TW202021275A - Method for performing lumen depreciation compensation on optical mechanical keyboard - Google Patents

Method for performing lumen depreciation compensation on optical mechanical keyboard Download PDF

Info

Publication number
TW202021275A
TW202021275A TW107141646A TW107141646A TW202021275A TW 202021275 A TW202021275 A TW 202021275A TW 107141646 A TW107141646 A TW 107141646A TW 107141646 A TW107141646 A TW 107141646A TW 202021275 A TW202021275 A TW 202021275A
Authority
TW
Taiwan
Prior art keywords
compensation
infrared light
optical axis
voltage value
axis keyboard
Prior art date
Application number
TW107141646A
Other languages
Chinese (zh)
Other versions
TWI707540B (en
Inventor
陳希聖
王俊升
徐德平
Original Assignee
達方電子股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 達方電子股份有限公司 filed Critical 達方電子股份有限公司
Priority to TW107141646A priority Critical patent/TWI707540B/en
Publication of TW202021275A publication Critical patent/TW202021275A/en
Application granted granted Critical
Publication of TWI707540B publication Critical patent/TWI707540B/en

Links

Images

Landscapes

  • Input From Keyboards Or The Like (AREA)

Abstract

A method for performing lumen depreciation compensation on an optical axis keyboard is provided, wherein the optical axis keyboard may include a plurality of button units, any button unit within the plurality of button units may include an infrared light generator, and the method includes: reading a memory device to obtain using time information of the optical axis keyboard, wherein the using time information indicates accumulated using time of the infrared light generator; based on a mapping table between lumen depreciation and time, obtaining lumen depreciation information of the optical axis keyboard according to the using time information, wherein the mapping table indicates variation of infrared light intensity regarding the accumulated using time of the infrared light generator; and according to the lumen depreciation information, controlling infrared light intensity of the infrared light generator.

Description

對光軸鍵盤進行光衰補償的方法Method for performing light attenuation compensation on optical axis keyboard

本發明係關於光軸鍵盤（或稱光機（optical mechanical）鍵盤，諸如具有透過光感應制動的按鍵之鍵盤），尤指一種對光軸鍵盤進行光衰補償的方法。The present invention relates to an optical axis keyboard (or optical mechanical keyboard, such as a keyboard with keys that are braked through light induction), and particularly to a method of performing optical attenuation compensation on the optical axis keyboard.

由於光軸鍵盤係利用紅外光產生器所產生之紅外光以及相對應的感測裝置來運作，因此光軸鍵盤的壽命會受到其內的紅外光產生器影響。例如：紅外光產生器因自身特性而有光衰壽命的問題，當所產生的紅外光的強度隨著累計使用時間的增加而減弱，可能造成光軸鍵盤進行掃描時判斷失效。因此，需要一種新穎的方法，來解決光軸鍵盤因光衰壽命所產生的問題。Since the optical axis keyboard uses the infrared light generated by the infrared light generator and the corresponding sensing device to operate, the life of the optical axis keyboard is affected by the infrared light generator therein. For example, the infrared light generator has the problem of light decay life due to its own characteristics. When the intensity of the generated infrared light decreases with the increase of the cumulative use time, it may cause the optical axis keyboard to fail to judge when scanning. Therefore, a novel method is needed to solve the problems caused by the light decay life of the optical axis keyboard.

本發明之一目的在於提供一種對一光軸鍵盤進行光衰補償的方法，以在沒有副作用或較不可能帶來副作用的狀況下，解決上述問題。An object of the present invention is to provide a method for compensating the light attenuation of an optical axis keyboard, so as to solve the above-mentioned problems without side effects or when side effects are less likely to occur.

本發明之另一目的在於提供一種對一光軸鍵盤進行光衰補償的方法，以偵測光衰的程度並進行相對應的補償。Another object of the present invention is to provide a method for performing light attenuation compensation on an optical axis keyboard to detect the degree of light attenuation and perform corresponding compensation.

本發明至少一實施例提供一種對一光軸鍵盤進行光衰補償的方法，其中該光軸鍵盤包含複數個按鍵單元，該複數個按鍵單元中之任一按鍵單元包含一紅外光產生器，且該方法包含：讀取一記憶裝置以取得該光軸鍵盤的使用時間資訊，其中該使用時間資訊指出該紅外光產生器的累計使用時間；基於一光衰時間對照表，依據該使用時間資訊取得該光軸鍵盤之光衰資訊，其中該光衰時間對照表指出該紅外線產生器隨累計使用時間的紅外光強度變化；以及依據該光衰資訊，控制該紅外光產生器之紅外光強度。At least one embodiment of the present invention provides a light attenuation compensation method for an optical axis keyboard, wherein the optical axis keyboard includes a plurality of key units, and any key unit of the plurality of key units includes an infrared light generator, and The method includes: reading a memory device to obtain the usage time information of the optical axis keyboard, wherein the usage time information indicates the cumulative usage time of the infrared light generator; based on a light decay time comparison table, obtained based on the usage time information The light decay information of the optical axis keyboard, wherein the light decay time comparison table indicates that the infrared light intensity of the infrared generator changes with the cumulative use time; and according to the light decay information, the infrared light intensity of the infrared light generator is controlled.

本發明至少一實施例提供一種對一光軸鍵盤進行光衰補償的方法，其中該光軸鍵盤包含複數個按鍵單元，該複數個按鍵單元中之任一按鍵單元包含一紅外光產生器以及一偵測元件，且該方法包含：在該光軸鍵盤上電後，透過該偵測元件依據該紅外光產生器所產生之紅外光強度產生一電壓值；依據該電壓值產生該紅外光產生器的補償資訊；將該補償資訊儲存至一記憶裝置中；以及在該光軸鍵盤進行正常運作時，依據該補償資訊增強該紅外光強度。At least one embodiment of the present invention provides a light attenuation compensation method for an optical axis keyboard, wherein the optical axis keyboard includes a plurality of key units, and any key unit of the plurality of key units includes an infrared light generator and a A detection element, and the method includes: after the optical axis keyboard is powered on, generating a voltage value according to the intensity of infrared light generated by the infrared light generator through the detection element; generating the infrared light generator according to the voltage value Compensation information; store the compensation information in a memory device; and enhance the infrared light intensity according to the compensation information during normal operation of the optical axis keyboard.

本發明的好處之一在於，本發明能依據該光軸鍵盤中之紅外光產生器的使用狀況，例如光衰狀況，來進行相對應之強度補償，以避免該光軸鍵盤因光衰問題而失效。另外，依據本發明之實施例來進行光衰補償不會大幅增加額外成本，因此，本發明能在沒有副作用或較不可能帶來副作用的狀況下，解決相關技術的問題。One of the advantages of the present invention is that the present invention can perform corresponding intensity compensation according to the usage status of the infrared light generator in the optical axis keyboard, such as the light decay condition, to avoid the optical axis keyboard due to the problem of light decay Failure. In addition, the light attenuation compensation according to the embodiments of the present invention does not significantly increase the additional cost. Therefore, the present invention can solve the problems of the related art without side effects or less likely to bring side effects.

第1圖為依據本發明一實施例之光軸鍵盤100的示意圖，其中光軸鍵盤100可包含一按鍵陣列10、一控制器20、一記憶裝置30以及一計時器40，且按鍵陣列10可包含複數個按鍵單元諸如按鍵單元110以及對應的選擇電路諸如選擇電路120。在本實施例中，控制器20可耦接至按鍵陣列10中的按鍵單元110以及選擇電路120，且另耦接至記憶裝置30以及計時器40，其中控制器20可利用選擇電路120控制按鍵單元110輸出一輸出電壓（可稱為「PT電壓」，其中PT可表示此電壓為光電晶體的輸出電壓）至控制器20，但本發明不限於此。FIG. 1 is a schematic diagram of an optical axis keyboard 100 according to an embodiment of the present invention, wherein the optical axis keyboard 100 may include a key array 10, a controller 20, a memory device 30, and a timer 40, and the key array 10 may A plurality of key units such as key unit 110 and corresponding selection circuits such as selection circuit 120 are included. In this embodiment, the controller 20 can be coupled to the key unit 110 and the selection circuit 120 in the key array 10, and further coupled to the memory device 30 and the timer 40, wherein the controller 20 can use the selection circuit 120 to control the keys The unit 110 outputs an output voltage (which may be referred to as "PT voltage", where PT may indicate that this voltage is the output voltage of the phototransistor) to the controller 20, but the invention is not limited thereto.

第2圖為依據本發明一實施例之複數個按鍵單元諸如按鍵單元110_1與110_2的示意圖，其中按鍵單元110_1與110_2中任一者可作為第1圖所示之按鍵單元110的例子，且按鍵單元110_1與110_2可分別耦接至光軸鍵盤100中的選擇電路120_1與120_2。按鍵單元110_1可包含一紅外光產生器諸如紅外光發光二極體（infrared Light-emitting diode, IR LED）112_1、一偵測元件諸如光電晶體（phototransistor）114_1、負載電阻116_1以及遮光板118_1，其中負載電阻116_1耦接於紅外光發光二極體112_1與選擇電路120_1之間；按鍵單元110_2可包含紅外光發光二極體112_2、光電晶體114_2、負載電阻116_2以及遮光板118_2，其中負載電阻116_2耦接於紅外光發光二極體112_2與選擇電路120_2之間；但本發明不限於此。舉例來說，光軸鍵盤100可為(30 * 6)的光軸鍵盤，即光軸鍵盤100可包含180個與按鍵單元110_1或110_2之架構類似的按鍵單元，相關領域者於閱讀以上說明後應可了解不同按鍵單元數量的架構，在此不贅述。FIG. 2 is a schematic diagram of a plurality of key units such as key units 110_1 and 110_2 according to an embodiment of the present invention, wherein any one of the key units 110_1 and 110_2 can be used as an example of the key unit 110 shown in FIG. The units 110_1 and 110_2 may be coupled to the selection circuits 120_1 and 120_2 in the optical axis keyboard 100, respectively. The key unit 110_1 may include an infrared light generator such as an infrared light-emitting diode (IR LED) 112_1, a detection element such as a phototransistor 114_1, a load resistor 116_1, and a light shield 118_1, wherein The load resistor 116_1 is coupled between the infrared light-emitting diode 112_1 and the selection circuit 120_1; the key unit 110_2 may include an infrared light-emitting diode 112_2, a photoelectric crystal 114_2, a load resistor 116_2, and a shading plate 118_2, wherein the load resistor 116_2 is coupled It is connected between the infrared light emitting diode 112_2 and the selection circuit 120_2; but the invention is not limited thereto. For example, the optical axis keyboard 100 may be an optical axis keyboard of (30 * 6), that is, the optical axis keyboard 100 may include 180 key units similar to the structure of the key unit 110_1 or 110_2. It should be understood that the structure of the number of different key units is not repeated here.

在本實施例中，由於按鍵單元110_1未被按下，其內的遮光板118_1不會被設置於紅外光發光二極體112_1與光電晶體114_1之間，而由於按鍵單元110_2被按下，其內的遮光板118_2會被設置於紅外光發光二極體112_2與光電晶體114_2之間，如此一來，當光軸鍵盤100依序對按鍵單元110_1與110_2進行掃描時可依據輸出至輸出端子PT_OUT的電壓位準判斷對應的按鍵單元是否有被按下，其中輸出端子PT_OUT可耦接至第1圖所示之控制器20。例如，當光軸鍵盤開啟選擇電路120_1時，紅外光發光二極體112_1可產生紅外光，而光電晶體114_1可接收到112_1所產生的紅外光而導通，使得耦接至輸出端子PT_OUT的輸出端子PT1從一第一電壓位準（例如一高位準）被拉至一第二電壓位準（例如一低位準）；當光軸鍵盤開啟選擇電路120_2時，紅外光發光二極體112_2可產生紅外光，而光電晶體114_2因遮光板118_2無法接收到112_2所產生的紅外光，使得耦接至輸出端子PT_OUT的輸出端子PT2維持在該第一電壓位準。換句話說，當輸出端子PT_OUT的電壓位準為該第一電壓位準，則表示對應的按鍵單元（例如按鍵單元110_2）有被按下，相對地，當輸出端子PT_OUT的電壓位準為該第二電壓位準，則表示對應的按鍵單元（例如按鍵單元110_1）未被按下。熟習此技藝者應可了解與光軸鍵盤100之運作相關的實施細節，為簡明起見，在此不贅述。In this embodiment, since the key unit 110_1 is not pressed, the light shield 118_1 therein will not be disposed between the infrared light emitting diode 112_1 and the photoelectric crystal 114_1, and because the key unit 110_2 is pressed, its The inner light-shielding plate 118_2 will be disposed between the infrared light emitting diode 112_2 and the photoelectric crystal 114_2, so that when the optical axis keyboard 100 sequentially scans the key units 110_1 and 110_2, it can be output to the output terminal PT_OUT Determines whether the corresponding key unit is pressed, and the output terminal PT_OUT can be coupled to the controller 20 shown in FIG. 1. For example, when the optical axis keyboard turns on the selection circuit 120_1, the infrared light emitting diode 112_1 can generate infrared light, and the phototransistor 114_1 can receive the infrared light generated by 112_1 to be turned on, so that it is coupled to the output terminal of the output terminal PT_OUT PT1 is pulled from a first voltage level (such as a high level) to a second voltage level (such as a low level); when the optical axis keyboard turns on the selection circuit 120_2, the infrared light emitting diode 112_2 can generate infrared light Light, and the phototransistor 114_2 cannot receive the infrared light generated by the 112_2 due to the shading plate 118_2, so that the output terminal PT2 coupled to the output terminal PT_OUT is maintained at the first voltage level. In other words, when the voltage level of the output terminal PT_OUT is the first voltage level, it means that the corresponding key unit (such as the key unit 110_2) has been pressed. Relatively, when the voltage level of the output terminal PT_OUT is the The second voltage level indicates that the corresponding key unit (for example, key unit 110_1) has not been pressed. Those skilled in the art should be able to understand the implementation details related to the operation of the optical axis keyboard 100, and for the sake of simplicity, they will not be repeated here.

第3圖為依據本發明一實施例之光衰時間對照表300（例如：發光二極體製造商所提供的光衰時間對照表），其中光衰時間對照表300可指出紅外光發光二極體112_1與112_2隨累計使用時間的紅外光強度變化。如第3圖所示，紅外光發光二極體的紅外光強度會隨著時間逐漸衰減。為了避免按鍵單元110_1與110_2因其內的紅外光發光二極體112_1與112_2的光衰問題而失效，控制器20可依據光衰時間對照表300來控制紅外光發光二極體112_1與112_2的紅外光強度。FIG. 3 is a light decay time comparison table 300 according to an embodiment of the present invention (for example: a light decay time comparison table provided by a light-emitting diode manufacturer), wherein the light decay time comparison table 300 may indicate an infrared light-emitting diode The infrared light intensity of the body 112_1 and 112_2 varies with the cumulative use time. As shown in Figure 3, the infrared light intensity of the infrared light-emitting diode will gradually decrease with time. In order to avoid the failure of the key units 110_1 and 110_2 due to the light decay problem of the infrared light emitting diodes 112_1 and 112_2 therein, the controller 20 can control the infrared light emitting diodes 112_1 and 112_2 according to the light attenuation time comparison table 300 Infrared light intensity.

第4圖為依據本發明一實施例之對光軸鍵盤100進行光衰補償的工作流程400。本發明所提出的方法可依據光軸鍵盤100中的紅外光發光二極體112_1與112_2的累計使用時間，來調整供應給紅外光發光二極體112_1與112_2的電流大小，以補償紅外光發光二極體112_1與112_2的紅外光強度。FIG. 4 is a workflow 400 for performing light attenuation compensation on the optical axis keyboard 100 according to an embodiment of the present invention. The method proposed by the present invention can adjust the current supplied to the infrared light-emitting diodes 112_1 and 112_2 according to the cumulative usage time of the infrared light-emitting diodes 112_1 and 112_2 in the optical axis keyboard 100 to compensate for the infrared light emission Infrared light intensity of diodes 112_1 and 112_2.

在步驟410中，光軸鍵盤100上電。In step 410, the optical axis keyboard 100 is powered on.

在步驟420中，光軸鍵盤100中之控制器20可讀取一記憶裝置諸如記憶裝置30（例如一快閃記憶體（flash memory））以取得光軸鍵盤100的使用時間資訊，其中該使用時間資訊指出該紅外光產生器的累計使用時間（例如：20000小時）。In step 420, the controller 20 in the optical axis keyboard 100 can read a memory device such as a memory device 30 (for example, a flash memory) to obtain the usage time information of the optical axis keyboard 100, wherein the use Time information indicates the cumulative usage time of the infrared light generator (for example: 20,000 hours).

在步驟430中，基於一光衰時間對照表諸如第3圖所示之光衰時間對照表300，控制器20可依據該使用時間資訊取得光軸鍵盤100之光衰資訊（例如：相對功率為60%）。In step 430, based on a light decay time comparison table such as the light decay time comparison table 300 shown in FIG. 3, the controller 20 can obtain the light decay information of the optical axis keyboard 100 according to the usage time information (for example, the relative power is 60%).

在步驟440中，控制器20可依據該光衰資訊來控制紅外光發光二極體112_1與112_2的紅外光強度，例如：將電流調整為1.67倍，如此一來，雖然紅外光發光二極體112_1與112_2的累計使用時間不停增加，其紅外光強度能維持一致而不會衰減。其中上述控制紅外光強度的機制並非對本發明之限制，例如，選擇電路120_1與120_2中每一者可包含一切換式電流源，以供應不同的電流大小；又例如，負載電阻116_1與116_2中每一者可包含一可變電阻，來調整紅外光發光二極體112_1與112_2的紅外光強度。熟習此技藝者應可了解各種針對紅外光強度的調整方法，在此不贅述。In step 440, the controller 20 can control the infrared light intensity of the infrared light-emitting diodes 112_1 and 112_2 according to the light attenuation information, for example: adjust the current to 1.67 times, so that although the infrared light-emitting diodes The cumulative usage time of 112_1 and 112_2 keeps increasing, and their infrared light intensity can be kept consistent without decay. The above-mentioned mechanism for controlling the intensity of infrared light is not a limitation of the present invention. For example, each of the selection circuits 120_1 and 120_2 may include a switched current source to supply different current levels; for example, each of the load resistors 116_1 and 116_2 One can include a variable resistor to adjust the infrared light intensity of the infrared light emitting diodes 112_1 and 112_2. Those skilled in the art should be able to understand various adjustment methods for infrared light intensity, which will not be repeated here.

在步驟450中，控制器20可啟動光軸鍵盤100中的一計時器（諸如計時器40），以使得計時器40開始進行計時，也就是說，在光軸鍵盤100操作的期間，計時器40可產生該使用時間資訊以記錄該累計使用時間。In step 450, the controller 20 may start a timer (such as a timer 40) in the optical axis keyboard 100, so that the timer 40 starts timing, that is, during the operation of the optical axis keyboard 100, the timer 40 can generate the usage time information to record the accumulated usage time.

在步驟460中，光軸鍵盤100可進入正常的操作模式，例如：進行按鍵掃描取得按鍵指令。另外，在光軸鍵100操作的期間，控制器20可依據一特定時間週期來持續地更新儲存於記憶裝置30的該使用時間資訊，以供光軸鍵盤100下一次上電後能取得更新後的使用時間資訊。例如，控制器20每經過該特定時間週期（例如24分鐘）就從計時器40取得累計使用時間，以更新儲存於記憶裝置30的該使用時間資訊所記錄的累計使用時間。In step 460, the optical axis keyboard 100 may enter a normal operation mode, for example, performing a key scan to obtain key commands. In addition, during the operation of the optical axis key 100, the controller 20 can continuously update the usage time information stored in the memory device 30 according to a specific time period for the optical axis keyboard 100 to obtain the update after the next power-on Usage time information. For example, the controller 20 obtains the cumulative usage time from the timer 40 every time the specific time period (for example, 24 minutes) passes, so as to update the cumulative usage time recorded in the usage time information stored in the memory device 30.

在某些實施例中，控制器20可依據一特定時間週期諸如上述特定時間週期來動態地控制紅外光發光二極體112_1與112_2的紅外光強度，例如：每經過該特定時間週期（例如24分鐘），就讀取一次記憶裝置30以取得光軸鍵盤100的該使用時間資訊，尤指最新的使用時間資訊，並依據該最近的使用時間資訊來控制紅外光發光二極體112_1與112_2的紅外光強度，但本發明不限於此。In some embodiments, the controller 20 can dynamically control the infrared light intensity of the infrared light emitting diodes 112_1 and 112_2 according to a specific time period such as the specific time period described above, for example: every time the specific time period elapses (eg 24 Minutes), the memory device 30 is read once to obtain the usage time information of the optical axis keyboard 100, especially the latest usage time information, and the infrared light emitting diodes 112_1 and 112_2 are controlled according to the latest usage time information Infrared light intensity, but the invention is not limited to this.

第5圖為依據本發明一實施例之光軸鍵盤500的示意圖，其中光軸鍵盤500可當作光軸鍵盤100的一個例子。如第5圖所示，控制器50可透過一電壓偵測電路52（例如：類比數位轉換電路）用來接收或偵測按鍵單元110所產生的一輸出電壓（諸如上述PT電壓），以供控制器50依據該輸出電壓值控制按鍵單元110中的紅外光產生器的紅外光強度（紅外光強度的增強量可稱為「IR補償段數」，其中IR表示紅外光）。 表1

Figure 107141646-A0304-0001
FIG. 5 is a schematic diagram of an optical axis keyboard 500 according to an embodiment of the present invention, where the optical axis keyboard 500 can be used as an example of the optical axis keyboard 100. As shown in FIG. 5, the controller 50 can be used to receive or detect an output voltage (such as the above-mentioned PT voltage) generated by the key unit 110 through a voltage detection circuit 52 (eg, analog-to-digital conversion circuit) for The controller 50 controls the infrared light intensity of the infrared light generator in the key unit 110 according to the output voltage value (the amount of enhancement of infrared light intensity may be referred to as “IR compensation segment number”, where IR represents infrared light). Table 1
Figure 107141646-A0304-0001

表1為偵測到的PT電壓與對應的IR補償段數的對照表的例子，例如，當按鍵單元110所產生的PT電壓為0.2 V，其代表按鍵單元110中的紅外光產生器的紅外光強度大於或等於一特定強度，無須進行補償；又例如，當按鍵單元110所產生的PT電壓為0.5 V，其代表按鍵單元110中的紅外光產生器的紅外光強度所需的IR補償段數為3。Table 1 is an example of a comparison table between the detected PT voltage and the corresponding IR compensation segment number. For example, when the PT voltage generated by the key unit 110 is 0.2 V, it represents the infrared of the infrared light generator in the key unit 110 The light intensity is greater than or equal to a specific intensity without compensation; for example, when the PT voltage generated by the key unit 110 is 0.5 V, it represents the IR compensation section required for the infrared light intensity of the infrared light generator in the key unit 110 The number is 3.

在本實施例中，光軸鍵盤500上電後，控制器50（尤指其內的電壓偵測電路52）可接收到透過一偵測元件諸如按鍵單元110中的光電晶體（例如第2圖所示之光電晶體114_1或114_2）所產生的PT電壓，其中該PT電壓係依據按鍵單元110中的紅外光產生器（例如第2圖所示之紅外光發光二極體112_1或112_2）的紅外光強度所產生的一電壓值諸如，例如，在該紅外光強度尚未衰減，即其強度大於一預定強度，該電壓值可低於一預定電壓值（例如0.26 V）；又例如，該紅外光強度隨著時間衰減而低於該預定強度，該電壓值可高於該預定電壓值（例如0.26 V）；但本發明不限於此。控制器50可依據該PT電壓產生按鍵單元110中的紅外光產生器的補償資訊，其中該補償資訊可包含一補償強度段數IR_COMP、一異常標幟COMP_WARNING、一重新補償次數IR_RECOMP以及一初始電壓值PT_INIT。在本實施例中，補償強度段數IR_COMP可表示紅外光強度的增強量（即段數），而初始電壓值PT_INIT可表示在未按下按鍵單元110時其內的光電晶體（例如第2圖所示之光電晶體114_1或114_2）所產生的PT電壓。在一補償運作中，異常標幟COMP_WARNING為真（true）可表示該補償運作為異常（例如：在按鍵單元110被按下時進行掃描，使得控制器50將此結果誤判為光衰所造成），而該異常標幟為假（false）則表示該補償運作為正常。另外，重新補償次數IR_RECOMP可表示該補償運作為異常的連續次數，例如：當該PT電壓所對應到的IR補償段數超過一預定調整段數（例如IR補償段數為5，而該預定調整段數為3），控制器50可先依據該預定調整段數進行補償（或者先不調整段數）並且將重新補償次數IR_RECOMP增加一次。完成一次補償運作後，控制器50可將該補償資訊儲存（或更新）至一記憶裝置（諸如記憶裝置30）中，而光軸鍵盤500即可依據該補償資訊增強按鍵單元110的紅外光強度已進行正常運作諸如鍵盤輸入操作。In this embodiment, after the optical axis keyboard 500 is powered on, the controller 50 (especially the voltage detection circuit 52 therein) can receive the photoelectric crystal (eg, FIG. 2) through a detection element such as the key unit 110 PT voltage generated by the photoelectric crystal 114_1 or 114_2 shown), wherein the PT voltage is based on the infrared of the infrared light generator (such as the infrared light emitting diode 112_1 or 112_2 shown in FIG. 2) in the key unit 110 A voltage value generated by the light intensity such as, for example, the infrared light intensity has not been attenuated, that is, its intensity is greater than a predetermined intensity, the voltage value may be lower than a predetermined voltage value (for example, 0.26 V); and for example, the infrared light The intensity decreases with time and becomes lower than the predetermined intensity, and the voltage value may be higher than the predetermined voltage value (for example, 0.26 V); but the invention is not limited thereto. The controller 50 can generate compensation information of the infrared light generator in the key unit 110 according to the PT voltage, where the compensation information can include a compensation intensity segment IR_COMP, an abnormal flag COMP_WARNING, a recompensation number IR_RECOMP, and an initial voltage The value PT_INIT. In this embodiment, the number of compensation intensity segments IR_COMP can represent the amount of enhancement of infrared light intensity (ie, the number of segments), and the initial voltage value PT_INIT can represent the photoelectric crystal in the button unit 110 when it is not pressed (for example, FIG. 2 The PT voltage generated by the photoelectric crystal 114_1 or 114_2 shown). In a compensation operation, the abnormal flag COMP_WARNING is true (true) may indicate that the compensation operation is abnormal (for example: scan when the button unit 110 is pressed, so that the controller 50 misjudges this result as caused by light decay) , And the abnormal flag is false, indicating that the compensation operation is normal. In addition, the number of re-compensation IR_RECOMP can indicate that the compensation operation is an abnormal number of consecutive times, for example: when the number of IR compensation segments corresponding to the PT voltage exceeds a predetermined number of adjustment segments (for example, the number of IR compensation segments is 5, and the predetermined adjustment The number of segments is 3), the controller 50 may first compensate according to the predetermined adjusted segment number (or not adjust the segment number first) and increase the number of re-compensation IR_RECOMP once. After completing a compensation operation, the controller 50 can store (or update) the compensation information in a memory device (such as the memory device 30), and the optical axis keyboard 500 can enhance the infrared light intensity of the key unit 110 according to the compensation information Normal operations such as keyboard input operations have been performed.

請注意，上述補償運作可分別針對光軸鍵盤500中的全部按鍵單元來進行，舉例來說，上述全部按鍵單元均可具有各自的補償資訊以分別進行補償運作，相關領域者於閱讀以上說明後應可了解將上述補償運作類推到全部按鍵單元的實施方式，在此不贅述。為簡明起見，後續實施細節均以單一按鍵單元（諸如按鍵單元110）為例來說明。Please note that the above compensation operations can be performed on all the key units in the optical axis keyboard 500, for example, all the above button units can have their own compensation information to perform the compensation operations separately. It should be understood that the above-mentioned compensation operation can be analogized to all the button units, which will not be repeated here. For the sake of brevity, the details of the subsequent implementation are explained by taking a single key unit (such as the key unit 110) as an example.

在某些實施例中，上述補償運作可能因為光軸鍵盤500被使用者誤按，使得控制器50接收到的PT電壓異常地高於初始電壓值PT_INIT，為了避免控制器50誤認為按鍵單元110需要以非常高的調整量（諸如表1所示之IR補償段數的段數調整量）來進行補償，控制器50需連續地接收到異常地高於初始電壓值PT_INIT的PT電壓多次才會以對應於此PT電壓的調整量進行補償。In some embodiments, the above compensation operation may be caused by the user accidentally pressing the optical axis keyboard 500, so that the PT voltage received by the controller 50 is abnormally higher than the initial voltage value PT_INIT, in order to avoid the controller 50 mistakenly thinking of the key unit 110 It needs to be compensated with a very high adjustment amount (such as the adjustment amount of the IR compensation stage number shown in Table 1), and the controller 50 needs to continuously receive the PT voltage abnormally higher than the initial voltage value PT_INIT multiple times. It will be compensated by the adjustment amount corresponding to this PT voltage.

舉例來說，控制器50接收到的PT電壓為0.3 V，其大於按鍵單元110的初始電壓值PT_INIT（例如0.26 V），控制器50可依據該電壓值與該初始電壓值之間的差距調整該補償強度段數（例如，依據表1可判斷其對應的IR補償段數為1），由於此調整量（1段）小於一預定調整段數（例如3段），控制器50可依據此調整量調整該補償強度段數IR_COMP（例如從段數1增加為段數2）。For example, the PT voltage received by the controller 50 is 0.3 V, which is greater than the initial voltage value PT_INIT (for example, 0.26 V) of the key unit 110, and the controller 50 can adjust according to the difference between the voltage value and the initial voltage value The compensation intensity segment number (for example, the corresponding IR compensation segment number can be judged according to Table 1 is 1), because the adjustment amount (1 segment) is less than a predetermined adjustment segment number (for example, 3 segments), the controller 50 can be based on this The adjustment amount adjusts the compensation intensity segment number IR_COMP (for example, increases from segment number 1 to segment number 2).

又例如，控制器50接收到的PT電壓為0.9 V，其大於按鍵單元110的初始電壓值PT_INIT（例如0.26 V），控制器50可依據該電壓值與該初始電壓值PT_INIT之間的差距調整補償強度段數IR_COMP（例如，依據表1可判斷其對應的IR補償段數為7），由於此調整量（7段）大於該預定調整段數（例如3段），控制器50在此次補償運作可依據該預定調整段數（3段）來調整補償強度段數IR_COMP，而不是依據此調整量（7段）來調整，或者，控制器50在此次補償運作可先不進行調整，並且將此次補償運作視為異常（例如將異常標幟COMP_WARNING設為「真」），而將重新補償次數IR_RECOMP增加一次，但本發明不限於此。For another example, the PT voltage received by the controller 50 is 0.9 V, which is greater than the initial voltage value PT_INIT (for example, 0.26 V) of the key unit 110, and the controller 50 can adjust according to the difference between the voltage value and the initial voltage value PT_INIT The number of compensation intensity segments IR_COMP (for example, according to Table 1, it can be judged that the corresponding number of IR compensation segments is 7). Since this adjustment amount (7 segments) is greater than the predetermined adjustment segment number (for example, 3 segments), the controller 50 The compensation operation may adjust the compensation intensity number IR_COMP according to the predetermined number of adjustment steps (3 steps), instead of adjusting according to the adjustment amount (7 steps), or the controller 50 may not adjust the compensation operation first. In addition, the compensation operation is regarded as abnormal (for example, the abnormal flag COMP_WARNING is set to "true"), and the number of re-compensation IR_RECOMP is increased once, but the invention is not limited to this.

再舉一例，依據控制器50所收到的PT電壓與該初始電壓值PT_INIT之間的差距所決定的調整量已連續多次地大於該預定調整段數，換句話說，重新補償次數IR_RECOMP已達到一預定次數（例如三次），控制器50即可將此次補償運作視為正常（並非按鍵誤按所造成）並將異常標幟COMP_WARNING設為「假（false）」，以依據此調整量調整補償強度段數IR_COMP。As another example, the amount of adjustment determined according to the difference between the PT voltage received by the controller 50 and the initial voltage value PT_INIT has been greater than the predetermined number of adjustment segments multiple times in a row, in other words, the number of recompensations IR_RECOMP has After reaching a predetermined number of times (for example, three times), the controller 50 can treat the compensation operation as normal (not caused by a wrong key press) and set the abnormal flag COMP_WARNING to "false", according to this adjustment amount Adjust the compensation intensity segment IR_COMP.

第6圖為依據本發明一實施例之對光軸鍵盤500進行光衰補償的工作流程600，需注意的是，只要不妨礙本發明的實施，一或多個步驟可於工作流程600中被修改、新增或刪除。FIG. 6 is a workflow 600 for performing light attenuation compensation on the optical axis keyboard 500 according to an embodiment of the present invention. It should be noted that as long as the implementation of the present invention is not hindered, one or more steps can be performed in the workflow 600 Modify, add or delete.

在步驟610中，光軸鍵盤500上電。In step 610, the optical axis keyboard 500 is powered on.

在步驟620中，控制器50可接收按鍵單元110的PT電壓，其中該PT電壓係依據按鍵單元110中之一紅外光產生器（例如第2圖所示之紅外光發光二極體112_1或112_2）之紅外光強度所產生。In step 620, the controller 50 may receive the PT voltage of the key unit 110, wherein the PT voltage is based on an infrared light generator (such as the infrared light emitting diode 112_1 or 112_2 shown in FIG. 2) of the key unit 110 ) Of the infrared light intensity.

在步驟630中，控制器50可判斷該PT電壓是否大於初始電壓值PT_INIT，若是，進入步驟640；否則，進入步驟660。In step 630, the controller 50 can determine whether the PT voltage is greater than the initial voltage value PT_INIT, and if so, proceed to step 640; otherwise, proceed to step 660.

在步驟640中，控制器50可判斷該PT電壓所對應的調整量（例如表1所示之IR補償段數）是否大於一預定調整段數，若是（例如IR補償段數為5而該預定調整段數為3），進入步驟650；否則（例如IR補償段數為2而該預定調整段數為3），進入步驟670。In step 640, the controller 50 can determine whether the adjustment amount corresponding to the PT voltage (such as the number of IR compensation segments shown in Table 1) is greater than a predetermined number of adjustment segments, and if it is (such as the number of IR compensation segments being 5 and the predetermined If the number of adjustment segments is 3), proceed to step 650; otherwise (for example, the number of IR compensation segments is 2 and the predetermined number of adjustment segments is 3), proceed to step 670.

在步驟650中，控制器50可判斷按鍵單元110的重新補償次數IR_RECOMP是否達到一預定次數，若是，進入步驟690；否則，進入步驟680。In step 650, the controller 50 can determine whether the number of recompensations IR_RECOMP of the key unit 110 reaches a predetermined number of times. If so, proceed to step 690; otherwise, proceed to step 680.

在步驟660中，由於該PT電壓值不大於初始電壓值PT_INIT，控制器50不需調整補償強度段數IR_COMP即可讓光軸鍵盤500進入正常模式進行按鍵輸入。In step 660, since the PT voltage value is not greater than the initial voltage value PT_INIT, the controller 50 does not need to adjust the compensation intensity segment number IR_COMP to allow the optical axis keyboard 500 to enter the normal mode for key input.

在步驟670中，由於步驟640中所述之調整量不大於該預定調整段數（例如IR補償段數為2而該預定調整段數為3），控制器50可依據該調整量調整補償強度段數IR_COMP（例如：增加2段）。In step 670, since the adjustment amount described in step 640 is not greater than the predetermined adjustment section number (for example, the IR compensation section number is 2 and the predetermined adjustment section number is 3), the controller 50 can adjust the compensation intensity according to the adjustment amount The number of segments IR_COMP (for example: increase 2 segments).

在步驟680中，由於步驟650中所述之重新補償次數IR_RECOMP不大於該預定次數，例如重新補償次數IR_RECOMP為兩次而該預定次數為三次，控制器50可將此次補償運作視為異常，並依據步驟640所述之預定補償段數來調整補償強度段數IR_COMP（例如：增加3段）。In step 680, since the number of re-compensations IR_RECOMP described in step 650 is not greater than the predetermined number of times, for example, the number of re-compensation IR_RECOMP is two and the predetermined number of times is three, the controller 50 may treat the compensation operation as abnormal, And adjust the compensation intensity segment number IR_COMP according to the predetermined compensation segment number described in step 640 (for example: add 3 segments).

在步驟690中，由於重新補償次數IR_RECOM已達到步驟650所述之預定次數，控制器50可將此次補償運作視為正常，並依據步驟640所述之調整量來調整補償強度段數IR_COMP（例如：增加5段）。In step 690, since the number of re-compensations IR_RECOM has reached the predetermined number described in step 650, the controller 50 can regard the compensation operation as normal and adjust the number of compensation intensity segments IR_COMP according to the adjustment amount described in step 640 ( For example: add 5 paragraphs).

總結來說，本發明所提出的光衰補償方法能依據按鍵單元中的紅外光產生器的紅外光強度衰減狀況來進行相關的補償運作，此外，依據本發明所提供的實施例來實施不會增加許多成本，因此，本發明能在沒有副作用或較不會帶來副作用的情況下，解決光軸鍵盤因光衰而造成的按鍵失效問題。   以上所述僅為本發明之較佳實施例，凡依本發明申請專利範圍所做之均等變化與修飾，皆應屬本發明之涵蓋範圍。In summary, the light attenuation compensation method proposed by the present invention can perform related compensation operations according to the infrared light intensity attenuation status of the infrared light generator in the key unit. In addition, implementation according to the embodiments provided by the present invention does not Many costs are increased. Therefore, the present invention can solve the problem of key failure caused by the light attenuation of the optical axis keyboard without side effects or less side effects. The above are only the preferred embodiments of the present invention, and all changes and modifications made in accordance with the patent application scope of the present invention shall fall within the scope of the present invention.

