TW201702609A - Probe module which comprises a conductive member, two connection members, two extendible/retractable probes, and a signal connector - Google Patents
Probe module which comprises a conductive member, two connection members, two extendible/retractable probes, and a signal connector Download PDFInfo
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- TW201702609A TW201702609A TW104121853A TW104121853A TW201702609A TW 201702609 A TW201702609 A TW 201702609A TW 104121853 A TW104121853 A TW 104121853A TW 104121853 A TW104121853 A TW 104121853A TW 201702609 A TW201702609 A TW 201702609A
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Abstract
Description
本發明係與電性檢測設備有關；特別是指一種探針模組。 The invention relates to an electrical detection device; in particular to a probe module.
按，用以檢測電子產品之各精密電子元件間的電性連接是否確實的方法，是以一探針模組作為一檢測裝置與待測電子裝置之間的測試訊號與電源訊號之傳輸介面。 According to the method for detecting whether the electrical connection between the precision electronic components of the electronic product is true, a probe module is used as a transmission interface between the test signal and the power signal between the detecting device and the electronic device to be tested.
然而，習用探針模組於組裝後，其探針常常因為多次與待測電子裝置抵觸而產生偏移，或者是探針起初製作上的公差問題，導致各探針的針尖部位有高低不一致的情況發生，以至於再次進行點測時，各探針之針尖部位戳向待測電子裝置的程度不一，而造成部分針尖所造成的針痕過深，而另一部分針尖甚至並未接觸待測電子裝置的表面。 However, after the conventional probe module is assembled, the probe often shifts due to multiple conflicts with the electronic device to be tested, or the tolerance problem of the initial fabrication of the probe causes the height and the inconsistency of the tip of each probe. The situation occurs, so that when the spot test is performed again, the tip position of each probe is poked to the extent of the electronic device to be tested, and the needle mark caused by the partial needle tip is too deep, and the other part of the needle tip is not even contacted. Measure the surface of the electronic device.
如此一來，除造成量測對位的精準度下降外，亦會造成電氣特性的改變，進而導致檢測結果不夠準確，而容易有測試誤判的情形產生。 In this way, in addition to causing a decrease in the accuracy of the measurement alignment, the electrical characteristics are also changed, which in turn leads to inaccurate detection results, and it is easy to have a test misjudgment.
是以，如何在探針模組對待測物進行點測時，可克服針尖平行度不一，導致檢測結果不準確的問題，實為現今業者苦思改良之方向。 Therefore, how to overcome the problem of inconsistent detection results when the probe module performs spot measurement on the object to be tested is actually the direction of improvement of the current industry.
有鑑於此，本發明之目的用於提供一種探針模組，於進行訊號測試時，具有一可伸縮的彈性傳導體，作為探針模組與待測物之間的緩衝元件，以克服針尖對於待測物 平行度不一的問題。 In view of the above, the object of the present invention is to provide a probe module having a retractable elastic conductor as a buffer component between the probe module and the object to be tested when the signal is tested. For the object to be tested The problem of different degrees of parallelism.
緣以達成上述目的，本發明所提供探針模組，用以於一檢測裝置以及一待測物之間傳遞電訊號，且包括一電傳導件、二連接件、二伸縮式探針以及一訊號接頭。該二連接件以導體製成，且相間隔地設置於該電傳導件上。該二伸縮式探針各別包含有以導體製成之一套筒以及一彈針；各該套筒分別與各該連接件電性連接且呈中空結構，各該套筒的一端具有一開口；各該彈針係分別設置於各該套筒內，且可相對於套筒移動，且與相應之套筒電性連接，且各該彈針之一端自各該開口伸出，並凸出各該連接件之邊緣，各該彈針用以與該待測物接抵。該訊號接頭用以供與該檢測裝置電性連接，且與該電傳導件電性連接。 In order to achieve the above object, the probe module provided by the present invention is configured to transmit an electrical signal between a detecting device and a test object, and includes an electric conductive member, two connecting members, two telescopic probes, and a Signal connector. The two connectors are made of conductors and are spaced apart from each other on the electrically conductive member. The two telescopic probes respectively comprise a sleeve made of a conductor and a spring pin; each of the sleeves is electrically connected to each of the connecting members and has a hollow structure, and each end of the sleeve has an opening. Each of the elastic needles is disposed in each of the sleeves, and is movable relative to the sleeve, and is electrically connected to the corresponding sleeve, and one end of each of the elastic needles protrudes from each of the openings, and protrudes from each of the sleeves An edge of the connecting member, each of the elastic pins is used to contact the object to be tested. The signal connector is configured to be electrically connected to the detecting device and electrically connected to the electrical conducting member.
透過上述之設計，該些伸縮式探針作為探針模組與待測物之間的緩衝元件，以克服習用探針模組針尖對於待測物平行度不一的問題，使得探針模組於下針時，各彈針皆能與待測物保持良好的電性接觸；除此之外，連接件的設計更能達到阻抗匹配，而有良好的電訊號傳導效果。 Through the above design, the telescopic probes serve as a buffer component between the probe module and the object to be tested, so as to overcome the problem that the tip of the conventional probe module has different parallelism to the object to be tested, so that the probe module is made. In the case of the lower needle, each of the elastic needles can maintain good electrical contact with the object to be tested; in addition, the connector is designed to achieve impedance matching and has good electrical signal conduction effect.
100‧‧‧探針模組 100‧‧‧ Probe Module
10‧‧‧電傳導件 10‧‧‧Electrical conductors
12‧‧‧基板 12‧‧‧Substrate
14‧‧‧訊號線路 14‧‧‧ Signal Line
16‧‧‧接地線路 16‧‧‧ Grounding circuit
17‧‧‧備用線路 17‧‧‧Alternative route
20‧‧‧葉片組 20‧‧‧blade group
22,24,26‧‧‧連接件 22,24,26‧‧‧connectors
30‧‧‧探針組 30‧‧‧ probe set
32‧‧‧伸縮式探針 32‧‧‧ Telescopic probe
320‧‧‧套筒 320‧‧‧ sleeve
320a‧‧‧開口 320a‧‧‧ openings
322‧‧‧彈針 322‧‧‧needle
322a‧‧‧斜面 322a‧‧‧Bevel
324‧‧‧彈簧 324‧‧ ‧ spring
40‧‧‧訊號接頭 40‧‧‧Signal connector
42‧‧‧訊號傳導部 42‧‧‧ Signal Transmitter
44‧‧‧接地傳導部 44‧‧‧ Grounding Conduction
46‧‧‧絕緣墊圈 46‧‧‧Insulation washers
50‧‧‧殼體 50‧‧‧shell
52‧‧‧上殼 52‧‧‧Upper shell
521‧‧‧第一開口 521‧‧‧ first opening
522‧‧‧第二開口 522‧‧‧ second opening
54‧‧‧下殼 54‧‧‧lower shell
541‧‧‧承台 541‧‧‧ 承台
542‧‧‧接板 542‧‧‧
60‧‧‧定位件 60‧‧‧ positioning parts
70‧‧‧填充件 70‧‧‧Filling parts
80‧‧‧伸縮式探針 80‧‧‧ Telescopic probe
82‧‧‧套筒 82‧‧‧ sleeve
84‧‧‧彈針 84‧‧‧needle
圖1係本發明較佳實施例之探針模組之立體圖。 1 is a perspective view of a probe module in accordance with a preferred embodiment of the present invention.
圖2係本發明較佳實施例之探針模組之分解圖。 2 is an exploded view of a probe module in accordance with a preferred embodiment of the present invention.
圖3為一正視圖，揭示探針組設於葉片組上。 Figure 3 is a front elevational view showing the probe set on the blade set.
圖4係伸縮式探針的剖視圖。 Figure 4 is a cross-sectional view of the telescopic probe.
圖5係一另一較佳實施例之正視圖，揭示套筒不凸出於連接件的邊緣。 Figure 5 is a front elevational view of another preferred embodiment showing the sleeve does not protrude from the edge of the connector.
為能更清楚地說明本發明，茲舉較佳實施例並配合圖示詳細說明如後。請參圖1與圖2所示，本發明一較佳實施例之探針模組100，用以於一檢測裝置(圖未示)以及一待測物(圖未示)之間傳遞電訊號，且包含有一電傳導件10、一葉片組20、一探針組30、一訊號接頭40、一殼體50、一定位件60以及二填充件70。 In order that the present invention may be more clearly described, the preferred embodiments are illustrated in the accompanying drawings. Referring to FIG. 1 and FIG. 2, a probe module 100 according to a preferred embodiment of the present invention is configured to transmit a signal between a detecting device (not shown) and a test object (not shown). And comprising an electric conducting member 10, a blade set 20, a probe set 30, a signal connector 40, a housing 50, a positioning member 60 and two filling members 70.
該電傳導件10於本實施例中為一印刷電路板，且具有一呈長矩形之基板12、一訊號線路14、一接地線路16以及一備用線路17。該訊號線路14、該接地線路16與該備用線路17係佈設於該基板12上，且該訊號線路14位於該接地線路16以及該備用線路17之間。而於其他應用上，該電傳導件10亦可使用同軸線、軟性電路板或是其他導線代替。 The electrically conductive member 10 is a printed circuit board in the present embodiment and has a substrate 12 having a long rectangular shape, a signal line 14, a ground line 16, and a backup line 17. The signal line 14, the ground line 16 and the backup line 17 are disposed on the substrate 12, and the signal line 14 is located between the ground line 16 and the backup line 17. In other applications, the electrically conductive member 10 can also be replaced with a coaxial wire, a flexible circuit board, or other wires.
請配合圖3所示，該葉片組20包含有三個以導體製成的連接件，分別為連接件22、連接件24以及一備用的連接件26，該些連接件22,24,26係相間隔地設置於該電傳導件10上。連接件22一端係焊設於該基板12上，且與該訊號線路14電性連接；連接件24一端係焊設於該基板12上，且與該接地線路16電性連接；備用的連接件26一端係焊設於該基板12上，且與該備用線路17電性連接。 As shown in FIG. 3, the blade set 20 includes three connecting members made of a conductor, which are a connecting member 22, a connecting member 24 and a spare connecting member 26, and the connecting members 22, 24, and 26 are phased. They are disposed on the electrically conductive member 10 at intervals. One end of the connecting member 22 is soldered to the substrate 12 and electrically connected to the signal line 14; one end of the connecting member 24 is soldered to the substrate 12 and electrically connected to the grounding line 16; One end of the 26 is soldered to the substrate 12 and electrically connected to the backup line 17 .
請配合圖3及圖4所示，該探針組30包含有二伸縮式探針32，各該伸縮式探針32個別包含有以導體製成的一套筒320、一彈針322以及一以彈簧324為例之彈性件。該二伸縮式探針32的套筒320係分別設置於該二連接件22、24上並與之電性連接。 As shown in FIG. 3 and FIG. 4 , the probe set 30 includes two telescopic probes 32 , and each of the telescopic probes 32 includes a sleeve 320 , a spring pin 322 and a conductor made of a conductor. The elastic member is exemplified by the spring 324. The sleeves 320 of the two telescopic probes 32 are respectively disposed on the second connecting members 22 and 24 and electrically connected thereto.
