TW466140B

TW466140B - Inspection and classficatin machine for plastic capacitors

Info

Publication number: TW466140B
Application number: TW88105083A
Authority: TW
Inventors: Shr-Kai Huang
Original assignee: Shr-Kai Huang
Priority date: 1999-03-31
Filing date: 1999-03-31
Publication date: 2001-12-01

Abstract

An inspection and classification machine for plastic capacitors are composed from a pneumatic pump, an automatic material feeder stand, an inspection machine, a central processor unit for testing, digital testers, a charge/discharge power supply and a motor driven transmission mechanism. Several pneumatic cylinders controlled by the pneumatic pump force the plastic capacitors dropping from the inspection machine. On the automatic material feeder stand, there are more than one electromagnetic vibration automatic material feeders which move the capacitors to be tested into the straight feeder of the host inspection machine that includes a four-claw feeding disk, a main testing disk, a fixture disk, a pin straightening mechanism, a pre-testing mechanism, an insulation resistance testing station and a high/low frequency capacitance loss testing station. The motion of the above mentioned mechanism in the inspection machine are controlled by the motor driven transmission mechanism. After the capacitor is sent in turn through the straight feeder, the four-claw feeding disk, the fixture disk and so on, the capacitor will go through a series of preset function tests and defect product exclusion procedure, and further inspection and selection operation such as automatic classification, catergorization and statistics are then completed.

Description

4 6 6] 40 五、發明說明（υ 本發明係與一種塑膠膜電容器之成品檢驗分選機有關，更詳而言之，特別係指一種藉由密集之分站測試與檢驗，俾正確檢選符合預期品質之電容器以供使用之新穎發明者。按，任一電子產品中，其任一電子零件之品質良莠，攸關該產品於日後之品質及功能是否得以碟保，進而維持一定程度以上之優良率，而本發明便是針對塑膠膜電容器其耐壓、容量、損耗、絕緣阻抗及實際使用時之穩定性等潛在品質方面，而所研發成功之一檢驗分選機，俾提供業界在應用該電容器於電子產品之前，可做一最佳之事前檢驗與測試，進而做為取捨之依據，並確保產品品質者。而為使進一步深入瞭解本發明之結構特徵，茲配合圖式詳述如下：圖。意圖示意面示平面。。之平圖圖構之體意機台立矛動料合面傳送組平達動之之馬自明明明明發發發發本本本本 #係係係明圖圖圖圖說一二三四單第第第第簡之式圖' 圖號之簡單說明： iO:氣壓泵 11:氣壓缸 20:自動送料台 30:檢驗主機 2 1、2 2 :自動送料盤 3 1 :直線送料器 4 0 :中央處理器 5 0、5 1 、5 2、5 3 :測量儀表 8 0 :充放電電源供應器4 6 6] 40 V. Description of the invention (υ This invention is related to a finished product inspection and sorting machine for plastic film capacitors, and more specifically, it refers to a kind of accurate inspection through intensive substation testing and inspection. Select a novel inventor of a capacitor that meets the expected quality for use. According to any electronic product, the quality of any of its electronic parts is good or bad, it is related to whether the quality and function of the product will be guaranteed in the future, and to maintain a certain level. The above rate is excellent, and the present invention is aimed at the potential quality of plastic film capacitors such as voltage resistance, capacity, loss, insulation resistance, and stability in actual use. Before the capacitor is applied to electronic products, the industry can do the best prior inspection and testing, and then use it as a basis for selection and ensure product quality. In order to further understand the structural features of the present invention, the drawings are hereby provided. The details are as follows: Figure. Intended to show the plane .. The plan of the plan. The structure of the machine. Famingfafafafafafafabenben ## is a schematic diagram of the first diagram of the first two three or four single form of the first number of the simple diagram of the drawing number: iO: pneumatic pump 11: pneumatic cylinder 20: automatic feeding table 30: Inspection host 2 1, 2 2: Automatic feed tray 3 1: Linear feeder 4 0: Central processing unit 50, 5 1, 5, 2, 5 3: Measuring instrument 80: Charge and discharge power supply

