formfactor, Inc. | Test assembly including a test die for testing a semiconductor product die |
US6060891A (en) | 1997-02-11 | 2000-05-09 | Micron Technology, Inc. | Probe card for semiconductor wafers and method and system for testing wafers |
US6028437A (en) | 1997-05-19 | 2000-02-22 | Si Diamond Technology, Inc. | Probe head assembly |
US6285201B1 (en) * | 1997-10-06 | 2001-09-04 | Micron Technology, Inc. | Method and apparatus for capacitively testing a semiconductor die |
US6048750A (en) * | 1997-11-24 | 2000-04-11 | Micron Technology, Inc. | Method for aligning and connecting semiconductor components to substrates |
US6080650A (en) * | 1998-02-04 | 2000-06-27 | Texas Instruments Incorporated | Method and apparatus for attaching particles to a substrate |
US6426636B1 (en) | 1998-02-11 | 2002-07-30 | International Business Machines Corporation | Wafer probe interface arrangement with nonresilient probe elements and support structure |
US6246250B1 (en) * | 1998-05-11 | 2001-06-12 | Micron Technology, Inc. | Probe card having on-board multiplex circuitry for expanding tester resources |
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US6456099B1 (en) * | 1998-12-31 | 2002-09-24 | Formfactor, Inc. | Special contact points for accessing internal circuitry of an integrated circuit |
JP2001007165A (ja) * | 1999-06-21 | 2001-01-12 | Mitsubishi Electric Corp | プローブカード装置 |
US6249136B1 (en) * | 1999-06-28 | 2001-06-19 | Advanced Micro Devices, Inc. | Bottom side C4 bumps for integrated circuits |
US6400173B1 (en) | 1999-11-19 | 2002-06-04 | Hitachi, Ltd. | Test system and manufacturing of semiconductor device |
US6426637B1 (en) | 1999-12-21 | 2002-07-30 | Cerprobe Corporation | Alignment guide and signal transmission apparatus and method for spring contact probe needles |
US6563215B1 (en) * | 2000-01-10 | 2003-05-13 | Micron Technology, Inc. | Silicon carbide interconnect for semiconductor components and method of fabrication |
US6426638B1 (en) * | 2000-05-02 | 2002-07-30 | Decision Track Llc | Compliant probe apparatus |
US6344684B1 (en) * | 2000-07-06 | 2002-02-05 | Advanced Micro Devices, Inc. | Multi-layered pin grid array interposer apparatus and method for testing semiconductor devices having a non-pin grid array footprint |
US6379982B1 (en) * | 2000-08-17 | 2002-04-30 | Micron Technology, Inc. | Wafer on wafer packaging and method of fabrication for full-wafer burn-in and testing |
US6695623B2 (en) * | 2001-05-31 | 2004-02-24 | International Business Machines Corporation | Enhanced electrical/mechanical connection for electronic devices |
US6912778B2 (en) * | 2001-07-19 | 2005-07-05 | Micron Technology, Inc. | Methods of fabricating full-wafer silicon probe cards for burn-in and testing of semiconductor devices |
US6621710B1 (en) | 2002-07-19 | 2003-09-16 | Chipmos Technologies (Bermuda) Ltd. | Modular probe card assembly |
US7112975B1 (en) * | 2003-03-26 | 2006-09-26 | Cypress Semiconductor Corporation | Advanced probe card and method of fabricating same |
-
2003
- 2003-05-01 US US10/428,572 patent/US6984996B2/en not_active Expired - Fee Related
- 2003-11-19 US US10/718,031 patent/US7405581B2/en not_active Expired - Lifetime
- 2003-11-19 US US10/718,503 patent/US6975127B2/en not_active Expired - Fee Related
-
2004
- 2004-04-15 TW TW095102079A patent/TWI315898B/zh not_active IP Right Cessation
- 2004-04-27 CN CN2004800151275A patent/CN1798977B/zh not_active Expired - Fee Related
- 2004-04-27 CN CNB2004800156851A patent/CN100514751C/zh not_active Expired - Fee Related
-
2005
- 2005-06-14 US US11/153,018 patent/US20050231222A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US20040217767A1 (en) | 2004-11-04 |
US20040217769A1 (en) | 2004-11-04 |
US6975127B2 (en) | 2005-12-13 |
US20050231222A1 (en) | 2005-10-20 |
US20040217770A1 (en) | 2004-11-04 |
US6984996B2 (en) | 2006-01-10 |
CN1802775A (zh) | 2006-07-12 |
US7405581B2 (en) | 2008-07-29 |
TW200633108A (en) | 2006-09-16 |
CN1798977A (zh) | 2006-07-05 |
CN100514751C (zh) | 2009-07-15 |
CN1798977B (zh) | 2010-06-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |