TW232051B - Measuring device of heating power of circuit module - Google Patents

Measuring device of heating power of circuit module

Info

Publication number
TW232051B
TW232051B TW82107470A TW82107470A TW232051B TW 232051 B TW232051 B TW 232051B TW 82107470 A TW82107470 A TW 82107470A TW 82107470 A TW82107470 A TW 82107470A TW 232051 B TW232051 B TW 232051B
Authority
TW
Taiwan
Prior art keywords
enclosed chamber
heat
component
measuring
heat conduction
Prior art date
Application number
TW82107470A
Other languages
Chinese (zh)
Inventor
Jian-Dih Jeng
Original Assignee
Ind Tech Res Inst
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ind Tech Res Inst filed Critical Ind Tech Res Inst
Priority to TW82107470A priority Critical patent/TW232051B/en
Application granted granted Critical
Publication of TW232051B publication Critical patent/TW232051B/en

Links

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  • Measuring Temperature Or Quantity Of Heat (AREA)

Abstract

A heat power measuring device installed on the component of circuit board,which the radiation surface departs from the circuit board, includes: - a tubular body that can be placed on circuit component to orient thexis of the body approximately vertical to the plane of circuit board inttempt to build a heat conduction path to let most of the power of theomponent surface flow through this body; - a highly heat-conductive first separation board where is located in theody but some distance away from the radiation surface of the componenterving as the top of the first enclosed chamber and the bottom of theecond enclosed chamber; - a highly heat-conductive second separation board where is located inhe body serving as the top of the second enclosed chamber. - a heat conduction device where is located in the first enclosed chamberor providing better heat conduction path between the component and theirst separation board; - a heat conduction substance that is stuffed in the above-mentionedecond enclosed chamber to generate temperature difference between theirst and the second separation board when heat is passing through; - a device, which measures the temperature difference of theeat-conductive substance passing through the second enclosed chamber,onsisting of the first temperature sensing component for measuring theemperature of the first separation board and the second temperatureensing component for measuring the temperature of the second separationoard; Therefore, the temperature difference measured according to the heatresistance in the second enclosed chamber and temperature measuring devicecan be used to calculate the heat power arising from the circuit componentsurface.
TW82107470A 1993-09-09 1993-09-09 Measuring device of heating power of circuit module TW232051B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW82107470A TW232051B (en) 1993-09-09 1993-09-09 Measuring device of heating power of circuit module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW82107470A TW232051B (en) 1993-09-09 1993-09-09 Measuring device of heating power of circuit module

Publications (1)

Publication Number Publication Date
TW232051B true TW232051B (en) 1994-10-11

Family

ID=51348666

Family Applications (1)

Application Number Title Priority Date Filing Date
TW82107470A TW232051B (en) 1993-09-09 1993-09-09 Measuring device of heating power of circuit module

Country Status (1)

Country Link
TW (1) TW232051B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8107493B2 (en) 2005-06-09 2012-01-31 Samsung Electronics Co., Ltd. Method and apparatus for transmitting and receiving legacy format data in high throughput wireless network
CN104914299A (en) * 2015-07-15 2015-09-16 福州大学 Comparison heat measuring device for measuring loss of magnetic element and measurement method thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8107493B2 (en) 2005-06-09 2012-01-31 Samsung Electronics Co., Ltd. Method and apparatus for transmitting and receiving legacy format data in high throughput wireless network
US8660140B2 (en) 2005-06-09 2014-02-25 Samsung Electronics Co., Ltd. Method and apparatus for transmitting and receiving legacy format data in high throughput wireless network
CN104914299A (en) * 2015-07-15 2015-09-16 福州大学 Comparison heat measuring device for measuring loss of magnetic element and measurement method thereof

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees