TW362214B - Generation method of memory test and the circuit thereof - Google Patents

Generation method of memory test and the circuit thereof

Info

Publication number
TW362214B
TW362214B TW087106813A TW87106813A TW362214B TW 362214 B TW362214 B TW 362214B TW 087106813 A TW087106813 A TW 087106813A TW 87106813 A TW87106813 A TW 87106813A TW 362214 B TW362214 B TW 362214B
Authority
TW
Taiwan
Prior art keywords
circuit
test
generation method
memory test
test data
Prior art date
Application number
TW087106813A
Other languages
Chinese (zh)
Inventor
Wen-Yang Lin
Original Assignee
Chroma Ate Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chroma Ate Inc filed Critical Chroma Ate Inc
Priority to TW087106813A priority Critical patent/TW362214B/en
Application granted granted Critical
Publication of TW362214B publication Critical patent/TW362214B/en

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Abstract

A kind of test data generation method and the circuit thereof for memory test which the central control unit provides an original image test data to be written into a plurality of connected test image handling units and the central control unit control those test image handling units and write those original image test data into the memory to be tested.
TW087106813A 1998-05-02 1998-05-02 Generation method of memory test and the circuit thereof TW362214B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW087106813A TW362214B (en) 1998-05-02 1998-05-02 Generation method of memory test and the circuit thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW087106813A TW362214B (en) 1998-05-02 1998-05-02 Generation method of memory test and the circuit thereof

Publications (1)

Publication Number Publication Date
TW362214B true TW362214B (en) 1999-06-21

Family

ID=57940790

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087106813A TW362214B (en) 1998-05-02 1998-05-02 Generation method of memory test and the circuit thereof

Country Status (1)

Country Link
TW (1) TW362214B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI394168B (en) * 2008-10-31 2013-04-21 Moai Electronics Corp Memory test method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI394168B (en) * 2008-10-31 2013-04-21 Moai Electronics Corp Memory test method

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