TW201448488A - System and method for testing radio frequency wireless signal transceivers using wireless test signals - Google Patents
System and method for testing radio frequency wireless signal transceivers using wireless test signals Download PDFInfo
- Publication number
- TW201448488A TW201448488A TW103118384A TW103118384A TW201448488A TW 201448488 A TW201448488 A TW 201448488A TW 103118384 A TW103118384 A TW 103118384A TW 103118384 A TW103118384 A TW 103118384A TW 201448488 A TW201448488 A TW 201448488A
- Authority
- TW
- Taiwan
- Prior art keywords
- signal
- radio frequency
- test
- signals
- individual
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/391—Modelling the propagation channel
- H04B17/3911—Fading models or fading generators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Mobile Radio Communication Systems (AREA)
- Variable-Direction Aerials And Aerial Arrays (AREA)
Abstract
Description
本發明係關於測試射頻(RF)無線信號收發器，且特別係關於測試該等裝置而無需使用載送RF測試信號之RF信號纜線。 This invention relates to testing radio frequency (RF) wireless signal transceivers, and in particular to testing such devices without the use of RF signal cables carrying RF test signals.
本申請案為2013年3月15日所提出申請之美國專利申請第13/839,162號之部分延續案，標題為「使用無線測試信號測試射頻無線信號收發器之系統及方法(System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals)」，以及本申請案為2013年3月15日所提出申請之美國專利申請第13/839,583號之部分延續案，標題為「使用無線測試信號測試射頻無線信號收發器之系統及方法(System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals)」，該二申請案之全部公開內容引用併入本申請以供參照。 This application is a continuation of U.S. Patent Application Serial No. 13/839,162, filed on March 15, 2013, entitled "System and Method for Testing Using Wireless Test Signals to Test RF Wireless Signal Transceivers" Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals), and a continuation of the US Patent Application No. 13/839,583, filed on March 15, 2013, entitled "Using Wireless Test Signals to Test Radio Frequency Wireless" System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals, the entire disclosures of which are incorporated herein by reference.
許多現今的電子裝置使用無線技術作為連接及通訊這兩種目的。因為無線裝置發送以及接收電磁能量，且因為二或複數個無線裝置 可能因其信號頻率及功率頻譜密度而干擾彼此的運作，這些裝置及其無線技術必須遵循各種無線技術標準規格。 Many modern electronic devices use wireless technology for both connection and communication purposes. Because the wireless device transmits and receives electromagnetic energy, and because two or more wireless devices These devices may interfere with each other's operation due to their signal frequency and power spectral density. These devices and their wireless technologies must comply with various wireless technology standard specifications.
當設計該等裝置時，工程師必須額外留意以確保該等裝置符合或優於其包含之無線技術指定遵守基於標準規格之每一者。再者，當這些裝置未來大量製造時，其會接受測試以確保製造瑕疵不會導致不適當的運作，包括其是否遵循該包含之無線技術基於標準之規格。 When designing such devices, engineers must pay extra attention to ensure that such devices meet or exceed each of the wireless technology they specify to comply with standards-based specifications. Furthermore, when these devices are manufactured in large quantities in the future, they will be tested to ensure that manufacturing defects do not result in improper operation, including whether they comply with the standards of the included wireless technology based standards.
為了在這些裝置製造及組裝後對其進行測試，目前的無線裝置測試系統(「測試器」)利用一子系統來分析接收自各裝置之信號。該等子系統通常至少包括一向量信號產生器(VSG)，其用於提供待傳輸至該裝置之來源信號，以及一向量信號分析器(VSA)，其用於分析由該裝置所產生之信號。由VSG產生的信號以及由VSA執行的分析通常係可程式設計的，如此可使用不同頻率範圍、頻寬以及信號調變特性之各信號來測試各種裝置是否遵循各種無線技術標準。 In order to test these devices after they are manufactured and assembled, current wireless device test systems ("testers") utilize a subsystem to analyze signals received from each device. The subsystems typically include at least a vector signal generator (VSG) for providing a source signal to be transmitted to the device, and a vector signal analyzer (VSA) for analyzing signals generated by the device. . The signals generated by the VSG and the analysis performed by the VSA are typically programmable so that signals of different frequency ranges, bandwidths, and signal modulation characteristics can be used to test whether various devices follow various wireless technology standards.
受測裝置(DUT)之校準及效能檢定測試通常係使用導電信號路徑(諸如纜線)來進行，而非使用DUT與測試器藉以經由電磁輻射通信的無線信號路徑。據此，於測試器與DUT之間信號係經由該導電信號路徑載送，而非透過周遭的空間向外輻射。使用該等導電信號路徑有助於確保量測之可重複性及一致性，並且排除信號載送(傳輸及接收)中需要考量DUT之定位與定向。 The calibration of the device under test (DUT) and the performance verification test are typically performed using a conductive signal path, such as a cable, rather than using a wireless signal path through which the DUT communicates with the tester via electromagnetic radiation. Accordingly, the signal between the tester and the DUT is carried via the conductive signal path rather than radiating outward through the surrounding space. The use of these conductive signal paths helps to ensure repeatability and consistency of the measurements, and eliminates the need to consider the positioning and orientation of the DUT in signal loading (transmission and reception).
對於一多輸入多輸出(MIMO)DUT，該受測裝置(DUT)之各輸入/輸出必須提供一某種型式的信號路徑。舉例而言，對於意欲使用三個天線操作的MIMO裝置，必須提供用於測試之三個導電信號路徑，例如，纜 線及連接。 For a multiple input multiple output (MIMO) DUT, each input/output of the device under test (DUT) must provide a certain type of signal path. For example, for a MIMO device intended to operate with three antennas, three conductive signal paths must be provided for testing, for example, a cable Line and connection.
但是，由於需要實體地連接及拆接該受測裝置(DUT)及測試器之間的纜線，所以使用導電信號路徑顯著地影響各DUT所需的測試時間。而且，對於一MIMO DUT，在開始測試及終止測試時皆需要進行多次的連接及拆接動作。而且，由於在測試期間被載送的信號不是經由周遭的空間輻射(該信號通常採用的方式)，並且在該等測試期間未使用該受測裝置(DUT)之天線總成，所以該等測試未模擬真實世界的操作，並且該測試結果未反映任何屬於天線的效能特性。 However, the use of a conductive signal path significantly affects the test time required for each DUT due to the need to physically connect and disconnect the cable between the device under test (DUT) and the tester. Moreover, for a MIMO DUT, multiple connections and disconnections are required at the beginning of the test and termination of the test. Moreover, since the signal carried during the test is not via ambient radiation (the manner in which the signal is typically employed) and the antenna assembly of the device under test (DUT) is not used during such testing, such testing The real world operation is not simulated, and the test results do not reflect any performance characteristics belonging to the antenna.
作為替代方案，可使用經由電磁輻射而非經由纜線傳導所載送之測試信號進行測試。該方式具有不需要連接及拆接測試纜線的優點，從而縮短相關於連接及拆接之測試時間。但是，由於源自於其他地方及散佈於周遭空間的電磁信號，所以有輻射信號及接收器天線存在的「頻道」(即，藉以輻射及接收測試信號的周遭空間)原本就易受到信號干擾及錯誤。該受測裝置(DUT)天線會接收該等信號以及可能因信號反射而包含來自各干擾信號源的多路徑信號。據此，與使用個別的導電信號路徑(例如，用於各天線連接的纜線)相比較，該「頻道」之「條件」通常不佳。 Alternatively, testing can be performed using test signals carried via electromagnetic radiation rather than via cable conduction. This method has the advantage of not requiring connection and disconnection of the test cable, thereby shortening the test time associated with the connection and disconnection. However, due to the electromagnetic signals originating from other places and scattered around the surrounding space, the "channel" (ie, the surrounding space through which radiation and receiving test signals) existing in the radiated signal and the receiver antenna is inherently susceptible to signal interference and error. The device under test (DUT) antenna receives the signals and may include multipath signals from the various interfering signal sources due to signal reflections. Accordingly, the "conditions" of the "channel" are generally poor compared to the use of individual conductive signal paths (e.g., cables for each antenna connection).
一種防止或至少顯著地減小來自該等外來信號之干擾的方法為使用一屏蔽外殼來隔離該受測裝置(DUT)及測試器的輻射信號介面。但是，該等外殼典型地無法產生可相比的測量準確度及可重複性。此特別會發生在外殼小於最小無回波室。此外，該等外殼傾向於對該受測裝置(DUT)之定位與定向敏感，並且亦對該等外殼內產生的多路徑信號之建設性干擾 及破壞性干擾敏感。 One method of preventing or at least significantly reducing interference from such external signals is to use a shielded enclosure to isolate the radiation signal interface of the device under test (DUT) and the tester. However, such enclosures typically do not produce comparable measurement accuracy and repeatability. This can occur especially when the outer casing is smaller than the smallest echo-free chamber. In addition, the enclosures tend to be sensitive to the location and orientation of the device under test (DUT) and also constructively interfere with multipath signals generated within the enclosures. And destructive interference is sensitive.
據此，希望具有用於測試無線信號收發器(特別地為無線MIMO信號收發器)之系統及方法，其中可使用輻射電磁測試信號，藉此模擬真實世界系統操作並且避免連接及拆接測試纜線所需的測試時間，同時藉由避免歸因於外部產生之信號及多路徑信號效應所致的干擾信號而維持測試可重複性及準確度。 Accordingly, it would be desirable to have systems and methods for testing wireless signal transceivers, particularly wireless MIMO signal transceivers, in which radiated electromagnetic test signals can be used, thereby simulating real world system operation and avoiding connecting and disconnecting test cables. The test time required for the line while maintaining test repeatability and accuracy by avoiding interference signals due to externally generated signals and multipath signal effects.
根據本申請發明，其提供一種用於促進一射頻(RF)信號收發器受測裝置(DUT)進行無線測試之方法。使用位於包含該受測裝置(DUT)之一屏蔽外殼內的多重天線，從該受測裝置(DUT)輻射出的射頻(RF)測試信號所產生的多重無線射頻(RF)測試信號於經結合以形成一複合射頻(RF)信號之前，係經捕捉且彼等之個別信號相位受到控制。持續重複本流程直到在一選定數量之射頻(RF)信號頻率之個別配對下之信號功率位準之間的功率位準差值具有介於預設最小值與最大值間之數值，藉此提供該屏蔽外殼內該多路徑信號環境的補償，並藉此於該受測裝置(DUT)的無線測試中模擬一有線測試信號路徑。 In accordance with the present invention, a method for facilitating wireless testing of a radio frequency (RF) signal transceiver device under test (DUT) is provided. Multiple radio frequency (RF) test signals generated from radio frequency (RF) test signals radiated from the device under test (DUT) using a multiple antenna located within a shielded enclosure containing one of the devices under test (DUT) Before a composite radio frequency (RF) signal is formed, it is captured and the individual signal phases are controlled. The process is continuously repeated until the power level difference between the signal power levels of the selected pair of radio frequency (RF) signal frequencies has a value between the preset minimum and maximum values, thereby providing The multi-path signal environment is compensated within the shielded enclosure and thereby simulates a wired test signal path in a wireless test of the device under test (DUT).
根據本申請發明的一實施例，一種促進一射頻(RF)信號收發器受測裝置(DUT)進行無線測試之方法包括：接收至少一複數個無線射頻(RF)測試信號，其具有複數個個別射頻(RF)測試信號相位並與從安置於一結構的一內部區域內的一受測裝置(DUT)所輻射出的一公共射頻(RF)測試信號相關，其中 該公共射頻(RF)測試信號包括複數個定義一射頻(RF)信號頻率範圍之射頻(RF)信號頻率，以及該結構定義該內部區域與一外部區域，並經配置以使該內部區域實質地隔離於源自該外部區域的電磁輻射；控制至少一部份該複數個個別射頻(RF)測試信號的個別相位以提供複數個相位受控射頻(RF)信號；結合至少該複數個相位受控射頻(RF)信號以提供在該複數個射頻(RF)信號頻率的每一頻率下具有一信號功率位準的一複合射頻(RF)信號；以及重複該接收、控制與結合直到在部份該複數個射頻(RF)信號頻率之個別配對下之該信號功率位準之間的複數個功率位準差值之各者具有介於預設最小值與最大值間之一數值。 In accordance with an embodiment of the present invention, a method of facilitating wireless testing of a radio frequency (RF) signal transceiver device under test (DUT) includes receiving at least one plurality of radio frequency (RF) test signals having a plurality of individual A radio frequency (RF) test signal phase is associated with a common radio frequency (RF) test signal radiated from a device under test (DUT) disposed within an interior region of a structure, wherein The common radio frequency (RF) test signal includes a plurality of radio frequency (RF) signal frequencies defining a frequency range of a radio frequency (RF) signal, and the structure defines the inner region and an outer region and is configured such that the inner region is substantially Separating from electromagnetic radiation originating from the outer region; controlling at least a portion of the individual phases of the plurality of individual radio frequency (RF) test signals to provide a plurality of phase controlled radio frequency (RF) signals; combining at least the plurality of phase controlled a radio frequency (RF) signal to provide a composite radio frequency (RF) signal having a signal power level at each of the plurality of radio frequency (RF) signal frequencies; and repeating the receiving, controlling, and combining until the portion Each of the plurality of power level deviation values between the signal power levels of the plurality of radio frequency (RF) signal frequencies has a value between the preset minimum and maximum values.
根據本申請發明的另一實施例，一種促進一射頻(RF)信號收發器受測裝置(DUT)進行無線測試之方法包括：接收至少一複數個無線射頻(RF)測試信號，其具有複數個個別射頻(RF)測試信號相位並與從安置於一結構的一內部區域內的一受測裝置(DUT)所輻射出的一公共射頻(RF)測試信號相關，其中該公共射頻(RF)測試信號包括定義一射頻(RF)信號頻率範圍之複數個射頻(RF)信號頻率，以及該結構定義該內部區域與一外部區域，並經配置以使該內部區域實質地隔離於源自該外部區域的電磁輻射；控制至少一部份該複數個個別射頻(RF)測試信號的個別相位以提供複數個相位受控射頻(RF)信號； 結合至少該複數個相位受控射頻(RF)信號以提供一複合射頻(RF)信號；測量在部份該複數個射頻(RF)信號頻率之每一頻率下的該複合射頻(RF)信號之一功率位準；運算在部份該複數個射頻(RF)信號頻率之個別配對下之該信號功率位準之間的複數個功率位準差值；以及重複該接收、控制與結合直到至少一部份該複數個功率位準差值之各者具有介於預設最小值與最大值間之一數值。 In accordance with another embodiment of the present invention, a method of facilitating wireless testing of a radio frequency (RF) signal transceiver device under test (DUT) includes receiving at least one plurality of radio frequency (RF) test signals having a plurality of The individual radio frequency (RF) test signal phase is associated with a common radio frequency (RF) test signal radiated from a device under test (DUT) disposed within an interior region of a structure, wherein the common radio frequency (RF) test The signal includes a plurality of radio frequency (RF) signal frequencies defining a frequency range of a radio frequency (RF) signal, and the structure defines the inner region and an outer region and is configured to substantially isolate the inner region from the outer region Electromagnetic radiation; controlling at least a portion of the individual phases of the plurality of individual radio frequency (RF) test signals to provide a plurality of phase controlled radio frequency (RF) signals; Combining at least the plurality of phase controlled radio frequency (RF) signals to provide a composite radio frequency (RF) signal; measuring the composite radio frequency (RF) signal at each of a plurality of frequencies of the plurality of radio frequency (RF) signals a power level; computing a plurality of power level differences between the signal power levels of the plurality of pairs of the plurality of radio frequency (RF) signal frequencies; and repeating the receiving, controlling, and combining until at least one Each of the plurality of power level deviation values has a value between a preset minimum value and a maximum value.
10‧‧‧控制器 10‧‧‧ Controller
11a,11b‧‧‧有線信號介面 11a, 11b‧‧‧Wired signal interface
20‧‧‧對角矩陣 20‧‧‧ diagonal matrix
20a‧‧‧矩陣 20a‧‧‧Matrix
22‧‧‧對角 22‧‧‧ diagonal
24a,24b‧‧‧交叉-耦合係數 24a, 24b‧‧‧cross-coupling coefficient
100‧‧‧測試器 100‧‧‧Tester
100a‧‧‧測試器 100a‧‧‧Tester
102‧‧‧天線 102‧‧‧Antenna
102a,102b,102n‧‧‧測試器天線 102a, 102b, 102n‧‧‧ tester antenna
102aa,102ab,102am,102ba,102bm‧‧‧天線元件 102aa, 102ab, 102am, 102ba, 102bm‧‧‧ antenna elements
103a‧‧‧射頻(RF)測試信號 103a‧‧‧RF (RF) test signal
103ai‧‧‧主入射信號分量 103ai‧‧‧main incident signal component
103aa,103ab,103am,103bb,103ba‧‧‧信號 103aa, 103ab, 103am, 103bb, 103ba‧‧‧ signals
103br,103cr‧‧‧反射信號分量 103br,103cr‧‧‧reflected signal component
104‧‧‧導電信號連接器 104‧‧‧Conductive signal connector
104a,104b,104n‧‧‧測試器連接器 104a, 104b, 104n‧‧‧ tester connector
105a,105b,105n‧‧‧測試信號 105a, 105b, 105n‧‧‧ test signals
106‧‧‧射頻(RF)同軸纜線 106‧‧‧RF (RF) coaxial cable
106a,106b,106n‧‧‧測試纜線 106a, 106b, 106n‧‧‧ test cable
107‧‧‧測試連接 107‧‧‧Test connection
107a‧‧‧頻道 107a‧‧ Channel
110,110a,110b,110n‧‧‧信號源 110, 110a, 110b, 110n‧‧‧ signal source
111,111a,111b,111n‧‧‧射頻(RF)測試信號 111, 111a, 111b, 111n‧‧‧ radio frequency (RF) test signals
130,130a,130b‧‧‧射頻(RF)信號控制電路 130,130a,130b‧‧‧RF signal control circuit
131aa,131ab,131am‧‧‧射頻(RF)測試信號 131aa, 131ab, 131am‧‧‧ radio frequency (RF) test signals
132‧‧‧信號大小控制電路 132‧‧‧Signal size control circuit
133‧‧‧測試信號 133‧‧‧ test signal
135a,135b,135m‧‧‧射頻(RF)測試信號 135a, 135b, 135m‧‧‧ radio frequency (RF) test signal
136,136a,136b,136m‧‧‧相位控制電路 136, 136a, 136b, 136m‧‧‧ phase control circuit
137,138‧‧‧控制電路 137,138‧‧‧Control circuit
139a,139b,139m‧‧‧控制信號 139a, 139b, 139m‧‧‧ control signals
150‧‧‧射頻(RF)信號控制電路 150‧‧‧ Radio Frequency (RF) Signal Control Circuit
152‧‧‧電路 152‧‧‧ Circuitry
152a,152b‧‧‧相位控制元件 152a, 152b‧‧‧ phase control components
155a‧‧‧回饋信號 155a‧‧‧ feedback signal
155b‧‧‧信號 155b‧‧‧ signal
200,200a‧‧‧受測裝置(DUT) 200,200a‧‧‧Device under test (DUT)
201a,201aa‧‧‧回饋資料 201a, 201aa‧‧‧Reward information
202,202a,202b,202n‧‧‧天線 202,202a,202b,202n‧‧‧Antenna
203‧‧‧輻射電磁信號/信號 203‧‧‧radiating electromagnetic signals/signals
203a‧‧‧受測裝置(DUT)信號 203a‧‧‧Device under test (DUT) signal
203b,203c‧‧‧信號分量 203b, 203c‧‧‧ signal components
203br,203cr‧‧‧反射信號分量 203br, 203cr‧‧‧ reflected signal component
203ai‧‧‧主入射信號分量 203ai‧‧‧main incident signal component
203i‧‧‧入射信號分量 203i‧‧‧incident signal component
203r‧‧‧反射信號分量 203r‧‧‧reflected signal component
204‧‧‧導電信號連接器 204‧‧‧Conductive signal connector
204a,204b,204n‧‧‧受測裝置(DUT)連接器 204a, 204b, 204n‧‧‧Device under test (DUT) connector
207ap,207bp‧‧‧相位控制信號 207ap, 207bp‧‧‧ phase control signal
210,210a,210b,210n‧‧‧射頻(RF)信號接收器 210, 210a, 210b, 210n‧‧‧ Radio Frequency (RF) Signal Receiver
211‧‧‧傳達測試信號 211‧‧‧Communication test signal
211a,211b,211n‧‧‧射頻(RF)測試信號 211a, 211b, 211n‧‧‧ radio frequency (RF) test signals
300,300b‧‧‧屏蔽外殼 300,300b‧‧‧Shielded enclosure
301‧‧‧內部 301‧‧‧Internal
301a,301b‧‧‧內部區域 301a, 301b‧‧‧Internal area
301d‧‧‧端面 301d‧‧‧ end face
302,304,306‧‧‧內部表面 302,304,306‧‧‧Internal surface
320‧‧‧射頻(RF)吸收劑材料 320‧‧‧ Radio Frequency (RF) Absorbent Materials
232,232a,232b‧‧‧控制信號增益級 232, 232a, 232b‧‧‧ control signal gain stage
234‧‧‧信號結合電路 234‧‧‧Signal combining circuit
235‧‧‧複合測試信號 235‧‧‧Complex test signal
235a,235b‧‧‧天線陣列 235a, 235b‧‧‧ antenna array
236a,236b,236c,236d,236e,236g,236h,236i,236j,236k,236l,236m,236n,236o,236p‧‧‧相位控制電路 236a, 236b, 236c, 236d, 236e, 236g, 236h, 236i, 236j, 236k, 236l, 236m, 236n, 236o, 236p ‧ ‧ phase control circuit
237a,237b,237n‧‧‧相位-受控測試信號 237a, 237b, 237n‧‧‧ phase-controlled test signals
242‧‧‧控制系統 242‧‧‧Control system
242b‧‧‧控制電路 242b‧‧‧Control circuit
242aa,242ab,242an,243aa,243ab,243an‧‧‧功率測量信號 242aa, 242ab, 242an, 243aa, 243ab, 243an‧‧‧ power measurement signals
242ca,242cb,242cn‧‧‧相位偵測器 242ca, 242cb, 242cn‧‧‧ phase detector
242d‧‧‧控制電路 242d‧‧‧Control circuit
243a,243b,243n‧‧‧功率測量信號 243a, 243b, 243n‧‧‧ power measurement signals
243ba,243bb,243bn‧‧‧相位控制信號 243ba, 243bb, 243bn‧‧‧ phase control signals
243ca,243cb,243cn‧‧‧相位資料 243ca, 243cb, 243cn‧‧‧ phase data
243da,243dn,243db‧‧‧相位控制信號 243da, 243dn, 243db‧‧‧ phase control signal
244‧‧‧替代下游控制系統 244‧‧‧Replacement of downstream control systems
244a‧‧‧功率測量電路 244a‧‧‧Power measurement circuit
244b‧‧‧控制電路 244b‧‧‧Control circuit
245a,245b,245n,245ba,245bb,245bn‧‧‧相位控制信號 245a, 245b, 245n, 245ba, 245bb, 245bn‧‧‧ phase control signals
410,420,430,440‧‧‧流程 410,420,430,440‧‧‧Process
411,412,413,414,415,416,417,418,421,422,423,424,425,426,427,431,432,433,434,435,441,442,443,444,445,446,447,448,449,450,451‧‧‧步驟 411,412,413,414,415,416,417,418,421,422,423,424,425,426,427,431,432,433,434,435,441,442,443,444,445,446,447,448,449,450,451‧‧
510‧‧‧擴大部分 510‧‧‧Expanded
511‧‧‧頻率頻帶 511‧‧‧frequency band
521‧‧‧上部分布圖 521‧‧‧ upper map
522,523‧‧‧響應分布圖 522, 523‧‧‧ response map
h11,h22,hnn‧‧‧頻道 H11, h22, hnn‧‧ channel
h11,h12,h22,h21,h1n,h2n,hn1,hn2‧‧‧頻道 H11, h12, h22, h21, h1n, h2n, hn1, hn2‧‧ channel
圖1描繪無線信號收發器的典型操作及可能的測試環境。 Figure 1 depicts a typical operation of a wireless signal transceiver and a possible test environment.
圖2描繪使用導電測試信號路徑之無線信號收發器測試環境。 Figure 2 depicts a wireless signal transceiver test environment using a conductive test signal path.
圖3描繪使用導電信號路徑之MIMO無線信號收發器測試環境及該等測試環境之頻道模型。 3 depicts a MIMO wireless signal transceiver test environment using conductive signal paths and a channel model for such test environments.
圖4描繪使用輻射電磁信號之MIMO無線信號收發器測試環境及該等測試環境之頻道模型。 4 depicts a MIMO wireless signal transceiver test environment using radiated electromagnetic signals and a channel model for such test environments.
圖5描繪一依據例示性實施例之測試環境，於該測試環境中可使用輻射電磁測試信號測試MIMO DUT。 FIG. 5 depicts a test environment in which an MIMO DUT can be tested using a radiated electromagnetic test signal in accordance with an exemplary embodiment.
圖6描繪一測試環境，於此在屏蔽外殼內使用輻射電磁測試信號測試DUT。 Figure 6 depicts a test environment where the DUT is tested using a radiant electromagnetic test signal within the shielded enclosure.
圖7及圖8描繪測試環境之例示性實施例，於此於減小多路徑信號效應之屏蔽外殼內使用輻射電磁測試信號測試無線DUT。 7 and 8 depict an exemplary embodiment of a test environment for testing a wireless DUT using a radiated electromagnetic test signal within a shielded enclosure that reduces multipath signal effects.
圖9描繪於圖7及圖8之測試環境中使用之依據例示性實施例之屏蔽外殼之實體表示。 Figure 9 depicts a physical representation of a shielded enclosure in accordance with an exemplary embodiment for use in the test environment of Figures 7 and 8.
圖10描繪根據例示性實施例的一測試環境，其中可使用輻射電磁測試信號測試一受測裝置(DUT)。 10 depicts a test environment in which a device under test (DUT) can be tested using a radiated electromagnetic test signal, in accordance with an illustrative embodiment.
圖11描繪根據例示性實施例的另一測試環境，其中可使用輻射電磁測試信號測試一受測裝置(DUT)。 11 depicts another test environment in which a device under test (DUT) can be tested using a radiated electromagnetic test signal, in accordance with an illustrative embodiment.
圖12描繪使用圖11之該測試環境下，用於測試一受測裝置(DUT)的一例示性演算法。 Figure 12 depicts an exemplary algorithm for testing a device under test (DUT) using the test environment of Figure 11.
圖13描繪根據例示性實施例另一測試環境，其中可使用輻射電磁測試信號測試一受測裝置(DUT)。 13 depicts another test environment in which a device under test (DUT) can be tested using a radiated electromagnetic test signal, in accordance with an illustrative embodiment.
圖14描繪使用圖13之該測試環境下，用於測試一受測裝置(DUT)的一例示性演算法。 Figure 14 depicts an exemplary algorithm for testing a device under test (DUT) using the test environment of Figure 13.
圖15描繪根據例示性實施例另一測試環境，其中可使用輻射電磁測試信號測試一受測裝置(DUT)。 15 depicts another test environment in which a device under test (DUT) can be tested using a radiated electromagnetic test signal, in accordance with an illustrative embodiment.
圖16描繪使用圖15之該測試環境下，用於測試一受測裝置(DUT)的一例示性演算法。 Figure 16 depicts an exemplary algorithm for testing a device under test (DUT) using the test environment of Figure 15.
圖17描繪根據例示性實施例由一受測裝置(DUT)於補償前傳送之在一經定義頻率範圍內之一測試信號。 17 depicts a test signal transmitted over a defined frequency range by a device under test (DUT) prior to compensation, in accordance with an exemplary embodiment.
圖18描繪根據例示性實施例於補償前與補償後圖17中的該掃瞄測試信號，以及圖10、11、13與15中之該測試環境的例示性相位位移值。 18 depicts the scan test signal of FIG. 17 before and after compensation, and the exemplary phase shift values of the test environment of FIGS. 10, 11, 13, and 15 in accordance with an exemplary embodiment.
圖19描繪進行如圖18中所描述之補償的一例示性演算法。 Figure 19 depicts an exemplary algorithm for performing the compensation as described in Figure 18.
圖20描繪根據例示性實施例用於測試使用多重測試信號相位位移進行 補償之一無線受測裝置(DUT)的另一測試環境。 20 depicts a test for phase shift using multiple test signals, in accordance with an illustrative embodiment Compensating for another test environment for one wireless device under test (DUT).
圖21描繪根據附加例示性實施例圖20中具有用於補償的附加測試信號增益調整的該測試環境。 21 depicts the test environment of FIG. 20 with additional test signal gain adjustments for compensation, in accordance with an additional exemplary embodiment.
下列係本發明之例示性實施例於參照附圖下的詳細說明。此等說明意欲為說明性的而非限制本發明之範疇。該等實施例係以足夠細節予以說明使得本領域具通常知識者得以實施本發明，但應理解，可在不脫離本發明之精神及範疇的情況下，可以某些改變來實施其他實施例。 The following illustrative embodiments of the invention are described in detail with reference to the drawings. The description is intended to be illustrative, and not to limit the scope of the invention. The embodiments are described in sufficient detail to enable those skilled in the art to practice the invention. It is understood that other embodiments may be practiced without departing from the spirit and scope of the invention.