由於兩個伸縮式探針32的結構相同，於後茲 以其中一個伸縮式探針32說明其結構。該套筒320係呈中空結構，且套筒320的一端具有一個開口320a，且該套筒320具有開口320a的一端不凸出連接件22,24的底部邊緣，並與連接件22,24之邊緣切齊。該彈針322係以可相對於套筒320移動的方式設置於套筒320內，並與該套筒320的內壁保持接觸且電性連接，且彈針322的一端係自該開口320a伸出，用以與該待測物接抵。該彈簧324係設置於該套筒320內，一端抵於該套筒320相對於具有開口320a的另一端，另一端抵於該彈針322的一斜面322a上。該彈簧324係提供一彈力，以推動該彈針322往該套筒320的開口處320a移動。 Since the two telescopic probes 32 have the same structure, The structure is illustrated by one of the telescopic probes 32. The sleeve 320 has a hollow structure, and one end of the sleeve 320 has an opening 320a, and the end of the sleeve 320 having the opening 320a does not protrude from the bottom edge of the connecting members 22, 24, and the connecting members 22, 24 The edges are aligned. The elastic needle 322 is disposed in the sleeve 320 so as to be movable relative to the sleeve 320, and is in contact with and electrically connected to the inner wall of the sleeve 320, and one end of the elastic needle 322 extends from the opening 320a. Out, used to contact the object to be tested. The spring 324 is disposed in the sleeve 320, and one end of the sleeve 320 is opposite to the other end having the opening 320a, and the other end is abutted against a slope 322a of the elastic needle 322. The spring 324 provides an elastic force to urge the bullet 322 to move toward the opening 320a of the sleeve 320.
請復參照圖2所示，該訊號接頭40與該電傳導件10連接，且具有以導體製成之一訊號傳導部42以及一接地傳導部44，該訊號傳導部42與該訊號線路14電性連接，而該接地傳導部44則與該接地線路16電性連接。於本實施例中，該訊號傳導部42為一金屬柱。該接地傳導部44為一金屬套環，環繞該訊號傳導部42設置。另外，該訊號傳導部42與該接地傳導部44之間更設有一絕緣墊圈46，以隔絕兩者間之訊號相互影響，進而避免該訊號傳導部42與該接地傳導部44之間產生干擾或短路之疑慮。 Referring to FIG. 2, the signal connector 40 is connected to the electrical conductor 10 and has a signal conducting portion 42 and a ground conducting portion 44. The signal conducting portion 42 and the signal line 14 are electrically connected. The grounding conductor 44 is electrically connected to the grounding line 16. In this embodiment, the signal conducting portion 42 is a metal post. The ground conducting portion 44 is a metal collar disposed around the signal conducting portion 42. In addition, an insulating gasket 46 is further disposed between the signal conducting portion 42 and the ground conducting portion 44 to isolate the signal between the two, thereby preventing interference between the signal conducting portion 42 and the ground conducting portion 44. Short-circuit doubts.
該殼體50包含有一上殼52以及一下殼54，該上殼52於相反之兩端分別具有一第一開口521與一第二開口522。該下殼54則具有一承台541以及連接於該承台541之接板542。是以，當該葉片組20以及該訊號接頭40固定於該電傳導件10上後，便可將該電傳導件10與該訊號接頭40利用螺栓鎖固於該下殼54的承台541上。而後，便可將該上殼52鎖設於該承台541，且利用該上殼52遮蔽設於該承台541上之電傳導件10。組裝完成後，該探針組20將自 該第一開口521伸出至該殼體50外，而該訊號接頭40則自該第二開口522伸出至該殼體50外。 The housing 50 includes an upper housing 52 and a lower housing 54. The upper housing 52 has a first opening 521 and a second opening 522 at opposite ends. The lower case 54 has a cap 541 and a tab 542 connected to the cap 541. Therefore, after the blade assembly 20 and the signal connector 40 are fixed on the electrical conductor 10, the electrical conductor 10 and the signal connector 40 can be bolted to the platform 541 of the lower casing 54. . Then, the upper casing 52 can be locked to the pedestal 541, and the electric conductor 10 provided on the pedestal 541 can be shielded by the upper casing 52. After assembly is complete, the probe set 20 will be self-contained The first opening 521 extends out of the housing 50 , and the signal connector 40 extends from the second opening 522 to the outside of the housing 50 .
請配合圖2、3所示，該定位件60於本實施例中係以絕緣之環氧樹脂製成，用以在組裝完成後，利用絕緣黏膠固定設於該葉片組20外露該殼體50外之部分部位上，且該定位件60之部分部位則凸伸於該等連接件22,24,26之間。如此一來，透過上述之設計，便可達到固定該等連接件22,24,26之位置的目的，並可同時達到加強該等連接件22,24,26之間的電氣隔離的效果。當然，在實際實施上，該定位件60亦可選用其他絕緣材料，且該定位件60即使部分部位不凸伸至該等連接件22,24,26之間，亦可達到固定該等連接件22,24,26位置之效果。 As shown in FIG. 2 and FIG. 3, the positioning member 60 is made of an insulating epoxy resin in the embodiment for fixing the housing to the blade group 20 by using an insulating adhesive after the assembly is completed. A portion of the outer portion of the locating member 60 protrudes between the connecting members 22, 24, and 26. In this way, through the above design, the purpose of fixing the positions of the connecting members 22, 24, 26 can be achieved, and at the same time, the effect of enhancing the electrical isolation between the connecting members 22, 24, 26 can be achieved. Of course, in actual implementation, the positioning member 60 can also be made of other insulating materials, and the positioning member 60 can reach the connecting member even if a part of the positioning member 60 does not protrude between the connecting members 22, 24, and 26. 22, 24, 26 position effect.
請配合圖3所示，該等填充件70係於該等連接件22,24,26對應焊設於該基板12之訊號線路14、接地線路16與備用線路17後後，充填於該等連接件22,24,26之間的空隙，以固定該等連接件22,24,26的位置，致使各該連接件22,24,26穩固地設置而不易偏移。其中，該等填充件70的長度不超過其相鄰之連接件的長度，且其充填的位置於該等連接件與該等伸縮式探針連接之一端保留有些許空隙，以讓該填充件70不影響該等伸縮式探針的彈針可與待測物保有良好的抵接條件。其中，該填充件70係以絕緣且具有彈性的材質製成，而選用具有上述特性材質的目的在於，除了可加強該等連接件22,24,26之間電氣隔離的效果之外，更能緩衝該等連接件22,24,26所受到的衝擊力，可避免因多次使用後有偏移的情形發生，而達到固定該等連接件22,24,26位置之效果。 As shown in FIG. 3 , the fillers 70 are mounted on the signal lines 14 , the ground lines 16 , and the backup lines 17 of the substrate 12 , and then filled in the connections. The gap between the members 22, 24, 26 is such that the positions of the connectors 22, 24, 26 are fixed such that each of the connectors 22, 24, 26 is securely disposed without being easily offset. Wherein the length of the filler member 70 does not exceed the length of the adjacent connector member, and the filling position thereof leaves a slight gap between the connector member and one end of the telescopic probe connection, so that the filler member 70 The bullet that does not affect the telescopic probes can maintain good contact conditions with the object to be tested. Wherein, the filling member 70 is made of an insulating and elastic material, and the purpose of selecting the material having the above characteristics is to enhance the electrical isolation between the connecting members 22, 24, 26, and more. Buffering the impact forces of the connectors 22, 24, 26 can avoid the effect of fixing the positions of the connectors 22, 24, 26 due to the occurrence of offset after repeated use.
當檢測人員欲檢測時，便可將該接板542鎖固於該檢測裝置之探測手臂上，並將該訊號接頭40與該檢測 裝置之同軸電纜連接。而後，進行電性檢測時，便可利用該檢測裝置之探測手臂移動該探針模組至該待測物上，並使裝設於葉片組20上各伸縮式探針32之各彈針322接抵於該待測物上之待測部位，進而透過伸縮式探針32、葉片組20、電傳導件10以及訊號接頭40達到於該檢測裝置以及該待測物之間傳遞電訊號的目的。 When the detecting person wants to detect, the connecting plate 542 can be locked on the detecting arm of the detecting device, and the signal connector 40 and the detecting are Coaxial cable connection of the device. Then, when the electrical detection is performed, the probe arm of the detecting device can be used to move the probe module to the object to be tested, and the respective pins 322 of the telescopic probes 32 mounted on the blade group 20 are mounted. Receiving a portion to be tested on the object to be tested, and further transmitting the electrical signal between the detecting device and the object to be tested through the telescopic probe 32, the blade group 20, the electric conduction member 10, and the signal connector 40. .