五、發明說明（2) 6 0 :馬達傳動機構 3 0 0 :四爪進料盤 3 1 0 :主測試盤 3 2 0 :夾具盤 3 3 0 :整腳機構 3 4 0 :預測機構 7 0 :電容器 3 5 0 :絕緣阻抗測試點 3 6 0 :高低頻容量損耗測試機構 2丨1、2 2 1 :送料槽道 3 0 1、3 0 2、3 0 3、3 0 4 :進料爪 7 1 :接腳 3 2 1 :夾具 3 2 2、3 5 1 、3 6 1 :收集箱 3 2 :心軸 6 2 :凸輪 2 4 :移位轉盤 3 1 1 :電緣接點 2 3 :移位螺桿機構 Cl ' C2 ' C3 'C4 、C5 、C6 、C7:特定收集箱首先，請參閱第一、二圖所示，本發明主要係由一氣壓泵10、一自動送料台20、一檢驗主機30、一中央處理器 4 0、數測量儀表5 0、5 1 、5 2、5 3、一充玫電電源供應器8 0 及一馬達傳動機構6 0所組成，其中，氣壓泵1 0可配合數氣壓缸1 1做為檢驗主機3 0若干落料站之強迫落料用途；自動送料台2 0上則具有一個以上之電磁振動式自動送料盤2 1、 2 2，俾將欲測試之電容器7 0依序送入檢驗主機3 0之直線送料器3 1處；另，檢驗主機3 0則係包括有四爪進料盤3 0 0 、一主測試盤3 1 0、一爽具盤3 2 0、一整腳機構3 3 0 及一預測機構3 4 0、一絕緣阻抗測試點3 5 0及一高低頻容量損耗測試機構3 6 0 所組成，且該等構件之運動均係由設於檢驗主機 3 0後方之馬達傳動機構6 0所驅動；是，當電容器7 0經由直線送料器3 1依序進入四爪進料盤3 0 0 及夾具盤'3 2 0 後，將受到一連串預先設定之各項功能檢測及不良品排除程序，進而完成自動分級、歸類及統計等檢驗分選作業。V. Description of the invention (2) 6 0: Motor drive mechanism 3 0 0: Four-jaw feed tray 3 1 0: Main test plate 3 2 0: Fixture plate 3 3 0: Full leg mechanism 3 4 0: Prediction mechanism 7 0 : Capacitor 3 5 0: Insulation resistance test point 3 6 0: High and low frequency capacity loss test mechanism 2 丨 1, 2 2 1: Feeding channel 3 0 1, 3 0 2, 3 0 3, 3 0 4: Feeding claw 7 1: Pin 3 2 1: Clamp 3 2 2, 3 5 1, 3 6 1: Collecting box 3 2: Mandrel 6 2: Cam 2 4: Shifting dial 3 1 1: Electrical contact 2 3: Displacement screw mechanism Cl'C2'C3'C4, C5, C6, C7: specific collection box First, please refer to the first and second figures, the present invention is mainly composed of a pneumatic pump 10, an automatic feeding table 20, a The inspection host 30, a central processing unit 40, a digital measuring instrument 50, 51, 5, 2, 5, 3, a charging power supply 80 and a motor transmission mechanism 60, of which, the air pump 1 0 Can be used with several pneumatic cylinders 1 1 as the inspection host 3 0 Forced blanking of several blanking stations; automatic feeding table 2 0 has more than one electromagnetic vibration type automatic feeding tray 2 1 and 2 2 The tested capacitors 70 are sent to inspection in order 1 of the linear feeder 3 of the host 30; In addition, the inspection of the host 30 includes a four-jaw feed tray 3 0 0, a main test tray 3 1 0, a cooler tray 3 2 0, and a full-foot mechanism 3 3 0 and a prediction mechanism 3 40, an insulation resistance test point 3 50, and a high and low frequency capacity loss test mechanism 3 6 0, and the movement of these components are all located behind the inspection host 3 0 Driven by the motor transmission mechanism 60; yes, when the capacitor 70 enters the four-jaw feed tray 3 0 0 and the clamp plate '3 2 0 in sequence through the linear feeder 31, it will be subject to a series of preset functions. And defective products elimination procedures, and then complete automatic classification, classification and statistics inspection and sorting operations.

第S頁 4 66彳 4 ΟPage S 4 66 彳 4 Ο

再請配合參閱第三圖所示，該四爪進料盤“ο受S' 傳動機構6 0之牽動’故可位於原位進行九十度之間斷^ ^ 轉動作’當任一進料爪3 0 1位於直線送料器3 1位置時，旋進行自動夾料（即夹取一電容器7 〇 )之動作；當任一進f 爪3 0 2位於整腳機構3 3 0位置時，將由該整腳機"構“ο針f 電容器7 0之兩接腳71處進行導正動作，俾令該兩接腳7丨不致彎曲或外張，使之稍後能順利進入夾具盤3 2 〇之夾具3 2 j 中；當任一進料爪3 0 3位於預測機構3 4 0位置時，將針對電容器7 0之容直及損耗做預先之檢測作業，並配合相對之測量儀表5 0將測試結果加以顯示，倘有測得不良者，將會於主測武盤3 1 0之不良品落料站處被強迫落料，並進入不良品收集箱3 2 2集_處理；當任一進料爪3 〇 4位於夾具盤3 2 0 之一側時’則將由夾具盤3 2 0之夾具3 2 1加以夾取完成進料程序者。其夾具盤320受馬達傳動機構6〇之牵動，故可位於原位進行較小行程之間斷式旋轉動作，其周緣具有無數之夾具321，俾穩固夾持電容器70之兩接腳71者。其主測試盤3 1 0與夾具盤3 2 0位於同一心軸3 2上，且其直徑小於夾具盤3 2 0 ，其後端面受馬達傳動機構6 0之凸輪 6 2頂推作用’而可位於原位做前、後之伸縮運動行程’另 ’其周緣相對於夾具盤320夾具321之位置上，設有無數呈對應之電緣接點3 1 1以連通測試用電路，因此，當主測試盤310向前位移而與夾具盤320接觸後，該各電源接點311 便與九具盤320 .之對應電路（未示於圖）連通而各自形成Please also refer to the third figure, the four-jaw feeding tray "ο is driven by S 'transmission mechanism 60 0', so it can be located in the original position to perform a ninety-degree break ^ ^ turning action 'when any of the feed jaws When 3 0 1 is at the position of 3 1 of the linear feeder, it will automatically perform the clamping operation (ie, a capacitor 7 〇); when any of the feed claws 3 0 2 are at the position of the whole foot 3 3 0, The whole foot machine is configured to guide the pins 71 of the two pins 71 of the capacitor 70 to prevent the two pins 7 from being bent or flared, so that they can enter the fixture plate 3 2 later. In the fixture 3 2 j; when any of the feeding claws 3 0 3 is located at the position 3 4 0 of the predicting mechanism, a pre-test operation will be performed for the capacity and loss of the capacitor 70, and cooperate with the corresponding measuring instrument 5 0 The test results show that if there is a bad measurement, it will be forced to blank at the defective product blanking station of the main test Wupan 3 10, and enter the defective product collection box 3 2 2_ processing; when any When the feeding claw 3 04 is located on one side of the clamp plate 3 2 0, the clamp 3 2 1 of the clamp plate 3 2 0 will be clamped to complete the feeding procedure. The clamp plate 320 is driven by the motor transmission mechanism 60, so it can be positioned in the position to perform intermittent rotary motion with small strokes. It has countless clamps 321 on its periphery, and can hold the two pins 71 of the capacitor 70 firmly. The main test plate 3 1 0 and the fixture plate 3 2 0 are located on the same mandrel 32, and the diameter is smaller than that of the fixture plate 3 2 0, and the rear end surface is pushed by the cam 6 2 of the motor transmission mechanism 60. The telescoping stroke before and after the original position is 'other', and its peripheral edge is relative to the position of the clamp plate 320 and the clamp 321, and there are numerous corresponding electrical edge contacts 3 1 1 to connect the test circuit, so when the main After the test disc 310 is moved forward to contact the fixture disc 320, the power contacts 311 communicate with the corresponding circuits (not shown) of the nine-piece disc 320 and are formed separately.

第7頁 4 6 6 1 4 Ο 五、發明說明（4) 一獨立測試站，復因該每一測試站之作用均已被事先設定，是，當夾具盤3 2 0之夾具3 2 1到達某一測試站後，位於夾具3 2 1 上之電容器7 0便被施以預期之測試或強迫落料等作業（包括預測不良品落料站、絕緣阻抗不良品落料站及測試完成後之無數分級落料站），待測試完成後，主測試盤 3 1 0將内縮並與夾具盤3 2 0分離而暫時切斷測試用電路，同時，夾具盤3 2 0 將隨之旋動一預定行程，並重覆前述主測試盤3 1 0 伸出之檢測步驟者。前述之預測不良品落料站、絕緣阻抗不良品落料站及測試完成後之無數分級落料站，皆各自搭配有一氣壓缸1 1 ，俾·藉以開啟夾具3 2 1使電容器7 0自行掉落而進入相對之收集箱322、351、361、C1、C2、C3、C4、C5、C6、C7 中，惟由於該大多數氣壓缸1 1係位於夾具盤3 2 0 後方，故在圖式中誠難以全數地清楚繪出，否則將影響圖式之可辨視程度，故僅繪製 < 氣壓缸Η代表之，還請諒察。前述_ k測試盤3 1 0 每一測試站之測試標的或目的皆係由中央處理器4 0所預先設定，然此程式設定方面之控制方式非屬專利申請範疇，故將不予贅述，析請諒察。其充放電電源供應器8 0之作用乃係在若干測試站申，對受测電容器7 0進行反覆充放電之步驟，藉以模擬電容器 7 0之實際使用狀態，完成電容器7 0之老化測試步驟，倘有測得不良者，將會於主測試盤3 1 0 之落料站處被強迫落料，並進入一特定收集箱C6集中處理者。其絕緣阻抗測試點3 5 0 配合有測量儀表5 1，俾對每一Page 7 4 6 6 1 4 〇 V. Description of the invention (4) An independent test station, because the function of each test station has been set in advance, when the fixture 3 2 1 of the fixture plate 3 2 0 arrives After a certain test station, the capacitor 70 located on the fixture 3 2 1 is subjected to the expected test or forced blanking (including the prediction of the defective blanking station, the insulation resistance defective blanking station, and Countless graded blanking stations), after the test is completed, the main test disc 3 1 0 will be retracted and separated from the clamp disc 3 2 0 to temporarily cut off the test circuit. At the same time, the clamp disc 3 2 0 will rotate along with it. A person who has scheduled a trip and repeats the aforementioned detection step of the main test disc 3 1 0 being extended. The aforementioned predicted defective product blanking station, insulation resistance defective product blanking station, and countless graded blanking stations after testing are all equipped with a pneumatic cylinder 1 1, 俾 · By opening the clamp 3 2 1 to make the capacitor 70 drop by itself Fall into the opposite collection boxes 322, 351, 361, C1, C2, C3, C4, C5, C6, C7, but since most of the pneumatic cylinders 1 1 are located behind the clamp plate 3 2 0, so in the diagram It is difficult for Zhongcheng to draw all of them clearly, otherwise it will affect the legibility of the drawing, so only the < pneumatic cylinder Η is represented, please forgive me. The aforementioned _ k test disc 3 1 0 The test target or purpose of each test station is set in advance by the central processing unit 40. However, the control method of this program setting is not in the scope of patent application, so it will not be described in detail. Please forgive me. The role of its charge and discharge power supply 80 is to apply the repeated charging and discharging steps to the tested capacitor 70 at a number of test stations to simulate the actual use of the capacitor 70 and complete the aging test step of the capacitor 70. If there is a bad measurement, it will be forced to be blanked at the blanking station of the main test plate 3 10, and will enter a specific collection box C6 for centralized processing. Its insulation resistance test point 3 5 0 is equipped with a measuring instrument 5 1

4 6 6彳40 五、發明說明（5) 電容器70遂行該項測試，並將測試結果及統計值加以顯示，而當某一電容器7 0被測出之絕緣阻抗值不符合預定之設定值時，將在絕緣阻抗不良品落料站被強迫落料，並進入不良品收集箱3 5 1集中處理。其高低頻容量損耗測試機構3 6 0 配合測量儀表5 2、5 3 而被固定於主測試盤3 1 0 之高頻損耗測試站處，俾對每一電容器7 0遂行該項測試，並將測試結果及統計值加以顯示，而當某一電容器7 0被測出高頻損耗率高於設定值時，亦將被強迫落料於分級落料站之一特定收集箱3 6 1中者。4 6 6 彳 40 5. Description of the invention (5) The capacitor 70 performs the test and displays the test results and statistical values. When the insulation resistance value measured for a certain capacitor 70 does not meet the predetermined set value , Will be forced to blank at the blanking station with defective insulation resistance, and enter the defective product collection box 3 5 1 for centralized processing. The high and low frequency capacity loss test mechanism 3 6 0 is fixed at the high frequency loss test station of the main test panel 3 1 0 in cooperation with the measuring instruments 5 2 and 5 3, and then performs the test on each capacitor 70. The test results and statistical values are displayed, and when the high frequency loss rate of a certain capacitor 70 is higher than the set value, it will also be forced to blank in one of the special collection boxes 3 61 of the graded blanking station.

最後，當一電容器7 0完成各項檢測後，將藉由中央處理器4 [)依判讀測試結果，並於分級落料站分別被強迫落料至對應之一特定收集箱Cl、C2、C3、C4、C5、C6、C7中並直接完成分類作業者。前述各特定收集箱Cl、C2、C3、C4、C5、C6、C7之排列順序及位置，係供做分級與區隔檢測後電容器7 0之用，故其隨時可隨使用習慣或方便性之考量而設定其分別所收集之檢測後電容器7 0等級者。又，當某一電容器70在測試過裎中因電力中斷或其它因素而有漏失某一檢測項目時，該電容器70將在分級落料站處，被強迫落料於重測收集箱C 7中，俾供再次重測。Finally, after a capacitor 70 has completed various tests, it will read the test results by the central processing unit 4 [), and will be forced to blank to the corresponding one of the specific collection boxes Cl, C2, and C3 at the grade blanking station. , C4, C5, C6, C7 and directly complete the classification operator. The arrangement order and position of each of the aforementioned specific collection boxes Cl, C2, C3, C4, C5, C6, and C7 are for the capacitor 70, which is used for grading and segmentation detection, so it can be used at any time with convenience or convenience. Taking into account the level of the 70 capacitors collected after detection, respectively. In addition, when a capacitor 70 misses a detection item due to power interruption or other factors during the test, the capacitor 70 will be forced to be blanked in the re-test collection box C 7 at the graded blanking station. , For retesting again.

前述由夾具盤3 2 0及主測試盤3 1 0所構成之無數測試站，其測試項目除有預先測試、絕緣阻抗測試、高低頻容量損耗測試及老化測試外，更可包含有交流耐壓測試、電介質強度測試或其它特殊用途之專業级檢測項目者。The countless test stations composed of the fixture disc 3 2 0 and the main test disc 3 10 mentioned above may include AC withstand voltage in addition to pre-test, insulation resistance test, high and low frequency capacity loss test, and aging test. Professional test items for testing, dielectric strength testing or other special purposes.

