TW201926038A - Server detection method and device thereof - Google Patents

Server detection method and device thereof Download PDF

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TW201926038A
TW201926038A TW106143289A TW106143289A TW201926038A TW 201926038 A TW201926038 A TW 201926038A TW 106143289 A TW106143289 A TW 106143289A TW 106143289 A TW106143289 A TW 106143289A TW 201926038 A TW201926038 A TW 201926038A
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test
identification code
preset
pci
transmission rate
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TW106143289A
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胡仕偉
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英業達股份有限公司
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Abstract

A server detection method and a device thereof are disclosed with following steps. Default device identification name and default transmission rate of PCI-E device are established. Reboot detection and power on cyclic detection of PCI-E device are executed to obtain detection device identification name and detection transmission rate. The default device identification name and the detection device identification name are compared. First error detection result is generated when the default device identification name and the detection device identification name are different. The default transmission rate and the detection transmission rate are compared to generate detection result when the default device identification name and the detection device identification name are the same. The problem for other defects of PCI-E device cannot be detected through existing technology can be solved by this invention.

Description

伺服器的測試方法及其裝置Server test method and device thereof

本發明涉及伺服器測試的技術領域，尤其涉及一種伺服器的測試方法及其裝置。The present invention relates to the technical field of server testing, and in particular, to a server testing method and apparatus therefor.

一般來說，在PCI-E裝置在製作完成後，會對PCI-E進行測試，以便確認PCI-E裝置是否有異常狀態。對於檢測PCI-E裝置的現行做法來說，只是單獨的用供應商提供的工具或者Linux系統自帶的工具，檢測PCI-E裝置在循環測試中是否存在，磁碟機代號及位置順序是否有改變。Generally, after the PCI-E device is manufactured, the PCI-E is tested to confirm whether the PCI-E device has an abnormal state. For the current practice of detecting PCI-E devices, it is only a separate tool provided by the vendor or a tool provided by the Linux system to detect whether the PCI-E device exists in the loop test, whether the disk drive code and the position sequence have change.

然而，僅檢測PCI-E的磁碟機代號和位置順序，這樣的檢測方式過於簡單，無法有效地檢測出PCI-E裝置是否存在其他缺陷，如此將會降低出貨品質且會造成終端使用者使用異常而降低用戶的體驗觀感。因此，對PCI-E裝置進行檢測仍有改善的空間。However, only the PCI-E disk drive code and position sequence are detected. Such a detection method is too simple to effectively detect whether the PCI-E device has other defects, which will reduce the quality of the shipment and cause the terminal user. Use abnormalities to reduce the user's experience. Therefore, there is still room for improvement in detecting PCI-E devices.

本發明的主要目的在於提供一種伺服器的測試方法及其裝置，以解決現有技術存在的無法有效地檢測出PCI-E裝置是否存在其他缺陷的問題。The main object of the present invention is to provide a server testing method and apparatus thereof, which solve the problem of the prior art that cannot effectively detect whether the PCI-E device has other defects.

為解決上述問題，本發明實施例提供一種伺服器的測試方法，包括下列步驟。建立PCI-E裝置的預設裝置識別代號和預設傳送速率。對PCI-E裝置進行重新開機測試及電力開啟（power on）循環測試，以取得測試裝置識別代號和測試傳送速率。將預設裝置識別代號與測試識別代號比對。當預設裝置識別代號與測試識別代號不相同時，產生第一錯誤檢測結果。當預設裝置識別代號與測試識別代號相同時，將預設傳送速率與測試傳送速率比對，以產生測試結果。To solve the above problem, an embodiment of the present invention provides a test method for a server, which includes the following steps. Establish a preset device identification code and a preset transfer rate of the PCI-E device. The PCI-E device is subjected to a reboot test and a power on cycle test to obtain a test device identification code and a test transfer rate. The preset device identification code is compared with the test identification code. When the preset device identification code is different from the test identification code, the first error detection result is generated. When the preset device identification code is the same as the test identification code, the preset transfer rate is compared with the test transfer rate to generate a test result.

在一實施例中，將預設傳送速率與測試傳送速率比對，以產生測試結果的步驟包括下列步驟。當預設傳送速率與測試傳送速率不相同時，產生第二錯誤檢測結果。當預設裝置識別代號與測試識別代號相同時，產生成功檢測結果。In an embodiment, the step of comparing the preset transfer rate to the test transfer rate to generate a test result comprises the following steps. When the preset transfer rate is not the same as the test transfer rate, a second error detection result is generated. When the preset device identification code is the same as the test identification code, a successful detection result is generated.

在一實施例中，所述電力開啟循環測試包括直流測試、交流測試或直流和交流測試。In an embodiment, the power-on cycle test includes a DC test, an AC test, or a DC and AC test.

在一實施例中，對所述PCI-E裝置進行重新開機測試及電力開啟循環測試還包括對PCI-E裝置進行一預設次數的重新啟動測試及電力開啟循環測試。In an embodiment, performing the reboot test and the power-on cycle test on the PCI-E device further includes performing a preset number of restart tests and power-on loop tests on the PCI-E device.

在一實施例中，所述PCI-E裝置包括SATA硬碟、SAS硬碟、顯示卡。In an embodiment, the PCI-E device includes a SATA hard disk, a SAS hard disk, and a display card.

本發明實施例還提供一種伺服器的測試裝置，包括建立單元、檢測單元與比對單元。建立單元建立PCI-E裝置的預設裝置識別代號和預設傳送速率。檢測單元耦接PCI-E裝置，對PCI-E裝置進行重新開機測試及電力開啟循環測試，以取得測試裝置識別代號和測試傳送速率。比對單元耦接建立單元與檢測單元，接收預設裝置識別代號、預設傳送速率、測試裝置識別代號和測試傳送速率，並將預設裝置識別代號與測試識別代號比對，當預設裝置識別代號與測試識別代號不相同時，產生第一錯誤檢測結果，以及當預設裝置識別代號與測試識別代號相同時，將預設傳送速率與測試傳送速率比對，以產生測試結果。The embodiment of the invention further provides a testing device for a server, comprising an establishing unit, a detecting unit and a comparing unit. The establishing unit establishes a preset device identification code and a preset transfer rate of the PCI-E device. The detecting unit is coupled to the PCI-E device, and performs a restart test and a power-on cycle test on the PCI-E device to obtain the test device identification code and the test transfer rate. The comparison unit is coupled to the establishing unit and the detecting unit, and receives the preset device identification code, the preset transmission rate, the test device identification code, and the test transmission rate, and compares the preset device identification code with the test identification code, when the preset device When the identification code is different from the test identification code, the first error detection result is generated, and when the preset device identification code is the same as the test identification code, the preset transmission rate is compared with the test transmission rate to generate a test result.

在一實施例中，當預設傳送速率與測試傳送速率不相同，單元產生第二錯誤檢測結果；當預設裝置識別代號與測試識別代號相同時，比對單元產生成功檢測結果。In an embodiment, when the preset transmission rate is different from the test transmission rate, the unit generates a second error detection result; when the preset device identification code is the same as the test identification code, the comparison unit generates a successful detection result.

在一實施例中，所述電力開啟循環測試包括直流測試、交流測試或直流和交流測試。In an embodiment, the power-on cycle test includes a DC test, an AC test, or a DC and AC test.

在一實施例中，所述檢測單元對PCI-E裝置進行重新開機測試及電力開啟循環測試還包括對PCI-E裝置進行一預設次數的重新啟動測試及電力開啟循環測試。In an embodiment, the detecting unit performs a reboot test and a power-on cycle test on the PCI-E device, and further includes performing a preset number of restart tests and power-on loop tests on the PCI-E device.

在一實施例中，所述PCI-E裝置包括SATA硬碟、SAS硬碟、顯示卡。In an embodiment, the PCI-E device includes a SATA hard disk, a SAS hard disk, and a display card.

根據本發明的技術方案，透過建立單元建立PCI-E裝置的預設裝置識別代號和預設傳送速率，並透過檢測單元對PCI-E裝置進行重新開機測試及電力開啟循環測試，以取得測試裝置識別代號和測試傳送速率，再透過比對單元將預設裝置識別代號與測試識別代號比對以及將預設傳送速率與測試傳送速率比對，以產生檢測結果。如此一來，使用者便可透過比對單元所產生的檢測結果，快速地得知PCI-E裝置的狀態，即PCI-E裝置本身的識別代號和傳送速率是否符合規範或是有缺陷產生，並進行相應的處理，以提高產品的出貨品質、減少人力成本的浪費並增加使用上的便利性。According to the technical solution of the present invention, the preset device identification code and the preset transmission rate of the PCI-E device are established through the establishing unit, and the PCI-E device is restarted and the power-on loop test is performed through the detecting unit to obtain the testing device. The identification code and the test transmission rate are compared, and the preset device identification code is compared with the test identification code through the comparison unit, and the preset transmission rate is compared with the test transmission rate to generate a detection result. In this way, the user can quickly know the status of the PCI-E device through the detection result generated by the comparison unit, that is, whether the identification code and the transmission rate of the PCI-E device itself conform to the specification or are defective. And the corresponding processing to improve the product quality of the product, reduce the waste of labor costs and increase the convenience of use.

為使本發明的目的、技術方案和優點更加清楚，以下結合附圖及具體實施例，對本發明作進一步地詳細說明。The present invention will be further described in detail below with reference to the drawings and specific embodiments.

「第1圖」是根據本發明實施例的伺服器的測試裝置的結構框圖。伺服器的測試裝置100包括建立單元110、檢測單元120與比對單元130。"FIG. 1" is a block diagram showing the structure of a test apparatus of a server according to an embodiment of the present invention. The test apparatus 100 of the server includes an establishing unit 110, a detecting unit 120, and a comparing unit 130.

建立單元110建立PCI-E裝置150的預設裝置識別代號和預設傳送速率。在本實施例中，建立單元110例如為使用者介面，使得使用者可根據PCI-E裝置150的規範，並透過建立單元110將PCI-E裝置150相關的識別代號和傳送速率輸入，以建立PCI-E裝置150的預設裝置識別代號和預設傳送速率，並做為測試的依據。其中，PCI-E裝置150例如包括SATA硬碟、SAS硬碟、顯示卡。The establishing unit 110 establishes a preset device identification code and a preset transfer rate of the PCI-E device 150. In this embodiment, the establishing unit 110 is, for example, a user interface, so that the user can input the identification code and the transmission rate associated with the PCI-E device 150 according to the specification of the PCI-E device 150 and through the establishing unit 110 to establish The preset device identification code and the preset transmission rate of the PCI-E device 150 are used as a basis for testing. The PCI-E device 150 includes, for example, a SATA hard disk, a SAS hard disk, and a display card.

檢測單元120耦接PCI-E裝置150，對PCI-E裝置150進行重新開機(reboot)測試及電力開啟（power on）循環測試，以取得測試裝置識別代號和測試傳送速率。在本實施例中，所述電力開啟循環測試包括直流測試、交流測試或直流和交流測試。也就是說，檢測單元120透過對PCI-E裝置150進行重新開機以及以直流、交流或同時以直流和交流對PCI-E進行測試，以取得PCI-E實際的裝置識別代號和傳送速率作為測試裝置識別代號和測試傳送速率，進而作為後續操作的依據。The detecting unit 120 is coupled to the PCI-E device 150, and performs a reboot test and a power on cycle test on the PCI-E device 150 to obtain the test device identification code and the test transfer rate. In this embodiment, the power-on cycle test includes a DC test, an AC test, or a DC and AC test. That is to say, the detecting unit 120 performs the test of the PCI-E device 150 by re-booting the PCI-E device 150 and testing the PCI-E by DC, AC or DC and AC at the same time to obtain the actual device identification code and transmission rate of the PCI-E. The device identification code and the test transfer rate are used as a basis for subsequent operations.

進一步來說，檢測單元120對PCI-E裝置150進行重新開機測試及電力開啟循環測試還包括對PCI-E裝置150進行一預設次數的重新啟動測試及電力開啟循環測試。舉例來說，假設預設次數為10次，則檢測單元120會對對PCI-E裝置150進行10次的重新啟動測試及電力開啟循環測試，以取得10筆的試裝置識別代號和測試傳送速率；假設預設次數為100次，則檢測單元120會對對PCI-E裝置150進行100次的重新啟動測試及電力開啟循環測試，以取得100筆的試裝置識別代號和測試傳送速率，以便進行後續比對的操作。在本實施例中，所述預設次數可依用戶視其需求自行調整。Further, the re-boot test and the power-on cycle test of the PCI-E device 150 by the detecting unit 120 further includes performing a preset number of restart tests and power-on loop tests on the PCI-E device 150. For example, if the preset number of times is 10, the detecting unit 120 performs 10 restart tests and power-on loop tests on the PCI-E device 150 to obtain 10 test device identification codes and test transfer rates. Assuming that the preset number of times is 100, the detecting unit 120 performs a 100-time restart test and a power-on cycle test on the PCI-E device 150 to obtain 100 test device identification codes and test transfer rates for performing. Subsequent comparison operations. In this embodiment, the preset number of times may be adjusted according to the user's needs.