在本揭示各處，如無相反於本文的明確指示，可理解所描述之各別電路元件在數目上可為單一的或是複數的。舉例而言，「電路」及「電路系統」一詞可包括一單一個元件或複數個元件，其可為主動的及/或被動的，且連接的或耦合的在一起(舉例而言，如同一或複數個積體電路晶片)來提供描述的功能。另外，「信號」可參照一或複數個電流、一或複數個電壓或資料信號。在圖式之中，類似的或相關的元件會有類似的或相關的字母、數字或文數字標誌符。再者，雖然已經討論使用離散電子電路系統(較佳地以一或複數個積體電路晶片的形式)的情況下實施本發明，惟取決於欲處理的信號頻率或資料率，可另外地使用一或複數個經適當編程的處理器實施該等電路系統之任一部分的功能。再者，於圖形圖解各種實施例之功能區塊圖的情況，該功能區塊不必然地標示硬體電路系統之間的區塊。 Throughout the disclosure, it is to be understood that the various circuit elements described may be singular or plural in number. For example, the terms "circuit" and "circuitry" may include a single element or a plurality of elements, which may be active and/or passive, and connected or coupled together (for example, as One or a plurality of integrated circuit chips) to provide the described functionality. In addition, the "signal" can refer to one or more currents, one or more voltages or data signals. In the drawings, similar or related elements may have similar or related alphanumeric or alphanumeric identifiers. Furthermore, although the invention has been discussed using discrete electronic circuitry (preferably in the form of one or a plurality of integrated circuit wafers), it may additionally be used depending on the frequency or data rate of the signal to be processed. One or more suitably programmed processors implement the functionality of any of the circuitry. Moreover, in the case of graphically illustrating functional block diagrams of various embodiments, the functional blocks are not necessarily indicative of the blocks between the hardware circuitry.
請參考圖1，一無線信號收發器之典型操作環境及理想測試環境(至少就真實世界操作而論)具有無線通信之測試器100及受測裝置 (DUT)200。典型地，亦將使用某種形式之測試控制器10(例如，個人電腦)，以經由有線信號介面11a、11b來與測試器100及受測裝置(DUT)200交換測試命令及資料。測試器100及受測裝置(DUT)200各具有一個(對於MIMO裝置，有多個)各自天線102、202，藉由導電信號連接器104、204(例如，同軸纜線連接，其許多類型係於本領域中所習知的)連接測試器100及受測裝置(DUT)200。測試信號(訊源及回應)係於測試器100與受測裝置(DUT)200之間經由天線102、202無線地載送。舉例而言，於受測裝置(DUT)200之傳輸(TX)測試期間，DUT天線202會輻射電磁信號203。取決於天線發射場型之方向性，此信號203會朝向許多的方向輻射，導致測試器天線102接收到入射信號分量203i及反射信號分量203r。如上文所述，這些反射信號分量203r，通常為多路徑信號效應以及源自其他地方之電磁信號(圖中未繪示)的產物，導致建設性干擾及破壞性信號干擾，因而妨礙可靠的及可重複的信號接收及測試結果。 Please refer to FIG. 1 , a typical operating environment of a wireless signal transceiver and an ideal test environment (at least in terms of real world operation) with a tester 100 and a device under test for wireless communication. (DUT) 200. Typically, some form of test controller 10 (e.g., a personal computer) will also be used to exchange test commands and data with tester 100 and device under test (DUT) 200 via wired signal interfaces 11a, 11b. Tester 100 and device under test (DUT) 200 each have one (for MIMO devices, multiple) respective antennas 102, 202, by conductive signal connectors 104, 204 (eg, coaxial cable connections, many of which are The tester 100 and the device under test (DUT) 200 are connected as is known in the art. Test signals (sources and responses) are wirelessly carried between the tester 100 and the device under test (DUT) 200 via antennas 102, 202. For example, DUT antenna 202 may radiate electromagnetic signal 203 during a transmission (TX) test of device under test (DUT) 200. Depending on the directionality of the antenna transmit pattern, this signal 203 will radiate in many directions, causing the tester antenna 102 to receive the incident signal component 203i and the reflected signal component 203r. As described above, these reflected signal components 203r, which are typically multipath signal effects and products originating from electromagnetic signals elsewhere (not shown), cause constructive interference and destructive signal interference, thus impeding reliable Repeatable signal reception and test results.
請參考圖2，為避免該等不可靠測試結果，使用導電信號路徑(諸如RF同軸纜線106)來連接測試器100及受測裝置(DUT)200之天線連接器104、204，以在測試器100與受測裝置(DUT)200之間提供一致的、可靠及可重複之導電信號路徑來載送測試信號。如上文所述，但是，在測試之前與之後連接及拆接纜線106所需的時間會延長整體的測試時間。 Referring to FIG. 2, in order to avoid such unreliable test results, a conductive signal path (such as RF coaxial cable 106) is used to connect the tester 100 and the antenna connector 104, 204 of the device under test (DUT) 200 for testing. A consistent, reliable, and repeatable conductive signal path is provided between the device 100 and the device under test (DUT) 200 to carry the test signal. As noted above, however, the time required to connect and disconnect the cable 106 before and after testing can extend the overall test time.
請參考圖3，當測試MIMO受測裝置(DUT)200a的時候，用於連接及拆接測試纜線之額外測試時間甚至變得更長。在該等情況中，需要多個測試纜線106來連接相對應之測試器104及受測裝置(DUT)204連接器，使得能夠載送來自測試器100a之RF信號源110(例如，VSG)的RF測 試信號，以由受測裝置(DUT)200a內之RF信號接收器210予以接收。舉例而言，在典型測試環境中，用於測試MIMO裝置之測試器將具有一或多個VSG 110a、110b、…、110n，用以提供相對應之一或多個RF測試信號111a、111b、…、111n(例如，具有可變信號功率、封包內容及資料速率之封包資料信號)。經由各自測試器連接器104a、104b、…、104n及DUT連接器204a、204b、…、204n連接之該等相對應之測試纜線106a、106b、…、106n載送這些信號，以便將接收的RF測試信號211a、211b、…、211n提供予在受測裝置(DUT)200a內之相對應之RF信號接收器210a、210b、…、210n。據此，連接及拆接這些測試纜線106所需之額外測試時間可增加n倍，此n倍對應於測試纜線106之數目。 Referring to FIG. 3, when testing the MIMO device under test (DUT) 200a, the additional test time for connecting and disconnecting the test cable becomes even longer. In such cases, multiple test cables 106 are required to connect the corresponding tester 104 and device under test (DUT) 204 connectors to enable carrying RF signal source 110 (eg, VSG) from tester 100a. RF measurement The test signal is received by the RF signal receiver 210 within the device under test (DUT) 200a. For example, in a typical test environment, a tester for testing a MIMO device will have one or more VSGs 110a, 110b, ..., 110n to provide corresponding one or more RF test signals 111a, 111b, ..., 111n (for example, a packet data signal with variable signal power, packet content, and data rate). The corresponding test cables 106a, 106b, ..., 106n connected via respective tester connectors 104a, 104b, ..., 104n and DUT connectors 204a, 204b, ..., 204n carry these signals so as to be received The RF test signals 211a, 211b, ..., 211n are provided to corresponding RF signal receivers 210a, 210b, ..., 210n within the device under test (DUT) 200a. Accordingly, the additional test time required to connect and disconnect these test cables 106 can be increased by a factor of n, which corresponds to the number of test cables 106.
如上文所述，使用連接測試器100a及受測裝置(DUT)200a之測試纜線確實具有提供一致、可靠及可重複測試連接之優點。如熟悉該技藝者所習知，該些測試連接107可模擬為一信號頻道H，其特徵在於一對角矩陣20，其中該對角矩陣元素22係對應於針對該個別信號頻道特性(例如，該個別測試纜線106的信號路徑傳導性或損耗)之直接-耦合係數h11，h22，…，hnn(hij，其中i=j)。 As described above, the test cable using the connection tester 100a and the device under test (DUT) 200a does have the advantage of providing a consistent, reliable, and repeatable test connection. As is known to those skilled in the art, the test connections 107 can be modeled as a signal channel H characterized by a pair of angular matrices 20, wherein the diagonal matrix elements 22 correspond to channel characteristics for the individual signals (eg, The direct-coupling coefficients h 11 , h 22 , . . . , h nn (h ij , where i=j) of the signal path conductance or loss of the individual test cable 106.
請參考圖4，依據一或多項例示性實施例，由測試器100a與受測裝置(DUT)200a之間對應於無線信號介面106a之無線頻道107a取代導電(或有線的)頻道107(圖3)。如上文所述，測試器100a及受測裝置(DUT)200a經由各自天線102、202陣列傳達測試信號111、211。此類型測試環境中，不使用一對角矩陣20代表該信號頻道107a，而使用具有一或多個非零交叉-耦合係數24a、24b(hij，其中i≠j)除去該對角22的一矩陣20a來代表 該信號頻道107a。本領域中習此項技術者將易於明白，此係歸因於頻道107a中有多個可用的無線信號路徑。舉例而言，不同於纜線信號環境，於此理想上各DUT連接器204僅接收來自其相對應之測試器連接器104的信號。在此無線頻道107a中，第一DUT天線202a接收由所有測試器天線102a、102b、…、102n輻射之測試信號，例如，對應於頻道矩陣H係數h11、h12、…、及h1n。 Referring to FIG. 4, in accordance with one or more exemplary embodiments, a conductive (or wired) channel 107 is replaced by a wireless channel 107a corresponding to the wireless signal interface 106a between the tester 100a and the device under test (DUT) 200a (FIG. 3). ). As described above, tester 100a and device under test (DUT) 200a communicate test signals 111, 211 via respective arrays of antennas 102, 202. This type of testing environment, without the use of a diagonal matrix signal 20 representing the channel 107a, and having one or more non-zero cross - coupling coefficients 24a, 24b (h ij, where i ≠ j) removing the diagonal 22 A matrix 20a represents the signal channel 107a. It will be readily apparent to those skilled in the art that this is due to the plurality of available wireless signal paths in channel 107a. For example, unlike cable signal environments, each DUT connector 204 desirably receives only signals from its corresponding tester connector 104. In this wireless channel 107a, the first DUT antenna 202a receives test signals radiated by all of the tester antennas 102a, 102b, ..., 102n, for example, corresponding to channel matrix H coefficients h 11 , h 12 , ..., and h 1n .
依據習知的原理，頻道矩陣H之係數h對應於頻道107a之特性，該特性影響RF測試信號之傳輸及接收。這些係數h聯合地界定頻道條件數k(H)，其為H矩陣之範數與H之反矩陣之範數的乘積，如以下方程式所表示：k(H)=||H||*||H1| According to conventional principles, the coefficient h of the channel matrix H corresponds to the characteristics of the channel 107a, which affects the transmission and reception of the RF test signal. These coefficients h jointly define the channel condition number k(H), which is the product of the norm of the H matrix and the norm of the inverse matrix of H, as expressed by the following equation: k(H)=||H||*| |H 1 |
影響這些係數的因素會改變頻道條件數，從而也會影響測量的誤差。舉例而言，在條件不佳之頻道中，小誤差可在測試結果中造成大誤差。在頻道數低的情況中，該頻道中的小誤差可在接收(RX)天線產生小測量誤差。但是，在頻道數高的情況中，該頻道中的小誤差可在接收天線產生大測量誤差。此頻道條件數k(H)亦對實體DUT在其測試環境(例如，屏蔽外殼)內之定位與定向及其各種天線204之定向敏感。據此，即使沒有源自其他地方或經由反射再入射接收天線204的外來干擾信號，可重複精確測試結果的可能性仍然很低。 Factors affecting these coefficients change the number of channel conditions and thus the measurement error. For example, in a poorly qualified channel, small errors can cause large errors in the test results. In the case of a low number of channels, small errors in the channel can produce small measurement errors at the receiving (RX) antenna. However, in the case where the number of channels is high, a small error in the channel can cause a large measurement error at the receiving antenna. This channel condition number k(H) is also sensitive to the positioning and orientation of the physical DUT within its test environment (e.g., shielded enclosure) and the orientation of its various antennas 204. Accordingly, even if there is no external interference signal originating from other places or re-incident to the receiving antenna 204 via reflection, the possibility of repeating the accurate test result is still low.
請參考圖5，依據一或多項例示性實施例，測試器100a與受測裝置(DUT)200a之間的測試信號介面可為無線。受測裝置(DUT)200a被安置在屏蔽外殼300之內部301內。該等屏蔽外殼300可實作為金屬外 殼，例如，其建構或至少效力方面類似於法拉第籠(Faraday cage)。此使受測裝置(DUT)200a隔離於源自於外殼300之外部區域302的輻射信號。依據例示性實施例，外殼300之幾何形狀使得其作用為一封閉式波導。 Referring to FIG. 5, in accordance with one or more exemplary embodiments, the test signal interface between the tester 100a and the device under test (DUT) 200a may be wireless. A device under test (DUT) 200a is disposed within the interior 301 of the shielded enclosure 300. The shielded outer casing 300 can be used as a metal The shell, for example, is constructed or at least in a similar aspect to the Faraday cage. This isolates the device under test (DUT) 200a from radiation signals originating from the outer region 302 of the outer casing 300. According to an exemplary embodiment, the geometry of the outer casing 300 is such that it acts as a closed waveguide.
在別處，例如，在外殼300之內部表面302內或在其對面上安置多個(n)天線陣列102a、102b、…、102n，該天線陣列之各者輻射源自於測試器100a內之測試信號源110a、110b、…、110n的多個相位受控RF測試信號103a、103b、…、103n(於下文中更詳細論述)。各天線陣列包含多個(M)天線元件。舉例而言，第一天線陣列102a包含m個天線102aa、102ab、…、102am。由各自RF信號控制電路130a提供的各自相位受控RF測試信號131aa、131ab、…、131am驅動這些天線元件102aa、102ab、…、102am之各者。 Elsewhere, for example, a plurality (n) of antenna arrays 102a, 102b, ..., 102n are disposed within or opposite the inner surface 302 of the outer casing 300, each of which radiates a test originating from the tester 100a A plurality of phase controlled RF test signals 103a, 103b, ..., 103n of signal sources 110a, 110b, ..., 110n (discussed in more detail below). Each antenna array includes a plurality of (M) antenna elements. For example, the first antenna array 102a includes m antennas 102aa, 102ab, ..., 102am. The respective phase-controlled RF test signals 131aa, 131ab, ..., 131am provided by the respective RF signal control circuits 130a drive each of these antenna elements 102aa, 102ab, ..., 102am.
