TW522235B

TW522235B - Automatic insert testing device

Info

Publication number: TW522235B
Application number: TW90113886A
Authority: TW
Inventors: Yau-De Shiu
Original assignee: Wistron Corproation; Acer Co Ltd
Priority date: 2001-06-07
Filing date: 2001-06-07
Publication date: 2003-03-01

Abstract

An automatic insert testing device uses the matching connection between an insert and a connector of a motherboard to test the electrical performance of the connector, and comprises a front guide plate, a rear guide plate, two guide rods, and a driving device. Two guide holes are installed on the front guide plate near the two sides thereof, the middle part thereof matches with the insert, so that the guide plate and the front guide plate are connected through the elastic component on the two sides thereof. The diameter of the guide rod is smaller than the diameter of the guide hole of the front guide plate, and one end thereof is a conical head structure and the other end inserts into the guide hole of the front guide plate and combines on the rear guide plate, in which the elastic force of the elastic component can separates the front guide plate and the rear guide plate from each other so that the two guide holes of the front guide plate separately abut on the slant face of the conical head of the two guide rods. The driving device can drive the automatic insert testing device forward so that the insert thereon matches with the connector on a motherboard. When an insert and an connect can not match each other nicely due to a deflection therebetween, the elastic component will deform so that the guide plate rotates along the deflection direction, thereby enabling the insert to smoothly complete its matching with the connector.

Description

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五、發明說明G) 發明領域：器電性效能之測於主機板之連接本發明係有關於一種以插件測試連接試治具，特別是指一種可自動將插件結合器之測試治具。發明背景：隨著資訊科技的蓬勃發展，電腦已成為現代人生活中 :口缺的重要工具之一’％因此電腦產業便成為現今世界上敢重要的明星工業。V. Description of the invention G) Field of the invention: Measurement of the electrical performance of the device Connected to the motherboard This invention relates to a test fixture that uses a plug-in to test the connection, and particularly to a test fixture that can automatically plug in a plug-in adapter. Background of the Invention: With the vigorous development of information technology, computers have become one of the most important tools in modern people ’s lives. Therefore, the computer industry has become a star industry in the world.

=參閱圖一所示，其係為電腦内部之主機板（M〇ther 〇ar )不意圖，主機板10表面設有各種型式之插槽，可供 f，IC元件以及介面卡插人，而為了提昇電腦的功能，在主機板10的四周通常會設置各種不同介面型式之連接器 12，包括USB、Audio、CRT、LAN/TEL、printer port、 PS2>m〇use/Keyb〇ard 以及 AC Adapter 等。這些連接器 ^主要係做為電腦與其周邊配備連繫之介面，其目的在二提昇電腦的功能以擴大電腦的應用範圍。= Please refer to Figure 1. It is not intended for the main board (M〇ther 〇ar) inside the computer. The main board 10 is provided with various types of slots on the surface for f, IC components and interface cards. In order to improve the function of the computer, various connectors 12 are usually provided around the motherboard 10, including USB, Audio, CRT, LAN / TEL, printer port, PS2> mouse / Keyb〇ard and AC Adapter. Wait. These connectors ^ are mainly used as the interface between the computer and its surroundings. The purpose is to enhance the computer's functions to expand the scope of computer applications.

♦然而，在電腦的製造過程中，特別是對於筆記型電腦的製造過程中，這些連接器大部分都是以表面黏著技術 SMy) $成於主機板的周邊，因此在製程中若要對上述連，器進仃測試，就必須在主機板的周邊設置複數個與連接 "配之插件，藉由插件與連接器之間互相地匹配結合，♦ However, in the manufacturing process of computers, especially for notebook computers, most of these connectors are formed on the periphery of the motherboard using surface adhesion technology (SMy). Therefore, in the manufacturing process, if the above To test the device, you must set up a number of plug-ins that match the connection on the periphery of the motherboard. By matching and combining the plug-in and the connector,

522235 五、發明說明（2) 以達到測試主機板之逵技哭+ α 之結合測試，主要是利’而目前插件與連接器測试之方法與原理係說明如下。具請參閲圖二所示，苴传為翌具20示意圖，包括—前^2^知=之自動插件測試治 9Q甘士义夹板2〗、一後夾板22以及一氣遷缸 ϋή 』、後夾板21、22二側係利用二固定蟫呼24加以鎖固結合，前夹板21在其前方中門户孫」疋f，，，糸24加以後夹板22在其後方中間/ T :間f係权有二插件25 ’而俊万宁間處則疋與氣壓缸23相連接，為了能夠以自動化方式對主機板10之自、522235 V. Description of the invention (2) The combination test to test the main board of the main board + α is mainly for the benefit of the test method and principle of the current plug-in and connector testing. Please refer to Figure 2 for a description of the tool 20, including-front ^ 2 ^ know = the automatic plug-in test 9Q Gan Shiyi splint 2〗, a rear splint 22 and a gas transfer cylinder price 』, rear splint 21 The two sides are locked and combined by two fixed cymbals 24, and the front splint 21 is in front of its front center. 疋 f ,, 糸 24 and the rear splint 22 is in the middle of the rear. Two plug-in units 25 'and Jun Wanning are connected to the pneumatic cylinder 23 in order to be able to automatically and automatically

:測試治具2。的設置都是事先被安排在固定丁二：動J 夾板22進行前後移動，使前夾板21前 :之插件25與主機板10之連接器12完成匹配結合或分離之動作，以達到測試連接器12之電性效能之目的。缺而，多時候連接器會因為SMT製程中所產生之空焊或定位上的偏差而造成偏移，此時，若自動插件測試治具盔法接器的偏移調整’連接器很容易在氣壓紅驅動插件向^ 過程中，因為無法與連接器完成匹配結合，而甚至主機板的破壞。取逆按口口因此，如何設計出一種自動插件測試治具，使其在對主機板，連接器進行測試時，不會因為連接器的偏移而造成連接斋或主機板的破壞’並順利地完成插件與連接秀之間的電性效能測試，實為從事電腦製造業之工程師所^欲第6頁 522235: Test fixture 2. The settings are arranged in advance in fixed Ding Er: move the J splint 22 back and forth, so that the front 25 of the front splint 21: the plug 25 and the connector 12 of the motherboard 10 complete the matching or separation action to achieve the test connector Purpose of electrical performance of 12. However, in many cases, the connector will be offset due to air welding or positioning deviation generated during the SMT process. At this time, if the automatic plug-in test fixture adjusts the offset adjustment of the helmet helmet connector, the connector is easy to During the process of driving the red pressure plug-in, it is impossible to complete the matching with the connector, and even the motherboard is damaged. Therefore, how to design an automatic plug-in test fixture so that when testing the motherboard and the connector, it will not cause the connection or the motherboard to be damaged due to the displacement of the connector. Complete the electrical performance test between the plug-in and the connection show, which is really desired by engineers engaged in computer manufacturing. Page 6 522235

解決的目標。發明目的：本發明之主要目的在於接供_播白其具有条h㉗一種自動插件測試治具，胥角度調整之功能，使插件可以配合調整，淮品成上工κ 士口逆接器的偏位做〜進而使插件與連接器可以順利地完ώ PE献沾人行測試 ” J ^疋風四配結合以進本發明接器之電性板、二導桿徑較大之導合，後導板是小於前導另一端則是時，彈性元開，使得前面，若驅動上之插件將之自動插件測試治效能，其第一實施具係應例包括前導板一固定彈性元其一端入並結彈力可頂住二測試治進行匹以及一驅孔，其中與前導板板之二導由前導板件係為受導板之二裝置驅動與主機板動裝置。間處設有之間設有孔孔徑，之導孔套壓狀態其導孔分別自動插件之連接器用於測試一前導板之二側分頭可與一件，二導係為錐形合於後導以驅動前導桿之錐具向前，配結合。王機板之連、一後導別設有二孔插件相結桿之桿徑則頭結構，其板之上，此、後導板分形頭之斜則將使得其但是在很多情況下連接器可能會因為偏位的關係而無法與插件匹配結合，使得前導板在結合的過程遭受到阻礙，但由於導桿之桿徑較前導板之導孔孔徑小，因此一旦前導板受到阻礙而退縮時，彈性元件將會因為受力而產生Solved goals. Purpose of the invention: The main purpose of the present invention is to provide a device that has an automatic plug-in test fixture, an angle adjustment function, so that the plug-in can cooperate with the adjustment, and Huai Pincheng will be able to perform the deviation of the Shikou reverse connector. Do ~, so that the plug-in and connector can successfully complete the PE test with the "People's test" J ^ The combination of four winds to enter the electrical board of the connector of the present invention, the larger diameter of the two guide rods, the rear guide plate When it is smaller than the other end of the lead, the elastic element is opened, so that if the plug-in on the drive is used to test the automatic plug-in performance, the first implementation example includes a front guide plate with a fixed elastic element and one end of the elastic element. It can withstand the second test rule and the first drive hole, in which the second guide and the front guide plate are driven by the second guide device of the guide plate and the main board moving device. In the state of the guide hole sleeve, the guide holes of the guide holes are automatically inserted. The connectors are used to test that the two sides of a front guide can be split with one piece. The two guides are tapered to the rear guide to drive the front guide rod. It has a forward and matching combination. The connection of the king plate and the rear guide are provided with a two-hole plug-in connecting rod. The diameter of the head structure is above the plate. The slope of the fractal head of the rear guide plate will make it However, in many cases, the connector may not be able to be matched with the plug due to the offset relationship, which causes the front guide plate to be hindered in the joining process. However, because the rod diameter of the guide rod is smaller than the hole diameter of the guide hole of the front guide plate, once When the front guide is blocked and retracted, the elastic element will be generated due to the force.

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變形，使前導板可以順著連接器的偏位方向轉插件順利地結合於連接器之上以進行電性效能的測試而將本發明之第二實施例乃將第一實施例中之前後導板位置互換，即將插件結合於後導板上，而驅動裝置由前導板驅動自動插件測試治具移動，如此亦可達到如第一實施例之效果。為使貴審查委員能確實瞭解本發明之目的、特徵及Deformed, so that the front guide plate can be smoothly combined with the connector along the offset direction of the connector to perform electrical performance testing. The second embodiment of the present invention is a front and rear guide of the first embodiment. The board positions are interchanged, that is, the plug-in is combined with the rear guide plate, and the driving device drives the automatic plug-in test fixture to move by the front guide plate, so that the effect of the first embodiment can also be achieved. In order for your review committee to know the purpose, characteristics and

功效有更進一步的瞭解與認同，茲配合圖式詳細說明如后：圖式之簡要說明：圖一係為電細内部之主機板示意圖；圖二係為習知技術之自動插件測試治具示意圖；圖二A、二B係為本發明自動插件測試治具之第一實施例圖，The function has been further understood and agreed, and the detailed description with the drawings is as follows: Brief description of the drawings: Figure 1 is a schematic diagram of the motherboard inside the electrical device; Figure 2 is a schematic diagram of the automatic plug-in test fixture of the conventional technology Figures 2A and 2B are diagrams of the first embodiment of the automatic plug-in test fixture of the present invention,

圖四A、四B係為第一實施例之插件與連接器結合之動作示意圖；圖五A、五B係為第二實施例之插件與：連接器結合之動作示意圖。圖式之圖號說明：Figures 4A and 4B are schematic diagrams showing the actions of the plug-in and connector combination of the first embodiment; Figures 5A and 5B are schematic diagrams of the action of the plug-in and connector combination of the second embodiment. Illustration of drawing number

第8頁 522235 五、發明說明（5) 2卜前夾板 23〜氣壓缸 2 5〜插件 32〜後導板 34〜驅動裝置 3 6〜固定頭 3 8〜螺孔 4 0〜水平基座 42〜墊圈 20〜自動插件裝置 2 2〜後夾板 24〜固定螺絲 3卜前導板 33〜導桿 35〜導孔 3 7〜螺栓 3 9〜彈性元件 41〜錐形頭詳細說明：本發明揭露一種自動插件測試治具，其係藉由插件與連接器的匹配結合，以達到測試連接器之電性效能，其詳細内容將由下列所提之實施例做為說明。、请參閱圖三A、三B所示，其係為本發明之自動插件測试治具之第一實施例圖’本實施例·之自動插件測試治具3〇包括一鈾導板3 1、一後導板3 2、二導桿3 3以及一驅動裝置 3 4二I在刖導板31之二側係分別設有二孔徑較大之導孔 35，在中間位置處則机女 _ _ π，ίϋ # a 有一固定頭3&可將一插件25固定住，固疋頭3 6係利用痛如定於其中，且所固=數顆螺检37以鎖固方式將插件2 5固 12規格而有所不^定之插件25形式係依據所測試之連接器基座4〇。 ’又在前導板31之下方則是設有一水平Page 8 522235 V. Description of the invention (5) 2 Front splint 23 ~ Pneumatic cylinder 2 5 ~ Plug-in 32 ~ Rear guide 34 ~ Drive device 3 6 ~ Fixed head 3 8 ~ Screw hole 4 0 ~ Horizontal base 42 ~ Washer 20 ~ Automatic insert device 2 2 ~ Rear splint 24 ~ Fixing screw 3 Front guide 33 ~ Guide rod 35 ~ Guide hole 3 7 ~ Bolt 3 9 ~ Elastic element 41 ~ Tapered head Detailed description: The present invention discloses an automatic insert The test fixture is a combination of the plug-in and the connector to achieve the electrical performance of the test connector. The details will be described by the following examples. Please refer to FIGS. 3A and 3B, which are the first embodiment of the automatic plug-in test fixture of the present invention. The automatic plug-in test fixture of this embodiment 30 includes a uranium guide plate 31. , A rear guide plate 3 2, two guide rods 3 3, and a driving device 3 4 two I are respectively provided with two larger guide holes 35 on the two sides of the cymbal guide plate 31, and in the middle position is a female _ _ π ， ίϋ # a has a fixed head 3 & can fix an insert 25, the fixed head 3 6 series use the pain as fixed in it, and fixed = several screw inspection 37 to lock the insert 2 5 The form of the plug-in 25, which varies according to the 12 specifications, is based on the tested connector base 40. ’There is a level below the front guide plate 31

522235 五、發明說明（6) 後導板32在其二侧係設有二螺孔38，後導板32與前導板31之間設有二彈性元件39，彈性元件39係以線圈彈簧為最佳並設於前導板31之導孔35與後導板32之螺孔38之間，而一導桿3 3之桿控則是略小桿3 3之一端係為錐形頭41之由前導板31之導孔35套入線螺孔3 8互相結合，又，在線設有墊圈4 2。此時，線圈彈動前、後導板31、32分開，頂住一導桿3 3之錐形頭41斜缸，其係結合於後導板3 2之自動插件測試治具前後移動以與主機板1〇之連接器12進由於將插件25***連接明中之彈性元件39須於受力之彈力以便將插件2 5***連當壓縮範圍内須產生相當於同種類的插件25與其相對應力量不一，本發明可藉由改調整彈性元件39之壓縮程度試之連接裝置所需之結合力於前導板31之導孔35孔徑，導外張表面結構，其另一端則是圈彈簧内部，再與後導板32之圈彈簧與導孔35相鄰接之處係簧係為受壓狀態其彈力可以驅使得前導板31之二導孔35分別面，而驅動裝置34係為一氣壓中間適當位置處，其可以驅動，使前導板31前方之插件2 5可行匹配結合或分離。器1 2須憑藉一結合力量，本發壓縮至某一程度時產生一所需接器12，亦即彈性元件39於適上述結合力量之彈力。由於不之連接器1 2結合時所需之结合變導桿33鎖入螺孔38之進程，以及彈力，以產生適合所欲測 *& 0522235 5. Description of the invention (6) The rear guide plate 32 is provided with two screw holes 38 on its two sides, and two elastic elements 39 are provided between the rear guide plate 32 and the front guide plate 31. The elastic element 39 is a coil spring as the most It is preferably located between the guide hole 35 of the front guide plate 31 and the screw hole 38 of the rear guide plate 32, and the lever control of a guide rod 33 is slightly smaller. One end of the rod 33 is connected by the front guide of the tapered head 41. The guide holes 35 of the plate 31 are inserted into the thread screw holes 3 8 and are combined with each other, and a washer 4 2 is provided on the line. At this time, the coil springs the front and rear guide plates 31 and 32 apart, and abuts a tapered head 41 inclined cylinder of the guide rod 3 3, which is combined with the automatic insert test fixture of the rear guide plate 3 2 to move forward and backward to communicate with Since the connector 12 of the motherboard 10 is inserted into the elastic element 39 of the connector 25, the elastic force 39 of the connector must be subjected to a force of force in order to insert the connector 25 into the connector. The equivalent plug 25 must be generated corresponding to the connector 25. Different strengths, the present invention can adjust the degree of compression of the elastic element 39 to adjust the coupling force required by the connection device to the hole 35 of the guide hole 31 of the front guide plate 31, and guide the surface structure of the outer surface, and the other end is the inside of the coil spring Then, the spring adjacent to the coil spring of the rear guide plate 32 and the guide hole 35 is in a compressed state, and its elastic force can drive the two guide holes 35 of the front guide plate 31 respectively, and the driving device 34 is a pneumatic pressure. At the appropriate position in the middle, it can be driven, so that the inserts 25 in front of the front guide plate 31 can be combined and separated for matching. The device 12 must rely on a combination force. When the hair is compressed to a certain degree, a required connector 12 is generated, that is, the elastic element 39 is adapted to the elastic force of the above combination force. Due to the required coupling when the connector 12 is combined, the process of locking the guide rod 33 into the screw hole 38 and the elastic force to produce a suitable test * & 0

522235 五、發明說明（7) --— 請參閱圖四A、四B所示，在很多情況下（如背景說明所述）連接器1 2可能會因為偏位的關係而無法正確地與插件25匹配結合，使得前導板31在結合的過程遭受到阻礙，但由於導桿33之桿徑較前導板31之導孔35孔徑小，一旦前導板3 1在結合的過程中受到阻礙而退縮時，其二側或是其中〆側之導孔3 5將與導桿3 3之錐形頭41分開或沿導桿3 3及錐形頭41滑動，此時彈性元件將因為受力而產生變形，使得前導板31可以在導孔35與導桿33之間的間隔範圍^進行各方向小角度之轉動，因此前導板31將可以順著連接器12 偏位的方向轉動，使插件2 5可以順利地與連接器丨2結合以進行電性效能的測試。 σ 請參閱圖五A、五Β所示’其係為本發明之第二實施例示意圖。本實施例乃將第一實施中之前導板31與後導板“ 位置互換，即將插件25固定在後導板32上，而驅動裝置W 自前導板31推動治具移動。凡了解第一實施例之運作方式者，當可推知在此實施例中，當插件25與連接器12觸接，後導板32即可以順著連接器12偏位的方向轉動，使插㈣可以順利地與連接器丨2結合以進行電性效能的測試。值得一提的是，本發明之自.動插件測試治具並不限定於對主機板進行測#，其可應用於任何電子裝置的測試，試之插件與連接器也可以是任何形式之結合件與被、“件。此夕卜，本發明之自動插件測試治具可以利522235 V. Description of the invention (7) --- Please refer to Figures 4A and 4B. In many cases (as described in the background description), the connector 1 2 may not be able to communicate with the plug-in correctly due to the misalignment. 25 matching combination makes the front guide plate 31 encounter obstacles in the joining process, but because the rod diameter of the guide rod 33 is smaller than the diameter of the guide hole 35 of the front guide plate 31, once the front guide plate 31 is hindered during the combination process and retracts The guide holes 3 5 on the two sides or the 〆 side will be separated from the tapered head 41 of the guide rod 33 or slide along the guide rod 3 3 and the tapered head 41. At this time, the elastic element will be deformed due to the force. , So that the front guide plate 31 can be rotated at a small angle in each direction within the interval between the guide hole 35 and the guide rod 33, so the front guide plate 31 can be rotated in the direction of the offset of the connector 12, so that the insert 25 can Smoothly combine with connector 丨 2 for electrical performance test. σ Please refer to FIG. 5A and 5B, which are schematic diagrams of the second embodiment of the present invention. In this embodiment, the position of the front guide plate 31 and the rear guide plate in the first implementation is interchanged, that is, the insert 25 is fixed on the rear guide plate 32, and the driving device W pushes the jig from the front guide plate 31 to move. For example, it can be inferred that in this embodiment, when the plug-in 25 is in contact with the connector 12, the rear guide plate 32 can be rotated in the direction of the offset of the connector 12, so that the plug can be smoothly connected with the plug. The device 2 is combined to perform the electrical performance test. It is worth mentioning that the automatic plug-in test fixture of the present invention is not limited to the test of the motherboard. It can be applied to the test of any electronic device. The plug-in and connector can also be any kind of combination piece and quilt. Moreover, the automatic plug-in test fixture of the present invention can facilitate

