TWI232946B

TWI232946B - Measuring method of the driving circuit

Info

Publication number: TWI232946B
Application number: TW93106801A
Authority: TW
Inventors: Shan-Hung Tsai; Ming-Hsien Sun
Original assignee: Toppoly Optoelectronics Corp
Priority date: 2004-03-15
Filing date: 2004-03-15
Publication date: 2005-05-21
Also published as: TW200530599A

Abstract

A measuring method of the driving circuit is provided. The driving circuit can drive the display and comprises a scan line circuit and a data line circuit. Wherein, the start terminal of every scan line is coupled to the scan line circuit. In the measuring method, every scan line is coupled to the first testing pad and every data line is coupled to the second testing pad. And then, a first testing signal is transmitted to a input of the scan line circuit and a second testing signal is transmitted to a input of the data line circuit. Afterward, we can understand that all of the device of the scan line circuit and the data line circuit are good or bad after measured the first testing pad and the second testing pad.

Description

1232946 五、發明說明（1) 發明所屬之技術領域本發明是有關於一種驅動電路之量測方法，且特別是有關於一種可量測出驅動電路中的全部元件是否良好之驅動電路之量測方法。先前技術人類最早能看到的動態影像為記錄片型態的電影。之後，陰極射線管（C a t h 〇 d e R a y T u b e，簡稱C R T )的發明，成功地衍生出商業化的電視機，並成為每個家庭必備的家電用品。隨著科技的發展，CRT的應用又擴展到電腦產業中的桌上型監視器，而使得CRT風光將近數十年之久。但是CRT所製作成的各類型顯示器都面臨到輻射線的問題，並且因為内部電子搶的結構，而使得顯示器體積龐大並佔空間，所以不利《於薄形及輕量化。由於上述的問題，而使得研究人員著手開發所謂的平面顯示器（F 1 a t P a n e 1 D i s p 1 a y )。這個領域包含液晶顯示器（L i q u i d C r y s t a 1 D i s p 1 a y ，簡稱L C D )、場發射顯示器 (Field Emission Display，簡稱FED)、有機發光二極體 (Organic Light Emitting Diode ，簡稱OLED)、以及電漿顯示器面板（Plasma Display Panel ，簡稱PDP)。其中以液晶顯示器最為醒目且具有薄型化、輕量化及小、中與大型化等的特性，並符合現代及未來新世代之攜帶式無線通訊與網路之技術。對於薄膜電晶體（Thin Film Transistor，簡稱 TFT) LCD而言，可進一步地依材料區分為非晶矽LCD及多晶1232946 V. Description of the invention (1) Field of the invention The present invention relates to a measurement method for a driving circuit, and more particularly to a measurement for a driving circuit that can measure whether all components in the driving circuit are good or not. method. Prior art The earliest moving images that humans can see are documentary-type movies. Later, the invention of the cathode ray tube (Cat h o d e Ra y T ube, abbreviated as C R T) succeeded in deriving a commercial television and becoming an essential household appliance for every household. With the development of science and technology, the application of CRTs has been extended to desktop monitors in the computer industry, which has made CRT landscapes for decades. However, all types of displays made by CRTs face the problem of radiation, and because of the internal electronic grab structure, the display is bulky and takes up space, which is not conducive to thinness and lightness. Because of the above problems, researchers have started to develop so-called flat panel displays (F 1 a t P a n e 1 D i s p 1 a y). This field includes liquid crystal displays (Liquid Crysta 1 D isp 1 ay, LCD for short), Field Emission Display (FED), Organic Light Emitting Diode (OLED), and plasma Display Panel (Plasma Display Panel, PDP for short). Among them, the liquid crystal display is the most eye-catching and has the characteristics of thinness, light weight, small, medium and large, and it is in line with modern and future generations of portable wireless communication and network technology. For Thin Film Transistor (TFT) LCD, it can be further divided into amorphous silicon LCD and polycrystalline silicon according to materials.

