TW201544822A - Logic analyzer and probe thereof - Google Patents
Logic analyzer and probe thereof Download PDFInfo
- Publication number
- TW201544822A TW201544822A TW103117569A TW103117569A TW201544822A TW 201544822 A TW201544822 A TW 201544822A TW 103117569 A TW103117569 A TW 103117569A TW 103117569 A TW103117569 A TW 103117569A TW 201544822 A TW201544822 A TW 201544822A
- Authority
- TW
- Taiwan
- Prior art keywords
- display screen
- transmission line
- probe
- logic analyzer
- host
- Prior art date
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
Description
本發明係與數位訊號解析有關;特別是指一種邏輯分析儀及其探棒。 The invention relates to digital signal analysis; in particular to a logic analyzer and a probe thereof.
隨著數位科技的進步,如電子晶片、液晶螢幕(LCD)之影像處理晶片、互補性氧化金屬半導體(Complementary Metal-Oxide Semiconductor,CMOS)、以及電荷耦合元件(Charge Coupled Device,CCD)等使用數位訊號傳輸資料之電子裝置日漸普及。隨著數位科技的進步,如電子晶片、液晶螢幕(LCD)之影像處理晶片、互補性氧化金屬半導體(Complementary Metal-Oxide Semiconductor,CMOS)、以及電荷耦合元件(Charge Coupled Device,CCD)等使用數位訊號傳輸資料之電子裝置日漸普及。 With the advancement of digital technology, such as electronic wafers, liquid crystal display (LCD) image processing chips, Complementary Metal-Oxide Semiconductor (CMOS), and Charge Coupled Device (CCD), etc. Electronic devices for transmitting data have become increasingly popular. With the advancement of digital technology, such as electronic wafers, liquid crystal display (LCD) image processing chips, Complementary Metal-Oxide Semiconductor (CMOS), and Charge Coupled Device (CCD), etc. Electronic devices for transmitting data have become increasingly popular.
當研發人員在研發具有上述電子裝置時,通常會利用邏輯分析儀來擷取電子裝置所輸出之數位訊號,藉以與一基礎訊號進行比對來分析上述所擷取之數位訊號來判定上述電子裝置之設計是否正常。 When the R&D personnel develops the above-mentioned electronic device, the logic analyzer is usually used to capture the digital signal output by the electronic device, and the digital signal is compared with a basic signal to analyze the digital signal captured to determine the electronic device. Is the design normal?
然而,習用之邏輯分析儀於分析訊號時,通常是將數位訊號分析後,再將分析結果傳輸至電腦上顯示,而使得研發人員必須一邊將探棒接抵於電子裝置上,並一邊轉頭觀看電腦螢幕上顯示的分析結果,而此舉不僅徒增研發人員檢測時的困難度,當電子裝置之待檢測處數量較多而使用較多探棒時,則容易使得研發人員搞混各探棒對應之檢測頻道,進而容易造成檢測作業的延宕。 However, when the conventional logic analyzer analyzes the signal, it usually analyzes the digital signal and then transmits the analysis result to the computer for display. Therefore, the researcher must connect the probe to the electronic device and turn the head. Watch the analysis results displayed on the computer screen, and this will not only increase the difficulty of the R&D personnel's detection. When the number of electronic devices to be detected is large and more probes are used, it is easy for the R&D personnel to confuse the probes. The detection channel corresponding to the stick is likely to cause delay in the detection operation.
有鑑於此,本發明之目的用於提供一種邏輯分析儀及其探棒,可供研發人員快速且準確地知悉各探棒對應之數位訊號的分析結果。 In view of this, the object of the present invention is to provide a logic analyzer and a probe thereof, which enable the researcher to quickly and accurately know the analysis result of the digital signal corresponding to each probe.
緣以達成上述目的,本發明所提供邏輯分析儀包含一探棒、一第一傳輸線、一顯示幕、一第二傳輸線以及一主機。其中,該探棒用以接抵於一待測物上,以擷取該待測物輸出之數位訊號。該第一傳輸線電性連接該探棒。該顯示幕設置於該探棒上。該第二傳輸線電性連接該顯示幕。該主機電性連接該第一傳輸線以及該第二傳輸線,並供與一電腦電性連接,並用透過該第一傳輸線接收該探棒擷取之數位訊號,並分析該數位訊號,且於分析後,將分析結果傳輸至該電腦上顯示,同時將部分所設定之參數資訊透過該第二傳輸線傳導至該顯示幕上顯示。 To achieve the above objective, the logic analyzer provided by the present invention comprises a probe, a first transmission line, a display screen, a second transmission line and a host. The probe is used to connect to an object to be tested to capture the digital signal output by the object to be tested. The first transmission line is electrically connected to the probe. The display screen is disposed on the probe. The second transmission line is electrically connected to the display screen. The host is electrically connected to the first transmission line and the second transmission line, and is electrically connected to a computer, and receives the digital signal captured by the probe through the first transmission line, and analyzes the digital signal, and after analyzing And transmitting the analysis result to the display on the computer, and transmitting part of the set parameter information to the display screen through the second transmission line.
藉此,透過上述之設計,研發人員使用該邏輯分析儀時,便可透過該探棒上之顯示幕快速且準確地知悉該探棒所擷取之數位訊號所對應設定之參數資訊。 Therefore, through the above design, when the logic analyzer is used by the research and development personnel, the display screen on the probe can quickly and accurately know the parameter information corresponding to the digital signal captured by the probe.
10‧‧‧探棒 10‧‧‧ Probe
12‧‧‧握持部 12‧‧‧ grip
121‧‧‧斜面 121‧‧‧Bevel
14‧‧‧探測部 14‧‧‧Detection Department
21‧‧‧第一傳輸線 21‧‧‧First transmission line
22‧‧‧第二傳輸線 22‧‧‧second transmission line
30‧‧‧顯示幕 30‧‧‧ display screen
40‧‧‧主機 40‧‧‧Host
100‧‧‧待測物 100‧‧‧Test object
200‧‧‧電腦 200‧‧‧ computer
210‧‧‧螢幕 210‧‧‧ screen
圖1係使用本發明較佳實施例邏輯分析儀之檢測系統。 1 is a detection system using a logic analyzer of a preferred embodiment of the present invention.
圖2係本發明較佳實施例之探棒之立體圖。 2 is a perspective view of a probe of a preferred embodiment of the present invention.
為能更清楚地說明本發明,茲舉較佳實施例並配合圖示詳細說明如後。請參圖1所示,本發明一較佳實施 例之邏輯分析儀係用以擷取並解析一待測物100所產生之數位訊號,並將分析結果傳輸予一電腦200,且包含有一探棒10、一顯示幕30、一第一傳輸線21、一第二傳輸線22以及一主機40。其中:該探棒10包含有一握持部12以及一探測部14。請參閱圖2,該握持部12係用以供研發人員握持,並以絕緣體製成,且該握持部12之頂端係呈一斜面121。該探測部14係以導體製成,並設置於該握持部12之底端,且於本實施例中,該探測部14一端係呈尖錐狀,用以接抵於該待測物100之待測部位上,以擷取該待測物100輸出之數位訊號。當然,在實際實施上,該探測部14亦可是呈夾子形狀或是其他進行檢測時所須之形狀。 In order that the present invention may be more clearly described, the preferred embodiments are illustrated in the accompanying drawings. Please refer to FIG. 1 for a preferred embodiment of the present invention. The logic analyzer is used to capture and parse the digital signal generated by the object to be tested 100, and transmit the analysis result to a computer 200, and includes a probe 10, a display screen 30, and a first transmission line 21. A second transmission line 22 and a host 40. The probe 10 includes a grip portion 12 and a detecting portion 14. Referring to FIG. 2 , the grip portion 12 is used for the developer to hold and is made of an insulator, and the top end of the grip portion 12 has a slope 121 . The detecting portion 14 is formed of a conductor and is disposed at a bottom end of the holding portion 12, and in the embodiment, the detecting portion 14 has a tapered shape at one end for receiving the object to be tested 100. The portion to be tested is used to capture the digital signal output by the object to be tested 100. Of course, in actual implementation, the detecting portion 14 may also be in the shape of a clip or other shape required for detecting.
該顯示幕30係設置於該握持部12之斜面121上,而與該探測部14分別位於該握持部12上相反位置之頂端與底端,於本實施例中,該顯示幕30係一液晶螢幕,當然在實際實施上,亦可使用其它可顯示字元之元件代替。 The display screen 30 is disposed on the inclined surface 121 of the grip portion 12, and the detecting portion 14 is located at the top end and the bottom end of the opposite position of the grip portion 12, and in the embodiment, the display screen 30 is A liquid crystal screen, of course, in actual implementation, other elements that can display characters can be used instead.
該第一傳輸線21與該第二傳輸線22的一端分別埋設於該握持部中12,且分別與該探測部14以及該顯示幕30電性連接,而透過將該等傳輸線21、22一端埋設於該握持部12中而呈一體之目的,在於避免線材過於混亂而影響研發人員之操作,當然,在實際實施上,更可將該等傳輸線21、22外露於該握持部12之外的部位包裹於一束套(圖未示)內,而可避免該等傳輸線21、22產生線材相互纏繞而影響操作之情事發生。 The first transmission line 21 and one end of the second transmission line 22 are respectively embedded in the holding portion 12, and are electrically connected to the detecting portion 14 and the display screen 30, respectively, and are buried at one end of the transmission lines 21 and 22. The purpose of the integration in the grip portion 12 is to prevent the wire from being too confusing and affecting the operation of the research and development personnel. Of course, in actual practice, the transmission lines 21 and 22 may be exposed outside the grip portion 12 . The parts are wrapped in a sleeve (not shown), and the transmission lines 21 and 22 are prevented from being entangled with each other to affect the operation.
該主機40設定有複數參數資訊(如波形、頻率、觸發點、擷取之頻道等),且電性連接該第一傳輸線21以及該第二傳輸線22,並供與該電腦200電性連接。如此一來,當研發人員進行檢測而將該探棒10之探測部14接抵 於該待測物100之待測部位上時,該探棒10擷取之數位訊號透過該第一傳輸線21傳送該主機40後,該主機40便依據所設定之參數資訊進行分析,且於分析後,該主機40便將分析結果傳輸至該電腦200,使該電腦200之螢幕210上顯示分析結果(如波形、頻率、觸發點、擷取之頻道等),同時將取樣頻率、觸發點與頻道名稱等較為基礎的部分所設定之參數資訊透過該第二傳輸線22傳導至該握持部12上之該顯示幕30顯示。而在本實施例中,該主機40內建有一編譯器用以將該主機40分析之部分所設定之參數資訊編譯成對應之I2C訊號後輸出至該第二傳輸線22,且該顯示幕30內建有一對應之解譯器,用以將解譯該第二傳輸線22傳輸之I2C訊號,而取得該I2C訊號對應之部分所設定之參數資訊(即取樣頻率、觸發點與頻道名稱),以顯示於該顯示幕30上(如圖2)。 The host 40 is configured with a plurality of parameter information (such as a waveform, a frequency, a trigger point, a channel to be captured, etc.), and is electrically connected to the first transmission line 21 and the second transmission line 22, and is electrically connected to the computer 200. In this way, when the researcher performs the detection and the detecting portion 14 of the probe 10 is connected to the portion to be tested of the object to be tested 100, the digital signal captured by the probe 10 is transmitted through the first transmission line 21. After the host 40, the host 40 analyzes according to the set parameter information, and after the analysis, the host 40 transmits the analysis result to the computer 200, so that the analysis result (such as a waveform) is displayed on the screen 210 of the computer 200. The frequency, the trigger point, the captured channel, etc., and the parameter information set by the basic part such as the sampling frequency, the trigger point and the channel name is transmitted to the display on the grip portion 12 through the second transmission line 22 Curtain 30 shows. In the embodiment, the host 40 has a built-in compiler for compiling the parameter information set by the analysis part of the host 40 into the corresponding I 2 C signal, and outputting the information to the second transmission line 22, and the display screen 30 A corresponding interpreter is built in, for interpreting the I 2 C signal transmitted by the second transmission line 22, and obtaining parameter information set by the portion corresponding to the I 2 C signal (ie, sampling frequency, trigger point and channel) The name) is displayed on the display screen 30 (Fig. 2).
如此一來,研發人員便可於檢測時,直接由該顯示幕30上知悉所擷取之數位訊號的基礎資料,而可快速且確實地知悉所設定之參數資訊對比於該待測物100所產生之訊號,而不會有誤視之情形發生。另外,透過將該探測部14與該顯示幕30分別設置於該握持部12相反兩端之設計,研發人員握持該握持部14而將該探測部14壓抵於該待測物100上進行檢測時,其手部便不會遮蔽到該顯示幕30之呈現,且透過將該顯示幕30設置於該握持部頂部12之斜面121,更可使得研發人員之視線可方便地直視該顯示幕30,而可直接且方便地觀看該顯示幕30顯示之資訊,進而大幅地增加檢測時的便利性。 In this way, the R&D personnel can directly know the basic data of the digital signal captured by the display screen 30 during the detection, and can quickly and surely know the set parameter information compared with the object to be tested 100. The signal generated, without the occurrence of a misunderstanding. In addition, by designing the detecting portion 14 and the display screen 30 on opposite ends of the grip portion 12, the researcher holds the grip portion 14 and presses the detecting portion 14 against the object to be tested 100. When the detection is performed, the hand is not shielded from the display of the display screen 30, and the display screen 30 is disposed on the inclined surface 121 of the top portion 12 of the grip portion, so that the line of sight of the developer can be conveniently viewed directly. The display screen 30 can directly and conveniently view the information displayed on the display screen 30, thereby greatly increasing the convenience in detection.
