TWI220256B - Memory card test flow and test mechanism - Google Patents

Memory card test flow and test mechanism Download PDF

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Publication number
TWI220256B
TWI220256B TW92112726A TW92112726A TWI220256B TW I220256 B TWI220256 B TW I220256B TW 92112726 A TW92112726 A TW 92112726A TW 92112726 A TW92112726 A TW 92112726A TW I220256 B TWI220256 B TW I220256B
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Taiwan
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platform
memory card
semi
test
sent
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TW92112726A
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Chinese (zh)
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TW200425153A (en
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Chien-Yuan Chen
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Power Digital Card Co Ltd
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Publication of TW200425153A publication Critical patent/TW200425153A/en

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Abstract

The present invention provides a memory card test flow and its test mechanism. The test mechanism includes a carry-in platen, a test platen, a label platen and an unload platen. A semi-finished product of memory card is transferred to the carry-in platen. The carry-in platen transfers the semi-finished product of memory card to the test platen. The test platen transfers good semi-finished product of memory card to the label platen and sends defective semi-finished product of memory card out of the mechanism. After labeling the semi-finished product of memory card transferred to the label platen, the memory card is transferred to the unload platen for being sent out from the unload platen, so as to perform the subsequent packaging operation. The label platen is a computer carving operation platen to carve information related to the memory card on the casing of the memory card, so as to save the labor of manually adhering stickers, avoid possible error in adhering, and prevent the sticker from being easily worn away, dropped off and replaced.

Description

1220256 五、發明說明(l) 【發明所屬之技術領域】 本發明係提供一種記情卡測試流程及其機台,尤指一 種於記憶卡上以電腦雕刻ς憶卡相關資訊之測試流程及其 機台者- 【先前 隨 增高, 目前新 輸、速度 廠豕及 量、批 大多採 一、 印 不 二、 貼 資 三、 因 消 四、 必 五、 不 量 技術】 著e世 代來臨,電子資料傳輸之隨機性需求亦曰盈 遍使用之記憶卡,或稱智慧卡、數位卡,係 代之健存媒體 ^ 从矣蔷荔、 目前普 快等特 記憶卡 號、曰 用印刷 刷或貼 清。 紙遇水 ° 作業疏 費者與 須耗費 肖販售 貼紙, 匕m卞,驭稱臂憝卜 > •、姐,其具有體積小巧、儲存量咼、, 性,尤適用於多媒體之資料儲存、傳輸,大 容量不同,必須於記憶卡上標示記憶卡J々 期碼、公司名稱等記憶卡相關資訊,其’ 或貼附貼紙,惟,其存在以下許多缺失;^ 一 紙品質不良時,其字樣容“落,導致松不 或環境潮濕、時,容易脫落,導致無法得知其 導致錯貼貼紙,發生容量不符現象,脉置 ίί者或業者之困擾。 後續貼附貼紙之人工虚工時》 — ::自行更換貼紙,;;低容量站紙取代高谷 5人更製造廠家,導致消費者受騙。 【發明内容^1220256 V. Description of the invention (l) [Technical field to which the invention belongs] The present invention provides a memory card test process and a machine thereof, particularly a test process for engraving information related to a memory card with a computer on a memory card, and Machines-[Previously increased with the current increase, the current loss, speed plant volume and volume, most of the batches are taken one, printed two, discounted three, due to four, must five, the amount of technology] With the coming of e-generation, electronic data The randomness of transmission is also referred to as the memory card used by Yingbian, or smart card, digital card, which is replaced by the health media ^ from Qian Qiang Li, the current special fast memory card number, such as printing or paste. Paper meets the water ° Operators who need to work and who need to spend time selling stickers, daggers, control arms > •, sister, it has a small size, storage capacity, and performance, especially suitable for multimedia data storage , Transmission, large-capacity is different, the memory card must be marked on the memory card J々 period code, company name and other information related to the memory card, or 'stickers attached, but there are many missing: ^ When the quality of a paper is poor, The word “falling off” leads to looseness or the environment is wet, and it is easy to fall off, which makes it impossible to know that it caused the wrong stickers, the capacity mismatch phenomenon, and the dilemma of the practitioner or the operator. The subsequent artificial work of attaching stickers时》 — :: Replace stickers by yourself ;; Low-capacity standing paper replaces Takani 5 people and more manufacturers, resulting in consumers being deceived. [Content of the Invention ^