100、500:光軸鍵盤 10:按鍵陣列 20、50:控制器 30:記憶裝置 40:計時器 52:電壓偵測電路 110、110_1、110_2:按鍵單元 120、120_1、120_2:選擇電路 112_1、112_2:紅外光發光二極體 114_1、114_2:光電晶體 116_1、116_2:負載電阻 118_1、118_2:遮光板 PT1、PT2、PT_OUT:輸出端子 300:光衰時間對照表 600、400:工作流程 410、420、430、 440、450、460、 610、620、630、640、650、 660、670、680、690:步驟 100, 500: optical axis keyboard 10: Button array 20, 50: controller 30: Memory device 40: Timer 52: Voltage detection circuit 110, 110_1, 110_2: button unit 120, 120_1, 120_2: selection circuit 112_1, 112_2: Infrared light emitting diode 114_1, 114_2: photoelectric crystal 116_1, 116_2: load resistance 118_1, 118_2: shading plate PT1, PT2, PT_OUT: output terminal 300: Light decay time comparison table 600, 400: workflow 410, 420, 430, 440, 450, 460, 610, 620, 630, 640, 650, 660, 670, 680, 690: steps

第1圖為依據本發明一實施例之光軸鍵盤的示意圖。 第2圖為依據本發明一實施例之複數個按鍵單元的示意圖。 第3圖為依據本發明一實施例之光衰時間對照表。 第4圖為依據本發明一實施例之對光軸鍵盤進行光衰補償的工作流程。 第5圖為依據本發明一實施例之光軸鍵盤的示意圖。 第6圖為依據本發明一實施例之對光軸鍵盤進行光衰補償的工作流程。FIG. 1 is a schematic diagram of an optical axis keyboard according to an embodiment of the invention. FIG. 2 is a schematic diagram of a plurality of key units according to an embodiment of the invention. FIG. 3 is a comparison table of light decay time according to an embodiment of the present invention. FIG. 4 is a workflow of performing optical attenuation compensation for an optical axis keyboard according to an embodiment of the invention. FIG. 5 is a schematic diagram of an optical axis keyboard according to an embodiment of the invention. FIG. 6 is a workflow of performing light attenuation compensation on an optical axis keyboard according to an embodiment of the invention.

100:光軸鍵盤 100: optical axis keyboard

10:按鍵陣列 10: Button array

20:控制器 20: Controller

30:記憶裝置 30: Memory device

40:計時器 40: Timer

110:按鍵單元 110: Button unit

120:選擇電路 120: Select circuit

Claims (10)

一種對一光軸鍵盤進行光衰補償的方法，其中該光軸鍵盤包含複數個按鍵單元，該複數個按鍵單元中之任一按鍵單元包含一紅外光產生器，且該方法包含： 讀取一記憶裝置以取得該光軸鍵盤的使用時間資訊，其中該使用時間資訊指出該紅外光產生器的累計使用時間； 基於一光衰時間對照表，依據該使用時間資訊取得該光軸鍵盤之光衰資訊，其中該光衰時間對照表指出該紅外線產生器隨累計使用時間的紅外光強度變化；以及 依據該光衰資訊，控制該紅外光產生器之紅外光強度。A method for performing light attenuation compensation on an optical axis keyboard, wherein the optical axis keyboard includes a plurality of key units, any one of the plurality of key units includes an infrared light generator, and the method includes: reading a The memory device obtains the use time information of the optical axis keyboard, wherein the use time information indicates the cumulative use time of the infrared light generator; based on a light decay time comparison table, the light attenuation of the optical axis keyboard is obtained according to the use time information Information, wherein the light decay time comparison table indicates that the infrared light intensity of the infrared generator changes with the cumulative use time; and based on the light decay information, the infrared light intensity of the infrared light generator is controlled. 如申請專利範圍第1項所述之方法，另包含： 在該光軸鍵盤操作的期間，利用一計時器產生該使用時間資訊，並將該使用時間資訊儲存於該記憶裝置中；以及 在該光軸鍵盤操作的期間，每經過一特定時間週期就更新一次儲存於該記憶裝置中之該使用時間資訊。The method as described in item 1 of the patent application scope further includes: during the operation of the optical axis keyboard, using a timer to generate the usage time information and storing the usage time information in the memory device; and in the During the operation of the optical axis keyboard, the usage time information stored in the memory device is updated every time a specific time period passes. 如申請專利範圍第2項所述之方法，其中讀取該記憶裝置以取得該光軸鍵盤的該使用時間資訊之步驟另包含： 每經過該特定時間週期就讀取一次該記憶裝置以取得該光軸鍵盤的該使用時間資訊。The method as described in item 2 of the patent application scope, wherein the step of reading the memory device to obtain the usage time information of the optical axis keyboard further comprises: reading the memory device to obtain the The usage time information of the optical axis keyboard. 一種對一光軸鍵盤進行光衰補償的方法，其中該光軸鍵盤包含複數個按鍵單元，該複數個按鍵單元中之任一按鍵單元包含一紅外光產生器以及一偵測元件，且該方法包含： 在該光軸鍵盤上電後，透過該偵測元件依據該紅外光產生器所產生之紅外光強度產生一電壓值； 依據該電壓值產生該紅外光產生器的補償資訊； 將該補償資訊儲存至一記憶裝置中；以及 在該光軸鍵盤進行正常運作時，依據該補償資訊增強該紅外光強度。A method for performing light attenuation compensation on an optical axis keyboard, wherein the optical axis keyboard includes a plurality of key units, any one of the plurality of key units includes an infrared light generator and a detection element, and the method The method includes: after the optical axis keyboard is powered on, generating a voltage value according to the infrared light intensity generated by the infrared light generator through the detection element; generating compensation information of the infrared light generator according to the voltage value; The information is stored in a memory device; and when the optical axis keyboard is in normal operation, the infrared light intensity is enhanced according to the compensation information. 如申請專利範圍第4項所述之方法，其中該補償資訊包含： 一補償強度段數，表示該紅外光強度的增強量； 一異常標幟，其中在一補償運作中，該異常標幟為真（true）表示該補償運作為異常，而該異常標幟為假（false）則表示該補償運作為正常； 一重新補償次數，表示該補償運作為異常的連續次數；以及 一初始電壓值，表示在未按下該按鍵單元時該偵測元件所產生之電壓位準。The method as described in item 4 of the patent application scope, wherein the compensation information includes: a compensation intensity segment number, which represents the amount of enhancement of the infrared light intensity; an abnormal flag, wherein in a compensation operation, the abnormal flag is True (true) indicates that the compensation operation is abnormal, and the abnormal flag is false (false) indicates that the compensation operation is normal; a re-compensation number indicates that the compensation operation is an abnormal number of consecutive times; and an initial voltage value, Indicates the voltage level generated by the detection element when the key unit is not pressed. 如申請專利範圍第5項所述之方法，其中依據該電壓值產生該紅外光產生器的補償資訊之步驟包含： 當該電壓值大於該初始電壓值，依據該電壓值與該初始電壓值之間的差距調整該補償強度段數。The method as described in item 5 of the patent application scope, wherein the step of generating the compensation information of the infrared light generator according to the voltage value includes: when the voltage value is greater than the initial voltage value, according to the voltage value and the initial voltage value The gap between them adjusts the number of compensation intensity segments. 如申請專利範圍第6項所述之方法，其中依據該電壓值與該初始電壓值之間的差距調整該補償強度段數之步驟包含： 當該電壓值與該初始電壓值之間的差距所對應的調整量小於一預定調整段數時，依據該調整量調整該補償強度段數。The method as described in item 6 of the patent application scope, wherein the step of adjusting the number of compensation intensity segments according to the difference between the voltage value and the initial voltage value includes: when the difference between the voltage value and the initial voltage value When the corresponding adjustment amount is less than a predetermined adjustment segment number, the compensation intensity segment number is adjusted according to the adjustment amount. 如申請專利範圍第6項所述之方法，其中依據該電壓值與該初始電壓值之間的差距調整該補償強度段數之步驟包含： 當該電壓值與該初始電壓值之間的差距所對應的調整量大於一預定調整段數時，依據該重新補償次數判斷是否以該調整量調整該補償強度段數。The method as described in item 6 of the patent application scope, wherein the step of adjusting the compensation intensity segment according to the difference between the voltage value and the initial voltage value includes: when the difference between the voltage value and the initial voltage value is When the corresponding adjustment amount is greater than a predetermined adjustment segment number, it is determined whether to adjust the compensation intensity segment number by the adjustment amount according to the recompensation times. 如申請專利範圍第8項所述之方法，其中依據該重新補償次數判斷是否以該調整量調整該補償強度段數之步驟包含： 當該重新補償次數達到一預定次數時，依據該調整量調整該補償強度段數。The method as described in item 8 of the patent application scope, wherein the step of judging whether to adjust the number of compensation intensity segments with the adjustment amount according to the recompensation number includes: when the recompensation number reaches a predetermined number, adjust according to the adjustment amount The number of compensation intensity segments. 如申請專利範圍第8項所述之方法，其中依據該重新補償次數判斷是否以該調整量調整該補償強度段數之步驟包含： 當該重新補償次數未達到該預定次數時，依據該預定調整段數調整該補償強度段數。The method as described in item 8 of the patent application scope, wherein the step of judging whether to adjust the number of compensation intensity segments with the adjustment amount according to the number of recompensations includes: when the number of recompensations does not reach the predetermined number of times, according to the predetermined adjustment Segment number adjusts the compensation intensity segment number.
TW107141646A 2018-11-22 2018-11-22 Method for performing lumen depreciation compensation on optical mechanical keyboard TWI707540B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW107141646A TWI707540B (en) 2018-11-22 2018-11-22 Method for performing lumen depreciation compensation on optical mechanical keyboard

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW107141646A TWI707540B (en) 2018-11-22 2018-11-22 Method for performing lumen depreciation compensation on optical mechanical keyboard

Publications (2)

Publication Number Publication Date
TW202021275A true TW202021275A (en) 2020-06-01
TWI707540B TWI707540B (en) 2020-10-11

Family

ID=72175759

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107141646A TWI707540B (en) 2018-11-22 2018-11-22 Method for performing lumen depreciation compensation on optical mechanical keyboard

Country Status (1)

Country Link
TW (1) TWI707540B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114356140A (en) * 2021-12-31 2022-04-15 上海永亚智能科技有限公司 Key action identification method of infrared induction suspension key

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI807385B (en) * 2021-08-10 2023-07-01 達方電子股份有限公司 Keyboard detection method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4128744C1 (en) * 1991-08-29 1993-04-22 Siemens Ag, 8000 Muenchen, De
TWI442286B (en) * 2010-02-01 2014-06-21 Acer Inc Touch control input method and apparatus thereof
TW201222328A (en) * 2010-11-24 2012-06-01 Inventec Corp Optical keyboard
TWI497041B (en) * 2013-02-18 2015-08-21 Eminent Electronic Technology Corp Ltd Optical sensor apparatus and image sensor apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114356140A (en) * 2021-12-31 2022-04-15 上海永亚智能科技有限公司 Key action identification method of infrared induction suspension key
CN114356140B (en) * 2021-12-31 2024-02-13 上海永亚智能科技有限公司 Key action recognition method of infrared induction suspension key

Also Published As

Publication number Publication date
TWI707540B (en) 2020-10-11

Similar Documents

Publication Publication Date Title
US10728970B2 (en) Driving circuit apparatus for automatically detecting optimized driving voltage of light string
US9699861B2 (en) Light emitting apparatus and method for controlling the same
US8723427B2 (en) Systems and methods for LED control using on-board intelligence
JP4773376B2 (en) LED driving device having temperature compensation function
US9024535B2 (en) Stabilized light source having luminance feedback control
US20120007521A1 (en) Illuminating device and controlling method thereof
US20080238340A1 (en) Method and apparatus for setting operating current of light emitting semiconductor element
TW202021275A (en) Method for performing lumen depreciation compensation on optical mechanical keyboard
JP2012521640A (en) Lighting control method having light output start-up function
US20170061898A1 (en) Display apparatus and irradiation light controlling method
WO2015133528A1 (en) Light source device, endoscope device, and light source control method
WO2020217355A1 (en) Deterioration diagnosis device and deterioration diagnosis method of optical transceiver
US7081720B2 (en) Driver circuit and method for driving electroluminescent lamp to emit light at brightness set level
JP2006080677A (en) Optical data link
US10510288B2 (en) Dot correction method and system for LED display device
JP2018060806A (en) Light emitting device and light receiving/emitting device
US20210092815A1 (en) Led luminance control circuit, led luminance control method, and led luminance control program
JP2007164160A (en) Systems for controlling brightness of displayed image
US20190246479A1 (en) Overdrive Dimming
CN109672436B (en) Method for compensating light attenuation of optical axis keyboard
US7825611B2 (en) Illumination adjusting device, illumination system using the same and illumination adjusting method
JP2017207412A (en) Light source device and video display device
JP6411076B2 (en) LED lighting device
TWI776603B (en) Automatic dehumidification control device
KR102025669B1 (en) Operating device and method for organic light emitting device