10504TWF.PTD 第6頁 1232946 五、發明說明（2) 石夕LCD兩大類。而近年來，更已成功地開發出低溫多晶矽 (LTPS)LCD。而對於目前的LTps — LCj)而言，由於驅動電路係位於晝素的外部，所以如何量測出驅動電路中的全部元件是否良好’便成為量測上的重要課題。 f下來請參照第1圖，其繪示的是使用習知的驅動電路^ f測方法之晝素陣列（a r r a y)及驅動電路的示意圖。由第1圖可知’驅動電路包括掃瞄線驅動電路1 〇 2及資料線馬，動電路1 0 4，而晝素陣列1 〇 6包括數條掃瞄線丨〇 8、數條 =H良11 〇、以及預先充電電路1 1 2。其中，掃瞄線驅動電路102包括移位暫存器（114，116)、閘極118及緩衝電路 (未繪示）。資料線驅動電路1 0 4包括移位暫存器（1 2 〇， 122 ’124)、相位配置電路（phase Arrangement10504TWF.PTD Page 6 1232946 V. Description of the invention (2) Shixi LCD two categories. In recent years, low temperature polycrystalline silicon (LTPS) LCDs have been successfully developed. For the current LTps-LCj), since the driving circuit is located outside the daylight, how to measure whether all the components in the driving circuit are good or not becomes an important issue in measurement. Please refer to FIG. 1 for a description of a daylight element array (a r r a y) and a driving circuit using a conventional driving circuit ^ f measurement method. It can be seen from the first figure that the driving circuit includes a scanning line driving circuit 10 and a data line horse, and a moving circuit 104, and the day element array 106 includes several scanning lines 〇〇8, several = H 良11 〇, and pre-charge circuit 1 1 2. The scanning line driving circuit 102 includes a shift register (114, 116), a gate 118, and a buffer circuit (not shown). The data line driving circuit 104 includes a shift register (122, 122'124), and a phase arrangement circuit (phase arrangement).

Circuit，簡稱PAC) 126、閘極1 28、以及水平開關130。接下來將以第1圖來說明習知之驅動電路之量測方法。對於掃瞄線驅動電路1 〇 2而言，會將脈衝訊號傳送至掃瞄線驅動電路1 〇 2的輸入端（即移位暫存器丨丨4的輸入端）’然後在掃目苗線驅動電路1 〇 2的輸出端量測（即移位暫存器1 1 6的輸出端），如果在移位暫存器丨丨6的輸出端量測到輸出訊號，則表示掃瞄線驅動電路丨〇 2良好，而如果在移位暫存器1 1 6的輸出端未量測到輸出訊號，則表示掃瞄 f驅動電路102損壞。同樣地，對於資料線驅動電路1〇4而言’會將脈衝訊號傳送至資料線驅動電路丨〇 4的輸入端（即移位暫存器120的輸入端），然後在資料線驅動電路1〇4的輸出端量測（即移位暫存器1 2 4的輸出端），如果在移位暫Circuit (referred to as PAC) 126, gate 1 28, and horizontal switch 130. Next, the measurement method of the conventional driving circuit will be described with reference to FIG. For the scanning line driving circuit 1 02, a pulse signal is transmitted to the input terminal of the scanning line driving circuit 1 02 (that is, the input terminal of the shift register 丨 4). Measurement of the output end of the driving circuit 1 〇2 (ie, the output end of the shift register 1 16). If the output signal is measured at the output end of the shift register 丨 6, it means that the scanning line is driven The circuit 2 is good, and if no output signal is measured at the output end of the shift register 116, it indicates that the scanning f driving circuit 102 is damaged. Similarly, for the data line drive circuit 104, the pulse signal is transmitted to the input end of the data line drive circuit 104 (that is, the input of the shift register 120), and then the data line drive circuit 1 〇4 output terminal measurement (ie the output of the shift register 1 2 4), if the shift register

