TW265407B - - Google Patents
Info
- Publication number
- TW265407B TW265407B TW81105439A TW81105439A TW265407B TW 265407 B TW265407 B TW 265407B TW 81105439 A TW81105439 A TW 81105439A TW 81105439 A TW81105439 A TW 81105439A TW 265407 B TW265407 B TW 265407B
- Authority
- TW
- Taiwan
Links
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/701,800 US5259881A (en) | 1991-05-17 | 1991-05-17 | Wafer processing cluster tool batch preheating and degassing apparatus |
US07/869,241 US5350899A (en) | 1992-04-15 | 1992-04-15 | Semiconductor wafer temperature determination by optical measurement of wafer expansion in processing apparatus chamber |
US07/869,465 US5352248A (en) | 1991-05-17 | 1992-04-15 | Pyrometer temperature measurement of plural wafers stacked on a processing chamber |
Publications (1)
Publication Number | Publication Date |
---|---|
TW265407B true TW265407B (en) | 1995-12-11 |
Family
ID=51626728
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW81105439A TW265407B (en) | 1991-05-17 | 1992-07-09 |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW265407B (en) |
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1992
- 1992-07-09 TW TW81105439A patent/TW265407B/zh active