比對單元130耦接建立單元110與檢測單元120，接收預設裝置識別代號、預設傳送速率、測試裝置識別代號和測試傳送速率。接著，比對單元130將預設裝置識別代號與測試識別代號比對，以判斷預設裝置識別代號與測試識別代號比對是否相同。The comparison unit 130 is coupled to the establishing unit 110 and the detecting unit 120, and receives the preset device identification code, the preset transmission rate, the test device identification code, and the test transmission rate. Next, the comparing unit 130 compares the preset device identification code with the test identification code to determine whether the preset device identification code and the test identification code are identical.

當判斷出預設裝置識別代號與測試識別代號不相同時，比對單元130產生第一錯誤檢測結果。當判斷出預設裝置識別代號與測試識別代號相同時，比對單元130將預設傳送速率與測試傳送速率比對，以產生測試結果，也就是判斷預設傳送速率與測試傳送速率是否相同。When it is determined that the preset device identification code is not the same as the test identification code, the comparison unit 130 generates a first error detection result. When it is determined that the preset device identification code is the same as the test identification code, the comparison unit 130 compares the preset transmission rate with the test transmission rate to generate a test result, that is, whether the preset transmission rate is the same as the test transmission rate.

進一步來說，當預設傳送速率與測試傳送速率不相同，比對單元130產生第二錯誤檢測結果。當預設裝置識別代號與測試識別代號相同時，比對單元130產生成功檢測結果。Further, when the preset transfer rate is different from the test transfer rate, the comparison unit 130 generates a second error detection result. When the preset device identification code is the same as the test identification code, the comparison unit 130 generates a successful detection result.

如此一來，使用者便可透過比對單元130所產生的檢測結果，即第一錯誤檢測結果(即測試識別代號未通過檢測)、第二錯誤檢測結果(即測試傳送速率未通過檢測)與成功檢測結果(即測試識別代號和測試傳送速率都通過檢測)，而快速地得知PCI-E裝置150的狀態，即PCI-E裝置150本身的識別代號和傳送速率是否符合規範或是有缺陷產生，並進行相應的處理，以提高產品的出貨品質、減少人力成本的浪費並增加使用上的便利性。In this way, the user can pass the detection result generated by the comparison unit 130, that is, the first error detection result (ie, the test identification code fails the detection), and the second error detection result (ie, the test transmission rate fails the detection). The result of the successful detection (ie, the test identification code and the test transmission rate are both detected), and the state of the PCI-E device 150 is quickly known, that is, whether the identification code and the transmission rate of the PCI-E device 150 itself conform to the specification or are defective. Generated and processed accordingly to improve product shipment quality, reduce labor cost waste and increase ease of use.

藉由上述實施例的說明，可以歸納出一種伺服器的測試方法。「第2圖」是根據本發明實施例的伺服器的測試方法的流程圖。Through the description of the above embodiments, a test method of a server can be summarized. "Fig. 2" is a flowchart of a test method of a server according to an embodiment of the present invention.

在步驟S202中，建立PCI-E裝置的預設裝置識別代號和預設傳送速率。在步驟S204中，對PCI-E裝置進行重新開機測試及電力開啟循環測試，以取得測試裝置識別代號和測試傳送速率。在步驟S206中，將預設裝置識別代號與測試識別代號比對。在步驟S208中，當預設裝置識別代號與測試識別代號不相同時，產生第一錯誤檢測結果。在步驟S210中，當預設裝置識別代號與測試識別代號相同時，將預設傳送速率與測試傳送速率比對，以產生測試結果。In step S202, a preset device identification code and a preset transfer rate of the PCI-E device are established. In step S204, the PCI-E device is subjected to a reboot test and a power-on cycle test to obtain a test device identification code and a test transfer rate. In step S206, the preset device identification code is compared with the test identification code. In step S208, when the preset device identification code is different from the test identification code, a first error detection result is generated. In step S210, when the preset device identification code is the same as the test identification code, the preset transfer rate is compared with the test transfer rate to generate a test result.

在本實施例中，所述電力開啟循環測試包括直流測試、交流測試或直流和交流測試。另外，對所述PCI-E裝置進行重新開機測試及電力開啟循環測試還包括對PCI-E裝置進行一預設次數的重新啟動測試及電力開啟循環測試。此外，所述PCI-E裝置包括SATA硬碟、SAS硬碟、顯示卡。In this embodiment, the power-on cycle test includes a DC test, an AC test, or a DC and AC test. In addition, performing the reboot test and the power-on loop test on the PCI-E device further includes performing a preset number of restart tests and power-on loop tests on the PCI-E device. In addition, the PCI-E device includes a SATA hard disk, a SAS hard disk, and a display card.

「第3圖」是根據本發明實施例的伺服器的測試方法的另一流程圖。在步驟S202中，建立PCI-E裝置的預設裝置識別代號和預設傳送速率。在步驟S204中，對PCI-E裝置進行重新開機測試及電力開啟循環測試，以取得測試裝置識別代號和測試傳送速率。在步驟S206中，將預設裝置識別代號與測試識別代號比對。在步驟S208中，當預設裝置識別代號與測試識別代號不相同時，產生第一錯誤檢測結果。在步驟S210中，當預設裝置識別代號與測試識別代號相同時，將預設傳送速率與測試傳送速率比對，以產生測試結果。在步驟S302中，當預設傳送速率與測試傳送速率不相同時，產生第二錯誤檢測結果。在步驟S304中，當預設裝置識別代號與測試識別代號相同時，產生成功檢測結果。"3rd picture" is another flow chart of a test method of a server according to an embodiment of the present invention. In step S202, a preset device identification code and a preset transfer rate of the PCI-E device are established. In step S204, the PCI-E device is subjected to a reboot test and a power-on cycle test to obtain a test device identification code and a test transfer rate. In step S206, the preset device identification code is compared with the test identification code. In step S208, when the preset device identification code is different from the test identification code, a first error detection result is generated. In step S210, when the preset device identification code is the same as the test identification code, the preset transfer rate is compared with the test transfer rate to generate a test result. In step S302, when the preset transfer rate is different from the test transfer rate, a second error detection result is generated. In step S304, when the preset device identification code is the same as the test identification code, a successful detection result is generated.

在本實施例中，所述電力開啟循環測試包括直流測試、交流測試或直流和交流測試。另外，對所述PCI-E裝置進行重新開機測試及電力開啟循環測試還包括對PCI-E裝置進行一預設次數的重新啟動測試及電力開啟循環測試。此外，所述PCI-E裝置包括SATA硬碟、SAS硬碟、顯示卡。In this embodiment, the power-on cycle test includes a DC test, an AC test, or a DC and AC test. In addition, performing the reboot test and the power-on loop test on the PCI-E device further includes performing a preset number of restart tests and power-on loop tests on the PCI-E device. In addition, the PCI-E device includes a SATA hard disk, a SAS hard disk, and a display card.

綜上所述，根據本發明的技術方案，透過建立單元建立PCI-E裝置的預設裝置識別代號和預設傳送速率，並透過檢測單元對PCI-E裝置進行重新開機測試及電力開啟循環測試，以取得測試裝置識別代號和測試傳送速率，再透過比對單元將預設裝置識別代號與測試識別代號比對以及將預設傳送速率與測試傳送速率比對，以產生檢測結果。如此一來，使用者便可透過比對單元所產生的檢測結果，快速地得知PCI-E裝置的狀態，即PCI-E裝置本身的識別代號和傳送速率是否符合規範或是有缺陷產生，並進行相應的處理，以提高產品的出貨品質、減少人力成本的浪費並增加使用上的便利性。In summary, according to the technical solution of the present invention, the preset device identification code and the preset transmission rate of the PCI-E device are established through the establishing unit, and the PCI-E device is restarted and the power-on cycle test is performed through the detecting unit. To obtain the test device identification code and the test transmission rate, and then compare the preset device identification code with the test identification code through the comparison unit and compare the preset transmission rate with the test transmission rate to generate the detection result. In this way, the user can quickly know the status of the PCI-E device through the detection result generated by the comparison unit, that is, whether the identification code and the transmission rate of the PCI-E device itself conform to the specification or are defective. And the corresponding processing to improve the product quality of the product, reduce the waste of labor costs and increase the convenience of use.

