TW202021275A - Method for performing lumen depreciation compensation on optical mechanical keyboard - Google Patents
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Abstract
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本發明係關於光軸鍵盤(或稱光機(optical mechanical)鍵盤,諸如具有透過光感應制動的按鍵之鍵盤),尤指一種對光軸鍵盤進行光衰補償的方法。The present invention relates to an optical axis keyboard (or optical mechanical keyboard, such as a keyboard with keys that are braked through light induction), and particularly to a method of performing optical attenuation compensation on the optical axis keyboard.
由於光軸鍵盤係利用紅外光產生器所產生之紅外光以及相對應的感測裝置來運作,因此光軸鍵盤的壽命會受到其內的紅外光產生器影響。例如:紅外光產生器因自身特性而有光衰壽命的問題,當所產生的紅外光的強度隨著累計使用時間的增加而減弱,可能造成光軸鍵盤進行掃描時判斷失效。因此,需要一種新穎的方法,來解決光軸鍵盤因光衰壽命所產生的問題。Since the optical axis keyboard uses the infrared light generated by the infrared light generator and the corresponding sensing device to operate, the life of the optical axis keyboard is affected by the infrared light generator therein. For example, the infrared light generator has the problem of light decay life due to its own characteristics. When the intensity of the generated infrared light decreases with the increase of the cumulative use time, it may cause the optical axis keyboard to fail to judge when scanning. Therefore, a novel method is needed to solve the problems caused by the light decay life of the optical axis keyboard.
本發明之一目的在於提供一種對一光軸鍵盤進行光衰補償的方法,以在沒有副作用或較不可能帶來副作用的狀況下,解決上述問題。An object of the present invention is to provide a method for compensating the light attenuation of an optical axis keyboard, so as to solve the above-mentioned problems without side effects or when side effects are less likely to occur.
本發明之另一目的在於提供一種對一光軸鍵盤進行光衰補償的方法,以偵測光衰的程度並進行相對應的補償。Another object of the present invention is to provide a method for performing light attenuation compensation on an optical axis keyboard to detect the degree of light attenuation and perform corresponding compensation.
本發明至少一實施例提供一種對一光軸鍵盤進行光衰補償的方法,其中該光軸鍵盤包含複數個按鍵單元,該複數個按鍵單元中之任一按鍵單元包含一紅外光產生器,且該方法包含:讀取一記憶裝置以取得該光軸鍵盤的使用時間資訊,其中該使用時間資訊指出該紅外光產生器的累計使用時間;基於一光衰時間對照表,依據該使用時間資訊取得該光軸鍵盤之光衰資訊,其中該光衰時間對照表指出該紅外線產生器隨累計使用時間的紅外光強度變化;以及依據該光衰資訊,控制該紅外光產生器之紅外光強度。At least one embodiment of the present invention provides a light attenuation compensation method for an optical axis keyboard, wherein the optical axis keyboard includes a plurality of key units, and any key unit of the plurality of key units includes an infrared light generator, and The method includes: reading a memory device to obtain the usage time information of the optical axis keyboard, wherein the usage time information indicates the cumulative usage time of the infrared light generator; based on a light decay time comparison table, obtained based on the usage time information The light decay information of the optical axis keyboard, wherein the light decay time comparison table indicates that the infrared light intensity of the infrared generator changes with the cumulative use time; and according to the light decay information, the infrared light intensity of the infrared light generator is controlled.
本發明至少一實施例提供一種對一光軸鍵盤進行光衰補償的方法,其中該光軸鍵盤包含複數個按鍵單元,該複數個按鍵單元中之任一按鍵單元包含一紅外光產生器以及一偵測元件,且該方法包含:在該光軸鍵盤上電後,透過該偵測元件依據該紅外光產生器所產生之紅外光強度產生一電壓值;依據該電壓值產生該紅外光產生器的補償資訊;將該補償資訊儲存至一記憶裝置中;以及在該光軸鍵盤進行正常運作時,依據該補償資訊增強該紅外光強度。At least one embodiment of the present invention provides a light attenuation compensation method for an optical axis keyboard, wherein the optical axis keyboard includes a plurality of key units, and any key unit of the plurality of key units includes an infrared light generator and a A detection element, and the method includes: after the optical axis keyboard is powered on, generating a voltage value according to the intensity of infrared light generated by the infrared light generator through the detection element; generating the infrared light generator according to the voltage value Compensation information; store the compensation information in a memory device; and enhance the infrared light intensity according to the compensation information during normal operation of the optical axis keyboard.