10504TWF.PTD 第7頁 1232946 五、發明說明（3) 存器1 2 4的輸出端量測到輸出訊號，則表示資料線驅動電路1 0 4良好，而如果在移位暫存器1 2 4的輸出端未量測到輸出訊號，則表示資料線驅動電路1 〇 4損壞。由上述可知，習知之驅動電路之量測方法至少有以下的缺點： (1 )當掃瞄線驅動電路1 0 2及資料線驅動電路1 0 4測試的結果為良好時，只表示掃瞄線驅動電路1 〇 2及資料線驅動電路104中的移位暫存器（114-116 ’120-124)良好，但是不能保證掃瞄線驅動電路1 〇 2及資料線驅動電路1 0 4中的其他電路元件均為良好。 (2 )當掃瞄線驅動電路1 0 2及資料線驅動電路1 0 4測試的結果為損壞時，並不能得知掃瞄線驅動電路1 〇 2及資料線驅動電路1 0 4中的何種電路元件損壞。 (3)由於習知之驅動電路之量測方法不能量測驅動電路中的全部電路元件，所以在晝素測試時，會有許多未知的線缺陷或點缺陷。發明内容有鑑於此，本發明提出一種驅動電路之量測方法。本發明是將每一掃瞄線及每一資料線分別耦接至第一測試焊墊及第二測試焊墊。接著，分別傳送第一測試訊號及第二測試訊號至掃目苗線驅動電路的輸入端及貧料線驅動電路的輸入端。之後，分別在第一測試焊墊及第二測試焊墊上做量測，即可得知掃瞄線驅動電路及資料線驅動電路中的全部電路元件是否良好。為達成上述及其他目的，本發明提出一種驅動電路之10504TWF.PTD Page 7 1232946 V. Description of the invention (3) When the output signal of the memory 1 2 4 is measured, it indicates that the data line drive circuit 1 0 4 is good, and if the shift register 1 2 4 If no output signal is measured at the output end, it means that the data line drive circuit 104 is damaged. It can be known from the above that the conventional measurement method of the driving circuit has at least the following disadvantages: (1) When the test results of the scanning line driving circuit 102 and the data line driving circuit 104 are good, it only indicates the scanning line The shift register (114-116'120-124) in the drive circuit 1 〇2 and the data line drive circuit 104 is good, but the scan line drive circuit 1 〇2 and the data line drive circuit 104 cannot be guaranteed. Other circuit components are good. (2) When the test results of the scanning line driving circuit 102 and the data line driving circuit 104 are damaged, it is not possible to know what is in the scanning line driving circuit 1 02 and the data line driving circuit 104. Damaged circuit components. (3) Because the conventional measurement method of the driving circuit does not measure all the circuit components in the driving circuit, there will be many unknown line defects or point defects during the daytime test. SUMMARY In view of this, the present invention provides a method for measuring a driving circuit. The present invention couples each scan line and each data line to a first test pad and a second test pad, respectively. Then, the first test signal and the second test signal are respectively transmitted to the input terminal of the scanning line driving circuit and the input terminal of the lean line driving circuit. After that, measurement is performed on the first test pad and the second test pad, and it can be known whether all the circuit elements in the scanning line driving circuit and the data line driving circuit are good. To achieve the above and other objectives, the present invention provides a driving circuit

10504TWF.PTD 第8頁 1232946 五、發明說明（4) 量測方法。此驅動電路包括掃瞄線驅動電路及資料線驅動電路，用以驅動顯示器。此顯示器包括數條掃瞄線及數條資料線。其中每一掃瞄線的起始端係耦接至掃瞄線驅動電路，而每一資料線的起始端係耦接至資料線驅動電路。在此量測方法中，首先會將每一掃瞄線及每一資料線分別耦接至第一測試焊墊及第二測試焊墊。接著，分別傳送第一測試訊號及第二測試訊號至掃瞄線驅動電路的輸入端及資料線驅動電路的輸入端，其中第一測試訊號係經由掃瞄線驅動電路及每一掃瞄線，而傳送至第一測試焊墊，而第二測試訊號係經由貧料線驅動電路及母一貧料線’而傳送至第二測試焊墊。之後，分別在第一測試焊墊及第二測試焊塾上做量測。在本發明的實施例中，當每一掃瞄線未耦接一電路時，則存在二極體，此二極體係位於每一掃瞄線與第一測試焊墊之間。而此二極體的正極係耦接至每一掃瞄線，而此二極體的負極係耦接至第一測試焊墊。在本發明的較佳實施例中，當每一掃瞄線耦接一電路時，則此電路之一端係耦接至第一測試焊墊。在本發明的實施例中，當每一資料線未耦接一電路時，則存在二極體，此二極體係位於每一資料線與第二測試焊墊之間。而此二極體的正極係耦接至每一資料線，而此二極體的負極係耦接至第二測試焊墊。在本發明的較佳實施例中，當每一資料線耦接一電路時，則此電路之一端係耦接至第二測試焊墊。10504TWF.PTD Page 8 1232946 V. Description of the invention (4) Measurement method. The driving circuit includes a scanning line driving circuit and a data line driving circuit for driving the display. The display includes several scanning lines and several data lines. The start end of each scan line is coupled to the scan line drive circuit, and the start end of each data line is coupled to the data line drive circuit. In this measurement method, each scan line and each data line are first coupled to a first test pad and a second test pad, respectively. Then, the first test signal and the second test signal are sent to the input end of the scan line drive circuit and the input end of the data line drive circuit, respectively. The first test signal is transmitted through the scan line drive circuit and each scan line. The signal is transmitted to the first test pad, and the second test signal is transmitted to the second test pad through the lean line driving circuit and the mother-lean line. After that, make measurements on the first test pad and the second test pad. In the embodiment of the present invention, when each scan line is not coupled to a circuit, there is a diode, and the two-pole system is located between each scan line and the first test pad. The anode of the diode is coupled to each scan line, and the anode of the diode is coupled to the first test pad. In a preferred embodiment of the present invention, when each scan line is coupled to a circuit, one end of the circuit is coupled to the first test pad. In the embodiment of the present invention, when each data line is not coupled to a circuit, there is a diode, and the two-pole system is located between each data line and the second test pad. The anode of the diode is coupled to each data line, and the anode of the diode is coupled to the second test pad. In a preferred embodiment of the present invention, when each data line is coupled to a circuit, one end of the circuit is coupled to the second test pad.

