TW499046U - Optimized gas sampling device - Google Patents

Optimized gas sampling device

Info

Publication number
TW499046U
TW499046U TW91204938U TW91204938U TW499046U TW 499046 U TW499046 U TW 499046U TW 91204938 U TW91204938 U TW 91204938U TW 91204938 U TW91204938 U TW 91204938U TW 499046 U TW499046 U TW 499046U
Authority
TW
Taiwan
Prior art keywords
sampling device
gas sampling
optimized gas
optimized
sampling
Prior art date
Application number
TW91204938U
Other languages
Chinese (zh)
Inventor
Jean-Marc Girard
Benjamin Jurcik
Chun-Hao Ly
Original Assignee
Air Liquide
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Air Liquide filed Critical Air Liquide
Publication of TW499046U publication Critical patent/TW499046U/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0011—Sample conditioning
    • G01N33/0016—Sample conditioning by regulating a physical variable, e.g. pressure or temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Combustion & Propulsion (AREA)
  • Biomedical Technology (AREA)
  • Molecular Biology (AREA)
  • Sampling And Sample Adjustment (AREA)
TW91204938U 2000-02-01 2001-01-31 Optimized gas sampling device TW499046U (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0001251A FR2804508A1 (en) 2000-02-01 2000-02-01 METHOD AND DEVICE FOR SAMPLING OPTIMALIZED GAS

Publications (1)

Publication Number Publication Date
TW499046U true TW499046U (en) 2002-08-11

Family

ID=8846537

Family Applications (1)

Application Number Title Priority Date Filing Date
TW91204938U TW499046U (en) 2000-02-01 2001-01-31 Optimized gas sampling device

Country Status (4)

Country Link
AU (1) AU2001235556A1 (en)
FR (1) FR2804508A1 (en)
TW (1) TW499046U (en)
WO (1) WO2001057491A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8380446B2 (en) * 2010-06-14 2013-02-19 Schlumberger Technology Corporation System and method for determining the phase envelope of a gas condensate
CN110470800B (en) * 2019-08-27 2022-08-16 武汉科技大学 Gas distribution system and method for nitrogen oxide sensor calibration

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2714968B1 (en) * 1994-01-07 1996-03-29 Air Liquide Method and device for supplying gas to an analyzer of traces of impurities in a gas.
US5665902A (en) * 1994-05-10 1997-09-09 American Air Liquide, Inc. Method to analyze particle contaminants in compressed gases
US5963336A (en) * 1995-10-10 1999-10-05 American Air Liquide Inc. Chamber effluent monitoring system and semiconductor processing system comprising absorption spectroscopy measurement system, and methods of use
SG63825A1 (en) * 1997-03-11 1999-03-30 Applied Materials Inc In situ monitoring of contaminants in semiconductor processing chambers

Also Published As

Publication number Publication date
AU2001235556A1 (en) 2001-08-14
FR2804508A1 (en) 2001-08-03
WO2001057491A1 (en) 2001-08-09

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