第11頁 522235 五、發明說明（8) 用複數個測試治具同時間行測試，因此只需要一次裝置上之所有被結合件進表面所有被結合件的測；就可以完成電子裝置 Λ 以提昇產品的產能。當然，以上所述僅Α女欲ππ 隹者方H # db 馮本發明之自動插件測試治具之較發明之範圍。本發月之精神所做之修改均應屬於本人=如上述貫施例中，雖使用一對彈性元件達成提供結 :里之功效，然热習該項技藝者當可僅利用一彈性元件作用於前後導板，即可達到上述功能。又例如上述貫施例中，雖利用導桿之錐形頭來達成自動對位之功效:然熟習該項技藝者當可利用任一於_端形成外張表面之導引構件，使裝設插件之導板在導孔與導引構件間的間隔範圍内進行各方向小角度之轉動，而達到上述功能。因此本發明之保護範圍當以下列所述之申請專利範圍做為依據。Page 11 522235 V. Description of the invention (8) Testing with multiple test fixtures at the same time, so only need to test all the bonded parts on the device into all the bonded parts on the surface at one time; you can complete the electronic device Λ to upgrade Product capacity. Of course, the above description is only for A female desire ππ 隹者方 H # db Feng's automatic plug-in test fixture of the present invention is within the scope of the invention. The modifications made by the spirit of the present month should belong to me = as in the above-mentioned embodiment, although a pair of elastic elements are used to provide the effect of providing the knot: the effect, but those skilled in the art can use only one elastic element to function The front and rear guides can achieve the above functions. For another example, in the above-mentioned embodiment, although the tapered head of the guide rod is used to achieve the function of automatic alignment: However, those skilled in the art can use any guide member that forms an outer surface at the _ end to make the installation The guide plate of the insert card rotates at small angles in all directions within the interval between the guide hole and the guide member to achieve the above function. Therefore, the protection scope of the present invention should be based on the patent application scope described below.

522235 圖式簡單說明圖式之簡要說明：圖一係為電腦内部之主機板示意圖；圖二係為習知技術之自動插件測試治具示意圖；圖三A、三B係為本發明自動插件測試治具之第一實施例固 · 圖，圖四A、四B係為第一實施例之插件與連接器結合之動作示意圖；圖五A、五B係為第二實施例之插件與連接器結合之動作示意圖。522235 Brief description of the diagram Brief description of the diagram: Figure 1 is a schematic diagram of the motherboard inside the computer; Figure 2 is a schematic diagram of an automatic plug-in test fixture of known technology; Figures 3A and 3B are automatic plug-in tests of the present invention Fixing diagram of the first embodiment of the fixture. Figures 4A and 4B are schematic diagrams of the combination of the plug-in and the connector of the first embodiment. Figures 5A and 5B are the plug-in and the connector of the second embodiment. Combined action diagram.

第13頁Page 13

Claims

522235 六、申請專利範圍申請專利範圍 1 · 一種自動插件測試治具，係藉由一插件與一主機板之連接器互相匹配結合，以測試該連接器之電性效能之自動插件測試治具，其包括：一前導板，其在靠近二側之位置處係設有二導孔，其中上述插件係固定於二導孔之間；一後導板，係設於前導板之後方，其與前導板之間設有至乂一彈性元件，上述彈性元件之二端係分別與前、後導板互相接觸；一導桿，其桿徑係小於前導板之導孔孔徑，上述導桿之一端係為錐形頭結構，其另一端則是由前導板之導孔套入並結合於該後導板之上，其中上述彈性元件之彈力係可以驅動前、後導板分開，使得前導板之二導孔分別頂於上述二導桿之錐形頭之斜面；以及一驅動裝置，係可以驅動該自動插件測試治具向前移動，使其上之插件與主機板之連接器進行四配結合；當插件與連接器之間因為偏位而無法確實匹配結合時，上述彈性元件將產生變形，造成前導板順著偏位的方向轉動’使得插件可以順利地與連接器完成匹配結合。 2 ·如申請專利範圍第1項所述之自動插件測試治具，其中在前導板之中間適當位置處係設有一固定頭可將該插件固定於前導板之前方。 3 ·如申請專利範圍第2項所述之自動插件測試治具，其中該固定頭係利用複數顆嫘栓將該插件鎖固於其中。522235 6. Scope of patent application Patent scope 1 · An automatic plug-in test fixture is an automatic plug-in test fixture that tests the electrical performance of the connector by matching and combining a plug-in with a connector of a motherboard. It includes: a front guide plate, which is provided with two guide holes near the two sides, wherein the insert is fixed between the two guide holes; a rear guide plate, which is located behind the front guide plate, and An elastic element is provided between the plates, and the two ends of the elastic element are in contact with the front and rear guide plates respectively; a guide rod whose diameter is smaller than the hole diameter of the guide hole of the front guide plate, and one end of the guide rod is It is a tapered head structure, and the other end is sleeved by the guide hole of the front guide plate and combined with the rear guide plate. The elastic force of the elastic element can drive the front and rear guide plates apart, so that the second of the front guide plate is separated. The guide holes are respectively pressed on the inclined surfaces of the tapered heads of the two guide rods; and a driving device can drive the automatic plug-in test fixture to move forward, so that the plug-in on it and the connector of the main board are four-matched Together; when the connector between the plug and because misalignment can not be bound do match, the above elastic element is deformed, resulting in the front face along the direction of rotation of the deviation 'so that plug connector can be smoothly completed matching binding. 2 · The automatic plug-in test fixture according to item 1 of the scope of patent application, wherein a fixing head is provided at an appropriate position in the middle of the front guide plate to fix the plug-in unit in front of the front guide plate. 3. The automatic plug-in testing jig as described in item 2 of the scope of patent application, wherein the fixing head is used to lock the plug-in therein using a plurality of cymbals.

第14頁 522235 六、申請專利範圍 4 ·如申請專利範圍第1項所述之自動插件測試治具，其中上述彈性元件包含一對線圈彈簧，且上述二導桿係分別套入二線圈彈簧的内部。 5 ·如申請專利範圍第4項所述之自動插件測試治具，其中該後導板之二側係設有二螺孔，上述螺孔係分別與前導板之導孔互相對應，上述導桿係穿過前導板之導孔並與後導板之螺孔相結合，且上述導桿鎖入上述螺孔之進程為可調整，以利進一步調整線圈彈簧產生之彈力。 6·如申請專利範圍第1項所述之自動插件測試治具，其中該驅動裝置係為氣壓缸。 7 ·如申請專利範圍第1項所述之自動插件測試治具，其中該驅動裝置係結合於後導板之中央適當位置處。 8 ·如申請專利範圍第1項所述之自動插件測試治具，其中上述彈性元件產生上述插件與連接器結合所需之結合力量。 9· 一種自動插件測試治具，係藉由一插件與一主機板之連接器互相匹配結合，以測試該連接器之電性效能之自動插件測試治具，其包括：一前導板，其中間之適當位置處係與上述插件相結合；一後導板，係設於前導板之後方，其:與前導板之間設有至少一彈性元件，上述彈性元件之二端係分別與前、後導板互相接觸；二導桿，其桿徑係小於後導板之導孔孔徑，上述導桿之一端係為錐形頭結構，其另一端則是由後導板之導孔套入Page 14 522235 VI. Patent Application Range 4 · The automatic plug-in test fixture described in item 1 of the patent application range, wherein the above-mentioned elastic element includes a pair of coil springs, and the above-mentioned two guide rods are respectively sleeved into two-coil springs. internal. 5 · The automatic plug-in test fixture according to item 4 of the scope of patent application, wherein two sides of the rear guide plate are provided with two screw holes, and the above screw holes correspond to the guide holes of the front guide plate, respectively, and the guide rod It passes through the guide hole of the front guide plate and is combined with the screw hole of the rear guide plate, and the process of locking the guide rod into the screw hole is adjustable to further adjust the spring force generated by the coil spring. 6. The automatic plug-in test fixture according to item 1 of the scope of patent application, wherein the driving device is a pneumatic cylinder. 7 · The automatic plug-in test fixture as described in item 1 of the scope of patent application, wherein the driving device is coupled to an appropriate position in the center of the rear guide plate. 8 · The automatic plug-in test fixture according to item 1 of the scope of the patent application, wherein the elastic element generates the binding force required for the plug-in to be connected with the connector. 9. · An automatic plug-in test fixture, which is an automatic plug-in test fixture that tests the electrical performance of the connector by matching and combining a plug-in with a connector of a motherboard, which includes: a front guide plate, a middle An appropriate position is combined with the above-mentioned plug-in; a rear guide plate is arranged behind the front guide plate, which is provided with at least one elastic element between the front guide plate, and the two ends of the elastic element are respectively connected with the front and the rear. The guide plates are in contact with each other; the two guide rods are smaller in diameter than the guide hole diameter of the rear guide plate. One end of the guide rod is a tapered head structure, and the other end is sleeved by the guide hole of the rear guide plate.