第9頁 4 6 61 4 0 五、發明說明（6) 再如第四圖所示者，自動送料台20下方具有一移位螺桿機構2 3，故使用者可藉旋動移位轉盤2 4將之驅動，令送料台2 0可被左、右橫移，俾使任一電磁振動式自動送料盤 2 1、2 2之送料槽道2 Π、2 2 1對準檢驗主機3 0之直線送料器 31 ，達成自動送料之目的，同時，該電磁振動式自動送料盤2 1 、2 2中，可分別置入不同規格、尺寸之電容器7 0以符合實用需求；另，由於電磁振動式自動送料盤2 1 、2 2係為習用之自動送料機構，誠非本發明之特徵所在，故亦不予贅述。綜觀以上所言，本發明確係一利用自然法則及投術思想之高度創作，更確實可達成預期之發明目的，誠已完全符合發明專利要件，更值得鈞局之鼓勵與肯定，爰依法提出專利申請。Page 9 4 6 61 4 0 5. Description of the invention (6) As shown in the fourth figure, there is a shift screw mechanism 2 3 under the automatic feeding table 20, so the user can rotate the shift dial 2 4 Drive it so that the feeding table 20 can be moved left and right, so that any of the electromagnetic vibration automatic feeding trays 2 1, 2 2 and the feeding channel 2 Π, 2 2 1 are aligned with the straight line of the inspection host 3 0 The feeder 31 achieves the purpose of automatic feeding. At the same time, the electromagnetic vibration type automatic feeding trays 2 1 and 22 can be respectively equipped with capacitors 70 of different specifications and sizes to meet the practical needs. In addition, due to the electromagnetic vibration automatic The feeding trays 2 1 and 2 2 are conventional automatic feeding mechanisms, which are not the features of the present invention, so they will not be described in detail. In summary, the present invention is indeed a highly creative use of the laws of nature and technical thinking, and it can indeed achieve the intended purpose of the invention. It has fully met the requirements of the invention patent, and is worthy of the encouragement and affirmation of the Bureau. patent application.

第10頁Page 10

Claims

4 6 61 4 0 六、申請專利範圍 1 _ 由一氣壓泵器、數測量所組成，其落料站之強電磁振動式驗主機之直料盤、一主構、一絕緣 f备汜平 —種塑膠膜電容器、一自動送料台、儀表、一充放電電中，氣壓泵可配合迫落料用途；自動自_送料盤，俾將線送料is處，另* 成品檢驗分選4 6 61 4 0 6. Scope of patent application 1 _ Consists of a pneumatic pump and a number of measurements, a straight material tray, a main structure, and an insulation device for the strong electromagnetic vibration testing host of the blanking station— A plastic film capacitor, an automatic feeding table, an instrument, and a charge and discharge battery. The pneumatic pump can be used for forced blanking; the automatic self-feeding tray, the feed line is at the place, and the final product inspection and sorting.

主要係' 機 —- I | J r 成，當電後，程序而其故可爪位一進且該等容器經將受到，進而特徵在該檢驗位於原於直線料爪位兩接腳器之位置時，將當任加以動，緣具一進料夾取完故可位有無數測試盤阻抗測構件之由直線一連串完成自於：主機中位進行送料器於整腳處進行針對電爪位於成進料於原位之夾具、一夾具盤試點及一高運動均係由送料器依序預先設定之動分級、歸之四爪九十度位置時機構位導正動容器之夾具盤程序，進行較，俾穩一檢源供數氣送料欲測檢驗、-一低頻馬達進入各項類及進料之間，將置時作；驗主應器壓缸台上試之主機整腳容量傳動四爪功能統計盤受馬斷式旋進行自，將由當任一容量及損耗之一側時，而該夾具盤小行程之間固夾持電容及一馬達做為則具電容則係機構才貝耗機構進料檢測等檢檢驗有一器依包括測試所驅盤及及不驗分央處傳動主機個以序送有四預測機構動；爽具良品選作達傳動轉動作動夾料該整腳進料爪做預先則將由受馬達斷式旋器之兩機構之牵，當任一之動作；機構針對位於預測之檢測作夾具盤之傳動機構轉動作，接腳，而理機構若干上之入檢爪進機所組是，盤排除業，動，進料當任電容機構業；炎具之牽其周可於Mainly the machine-I | J r is completed. When the electricity is turned on, the program can enter the claw position and the containers will be subjected to it, which is characterized in that the inspection is located in the two pins of the original straight claw position. When it is in position, it will be moved at any time, so it can be placed in a series of straight lines with countless test disc impedance measurement components after it is taken out by a feeding clamp. From the mainframe, the feeder is positioned at the whole foot for the electric claw. The fixtures that are fed into the original position, a fixture disk pilot, and a high movement are all set in advance by the feeder in accordance with the motion classification in advance, and the fixture disk program of the positive position of the mechanism when the four-claw ninety degree position is returned. Make comparisons, stabilize a source of supply, check the number of gas feeds to be tested,-a low-frequency motor enters between the various types and feeds, and will be set aside; check the capacity of the main foot of the main reactor to test on the cylinder drive The four-claw function statistics disk is automatically rotated by a horse-broken rotation. When any one of the capacity and loss is on one side, the capacitor and a motor are fixed between the small strokes of the clamp disk. As a capacitor, it is the mechanism of the material consumption mechanism of the institution. It has a device that includes the drive test of the test center and the non-inspection center. The main drive unit sends four predictive mechanisms in sequence. The driving action of the drive mechanism is to clamp the full-foot feeding claw in advance. It will be held by the two mechanisms of the motor-spinning screwdriver. When either action is performed; Some of the advanced inspection and claw-entering machines in the management organization are: the disk removal industry, the moving industry, and the material supply industry as the capacitor organization industry.

第11頁 4 66)40 試站測試迫落品檢驗試站中 4. 品檢驗量儀表統計值六、申請專利範圍該夾具盤上高低頻容量強度測試或 2.如申品檢驗分選一心轴上，馬達傳動機伸縮運動行設有無數呈主測試盤向夾具盤之對每一測達某一試或強與夾具盤分之旋動一預者。 3.如申分選，對如申分選，俾加以同時進行一損耗測試、其它特殊用請專利範圍機，其檢驗且主測試盤構之凸輪頂程，另，其對應之電緣前位移而與應電路連通之作用均已站後，位於料等作業，離而暫時切定行程，並請專利範圍機，其充放受測電容器請專利範圍機，其檢驗對每顯示的耐壓測試測試，交流專業級檢測項所述之一中之主徑略小用，而相對於以連通盤接觸自形成先設定上之電試完成試用電前述主、絕緣阻抗耐壓測試、項目者。種塑膠膜電盤與夾具盤具盤，其後於原位做前盤爽具之位用電路，因該各電源接立測試站，，當夾具盤便被施以預主測試盤將同時》爽具盤伸出之檢電容當某系列老化途之第1 主機之直推作周緣接點夾具而各被預夾具待測斷測重覆測試於夾可_位夾具測試後，一獨，是容器後，路，測試第1項所述之一種塑膠膜電容器成電電源供應器之作用乃係在若干測進行反覆充放電之步驟者。第1項所述之一種塑膠膜電容器成主機中之絕緣阻抗測試點配合有測器遂行該項測試，並將測試結果及一電容器被測出之絕緣阻抗值不符測試、電介質容器成位於同端面受、後之置上，此，當點便與復因該夾具到期之測内縮並盤將隨測步驟Page 11 4 66) 40 Trial station test Forced product inspection test station 4. Statistical value of product inspection instrumentation 6. Scope of patent application High and low frequency capacity strength test on the fixture plate or 2. Mandatory if sorting application On the telescopic motion line of the motor drive, there are countless main test disks to the fixture disk. Each test reaches a certain test or strongly rotates with the fixture disk. 3. If applying for sorting, perform a loss test at the same time as for applying for sorting. For other special applications, please use a patented range machine. Its inspection and main test cam cam stroke, and its corresponding front edge displacement. And the function of communicating with the responding circuit has already stood, and is located in the operation of the material, etc., and temporarily determines the stroke, and please patent the range machine, and charge and discharge the capacitor under test, please use the patent range machine. Its inspection is for each withstand voltage test. For testing, the main diameter of one of the items mentioned in the AC professional-level test item is slightly less, but compared to the electrical test set by the connection plate contact self-formation first setting to complete the trial of the aforementioned main, insulation resistance and withstand voltage test, the project owner. This kind of plastic film electric disk and fixture plate is used as the circuit of the front plate. Since the power supply is connected to the test station, the pre-main test plate will be applied when the fixture plate is installed. The detection capacitance extended by the tray is when the first host of a certain series of aging is pushed directly as a peripheral contact fixture, and each of them is tested by the pre-fixture. Repeated testing is performed after the clamp-bit fixture test. After the container, the function of testing a plastic film capacitor into an electric power supply as described in item 1 is based on several steps of repeated charging and discharging. The insulation resistance test point in the host of a plastic film capacitor as described in item 1 is performed with a tester, and the test result and the insulation resistance value measured by a capacitor do not match the test. The dielectric container is located on the same end surface. The receiver and the receiver are placed on top. Therefore, when the point is reconciled with the due date of the fixture, the contraction disk will follow the test steps.