10504TWF.PTD 第9頁 1232946 五、發明說明（5) 在本發明的較佳實施例中，欲量測第一測試焊墊及第二測試焊墊上的電流時，係使用電流計來量測。而欲量測第一測試焊墊及第二測試焊墊上的電壓時，係使用電壓計來量測。在本發明的較佳實施例中，第一測試訊號及第二測試訊號為脈衝訊號、電壓訊號或電流訊號。在本發明的較佳實施例中，此顯示器為液晶顯示器。綜上所述，本發明提出一種驅動電路之量測方法。本發明是將每一掃瞄線及每一資料線分別耦接至第一測試焊墊及第二測試焊墊。接著，分別傳送第一測試訊號及第二測試訊號至掃瞄線驅動電路的輸入端及資料線驅動電路的輸入端。之後，分別在第一測試焊墊及第二測試焊墊上做量測，即可得知掃瞄線驅動電路及資料線驅動電路中的全部電路元件是否良好。為讓本發明之上述和其他目的、特徵和優點，能更加明顯易懂，下文特舉較佳實施例，並配合所附圖示，做詳細說明如下：實方fe方式請參照第2圖，其繪示的是使用根據本發明一較佳實施例之驅動電路之量測方法之畫素陣列及驅動電路的示意圖。由第2圖可知，驅動電路包括掃瞄線驅動電路2 0 2及資料線驅動電路2 0 4，用以驅動顯示器（例如是液晶顯示器）。而在顯示器中，具有晝素陣列2 0 6 ，晝素陣列2 0 6包10504TWF.PTD Page 9 1232946 V. Description of the Invention (5) In the preferred embodiment of the present invention, when the current on the first test pad and the second test pad is to be measured, the current is measured using an ammeter. When you want to measure the voltage on the first test pad and the second test pad, use a voltmeter to measure. In a preferred embodiment of the present invention, the first test signal and the second test signal are a pulse signal, a voltage signal, or a current signal. In a preferred embodiment of the invention, the display is a liquid crystal display. In summary, the present invention provides a measurement method for a driving circuit. The present invention couples each scanning line and each data line to the first test pad and the second test pad, respectively. Then, the first test signal and the second test signal are respectively transmitted to the input terminal of the scanning line driving circuit and the input terminal of the data line driving circuit. After that, measurement is performed on the first test pad and the second test pad, and it can be known whether all circuit elements in the scanning line driving circuit and the data line driving circuit are good. In order to make the above and other objects, features, and advantages of the present invention more comprehensible, the following describes the preferred embodiment in detail with the accompanying drawings, and the detailed description is as follows: Please refer to FIG. 2 for the actual fe method. It is a schematic diagram of a pixel array and a driving circuit using a measuring method of a driving circuit according to a preferred embodiment of the present invention. It can be seen from FIG. 2 that the driving circuit includes a scanning line driving circuit 202 and a data line driving circuit 204 for driving a display (such as a liquid crystal display). And in the display, there is a daylight array 206, a daylight array 206 package

10504TWF.PTD 第10頁 1232946 五、發明說明（6) 括數條掃瞄線2 0 8、數條資料線2 1 0、以及預先充電電路 2 1 2。其中，掃瞄線驅動電路2 0 2包括移位暫存器（2 1 4， 2 1 6 )、閘極2 1 8及緩衝電路（未繪示）。資料線驅動電路2 0 4 包括移位暫存器（2 2 0，2 2 2，2 2 4 )、相位配置電路2 2 6、閘極2 2 8、以及水平開關2 3 0。另夕卜，每一掃瞄線2 0 8的起始端係耦接至掃瞄線驅動電路2 0 2，而每一資料線2 1 0的起始端係耦接至資料線驅動電路2 0 4。接下來將以第2 圖來說明本發明之驅動電路之量測方法。在此量測方法中，首先會將每一掃目洁線及每一資料線分別耦接至第一測試焊墊及第二測試焊墊。對於掃瞄線而言，當每一掃瞄線未耦接至一電路時，則存在二極體，此二極體係位於每一掃瞄線與第一測試焊墊之間，而此二極體的正極係耦接至每一掃瞄線，而此二極體的負極係耦接至第一測試焊墊；而當每一掃瞄線耦接至一電路時，則此電路之一端係耦接至第一測試焊墊。對於資料線而言，當每一資料線未耦接一電路時，則存在二極體，此二極體係位於每一資料線與第二測試焊墊之間，而此二極體的正極係耦接至每一資料線，而此二極體的負極係耦接至第二測試焊墊；而當每一資料線耦接一電路時，則此電路之一端係耦接至第二測試焊墊。而在第2圖中，因為每一掃瞄線 2 0 8未搞接一電路’所以母' 掃猫線2 0 8會經由二極體 2 3 2，而耦接至測試焊墊2 3 4。再者，因為每一掃瞄線2 1 0 已耦接預先充電電路2 1 2，所以預先充電電路2 1 2的汲極端會經由水平開關2 3 0而耦接至測試焊墊2 3 6。此外，對於熟10504TWF.PTD Page 10 1232946 V. Description of the invention (6) Includes several scanning lines 2 0 8, several data lines 2 1 0, and pre-charging circuit 2 1 2. The scanning line driving circuit 202 includes a shift register (2 1 4, 2 1 6), a gate 2 8 and a buffer circuit (not shown). The data line driving circuit 2 0 4 includes a shift register (2 2 0, 2 2 2, 2 2 4), a phase configuration circuit 2 2 6, a gate 2 2 8, and a horizontal switch 2 3 0. In addition, the start end of each scan line 208 is coupled to the scan line drive circuit 202, and the start end of each data line 2 10 is coupled to the data line drive circuit 204. Next, the measurement method of the driving circuit of the present invention will be described with reference to FIG. 2. In this measurement method, each scan line and each data line are first coupled to a first test pad and a second test pad, respectively. For the scanning lines, when each scanning line is not coupled to a circuit, there is a diode. The two-pole system is located between each scanning line and the first test pad. The positive electrode is coupled to each scan line, and the negative electrode of the diode is coupled to the first test pad. When each scan line is coupled to a circuit, one end of the circuit is coupled to the first test pad. A test pad. For the data lines, when each data line is not coupled to a circuit, there is a diode. This diode system is located between each data line and the second test pad, and the anode system of the diode is Is coupled to each data line, and the anode of the diode is coupled to the second test pad; and when each data line is coupled to a circuit, one end of the circuit is coupled to the second test pad pad. In the second figure, because each scan line 2 0 8 is not connected to a circuit, the female scan line 2 0 8 is coupled to the test pad 2 3 4 through the diode 2 3 2. Furthermore, since each scanning line 2 1 0 is coupled to the pre-charging circuit 2 1 2, the drain terminal of the pre-charging circuit 2 1 2 is coupled to the test pad 2 3 6 through the horizontal switch 2 3 0. In addition, for cooked

10504TWF.PTD 第11頁 1232946 五、發明說明（7) 習此項技藝者而言，應該知道的是，第2圖僅為掃瞄線及資料線，與測試焊墊連接方式的一例，並非用以限定本發明，只要在不脫離本發明的申請專利範圍之外都可以為之。接著，會分別傳送測試訊號2 3 8及測試訊號2 4 0至掃瞄線驅動電路2 0 2的輸入端（即移位暫存器2 1 4的輸入端）及資料線驅動電路的輸入端（即移位暫存器2 2 0的輸入端）。其中，測試訊號2 3 8會經由掃瞄線驅動電路2 0 2及每一掃瞄線 2 0 8，而傳送至測試焊墊2 3 4。而測試訊號2 4 0會經由資料線驅動電路2 0 4及每一資料線2 1 0，而傳送至測試焊墊 2 3 6。另外，測試訊號2 3 8及測試訊號2 4 0可為脈衝訊號、電壓訊號或電流訊號。之後，分別在測試焊墊2 34及測試焊墊2 3 6上做量測，藉由在測試焊墊2 3 4及測試焊墊2 3 6上所量測到的輸出訊號，即可得知出掃瞄線驅動電路2 0 2中的全部元件及資料線驅動電路2 0 4中的全部元件是否良好。另外，如果欲量測測試焊墊2 3 4及測試焊墊2 3 6上的電流時，可使用電流計來量測。而如如果欲量測測試焊墊2 3 4及測試焊墊2 3 8的電壓時，可使用電壓計來量測。綜上所述，現將本發明的優點略述如下： (1 )可ϊ測出掃猫線驅動電路及貧料線驅動電路中的全部電路元件是否良好。 (2 )當掃瞄線驅動電路及資料線驅動電路的測試結果為4貝壞時’可付知知目苗線驅動電路及貧料線驅動電路中的10504TWF.PTD Page 11 1232946 V. Description of the invention (7) For those skilled in the art, it should be known that Figure 2 is only an example of the scanning line and data line, and is an example of the connection method to the test pad. To limit the present invention, it can be done without departing from the scope of the patent application of the present invention. Next, the test signal 2 3 8 and the test signal 2 40 are transmitted to the input end of the scanning line driving circuit 202 (that is, the input end of the shift register 2 1 4) and the input end of the data line driving circuit. (Ie the input of the shift register 2 2 0). Among them, the test signal 2 3 8 is transmitted to the test pad 2 3 4 through the scan line driving circuit 202 and each scan line 208. The test signal 2 40 is transmitted to the test pad 2 3 6 through the data line driving circuit 204 and each data line 2 10. In addition, the test signal 2 38 and the test signal 2 40 may be a pulse signal, a voltage signal, or a current signal. After that, make measurements on the test pads 2 34 and 2 3 6 respectively. You can know the output signals measured on the test pads 2 3 4 and 2 3 6 Check whether all the components in the scanning line driving circuit 202 and the data line driving circuit 204 are in good condition. In addition, if you want to measure the current on test pad 2 3 4 and test pad 2 3 6, you can use an ammeter to measure it. If you want to measure the voltage of test pad 2 3 4 and test pad 2 3 8, you can use a voltmeter to measure. In summary, the advantages of the present invention are briefly described as follows: (1) It can be detected whether all the circuit elements in the cat line driving circuit and the lean line driving circuit are good. (2) When the test results of the scanning line driving circuit and the data line driving circuit are 4 Ω bad, it is possible to know the

10504TWF.PTD 第12頁 1232946 五、發明說明（8) 何種電路元件損壞，所以可提供更多的分析資訊及修復資訊。 (3 ) 由於本發明可量測出驅動電路中的全部電路元件是否良好，所以在晝素測試時，可得知線缺陷或點缺陷。雖然本發明已以較佳實施例揭露於上，然其並非用以限定本發明，任何熟習此技藝者，在不脫離本發明之精神和範圍内，當可作各種之更動與潤飾，因此本發明之保護範圍當視後附之申請專利範圍所介定者為準。10504TWF.PTD Page 12 1232946 V. Description of the invention (8) What kind of circuit element is damaged, so it can provide more analysis information and repair information. (3) Since the present invention can measure whether all the circuit elements in the driving circuit are good or not, during the day test, the line defect or the point defect can be known. Although the present invention has been disclosed above with a preferred embodiment, it is not intended to limit the present invention. Any person skilled in the art can make various modifications and retouches without departing from the spirit and scope of the present invention. The scope of protection of the invention shall be determined by the scope of the attached patent application.

10504TWF.PTD 第13頁 1232946 圖式簡單說明第1圖繪示的是使用習知的驅動電路之量測方法之畫素陣列及驅動電路的示意圖；以及第2圖繪示的是使用根據本發明一較佳實施例之驅動電路之量測方法之畫素陣列及驅動電路的示意圖。圖式標示說明： 1 02 ，202 掃目苗線馬區動電路 1 04 ，204 資料線驅動電路 1 06 ，206 晝素陣列 1 08 ，208 掃瞄線 110 ，21 0 資料線 112 ，212 預先充電電路 114 >116、120、122、124、214、216、220、222、224 ·· 移位暫存器 1 1 8、1 2 8、2 1 8、2 2 8 :閘極 1 2 6，2 2 6 :相位配置電路 1 3 0 ，2 3 0 :水平開關 2 3 2 :二極體 2 3 4，2 3 6 :測試焊墊 2 3 8，2 4 0 :測試訊號10504TWF.PTD Page 13 1232946 Brief Description of Drawings Figure 1 shows a schematic diagram of a pixel array and a driving circuit using a conventional driving circuit measurement method; and Figure 2 shows the use of a driving circuit according to the present invention. A schematic diagram of a pixel array and a driving circuit of a measuring method of a driving circuit in a preferred embodiment. Schematic description: 1 02, 202 Sweeping Miao line horse circuit circuit 1 04, 204 data line drive circuit 1 06, 206 day element array 1 08, 208 scan line 110, 21 0 data line 112, 212 precharge Circuit 114 > 116, 120, 122, 124, 214, 216, 220, 222, 224 · Shift register 1 1 8, 1 2 8, 2 1 8, 2 2 8: Gate 1 2 6 2 2 6: Phase configuration circuit 1 3 0, 2 3 0: Horizontal switch 2 3 2: Diode 2 3 4, 2 3 6: Test pad 2 3 8, 2 4 0: Test signal

10504TWF.PTD 第14頁10504TWF.PTD Page 14

Claims

1232946 六、申請專利範圍 1 . 一種驅動電路之量測方法，該驅動電路包括一掃瞄線驅動電路及一資料線驅動電路，用以驅動一顯示器，該顯示器包括複數條掃瞄線及複數條資料線，每一該些掃瞄線的起始端係搞接至該掃瞄線驅動電路，每一該些資料線的起始端係搞接至該資料線驅動電路，該量測方法包括下列步驟：將每一該些掃目苗線及母一該些貢料線分別搞接至一弟一測試焊墊及一第二測試焊墊；分別傳送一第一測試訊號及一第二測試訊號至該掃瞄線驅動電路的輸入端及該資料線驅動電路的輸入端，其中該弟一測試訊號係經由該掃目苗線驅動電路及母一該些掃瞒線，而傳送至該第一測試焊墊，而該第二測試訊號係經由該資料線驅動電路及每一該些資料線，而傳送至該第二測試焊墊；以及分別在該第一測試焊墊及該第二測試焊墊上做量測。 2 . 如申請專利範圍第1項所述之驅動電路之量測方法，其中當每一該些掃瞄線未耦接一電路時，則存在一二極體，該二極體係位於每一該些掃瞄線與該第一測試焊墊之間。 3 . 如申請專利範圍第2項所述之驅動電路之量測方法，其中該二極體的正極係耦接至每一該些掃瞄線，而該二極體的負極係耦接至該第一測試焊墊。 4. 如申請專利範圍第1項所述之驅動電路之量測方法，其中當每一該些掃瞄線耦接一電路時，則該電路之一1232946 6. Scope of patent application 1. A measuring method of a driving circuit, the driving circuit includes a scanning line driving circuit and a data line driving circuit for driving a display, the display includes a plurality of scanning lines and a plurality of data The starting end of each scanning line is connected to the scanning line driving circuit, and the starting end of each data line is connected to the data line driving circuit. The measuring method includes the following steps: Connect each of the scanning seedling lines and the mother-of-a-kind material lines to a younger test pad and a second test pad, respectively; send a first test signal and a second test signal to the The input terminal of the scanning line driving circuit and the input terminal of the data line driving circuit, wherein the test signal of the younger is transmitted to the first test welding via the scanning line driving circuit and the female and the hidden lines. Pad, and the second test signal is transmitted to the second test pad via the data line driving circuit and each of the data lines; and is performed on the first test pad and the second test pad, respectively. the amount Measurement. 2. The measurement method of the driving circuit as described in item 1 of the scope of patent application, wherein when each of these scanning lines is not coupled to a circuit, there is a diode, and the diode system is located at each of Between the scan lines and the first test pad. 3. The measuring method of the driving circuit as described in item 2 of the scope of patent application, wherein the anode of the diode is coupled to each of the scanning lines, and the anode of the diode is coupled to the First test pad. 4. The measuring method of the driving circuit as described in the first item of the patent application, wherein when each of the scanning lines is coupled to a circuit, one of the circuits is

10504TWF.PTD 第15頁 1232946 六、申請專利範圍端係耦接至該第一測試焊墊。 5 . 如申請專利範圍第1項所述之驅動電路之量測方法’其中當每一^該些貨料線未躺接一電路時，則存在一二極體，該二極體係位於每一該些資料線與該第二測試焊墊之間。 6 . 如申請專利範圍第5項所述之驅動電路之量測方法，其中該二極體的正極係耦接至每一該些資料線，而該二極體的負極係耦接至該第二測試焊墊。 7 . 如申請專利範圍第1項所述之驅動電路之量測方法，其中當每一該些資料線耦接一電路時，則該電路之一端係耦接至該第二測試焊墊。 8. 如申請專利範圍第1項所述之驅動電路之量測方法，其中欲量測該第一測試焊墊及該第二測試焊墊上的電流時，係使用一電流計來量測。 9 . 如申請專利範圍第1項所述之驅動電路之量測方法，其中欲量測該第一測試焊墊及該第二測試焊墊上的電壓時，係使用一電壓計來量測。 10. 如申請專利範圍第1項所述之驅動電路之量測方法，其中該第一測試訊號及該第二測試訊號係一脈衝訊號。 11. 如申請專利範圍第1項所述之驅動電路之量測方法，其中該第一測試訊號及該第二測試訊號係一電壓訊號。 12. 如申請專利範圍第1項所述之驅動電路之量測方10504TWF.PTD Page 15 1232946 6. Scope of patent application The end system is coupled to the first test pad. 5. The measurement method of the driving circuit as described in item 1 of the scope of the patent application, wherein when each circuit is not connected to a circuit, there is a diode, and the diode system is located at each Between the data lines and the second test pad. 6. The measuring method of the driving circuit as described in item 5 of the scope of patent application, wherein the anode of the diode is coupled to each of the data lines, and the anode of the diode is coupled to the first Two test pads. 7. The method for measuring a driving circuit as described in item 1 of the scope of patent application, wherein when each of the data lines is coupled to a circuit, one end of the circuit is coupled to the second test pad. 8. The measurement method of the driving circuit according to item 1 of the scope of patent application, wherein when the current on the first test pad and the second test pad is to be measured, a current meter is used for measurement. 9. The measuring method of the driving circuit according to item 1 of the scope of patent application, wherein when the voltages on the first test pad and the second test pad are to be measured, a voltmeter is used for measurement. 10. The measuring method of the driving circuit according to item 1 of the scope of patent application, wherein the first test signal and the second test signal are pulse signals. 11. The measuring method of the driving circuit according to item 1 of the scope of patent application, wherein the first test signal and the second test signal are a voltage signal. 12. Measurement method of driving circuit as described in item 1 of the scope of patent application

10504TWF.PTD 第16頁 1232946 六、申請專利範圍法，其中該第一測試訊號及該第二測試訊號係一電流訊號。 13. 如申請專利範圍第1項所述之驅動電路之量測方法’其中該顯不為係一液晶顯不為。 10504TWF.PTD 第17頁10504TWF.PTD Page 16 1232946 6. Patent application method, where the first test signal and the second test signal are a current signal. 13. The measuring method of the driving circuit as described in item 1 of the scope of the patent application, wherein the display is a liquid crystal display. 10504TWF.PTD Page 17