TW201918714A - Thimble fixture with power-supply protective device - Google Patents
Thimble fixture with power-supply protective device Download PDFInfo
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- TW201918714A TW201918714A TW106139085A TW106139085A TW201918714A TW 201918714 A TW201918714 A TW 201918714A TW 106139085 A TW106139085 A TW 106139085A TW 106139085 A TW106139085 A TW 106139085A TW 201918714 A TW201918714 A TW 201918714A
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Abstract
Description
本發明係涉及一種使電路板等電子產品進行通電測試的頂針治具。The present invention relates to a thimble jig for conducting an electrical test of an electronic product such as a circuit board.
現有技術的待測電子產品(例如電路板)進行檢測時，往往係透過頂針治具來進行，而頂針治具通常包含載板、彈簧、壓板、頂針及電源等裝置；In the prior art, the electronic product to be tested (for example, a circuit board) is often detected by a thimble jig, and the thimble jig usually includes a carrier, a spring, a pressure plate, a thimble, and a power source;
前述治具使用時，首先將待測電子產品放置於載板頂面，並使待測產品底面的供電點對準頂針；接著透過壓板向下推動待測產品及載板，直到待測產品底面的供電點接觸到頂針的頂端，而電源透過頂針對待測產品供電以進行檢測；When the jig is used, the electronic product to be tested is first placed on the top surface of the carrier, and the feeding point of the bottom surface of the product to be tested is aligned with the thimble; then the product to be tested and the carrier are pushed down through the pressing plate until the bottom of the product to be tested The power supply point contacts the top end of the thimble, and the power supply through the top is powered by the product to be tested for detection;
檢測結束後，操作者向上提起壓板，而彈簧同時向上推動載板以將待測產品向上推離頂針，最後將待測產品取出即可。After the test is finished, the operator lifts the pressure plate upward, and the spring simultaneously pushes up the carrier plate to push the product to be tested upward from the thimble, and finally the product to be tested is taken out.
然而，檢測結束後電源仍持續對頂針供電，因此操作者此時將壓板上提，可能不慎碰觸到頂針或待測產品，則會有觸電的危險；尤其頂針可能會承載高電壓(可能高達220V)，因此觸電的風險更是不可輕視。故，現有技術的頂針治具無法有效降低觸電之可能，因此實有待加以改良。However, after the test is finished, the power supply continues to supply power to the thimble, so the operator will lift the plate at this time, and may accidentally touch the thimble or the product to be tested, which may cause electric shock; especially the thimble may carry high voltage (possibly Up to 220V), so the risk of electric shock is not to be underestimated. Therefore, the prior art thimble jig cannot effectively reduce the possibility of electric shock, so it needs to be improved.
有鑑於前述之現有技術的缺點及不足，本發明提供一種具供電保護裝置的檢測治具，其可有效降低觸電之風險。In view of the above disadvantages and deficiencies of the prior art, the present invention provides a detection fixture with a power protection device, which can effectively reduce the risk of electric shock.
為達到上述的創作目的，本發明所採用的技術手段為設計一種具供電保護裝置的檢測治具，其用以檢測一待測產品，該待測產品具有兩供電點，該具供電保護裝置的檢測治具包含一底板、一載板、至少一彈性元件、一第一頂針組、一導電片、一第二頂針組及一電源；該載板位於該底板的上方，該載板的頂面用以承載該待測產品；該至少一彈性元件設於該底板及該載板之間，且向上推抵該載板；該第一頂針組向上穿設於該載板中，該第一頂針組包含兩第一頂針，該兩第一頂針向上接觸被該載板帶動的該待測產品的該兩供電點；該導電片設於該載板上；該第二頂針組位於該導電片的下方，該第二頂針組包含兩第二頂針，該兩第二頂針向上接觸被該載板帶動的該導電片；該電源電連接其中一該第一頂針及其中一該第二頂針，另一該第一頂針與另一該第二頂針彼此電連接。In order to achieve the above-mentioned creative purpose, the technical means adopted by the present invention is to design a detecting fixture with a power supply protection device for detecting a product to be tested, the product to be tested having two power supply points, and the power supply protection device The detecting fixture comprises a bottom plate, a carrier plate, at least one elastic component, a first thimble set, a conductive piece, a second thimble set and a power source; the carrier plate is located above the bottom plate, and the top surface of the carrier plate The at least one elastic component is disposed between the bottom plate and the carrier plate and is pushed up against the carrier plate; the first ejector pin group is disposed upwardly in the carrier plate, the first ejector pin The set includes two first thimbles, the two thimbles are in upward contact with the two feeding points of the product to be tested driven by the carrier; the conductive sheet is disposed on the carrier; the second thimble is located on the conductive sheet Below, the second thimble set includes two second thimbles, the two thimbles are in upward contact with the conductive sheet driven by the carrier; the power source electrically connects one of the first thimbles and one of the second thimbles, and the other The first thimble and the other second Pin electrically connected to each other.
本發明之優點在於，當載板向下移動直到待測產品的供電點接觸到兩第一頂針時，載板下降的距離也恰使導電片向下接觸該兩第二頂針，因此電源、其中一第一頂針、待測產品、另一第一頂針、其中一第二頂針、導電片及另一第二頂針之間形成一迴路，藉以讓電源對待測產品供電以進行檢測；而由於前述迴路需要經過導電片及第二頂針組才能成立及通電，因此縱使在電源開啟的情形下，只要一讓載板上升(例如將壓板向上提)，導電片便會立刻與第二頂針組分離，如此便可達到斷電的效果；藉此在將壓板上提的過程中，縱使誤觸第一頂針組或待測產品也不會產生觸電之危險；本發明藉此達到有效降低觸電風險的發明目的。The invention has the advantages that when the carrier board moves downward until the feeding point of the product to be tested contacts the two first thimbles, the distance that the carrier board descends is such that the conductive sheet contacts the two second thimbles downwardly, thus the power source, a first thimble, a product to be tested, another first thimble, one of the second thimbles, the conductive sheet and the other second thimble form a loop between the power supply to be tested for power supply for detection; It is necessary to pass through the conductive sheet and the second thimble group to establish and energize, so that even if the power supply is turned on, as long as the carrier is raised (for example, the pressure plate is lifted up), the conductive sheet is immediately separated from the second ejector pin. The power-off effect can be achieved; thereby, in the process of lifting the pressure plate, even if the first thimble set or the product to be tested is accidentally touched, there is no danger of electric shock; the invention achieves the purpose of effectively reducing the risk of electric shock. .
進一步而言，所述之具供電保護裝置的檢測治具，其中該至少一彈性元件向上推抵該載板以使該載板的該頂面高於該第一頂針組的頂端。Further, the detecting fixture of the power protection device, wherein the at least one elastic component pushes up against the carrier such that the top surface of the carrier is higher than the top end of the first thimble.
進一步而言，所述之具供電保護裝置的檢測治具，其中該導電片設置在該載板的底面，該第二頂針組位於該載板的下方。Further, the detecting fixture of the power protection device, wherein the conductive sheet is disposed on a bottom surface of the carrier, and the second thimble group is located below the carrier.
進一步而言，所述之具供電保護裝置的檢測治具，其中該第一頂針組及該第二頂針組均貫穿該底板。Further, the detecting fixture of the power protection device, wherein the first thimble set and the second thimble set penetrate the bottom plate.
進一步而言，所述之具供電保護裝置的檢測治具，其中進一步包含有一壓板，其可上下移動地位於該載板的上方，且可向下推抵該載板。Further, the detection fixture of the power protection device further includes a pressure plate that is vertically movable above the carrier and can be pushed down against the carrier.
進一步而言，所述之具供電保護裝置的檢測治具，其中進一步包含有一手切開關，其設於與該電源與該第一頂針組及該第二頂針組之間。Further, the detection fixture of the power protection device further includes a hand switch disposed between the power source and the first thimble set and the second thimble set.
進一步而言，所述之具供電保護裝置的檢測治具，其中該至少一彈性元件為壓縮彈簧。Further, the detecting fixture of the power protection device, wherein the at least one elastic component is a compression spring.
以下配合圖式及本發明之較佳實施例，進一步闡述本發明為達成預定創作目的所採取的技術手段。The technical means adopted by the present invention for achieving the intended purpose of creation are further explained below in conjunction with the drawings and preferred embodiments of the present invention.
請參閱圖1所示，本發明之具供電保護裝置的檢測治具包含一底板10、一載板20、至少一彈性元件30、一壓板40、一第一頂針組50、一導電片60、一第二頂針組70、一電源80及一手切開關90；本發明之壓合檢測治具用以檢測一待測產品100，待測產品100具有兩供電點101，在本實施例中，該待測產品100為電路板，但不以此為限。Referring to FIG. 1 , the detection fixture with the power protection device of the present invention comprises a bottom plate 10 , a carrier plate 20 , at least one elastic component 30 , a pressure plate 40 , a first thimble set 50 , a conductive sheet 60 , a second thimble set 70, a power supply 80, and a hand-cut switch 90; the press-fit test fixture of the present invention is used to detect a product 100 to be tested, and the product to be tested 100 has two power supply points 101. In this embodiment, the The product to be tested 100 is a circuit board, but is not limited thereto.
前述之載板20間隔地位於底板10的上方，載板20的頂面21用以承載待測產品100。The aforementioned carrier 20 is spaced above the bottom plate 10, and the top surface 21 of the carrier 20 is used to carry the product 100 to be tested.
前述之彈性元件30設於底板10及載板20之間，且向上推抵載板20；在本實施例中，彈性元件30為壓縮彈簧，且彈性元件30的數量為複數個，但不以此為限，彈性元件30亦可為其他種類，也可以只有一個，僅要能向上推抵載板20即可。The elastic member 30 is disposed between the bottom plate 10 and the carrier 20 and pushes up against the carrier 20; in the embodiment, the elastic member 30 is a compression spring, and the number of the elastic members 30 is plural, but not For this reason, the elastic member 30 may be of other types or only one, and only needs to be pushed up against the carrier 20 .
前述之壓板40可上下移動地位於載板20的上方，且可向下推抵載板20，但本發明亦可沒有壓板40，而可透過其他方式來向下移動載板20。The pressure plate 40 can be moved up and down above the carrier 20 and can be pushed down against the carrier 20. However, the present invention can also be used without the pressure plate 40, and the carrier 20 can be moved downward by other means.
前述之第一頂針組50向上穿設於載板20中，第一頂針組50包含有兩第一頂針51、52，該兩第一頂針51、52選擇性地向上接觸被載板20帶動的待測產品100的兩供電點101；在本實施例中，第一頂針組50貫穿底板10，藉由使第一頂針組50同時貫穿底板10及載板20，以可穩固設置第一頂針組50；The first thimble set 50 is disposed upwardly in the carrier 20, and the first thimble set 50 includes two first thimbles 51, 52. The two first thimbles 51, 52 are selectively in upwardly contacted by the carrier 20 The two ejector points 101 of the product to be tested 100; in this embodiment, the first ejector pin group 50 penetrates the bottom plate 10, and the first ejector pin group 50 is simultaneously inserted through the bottom plate 10 and the carrier plate 20 to stably set the first ejector pin group. 50;
在本實施例中，載板20在沒有外力下壓的情形下，彈性元件30向上推抵載板20以使載板20的頂面21高於兩第一頂針51、52的頂端，但不以此為限，倘若待測產品100的兩供電點101係凹設成形於待測產品100的底面，即兩供電點101的位置高於待測產品100的底面，則本發明也可配合地改成，載板20在沒有外力下壓的情形下，兩第一頂針51、52的頂端高於載板20的頂面21，僅要在載板20在沒有外力下壓的情形下，兩第一頂針51、52的頂端不會接觸到待測產品100的供電點101即可。In the present embodiment, in the case where the carrier 20 is pressed without external force, the elastic member 30 is pushed up against the carrier 20 so that the top surface 21 of the carrier 20 is higher than the top ends of the two first ejector pins 51, 52, but not To this end, if the two power supply points 101 of the product to be tested 100 are recessed and formed on the bottom surface of the product to be tested 100, that is, the positions of the two power supply points 101 are higher than the bottom surface of the product 100 to be tested, the present invention can also cooperate with the ground. In the case where the carrier 20 is pressed without external force, the top ends of the two first ejector pins 51, 52 are higher than the top surface 21 of the carrier 20, only in the case where the carrier 20 is pressed without external force, The top ends of the first ejector pins 51, 52 do not come into contact with the power supply point 101 of the product 100 to be tested.
前述之導電片60設於載板20上。The aforementioned conductive sheet 60 is provided on the carrier 20 .
前述之第二頂針組70位於導電片60的下方，第二頂針組70包含兩第二頂針71、72，該兩第二頂針71、72選擇性地向上接觸被載板20帶動的導電片60；在本實施例中，導電片60設置在載板20的底面，第二頂針組70位於載板20的下方，且貫穿底板10，但不以此為限，導電片60亦可設置在載板20的橫向一側等其他位置，而第二頂針組70連帶調整位置即可，僅要載板20向下移動時，載板20可帶動導電片60向下接觸兩第二頂針71、72的頂端即可。The second thimble set 70 is located below the conductive sheet 60, and the second thimble set 70 includes two second thimbles 71, 72 that selectively contact the conductive sheet 60 that is driven by the carrier 20 In this embodiment, the conductive sheet 60 is disposed on the bottom surface of the carrier 20, and the second thimble set 70 is located below the carrier 20 and penetrates the bottom plate 10, but not limited thereto, the conductive sheet 60 may also be disposed on the bottom plate 10 The second thimble set 70 can be adjusted to another position, and the second thimble set 70 can be adjusted with the adjustment position. When the carrier 20 is moved downward, the carrier 20 can drive the conductive sheet 60 downward to contact the two second ejector pins 71, 72. The top of it can be.
前述之電源80電連接其中一第一頂針51(在本實施例中為地線或負極)及其中一第二頂針71(在本實施例中為火線或正極)，另一第一頂針52與另一第二頂針72彼此電連接。The foregoing power source 80 is electrically connected to one of the first thimbles 51 (in this embodiment, the ground or the negative pole) and one of the second ejector pins 71 (in this embodiment, the live wire or the positive pole), and the other first ejector pin 52 The other second ejector pins 72 are electrically connected to each other.
前述之手切開關90設於電源80與第一頂針組50(在本實施例中為第一頂針51)之間，同時也設於電源80與第二頂針組70(在本實施例中為第二頂針72)之間；該手切開關90可用以開啟及阻斷電源80對第一頂針組50及第二頂針組70的供電，但本發明亦可沒有手切開關90，而直接透過下列形成斷路的方式來斷電即可。The hand switch 90 is disposed between the power source 80 and the first thimble set 50 (in the present embodiment, the first ejector pin 51), and is also disposed on the power source 80 and the second thimble set 70 (in this embodiment, The second ejector pin 72) can be used to open and block the power supply of the first thimble set 50 and the second thimble set 70 by the power source 80. However, the present invention can also directly pass through the hand-cut switch 90 without directly The following ways to form an open circuit can be used to cut off the power.
本發明使用時，首先待測產品100放置於載板20頂面21，請參閱圖2所示，接著載板20受到一外力而向下移動，該外力在本實施例中為壓板40所提供，壓板40向下推抵待測產品100以間接向下推抵載板20，但不以此為限，亦可透過壓板40以外的其他方式下壓，亦可不透過待測產品100而直接向下移動載板20，此時放置於載板20上的待測產品100也自然跟著向下移動；When the invention is used, the product to be tested 100 is first placed on the top surface 21 of the carrier 20, as shown in FIG. 2, and then the carrier 20 is moved downward by an external force, which is provided for the pressure plate 40 in this embodiment. The pressure plate 40 is pushed down against the product to be tested 100 to push down the carrier 20 indirectly. However, it is not limited thereto, and may be pressed down by other means than the pressure plate 40 or directly through the product to be tested 100. Moving the carrier 20 downward, and the product 100 to be tested placed on the carrier 20 is also naturally moved downward;
當載板20向下移動直到待測產品100的兩供電點101接觸第一頂針組50的頂端時，載板20下降的距離也恰使導電片60向下接觸第二頂針組70，而使電源80、第一頂針組50、待測產品100、第二頂針組70及導電片60之間形成一迴路；在本實施例中，電源80的電力依序通過其中一第一頂針51、待測產品100、另一第一頂針52、其中一第二頂針72、導電片60及另一第二頂針71而回到電源80以形成迴路；When the carrier 20 moves downward until the two feeding points 101 of the product 100 to be tested contact the top end of the first thimble set 50, the distance that the carrier 20 is lowered is such that the conductive sheet 60 contacts the second thimble set 70 downwardly, A power circuit 80, a first thimble set 50, a product to be tested 100, a second thimble set 70, and a conductive sheet 60 form a loop; in this embodiment, the power of the power source 80 sequentially passes through one of the first ejector pins 51, Measuring product 100, another first thimble 52, one of the second ejector pins 72, the conductive sheet 60 and the other second thimble 71 are returned to the power source 80 to form a loop;
當載板20的外力除去時，在本實施例中為壓板40向上提起時，請參閱圖1所示，彈性元件30連帶向上推抵載板20，而導電片60與第二頂針組70便立即分離，進而使前述之迴路形成斷路。When the external force of the carrier 20 is removed, in the present embodiment, when the pressure plate 40 is lifted up, referring to FIG. 1, the elastic member 30 is pushed up against the carrier 20, and the conductive sheet 60 and the second thimble set 70 are The separation is immediately performed, thereby causing the aforementioned circuit to form an open circuit.
由於只要一將壓板40向上提，導電片60便會立刻與第二頂針組70分離，進而使迴路斷開而達到斷電的效果；藉此在將壓板40上提的過程中，縱使誤觸第一頂針組50或待測產品100也不會產生觸電之危險；本發明藉此達到有效降低觸電風險的發明目的。As soon as the platen 40 is lifted up, the conductive sheet 60 is immediately separated from the second ejector pin 70, thereby breaking the circuit to achieve the power-off effect; thereby, in the process of lifting the platen 40, even if it is accidentally touched The first thimble set 50 or the product to be tested 100 also does not pose a risk of electric shock; the present invention thereby achieves the object of effectively reducing the risk of electric shock.
以上所述僅是本發明的較佳實施例而已，並非對本發明做任何形式上的限制，雖然本發明已以較佳實施例揭露如上，然而並非用以限定本發明，任何所屬技術領域中具有通常知識者，在不脫離本發明技術方案的範圍內，當可利用上述揭示的技術內容作出些許更動或修飾為等同變化的等效實施例，但凡是未脫離本發明技術方案的內容，依據本發明的技術實質對以上實施例所作的任何簡單修改、等同變化與修飾，均仍屬於本發明技術方案的範圍內。The above is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the invention, and A person skilled in the art can make some modifications or modifications to equivalent embodiments by using the above-disclosed technical contents without departing from the technical scope of the present invention. The present invention is not limited to any simple modifications, equivalent changes and modifications of the above embodiments.
10‧‧‧底板10‧‧‧floor
20‧‧‧載板20‧‧‧ Carrier Board
21‧‧‧頂面21‧‧‧ top surface
30‧‧‧彈性元件30‧‧‧Flexible components
40‧‧‧壓板40‧‧‧ pressure plate
50‧‧‧第一頂針組50‧‧‧First thimble set
51‧‧‧第一頂針51‧‧‧First thimble
52‧‧‧第一頂針52‧‧‧First thimble
60‧‧‧導電片60‧‧‧Conductor
70‧‧‧第二頂針組70‧‧‧Second thimble set
71‧‧‧第二頂針71‧‧‧Second thimble
72‧‧‧第二頂針72‧‧‧Second thimble
80‧‧‧電源80‧‧‧Power supply
90‧‧‧手切開關90‧‧‧Hand switch
100‧‧‧待測產品100‧‧‧ products to be tested
101‧‧‧供電點101‧‧‧Power supply point
圖1係本發明之斷電時之側視示意圖。 圖2係本發明之斷電時之側視示意圖。BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a side elevational view of the powering down of the present invention. Figure 2 is a side elevational view of the powering down of the present invention.
Claims (7)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW106139085A TWI621855B (en) | 2017-11-13 | 2017-11-13 | Thimble fixture with power-supply protective device |
| CN201810856279.1A CN109782035B (en) | 2017-11-13 | 2018-07-31 | Detection tool with power supply protection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW106139085A TWI621855B (en) | 2017-11-13 | 2017-11-13 | Thimble fixture with power-supply protective device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI621855B TWI621855B (en) | 2018-04-21 |
| TW201918714A true TW201918714A (en) | 2019-05-16 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW106139085A TWI621855B (en) | 2017-11-13 | 2017-11-13 | Thimble fixture with power-supply protective device |
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| Country | Link |
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| CN (1) | CN109782035B (en) |
| TW (1) | TWI621855B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110082628A (en) * | 2019-06-05 | 2019-08-02 | 格力电器（郑州）有限公司 | Test device and its control method for air-conditioning |
| CN115290938B (en) * | 2022-10-09 | 2022-12-30 | 深圳市华科达诚科技有限公司 | Automatic connecting device for integrated circuit |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB8622878D0 (en) * | 1986-09-23 | 1986-10-29 | Marconi Instruments Ltd | Electrical interface arrangement |
| US6894479B2 (en) * | 2002-08-26 | 2005-05-17 | Agilent Technologies, Inc. | Connector cable and method for probing vacuum-sealable electronic nodes of an electrical testing device |
| US8581610B2 (en) * | 2004-04-21 | 2013-11-12 | Charles A Miller | Method of designing an application specific probe card test system |
| US7812624B1 (en) * | 2009-05-26 | 2010-10-12 | High Power Lighting Corp. | Testing method for LED module |
| TW201219807A (en) * | 2010-11-15 | 2012-05-16 | Askey Computer Corp | Testing auxiliary apparatus |
| TW201221988A (en) * | 2010-11-18 | 2012-06-01 | Askey Computer Corp | Inspection fixture for light emitting diode array |
| CN103777043B (en) * | 2012-10-22 | 2016-05-25 | 昆山意力电路世界有限公司 | Elastomeric connector functional tester |
| KR20140111146A (en) * | 2013-03-08 | 2014-09-18 | 삼성전자주식회사 | Apparatus for testing a semiconductor package |
| CN203249984U (en) * | 2013-05-31 | 2013-10-23 | 浙江龙威电子科技有限公司 | Tool for detecting open circuit and short circuit of flexible circuit board |
| CN204142910U (en) * | 2014-09-03 | 2015-02-04 | 东莞华贝电子科技有限公司 | A kind of electronics mainboard test platform |
| CN206223925U (en) * | 2016-10-21 | 2017-06-06 | 厦门市铂联科技股份有限公司 | A kind of circuit board testing frock |
| CN106646202A (en) * | 2017-02-24 | 2017-05-10 | 常州信息职业技术学院 | Touch key circuit board function display and detection system |
-
2017
- 2017-11-13 TW TW106139085A patent/TWI621855B/en active
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2018
- 2018-07-31 CN CN201810856279.1A patent/CN109782035B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN109782035B (en) | 2021-04-30 |
| CN109782035A (en) | 2019-05-21 |
| TWI621855B (en) | 2018-04-21 |
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