TW202346872A - Processing apparatus of shifting unit, and handler - Google Patents
Processing apparatus of shifting unit, and handler Download PDFInfo
- Publication number
- TW202346872A TW202346872A TW111119171A TW111119171A TW202346872A TW 202346872 A TW202346872 A TW 202346872A TW 111119171 A TW111119171 A TW 111119171A TW 111119171 A TW111119171 A TW 111119171A TW 202346872 A TW202346872 A TW 202346872A
- Authority
- TW
- Taiwan
- Prior art keywords
- tool
- pulling
- intermediary
- component
- positioning
- Prior art date
Links
- 230000008878 coupling Effects 0.000 claims description 10
- 238000010168 coupling process Methods 0.000 claims description 10
- 238000005859 coupling reaction Methods 0.000 claims description 10
- 238000006073 displacement reaction Methods 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 4
- 230000037431 insertion Effects 0.000 claims 1
- 238000003780 insertion Methods 0.000 claims 1
- 239000008207 working material Substances 0.000 claims 1
- 238000000034 method Methods 0.000 abstract 1
- 238000012360 testing method Methods 0.000 description 64
- 239000000758 substrate Substances 0.000 description 13
- 239000000523 sample Substances 0.000 description 12
- 238000002788 crimping Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 2
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000032258 transport Effects 0.000 description 1
Landscapes
- Manufacturing Of Magnetic Record Carriers (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Radiation-Therapy Devices (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
Abstract
Description
本發明提供一種可微調而精準配置作業器的調位單元。The present invention provides a positioning unit that can finely adjust and accurately configure a working device.
在現今，作業裝置於機台裝配測試器，以對電子元件執行測試作業；測試器包含電路板及測試座，測試座之內部供承置一具接腳之電子元件，並設有複數支探針，探針之一端穿伸出測試座之底面，以電性連接電路板，另一端供電性接觸電子元件之接腳而執行測試作業；因此，測試座僅以複數支探針連結電路板，使得測試座可作適當位移。Nowadays, the operating device assembles a tester on the machine to perform testing operations on electronic components. The tester includes a circuit board and a test socket. The inside of the test socket is used to hold an electronic component with pins and is equipped with a plurality of probes. One end of the probe extends out of the bottom surface of the test socket to electrically connect to the circuit board, and the other end contacts the pins of the electronic component for power supply to perform testing operations; therefore, the test socket only uses a plurality of probes to connect to the circuit board. This allows the test seat to move appropriately.
然，電子元件日趨微小精密，其接腳與測試座之探針的對位精準性相當重要，如稍有微小偏差，即會影響電性測試之品質；但作業裝置易發生測試座配置偏差或測試座因冷測/熱測作業的測試溫度影響而偏位，以致測試座內之複數支探針與電子元件之接腳具有微小偏差，而無法使測試座與電子元件作有效性電性接觸之測試作業，以致無法提高測試良率。However, as electronic components become increasingly smaller and more precise, the alignment accuracy of their pins and the probes of the test socket is very important. If there is a slight deviation, it will affect the quality of the electrical test; however, the operating equipment is prone to test socket configuration deviation or The test socket is deflected due to the influence of the test temperature during cold/hot test operations, resulting in slight deviations between the plurality of probes in the test socket and the pins of the electronic components, making it impossible to make effective electrical contact between the test socket and the electronic components. test operations, making it impossible to improve the test yield.
本發明之目的一，提供一種具調位單元之作業裝置，其於裝載具與作業器間設置調位單元，調位單元包含中介具、第一牽動結構及定位結構，中介具配置於裝載具與作業器之間，第一牽動結構於中介具沿第一方向設有第一牽動部件，並於作業器之承置件設有可與第一牽動部件相互配合之第二牽動部件，定位結構於中介具與裝載具間設有相互配合之第一定位部件及第二定位部件，於裝載具以定位結構組裝中介具時，中介具利用第一牽動結構牽動承置件於作業器上作第一方向位移而微調位置，進而提高承置件之配置精準性。One object of the present invention is to provide a working device with a positioning unit, which is provided between a loading device and a work machine. The positioning unit includes an intermediary tool, a first pulling structure and a positioning structure. The intermediary tool is arranged on the loading tool. Between the first pulling structure and the operator, a first pulling component is provided along the first direction in the intermediary tool, and a second pulling component that can cooperate with the first pulling component is provided on the supporting member of the operator. The positioning structure There are first positioning parts and second positioning parts that cooperate with each other between the intermediary tool and the loading tool. When the loading tool assembles the intermediary tool with the positioning structure, the intermediary tool uses the first pulling structure to pull the supporting member to perform the third operation on the work machine. Displace in one direction to fine-tune the position, thereby improving the placement accuracy of the supporting components.
本發明之目的二，提供一種具調位單元之作業裝置，其調位單元更包含第二牽動結構，第二牽動結構於中介具設有呈第一方向配置之導槽，並於裝載具裝配一具偏心桿之轉動具，轉動具之偏心桿插置於導槽，於轉動具沿軸線轉動時，利用偏心桿帶動中介具及承置件作第二方向位移而微調位置，進而提高調位使用效能。The second object of the present invention is to provide a working device with a positioning unit. The positioning unit further includes a second pulling structure. The second pulling structure is provided with a guide groove arranged in the first direction on the intermediary tool and is assembled on the loading tool. A rotating tool with an eccentric rod. The eccentric rod of the rotating tool is inserted into the guide groove. When the rotating tool rotates along the axis, the eccentric rod is used to drive the intermediary tool and the supporting member to move in the second direction to fine-tune the position, thereby improving the positioning. Use efficiency.
本發明之目的三，提供一種作業機，包含機台、供料裝置、收料裝置、本發明作業裝置、輸送裝置及中央控制裝置，供料裝置配置於機台，並設有至少一供料器，以供容置至少一待作業電子元件；收料裝置配置於機台，並設有至少一收料器，以供容置至少一已作業電子元件；本發明作業裝置配置於機台，包含裝載具、作業器及調位單元，作業器以供對電子元件執行預設作業，調位單元以供連結裝載具及作業器，並可微調作業器之位置；輸送裝置配置於機台，並設有至少一輸送器，以供輸送電子元件；中央控制裝置以控制及整合各裝置作動而執行自動化作業。The third object of the present invention is to provide a working machine, which includes a machine platform, a feeding device, a collecting device, an operating device of the present invention, a conveying device and a central control device. The feeding device is arranged on the machine platform and is provided with at least one feeding device. Container for accommodating at least one electronic component to be operated; the collecting device is arranged on the machine platform, and is provided with at least one collecting device for accommodating at least one electronic component that has been operated; the operating device of the present invention is arranged on the machine platform, It includes a loader, an operator and a positioning unit. The operator is used to perform preset operations on electronic components. The positioning unit is used to connect the loader and the operator and fine-tune the position of the operator. The conveyor is configured on the machine platform. At least one conveyor is provided for conveying electronic components; the central control device controls and integrates the actions of each device to perform automated operations.
為使 貴審查委員對本發明作更進一步之瞭解，茲舉一較佳實施例並配合圖式，詳述如後：In order to enable the review committee to have a further understanding of the present invention, a preferred embodiment is cited together with the drawings, and the details are as follows:
請參閱圖1至7，本發明作業裝置10包含裝載具、作業器及調位單元。Referring to Figures 1 to 7, the working device 10 of the present invention includes a loader, a working device and a positioning unit.
裝載具為一可供連結作業器之器件，並供移入或移出電子元件，裝載具可為基板或機台等，不受限於本實施例；於本實施例，裝載具為基板11 ，基板11開設有第一通孔111供移入或移出電子元件，並以栓具組裝於機台20之頂面，機台20於相對應基板11之第一通孔111位置開設第二通孔21，第二通孔21供移入或移出電子元件，並供穿置作業器之承置件。 The loading device is a device that can be connected to the operator and used to move electronic components in or out. The loading device can be a substrate or a machine platform, etc., and is not limited to this embodiment; in this embodiment, the loading device is the substrate 11 , the substrate 11 is provided with a first through hole 111 for moving in or out electronic components, and is assembled on the top surface of the machine 20 with bolts. The machine 20 is provided with a second through hole corresponding to the first through hole 111 of the substrate 11 21. The second through hole 21 is used for moving in or out electronic components and for inserting the supporting member of the operating device.
然，裝載具為機台20時，亦可省略配置基板11，作業器之承置件不一定穿置於機台20之第二通孔21，而可位於第二通孔21之下方，亦無不可。However, when the loading device is a machine platform 20, the base plate 11 can also be omitted, and the supporting member of the operator does not necessarily need to pass through the second through hole 21 of the machine platform 20, but can be located below the second through hole 21, or Nothing is impossible.