第12頁 4 6 614 0 六、申請專利範圍合預定之設定值時，將在絕緣阻抗不良品落料站被強迫落' 料，並進入不良品收集箱集申者。 5. 如申請專利範圍第1 項所述之一種塑膠膜電容器成品檢驗分選機，其檢驗主機中之高低頻容量損耗測試機構配合測量儀表而被固定於主測試盤之高頻損耗測試站處，俾對每一電容器遂行該項測試，並將測試結果及統計值加以顯示，而當某一電容器被測出高頻損耗率高於設定值時，亦將被強迫落料於分級落料站之一特定收集箱中。 6. 如申請專利範圍第1項所述之一種塑膠膜電容器成品檢驗分選機，當一電容器完成各項檢測後，將藉由中央處理器依判讀測試結果，並於分級落料站分別被強迫落料丨至對應之一特定收集箱中並直接完成分類作業，而各特定收集箱之排列順序及位置，係供做分級與區隔檢測後電容器之用，故隨時可依使用需求而設定其分別所收集之檢測後電容器等級者。 7. 如申請專利範圍第1項所述之一種塑膠膜電容器成品檢驗分選機，當某一電容器在測試過程中因電力中斷或其它因素而有漏失某一檢測項目時，該電容器將在分級落料站處，被強迫落料於重測收集箱中，俾供再次重測者。 8. 如申請專利範圍第1項所述之一種塑膠膜電容器成品檢驗分選機，其自動送料台下方具有一移位螺桿機構，故可藉旋動移位轉盤將之驅動，俾令送料台可被左、右橫（移，使任一電磁振動式自動送料盤之送料槽道對準檢驗主機之直線送料器，達成自動送料之作用者。Page 12 4 6 614 0 6. Scope of patent application When the predetermined set value is met, the material will be forced to be dropped at the blanking station with defective insulation resistance, and the applicant will be collected in the defective box. 5. A plastic film capacitor finished product inspection and sorting machine as described in item 1 of the scope of patent application. The high and low frequency capacity loss testing mechanism of the inspection host is fixed at the high frequency loss test station of the main test panel in cooperation with the measuring instrument.俾 Perform this test for each capacitor, and display the test results and statistical values. When a capacitor's measured high-frequency loss rate is higher than the set value, it will also be forced to blank at the graded blanking station. One of the specific collection boxes. 6. As for a plastic film capacitor finished product inspection and sorting machine as described in item 1 of the scope of patent application, after a capacitor has completed various tests, the test results will be read by the central processor according to the judgment, and will be separately classified at the blanking station. Force the blanking to a corresponding specific collection box and directly complete the classification operation. The arrangement order and position of each specific collection box are used for capacitors after classification and separation detection, so it can be set at any time according to the use requirements They are collected after the detection of the capacitor level. 7. As for a plastic film capacitor finished product inspection and sorting machine described in item 1 of the scope of patent application, when a capacitor misses a test item due to power interruption or other factors during the test, the capacitor will be classified At the blanking station, they are forced to blank in the retest collection box for the retester. 8. A plastic film capacitor finished product inspection and sorting machine as described in item 1 of the scope of the patent application, which has a shift screw mechanism under the automatic feeding table, so it can be driven by rotating the rotating turntable to order the feeding table. It can be shifted left and right to align the feeding channel of any electromagnetic vibration automatic feeding tray with the linear feeder of the inspection host to achieve the function of automatic feeding.

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