第15頁 522235 六、申請專利範圍 ----—一" ' 並結合ί該前導板之上，其中上述彈性元件之彈力係可以驅動刖、後導板分開，使得後導板之二導孔分別頂於 ^述二導桿之錐形頭之斜面；以及 °動裝置係可以驅動該自動插件測試治具向前移動， $使其上之插件與主機板之連接器進行匹配結合；當插件與連接器之間因為偏位严無法確實匹配結合時，上述彈性元件將產生變形，造成前導板以及導桿順著偏位的方向轉動’使插件可以順利地與連接器進行匹配結合。 I 0 ·如申請專利範圍第9項所述之自動插件測試治具，其中上述彈性元件產生上述插件與連接器結合所需之結合力量。 II ·如申請專利範圍第9項所述之自動插件測試治具，其中在前導板之中間適當位f處係設有一固定頭可將該插件固疋於如導板之前方。 12 ·如申請專利範圍第9項所述之自動插件測試治具，其中上述彈性元件包含一對線圈彈簧，且上述二導桿係分別套入二線圈彈簧的内部。 13·如申請專利範圍第1 2頊所述之自動插件測試治具，其中該前導板之二側係設有二螺孔，—上述螺孔係分別與後導板之導孔互相對應，上述導桿係穿過後導板之導孔並與前導板之螺孔相結合’且上述導桿鎖入上述螺孔之進程為可調整，以利進一夕調整線圈彈簧產生之彈力。 14·如申請專利範圍第9項所述，之自動插件測試治具，其中 522235 六、申請專利範圍該驅動裝置係為氣壓缸。 15· —種電子裝置測試治具，用於使一結合件與所測電子裝置中之一被結合件產生對位並結合，以利對該電子裝置之性能進行測試，該測試治具包含：一驅動裝置，用以產生該結合并結合該被結合件所需位移之動力；一對位裝置，其一端係固接該結合件，另一端則受該驅動裝置作用而產生位移並帶動該結合件產生位移，該對位裝置包含：一前導板，其適當位置處係設有二導孔；一後導板，係設於該前導導板之後側適當位置處；二導桿，其一端係分別固定在該後導板上，而其另一端則分別穿過該前導板之導孔，並於端部形成一尺寸大於該導孔孔徑之錐形頭，使前導板被限制在該錐形頭與該後導板之間；以及至少一彈性元件，其兩端係分別與該前、後導板互相接觸，其彈力作用可以使該前導板抵靠在該錐形頭之斜面上；其中於該結合件觸接該被結合件時’該前導板與該後導板得受力縮短間距並而造成該彈性元件壓縮變形，該前導板之導孔得沿著上述二導桿產生滑動，使該前導板與該後導板產生配合該結合件與該被結合件兩者結合方向之角度偏移，而該彈性元件產ώ生之彈力足以使該結合件與該被結合件產生完全結合。Page 15 522235 6. Scope of applying for patents-a " and combined with the front guide plate, in which the elastic force of the above-mentioned elastic element can drive the cymbal and the rear guide plate to separate, so that the second guide plate of the rear guide plate is separated. The holes are respectively pressed on the inclined surfaces of the tapered head of the two guide rods; and the moving device can drive the automatic plug-in test fixture to move forward, so that the plug-in on it and the connector of the motherboard are matched and combined; when When the plug-in and the connector cannot be accurately matched and combined due to the strict deviation, the above-mentioned elastic element will be deformed, causing the front guide plate and the guide rod to rotate in the direction of the misalignment, so that the plug-in can be smoothly matched with the connector. I 0 · The automatic plug-in test fixture according to item 9 of the scope of the patent application, wherein the elastic element generates a binding force required for combining the plug-in and the connector. II. The automatic plug-in test fixture as described in item 9 of the scope of patent application, wherein a fixing head is provided at an appropriate position f in the middle of the front guide plate to fix the plug-in unit in front of the guide plate. 12 · The automatic insert test fixture according to item 9 of the scope of the patent application, wherein the elastic element includes a pair of coil springs, and the two guide rods are respectively inserted into the interior of the two coil springs. 13. The automatic plug-in testing jig as described in the scope of application patent No. 121, wherein two sides of the front guide plate are provided with two screw holes, the above-mentioned screw holes respectively correspond to the guide holes of the rear guide plate, the above The guide rod passes through the guide hole of the rear guide plate and is combined with the screw hole of the front guide plate, and the process of locking the guide rod into the screw hole is adjustable to facilitate the adjustment of the spring force generated by the coil spring overnight. 14. The automatic plug-in test fixture as described in item 9 of the scope of patent application, of which 522235 VI. The scope of patent application The driving device is a pneumatic cylinder. 15 · —An electronic device testing jig for aligning and combining a bonding part with one of the electronic parts to be tested for testing the performance of the electronic device. The testing jig includes: A driving device for generating the driving force for the coupling and the required displacement of the coupled component; a pair of positional devices, one end of which is fixedly connected to the coupling component, and the other end is caused by the driving device to generate displacement and drive the coupling The alignment device includes: a front guide plate, which is provided with two guide holes at an appropriate position; a rear guide plate, which is provided at an appropriate position on the rear side of the front guide plate; two guide rods, whose one end is connected with They are respectively fixed on the rear guide plate, and the other ends are respectively passed through the guide holes of the front guide plate, and a tapered head with a size larger than the hole diameter of the guide hole is formed at the end, so that the front guide plate is restricted to the tapered shape. Between the head and the rear guide plate; and at least one elastic element, the two ends of which are in contact with the front and rear guide plates, respectively, and its elastic effect can make the front guide plate abut against the inclined surface of the tapered head; To the combination When contacting the coupled member, the front guide plate and the rear guide plate are forced to shorten the distance and cause the elastic element to be compressed and deformed. The guide hole of the front guide plate must slide along the two guide rods to make the front guide plate An angular deviation of the coupling direction between the coupling member and the coupled member is generated with the rear guide plate, and the elastic force produced by the elastic element is sufficient to fully combine the coupling member and the coupled member.

第17頁 522235 六、申請專利範圍 16.如申請專利範圍第15項所述之電子裝置測試治具，其中該結合件係固接於前導板之上，而該驅動裝置則是固接於後導板之上。 1 7·如申請專利範圍第丨5項所述之電子裝置測試治具，其中該結合件係固接於後導板之上，而該驅動裝置則是固接於前導板之上。 1 8·如申請專利範圍第丨5項所述之電子裝置測試治具，其中所測試之電子裝置係為主機板。 ^ ’、 1 9 · 一種電子裝置測試治具，用於使一結合件與所測電子裝置中之一被結合件產生對位並結合，以利對該電子裝置之性能進行測試，該測試設備包含：一驅動裝置，用以產生該結合件結合該被結合件所需之位移；一對位裝置，其一端係固接該結合件，另一端則受該驅動裝置作用而產生位移並帶動該結合件產生位移，該對位裝置包含：一第一導板，其適位處設有兩導孔；一第二導板，係間隔地設於該第一導板之一側；二導引件，各導引件之一端係固定在該第二導板上，而另一端則分別穿過該第一導板上之兩導孔並形成一使終端尺寸大於該導孔孔徑之外張表面’而將該第一導板限制在該外張表面與該第二導板之間’該第一導板得透過一導孔孔壁沿一導引件滑動，且得透過另一導孔孔壁沿另一導引件滑動；以及Page 17 522235 VI. Patent application scope 16. The electronic device test fixture as described in item 15 of the patent application scope, wherein the joint is fixed on the front guide plate, and the driving device is fixed on the rear Above the guide. 17. The electronic device testing jig as described in item 5 of the patent application scope, wherein the coupling member is fixed on the rear guide plate, and the driving device is fixed on the front guide plate. 1 8. The electronic device testing jig as described in item 5 of the patent application scope, wherein the tested electronic device is the motherboard. ^ ', 1 9 · An electronic device testing jig for aligning and combining a bonding piece with one of the bonded pieces of the tested electronic device to facilitate testing of the performance of the electronic device. The testing device Including: a driving device for generating the displacement required for the coupling member to join the coupled member; a pair of bit devices, one end of which is fixedly connected to the coupling member, and the other end is displaced by the driving device and causes the displacement The alignment member is displaced, and the alignment device includes: a first guide plate provided with two guide holes at an appropriate position; a second guide plate provided on one side of the first guide plate at intervals; two guides One end of each guide is fixed on the second guide plate, and the other end passes through the two guide holes of the first guide plate and forms a flared surface so that the terminal size is larger than the hole diameter of the guide hole 'And the first guide plate is limited between the outer surface and the second guide plate' The first guide plate must slide along a guide through a guide hole hole wall and pass through another guide hole hole wall along another Guide sliding; and

522235 六、申請專利範圍至少一彈性元件，兩端係分別與該第一導板與該第二導板接觸，其彈力作用方向為將.該第一導板抵靠在該外張表面上之方向；其中，該第一導板與該第二導板兩者受力時，該第一導板得分別沿該二導引件產生滑動，以利該第一導板與該第二導板產生相對角度偏移；其中，該驅動裝置得作用在該第一導板與該第二導板兩者其中之一導板，而該結合件則固接在另一導板；於該結合件觸接該被結合件時，該第一導板與該第二導板產生之相對角度偏移即自動配合該結合件與該被結合件兩者之結合方向，該彈性元件產生之彈力足以使該結合件與該被結合件產生完全結合。 2 0 ·如申請專利範圍第1 5項或第丨9項所述之測試治具，其中該彈性元件產生之彈力為可調整。 t522235 6. The scope of the patent application is at least one elastic element, both ends of which are in contact with the first guide plate and the second guide plate, respectively, and the direction of the elastic force is that the first guide plate abuts against the outer surface. Direction; when the first guide plate and the second guide plate are stressed, the first guide plate must slide along the two guides, so as to facilitate the first guide plate and the second guide plate A relative angular offset is generated; wherein the driving device must act on one of the first guide plate and the second guide plate, and the coupling member is fixed to the other guide plate; When contacting the coupled member, the relative angular deviation of the first guide plate and the second guide plate automatically matches the coupling direction of the coupling member and the coupled member, and the elastic force generated by the elastic element is sufficient to make The coupling member is completely combined with the coupled member. 20 • The test fixture as described in item 15 or item 9 of the scope of patent application, in which the elastic force generated by the elastic element is adjustable. t

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