TWI297079B

TWI297079B -

Info

Publication number: TWI297079B
Application number: TW92136450A
Authority: TW
Inventors: Hsi Hua Hsiao; Cheng Te Chen; Wei Min Cehn; Yung Yi Lin
Original assignee: Jet Technology Co Ltd
Priority date: 2003-12-22
Filing date: 2003-12-22
Publication date: 2008-05-21
Also published as: TW200521451A

Description

1297079 五、發明說明（1) 【發明所屬之技術本發明係提供 ’尤指利用電腦輔路板）上之定位點點之座標的距離長間之高頻阻抗值，【先前技術】按，現今高科的電子產品也具有子產品時的快速與會，因而許多科技、音響、家電用品活環境週遭提供生在各種各式的電子電路板，且在電路式電子零件，然該造成電子零件的損的運作速度越快則產品會不穩甚至當阻抗是否準確合袼是否短路及電子零良品去除，以提供而如公告第五係公告於民國九十領域】一種電路板之檢助設計（C A D ) 及複數待測點之度並經換算成量以符合預設之高測定位方法及測試機構圖檔設定待測試板（電座標值，且計算出待測測參數，而獲得待測點頻阻抗的波形。技電子資相當優越便捷，也電子化產、電話、活上、工、電器產板上佈設電路板在壞或電子其高頻特機，所以、印刷電件是否損合格的電四〇七〇一年七月訊業的的功能帶領人品相應休閒娛作上及品中都有複雜製造、迴路之性越是必須偵路是否壞等，路板供三號之一日之蓬勃發，提供類走向而生，樂器具休閒娛設置有的電子加工的阻斷，重要，測電路導通、以將有電子產『電路專利公展，許多使用者在高科技的舉凡電腦等，在人樂時的方控制執行迴路及裝作業過程是以，在若高頻特板上線路不可導通瑕疲的電品使用。板測試機報，申請高價值使用電文明社、電視類的生便，而動作的設有各中，會電路板性不好之南頻之迴路路板不1297079 V. INSTRUCTIONS (1) [Technical Fields of the Invention The present invention provides high-frequency impedance values between the long distances of the coordinates of the positioning points on the computer, especially the computer auxiliary circuit board, [Prior Art] Press, nowadays The electronic products also have a quick meeting with the sub-products, so many technology, audio, and home appliances are provided around the various electronic circuit boards in the living environment, and in the circuit-type electronic parts, the operation of the electronic parts is damaged. The faster the speed, the more unstable the product will be, and even if the impedance is correct, whether it is short-circuited or the electronic zero-goods are removed, so as to provide the announcement of the fifth series in the 90th field of the Republic of China.] A circuit board's help design (CAD) and plural The degree of the point to be measured is converted into a quantity to meet the preset high-position method and the test mechanism image to set the board to be tested (electric coordinate value, and the parameter to be measured is calculated, and the waveform of the frequency impedance to be measured is obtained. Technical and electronic resources are quite superior and convenient, and electronic circuit production, telephone, live, industrial, electrical production boards are laid out in bad or electric Its high-frequency special machine, so, whether the printed electrical parts are damaged or not, the function of the industry is leading to the complex entertainment and the more the circuit is. It is necessary to detect whether the road is bad or not. The road plate is used for one of the three days of the day, providing a kind of life-oriented, musical instruments with entertainment and entertainment, and some electronic processing blocks, important, measuring circuit conduction, to have electronic products. The circuit patent exhibition, many users in the high-tech computer, etc., in the human music control circuit and the loading process is used, if the high-frequency special board can not lead to the use of electrical products. The test machine reported that it applied for the high-value use of the civilized society and the television class, and the action circuit was equipped with a circuit board of the south frequency that was not good in circuit board.

1297079 其係用以測試，而定位在該上，藉該下治具與點以進行在X軸方進行位置轉角度微第二調整步具有複該調整台周緣所在區第一調整板、該第二五、發明說明（2) 九一二〇三組得以對一調整台上之電路板固定治具方向移板上下兩面該調整整板、一可在X Y軸平使該等第_ 合，而該調裝置係位於可同時將該互夾緊而定得以固定；該壓板移動該壓板與頂二四一號，電路板進行下治具及一在該下治具動’使得該之電路測試台具有一可在Y軸方向面上進行旋調整板、該整台更進一位於該底座而該頂座與至最接近該座之相對位上，使得該壓板之頂座之位置。定位一治具組，使該治具該治具組包含有一定位在壓板上之上治具，使得該壓板帶動該上治具向該下該上治具分別接觸該電路測試，其特徵在於：向進行位置微調之第一調微調之第二調整板及一可調之第三調整板及底板，板及該第三調整板相互疊數鎖定裝置，使該等鎖定域之内部，藉該鎖定裝置調整板及該第三調整板相該下治具之位置在調整後間更設有一保險裝置，在置時，該保險裝置可固定上述之電路板測試機，其治具的調整必須透過x軸、 Y轴方向及XY平面的旋轉角度之微調，而使上、下治旦對位於電路板之上、下兩面，於使用上為存在有諸多的缺失與不便，例如：時，必須微調第一調整板 ’相當耗時、費工。即必須重新進行一次微調 1、電路板在調整台上進行對位、第二調整板及第三調整板 2、調整台上每更換一片電路板1297079 is used for testing, and is positioned on the upper fixture, and the point is used to perform positional rotation on the X-axis side. The second adjustment step has a first adjustment plate in the area where the adjustment table is located. 25. Description of the invention (2) The 9112 group can adjust the whole plate on the upper and lower sides of the board fixing fixture on an adjustment stage, and the level can be adjusted on the XY axis. The adjusting device is located at the same time and can be fixed by clamping each other; the pressing plate moves the pressing plate and the top 241, the circuit board performs the lower jig and a circuit in the lower pressing device makes the circuit test bench The utility model has a rotary adjustment plate which can be arranged on the Y-axis direction surface, and the whole table is further located on the base, and the top seat is located at an opposite position to the seat closest to the seat, so that the top seat of the pressure plate is located. Locating a fixture assembly, the fixture assembly includes a fixture positioned on the pressure plate, such that the pressure plate drives the upper fixture to contact the circuit test respectively to the lower fixture, wherein: a second adjustment plate for fine-tuning the first fine adjustment and an adjustable third adjustment plate and a bottom plate, and the third adjustment plate are stacked with each other to lock the inside of the locking domains The position of the lower adjustment tool of the device adjustment plate and the third adjustment plate is further provided with a safety device after adjustment. When the device is installed, the safety device can fix the circuit board test machine, and the adjustment of the fixture must pass through x. The fine adjustment of the rotation angle of the axis, the Y-axis direction and the XY plane, so that the upper and lower governance are located on the upper and lower sides of the circuit board, there are many defects and inconveniences in use, for example: An adjustment plate is quite time consuming and labor intensive. That is, it must be re-tuned once. 1. The board is aligned on the adjustment table, the second adjustment board and the third adjustment board. 2. Each board is replaced on the adjustment stage.

1297079 五、發明說明（3) 校正、對位，且每次調整都是三個，使用相當不便。 α調整板分三次調整 3、在依序微調各調整板時，後調整之調整塑 4 调整過的調整板產生偏移而必須重新調敕。以曰調整台之第一調整板、第二調整板及；：調 5 以鎖定裝置夹緊固定，在夹緊的過程中“ 使各凋正板產生位移，而造成固定位置偏移。各調整板的微調必須謹慎、仔細，而且不能偏差過大，所以必須以具專業知識者才能進 = 業’使用的限制條件較嚴格。 s°乍此> I:ί Ϊ善上列習用電路板測試、偵測的缺失，即為的空間。丨。之廄、-所在’同時亦存在有諸多可改善【發明内容】由多於上述缺失，乃搜集相關資料，經 _由不斷试作與修改，始設計出此種設定基準點1297079 V. Description of invention (3) Correction, alignment, and each adjustment is three, the use is quite inconvenient. The α adjustment plate is adjusted three times. 3. When the adjustment plates are fine-tuned in sequence, the adjustment of the rear adjustment is made. The adjusted adjustment plate has an offset and must be re-tune. The first adjustment plate and the second adjustment plate of the adjustment table are adjusted by the locking device, and the locking device is clamped and fixed. During the clamping process, the displacement of each of the positive plates is caused, and the fixed position is offset. The fine-tuning of the board must be cautious and careful, and it should not be too large, so it must be stricter to use the professional knowledge. s°乍此> I: Ϊ 上上上上上上上上上上上The lack of detection is the space. 丨廄廄 - - - - - - ' ' ' ' ' 同时同时发明发明发明发明发明发明发明发明发明发明发明发明发明由由由由由由由由由由由由由由由由由由Designing such a set reference point

t & π $ ϋ ^ ί 點間高頻阻抗之檢挪的H 扳之松劂疋位方法及測試機構。电峪 i 2之主要目的在於藉由電路板之檢測定饭方、夫而以電細輔助設計（C A D)圖檔設定待測試板（=法， )上之定位點及趨鉍炷、目，丨科 Λ ^ k即電路板值計算出τ r 點；座標值；f將待測點之座標從π φ收也長度，並轉換成阻抗量測參敫，而7 獲付電路板上待測點間之高頻阻抗值。而可t & π $ ϋ ^ ί H-spinning method and test mechanism for the detection of high-frequency impedance between points. The main purpose of the electric 峪i 2 is to set the positioning point and the trend and the target on the board to be tested (= method, ) by means of the board to determine the rice cooker and the electric fine assist design (CAD) image file.丨科Λ ^ k is the board value to calculate the τ r point; coordinate value; f the coordinates of the point to be measured from π φ to the length, and converted into impedance measurement parameters, and 7 paid circuit board to be tested The high frequency impedance value between the points. But

TO 1297079 五、發明說明（4) 本發明之次要目的係在於測試機構、複數定位裝置、指標裝置等裝置，該測試平台上方並可投射雷射光於測試平台上依雷射光指示的位置而逐一設置定裝置於測试平台上成為待測點的支撐塾件，以供待測試板快速定位於測試平台本發明之再一目的在於各支撐墊塊的待測點下方，俾使待測試板於測試過變形。【實施方式】為達成上述之目的及功效，本發明及其定位方法，茲繪圖就本發明之較佳特徵與功能如下，俾利完全瞭解。請參閱第一、二圖所示，係為本發流程圖、電路板上選擇基準點之示意圖施步驟，依序為： (A )呼叫電腦辅助設計（c A D )圖檔之迴路； (B )以C C D尋找待測試板上的基準板之對角位置的定位孔為基準孔值； (C )以基準點之座標值為基準，計算待測點、定位點的座標值； (D )以各待測點的座標值經過計算，為包括有測試平台指標裝置為設置於台上，並於側試平位裝置，俾使定位塊、定位點之固定上。為墊設於待測試板程不致凹陷或彎曲所採用之測試機構實施例詳加說明其明之檢測定位方法 ’其定位方法之實操取待測試板上點（通常以待測試位），並設定座標出待測試板上的各而獲得待測點間之TO 1297079 V. INSTRUCTION DESCRIPTION (4) The secondary object of the present invention is a test mechanism, a plurality of positioning devices, an index device, and the like. The test platform is above and can project laser light on the test platform according to the position indicated by the laser light. Setting a support device on the test platform as a support member for the point to be tested, for the test board to be quickly positioned on the test platform. Another object of the present invention is to under the point to be tested of each support block, so that the board to be tested is Tested for deformation. [Embodiment] In order to achieve the above objects and effects, the present invention and its positioning method are as follows. The preferred features and functions of the present invention are as follows. Please refer to the first and second figures for the flow chart of the flow chart and the selection of the reference point on the circuit board. The sequence is as follows: (A) Calling the circuit of the computer aided design (c AD ) image file; (B The CCD is used to find the positioning hole of the diagonal position of the reference plate on the board to be tested as the reference hole value; (C) Calculate the coordinate value of the point to be measured and the positioning point based on the coordinate value of the reference point; (D) The coordinates of each point to be measured are calculated, and the device including the test platform indicator is set on the stage, and the leveling device is tested on the side, so that the positioning block and the positioning point are fixed. The test mechanism embodiment for the pad to be tested on the board to be tested without sag or bending is described in detail. The method for detecting and locating the method of positioning is determined by the actual operation of the positioning method (usually to be tested) and set. Coordinates are found on each board to be tested

1297079 五、發明說明（5) 間距（T r a c e )的長度； (E )再以待測點間之間距（T r a c e )長度轉換成高頻阻抗之量測參數值； (F )檢測該量測參數值，以符合預設之高頻阻抗的波形 (G )完成設定作業。其中該基準點的設定，係擷取待測試板4上的電子迴路位置建立電腦輔助設計（C A D )圖檔；即由電腦軟體呼叫出電腦輔助設計（C A D )圖檔，而於圖中直接點選所要設定的基準點（通常是電路板上二對角位置成為定位點），並以該基準點為基準於待測試板4上選定各待測點4 2 、定位點4 1 ，且將圖中基準點與待測試板4之各待測點 4 2、定位點4 1的座標值，而於圖中進行待測點4 2間之間距（T r a c e )的長度，例： A點座標（X 1 ，y 1 ) 、B點座標（X 2 ，y 2 ) C點座標........D點座標........ ’並求出·1297079 V. Description of invention (5) Length of the distance (T race ); (E) Conversion of the length of the distance between the points to be measured (T race ) into a measured value of the high frequency impedance; (F) detecting the measurement The parameter value is used to complete the setting operation in accordance with the waveform (G) of the preset high-frequency impedance. The setting of the reference point is to take a computer-aided design (CAD) image file by taking the position of the electronic circuit on the board to be tested 4; that is, calling the computer-aided design (CAD) image file by the computer software, and directly in the figure Selecting the reference point to be set (usually the two diagonal positions on the circuit board becomes the positioning point), and selecting each of the to-be-measured points 4 2 and the positioning points 4 1 on the board to be tested 4 based on the reference point, and The coordinate value of the middle reference point and each of the to-be-measured points 4 to 2 of the board to be tested 2, and the positioning point 4 1 , and the length of the distance between the points to be measured 4 (T race ) is performed in the figure, for example: A point coordinates ( X 1 , y 1 ) , B coordinates (X 2 , y 2 ) C coordinates........ D coordinates........ 'And find

X長度=1 x2 — xl I 、Y 長度=丨 y2 — yl I ，即求出：間距（Trace)長度= (X長度平方+Y長度平方）開根號；再將待測點4 2之間距（T r a c e )計算出的長度值換算成高頻阻抗（T D R )的量測參數：X length=1 x2 — xl I , Y length = 丨 y2 — yl I , that is: Find the length of the trace (Trace length = (X length square + Y length square) open root number; then the distance between the points to be measured 4 2 (T race ) The calculated length value is converted into the measurement parameter of high frequency impedance (TDR):

Sc a 1 e=間距（T r a c e)長度/光速X介質常數Sc a 1 e=pitch (T r a c e) length / speed of light X dielectric constant

1297079 五、發明說明（6) ;而使該量測參數（S c a 1 e )符合預設的高頻阻抗波形’即完成電路板上待測點4 2之間距的設定。請參閱第三、四、五、六圖所示，係為本發明之測試機構立體外觀圖、立體分解圖、定位裝置立體分解圖、定位裝置之較佳實施例立體分解圖，該測試機構係包括有測試平台1 、定位裝置2及指標裝置3所構成，其中：該測試平台1上為設有複數依序呈等距方式排列之定位孔1 1。位具件墊設2平，定係位撐為2試孔依2定支2盤測紋可置有、2轉於螺並裝設1部整設内，位為1整調固。為上定側2調供再方係 1而一件該係3 上1 台，的位，1 2 11 平整1定222 台孔試調2離22件平位測移座遠部孔定試定於位基而整槽固測數置的於，調整且於複設向且2有調，置之為方，1設該入。設上 2意1 2則，穿處係1 任 OJ 塊供 r—I CO T-H ，台裝做座墊一 2213平位置基撐另22孔置試定位之支的孔件位裝測數的形或2槽定定標述複1LT~^1整固之指上 1 呈 1 2 調之 1 孔有2塊有2台1297079 V. Description of the invention (6); and the measurement parameter (S c a 1 e ) conforms to the preset high-frequency impedance waveform ′′, that is, the setting of the distance between the points to be measured 4 2 on the circuit board is completed. Please refer to the third, fourth, fifth and sixth figures, which are perspective exploded views of the test mechanism of the present invention, an exploded perspective view, an exploded perspective view of the positioning device, and a positioning device, which is a perspective exploded view of the preferred embodiment of the positioning device. The test platform 1 includes a positioning device 1 , a positioning device 2 and an index device 3 , wherein: the test platform 1 is provided with a plurality of positioning holes 11 arranged in an equidistant manner. The positional pad is set to 2 flat, and the fixed position is 2 test holes. According to 2 fixed support, 2 discs can be set, 2 turns to screw and 1 set inside, and the position is 1 whole adjustment. For the fixed side 2, the requisitioning system 1 and one of the series 3, the 1st position, 1 2 11 flat 1 fixed 222 holes test 2 from the 22 flat position measuring block far hole test In the position base and the whole slot solid measurement number is set, adjusted and set in the direction of 2, set to square, 1 set the input. Set 2 meaning 1 2, wear the department 1 OJ block for r-I CO TH, set the seat cushion to a 2213 flat position base support 22 holes to test the position of the hole to install the number of measurements Or 2 slots to set the complex 1LT~^1 to solidify the finger 1 to 1 2 to adjust 1 hole 2 to have 2