作業器設有至少一承置件，以供對電子元件執行預設作業；作業器可為測試器、載台、預溫器、校正器或取像器等，以供對電子元件執行測試作業、中心校正作業或取像作業等；承置件可為測試座、承座或具作業件(如CCD)之台座，以供承置及對電子元件執行預設作業，或者僅供承置電子元件，若承置件之位置稍有偏差，即會影響測試良率或電子元件移入精準性或取像準確性等，因此，提高承置件之配置位置精準性相當重要。The operating device is provided with at least one supporting member for performing preset operations on electronic components; the operating device can be a tester, a carrier, a preheater, a calibrator or an image pickup device, etc., for performing testing operations on electronic components. , center calibration operation or imaging operation, etc.; the supporting part can be a test stand, a pedestal or a pedestal with working parts (such as CCD), for holding and performing preset operations on electronic components, or only for holding electronic components For components, if there is a slight deviation in the position of the supporting components, it will affect the test yield or the accuracy of moving the electronic components or the accuracy of imaging. Therefore, it is very important to improve the accuracy of the placement of the supporting components.
於本實施例，作業器為測試器，測試器包含測試座12及電路板，測試座12以供承置及測試電子元件，並具有複數支探針121，探針121之一端電性連接電路板，另一端供電性接觸電子元件(圖未示出)之接腳，測試座12可於電路板上作微小偏移，並置入於機台20之第二通孔21，而位於基板11之第一通孔111下方。In this embodiment, the operating device is a tester. The tester includes a test socket 12 and a circuit board. The test socket 12 is used to hold and test electronic components, and has a plurality of probes 121. One end of the probes 121 is electrically connected to the circuit. The other end of the circuit board has power contact pins of the electronic component (not shown in the figure). The test socket 12 can be slightly offset on the circuit board and placed in the second through hole 21 of the machine 20 and located on the substrate 11 below the first through hole 111.
調位單元包含中介具13、第一牽動結構及定位結構；更包含第二牽動結構。The position adjustment unit includes an intermediary 13, a first pulling structure and a positioning structure; it also includes a second pulling structure.
中介具13配置於裝載具與作業器之間；於本實施例，中介具13為一長型塊體，並置入於機台20之第二通孔21，而配置於基板11與測試器的測試座12之間，中介具13不會干涉電子元件移入或移出基板11之第一通孔111。The intermediary tool 13 is disposed between the loader and the operator; in this embodiment, the intermediary tool 13 is a long block, and is inserted into the second through hole 21 of the machine platform 20, and is disposed between the substrate 11 and the tester. Between the test seats 12 , the intermediary tool 13 will not interfere with the movement of the electronic components into or out of the first through hole 111 of the substrate 11 .
第一牽動結構於中介具13沿第一方向設有第一牽動部件，並於作業器之承置件設有可與第一牽動部件相互配合之第二牽動部件，於裝載具組裝中介具13時，利用中介具13及第一牽動結構能夠牽動承置件於作業器上作第一方向微調位移；更進一步，第一牽動結構之第一牽動部件及第二牽動部件可為相互配合之栓具及螺孔，或者為相互配合之銷具及銷孔。The first pulling structure is provided with a first pulling part along the first direction on the intermediary tool 13, and is provided with a second pulling part that can cooperate with the first pulling part on the supporting part of the operating tool. The intermediary tool 13 is assembled on the loading device. At this time, the intermediary 13 and the first pulling structure can be used to pull the supporting member to finely adjust the displacement in the first direction on the work machine; further, the first pulling component and the second pulling component of the first pulling structure can be bolts that cooperate with each other. tools and screw holes, or matching pin tools and pin holes.
若第一牽動結構之第一牽動部件及第二牽動部件為相互配合之栓具及螺孔，依作業需求，可於裝載具開設穿孔，以供穿置栓具，或者於中介具13開設階級孔，以供穿置栓具，亦無不可。If the first pulling part and the second pulling part of the first pulling structure are bolts and screw holes that match each other, according to the operation requirements, holes can be opened in the loading tool for inserting bolts, or levels can be set up in the intermediary tool 13 There are also holes for inserting bolts.
若第一牽動結構之第一牽動部件及第二牽動部件為相互配合之銷具及銷孔，依作業需求，更包含於中介具13與承置件間設有相互配合之第一結合部件及第二結合部件，以供中介具13連結組裝承置件；更進一步，第一結合部件及第二結合部件可為相互配合之栓具及螺孔。If the first pulling part and the second pulling part of the first pulling structure are mutually matching pins and pin holes, depending on the operation requirements, a first coupling part that cooperates with each other is further included between the intermediary tool 13 and the receiving member. The second coupling component is used for the intermediary tool 13 to connect and assemble the supporting member; further, the first coupling component and the second coupling component can be bolts and screw holes that cooperate with each other.
於本實施例，第一牽動結構於中介具13之底面設有複數列沿第一方向(如X方向)於預設位置設有一為銷具131之第一牽動部件，每一列之銷具131由中介具13之底面一體成型呈Z方向朝下延伸凸設；第一牽動結構於測試座12 設有複數列可為銷孔122之第二牽動部件，以供插置銷具131。 In this embodiment, the first pulling structure is provided with a plurality of rows on the bottom surface of the intermediary 13. A first pulling component is a pin 131 at a preset position along the first direction (such as the X direction). The pins 131 in each row are The bottom surface of the intermediary tool 13 is integrally formed and extends downward in the Z direction; the first pulling structure is on the test seat 12 A plurality of rows of second pulling components that can be pin holes 122 are provided for inserting the pins 131 .
又第一牽動結構於中介具13設有複數列為第一栓具之第一結合部件，於本實施例，於基板11與中介具13開設有相對應且呈Z方向配置之第一穿孔112及第二穿孔132，以供穿置第一栓具133，第一栓具133之螺桿穿伸出中介具13之第二穿孔132，且螺桿之自由端凸伸出中介具13之底面，第一栓具133較大直徑之螺栓頭則位於基板11之第一穿孔112，且可頂抵於中介具13之頂面，另於測試座12相對應中介具13之第一栓具133的位置設有一為第一螺孔123之第二結合部件，以供螺合第一栓具133。In addition, the first pulling structure is provided with a plurality of first connecting parts of the first bolts in the intermediary tool 13. In this embodiment, corresponding first through holes 112 arranged in the Z direction are opened in the base plate 11 and the intermediary tool 13. and a second hole 132 for inserting the first bolt 133. The screw rod of the first bolt 133 passes through the second hole 132 of the intermediary tool 13, and the free end of the screw protrudes from the bottom surface of the intermediary tool 13. The larger-diameter bolt head of a bolt 133 is located in the first through hole 112 of the base plate 11 and can bear against the top surface of the intermediary tool 13. In addition, the test seat 12 corresponds to the position of the first bolt 133 of the intermediary tool 13. A second coupling component is provided as a first screw hole 123 for screwing the first bolt 133 .
依作業需求，每一個中介具13之第一牽動部件可位於不同預設位置，例如每一個中介具13之第一牽動部件的預設位置相差1mm，以於更換不同中介具13時，而可牽動微調承置件至不同配置位置；又依作業需求，可於一中介具13沿第一方向之複數個位置分別開設孔洞，以供插置一為銷具之第一牽動部件，令第一牽動部件可插置於不同位置之孔洞，以供牽動微調承置件至不同配置位置，亦無不可。同理，若改變第二牽動部件的位置，亦可供牽動微調承置件之配置位置。According to the operation requirements, the first pulling component of each intermediary tool 13 can be located at different preset positions. For example, the preset positions of the first pulling components of each intermediary tool 13 differ by 1 mm, so that when different intermediary tools 13 are replaced, the first pulling component can be positioned at different preset positions. The micro-adjusting support member is moved to different configuration positions; and according to the operation requirements, holes can be respectively opened in a plurality of positions along the first direction of an intermediary tool 13 for inserting a first pulling component that is a pin, so that the first The pulling component can be inserted into the holes at different positions to fine-tune the supporting member to different configuration positions. In the same way, if the position of the second pulling component is changed, the arrangement position of the supporting member can also be finely adjusted.
依作業需求，第一牽動結構於中介具13設有階級孔，以供容置一為第一栓具133之第一結合部件的螺栓頭，亦無不可。According to the operation requirements, it is also possible that the first pulling structure is provided with a stepped hole in the intermediary tool 13 to accommodate a bolt head that is the first connecting component of the first bolt tool 133 .
定位結構於中介具13與裝載具間設有相互配合之第一定位部件及第二定位部件，以供於中介具13組裝裝載具時，利用中介具13及第一牽動結構能夠牽動承置件於作業器上作第一方向微調位移。更進一步，定位結構於裝載具開設呈第二方向配置之長槽孔，以供穿置第一定位部件，並於中介具13設有可供組裝第一定位部件之第二定位部件；於本實施例，定位結構於基板11開設有呈第二方向(如Y方向)配置之長槽孔113，長槽孔113為階級孔，以供穿置一為第二栓具114之第一定位部件，定位結構另於中介具13設有一為第二螺孔134之第二定位部件，第二螺孔134可供螺合第二栓具114。The positioning structure is provided with first positioning parts and second positioning parts that cooperate with each other between the intermediary tool 13 and the loading device, so that when the intermediary tool 13 is assembling the loading device, the intermediary tool 13 and the first pulling structure can be used to move the supporting parts Make a fine-tuning displacement in the first direction on the operating tool. Furthermore, the positioning structure opens a long slot arranged in the second direction in the loading tool for inserting the first positioning component, and the intermediary tool 13 is provided with a second positioning component for assembling the first positioning component; in this article In the embodiment, the positioning structure has a long slot hole 113 arranged in the second direction (such as the Y direction) in the base plate 11. The long slot hole 113 is a stepped hole for inserting a first positioning component that is the second bolt 114. , the positioning structure is also provided with a second positioning component which is a second screw hole 134 on the intermediary tool 13. The second screw hole 134 can be used for screwing the second bolt 114.
第二牽動結構於中介具13設有呈第一方向配置之導槽，並於裝載具設有一具偏心桿之轉動具，轉動具之偏心桿插置於導槽，以供帶動中介具13及承置件作第二方向微調位移；更進一步，裝載具開設有承槽以供容置轉動具 ；轉動具設有至少一接合部，以供連接驅動工具(如起子工具，圖未示出)；於本實施例，第二牽動結構於基板11設有一由頂面貫通至底面之承槽115，以供放置可沿軸線A轉動之轉動具14，轉動具14之底面設有呈Z方向配置之偏心桿141 ，而頂面凹設有接合部142，以供插接起子工具；第二牽動結構另於中介具13設有呈第一方向(如X方向)配置之導槽135，以供插置轉動具14之偏心桿141。 The second pulling structure is provided with a guide groove arranged in the first direction on the intermediary tool 13, and is provided with a rotating tool with an eccentric rod on the loading device. The eccentric rod of the rotating tool is inserted into the guide groove for driving the intermediary tool 13 and The supporting member performs fine-tuning displacement in the second direction; further, the loading tool is provided with a receiving groove for accommodating the rotating tool ; The rotating tool is provided with at least one joint for connecting a driving tool (such as a screwdriver tool, not shown in the figure); In this embodiment, the second pulling structure is provided with a receiving groove 115 on the base plate 11 from the top surface to the bottom surface. , for placing the rotating tool 14 that can rotate along the axis A. The bottom surface of the rotating tool 14 is provided with an eccentric rod 141 arranged in the Z direction. , and a joint portion 142 is recessed on the top surface for inserting the screwdriver tool; the second pulling structure is also provided with a guide groove 135 arranged in the first direction (such as the X direction) on the intermediary tool 13 for inserting the rotating tool. 14. Eccentric rod 141.
然，銷具131之設置位置可以中介具13之中心線作為基準而偏置一預設距離，每一個中介具13之銷具131的設置位置均不相同，因此，可依微調距離需求，而選用所需之中介具13。However, the setting position of the pin 131 can be offset by a preset distance based on the center line of the intermediary tool 13. The setting position of the pin 131 of each intermediary tool 13 is different. Therefore, the distance can be fine-tuned according to the requirement. Select the required intermediary tools13.
承上述，銷具131之設置位置可以中介具13之邊線作為基準而偏置一預設距離，亦無不可。Based on the above, the position of the pin 131 can be offset by a preset distance based on the edge of the intermediate tool 13 .
於微調測試座12之X方向位置時，中介具13以銷具131插置於測試座12之銷孔122，並以第一栓具133穿置基板11之第一穿孔112及中介具13之第二穿孔132，而螺合於測試座12之第一螺孔123，使第一栓具133連結中介具13及測試座12，中介具13可於基板11之下方位移作動。When fine-tuning the X-direction position of the test seat 12, the intermediary tool 13 uses the pin tool 131 to insert into the pin hole 122 of the test seat 12, and uses the first bolt tool 133 to penetrate the first through hole 112 of the substrate 11 and the intermediary tool 13. The second through hole 132 is screwed into the first screw hole 123 of the test seat 12 so that the first bolt 133 connects the intermediary tool 13 and the test seat 12 so that the intermediary tool 13 can move and move under the substrate 11 .
以第二栓具114穿置基板11之長槽孔113，並螺合於中介具13之第二螺孔134，而鎖固基板11及中介具13，由於測試座12僅以探針121之一端連接電路板，當第二栓具114鎖固基板11及中介具13時，利用中介具13之銷具131牽動測試座12於電路板上作X方向微小位移，進而微調測試座12之X方向位置。因此，當微調測試座12至X方向不同位置時，僅需更換不同中介具13，進而提高測試座12之配置精準性。The second bolt 114 is inserted through the long slot 113 of the base plate 11 and screwed into the second screw hole 134 of the intermediary tool 13 to lock the base plate 11 and the intermediary tool 13. Since the test seat 12 only uses the probe 121 One end is connected to the circuit board. When the second bolt 114 locks the substrate 11 and the intermediary tool 13, the pin 131 of the intermediary tool 13 is used to move the test socket 12 to make a slight displacement in the X direction on the circuit board, thereby fine-tuning the X of the test socket 12. direction position. Therefore, when fine-tuning the test seat 12 to different positions in the X direction, only different intermediary tools 13 need to be replaced, thereby improving the configuration accuracy of the test seat 12 .
於微調測試座12之Y方向位置時，以起子工具(圖未示出)插置於轉動具14之接合部142，而驅動該轉動具14於基板11之承槽115內沿軸線A作旋轉 ，轉動具14以偏心桿141於中介具13之X方向的導槽135位移，且頂推導槽135，進而推動中介具13作Y方向位移，使中介具13帶動測試座12同步位移而微調Y方向位置；再以第二栓具114鎖固基板11及中介具13，進而精確定位測試座12。 When fine-tuning the Y-direction position of the test seat 12, a screwdriver tool (not shown) is inserted into the joint 142 of the rotating tool 14, and the rotating tool 14 is driven to rotate along the axis A in the groove 115 of the base plate 11. , the rotating tool 14 uses the eccentric rod 141 to displace in the guide groove 135 of the intermediary tool 13 in the X direction, and pushes the guide groove 135, thereby pushing the intermediary tool 13 to move in the Y direction, so that the intermediary tool 13 drives the test seat 12 to move synchronously and fine-tune Y direction position; and then use the second bolt 114 to lock the base plate 11 and the intermediary tool 13 to accurately position the test seat 12.
於測試座12作X-Y方向微調定位後，壓接器31可作Y-Z方向位移將電子元件32移入通過基板11之第一通孔111而置入測試座12，使電子元件32之接腳準確對位壓接測試座12之探針121而執行測試作業，以提高測試品質。After the test seat 12 is fine-tuned and positioned in the X-Y direction, the crimping device 31 can move in the Y-Z direction to move the electronic component 32 into the first through hole 111 of the substrate 11 and place it into the test seat 12 so that the pins of the electronic component 32 can be accurately aligned. The probe 121 of the test socket 12 is pressed to perform the test operation to improve the test quality.
請參閱圖1~6、8，本發明作業機包含機台20、供料裝置40、收料裝置50、作業裝置10、輸送裝置60及中央控制裝置（圖未示出）；供料裝置40裝配於機台20，並設有至少一供料器41，以容納至少一待作業之電子元件；收料裝置50裝配於機台20，並設有至少一收料器51，以容納至少一已作業之電子元件；作業裝置10配置於機台20，包含裝載具、作業器及調位單元，作業器以供對電子元件執行預設作業，於本實施例，作業裝置10為測試裝置，作業器為測試器，以供測試電子元件，測試器設有電性連接之電路板及具傳輸件(如探針121)之測試座12，測試座12以供承置及測試電子元件；調位單元以連結裝載具及作業器，並供微調作業器之裝配位置；輸送裝置60裝配於機台20，並設有至少一輸送器，以輸送電子元件，於本實施例，輸送裝置60設有一為第一移料器61之第一輸送器，以於供料裝置40之供料器41取出待測之電子元件，並將待測電子元件移載至一為第一載台62之第二輸送器，第一載台62將待測之電子元件載送至作業裝置10之側方，輸送裝置60設有一為壓接器63之第三輸送器，以於第一載台62取出待測電子元件，並移載至測試座12執行測試作業，以及將已測電子元件移載至一為第二載台64之第四輸送器，第二載台64載出已測之電子元件，一為第二移料器65之第五輸送器於第二載台64取出已測之電子元件，並依據測試結果，將已測之電子元件輸送至收料裝置50之收料器51而分類收置；中央控制裝置(圖未示出)用以控制及整合各裝置作動，以執行自動化作業，達到提升作業效能之實用效益。Please refer to Figures 1 to 6 and 8. The working machine of the present invention includes a machine platform 20, a feeding device 40, a collecting device 50, an operating device 10, a conveying device 60 and a central control device (not shown); the feeding device 40 It is assembled on the machine platform 20 and is provided with at least one feeder 41 to accommodate at least one electronic component to be processed. The receiving device 50 is assembled on the machine platform 20 and is provided with at least one receiving device 51 to accommodate at least one electronic component. Electronic components that have been operated; the operating device 10 is configured on the machine platform 20 and includes a loader, an operator and a positioning unit. The operator is used to perform preset operations on the electronic components. In this embodiment, the operating device 10 is a testing device. The operating device is a tester for testing electronic components. The tester is provided with a circuit board for electrical connection and a test socket 12 with transmission parts (such as probes 121). The test socket 12 is used for holding and testing electronic components; adjust The bit unit is used to connect the loader and the operator and to fine-tune the assembly position of the operator; the conveyor device 60 is installed on the machine 20 and is provided with at least one conveyor to convey electronic components. In this embodiment, the conveyor device 60 is provided with There is a first conveyor, which is a first transfer device 61, to take out the electronic components to be tested from the feeder 41 of the feeding device 40, and transfer the electronic components to be tested to a first carrier 62. There are two conveyors. The first stage 62 carries the electronic components to be tested to the side of the operating device 10. The conveyor 60 is provided with a third conveyor which is a crimping device 63 to take out the electronic components to be tested on the first stage 62. The electronic components are tested and transferred to the test seat 12 to perform the testing operation, and the tested electronic components are transferred to a fourth conveyor that is the second carrier 64, and the second carrier 64 carries out the tested electronic components. One is the fifth conveyor of the second transfer device 65 that takes out the tested electronic components from the second stage 64 and transports the tested electronic components to the receiver 51 of the receiving device 50 for classification according to the test results. Storage; the central control device (not shown) is used to control and integrate the actions of various devices to perform automated operations and achieve practical benefits of improving operating efficiency.
依作業需求，壓接器更包含溫控單元(圖未示出)，溫控單元設置至少一溫控件，以供溫控電子元件；更進一步，溫控件可為加熱件、致冷晶片或具流體之座體。Depending on the operation requirements, the crimping device further includes a temperature control unit (not shown in the figure). The temperature control unit is equipped with at least one temperature control for temperature control electronic components; further, the temperature control can be a heating element or a cooling chip. Or a fluid body.
依作業需求，作業裝置10可於機台20設置測試室(圖未示出)，測試室設有至少一輸送管，以供輸送乾燥空氣，測試座12位於測試室之內部，以供電子元件於模擬日後使用環境溫度之測試室執行冷測作業。Depending on the operation requirements, the operating device 10 can be provided with a test chamber (not shown) on the machine 20. The test chamber is provided with at least one delivery pipe for delivering dry air. The test seat 12 is located inside the test chamber for electronic components. Perform cold testing operations in a testing room that simulates future ambient temperatures.
依作業需求，於熱測作業時，測試室內可配置鼓風機(圖未示出) ，以供吹送熱風，使測試室之內部升溫，亦無不可。 Depending on the operation requirements, a blower can be configured in the test room during thermal testing (not shown in the picture) , it is also possible to blow hot air to heat the inside of the test chamber.
10:作業裝置 11:基板 111:第一通孔 112:第一穿孔 113:長槽孔 114:第二栓具 115:承槽 12:測試座 121:探針 122:銷孔 123:第一螺孔 13:中介具 131:銷具 132:第二穿孔 133:第一栓具 134:第二螺孔 135:導槽 14:轉動具 141:偏心桿 142:接合部 20:機台 21:第二通孔 A:軸線 31:壓接器 32:電子元件 40:供料裝置 41:供料器 50:收料裝置 51:收料器 60:輸送裝置 61:第一移料器 62:第一載台 63:壓接器 64:第二載台 65:第二移料器 10:Working equipment 11:Substrate 111: First through hole 112: First piercing 113: Long slotted hole 114:Second bolt 115:Trough 12:Test seat 121:Probe 122: Pin hole 123:First screw hole 13: Intermediary tools 131: Pin tools 132: Second piercing 133:The first bolt 134:Second screw hole 135:Guide groove 14: Rotating tool 141: Eccentric rod 142:Joint 20:Machine 21: Second through hole A:Axis 31:crimper 32: Electronic components 40: Feeding device 41: Feeder 50:Receiving device 51:Receiver 60:Conveyor device 61:The first material transfer device 62:First carrier 63:crimper 64: Second stage 65: Second material transfer device
圖1：本發明作業裝置之零件分解圖。 圖2至圖6：作業裝置微調承置件之第一、二方向位置的使用示意圖。 圖7：作業裝置測試電子元件的使用示意圖。 圖8：作業裝置應用於作業機之示意圖。 Figure 1: Exploded view of parts of the working device of the present invention. Figure 2 to Figure 6: Schematic diagram of the use of the working device to fine-tune the position of the supporting member in the first and second directions. Figure 7: Schematic diagram of the use of the working device to test electronic components. Figure 8: Schematic diagram of the working device applied to the working machine.
10:作業裝置 10:Working device
11:基板 11:Substrate
111:第一通孔 111: First through hole
112:第一穿孔 112: First piercing
113:長槽孔 113: Long slotted hole
114:第二栓具 114:Second bolt
115:承槽 115:Trough
12:測試座 12:Test seat
121:探針 121:Probe
122:銷孔 122: Pin hole
123:第一螺孔 123:First screw hole
13:中介具 13: Intermediary tools
131:銷具 131: Pin tools
132:第二穿孔 132: Second piercing
133:第一栓具 133:The first bolt
134:第二螺孔 134:Second screw hole
135:導槽 135:Guide groove
14:轉動具 14: Rotating tool
141:偏心桿 141: Eccentric rod
142:接合部 142:Joint
20:機台 20:Machine
21:第二通孔 21: Second through hole
A:軸線 A:Axis
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW111119171A TWI815470B (en) | 2022-05-23 | 2022-05-23 | Processing apparatus of shifting unit, and handler |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW111119171A TWI815470B (en) | 2022-05-23 | 2022-05-23 | Processing apparatus of shifting unit, and handler |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI815470B TWI815470B (en) | 2023-09-11 |
| TW202346872A true TW202346872A (en) | 2023-12-01 |
Family
ID=88966033
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW111119171A TWI815470B (en) | 2022-05-23 | 2022-05-23 | Processing apparatus of shifting unit, and handler |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI815470B (en) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3011401B2 (en) * | 1996-08-29 | 2000-02-21 | 日本電産リード株式会社 | Printed circuit board inspection device with upper jig positioning mechanism and upper jig positioning method |
| TWM310335U (en) * | 2006-10-18 | 2007-04-21 | Guo-Jen Wu | Precise fine-tuning mold |
| CN101520487B (en) * | 2008-02-28 | 2012-06-13 | 富葵精密组件(深圳)有限公司 | Electrical measurement fixture |
| WO2017195300A1 (en) * | 2016-05-11 | 2017-11-16 | Ｗｉｔ株式会社 | Multifunctional substrate inspection device and multifunctional substrate inspection method |
| TWI745136B (en) * | 2020-10-27 | 2021-11-01 | 鴻勁精密股份有限公司 | Position shifter for electronic component support and operating apparatus using the same |
| CN213780291U (en) * | 2020-12-14 | 2021-07-23 | 苏州光和精密测试有限公司 | Novel test fixture |
-
2022
- 2022-05-23 TW TW111119171A patent/TWI815470B/en active
Also Published As
| Publication number | Publication date |
|---|---|
| TWI815470B (en) | 2023-09-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2821046B2 (en) | Characteristics inspection equipment for semiconductor devices | |
| US7232328B2 (en) | Insert and electronic component handling apparatus provided with the same | |
| US6932635B2 (en) | Electronic component testing socket and electronic component testing apparatus using the same | |
| US20020186005A1 (en) | Contact arm and electronic device testing apparatus using the same | |
| TWI677685B (en) | Electronic component test equipment | |
| TWI585424B (en) | Temperature control mechanism of electronic component bonding device, temperature control method and its application Test Equipment | |
| TWI815470B (en) | Processing apparatus of shifting unit, and handler | |
| TWI741442B (en) | Correction device, correction method and working equipment for application thereof | |
| US7676908B2 (en) | Pressing member and electronic device handling apparatus | |
| TW202217321A (en) | Position shifter for electronic component support and operating apparatus using the same | |
| TWI817183B (en) | Pressing mechanism, testing apparatus, and handler | |
| TW201809696A (en) | Electronic component crimping device and test and classification equipment applying same capable of avoiding damages to the temperature control component caused by a downward pressure and a counteraction of a probe | |
| JP3071156B2 (en) | Method for testing continuity of B, G, and A IC substrate | |
| TWI811770B (en) | Transmission mechanism, testing equipment, detecting method, and handler using the same | |
| TWI769664B (en) | Testing apparatus and testing equipment using the same | |
| TWI775471B (en) | Correction apparatus, correction method, and handler using the same | |
| JP2010175288A (en) | Apparatus for inspecting electronic device and implement for holding electronic device | |
| TWI827473B (en) | Processing machine of electronic component | |
| TWI791270B (en) | Correction apparatus, correction method, and handler using the same | |
| TWI767736B (en) | Correction apparatus, correction method, and handler using the same | |
| TWI764518B (en) | Pressing mechanism and testing equipment using the same | |
| TWI750984B (en) | An automated test system using bridge connection | |
| TWI777740B (en) | Correction apparatus, correction method, and handler using the same | |
| CN114967035A (en) | Image capturing device and operating equipment applying same | |
| TWI834475B (en) | Pressing mechanism, testing device, and processing machine |