其中，透過上述伸縮式探針32的設計，於彈針322接觸到待測物之後，彈簧324具有部分的壓縮行程的變化裕度，使得彈針322可往套筒320內退縮一預定距離。如此一來，於探針模組100下針時，即使彈針322用以接觸待測物的一端，由於起初製造時產生公差問題，或者是經過多次的使用而導致彈針322的平行度不佳，以至於各個彈針322的一端並未切齊同一平面，探針模組100仍然能夠藉由各別彈針322的伸縮量，使得各彈針322的一端與待測物保持穩固、良好的電性接觸，以及使得各彈針322一端與待測物表面之間的作用力維持於一預定值之內。而當探針模組離開待測物之後，各伸縮式探針32內的彈簧324可再將彈針322朝開口320a推出，以利於進行下一次的電性量測。 Through the design of the telescopic probe 32, after the elastic needle 322 contacts the object to be tested, the spring 324 has a partial change margin of the compression stroke, so that the elastic needle 322 can be retracted into the sleeve 320 by a predetermined distance. In this way, when the probe module 100 is down, even if the pin 322 is used to contact one end of the object to be tested, the parallelism of the pin 322 is caused due to a tolerance problem at the time of initial manufacture or a plurality of uses. Poorly, the end of each of the elastic pins 322 is not aligned with the same plane, and the probe module 100 can still maintain the end of each of the elastic pins 322 and the object to be tested by the amount of expansion and contraction of the respective elastic pins 322. Good electrical contact, and the force between one end of each of the pins 322 and the surface of the object to be tested is maintained within a predetermined value. When the probe module leaves the object to be tested, the spring 324 in each telescopic probe 32 can push the pin 322 toward the opening 320a to facilitate the next electrical measurement.
另外，該彈針322與彈簧324接觸的面係採斜面322a的設計，其目的在於利用彈簧324之彈力與斜面322a的分力，來確保彈針322與套筒320的內壁保持穩定的接觸。而於其他實際實施上，亦可不採用斜面計，而採用水平面的設計，而不以此為限。 In addition, the surface of the elastic needle 322 in contact with the spring 324 is designed to adopt a slope 322a for the purpose of ensuring stable contact between the elastic needle 322 and the inner wall of the sleeve 320 by utilizing the elastic force of the spring 324 and the component of the inclined surface 322a. . In other practical implementations, the design of the horizontal plane may be used instead of the bevel meter, and not limited thereto.
另一提的是，該葉片組20之各連接件22,24,26除了傳遞電訊號之外，更可有效地微縮由檢測裝置到待測物測試部位的接點間距，即，達到將自訊號接頭40、電傳導件10的間距尺寸微縮的效果；以及達到傳輸路徑的阻抗匹配，進而使得高頻的測試訊號更容易通過，提升測試訊號傳 導的效果。 In addition, in addition to transmitting electrical signals, the connecting members 22, 24, 26 of the blade set 20 can effectively reduce the contact distance from the detecting device to the test portion of the test object, that is, The signal connector 40 and the conductive member 10 have the effect of miniaturizing the pitch size; and the impedance matching of the transmission path is achieved, thereby making the high frequency test signal easier to pass and improving the test signal transmission. The effect of the guide.
再一提的是，上述備用線路17與備用的電連接件26僅作為阻抗匹配之外。於其他實施上，亦可在電連接件26的下方裝設一組伸縮式探針，以進行待測物的電性檢測。如此一來，該備用線路17則可作為另外一個訊號線路或接地線路之用，而不以前述實施例為限。 It is to be noted that the alternate line 17 and the spare electrical connector 26 are only used as impedance matching. In other implementations, a set of telescopic probes may be disposed under the electrical connector 26 for electrical detection of the object to be tested. In this way, the backup line 17 can be used as another signal line or ground line, and is not limited to the foregoing embodiment.
