TWI224195B

TWI224195B - Data analysis method for programmable logic analyzer

Info

Publication number: TWI224195B
Application number: TW91125311A
Authority: TW
Inventors: Chiu-Hao Cheng; Chun-Feng Tzu; Ming-Kuo Cheng
Original assignee: Zeroplus Technology Co Ltd
Priority date: 2002-10-25
Filing date: 2002-10-25
Publication date: 2004-11-21

Abstract

The present invention relates to a data analysis method for programmable logic analyzer, which is mainly to capture the waveform data from the tested object by the control circuit of the analyzer, and stores the data in the memory. After the memory is full, the data is transferred to the computer through the transmission interface. The computer writes the waveform data into the buffer, and transfers the data in the buffer to the screen for displaying, then the auxiliary analysis steps of the tested signal in the digital circuit, such as waveform quality analysis, communication protocol analysis and memory data analysis, are proceeded. Thus, the user can proceed diagnostic data analysis, data comparison analysis and data searching analysis, etc. in the computer by referencing the data shown on the screen, and the user can also store the analyzed data in the format of files, or print the report using a printer, so as to achieve the advantages of easy operation, and versatile applications.

Description

12241951224195

種可程式化邏測物處抓取波可進行數位電、通訊協定分電腦中參考螢資料分析和搜形式儲存起來分析儀取資料顯不幕業之製 • 一~ 、 i g g 樣的研以，現進趨勢強大的品時之試儀器針對某測試，僅可對後在顯 (螢幕造廠商記憶體 e r ) 發設計今邏輯中，實分析測整體研設計製種特定如測試本發明為提供一法，尤指分析儀由待幕上顯示出來後，即步驟中波形品質分析如此，使用者便可於偵錯資料分析、比對分析後之資料以檔案表使用。先前技藝：按，習知之邏輯、集成電路等）於抓示，再以人工方式在析’而目前從事此行不外乎包含下列四點度’三、觸發（T r 雜訊能力），可是這很難再有所突破；是在科技日新月異之演，他們需要更多、更程式設計師於開發產然而，現今之測測試機種，通常都只將同一種類的產品作轉"分析儀資料分析之方形資料傳送至電腦之螢路之待測信號輔助分析析和記憶體資料分析，幕上顯示之資料來進行尋資料分析等，亦可將或利用列表機列印成報數位電路（示幕（螢幕 )上觀看並，其所研發深度，二、能力，四、到達某種程分析儀所具不敷程式設試功能，這發速度。造廠商，其項目進行測萬用序列埠This kind of programmable logic detection object capture wave can be used for digital electricity, communication protocol, sub-computer analysis and search of reference data. The analyzer takes data and displays it. • Igg-like research, The test equipment for the current trend of powerful products is targeted at a certain test. It can only be developed in the display (screen manufacturer's memory er) in the current logic. The overall analysis and design are specific to the test. The present invention provides a Method, especially after the analyzer is displayed on the screen, that is, the waveform quality analysis in this step is so that the user can analyze the debugging data and compare the analyzed data with a file table. Previous skills: Press, custom logic, integrated circuits, etc.) at the scratch, and then analyze it manually, and currently engaged in this line is nothing more than including the following four degrees' three, trigger (T r noise ability), but This is difficult to make any breakthrough; it is changing with the technology, they need more and more programmers to develop the production. However, today's test and testing models usually only transfer the same kind of products " analyzer data The analyzed square data is sent to the computer's Fluorescent Road. The signal to be tested is analyzed and analyzed, and the data displayed on the screen is used for data analysis. It can also be printed or used as a digital circuit by a list machine. Watching on the screen (screen), the depth of its research and development, two, ability, four, reaching a kind of process analyzer has insufficient program setting function, this speed. Manufacturers, their projects are tested universal serial port

如積體電路 )上作一顯進行目視分設計之方向擷取信號速穩定度（抗度時，就會備的功能，計人員所需樣才能加快設計製造的試’而不能匯流排（UFor example, the integrated circuit) is used for visual display. The direction of design is to capture the signal speed. Stability (resistance, the function will be prepared. The designer needs the sample to speed up the design and manufacture test), but not the bus (U

^24195 五、發明說明（2) SB)通訊介面的機種，如RS〜232等，如此低消費者的購買意願。 ^ 所以如果讓邏輯分析能’並將測試某些特定項析儀的功能更加完整，且輯分析儀才能具備有更多就只要購買一台邏輯分析目’就要購買多台測試機願’也會降低設計製造廠發明綱要：故，發明人有鑑於前限制其發展空間；另，同測試儀器，只能單獨測試從事電子儀器之製造經驗心研究各種解決的方法，後’終於開發設計出全新分析之方法的發明誕生，本發明之主要目的，處抓取波形資料後，即儲存滿）後，再藉由傳輸介料填寫在其緩衝器裏，# 示出來，嗣再進行數位電形品質分析、通訊協定分 j號 911253^ 24195 V. Description of the invention (2) SB) The type of communication interface, such as RS ~ 232, etc., is so low that consumers are willing to buy. ^ So if logic analysis can be used and the functions of some specific analyzers can be tested to be more complete, and only a series of analyzers can be equipped, just purchase a logic analysis project and 'will purchase multiple test machines' Will reduce the outline of the invention of the design and manufacturing plant: Therefore, the inventor has limited the development space in view of the previous; In addition, the same testing instrument can only be tested separately and engaged in the manufacturing experience of electronic instruments to study various solutions, and then 'newly developed and designed a brand new The invention of the method of analysis was born. The main purpose of the present invention is to capture the waveform data and store it in full), and then fill it in the buffer through the transmission medium. # Is shown, and then the digital shape quality is performed. Analysis and Communication Protocol No. 911253

來測試其它消費者的金就不能拿不僅浪費儀能擁有目納入其能測試的、更強之儀，而不種，如此商的製造述習用邏一種類的特定項目和技術累在經過不型態之可俾能摒除係於分析存於記憶面傳送至將緩衝器路之待測析和記憶測试、偵錯中，此舉將產品項目更分析測試功用為了測試不但増加消成本。輯分析儀之產品，：§p不 ’是以，發積，特針對斷的研究、程式化邏輯先前技藝之儀之控制電體内，待記電腦，電腦裏的資料傳信號辅助分體資料分析的通訊介面錢，也會降、分析等功可使邏輯分多，如此邏能。消費者多種產品項費者講買意鲁研發技術會能用同一台明人乃依其上述缺失悉實驗與改良分析儀資料諸多缺失。路從待測物憶體用完（將此波形資送到螢幕顯析步驟中波 ’如此，使The gold used to test other consumers can not be used to not only waste the instrument can own the stronger instrument that can be tested, but not a kind, so the manufacturer's manufacturing practice uses a certain type of specific projects and technologies to accumulate through the process. The state can be eliminated from the analysis and storage on the memory surface to the buffer analysis and memory testing and debugging, which will make the product items more analytical and testing for testing purposes and not only eliminate costs. The product of the serial analyzer: §p not 'is, the product is developed, especially for the study of breaks, the logic of the prior art of the instrument is controlled by the control body, the computer to be recorded, and the data in the computer to assist the split data Analysis of communication interface money, will also reduce, analysis and other functions can make the logic more, so logical power. Consumers have a variety of product items. Consumers talk about buying ideas. Lu can use the same research and development technology to understand the experiments and improve the analysis of the analyzer. Way from the object under test, memory is exhausted (send this waveform to the screen during the analysis step ’so that

1224195 五、發明說明（3) 用者便可於電腦中參考，亦可將分析後之資料列印成報表使用。本發明之另一目的處抓取波形資料後，即存滿）後，續再填寫在料傳送到顯示裝置（勞之待測信號輔助分析步訊協定分析和記憶體資置（螢幕）上顯示之資之資料以檔案形式儲存案號 911253111224195 V. Description of the invention (3) The user can refer to it in the computer or print the analyzed data into a report for use. Another object of the present invention is to capture the waveform data and then fill it up, and then fill in the data and send it to the display device (the signal to be tested is assisted by the analysis of the step protocol analysis and the display of the memory information (screen). The information of the asset is stored as a file. Case No. 91125311

修正為其構造功能如詳細說請之一， 1 2及示出） 1 5相料，並後，再由電腦達成上述，茲繪圖下，俾利明：參閱第一其分析儀記憶體1 與待測物連接，令儲存於記將記憶體 1 5顯示目的及就本發完全瞭 A圖所 1 0為 3，而 1 4相控制電憶體1 1 3所出來。營幕上顯示之資料來進行資料分析以檔案形式儲存起來或利用印表機 ’係於分析儀之控制電路從待測物儲存於記憶體内，待記憶體用完（其緩衝器裏，嗣再將緩衝器裏的資幕）顯示出來，嗣再進行數位電路驟中數位電路之波形品質分析、通料分析’以供使用者可參考顯示裝料來進行資料分析，亦可將分析後起來或利用印表機列印成報表使用 =效L本發明所採用之技術手段及之杈佳實施例詳加說明其特徵與解。 =，係為本發明之電路方塊示意圖制電路11、傳輸介面 ^ 路11為藉由治具（圖中未 ’另傳輸介面i 2則與電腦 r, 可續取待測物1 4之内部資儲f，Ϊ記憶體1 3用完（存滿）子之貧料傳送至電腦1 5 ，並經Revise its structure function (please refer to one of them in detail, 1 2 and shown) 1 5 phase material, and then, the computer to achieve the above, here is the drawing, Li Mingming: See the first analyzer memory 1 and wait The test object is connected, so that the memory 15 shows the display purpose of the memory 15 and the figure A is 10, which is 3, and the 14-phase control memory 1 13 is out. The data displayed on the camp screen is used for data analysis and stored in the form of files or using the printer's control circuit attached to the analyzer to store the test object in the memory and run out of memory (in its buffer, 嗣Then display the information in the buffer), and then perform the digital circuit waveform quality analysis and material analysis in the digital circuit step, so that the user can refer to the display material for data analysis, and the analysis can also be performed. Or use a printer to print a report. Use the technical means and preferred embodiments of the present invention to explain its characteristics and solutions in detail. =, Is a schematic diagram of the circuit block of the present invention. The circuit 11 and the transmission interface ^ The road 11 is through a jig (the other transmission interface i 2 is not connected to the computer r in the figure, and the internal resources of the DUT 1 4 can be continued. Store f, memory 1 3 is used up (full) The poor material of the child is transferred to the computer 1 5 and

$ 6頁 1224195 SS_JU25311 修正曰五、發明說明（4) 内舍=者L其控制電路1 1於接收到由待測物1 4傳送之縮次^料日守’可先將該等内部資料經由歷縮襄置1 6做壓完^料處理後，再儲存於記憶體1 3中，待記憶體1 3用由電f /高）後’再將檢測數據完整地傳送到電腦1 5時’ 出來知1 5將該等内部資料做資料解壓縮處理後，再顯示之二π =閱第一 B圖所示，係為本發明之電路方塊示意圖内；析儀1 〇之控制電路1 1自待測物1 4中讀取 (ίί； 3 t 3 接# i I滿）後，再透過壓縮裝置1 6將資料予以壓缩，、，將記憶體1 3所儲存之資料傳叶于以壓細 15予以解壓縮資料後顯送至電…，經由電腦復請參閱第一A、一B圖所示，上述分 ^^==二待測物14的資料規格書：接之待測物編號時，便使分選所要測試 4抓取波形資料，並儲存於記；體以1可從待 J 3用S (存滿）後’再藉由傳輸介：’待記憶 5將此波形資料填寫在：：送至電腦衝器長的—貝料傳送到螢幕顯示出來，此 =裏，再將緩丁圖所示，嗣再進行數位電路之待測作號鍺凊同時參閱第 1 〇 0中波形品質分析2 〇、通二二補助分析步驟 :::分析4 0，如此，使用者便^;^ J和記憶體 i顯示之資料來進行债錯資料分析、比；2t參考鸯幕 ^_ 貝枓分柝和搜尋 $ 7頁 1224195 .it,! 1 號 91125311 五、發明說明（5) 料分析等，亦可將分用印表機列印成報表請參閱第二、三測信號輔助分析步驟明將依下列步驟開始 (2〇〇)輸入待測曰 2 〇 1 2 0 2 2 0 0 4 和資料庫輸出邏輯示，其輸 )判斷輸，即結束 0 2 B ) (請參考結束分析波形寬度示，其波 )判斷波結束分析 B );而參考第九分析動作比對資料示，其比 )再次輸析後之資使用者。圖所示， 1 0 0中進行處理信號；邏輯比較分析；此出邏輯分出波形邏分析動作 ;而步驟第九圖所動作；分析；此形寬度分形寬度是動作，否步驟（2 圖所示）分析；此對資料分入待測信料以檔案形式儲存起來或利當使用者進行數位電路之待波形品質分析2 〇時，本發是否符合特性規格；時，請析為先輯是否 ’否則 (2 〇示）田時，析為否符則，〇 3 用另時，析為號，繼同時參閱第三 A 圖所進行步驟 ( 2 0 2 A 符合特性規格 ? 壤若是繼續進行步驟 ( 2 2 B ) 在波形顯示另顏色標示後 > 即同時參閱第三 B 圖所進行步驟 ( 2 0 3 A 特性規格 ? 若是 > 即續進行步驟 ( 2 0 3 ) 在波形顯示區 ( 請顏色標示後 > 即結束同時參閱第三 C 圖所進行步驟 ( 2 0 4 A 步驟 ( 2 0 4 Β )$ 6 pages 1224195 SS_JU25311 Revised fifth, description of the invention (4) 内舍 = 者 L and its control circuit 1 1 upon receiving the reduction transmitted by the object to be tested ^ Material Rishou 'can first pass these internal data through After shrinking and setting the material for processing, it is stored in the memory 1 3, after the memory 13 is used by the electrical f / high) 'the test data is completely transmitted to the computer 15 hours' Come out and know 1 5 after decompressing the internal data, then display the second π = as shown in the first B diagram, which is a schematic diagram of the circuit block of the present invention; the control circuit 1 1 of the analyzer 10 After reading the test object 14 (3; 3 t 3 and #i Ifull), the data is compressed by the compression device 16, and the data stored in the memory 13 is transmitted to the compaction device. 15 After decompressing the data, it is displayed and sent to the electricity ..., please refer to the first A and B diagrams through the computer. The above data is ^^ == 2. The data specification of the DUT 14: When the DUT is numbered Then, make the sorting test 4 to capture the waveform data and store it in the record; the body can be used from 1 to J 3 with S (full) and then through the transmission medium: 'to be recorded Recall that this waveform data is filled in :: sent to the computer punch—the shell material is sent to the screen for display, this = mile, and then the delay chart is shown, and then the digital circuit is to be tested. Also refer to the waveform quality analysis 2 in 〇 0, Tong Er Er subsidy analysis steps: :: analysis 40, so the user will ^; ^ J and the data displayed in memory i to analyze and compare debt error data. ; 2t refer to the screen ^ _ Bech Divide and search $ 7 Page 1224195 .it ,! No. 9119125311 V. Description of the invention (5) Material analysis, etc., can also be printed on a separate printer as a report, please refer to the second 3, three test signal auxiliary analysis steps will start in the following steps (200) and enter the test date 2 0 1 2 0 2 2 0 0 4 and the database output logic display, its input) to judge the input, that is, to end 0 2 B ) (Please refer to the end analysis waveform width display, its wave) Judgment wave end analysis B); and refer to the ninth analysis action comparison data display, its ratio) Input again after analysis. As shown in the figure, signals are processed in 100; logic comparison and analysis; this logic divides the waveform logic analysis action; and the action in step ninth figure; analysis; the fractal width of this shape is the action, no step (2) (Showing) analysis; the data is stored in the data to be tested and stored in a file format, or it is useful for the user to perform the quality analysis of the waveform of the digital circuit. ○ If this product meets the characteristic specifications; 'Otherwise (shown at 2 〇), when the field is analyzed, it is interpreted as a negative rule. 〇 3 Use another time, parsed as a number, and then refer to the third step A (2 0 2 A meets the characteristic specifications? If the soil continues to the step (2 2 B) After the waveform display is displayed in another color, refer to the steps shown in Figure 3B (2 0 3 A characteristic specifications? If yes), then continue with the steps (2 0 3) in the waveform display area (please After the color marking > End the steps performed while referring to the third C figure (2 0 4 A step (2 0 4 Β)

1224195 案號 91125311 五、發明說明（6)1224195 Case number 91125311 V. Description of the invention (6)

修正讓使用者選擇與哪〜欠 (2 〇 4 C )將本次二料作比對，續以步驟顯示區（請參考第九 77析的波形資料在波形，即結束分析動作；m所示）用另一顏色標示 (2 0 5 )帛止輸入分析；此時，& f，其禁止輸入分析為二時Π第三D圖所 )判斷輪入波形邏輯e J a進仃步驟（2 0 5 A ，即結束分析動作，：則付合特性規格？若是 ◦ 5 B );而步驟（2 n :繼續進行步驟（2 (請參考第九圖所示）在波形顯示區結束分析動作；用另一顏色標示後，即 (206)搜尋資料分析；此時’ 千，盆妯夺一、明问時參閱第三E圖所The correction allows the user to choose which to owe (204 C) to compare the two materials this time, and then continues with the step display area (please refer to the waveform data analyzed in the ninth 77 in the waveform, that is, the end of the analysis action; shown in m ) Use another color (2 0 5) to stop input analysis; at this time, & f, which prohibits input analysis for 2 o'clock and 3rd D chart) determine the turn waveform logic e J a into step (2 0 5 A, that is, the end of the analysis operation: then the characteristic specifications are met? If it is ◦ 5 B); and step (2 n: continue to step (2 (please refer to the ninth figure)) end the analysis operation in the waveform display area; After marking with another color, (206) search for data analysis; at this time, 'Thousands of pots, won't win one, please refer to Figure 3 E when asked.

;I哥貧料分析為先進行步驟（2 〇 6 A 2 0 7 i#一ΐ從波形顯示區（請參考第九圖所示）岡斛_ /形，通訊協定顯示視窗（請參考第七圖不）會跳到與該波形相對應的通訊協定内容，並標示另一顏色，即結束分析動作；後之波形資料顯示在波形顯示區考第九圖所示）； ^ (208)是否要儲存成檔案？若是，繼續進行步驟 0 9)，否則，即結束分析動作； (2 0 9 )將波形資料儲存成檔案後，即結束分析動作。請參閱第二、四圖所示，當使用者進行數位電路之測信號輔助分析步驟1 0 〇中通訊協定分析3 〇時，本發進行處分析之來表示邏輯比分析；錯資料形寬度驟（3 D )；容後，内容是作，否 :其步，即結分析；尋資料從通訊選一筆九圖所八圖所的波形束分析之通訊區（請理：資料，通訊協較是否此時，分拚為是否符〇 2 Β 在步驟續於步否符合則，繼驟（3 束分析此時，分析為協定顯通訊協不）和示）會和記憶動作；協定内參考第將其轉定内容符合特請同時先進行合特性 )，否 (30 驟（3 特性規續進行〇 2 D 動作；請同時先進行示視窗定内容記憶體跳到與體内容 Α圖所 0 2 A 是，繼行步驟換成通中判斷，即結驟（3 錯誤訊 B圖所 0 3 A 第七圖不區（視窗（協定内另一顏 ;拉 -^_9Π25311 五、發明說明（7) ^將依下列步驟開始 3 0 0 )利用波形或符號等 (3 〇 1 )和資料庫 (3 0 2 )偵錯資料示，其偵 )判斷波續進行步 (302 訊協定内通訊協定束分析動 0 2 D ) 息格式後 (3 0 3 )搜尋資料示，其搜 )使用者所示）點請參考第請參考第容相對應色，即結 (3 〇 4 )將分析後視窗顯不修正換成文字、數字性規格；參閱第四步驟（3 規格？若則，則進 2 Β )轉 0 2 C ) 格？若是下列之步 )轉換成參閱第四步驟（3 (請參考 ’波形顯資料顯示遠葦通訊 ’並標示容顯示在通訊協定顯示七圖所示）·，嗣，再進; Brother analysis of the poor material is the first step (2 0 6 A 2 0 7 i # 1 from the waveform display area (please refer to the ninth figure) ganglia _ / shape, communication protocol display window (please refer to the seventh (Figure not) It will jump to the content of the communication protocol corresponding to the waveform and mark another color, that is, the end of the analysis action; the subsequent waveform data is displayed in the waveform display area as shown in the ninth figure); ^ (208) Save as file? If yes, continue to step 0 9), otherwise, the analysis operation is ended; (2 0 9) After the waveform data is saved as a file, the analysis operation is ended. Please refer to the second and fourth figures. When the user performs the auxiliary analysis of the measured signal of the digital circuit in the communication protocol analysis in step 100, the analysis is performed to indicate the logic ratio analysis. (3 D); After the content, the content is made, no: the step, that is, analysis; find data from the communication and select a communication area of the wave beam analysis of the nine maps and eight maps (please understand: data, communication, comparison At this time, the division is divided into whether or not it conforms to 〇 2 Β. If the steps continue to conform to the step, then the next step (3 beam analysis at this time, the analysis is agreement agreement and communication agreement) and instructions) and memory action; The content of the transfer is in line with the special feature, please perform the characteristics first. No (30 steps (3 features continue to perform 0 2 D actions; please also perform the display window to determine the content memory to jump to the body content A map 0 2 A) Yes, follow the steps to pass the judgment, that is, the end (3 error message B picture 0 0 A 7th picture does not area (window (another face in the agreement; pull-^ _ 9Π25311) V. Description of the invention (7) ^ Will follow these steps Start 3 0 0) Use the waveform or symbol (3 0 1) and the database (3 0 2) to debug the data, and its detection) to determine the wave to proceed (the protocol beam analysis in the 302 protocol 0 2 D) After the information format (3 0 3) search data display, its search) (user shows) point, please refer to the corresponding color corresponding to the first reference, that is, (3 〇 4) the analysis window is changed to text, Digital specifications; see step 4 (3 specifications? If so, enter 2 Β) turn 0 2 C)? If it is the following steps), convert it to refer to the fourth step (3 (please refer to ‘Waveform Display Data Display Yuanwei Communication’ and mark it as shown on the communication protocol display 7), 图, then enter

1224195 _案號91125311_年月日__ 五、發明說明（8) 行步驟（3 0 5 ); (3 0 5 )是否要儲存成檔案？若是，繼續進行步驟（3 0 6)，否則，即結束分析動作； (3 0 6 )將通訊協定内容儲存成檔案後，即結束分析動作。請參閱第二、五圖所示，當使用者進行數位電路之待測信號輔助分析步驟1 0 0中記憶體資料分析4 0時，本發明將依下列步驟開始進行處理：1224195 _Case No. 91125311_Year Month Date__ V. Description of the invention (8) Steps (3 0 5); (3 0 5) Do you want to save it as a file? If yes, continue to step (306), otherwise, the analysis operation is ended; (306) After the content of the communication protocol is saved as a file, the analysis operation is ended. Please refer to the second and fifth diagrams. When the user performs the auxiliary data analysis of the digital signal under test step 100 in the memory data analysis step 40, the present invention will start processing according to the following steps:

(4 0 0 )利用通訊協定内容的資料，複製一份待測物相同之記憶内容； (4 0 1 )和資料庫邏輯比較是否符合特性規格； (4 0 2 )讀寫資料分析，此時，請同時參閱第五A圖所示，其讀寫資料分析為先進行步驟（4 0 2 A )判斷同位址的寫入和讀出的資料是否相同？若是，即結束分析動作；否則，繼續進行步驟 (4 0 2 B );而步驟（402B)在記憶體資料顯示視窗（請參考第八圖所示）用另一顏色標示，即結束分析動作； (4 0 3 )比對資料分析；此時，請同時參閱第五B圖所示，其比對資料分析為先進行步驟（4 0 3 A )再次輸入通訊協定内容，再以步驟（40 3 B )讓使用者選擇與哪一筆資料作比對，續以步驟（4 0 3 C )將本次所分析的記憶内容在記憶體資料顯示視窗（請參考第八圖所示）用(4 0 0) Use the data of the communication protocol to copy the same memory content of the object to be tested; (4 0 1) Logically compare with the database to meet the characteristic specifications; (4 0 2) Read and write data analysis, at this time Please refer to Figure 5A at the same time. The read and write data analysis is performed first (4 0 2 A) to determine whether the data written and read at the same address are the same? If yes, end the analysis action; otherwise, continue to step (402 B); and step (402B) is marked with another color in the memory data display window (please refer to Figure 8), and the analysis action is ended; (4 0 3) analysis of comparison data; at this time, please also refer to Figure 5B, the comparison data analysis is to first perform the step (4 0 3 A) and then enter the content of the protocol again, and then use the step (40 3 B) Let the user choose which piece of data to compare with, and then continue with step (403 C) to use the memory content analyzed this time in the memory data display window (please refer to Figure 8)

第11頁 1224195 五、發明說明（9) ( 4 0 4 )Page 11 1224195 V. Description of the invention (9) (4 0 4)

銮號 911253U 曰另一顏色標示，即結束搜尋資料分析；為先進使用者從記憶體資料顯圖所示）選一資料或位協定顯示視窗（請表考該資料或位址和資料或内容’並標示另一顏色 (4 〇 5 )將分析後之記憶體資料視窗（如第八圖所示） (4 0 6 )是否要儲存成檔案？若 0 7)，否則，即結束 (4 〇 7 )將記憶體資料儲存成檔分析動作；行步驟（4 示視窗點（址和資料或第七圖所示位址相對應後，即結束顯示在記憶 0 4 A )讓請參考第八位址，通訊 )會跳到與的通訊協定分析動作；體資料顯示是，繼續進分析動作；案後，即結行步驟（4 束分析動作古/= #為本發明另—實施例之電路方鬼不心圖，该分析儀1 〇為包括有控制電路i工、記憶體1 3、顯示裝置（螢幕）丄7及緩衝器（ 2 ^ “ i 1 8，其中控制電路1 1為藉由治具（圖中未不出）與待測物1 4相連接，使控制電路丄i可讀資料而儲存於記憶體13，待記憶體1 3 ( V 後，再將記憶體1 3所儲存之資料傳送至緩 B ^ f uffer) 18，嗣再將緩衝器（莫^ 1 f e r ) I 8所儲存之資料傳送至顯示幕）1 7顯示出來。、愛再者其分析儀1 〇於接收到由使用者輸入欲測試待画 1224195 $a 2· 2 b .終案號 91125311 I ’ $No. 911253U means another color mark, that is, to end the search for data analysis; for advanced users, select a data or bit agreement display window from the memory data display (please test the data or address and data or content ' And mark another color (4.05) to analyze the memory data window (as shown in Figure 8) (4 0 6) Do you want to save it as a file? If 0 7), otherwise, it ends (4 0 7) ) Save the memory data into a file for analysis. Steps (4 window points (the address and the data or the address shown in the seventh figure correspond to the end of the display in the memory 0 4 A). Please refer to the eighth address , Communication) will jump to the analysis action of the communication protocol; the physical data shows that, continue to analyze the action; after the case, the step is completed (4 beam analysis action ancient / = # This is another-embodiment of the circuit side ghost Unintended, the analyzer 10 includes a control circuit, a memory 1 3, a display device (screen) 丄 7, and a buffer (2 ^ "i 1 8", in which the control circuit 1 1 is controlled by a fixture. (Not shown in the figure) Connect with the object to be measured The control circuit reads the data and stores it in the memory 13. After the memory 1 3 (V, the data stored in the memory 13 is transferred to the buffer B ^ f uffer) 18, and then the buffer (Mo ^ 1 fer) The data stored in I 8 is transmitted to the display screen) 1 7 is displayed. I love his analyzer 1 〇 After receiving the input by the user to test 1224195 $ a 2 2 b. Final case No. 91125311 I '$

IB 五、發明說明（10) 1 ~ " 測物之資料規格書（D a t a s 分析儀1 0之資料庫中點選所要測分析儀1 0之控制電路1 1便從待並儲存於$己憶體1 3中，待記憶 ’再將§己憶體1 3所儲存之資料傳 Buffer)18，嗣再將緩衝 1 8裏的資料傳送到顯示裝置（螢再進行數位電路之待測信號輔助分質分析2 0、通訊協定分析3 〇和 (請參考第二圖所示），如此，使 (螢幕）17上顯示之資料來進行料分析和搜尋資料分析等，亦可將式儲存起來或利用印表機列印成報上述分析儀10尚包括有壓縮控制電路1 1可將自待測物1 4讀縮/解壓縮裝置1 9予以壓縮，再令記憶體1 3用完（存滿）後，可 1 9予以解壓縮資料後，續透過顯示出來。另睛參閱第六B圖所示，係為路方塊示意圖之二，其分析儀1 〇 1 9亦可於控制電路1 1自待測物後’將内部資料直接儲存於記憶體用元（存滿）後，再透過壓縮/解以壓曰 h e e 試之待測物1 體1 3 送至緩器（B幕）1 析步驟記憶體用者便偵錯資分析後表使用 /解壓取之内儲存於藉由壓示裝置本發明之壓縮 1 4中 1 3中壓縮裝 t )或測物編 4抓取用完（衝器（ u f f 7顯示 10 0 資料分可參考料分析之資料者。縮裝置部資料記憶體縮/解 (螢幕直接從該號時，其波形資料存滿）後 e r ) 出來，蘇] 中波形品析4 0 顯示裝置、比對資以檔案形 1 9，使先透過壓 1 3中，壓縮裝置 )1 7顯另一實施例之電 /解壓縮裝置讀取内部資料 ’待記憶體1 3 置1 9將資料予IB Fifth, the invention description (10) 1 ~ " Data specification of the test object (D atas analyzer 1 0 in the database, click the control circuit of the analyzer 10 to be tested 1 1 from the standby and stored in $ 己In memory 13, to be memorized ', then transfer the data stored in § memory 13 to Buffer) 18, and then transfer the data in buffer 18 to the display device (Fei then assists the digital circuit with the signal to be tested. Qualitative analysis 20, communication protocol analysis 3, and (please refer to the second figure), so that the data displayed on (screen) 17 can be used for material analysis and search data analysis, etc. The printer 10 uses a printer to print the report. The above-mentioned analyzer 10 also includes a compression control circuit 11 which can compress the DUT 14 reading / decompressing device 19 and compress it, and then use up the memory 1 3 (full ), You can decompress the data after 19, and then continue to display it. See also Figure 6B, which is the second schematic diagram of the road block, the analyzer 1 0 1 9 can also be used in the control circuit 11 1 After the object to be measured ', store the internal data directly in the memory unit (full), and then Shrinking / uncompressing the object to be tested in the hee test 1 Body 1 3 Send to the retarder (Curtain B) 1 Analysis steps The user will detect the error after analyzing the data. After the table is used / uncompressed, it is stored in the display by pressure Device The compression of the present invention 1 4 of 1 3 of the compression device) or measuring object 4 grabbing and running out (punch (uff 7 shows 10 0 data points can refer to the data analysis of the data. Shrinking device department data memory shrink / Solution (when the screen is directly from this number, its waveform data is full) and then er)), the waveform analysis in the 4] display device, the comparison information is in the form of a file 19, so that the first transmission pressure 1 3, compression Device) 1 7 shows the electric / decompression device of another embodiment to read the internal data 'to be stored 1 3 set 1 9

第13頁 1224195 案號 91125311 年 ηPage 13 1224195 Case No. 91125311 η

If it 五曰修正發明說明（11) 且填寫在其緩衝器、，〇山 f β n f f e f ) 1 S ϊ ) 1 8晨，續將緩衝 (Buffer)18畏的資料經由壓縮/1 9予以解壓縮後，再傳送到顯示裝4 (螢幕）心二顯示。縮器在上述二實施例中，其電腦i 5之緩衝器（圖中出）或分析儀1 0之緩衝器i 8的容量，會依據待測物 1 4之内部資料大小，而變成與此内部資料相同之容量。由上可知，上述僅為本發明最佳具體實施例，惟本發明之構造特徵並不侷限於此，任何熟悉該項技藝者在本發明領域内’可輕易思及之變化或修飾，皆可涵蓋在以下本案之專利範圍。綜上所述，本發明上述資料分析之方法於使用時，故本發明誠為一實用性優異請要件，爰依法提出申請，障發明人之辛苦創作，倘若吝來函指示，發明人定當竭之可程式化邏輯分析儀記憶體為確實能達到其功效及目的，之創作，為符合發明專利之申盼審委早曰賜准本案，以保釣局審委有任何稽疑，請不力配合，實感公便。If it revises the description of the invention (11) and fill in its buffer, 〇yama f β nffef) 1 S ϊ) 1 8 am, continue to decompress the data in the buffer (Buffer) through compression / 19 After that, send it to the display device 4 (screen). In the above two embodiments, the capacity of the buffer i 8 (shown in the figure) of the computer i 5 or the buffer i 8 of the analyzer 10 will be based on the internal data size of the test object 14 and become the same as this. The same internal data capacity. It can be seen from the above that the above are only the preferred embodiments of the present invention, but the structural features of the present invention are not limited to this. Anyone skilled in the art can easily think of changes or modifications in the field of the present invention. Covered in the patent scope of this case below. In summary, when the method of analyzing the above-mentioned data of the present invention is used, the present invention is a request for excellent practicability. Applying for the application in accordance with the law will hinder the hard work of the inventor. If the letter instructs, the inventor will exhaust it. The programmable logic analyzer memory is designed to truly achieve its efficacy and purpose. In order to comply with the invention patent application, the review committee will grant this case as early as possible to ensure that the review committee of the fishing bureau has any suspicions. Please do not cooperate. Real sense.

第14頁 1224195 案號 91125311 圖式簡單說明Page 14 1224195 Case number 91125311 Simple illustration

年月,修正I 修正第一 A圖第一 B圖弟一圖第三圖第三A圖第三B圖第三C圖第三D圖第三E圖第四圖第四A圖第四B圖第五圖第五A圖係為本發明之電路係為本發明之電路係為本發明之動作係為本發明數位電圖。係為本發明數位電分析之動作流程圖係為本發明數位電分析之動作流程圖係為本發明數位電分析之動作流程圖係為本發明數位電分析之動作流程圖係為本發明數位電分析之動作流程圖係為本發明通訊協係為本發明通訊協作流程圖。係為本發明通訊協作流程圖。係為本發明記憶體係為本發明記憶體【圖式簡單說明】方塊示意圖之一。方塊示意圖之二。流程圖。路波形品質分析之動作流程路波形品質分析於輪出邏輯〇路波形品質分析於波形寬度〇路波形品質分析於比對資料〇路波形品質分析於禁止輸入 0 路波形品質分析於搜尋資料〇定分析之動作流程圖。定分析於偵錯資料分析之動定分析於搜尋資料分析之動資料分析之動作流程圖。資料分析於讀寫資料分析之Year, month, month I, month I, day 1A, day 1B, day 3, day 3, day 3A, day 3B, day 3C, day 3D, day 3E, day 4, day 4A, day 4A Figure 5 Figure 5A is the circuit of the present invention. The circuit of the present invention is the operation of the present invention. It is the digital electrical diagram of the present invention. It is the operation flow chart of the digital electrical analysis of the present invention. It is the operation flow chart of the digital electrical analysis of the present invention. It is the operation flow chart of the digital electrical analysis of the present invention. It is the operation flow chart of the digital electrical analysis of the present invention. The analysis flow chart is the communication cooperation flow chart of the present invention. It is a flowchart of the communication cooperation of the present invention. The memory of the present invention The memory of the present invention [Brief description of the drawings] One of the block diagrams. Block diagram two. flow chart. Waveform quality analysis operation flow Waveform quality analysis in turn-out logic. Waveform quality analysis in waveform width. Waveform quality analysis in comparison data. Waveform quality analysis in forbidden input. Waveform quality analysis in search data. Flow chart of analysis. Deterministic analysis is based on debugging data analysis. Deterministic analysis is based on search data analysis. Data analysis operation flow chart. Data analysis

II

第15頁 1224195 案號 91125311 年月日修正圖式簡單說明動作流程圖 0 第 SB 圖係為本發明記憶體資料分析於比對資料分析之動作流程圖〇第五C 圖係為本發明記憶體資料分析於搜尋資料分析之動作流程圖〇第六A 圖係為本發明另一 -實施例之電路方塊示意圖之 ' 第六B 圖係為本發明另- -實施例之電路方塊示意圖之二第七圖係為本發明通訊協定顯示視窗之示意圖〇第八圖係為本發明記憶體資料顯示視窗之示意圖〇第九圖係為本發明邏輯分析儀控制顯示視窗之示意圖元件符號說明 0、分析儀 1、控制電路 2、傳輸介面 3、記憶體 4、待測物 5、電腦 6、壓縮裝置 7、顯示裝置 8、緩衝器（Buffer 9、壓縮/解壓縮裝置Page 15 1224195 Case No. 9125311 Revised diagram Brief description of the operation flow chart 0 The SB diagram is the operation flowchart of the memory data analysis of the present invention and the comparison data analysis. The fifth C diagram is the memory of the present invention Flow chart of data analysis in search data analysis. The sixth A diagram is a schematic diagram of a circuit block of another embodiment of the present invention. The sixth B diagram is a second schematic diagram of a circuit block of another embodiment of the present invention. Figure 7 is a schematic diagram of the display window of the communication protocol of the present invention. Figure 8 is a schematic diagram of the memory data display window of the present invention. Figure 9 is a schematic diagram of the control display window of the logic analyzer of the present invention. Symbol description 0. Analyzer 1, control circuit 2, transmission interface 3, memory 4, test object 5, computer 6, compression device 7, display device 8, buffer (Buffer 9, compression / decompression Equipment

第16頁Page 16

Claims

1224195 Λ. 曰麵 91j^^ 六、申請專利範圍 1、一種可程式化遵八分析儀之控制電^^儀資料分析之方法，其主要於記憶體内，待：=抓取ί形資料，並儲存於電腦，電腦將此$·次:再藉’傳輸介面傳送至衝器裏的資料傳逆二：支、，’’’在其緩衝器裏’再將緩路之待測信號補助分析㈣： _再進仃數位電 (A )輸入待測信號 ί^號和邏輯資料庫比較是否符合特性規格 (C )輸出邏輯分析· 亏Γ生規格 (D )波形寬度分析 (Ε )比對資料分析 (F)禁止輸入分析 (G )搜尋資料分析， (Η )將分析後之波形資料顯示在波形顯示區； (1)是否要儲存成檔案； ’ (J )結束分析。如申請專利範圍第丄項所述之可程式化邏輯分料分析之方法’其巾該分析儀之控制電路從待測物抓取波形資料時，為可透過使用者輸入欲測試之待的資料規格書來進行相關分析使用。如申請專利範圍第1項所述之可程式化邏輯分析儀資料分析之方法，其中該分析儀之控制電路從待測物& 取波形資料時，為可直接從資料庫中點選所要測試之待測物編號來進行相關分析使用。、1224195 Λ. Said surface 91j ^^ VI. Application for patent scope 1. A method for analyzing the data of a programmable electric control instrument ^^, which is mainly in the memory. And stored in the computer, the computer will send this $ · times: and then use the transmission interface to transfer the data to the punch. Inverse two: support, "'in its buffer', and then subsidize the signal to be tested on the slow path. ㈣: _Re-enter the digital electrical (A) input signal to be tested and compare it with the logic database to see if it meets the characteristic specification (C). Output logic analysis. Defective specifications (D). Waveform width analysis (E) comparison data. Analysis (F) Prohibit input analysis (G) Search data analysis, (Η) Display the analyzed waveform data in the waveform display area; (1) Whether to save it as a file; '(J) End the analysis. According to the method of programmable logic distribution analysis described in item 丄 of the scope of the patent application, when the analyzer's control circuit grabs waveform data from the object to be tested, the user can input the data to be tested through the user. Specifications for analysis. The method for data analysis of the programmable logic analyzer as described in item 1 of the scope of patent application, wherein when the control circuit of the analyzer takes waveform data from the DUT &, it can directly select the test from the database The test object number is used for related analysis. ,

4 5 6 第其第其第其料第其之第其之第其之圍法電資後由 7 I 8 94 5 6 First, second, first, second, first, last, and last

第18頁月曰 1項所述之可程式化邏輯分析儀資中該分析後之資料可以用檔案形式 1項所述之可程式化邏輯分析儀資中該分析後之資料可以利用印表機 1項所述之中該電腦之大小而變化 1項所述之中該數位電資料進行偵 1項所述之中該數位電資料進行比 1項所述之中該數位電資料進行搜第1項所述 ’其中該分路可將自待料予以壓縮 ’續將記憶電腦予以解可程式路之待錯資料可程式路之待對資料可程式路之待尋資料之可程析儀為測物中 ’再儲體所儲壓縮資 1224195 si —— 案號9112W1 申請專利範圍、如申請專利範圍料分析之方法，儲存起來。、如申請專利範圍料分析之方法，列印成報表。、如申請專利範圍料分析之方法，待測物之内部資、如申請專利範圍料分析之方法，步驟可對待測物、如申請專利範圍料分析之方法，、步驟可對待測物、如申請專利範圍科分析之方法，步驟可對待測物、如申請專利範資料分析之方裝置，使控制 $壓縮裝置將令記憶體用完送至電腦，經修正可程式化邏輯分析儀資緩衝器之容量，會依據化邏輯分析儀資測信號輔助分析分析。化邏輯分析儀資測信號輔助分析分析。化邏輯分析儀資測信號輔助分析分析。式化邏輯分析儀進一步設有壓縮抓取波形資料透存於記憶體中，存之波形資料傳料後顯示出來。On page 18, the analyzed data in the programmable logic analyzer data described in item 1 can be used in the file format. The analyzed data in the programmable logic analyzer data described in item 1 can be used in the printer. The size of the computer described in item 1 is changed. The item of digital electricity data described in item 1 is detected. The item of digital electricity data described in item 1 is compared with the item of digital electrical data described in item 1. The item "where the shunt can compress the self-waiting material" is continued. The memory computer can be decoded. The program can be programmed with the wrong data. The program can be programmed with the data. The programmable analyzer is the measured object. 'Compressed funds stored in the re-reservoir 1224195 si —— Case No. 9112W1 The scope of patent application, such as the method of material analysis of the patent scope, is stored. The method of material analysis such as the scope of patent application is printed into a report. For example, the method of patent scope material analysis, the internal assets of the test object, such as the method of patent scope material analysis, the steps can be treated, the method of patent scope analysis, the steps can be treated, such as the application The method and method of patent scope analysis can be used to measure the object to be tested, such as the device for patent data analysis, so that the control of the compression device will make the memory run out to the computer, and the capacity of the programmable logic analyzer data buffer can be modified after modification. , It will assist analysis and analysis based on the measured signal of the Logic Analyzer. Signal analysis aided by a logic logic analyzer. Signal analysis aided by a logic logic analyzer. The formatted logic analyzer is further equipped with compression and capture waveform data stored in memory, and the stored waveform data is displayed after transmission.

丄 -- 案號. /、、申請專利範圍 1 1 、=申請專利範園第工項所 — 賢料分析之方法，、j ; 可程式化邏輯分析儀裝置，使控制電路二攸f分析儀為進一步設有壓縮儲存於記憶體中，:將自待測物中抓取波形資料先置將波形資料予η:'己憶體用完後，再透過壓縮裝解壓縮資傳送至電腦，經由電腦予以 12、於析之方法’其主要咏k制電路可從待測物抓取波形資料，並儲存於，憶體内，待記憶體用完後，續再填寫在盆煖衝器晨，嗣再將緩衝器裏的資料傳送到顯示裝^ 顯示出來，嗣再進行數位電路之待測信號辅助^析梦驟： (A )輸入待測信號； (β )#號和邏輯資料庫比較是否符合特性規格； (C)輸出邏輯分析； (D )波形寬度分析； (Ε )比對資料分析； (F )禁止輸入分析； (G )搜尋資料分析；丄-Case number. / 、、 Scope of patent application 1 1 、 = Applicable patent Fanyuan No.1 Institute-Method of material analysis, j; Programmable logic analyzer device, make control circuit two analyzers In order to further provide compression storage in the memory, the waveform data captured from the object to be tested is set to η: 'After the memory has been used up, it is then transmitted to the computer through compression and decompression. 12. The computer analyzes the method. Its main circuit can capture waveform data from the object to be measured and store it in the memory. After the memory is used up, fill it in the basin warmer.嗣 Then transfer the data in the buffer to the display device ^ to display it, and then carry out the auxiliary test signal of the digital circuit to analyze the dream step: (A) input the signal to be tested; (β) # is compared with the logical database Comply with characteristic specifications; (C) output logic analysis; (D) waveform width analysis; (E) comparison data analysis; (F) input analysis is prohibited; (G) search data analysis;

(Η )將分析後之波形資料顯示在波形顯示區； (I )是否要儲存成檔案； (J )結束分析。、如申請專利範圍第1 2項所述之可程式化邏輯分析儀資料分析之方法，其中該分析儀之控制電路從待(Η) Display the analyzed waveform data in the waveform display area; (I) Whether to save it as a file; (J) End the analysis. The data analysis method of the programmable logic analyzer as described in item 12 of the scope of patent application, wherein the control circuit of the analyzer is

1224195 六申請專利範圍測物抓取波形之待測物的資 1 4、如申請專利範儀資料分析之測物抓取波形要測試之待測 1 5、如申請專利範儀資料分析之案形式儲存起 1 6、如申請專利範儀資料分析之表機列印成報 1 7、如申請專利範儀資料分析之，會依據待測 1 8、如申請專利範儀資料分析之助分析步驟可 1 9、如申請專利範儀資料分析之助为析步驟可 2 0、如申請專利範儀資料分析之助分析步驟可案號 911253111224195 Six patent application scopes Measure object to capture the waveform of the object to be tested1 4. If the patent application for the analysis of the profile of the instrument to capture the waveform to be tested 1 5. Such as the case of the patent application Stored 16. If the data analysis device of the patent application is analyzed and printed into a report17. If the data analysis of the patent application is analyzed, it will be based on the test to be performed. 1 9. If the analysis step of the patent application data analysis can be analyzed step 2 0, if the analysis step of the patent application data analysis can be analyzed step number 9125311

為可透過使用者輸人欲測試資料時料規格圍第1 方法，資料時物編號圍第1 方法，來。圍第1 方法，表。圍第1 方法，物之内圍第1 方法，對待測圍第1 方法，對待測圍第1 方法，對待測書來進行相關分析使用 2項所述之可程式化邏輯分其中該分析儀之控制電略# # 為可直接從資料庫中點選所來進行相關分析使用 2項所述之可程式化邏輯分其中該分析後之資料可用以樓 2項所述之可程式化邏輯其中該分析後之資料可利用^ 2項所其中該部資料 2項所其中該物之資 2項所其中該物之> 2頊戶斤其中該物之資述之可程分析儀之大小而變述之可程數位電路料進行偵述之可程數位電路料進行比述之可程數位電路料進行搜式化邏緩衝器化。式化邏之待測錯資料式化邏之待測對資料式化邏之待測守資料輯分析之容量輯分析信號輔分析。輯分析 k號輔分析。輯分析信號輔分析。 mIn order to allow the user to input the data to be tested, the specification of the method is the first method, and the material number is the method of the first method. Wai 1st method, table. Method No.1, Method No.1 within the object, Method No.1 to be tested, Method No.1 to be tested, and relevant analysis of the book to be tested. Use the programmable logic described in item 2 in which the analyzer控电略 # # It can be clicked directly from the database to perform related analysis. Use the programmable logic described in item 2 to analyze the data. The programmable data described in item 2 can be used in the analysis. The data after analysis can be changed by using ^ 2 of the information in the department, 2 of the information in the property, 2 of the property in the 2 > 2 households, and the size of the process analyzer in the property. The described programmable digital circuit material is used for detection, and compared with the described programmable digital circuit material, search-type logic buffering is performed. The data to be tested by the formal logic is wrong. The data is to be tested from the formal logic. Compilation analysis No. k Analysis. Edit analysis Signal auxiliary analysis. m

第20頁 1224195 I rf % 案號申請專利範圍 1、如申請儀資料縮/解波形資再儲存 /解壓再透過如申請儀資料縮/解波形資透過壓緩衝器後，續 91125311Page 20 1224195 I rf% Case number Scope of patent application 1. If the instrument information is applied, the waveform data is saved / decompressed and then transmitted. If the instrument information is applied, the data is reduced / decompressed. The waveform data is passed through the pressure buffer, continued 91125311

羊 f：f 1C. v ^ 2 2 2 專利範圍分析之方壓縮裝置料透過壓於記憶體縮裝置予顯示裝置專利範圍分析之方壓縮裝置料先儲存縮裝置將，再藉由透過顯示第1 2項法，其中 ’使控制縮/解壓中，令記以解壓縮顯示出來第1 2項法，其中 ’使控制於記憶體波形資料壓縮/解裝置顯示所述之可程式該分析儀為進電路可將自待縮裝置將資料憶體用完後，資料後，儲存〇所述之可程式該分析儀為進電路可將自待中’令記憶體予以壓縮/解壓縮裝置予以出來。化邏輯分析一步設有壓測物中抓取予以壓縮，再藉由壓縮到緩衝器，化邏輯分析一步設有壓測物中抓取用完後，再壓縮儲存至解壓縮資料Sheep f: f 1C. V ^ 2 2 2 The square compression device of the patent range analysis is pressed to the memory shrink device to the display device. The square compression device of the patent range analysis is stored in the shrink device first, and then displayed through the first Two methods, among which 'make the control shrink / decompress, and make the descriptive decompression display the first 12 methods, where' make the control in the memory waveform data compression / decompression device display the programmable program described by the analyzer. The circuit can use the self-shrinking device to save the memory after the data is used up. After the data is stored, the analyzer described above can be programmed. The analyzer can be put into the circuit, and the memory can be compressed / decompressed by the device. Logic analysis step is set to grab the pressure object to compress it, and then compress it to the buffer. Logic logic analysis step is set to grab the pressure object. After use, it is compressed and stored to decompress the data.