本發明的好處之一在於,本發明能依據該光軸鍵盤中之紅外光產生器的使用狀況,例如光衰狀況,來進行相對應之強度補償,以避免該光軸鍵盤因光衰問題而失效。另外,依據本發明之實施例來進行光衰補償不會大幅增加額外成本,因此,本發明能在沒有副作用或較不可能帶來副作用的狀況下,解決相關技術的問題。One of the advantages of the present invention is that the present invention can perform corresponding intensity compensation according to the usage status of the infrared light generator in the optical axis keyboard, such as the light decay condition, to avoid the optical axis keyboard due to the problem of light decay Failure. In addition, the light attenuation compensation according to the embodiments of the present invention does not significantly increase the additional cost. Therefore, the present invention can solve the problems of the related art without side effects or less likely to bring side effects.
第1圖為依據本發明一實施例之光軸鍵盤100的示意圖,其中光軸鍵盤100可包含一按鍵陣列10、一控制器20、一記憶裝置30以及一計時器40,且按鍵陣列10可包含複數個按鍵單元諸如按鍵單元110以及對應的選擇電路諸如選擇電路120。在本實施例中,控制器20可耦接至按鍵陣列10中的按鍵單元110以及選擇電路120,且另耦接至記憶裝置30以及計時器40,其中控制器20可利用選擇電路120控制按鍵單元110輸出一輸出電壓(可稱為「PT電壓」,其中PT可表示此電壓為光電晶體的輸出電壓)至控制器20,但本發明不限於此。FIG. 1 is a schematic diagram of an
第2圖為依據本發明一實施例之複數個按鍵單元諸如按鍵單元110_1與110_2的示意圖,其中按鍵單元110_1與110_2中任一者可作為第1圖所示之按鍵單元110的例子,且按鍵單元110_1與110_2可分別耦接至光軸鍵盤100中的選擇電路120_1與120_2。按鍵單元110_1可包含一紅外光產生器諸如紅外光發光二極體(infrared Light-emitting diode, IR LED)112_1、一偵測元件諸如光電晶體(phototransistor)114_1、負載電阻116_1以及遮光板118_1,其中負載電阻116_1耦接於紅外光發光二極體112_1與選擇電路120_1之間;按鍵單元110_2可包含紅外光發光二極體112_2、光電晶體114_2、負載電阻116_2以及遮光板118_2,其中負載電阻116_2耦接於紅外光發光二極體112_2與選擇電路120_2之間;但本發明不限於此。舉例來說,光軸鍵盤100可為(30 * 6)的光軸鍵盤,即光軸鍵盤100可包含180個與按鍵單元110_1或110_2之架構類似的按鍵單元,相關領域者於閱讀以上說明後應可了解不同按鍵單元數量的架構,在此不贅述。FIG. 2 is a schematic diagram of a plurality of key units such as key units 110_1 and 110_2 according to an embodiment of the present invention, wherein any one of the key units 110_1 and 110_2 can be used as an example of the
在本實施例中,由於按鍵單元110_1未被按下,其內的遮光板118_1不會被設置於紅外光發光二極體112_1與光電晶體114_1之間,而由於按鍵單元110_2被按下,其內的遮光板118_2會被設置於紅外光發光二極體112_2與光電晶體114_2之間,如此一來,當光軸鍵盤100依序對按鍵單元110_1與110_2進行掃描時可依據輸出至輸出端子PT_OUT的電壓位準判斷對應的按鍵單元是否有被按下,其中輸出端子PT_OUT可耦接至第1圖所示之控制器20。例如,當光軸鍵盤開啟選擇電路120_1時,紅外光發光二極體112_1可產生紅外光,而光電晶體114_1可接收到112_1所產生的紅外光而導通,使得耦接至輸出端子PT_OUT的輸出端子PT1從一第一電壓位準(例如一高位準)被拉至一第二電壓位準(例如一低位準);當光軸鍵盤開啟選擇電路120_2時,紅外光發光二極體112_2可產生紅外光,而光電晶體114_2因遮光板118_2無法接收到112_2所產生的紅外光,使得耦接至輸出端子PT_OUT的輸出端子PT2維持在該第一電壓位準。換句話說,當輸出端子PT_OUT的電壓位準為該第一電壓位準,則表示對應的按鍵單元(例如按鍵單元110_2)有被按下,相對地,當輸出端子PT_OUT的電壓位準為該第二電壓位準,則表示對應的按鍵單元(例如按鍵單元110_1)未被按下。熟習此技藝者應可了解與光軸鍵盤100之運作相關的實施細節,為簡明起見,在此不贅述。In this embodiment, since the key unit 110_1 is not pressed, the light shield 118_1 therein will not be disposed between the infrared light emitting diode 112_1 and the photoelectric crystal 114_1, and because the key unit 110_2 is pressed, its The inner light-shielding plate 118_2 will be disposed between the infrared light emitting diode 112_2 and the photoelectric crystal 114_2, so that when the
第3圖為依據本發明一實施例之光衰時間對照表300(例如:發光二極體製造商所提供的光衰時間對照表),其中光衰時間對照表300可指出紅外光發光二極體112_1與112_2隨累計使用時間的紅外光強度變化。如第3圖所示,紅外光發光二極體的紅外光強度會隨著時間逐漸衰減。為了避免按鍵單元110_1與110_2因其內的紅外光發光二極體112_1與112_2的光衰問題而失效,控制器20可依據光衰時間對照表300來控制紅外光發光二極體112_1與112_2的紅外光強度。FIG. 3 is a light decay time comparison table 300 according to an embodiment of the present invention (for example: a light decay time comparison table provided by a light-emitting diode manufacturer), wherein the light decay time comparison table 300 may indicate an infrared light-emitting diode The infrared light intensity of the body 112_1 and 112_2 varies with the cumulative use time. As shown in Figure 3, the infrared light intensity of the infrared light-emitting diode will gradually decrease with time. In order to avoid the failure of the key units 110_1 and 110_2 due to the light decay problem of the infrared light emitting diodes 112_1 and 112_2 therein, the
第4圖為依據本發明一實施例之對光軸鍵盤100進行光衰補償的工作流程400。本發明所提出的方法可依據光軸鍵盤100中的紅外光發光二極體112_1與112_2的累計使用時間,來調整供應給紅外光發光二極體112_1與112_2的電流大小,以補償紅外光發光二極體112_1與112_2的紅外光強度。FIG. 4 is a
在步驟410中,光軸鍵盤100上電。In
在步驟420中,光軸鍵盤100中之控制器20可讀取一記憶裝置諸如記憶裝置30(例如一快閃記憶體(flash memory))以取得光軸鍵盤100的使用時間資訊,其中該使用時間資訊指出該紅外光產生器的累計使用時間(例如:20000小時)。In
在步驟430中,基於一光衰時間對照表諸如第3圖所示之光衰時間對照表300,控制器20可依據該使用時間資訊取得光軸鍵盤100之光衰資訊(例如:相對功率為60%)。In
在步驟440中,控制器20可依據該光衰資訊來控制紅外光發光二極體112_1與112_2的紅外光強度,例如:將電流調整為1.67倍,如此一來,雖然紅外光發光二極體112_1與112_2的累計使用時間不停增加,其紅外光強度能維持一致而不會衰減。其中上述控制紅外光強度的機制並非對本發明之限制,例如,選擇電路120_1與120_2中每一者可包含一切換式電流源,以供應不同的電流大小;又例如,負載電阻116_1與116_2中每一者可包含一可變電阻,來調整紅外光發光二極體112_1與112_2的紅外光強度。熟習此技藝者應可了解各種針對紅外光強度的調整方法,在此不贅述。In
在步驟450中,控制器20可啟動光軸鍵盤100中的一計時器(諸如計時器40),以使得計時器40開始進行計時,也就是說,在光軸鍵盤100操作的期間,計時器40可產生該使用時間資訊以記錄該累計使用時間。In
在步驟460中,光軸鍵盤100可進入正常的操作模式,例如:進行按鍵掃描取得按鍵指令。另外,在光軸鍵100操作的期間,控制器20可依據一特定時間週期來持續地更新儲存於記憶裝置30的該使用時間資訊,以供光軸鍵盤100下一次上電後能取得更新後的使用時間資訊。例如,控制器20每經過該特定時間週期(例如24分鐘)就從計時器40取得累計使用時間,以更新儲存於記憶裝置30的該使用時間資訊所記錄的累計使用時間。In
在某些實施例中,控制器20可依據一特定時間週期諸如上述特定時間週期來動態地控制紅外光發光二極體112_1與112_2的紅外光強度,例如:每經過該特定時間週期(例如24分鐘),就讀取一次記憶裝置30以取得光軸鍵盤100的該使用時間資訊,尤指最新的使用時間資訊,並依據該最近的使用時間資訊來控制紅外光發光二極體112_1與112_2的紅外光強度,但本發明不限於此。In some embodiments, the
第5圖為依據本發明一實施例之光軸鍵盤500的示意圖,其中光軸鍵盤500可當作光軸鍵盤100的一個例子。如第5圖所示,控制器50可透過一電壓偵測電路52(例如:類比數位轉換電路)用來接收或偵測按鍵單元110所產生的一輸出電壓(諸如上述PT電壓),以供控制器50依據該輸出電壓值控制按鍵單元110中的紅外光產生器的紅外光強度(紅外光強度的增強量可稱為「IR補償段數」,其中IR表示紅外光)。 表1
表1為偵測到的PT電壓與對應的IR補償段數的對照表的例子,例如,當按鍵單元110所產生的PT電壓為0.2 V,其代表按鍵單元110中的紅外光產生器的紅外光強度大於或等於一特定強度,無須進行補償;又例如,當按鍵單元110所產生的PT電壓為0.5 V,其代表按鍵單元110中的紅外光產生器的紅外光強度所需的IR補償段數為3。Table 1 is an example of a comparison table between the detected PT voltage and the corresponding IR compensation segment number. For example, when the PT voltage generated by the
在本實施例中,光軸鍵盤500上電後,控制器50(尤指其內的電壓偵測電路52)可接收到透過一偵測元件諸如按鍵單元110中的光電晶體(例如第2圖所示之光電晶體114_1或114_2)所產生的PT電壓,其中該PT電壓係依據按鍵單元110中的紅外光產生器(例如第2圖所示之紅外光發光二極體112_1或112_2)的紅外光強度所產生的一電壓值諸如,例如,在該紅外光強度尚未衰減,即其強度大於一預定強度,該電壓值可低於一預定電壓值(例如0.26 V);又例如,該紅外光強度隨著時間衰減而低於該預定強度,該電壓值可高於該預定電壓值(例如0.26 V);但本發明不限於此。控制器50可依據該PT電壓產生按鍵單元110中的紅外光產生器的補償資訊,其中該補償資訊可包含一補償強度段數IR_COMP、一異常標幟COMP_WARNING、一重新補償次數IR_RECOMP以及一初始電壓值PT_INIT。在本實施例中,補償強度段數IR_COMP可表示紅外光強度的增強量(即段數),而初始電壓值PT_INIT可表示在未按下按鍵單元110時其內的光電晶體(例如第2圖所示之光電晶體114_1或114_2)所產生的PT電壓。在一補償運作中,異常標幟COMP_WARNING為真(true)可表示該補償運作為異常(例如:在按鍵單元110被按下時進行掃描,使得控制器50將此結果誤判為光衰所造成),而該異常標幟為假(false)則表示該補償運作為正常。另外,重新補償次數IR_RECOMP可表示該補償運作為異常的連續次數,例如:當該PT電壓所對應到的IR補償段數超過一預定調整段數(例如IR補償段數為5,而該預定調整段數為3),控制器50可先依據該預定調整段數進行補償(或者先不調整段數)並且將重新補償次數IR_RECOMP增加一次。完成一次補償運作後,控制器50可將該補償資訊儲存(或更新)至一記憶裝置(諸如記憶裝置30)中,而光軸鍵盤500即可依據該補償資訊增強按鍵單元110的紅外光強度已進行正常運作諸如鍵盤輸入操作。In this embodiment, after the
請注意,上述補償運作可分別針對光軸鍵盤500中的全部按鍵單元來進行,舉例來說,上述全部按鍵單元均可具有各自的補償資訊以分別進行補償運作,相關領域者於閱讀以上說明後應可了解將上述補償運作類推到全部按鍵單元的實施方式,在此不贅述。為簡明起見,後續實施細節均以單一按鍵單元(諸如按鍵單元110)為例來說明。Please note that the above compensation operations can be performed on all the key units in the
在某些實施例中,上述補償運作可能因為光軸鍵盤500被使用者誤按,使得控制器50接收到的PT電壓異常地高於初始電壓值PT_INIT,為了避免控制器50誤認為按鍵單元110需要以非常高的調整量(諸如表1所示之IR補償段數的段數調整量)來進行補償,控制器50需連續地接收到異常地高於初始電壓值PT_INIT的PT電壓多次才會以對應於此PT電壓的調整量進行補償。In some embodiments, the above compensation operation may be caused by the user accidentally pressing the
舉例來說,控制器50接收到的PT電壓為0.3 V,其大於按鍵單元110的初始電壓值PT_INIT(例如0.26 V),控制器50可依據該電壓值與該初始電壓值之間的差距調整該補償強度段數(例如,依據表1可判斷其對應的IR補償段數為1),由於此調整量(1段)小於一預定調整段數(例如3段),控制器50可依據此調整量調整該補償強度段數IR_COMP(例如從段數1增加為段數2)。For example, the PT voltage received by the
又例如,控制器50接收到的PT電壓為0.9 V,其大於按鍵單元110的初始電壓值PT_INIT(例如0.26 V),控制器50可依據該電壓值與該初始電壓值PT_INIT之間的差距調整補償強度段數IR_COMP(例如,依據表1可判斷其對應的IR補償段數為7),由於此調整量(7段)大於該預定調整段數(例如3段),控制器50在此次補償運作可依據該預定調整段數(3段)來調整補償強度段數IR_COMP,而不是依據此調整量(7段)來調整,或者,控制器50在此次補償運作可先不進行調整,並且將此次補償運作視為異常(例如將異常標幟COMP_WARNING設為「真」),而將重新補償次數IR_RECOMP增加一次,但本發明不限於此。For another example, the PT voltage received by the
再舉一例,依據控制器50所收到的PT電壓與該初始電壓值PT_INIT之間的差距所決定的調整量已連續多次地大於該預定調整段數,換句話說,重新補償次數IR_RECOMP已達到一預定次數(例如三次),控制器50即可將此次補償運作視為正常(並非按鍵誤按所造成)並將異常標幟COMP_WARNING設為「假(false)」,以依據此調整量調整補償強度段數IR_COMP。As another example, the amount of adjustment determined according to the difference between the PT voltage received by the
第6圖為依據本發明一實施例之對光軸鍵盤500進行光衰補償的工作流程600,需注意的是,只要不妨礙本發明的實施,一或多個步驟可於工作流程600中被修改、新增或刪除。FIG. 6 is a
在步驟610中,光軸鍵盤500上電。In
在步驟620中,控制器50可接收按鍵單元110的PT電壓,其中該PT電壓係依據按鍵單元110中之一紅外光產生器(例如第2圖所示之紅外光發光二極體112_1或112_2)之紅外光強度所產生。In
在步驟630中,控制器50可判斷該PT電壓是否大於初始電壓值PT_INIT,若是,進入步驟640;否則,進入步驟660。In
在步驟640中,控制器50可判斷該PT電壓所對應的調整量(例如表1所示之IR補償段數)是否大於一預定調整段數,若是(例如IR補償段數為5而該預定調整段數為3),進入步驟650;否則(例如IR補償段數為2而該預定調整段數為3),進入步驟670。In
在步驟650中,控制器50可判斷按鍵單元110的重新補償次數IR_RECOMP是否達到一預定次數,若是,進入步驟690;否則,進入步驟680。In
在步驟660中,由於該PT電壓值不大於初始電壓值PT_INIT,控制器50不需調整補償強度段數IR_COMP即可讓光軸鍵盤500進入正常模式進行按鍵輸入。In
在步驟670中,由於步驟640中所述之調整量不大於該預定調整段數(例如IR補償段數為2而該預定調整段數為3),控制器50可依據該調整量調整補償強度段數IR_COMP(例如:增加2段)。In
在步驟680中,由於步驟650中所述之重新補償次數IR_RECOMP不大於該預定次數,例如重新補償次數IR_RECOMP為兩次而該預定次數為三次,控制器50可將此次補償運作視為異常,並依據步驟640所述之預定補償段數來調整補償強度段數IR_COMP(例如:增加3段)。In
在步驟690中,由於重新補償次數IR_RECOM已達到步驟650所述之預定次數,控制器50可將此次補償運作視為正常,並依據步驟640所述之調整量來調整補償強度段數IR_COMP(例如:增加5段)。In
總結來說,本發明所提出的光衰補償方法能依據按鍵單元中的紅外光產生器的紅外光強度衰減狀況來進行相關的補償運作,此外,依據本發明所提供的實施例來實施不會增加許多成本,因此,本發明能在沒有副作用或較不會帶來副作用的情況下,解決光軸鍵盤因光衰而造成的按鍵失效問題。 以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。In summary, the light attenuation compensation method proposed by the present invention can perform related compensation operations according to the infrared light intensity attenuation status of the infrared light generator in the key unit. In addition, implementation according to the embodiments provided by the present invention does not Many costs are increased. Therefore, the present invention can solve the problem of key failure caused by the light attenuation of the optical axis keyboard without side effects or less side effects. The above are only the preferred embodiments of the present invention, and all changes and modifications made in accordance with the patent application scope of the present invention shall fall within the scope of the present invention.
100、500:光軸鍵盤
10:按鍵陣列
20、50:控制器
30:記憶裝置
40:計時器
52:電壓偵測電路
110、110_1、110_2:按鍵單元
120、120_1、120_2:選擇電路
112_1、112_2:紅外光發光二極體
114_1、114_2:光電晶體
116_1、116_2:負載電阻
118_1、118_2:遮光板
PT1、PT2、PT_OUT:輸出端子
300:光衰時間對照表
600、400:工作流程
410、420、430、 440、450、460、 610、620、630、640、650、 660、670、680、690:步驟
100, 500: optical axis keyboard
10:
第1圖為依據本發明一實施例之光軸鍵盤的示意圖。 第2圖為依據本發明一實施例之複數個按鍵單元的示意圖。 第3圖為依據本發明一實施例之光衰時間對照表。 第4圖為依據本發明一實施例之對光軸鍵盤進行光衰補償的工作流程。 第5圖為依據本發明一實施例之光軸鍵盤的示意圖。 第6圖為依據本發明一實施例之對光軸鍵盤進行光衰補償的工作流程。FIG. 1 is a schematic diagram of an optical axis keyboard according to an embodiment of the invention. FIG. 2 is a schematic diagram of a plurality of key units according to an embodiment of the invention. FIG. 3 is a comparison table of light decay time according to an embodiment of the present invention. FIG. 4 is a workflow of performing optical attenuation compensation for an optical axis keyboard according to an embodiment of the invention. FIG. 5 is a schematic diagram of an optical axis keyboard according to an embodiment of the invention. FIG. 6 is a workflow of performing light attenuation compensation on an optical axis keyboard according to an embodiment of the invention.
100:光軸鍵盤 100: optical axis keyboard
10:按鍵陣列 10: Button array
20:控制器 20: Controller
30:記憶裝置 30: Memory device
40:計時器 40: Timer
110:按鍵單元 110: Button unit
120:選擇電路 120: Select circuit
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