以上所述僅為本發明的實施例而已，並不用於限制本發明，對於本領域的技術人員來說，本發明可以有各種更改和變化。凡在本發明的精神和原則之內，所作的任何修改、等同替換、改進等，均應包含在本發明的權利要求範圍之內。The above is only the embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes can be made to the present invention. Any modifications, equivalent substitutions, improvements, etc. within the spirit and scope of the invention are intended to be included within the scope of the appended claims.

100‧‧‧測試裝置100‧‧‧Testing device

110‧‧‧建立單元110‧‧‧Building unit

120‧‧‧檢測單元120‧‧‧Detection unit

130‧‧‧比對單元130‧‧‧ comparison unit

150‧‧‧PCI-E裝置150‧‧‧PCI-E device

步驟S202‧‧‧建立PCI-E裝置的預設裝置識別代號和預設傳送速率Step S202‧‧‧ Establish the preset device identification code and preset transmission rate of the PCI-E device

步驟S204‧‧‧對PCI-E裝置進行重新開機測試及電力開啟循環測試，以取得測試裝置識別代號和測試傳送速率Step S204‧‧‧Re-boot test and power-on cycle test for PCI-E device to obtain test device identification code and test transfer rate

步驟S206‧‧‧將預設裝置識別代號與測試識別代號比對Step S206‧‧‧Compare the preset device identification code with the test identification code

步驟S208‧‧‧當預設裝置識別代號與測試識別代號不相同時，產生第一錯誤檢測結果Step S208‧‧‧ When the preset device identification code is different from the test identification code, the first error detection result is generated.

步驟S210‧‧‧當預設裝置識別代號與測試識別代號相同時，將預設傳送速率與測試傳送速率比對，以產生測試結果Step S210‧‧‧ When the preset device identification code is the same as the test identification code, the preset transfer rate is compared with the test transfer rate to generate a test result.

步驟S302‧‧‧當預設傳送速率與測試傳送速率不相同時，產生第二錯誤檢測結果Step S302‧‧‧ When the preset transfer rate is different from the test transfer rate, a second error detection result is generated.

步驟S304‧‧‧當預設裝置識別代號與測試識別代號相同時，產生成功檢測結果Step S304‧‧‧ When the preset device identification code is the same as the test identification code, a successful detection result is generated.

第1圖是根據本發明實施例的伺服器的測試裝置的結構框圖。 第2圖是根據本發明實施例的伺服器的測試方法的流程圖。 第3圖是根據本發明實施例的伺服器的測試方法的另一流程圖。1 is a block diagram showing the structure of a test apparatus of a server according to an embodiment of the present invention. 2 is a flow chart of a test method of a server according to an embodiment of the present invention. Figure 3 is another flow chart of a test method of a server in accordance with an embodiment of the present invention.

Claims (10)

一種伺服器的測試方法，其包括下列步驟： 建立PCI-E裝置的預設裝置識別代號和預設傳送速率； 對所述PCI-E裝置進行重新開機測試及電力開啟（power on）循環測試，以取得測試裝置識別代號和測試傳送速率； 將所述預設裝置識別代號與所述測試識別代號比對； 當所述預設裝置識別代號與所述測試識別代號不相同時，產生第一錯誤檢測結果； 當所述預設裝置識別代號與所述測試識別代號相同時，將所述預設傳送速率與所述測試傳送速率比對，以產生測試結果。A server testing method includes the following steps: establishing a preset device identification code and a preset transmission rate of a PCI-E device; performing a power-on test and a power on cycle test on the PCI-E device, Obtaining a test device identification code and a test transfer rate; comparing the preset device identification code with the test identification code; generating a first error when the preset device identification code is different from the test identification code a detection result; when the preset device identification code is the same as the test identification code, comparing the preset transmission rate with the test transmission rate to generate a test result. 如申請專利範圍第1項所述的伺服器的測試方法，其中將所述預設傳送速率與所述測試傳送速率比對，以產生測試結果的步驟更包括： 當所述預設傳送速率與所述測試傳送速率不相同時，產生第二錯誤檢測結果；及 當所述預設裝置識別代號與所述測試識別代號相同時，產生成功檢測結果。The test method of the server of claim 1, wherein the step of comparing the preset transfer rate with the test transfer rate to generate a test result further comprises: when the preset transfer rate is When the test transmission rate is different, a second error detection result is generated; and when the preset device identification code is the same as the test identification code, a successful detection result is generated. 如申請專利範圍第1項所述的伺服器的測試方法，其中所述電力開啟循環測試包括直流測試、交流測試或直流和交流測試。The test method of the server according to claim 1, wherein the power-on cycle test includes a DC test, an AC test, or a DC and AC test. 如申請專利範圍第1項所述的伺服器的測試方法，其中所述對所述PCI-E裝置進行重新開機測試及電力開啟循環測試還包括對PCI-E裝置進行一預設次數的重新啟動測試及電力開啟循環測試。The method for testing a server according to claim 1, wherein the re-booting test and the power-on loop test of the PCI-E device further comprise performing a preset number of restarts on the PCI-E device. Test and power turn on loop test. 如申請專利範圍第1項所述的伺服器的測試方法，其中所述PCI-E裝置包括SATA硬碟、SAS硬碟、顯示卡。The method for testing a server according to claim 1, wherein the PCI-E device comprises a SATA hard disk, a SAS hard disk, and a display card. 一種伺服器的測試裝置，其包括： 建立單元，建立PCI-E裝置的預設裝置識別代號和預設傳送速率； 檢測單元，耦接所述PCI-E裝置，對所述PCI-E裝置進行重新開機測試及電力開啟循環測試，以取得測試裝置識別代號和測試傳送速率；及 比對單元，耦接所述建立單元與所述檢測單元，接收所述預設裝置識別代號、所述預設傳送速率、所述測試裝置識別代號和所述測試傳送速率，並將所述預設裝置識別代號與所述測試識別代號比對，當所述預設裝置識別代號與所述測試識別代號不相同時，產生第一錯誤檢測結果，以及當所述預設裝置識別代號與所述測試識別代號相同時，將所述預設傳送速率與所述測試傳送速率比對，以產生測試結果。A testing device for a server, comprising: an establishing unit, establishing a preset device identification code and a preset transmission rate of the PCI-E device; and a detecting unit coupled to the PCI-E device and performing the PCI-E device Re-starting test and power-on loop test to obtain test device identification code and test transfer rate; and comparing unit, coupling the establishing unit and the detecting unit, receiving the preset device identification code, the preset a transmission rate, the test device identification code, and the test transmission rate, and comparing the preset device identification code with the test identification code, when the preset device identification code is different from the test identification code And generating a first error detection result, and when the preset device identification code is the same as the test identification code, comparing the preset transmission rate with the test transmission rate to generate a test result. 如申請專利範圍第6項所述的伺服器的測試裝置，其中當所述預設傳送速率與所述測試傳送速率不相同，所述比對單元產生第二錯誤檢測結果；當所述預設裝置識別代號與所述測試識別代號相同時，所述比對單元產生成功檢測結果。The test apparatus of the server of claim 6, wherein the comparison unit generates a second error detection result when the preset transmission rate is different from the test transmission rate; when the preset When the device identification code is the same as the test identification code, the comparison unit generates a successful detection result. 如申請專利範圍第6項所述的伺服器的測試裝置，其中所述電力開啟循環測試包括直流測試、交流測試或直流和交流測試。The test device of the server of claim 6, wherein the power-on cycle test comprises a DC test, an AC test, or a DC and AC test. 如申請專利範圍第6項所述的伺服器的測試裝置，其中所述檢測單元對所述PCI-E裝置進行重新開機測試及電力開啟循環測試還包括對PCI-E裝置進行一預設次數的重新啟動測試及電力開啟循環測試。The test device of the server of claim 6, wherein the detecting unit performs a reboot test and a power-on cycle test on the PCI-E device, and further includes performing a preset number of times on the PCI-E device. Restart the test and power cycle test. 如申請專利範圍第6項所述的伺服器的測試裝置，其中所述PCI-E裝置包括SATA硬碟、SAS硬碟、顯示卡。The test device of the server of claim 6, wherein the PCI-E device comprises a SATA hard disk, a SAS hard disk, and a display card.
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI807887B (en) * 2022-06-14 2023-07-01 新加坡商鴻運科股份有限公司 Drive letter calibration method, system, electronic equipment and storage medium

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