第11頁 1297079Page 11 1297079

旋$調整轉盤2 2 2使固定件2 2 3鎖入定位孔丄i中達到疋位之功旎，且將各定位裝置2做適當的調整。測儀（丁 D I 之間距長度確的座標位上，再以定以各定位裝射光，且利上之定位孔標裝置3的而待測試板至正確座標位於指標裝 2 3鎖入測 4 1的設定點4 1的位而可供待測第七圖所示而上述可獲得待測度之座標值標裝置3投移至指標裝墊塊2 1 2 2之固定件定位裝置2 位置，完成 4 1之座標以各定位裝光，且利用之定位孔1 位裝置2之塊2 1 2即工作手臂置速定位之功計算所得之試板4上待供測試平台射雷射光於置3的雷射對位於指標 2 2 3鎖入固定於測試各待測點4 值亦供測試置2的定位調整部2 2 1中，以完定位件2 1 為待測點4 放於測試平效。高頻阻抗量測點4 2間 1位移至正測試平台1 光下方，並裝置3的雷測試平台1 平台1上指 2的設定；平台1位移件2 1 1對之固定件2 成各定位點 1即為定位 2的位置，台1時（如 Ο參數值，，而以該長置，且以指位裝置2位置2的支撐用調整部2 1 1，俾使雷射光指示 4上定位點位置後，再置3的雷射試平台1上 ;而依各定置、支撐墊試板4藉由 )’達到快Rotate the adjustment dial 2 2 2 to lock the fixing member 2 2 3 into the positioning hole 丄i to reach the position of the clamp, and adjust the positioning device 2 appropriately. The measuring instrument (the distance between the DI and the length of the coordinate position, and then set the light to each positioning, and the positioning of the hole marking device 3 and the test plate to the correct coordinates are located in the indicator 2 3 lock into the test 4 1 The position of the set point 4 1 is available for the position of the fixed position positioning device 2 of the index pad 2 1 2 2 to be displayed as shown in the seventh figure to be tested. The coordinate of 4 1 is lighted by each positioning, and the position of the positioning hole 1 of the device 2 is used to calculate the work of the working arm, and the test plate 4 obtained by the work is set to be used for the test platform. The laser pair is located in the positioning adjustment unit 2 2 1 which is fixed to the test point 4 and is also used for the test set 2 in the index 2 2 3, and is placed in the test level 2 by the positioning member 2 1 as the to-be-measured point 4. The high-frequency impedance measuring point 4 2 is shifted to the lower side of the test platform 1 light, and the lightning test platform 1 of the device 3 is set on the platform 1 upper finger 2; the platform 1 displacement member 2 1 1 is fixed to the fixed part 2 Point 1 is the position of the positioning 2, when the station 1 (such as the parameter value, and the length is set, and The support adjustment unit 2 1 1 at the position 2 of the pointing device 2 causes the laser light to indicate the position of the positioning point on the 4th position, and then resets the laser test platform 1 of 3; and the support test plate 4 is fixed by each ) 'Achieve fast

請參閱第七、立體外觀圖、待測之側視剖面圖，其板4定位’而其它待測試板4的待琪·】八、九圖所示，係為試板校正對位之立體中定位裝置2以定位定位裝置2再以支撐點4 2下方，俾當量本發明使用狀態之分解圖、待測試板件2 1 1供待測試墊塊2 1 2頂持於測件5對位待測試Please refer to the seventh, three-dimensional appearance, side view of the side to be tested, the board 4 is positioned 'and the other board to be tested 4 is waiting for Qi························ The positioning device 2 is positioned below the support point 4 2, and the lower limit of the use state of the present invention, the plate to be tested 2 1 1 for the test block 2 1 2 to be held by the test piece 5 test

第12頁 1297079 、發明說明（8) ___ 板4上之待/則點4 2進行偵測時，即以支撐墊持待而能避免待測試板4下陷或f曲變上2頂且剝喊干台1上之定位裝置2可依各種尺寸=。項板4重新設定待測點4 2、定位點4丄的位置寸測試不同尺寸的待測試板4進行定位、測試；而=各種測試板4其待測點4 2及定位點4 1的資料即儲在=之待輔助設計（C A D)圖檔中，並於下一批相同尺二::電腦板4進行測試時，可由既有的電腦辅助設計（c、、/、’則试中讀取舊有的待測點4 2、定位點4丄資料，圖檔 Η上利用嶋置3重新定位，而不需重新=:= 板4的迴路進订重新計算待測點4 2、定位點4 i的位置，可節省重複檢測時的定位測試步驟，具極佳的實用功效。且本發明之測试機構及定位方法在使用時為具以下各一π 的優點： 1、待測試板上之各定位點、待測點的計算、設定，均以測試平台配合指標裝置進行位移設定，不需手動設定且較為準確、速度快、時間短。 2、測試平台上利用定位裝置設定各定位點、待測點的座彳f、位置’設定後即不會偏移而需重新調整。Page 12 1297079, invention description (8) ___ On the board 4, when the point 4 2 is detected, the support pad is held to avoid the board 4 being sunken or f-curved and shattered. The positioning device 2 on the dry table 1 can be in various sizes =. The item board 4 resets the point to be tested 4, and the position of the positioning point 4丄 tests the different sizes of the board to be tested 4 for positioning and testing; and = the data of various test boards 4 to be tested 4 2 and the positioning point 4 1 That is, it is stored in the auxiliary design (CAD) image file, and can be tested by the existing computer-aided design (c, , /, ' Take the old point to be tested 4 2. Positioning point 4丄 data, the image file is repositioned by using the device 3, without re-=== Circuit 4 of the board 4 recalculates the point to be tested 4 2. Positioning point The position of 4 i can save the positioning test step during repeated detection, and has excellent practical effect. Moreover, the testing mechanism and the positioning method of the invention have the following advantages of π when used: 1. The board to be tested The positioning points and the calculation and setting of the points to be tested are all set by the test platform with the index device, which does not need to be manually set and is more accurate, faster and shorter. 2. The positioning platform is used to set each positioning point on the test platform. , the seat 彳f of the point to be measured, the position 'is not offset after being set Need to be re-adjusted.

3、測試爭台上設置複數定位點及待測點後’即可使待測試板快速於測試平台上定位進行測試’更換待測試板口 ♦會新校正定位即可進行檢測。後不給災 4、測试不台上之定位裝置係以固定件固定於測試平台的定位孔中’在待測試板進行測試時’定位裝置不致產3. After setting the complex positioning point and the point to be tested on the test platform, the test board can be quickly positioned on the test platform for testing. Replace the board to be tested. ♦ The new calibration position can be detected. After the disaster, the positioning device is not fixed on the positioning hole of the test platform by the fixing member. When the test board is tested, the positioning device is not produced.

第13頁 1297079 五、發明說明（9) 生偏斜、位移，確保各定位％過程中不會改變。待測點的位置在檢測Page 13 1297079 V. INSTRUCTIONS (9) Deviation and displacement ensure that the positioning % does not change during the process. The position of the point to be measured is in the test

5、利用電腦輔助設計（c A 位點、待测點的計算，並以 §進行待測試板的各定設定，操作過程簡易，不須=^平台與指標裝置進行均可輕易操控。、紊技術的操作，任何人惟，以上所述僅為本發明 :揭：本發明之專利範圍，故舉凡m“列而已，非因此 f内谷所為之簡易修飾及等效結構變& j:說明書及圖本發，之申請專利範圍内，合予陳明化，均應同理包含於細上所述，本發明上述電路機構於實施、使用時，為確實能達到m位方法及測試 :明誠為-實用性優異之發明，目的，故本件，爱依法提出申請，r分•委早曰賜；利之申請要函指示鈞：審委有任何稽疑，請不= 人疋S竭力配合，實感德便。朿第14頁 1297079 圖式簡單說明【圖式簡單說明】第一圖係為本發明之檢測定位方法流程圖。第二圖係為本發明電路板上選擇基準點之示意圖。第三圖係為本發明測試機構之立體外觀圖。第四圖係為本發明測試機構之立體分解圖。第五圖係為本發明定位裝置之立體分解圖。第六圖係為本發明定位裝置之較佳實施例立體分解圖。第七圖係為本發明使用狀態之立體外觀圖。5. Using computer-aided design (c A site, calculation of the point to be tested, and setting the board to be tested with §, the operation process is simple, and it is not necessary to control the platform and the indicator device.) The operation of the technology, the above is only the present invention: the scope of the patent of the present invention, so that m "list", not the simple modification of the inner valley and the equivalent structure change & j: the specification And the application of the patent, the scope of the patent application, combined with Chen Minghua, should be included in the same as described above, the above-mentioned circuit mechanism of the present invention can achieve the m-bit method and test when implemented and used: Mingcheng is - The invention of excellent practicality, the purpose, therefore, this article, love to apply in accordance with the law, r points • committee early gift; Lizhi application letter instructions 钧: the audit committee has any doubts, please do not = people 疋 S effort to cooperate, real sense朿第14页1297079 BRIEF DESCRIPTION OF THE DRAWINGS [Simplified illustration of the drawings] The first figure is a flow chart of the detection and positioning method of the present invention. The second figure is a schematic diagram of selecting a reference point on the circuit board of the present invention. Department-based The third drawing is an exploded perspective view of the testing mechanism of the present invention. The fifth drawing is an exploded perspective view of the positioning device of the present invention. The sixth drawing is a preferred embodiment of the positioning device of the present invention. The three-dimensional exploded view. The seventh figure is a three-dimensional appearance of the state of use of the present invention.

第八圖係為本發明待測試板校正對位之立體分解圖。第九圖係為本發明待測試板之側視剖面圖。【元件符號說明】 1 、測試平台 1 1、定位孔 2、定位裝置 2 2 1、調整槽孔 2 2 2、調整轉盤 2 2 3 、固定件The eighth figure is an exploded perspective view of the alignment of the board to be tested of the present invention. Figure 9 is a side cross-sectional view of the panel to be tested of the present invention. [Description of Symbols] 1. Test platform 1 1. Positioning hole 2. Positioning device 2 2 1. Adjust the slot 2 2 2. Adjust the turntable 2 2 3 Fixing parts

2 1、基座 2 1 1、定位件 2 1 2、支撐墊塊 2 2、調整部 3、指標裝置2 1. Base 2 1 1. Positioning piece 2 1 2. Support block 2 2. Adjustment part 3. Index device

第15頁 1297079 圖式簡單說明板試點測位待定、 Λ 4 1 4 4 2、待測點 5、量測件Page 15 1297079 Simple description of the board Pilot test Position to be determined, Λ 4 1 4 4 2, point to be tested 5. Measuring parts

第16頁Page 16

Claims

1297079 六、申請專利範圍 1 、一種電路板之檢測定位方法，其主要步驟為： (A )呼叫電腦輔助設計（C A D )圖檔，擷取待測試板上之迴路； (B )以C C D尋找待測試板上的基準點，並設定座標值， (C )以基準點之座標值為基準，計算出待測試板上的各待測點、定位點的座標值； (D )以各待測點的座標值經過計算，而獲得待測點間之間距的長度；1297079 VI. Patent application scope 1. A method for detecting and positioning a circuit board, the main steps are as follows: (A) calling a computer-aided design (CAD) image file to capture a circuit on the board to be tested; (B) looking for a CCD The reference point on the test board, and set the coordinate value, (C) based on the coordinate value of the reference point, calculate the coordinate value of each point to be tested and the positioning point on the board to be tested; (D) to each point to be measured The coordinate value is calculated to obtain the length of the distance between the points to be tested;

(E )再以待測點間之間距長度轉換成高頻阻抗（T D R )之量測參數值； (F )檢測該量測參數值，以符合預設之高頻阻抗的波形； (G )完成設定作業。 2、如申請專利範圍第1項所述電路板之檢測定位方法，其中該電腦輔助設計圖檔選擇之定位點，係選擇待測試板的對角位置之基準孔位。(E) converting the length of the distance between the points to be measured into a measured value of the high frequency impedance (TDR); (F) detecting the value of the measured parameter to conform to the waveform of the predetermined high frequency impedance; (G) Finish setting the job. 2. The method for detecting and positioning a circuit board according to item 1 of the patent application scope, wherein the positioning point of the computer aided design image selection is to select a reference hole position of a diagonal position of the test panel.

3、如申請專利範圍第2項所述電路板之檢測定位方法，其中該電腦輔助設計圖檔中選定之定位點係為二個點位，其一為發射點、一為接地點。 4、如申請專利範圍第1項所述電路板之檢測定位方法，其中該電腦輔助設計圖檔中選定之定位點為具方向性，且可分為0度、90度、180度及270度。 5、如申請專利範圍第1項所述電路板之檢測定位方法，3. The method for detecting and positioning a circuit board according to item 2 of the patent application scope, wherein the selected positioning point in the computer aided design file is two points, one of which is a transmitting point and one is a grounding point. 4. The method for detecting and positioning a circuit board according to the first aspect of the patent application, wherein the selected positioning point in the computer aided design file is directional, and can be divided into 0 degrees, 90 degrees, 180 degrees, and 270 degrees. . 5. The method for detecting and locating the circuit board according to item 1 of the patent application scope,

第17頁 1297079 _N 六、申請專利範圍其中高頻阻抗（ S c a 1 e =間 6、如申請專利範圍其中該介質常數值。 7、一種電路板之測裝置及指標裝置位裝置，並相對置，以利用指標及定位點之位置測試板能快速於 8、如申請專利範圍該測試平台上為 9、如申請專利範圍該測試平台上之 1 〇、如申請專利範中該定位裝置位件，且遠離 1 1、如申請專利範其中該基座之且該調整轉盤調整轉盤之固 1 2、如申請專利範其中該調整轉Page 17 1297079 _N VI. Patent application range of high frequency impedance (S ca 1 e = between 6, such as the patent range, the medium constant value. 7. A circuit board measuring device and indicator device device, and opposite To test the board with the position of the indicator and the positioning point, the test board can be as fast as 8, for example, the patent application scope is 9 on the test platform, such as the patent application scope of the test platform, such as the positioning device position in the patent application. And away from 1 1 , as in the patent application of the pedestal and the adjustment dial adjusts the turntable solid 1 , as in the patent application, where the adjustment

T D R )之量測參足巨長度/光速X介第5項所述電路板係依據待測試板的試機構，所構成，於複數定裝置在測，並於各測試平台第7項所設有複數第8項所複數定位園第7項為具有基定位件之圍第1 0 調整部為為朝一側定件可於園第1 1 盤一側之其係包括該測試平位裝置的試平台上位置設置上定位以述電路板定位孔。述電路板孔可為内所述電路數：質常數。之檢夠定位方法，材質而界定其常數有測試平台、定位台上為設有複數定上方係設有指標裝指定出複數待測點定位裝置，而使待進行檢測。之測試機構，其中之測試機構，其中螺紋孔。板之測試機構，其座，該基座於一侧為設有定另一側則項所述電設有調整延設有固調整槽孔項所述電固定件可設有調整部路板之測試機構槽孔及調整轉盤定件，並進一步中活動位移。路板之測試機構為螺桿。The measurement of the TDR) is based on the length of the beam/speed of light. The circuit board according to item 5 is composed of the test mechanism of the board to be tested, and is set in the test device and is provided in item 7 of each test platform. The seventh item of the plural number positioning park in the eighth item is the circumference of the base positioning member. The 10th adjustment unit is a test platform including the test level device on the side of the 1st disk of the garden. The upper position is set to position the board positioning hole. The board hole can be inside the number of circuits: mass constant. The detection method is sufficient for the positioning method, and the material is defined by the test platform. The positioning platform is provided with a plurality of sets. The upper part is provided with an index device to specify a plurality of points to be measured, and the detection device is to be tested. The test mechanism, wherein the test mechanism, wherein the threaded holes. The test mechanism of the board has a seat, and the base is provided with a fixed side on one side, and the electric set is provided with an adjustment extension and a solid adjustment slot is provided. The electric fixing member can be provided with a test section of the adjustment section. Mechanism slot and adjustment dial fixed parts, and further active displacement. The test mechanism of the road plate is a screw.

1297079 六、申請專利範圍 1 3、如申請專利範圍第7項所述電路板之測試機構，其中該定位裝置為具有基座，該基座於一側為設有墊塊，且遠離墊塊之另一側則設有調整部。 1 4、如申請專利範圍第1 3項所述電路板之測試機構，其中該基座之調整部為設有調整轉盤，且該調整轉盤為朝一側延設有固定件。 1 5、如申請專利範圍第1 4項所述電路板之測試機構，其中該調整轉盤一側之固定件可為螺桿。1297079 6. Patent application scope 1. The test mechanism of the circuit board according to claim 7, wherein the positioning device has a base, and the base is provided with a block on one side and away from the block. On the other side there is an adjustment section. The test mechanism of the circuit board according to Item 13 of the patent application, wherein the adjustment portion of the base is provided with an adjustment dial, and the adjustment dial is provided with a fixing member toward one side. 1 . The testing mechanism of the circuit board according to claim 14 , wherein the fixing member on one side of the adjusting turntable is a screw.

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