請參圖5所示，為本發明另一較佳實施例之探針模組的局部放大圖，其探針模組與前述實施例的結構大致上相同，不同的是，其伸縮式探針80的套筒82具有開口之一端係退縮至連接件22,24的底部邊緣以內，且不凸出連接件22,24的邊緣。藉此，同樣能夠達到探針模組下針時，各伸縮式探針藉由其彈針84的伸縮量，使得各彈針皆能與待側不保持良好的電性接觸等與前述實施例相同的良好效果。 FIG. 5 is a partial enlarged view of a probe module according to another preferred embodiment of the present invention. The probe module is substantially the same as the structure of the foregoing embodiment, except that the telescopic probe is The sleeve 82 of the sleeve 80 has an end that is retracted to the inside of the bottom edge of the connectors 22, 24 and does not project beyond the edges of the connectors 22, 24. Therefore, when the probe module is down, the telescopic probes can be elastically contacted with the to-be-side by the expansion and contraction of the elastic needles 84, and the like. The same good results.
以上所述僅為本發明較佳可行實施例而已，各彈針用以與待測物接抵的一端，除了是實施例中平頭的設計之外，當然也可以採用具有針尖(尖頭)的彈針。舉凡應用本發明說明書及申請專利範圍所為之等效變化，理應包含在本發明之專利範圍內。 The above description is only a preferred embodiment of the present invention, and the end of each of the elastic pins for abutting against the object to be tested may be a needle tip (tip), in addition to the flat design of the embodiment. Pins. Equivalent changes in the scope of the present invention and the scope of the claims are intended to be included within the scope of the invention.
14‧‧‧訊號線路 14‧‧‧ Signal Line
16‧‧‧接地線路 16‧‧‧ Grounding circuit
17‧‧‧備用線路 17‧‧‧Alternative route
22,24,26‧‧‧連接件 22,24,26‧‧‧connectors
32‧‧‧伸縮式探針 32‧‧‧ Telescopic probe
320‧‧‧套筒 320‧‧‧ sleeve
322‧‧‧彈針 322‧‧‧needle
60‧‧‧定位件 60‧‧‧ positioning parts
70‧‧‧填充件 70‧‧‧Filling parts
Claims (11)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104121853A TW201702609A (en) | 2015-07-06 | 2015-07-06 | Probe module which comprises a conductive member, two connection members, two extendible/retractable probes, and a signal connector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104121853A TW201702609A (en) | 2015-07-06 | 2015-07-06 | Probe module which comprises a conductive member, two connection members, two extendible/retractable probes, and a signal connector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI563260B TWI563260B (en) | 2016-12-21 |
| TW201702609A true TW201702609A (en) | 2017-01-16 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW104121853A TW201702609A (en) | 2015-07-06 | 2015-07-06 | Probe module which comprises a conductive member, two connection members, two extendible/retractable probes, and a signal connector |
Country Status (1)
| Country | Link |
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| TW (1) | TW201702609A (en) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7521634B2 (en) * | 2006-05-19 | 2009-04-21 | Tektronix, Inc. | Multi-Channel signal acquisition probe |
| TWM332850U (en) * | 2007-07-25 | 2008-05-21 | Acron Prec Ind Co Ltd | Contact probe |
| EP2141503A1 (en) * | 2008-06-30 | 2010-01-06 | Capres A/S | A multi-point probe for testing electrical properties and a method of producing a multi-point probe |
| TWI522623B (en) * | 2013-12-13 | 2016-02-21 | Mpi Corp | Probe module (1) |
| TWI506280B (en) * | 2013-12-13 | 2015-11-01 | Mpi Corp | Probe module (2) |
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2015
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| TWI563260B (en) | 2016-12-21 |
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