1220256 五、發明說明(2) 爰是,有 於提供一種記 將記憶卡容量 體上者。 本發明之 記憶卡容量直 本發明之 去後續作業可 確率百分之百 本發明之 標示無法置換 【實施方式】 為使 貴審查委 更進一步的認知與瞭 首先請參閱第一 入平台1、、測試平台2 台1、測試平台2、標 作業之機台上,亦,可 下’應以連續作業為 之記憶卡半成品5a ; 進行測試,若合格之 不合格之記憶卡不良 區2 1,以進行檢修或1220256 V. Description of the invention (2) Yes, it is to provide a kind of memory card capacity. The capacity of the memory card of the present invention is as straight as 100% of the follow-up operation of the present invention. The indication of the present invention cannot be replaced. [Embodiment] In order to make your review committee more aware, please refer to the first entry platform 1, and the test platform 2 On the test machine of platform 1, test platform 2, and standard operation, you can also download the semi-finished product of the memory card 5a, which should be used for continuous operation; test if the defective area of the memory card that is unqualified is 21, for maintenance or

鑑於習知技術之缺失,本發明之主要目的在 憶卡測試流程,其係於記憶卡測試流程中, 、批號、日期碼、名稱直接雕刻於記憶卡殼 次要目的在於提供一種記憶卡測試流程,其 接雕刻於記憶卡殼體上,絕對不致脫落者。 另一目的在於提供一種記憶卡測試流程,省 能導致錯貼貼紙之情況,省工、省時,且準 者。 再一目的在於提供一種記憶卡測試流程,其 ’可確保製造業者與消費者權益者。 員能對本發明之特徵、目的及功能有 解,茲配合圖式詳細說明如後。 圖,該記憶卡測試機台主要包括有載 、標示平台3、卸載平台4,該載入丰 示平台3、卸載平台4可設置於一連續 獨立設置,然基於省時、省工之需求 佳;該載入平台1係供栽入未經測試 該測試平台2係對該記憶卡半成品5a 記憶卡良品5 b則送入標不平台3,若 品5 c則送出測試平台2收集於不良品 作廢;該標示平台3係為雷射雕刻平 瞧 第5頁 1220256 五、發明說明(3) _ 台’可將有關記憶卡之容量、址觫 卡等相關資訊雕刻於記情卡良口 ^士日期碼、名稱等記憶In view of the lack of known technology, the main purpose of the present invention is the memory card test process, which is in the memory card test process. The batch number, date code, and name are directly engraved on the memory card shell. The secondary purpose is to provide a memory card test process. It is engraved on the casing of the memory card and will not fall off. Another purpose is to provide a memory card test process that saves energy and leads to mis-stickers, saving labor, time and accuracy. Another purpose is to provide a memory card testing process that can ensure manufacturers and consumers. The staff can understand the features, objects, and functions of the present invention, and are described in detail below with reference to the drawings. As shown in the figure, the memory card testing machine mainly includes an on-loading, labeling platform 3, and an unloading platform 4. The loading display platform 3 and the unloading platform 4 can be set in a continuous independent setting. ; The loading platform 1 is for loading the untested test platform 2 for the semi-finished product of the memory card 5a, and the good product 5b is sent to the standard platform 3; if the product 5c is sent to the test platform 2 for collection of defective products Obsolete; the marking platform 3 is laser engraving. Look at page 5 1220256 V. Description of the invention (3) _ Taiwan 'can engrav the relevant information about the memory card capacity, address card and other information on the memory card Liangkou Date code, name and other memories

送出,以進行後續包裝ζ卡業良⑼’並能將記憶卡良品W 請同時參閱第一圖+ a載入:將記情卡丰由本發明之測試步驟為: a·戰八將圯u卞牛成品5a送入載入 n 將記憶卡半成品5 a送入測試平台1 · 入平台1 b.測試:由測試平台!測試記憶卡半成品5&,記憶 。 5b送入標不平台3,記憶卡不良品5 μ卡良品 « ^ , , , ^ ^ ^ ^ ^, d.卸載:送入卸載平台4之記憶卡良 戰十口4 ; 出,以進行後續包裝作業。 戰干台4送 綜上所述,本發明之特點在於將記憶卡之 號、日期碼、名稱等記憶卡等相關資訊雕刻於記J2 因此可節省人通貼附貼紙必須耗費之工時以及可二道上, 錯貼,並能避免貼紙容易磨損、脫落或被置換之致之 以上所述者,僅為本發明之較佳實施例冬不At T鳊,惟 本發明的範圍,即大凡依本發明.中請專利S圍; 變化及修飾’仍將不失本發明之要義所在,亦不 明之精神和範圏,敌都應視為本發明的進一 +每A離+發 v貝施狀況。 【圖式簡單說明】 第一圖係本發明之作業機台之示意圖。Send it out for subsequent packaging. The card industry good product 'and can load the good product of the memory card W Please refer to the first picture + a at the same time: The test steps of the memory card card from the present invention are: a · 战 八 将 圯 u 卞The finished product 5a is sent to load n The semi-finished product of the memory card 5 a is sent to the test platform 1 · Enter the platform 1 b. Test: from the test platform! Test memory card semi-finished product 5 & memory. 5b into the standard platform 3, bad memory card 5 μ card good product «^,,, ^ ^ ^ ^ ^, d. Unloading: send the memory card into the unloading platform 4 good fight ten port 4; out for follow-up Packaging operations. As described above, the combat platform 4 presents a feature of the present invention: the memory card number, date code, name and other related information are sculpted in J2. Therefore, it can save man-hours and time required to attach stickers. In the second way, the wrong stickers can prevent the stickers from being easily worn, detached or replaced. The above are only the preferred embodiments of the present invention. However, the scope of the present invention is The invention. Please apply for patent S; changes and modifications' will still lose the essence of the invention, and the spirit and scope of the unknown, the enemy should be regarded as the situation of the present invention + every A departure + hair v besch. [Brief description of the drawings] The first diagram is a schematic diagram of the working machine of the present invention.

1220256 五、發明說明(4) 第二圖係本發明之製造流程方塊圖。 圖號說明: 1-載入平台 2 -測試平台 2 1 -不良品區 3 -標示平台 4-卸載平台 5a-記憶卡半成品 5 b、5 d -記憶卡良品 5 c -記憶卡不良品 a'載入 b-測試 c -標示 d -卸載1220256 V. Description of the invention (4) The second diagram is a block diagram of the manufacturing process of the present invention. Description of drawing numbers: 1- Loading platform 2-Testing platform 2 1-Defective product area 3-Labeling platform 4- Unloading platform 5a-Memory card semi-finished product 5 b, 5 d-Memory card good product 5 c-Memory card defective product a ' Load b-test c-mark d-unload

1220256 圖式簡單說明 第一圖係本發明之作業機台之示意圖 第二圖係本發明之製造流程方塊圖。 ΊΒΒΙ 第8頁1220256 Brief description of the drawings The first diagram is a schematic diagram of the working machine of the present invention. The second diagram is a block diagram of the manufacturing process of the present invention. ΊΒΒΙ Page 8

Claims (1)

1220256 六、申請專利範圍 1. 一種記憶卡測試流程,其步驟為: a. 備置有未經測試之記憶卡半成品; b. 備置一載入平台、一測試平台、一標示平台、一卸載 平台; c. 載入:將記憶卡半成品送入載入平台,由該載入平台 將記憶卡半成品送入測試平台, d. 測試:由測試平台測試記憶卡半成品,良品送入標示 平台,不良品則送出該測試平台;. e. 標示:將送入標示平台之記憶卡半成品進行標示作業 後,再將記憶卡送入卸載平台; f. 卸載:送入卸載平台之記憶卡經由卸載平台送出,以 進行後續包裝作業者。 2. 如申請專利範圍第1項所述之記憶卡測試流程,其中, 該標示平台係為一雕刻作業平台者。 3. 如申請專利範圍第2項所述之記憶卡測試流程,其中, 該雕刻作業平台係為一雷射雕刻作業平台者。 4. 如申請專利範圍第2或3項所述之記憶卡測試流程,其 中,該雕刻作業平台設定之雕刻内容包括記憶卡容量、 批號、日期碼、名稱等記憶卡之相關資訊者。 5. 如申請專利範圍第1項所述之記憶卡測試流程,其中, 該載入平台、測試平台、標示平台、卸載平台係,設置於 一連續機台上,以進行連續作業者。 6. —種記憶卡測試流程,其步驟為: a.備置有未經測試之記憶卡半成品;1220256 6. Scope of patent application 1. A memory card testing process, the steps are: a. Preparing semi-finished products of untested memory cards; b. Preparing a loading platform, a testing platform, a marking platform, and an unloading platform; c. Loading: The semi-finished product of the memory card is sent to the loading platform, and the semi-finished product of the memory card is sent to the testing platform by the loading platform. d. Testing: The semi-finished product of the memory card is tested by the testing platform, and the good product is sent to the labeling platform. Submit the test platform; e. Labeling: After marking the semi-finished product of the memory card sent to the labeling platform, send the memory card to the unloading platform; f. Unloading: The memory card sent to the unloading platform is sent through the unloading platform to Perform subsequent packaging operations. 2. The test procedure for a memory card as described in item 1 of the scope of patent application, wherein the marking platform is a carving platform. 3. The memory card testing process described in item 2 of the scope of patent application, wherein the engraving operation platform is a laser engraving operation platform. 4. The memory card testing process described in item 2 or 3 of the scope of patent application, in which the engraving content set on the engraving operation platform includes information about the memory card capacity, batch number, date code, name and other memory card information. 5. The test procedure for a memory card as described in item 1 of the scope of patent application, wherein the loading platform, testing platform, marking platform, and unloading platform are set on a continuous machine for continuous operators. 6. —A kind of memory card testing process, the steps are as follows: a. Prepare semi-finished products of untested memory cards; 第9頁 1220256 六、申請專利範圍 b. 備置一測試機台,該機台具有載入平台、測試平台、 標示平台、卸載平台; c. 將記憶卡半成品送入該機台之載入平台,由該載入平 台將記憶卡半成品送入測試平台; d. 由測試平台測試記憶卡半成品,良品送入標示平台, 不良品則送出該機台; e. 將送入標示平台之記憶卡半成品進行標示作業後.,再 將記憶卡送入卸載平台; f. 送入卸載平台之記憶卡經由卸載平台送出,以進行後 續包裝作業者。 7.如申請專利範圍第6項所述之記憶卡測試流程,其中, 該標示平台係為一雕刻作業平台者。 L如申請專利範圍第7項所述之記憶卡測試流程,其中, 該雕刻作業平台係為一雷射雕刻作業平台者。 9.如申請專利範圍第7或8項所述之記憶卡測試流程,其 中,該雕刻作業平台設定之雕刻内容包括記憶卡容量、 批號、日期碼、名稱等記憶卡之相關資訊者。 1 0. —種記憶卡測試機台,該機台具有載入平台、測試平 台、標示平台、卸載平台; 藉此,將記憶卡半成品送入載入平台,由該載入平台 將記憶卡半成品送入測試平台,再由測試平台測試記 憶卡半成品,良品送入標示平台,不良品則送出該機 台,將送入標示平台之記憶卡半成品進行標示作業 後,再將記憶卡送入卸載平台,送入卸載平台之記憶Page 1220256 6. Application scope of patent b. Prepare a test machine with a loading platform, a testing platform, a labeling platform, and an unloading platform; c. Send the semi-finished product of the memory card to the loading platform of the machine, The loading platform sends the semi-finished product of the memory card to the test platform; d. The semi-finished product of the memory card is tested by the testing platform, the good product is sent to the labeling platform, and the defective product is sent to the machine; e. After marking the operation, the memory card is sent to the unloading platform; f. The memory card sent to the unloading platform is sent out through the unloading platform for subsequent packaging operations. 7. The test procedure for a memory card according to item 6 of the scope of patent application, wherein the marking platform is a engraving operation platform. L The memory card testing process described in item 7 of the scope of patent application, wherein the engraving operation platform is a laser engraving operation platform. 9. The memory card test process described in item 7 or 8 of the scope of patent application, wherein the engraving content set on the engraving operation platform includes information about the memory card capacity, batch number, date code, name and other memory card information. 1 0. — A memory card testing machine having a loading platform, a testing platform, a labeling platform, and an unloading platform; thereby, the semi-finished product of the memory card is sent to the loading platform, and the semi-finished product of the memory card is loaded by the loading platform. Send it to the test platform, and then test the semi-finished product of the memory card on the test platform. Good products will be sent to the labeling platform. Defective products will be sent to the machine. To the memory of the uninstall platform 第10頁 1220256 六、申請專利範圍, 卡經由卸載平台送出,以進行後續包裝作業者。 11.如申請專利範圍第10項所述之記憶卡測試機台,其 中,該標示平台係為一雕刻作業平台者。 1 2.如申請專利範圍第11項所述之記憶卡測試機台,其 中,該雕刻作業平台係為一雷射雕刻作業平台者。 1 3.如申請專利範圍第11或1 2項所述之記憶卡測試機台, 其中,該雕刻作業平台設定之雕刻内容包括記憶卡容 量、批號、日期碼、名稱等記憶卡之相關資訊者。Page 10 1220256 6. Scope of patent application. The card is sent out through the unloading platform for subsequent packaging operators. 11. The memory card testing machine according to item 10 of the scope of patent application, wherein the marking platform is a engraving operation platform. 1 2. The memory card testing machine according to item 11 of the scope of patent application, wherein the engraving operation platform is a laser engraving operation platform. 1 3. The memory card testing machine described in item 11 or 12 of the scope of patent application, wherein the engraving content set on the engraving operation platform includes information about the memory card capacity, batch number, date code, name, etc. .
TW92112726A 2003-05-09 2003-05-09 Memory card test flow and test mechanism TWI220256B (en)

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* Cited by examiner, † Cited by third party
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TWI409822B (en) * 2008-03-26 2013-09-21

Cited By (1)

* Cited by examiner, † Cited by third party
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TWI409822B (en) * 2008-03-26 2013-09-21

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