綜上所述可知悉,研發人員使用該邏輯分析儀時,不僅可透過電腦200之螢幕210觀看分析結果,便可直接透過觀看該探棒10上之該顯示幕30,而可快速且準確地 知悉該探棒10所擷取之數位訊號對應的參數資訊,不僅方便研發人員操作,更可提升研發人員檢測與分析作業之效率。 In summary, the R&D personnel can use the logic analyzer to view the analysis result directly through the screen 210 of the computer 200, and can directly and accurately view the display screen 30 on the probe 10, thereby quickly and accurately. Knowing the parameter information corresponding to the digital signal captured by the probe 10 not only facilitates the operation of the research and development personnel, but also improves the efficiency of the detection and analysis work of the research and development personnel.
另外,以上所述僅為本發明較佳可行實施例而已,舉凡應用本發明說明書及申請專利範圍所為之等效變化,理應包含在本發明之專利範圍內。 In addition, the above description is only for the preferred embodiment of the present invention, and equivalent changes to the scope of the present invention and the scope of the patent application are intended to be included in the scope of the present invention.
10‧‧‧探棒 10‧‧‧ Probe
12‧‧‧握持部 12‧‧‧ grip
14‧‧‧探測部 14‧‧‧Detection Department
21‧‧‧第一傳輸線 21‧‧‧First transmission line
22‧‧‧第二傳輸線 22‧‧‧second transmission line
30‧‧‧顯示幕 30‧‧‧ display screen
40‧‧‧主機 40‧‧‧Host
100‧‧‧待測物 100‧‧‧Test object
200‧‧‧電腦 200‧‧‧ computer
210‧‧‧螢幕 210‧‧‧ screen
Claims (13)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW103117569A TWI528042B (en) | 2014-05-20 | 2014-05-20 | Logic analyzer and its probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW103117569A TWI528042B (en) | 2014-05-20 | 2014-05-20 | Logic analyzer and its probe |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201544822A true TW201544822A (en) | 2015-12-01 |
TWI528042B TWI528042B (en) | 2016-04-01 |
Family
ID=55407054
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103117569A TWI528042B (en) | 2014-05-20 | 2014-05-20 | Logic analyzer and its probe |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI528042B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI635298B (en) * | 2016-06-09 | 2018-09-11 | 孕龍科技股份有限公司 | Logic analyzer and method for data acquisition and performance test |
-
2014
- 2014-05-20 TW TW103117569A patent/TWI528042B/en not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI635298B (en) * | 2016-06-09 | 2018-09-11 | 孕龍科技股份有限公司 | Logic analyzer and method for data acquisition and performance test |
US10352999B2 (en) | 2016-06-09 | 2019-07-16 | Zeroplus Technology Co., Ltd. | Logic analyzer for evaluating an electronic product, method of retrieving data of the same, and method of performance testing |
Also Published As
Publication number | Publication date |
---|---|
TWI528042B (en) | 2016-04-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP2177903B1 (en) | Inspection apparatus | |
US8996928B2 (en) | Devices for indicating a physical layer error | |
MX362826B (en) | Capturing and processing instant drug test results using a mobile device. | |
CN107145416A (en) | A kind of PCIE signal method of testing and measurement jig system for supporting OCP interfaces | |
TWI528042B (en) | Logic analyzer and its probe | |
CN208172235U (en) | A kind of pulse collection and sending device | |
WO2016183696A1 (en) | Logic analyzer and probe thereof | |
CN108169521A (en) | A kind of selection method of oscilloprobe, oscillograph and oscillograph trigger port | |
JP2015045643A (en) | Modular inspection system and inspection module | |
US20140092381A1 (en) | Portable optical fiber test set controllable through wireless mobile device | |
CN204192578U (en) | Human life cell health detection signal acquisition process stores one earphone | |
KR101576668B1 (en) | Block type probe device | |
JP2015083974A (en) | Test and measurement probe connection system | |
CN204142685U (en) | A kind of insulator damage check instrument | |
CN105550507A (en) | Intelligent terminal for measuring blood type and measuring method | |
TW201326859A (en) | Data transmission method | |
TWI662469B (en) | Logic analysis system and signal processing and display method thereof | |
CN206832861U (en) | Test probe and printed circuit board test fixture | |
CN106291335A (en) | Logic analyser and probe thereof | |
TWI547700B (en) | Method for distinguishing i/o port of chip | |
CN206450749U (en) | A kind of multivoltage tester | |
CN206656952U (en) | A kind of portable minisize spectrometer | |
CN206270444U (en) | A kind of cable failure detection instrument | |
TWM478823U (en) | signal adaptor structure of probe detector | |
CN107797013A (en) | Show cable detector |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |