TW216472B - - Google Patents
Info
- Publication number
- TW216472B TW216472B TW081109018A TW81109018A TW216472B TW 216472 B TW216472 B TW 216472B TW 081109018 A TW081109018 A TW 081109018A TW 81109018 A TW81109018 A TW 81109018A TW 216472 B TW216472 B TW 216472B
- Authority
- TW
- Taiwan
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Thin Film Transistor (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP91203342 | 1991-12-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW216472B true TW216472B (zh) | 1993-11-21 |
Family
ID=8208081
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW081109018A TW216472B (zh) | 1991-12-18 | 1992-11-11 |
Country Status (6)
Country | Link |
---|---|
US (1) | US5598101A (zh) |
EP (1) | EP0547693B1 (zh) |
JP (1) | JP3263455B2 (zh) |
KR (1) | KR100260805B1 (zh) |
DE (1) | DE69222010T2 (zh) |
TW (1) | TW216472B (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6693431B1 (en) | 1998-08-28 | 2004-02-17 | Koninklijke Philips Electronics N.V. | Battery system and method of determining battery condition |
US6297661B1 (en) | 1999-04-19 | 2001-10-02 | Ford Global Technologies, Inc. | Semiconductor switch fault detection |
US20030067378A1 (en) * | 2001-10-04 | 2003-04-10 | Baarman David W. | End-of-life indicator |
JP5488480B2 (ja) * | 2011-01-19 | 2014-05-14 | 日本電気株式会社 | スイッチング素子の劣化診断回路及びその動作方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3272003A (en) * | 1964-01-27 | 1966-09-13 | Boeing Co | Fatigue life gaging methods |
US3289075A (en) * | 1964-04-24 | 1966-11-29 | Martin V Jones | Apparatus including parallel connected fuse and lamp means for testing motor insulation |
US3657602A (en) * | 1971-04-05 | 1972-04-18 | Inductotherm Corp | Method and means for detecting incipient capacitor failure |
CH532257A (de) * | 1971-06-15 | 1972-12-31 | Bbc Brown Boveri & Cie | Verfahren zur Spannungsprüfung von Isolationsteilen von Hochspannungs-Apparaten und elektrischen Maschinen und Mittel zur Durchführung des Verfahrens |
US3828606A (en) * | 1972-12-06 | 1974-08-13 | Boeing Co | Method for determining thermal fatigue of electronic components |
DE2534668A1 (de) * | 1975-08-02 | 1977-02-17 | Rosenthal Technik Ag | Verwendung von thermographischen farben auf keramik zur temperaturbestimmung in oefen und auf bauelementen |
US4142151A (en) * | 1977-07-25 | 1979-02-27 | General Electric Company | Failed diode indicator |
NL192801C (nl) * | 1986-09-10 | 1998-02-03 | Philips Electronics Nv | Werkwijze voor het testen van een drager met meerdere digitaal-werkende geïntegreerde schakelingen, geïntegreerde schakeling geschikt voor het aanbrengen op een aldus te testen drager, en drager voorzien van meerdere van zulke geïntegreerde schakelingen. |
EP0281553A1 (en) * | 1986-09-17 | 1988-09-14 | THE GENERAL ELECTRIC COMPANY, p.l.c. | Method of manufacturing integrated circuits |
US4799019A (en) * | 1987-03-02 | 1989-01-17 | Charles Cooley | Electrical continuity load monitoring circuit |
NL8801362A (nl) * | 1988-05-27 | 1989-12-18 | Philips Nv | Elektronische module bevattende een eerste substraatelement met een funktioneel deel, alsmede een tweede substraatelement voor het testen van een interkonnektiefunktie, voet bevattende zo een tweede substraatelement, substraatelement te gebruiken als zo een tweede substraatelement en elektronisch apparaat bevattende een plaat met gedrukte bedrading en ten minste twee zulke elektronische modules. |
US5130689A (en) * | 1989-05-09 | 1992-07-14 | Leach & Garner Co. | Intermetallic time-temperature integration fuse |
US5250905A (en) * | 1991-09-24 | 1993-10-05 | Duracell Inc. | Battery with electrochemical tester |
US5243298A (en) * | 1991-11-04 | 1993-09-07 | Teledyne Ryan Aeronautical, Division Of Teledyne Industries, Inc. | Corrosion monitor by creating a galvanic circuit between an anode wire and a test structure |
US5514974A (en) * | 1994-10-12 | 1996-05-07 | International Business Machines Corporation | Test device and method for signalling metal failure of semiconductor wafer |
-
1992
- 1992-11-11 TW TW081109018A patent/TW216472B/zh active
- 1992-12-03 KR KR1019920023168A patent/KR100260805B1/ko not_active IP Right Cessation
- 1992-12-10 EP EP92203864A patent/EP0547693B1/en not_active Expired - Lifetime
- 1992-12-10 DE DE69222010T patent/DE69222010T2/de not_active Expired - Fee Related
- 1992-12-15 JP JP33422692A patent/JP3263455B2/ja not_active Expired - Fee Related
-
1995
- 1995-04-12 US US08/422,014 patent/US5598101A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0547693A3 (en) | 1993-11-18 |
US5598101A (en) | 1997-01-28 |
KR930014233A (ko) | 1993-07-22 |
EP0547693B1 (en) | 1997-09-03 |
DE69222010D1 (de) | 1997-10-09 |
KR100260805B1 (ko) | 2000-07-01 |
EP0547693A2 (en) | 1993-06-23 |
JPH05264658A (ja) | 1993-10-12 |
JP3263455B2 (ja) | 2002-03-04 |
DE69222010T2 (de) | 1998-03-26 |