TW373076B - IC test handler - Google Patents

IC test handler

Info

Publication number
TW373076B
TW373076B TW087111247A TW87111247A TW373076B TW 373076 B TW373076 B TW 373076B TW 087111247 A TW087111247 A TW 087111247A TW 87111247 A TW87111247 A TW 87111247A TW 373076 B TW373076 B TW 373076B
Authority
TW
Taiwan
Prior art keywords
test handler
post contents
contents
detail information
post
Prior art date
Application number
TW087111247A
Other languages
Chinese (zh)
Inventor
Hiroki Ikeda
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP20384497A external-priority patent/JPH1138084A/en
Priority claimed from JP9203843A external-priority patent/JPH1138083A/en
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of TW373076B publication Critical patent/TW373076B/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/025—General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/40—Arrangements for displaying electric variables or waveforms using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/32—Monitoring with visual or acoustical indication of the functioning of the machine
    • G06F11/324—Display of status information
    • G06F11/327—Alarm or error message display
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56016—Apparatus features
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5604—Display of error information

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Human Computer Interaction (AREA)
  • Theoretical Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Quality & Reliability (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Control Of Conveyors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

Disclosed is an IC test handler allowing a screen display of various post contents. Stored as a help file is detail information, e.g., on post contents of an operation screen indicative of an operation procedure of the IC test handler or on post contents of an alarm generated upon the occurrence of an abnormality. In case of displaying these post contents, the help file is executed to make a display of detail information on the post contents.
TW087111247A 1997-07-14 1998-07-10 IC test handler TW373076B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP20384497A JPH1138084A (en) 1997-07-14 1997-07-14 Ic test handler
JP9203843A JPH1138083A (en) 1997-07-14 1997-07-14 Ic test handler

Publications (1)

Publication Number Publication Date
TW373076B true TW373076B (en) 1999-11-01

Family

ID=26514140

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087111247A TW373076B (en) 1997-07-14 1998-07-10 IC test handler

Country Status (4)

Country Link
KR (1) KR19990013599A (en)
DE (1) DE19831573A1 (en)
SG (1) SG78307A1 (en)
TW (1) TW373076B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI696234B (en) * 2017-02-28 2020-06-11 日商精工愛普生股份有限公司 Electronic parts conveying device and electronic parts inspection device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100825774B1 (en) 2006-03-22 2008-04-29 삼성전자주식회사 Handler for testing a semiconductor device having a single door type stocker

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI696234B (en) * 2017-02-28 2020-06-11 日商精工愛普生股份有限公司 Electronic parts conveying device and electronic parts inspection device

Also Published As

Publication number Publication date
SG78307A1 (en) 2001-02-20
KR19990013599A (en) 1999-02-25
DE19831573A1 (en) 1999-01-21

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