TW291535B - Separate testing board for semiconducting component - Google Patents
Separate testing board for semiconducting componentInfo
- Publication number
- TW291535B TW291535B TW85107207A TW85107207A TW291535B TW 291535 B TW291535 B TW 291535B TW 85107207 A TW85107207 A TW 85107207A TW 85107207 A TW85107207 A TW 85107207A TW 291535 B TW291535 B TW 291535B
- Authority
- TW
- Taiwan
- Prior art keywords
- board
- jumper
- plug
- pins
- separate testing
- Prior art date
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
A separate testing board for semiconducting component includes an IC plug-in board and a jumper board. The IC plug-in board has a IC plug set and plural number of bus connectors. The jumper board also has plural number of bus connectors and equivalent number of jumper units. Each jumper unit has three pins in which one pin is connected to the positive voltage, the other to the negative voltage, and another one to jumper end. The jumper end can be selectively connected to positive or negative voltage to change the level of the connector pins. The IC plug-in board and the jumper board are connected by the bus wires so that the level of the pins of the IC plug-in board and the IC pins can be adequately biased by changing the jumper setting in the jumper board.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW85107207A TW291535B (en) | 1996-06-15 | 1996-06-15 | Separate testing board for semiconducting component |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW85107207A TW291535B (en) | 1996-06-15 | 1996-06-15 | Separate testing board for semiconducting component |
Publications (1)
Publication Number | Publication Date |
---|---|
TW291535B true TW291535B (en) | 1996-11-21 |
Family
ID=51398314
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW85107207A TW291535B (en) | 1996-06-15 | 1996-06-15 | Separate testing board for semiconducting component |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW291535B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110501633A (en) * | 2019-08-29 | 2019-11-26 | 上海华力集成电路制造有限公司 | Package level apparatus for testing chip and method |
-
1996
- 1996-06-15 TW TW85107207A patent/TW291535B/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110501633A (en) * | 2019-08-29 | 2019-11-26 | 上海华力集成电路制造有限公司 | Package level apparatus for testing chip and method |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK4A | Expiration of patent term of an invention patent |