如第一RF信號控制電路130a之實例中所描述，藉由信號大小(signal magnitude)控制電路132增加(例如，放大)或減小(例如，衰減)來自第一RF測試信號源110a之RF測試信號111a的大小。藉由信號複製電路134(例如，信號除法器)複製經大小控制的測試信號133。藉由各自相位控制電路136a、136b、…、136m相位控制(例如，移位)經大小控制與複製的RF測試信號135a、135b、…、135m之各自信號，以產生大小及相位受控信號131aa、131ab、…、131am來驅動天線陣列102a之天線元件102aa、102ab、…、102am。 The RF test from the first RF test signal source 110a is increased (eg, amplified) or reduced (eg, attenuated) by a signal magnitude control circuit 132 as described in the example of the first RF signal control circuit 130a. The size of the signal 111a. The size controlled test signal 133 is copied by a signal replica circuit 134 (e.g., a signal divider). The respective signals of the size-controlled and replicated RF test signals 135a, 135b, ..., 135m are phase controlled (e.g., shifted) by respective phase control circuits 136a, 136b, ..., 136m to produce a size and phase controlled signal 131aa 131ab, ..., 131am drive the antenna elements 102aa, 102ab, ..., 102am of the antenna array 102a.
藉由相對應之RF信號控制電路130b、…、130m以類似方式驅動其餘天線陣列102b、…、102n及其各自天線元件。此產生相對應數目之複合輻射信號103a、103b、…、103n，依據頻道矩陣H，藉由受測裝置 (DUT)200a之天線202a、202b、…、202n予以載送及接收，如上文所述。受測裝置(DUT)200a處理其相對應之接收測試信號211a、211b、…、211m並且提供指示這些經接收信號之特性(例如，大小、相對相位等)的一或多個回饋信號201。這些回饋信號201a被提供至RF信號控制電路130內的控制電路138。此控制電路138提供用於大小控制電路132及相位控制電路136的控制信號137、139a、139b、…、139m。據此，提供一閉路控制路徑，從而增益及相位控制來自測試器100a之輻射信號，使受測裝置(DUT)200a能接收該信號。(替代地，可包含此控制電路130作為測試器100a之部件)。 The remaining antenna arrays 102b, ..., 102n and their respective antenna elements are driven in a similar manner by corresponding RF signal control circuits 130b, ..., 130m. This produces a corresponding number of composite radiation signals 103a, 103b, ..., 103n, according to the channel matrix H, by the device under test The antennas 202a, 202b, ..., 202n of the (DUT) 200a are carried and received as described above. The device under test (DUT) 200a processes its corresponding received test signals 211a, 211b, ..., 211m and provides one or more feedback signals 201 indicative of the characteristics (e.g., size, relative phase, etc.) of the received signals. These feedback signals 201a are provided to a control circuit 138 within the RF signal control circuit 130. This control circuit 138 provides control signals 137, 139a, 139b, ..., 139m for the size control circuit 132 and the phase control circuit 136. Accordingly, a closed loop control path is provided to gain and phase control the radiated signal from the tester 100a to enable the device under test (DUT) 200a to receive the signal. (Alternatively, this control circuit 130 can be included as part of the tester 100a).
依據習知的頻道最佳化技術，控制電路138使用來自受測裝置(DUT)200a的回饋資料201a，以類似於最小化頻道條件數k(H)的方式改變輻射信號之大小及相位，達成最佳頻道條件並且產生如各DUT天線202處測得之具有約相等大小之經接收信號。此將建置一通信頻道，透過此通信頻道，輻射信號產生的測試結果實質上匹敵使用導電信號路徑(例如，RF信號纜線)產生的測試結果。 In accordance with conventional channel optimization techniques, control circuit 138 uses feedback data 201a from device under test (DUT) 200a to vary the magnitude and phase of the radiated signal in a manner similar to minimizing channel condition number k(H). The best channel conditions and produce received signals of approximately equal magnitude as measured at each DUT antenna 202. This will establish a communication channel through which the radiation signal produces a test result that substantially rivals the test results produced using a conductive signal path (eg, an RF signal cable).
在相繼的傳輸及頻道條件回饋事件後，藉由RF信號控制電路130之控制電路138的此操作將改變各天線陣列102a、102b、…、102n之信號大小及相位，以反覆達成最佳化的頻道條件數k(H)。一旦已達成該等最佳化的頻道條件數k(H)，可保留相對應之量值及相位設定，並且測試器100a及受測裝置(DUT)200a可繼續進行之後的測試序列，如同在纜線測試環境進行一樣。 After successive transmission and channel condition feedback events, this operation of control circuit 138 by RF signal control circuit 130 will change the signal magnitude and phase of each antenna array 102a, 102b, ..., 102n to achieve an optimized The number of channel conditions is k(H). Once the optimized channel condition number k(H) has been achieved, the corresponding magnitude and phase settings may be retained, and the tester 100a and the device under test (DUT) 200a may proceed to the subsequent test sequence as if The cable test environment does the same.
實務上，將一參考DUT安置在屏蔽外殼300內的一測試夾具，用於在透過上文所述之反覆程序最佳化頻道條件中使用。之後，可相 繼測試相同設計之進一步DUT，而不需要在所有例項中執行頻道最佳化，此係因為外殼300之控制的頻道環境中遇到的路徑損失應妥善在正常測試容限內。 In practice, a reference DUT is placed in a test fixture within the shielded enclosure 300 for use in optimizing channel conditions through the repeated procedures described above. After that, the phase Following the testing of further DUTs of the same design, channel optimization is not required in all of the instances, as the path losses encountered in the channel environment controlled by the enclosure 300 should be properly within the normal test tolerances.
仍參考圖5，舉例而言，模型化最初傳輸，以產生頻道條件數13.8db，並且h11及h22係數的大小分別為-28db及-28.5db。頻道H之大小矩陣將表示為如下：k(H)=13.8dB Still referring to FIG. 5, for example, the model is initially transmitted to generate a channel condition number of 13.8 db, and the magnitudes of the h 11 and h 22 coefficients are -28 db and -28.5 db, respectively. The size matrix of channel H will be expressed as follows: k(H)=13.8dB
反覆調整大小及相位後，如上文所述，頻道條件數k(H)減小至2.27db，並且h11及h22係數的大小分別為-0.12db及-0.18db，而產生如下頻道大小矩陣：k(H)=2.27dB After resizing and phase, as described above, the channel condition number k(H) is reduced to 2.27 db, and the h 11 and h 22 coefficients are -0.12 db and -0.18 db, respectively, and the following channel size matrix is generated. : k(H)=2.27dB
這些結果可茲匹敵於使用纜線測試環境的結果，從而顯示此無線測試環境可提供可茲相匹敵的準確度。剔除連接及拆接纜線信號路徑的時間，以及將大小及相位調整的縮短時間列入因素，整體接收信號測試時間顯著地縮短。 These results are comparable to the results of using a cable test environment, showing that this wireless test environment provides comparable accuracy. Eliminating the time of connecting and disconnecting the signal path of the cable, and including the shortening of the size and phase adjustment, the overall received signal test time is significantly shortened.
請參考圖6，可更佳瞭解多路徑信號效應對頻道條件的影響。如上文所述，一旦將受測裝置(DUT)200a安置在外殼300之內部301內，受測裝置(DUT)200a會於傳輸測試期間自各天線202a輻射電磁信號203a。此信號203a包含外向且遠離測試器100a之天線102a輻射的分量203b、 203c。但是，這些信號分量203b、203c反射離開外殼300之內部表面304、306，並且作為反射信號分量203br、203cr入射，而根據多路徑信號條件來與主入射信號分量203ai進行建設性或破壞性的組合。如上文所述，取決於干擾之建設性及破壞性本質，對於用在適當校準及效能檢定中測試結果將通常傾向於不可靠且不準確。 Please refer to Figure 6 for a better understanding of the effects of multipath signal effects on channel conditions. As described above, once the device under test (DUT) 200a is placed within the interior 301 of the housing 300, the device under test (DUT) 200a will radiate the electromagnetic signal 203a from each antenna 202a during the transmission test. This signal 203a includes a component 203b that is outwardly directed away from the antenna 102a of the tester 100a, 203c. However, these signal components 203b, 203c are reflected off the inner surfaces 304, 306 of the outer casing 300 and are incident as reflected signal components 203br, 203cr, and constructively or destructively combined with the main incident signal component 203ai in accordance with multipath signal conditions. . As noted above, depending on the constructive and destructive nature of the interference, the test results used in proper calibration and performance verification will generally tend to be unreliable and inaccurate.
請參考圖7，依據一例示性實施例，RF吸收劑材料320a、320b安置在反射表面304、306處。結果，反射信號分量203br、203cr顯著衰減，從而對主入射信號分量203ai產生較少的建設性或破壞性干擾。 Referring to FIG. 7, in accordance with an exemplary embodiment, RF absorber materials 320a, 320b are disposed at reflective surfaces 304, 306. As a result, the reflected signal components 203br, 203cr are significantly attenuated, resulting in less constructive or destructive interference to the primary incident signal component 203ai.
可包含額外RF信號控制電路150以在天線陣列102a與測試器100a之間使用，該天線陣列102a係安裝在外殼300a之內部301內或內部表面302之上。(替代地，可包含此額外控制電路150作為測試器100a之部件)。入射至天線元件102aa、102ab、…、102am的輻射信號產生經接收的信號103aa、103ab、…、103am，其中由相位控制電路152控制(例如，移位)各自信號相位，該相位控制電路152係依據控制系統156提供的一或多個相位控制信號157a、157b、…、157m控制相位控制元件152a、152b、…、152m。於信號組合器154中將所得相位受控信號153組合，以便將接收的信號155a提供測試器100a且將一回饋信號155b提供控制系統156。控制系統156，其為閉路控制網路之一部份，處理此回饋信號155b，以便視需要調整複合接收信號103aa、103ab、…、103am之各自相位來最小化相關於外殼300a內部區域301之表觀信號路徑損失。在外殼300a內變更受測裝置(DUT)200a之定位與定向情況中，此閉路控制網路亦允許系統重新組態由這些天線102a及相位控制電路152啟用之相位式陣列。結果，使用此回饋迴路最小 化路徑損失後，可達成在外殼300a內使用輻射信號環境準確且可重複地載送DUT信號203a至測試器100a。 Additional RF signal control circuitry 150 may be included for use between antenna array 102a and tester 100a, which is mounted within or on interior surface 301 of housing 300a. (Alternatively, this additional control circuit 150 can be included as part of the tester 100a). The radiation signals incident on the antenna elements 102aa, 102ab, ..., 102am generate received signals 103aa, 103ab, ..., 103am, wherein the respective signal phases are controlled (e.g., shifted) by the phase control circuit 152, the phase control circuit 152 Phase control elements 152a, 152b, ..., 152m are controlled in accordance with one or more phase control signals 157a, 157b, ..., 157m provided by control system 156. The resulting phase controlled signals 153 are combined in a signal combiner 154 to provide the received signal 155a to the tester 100a and a feedback signal 155b to the control system 156. Control system 156, which is part of a closed-loop control network, processes this feedback signal 155b to adjust the respective phases of composite received signals 103aa, 103ab, ..., 103am as needed to minimize the table associated with internal region 301 of housing 300a. Observe the signal path loss. In the case of changing the position and orientation of the device under test (DUT) 200a within the housing 300a, the closed-loop control network also allows the system to reconfigure the phased array enabled by the antennas 102a and phase control circuit 152. As a result, the minimum use of this feedback loop After the path loss, it is achieved that the DUT signal 203a is accurately and reproducibly carried into the tester 100a using the radiated signal environment within the housing 300a.
請參考圖8，可針對DUT接收信號測試達成產生準確且可重複測試結果的類似控制及改進。在此情況中，藉由信號組合器/分離器154複製由測試器100a提供的測試信號111a，並且若需要，在由天線元件102aa、102ab、…、102am輻射之前，由相位控制電路152調整複製的測試信號153之各自相位。如同前述情況中，反射信號分量103br、103cr顯著衰減，從而對主入射信號分量103ai製造較少的建設性或破壞性干擾。來自受測裝置(DUT)200a的一或多個回饋信號203a提供用於控制複製的測試信號153之相位所需的資訊給控制系統156，以最小化相關於外殼300a內部301的表觀信號路徑損失，從而建立一致且可重複信號路徑損失的條件。 Referring to Figure 8, similar controls and improvements can be achieved for DUT receive signal testing that yield accurate and repeatable test results. In this case, the test signal 111a provided by the tester 100a is reproduced by the signal combiner/splitter 154, and if necessary, the phase control circuit 152 adjusts the copy before being radiated by the antenna elements 102aa, 102ab, ..., 102am. The respective phases of the test signals 153. As in the foregoing case, the reflected signal components 103br, 103cr are significantly attenuated, thereby creating less constructive or destructive interference to the primary incident signal component 103ai. One or more feedback signals 203a from the device under test (DUT) 200a provide information needed to control the phase of the replicated test signal 153 to the control system 156 to minimize the apparent signal path associated with the interior 301 of the housing 300a. Loss, thereby establishing a consistent and repeatable condition of signal path loss.
請參考圖9，依據一或多項例示性實施例，可實質上如所示實作屏蔽外殼300b。如上文所述，DUT可定位在外殼300b之內部301之一端面301d、其為內部區域301b之對面，該內部區域301b包含或面對測試器天線陣列102a、102b、…、102n所在之內部表面302(圖5)。位於其間為一內部區域301a，其係由RF吸收劑材料320環繞所構成之波導腔室。 Referring to FIG. 9, in accordance with one or more exemplary embodiments, the shielded outer casing 300b can be implemented substantially as shown. As described above, the DUT can be positioned at one end 301d of the interior 301 of the housing 300b, which is opposite the interior region 301b, which contains or faces the interior surface of the tester antenna arrays 102a, 102b, ..., 102n. 302 (Figure 5). Located therebetween is an inner region 301a surrounded by a RF absorber material 320 that is formed by a waveguide chamber.
如上所述與下述細節，根據本發明系統與方法的例示性實施例可實現無線受測裝置(DUT)的無纜線測試同時進行多路徑效果補償與最佳化信號路徑損耗控制。多重天線，以及天線陣列，配合控制系統可用於調整提供給該天線元件之該測試信號的該相位，該方式模仿(emulate)普遍與一傳導信號路徑環境相關之該穩定與可重複之信號路徑損耗環境，同時使用一屏蔽外殼內的一輻射信號環境。同時該用於調整該移相器的所需時間 屬於該整體所有測試時間的一部份，此調整時間顯著小於用於連接與拆卸測試纜線所需時間，以及可提供包括該天線元件的真實世界測試的附加利益。 As described above and with the following details, an exemplary embodiment of the system and method in accordance with the present invention enables cableless testing of a wireless device under test (DUT) while performing multipath effect compensation and optimized signal path loss control. Multiple antennas, and an antenna array, with a control system that can be used to adjust the phase of the test signal provided to the antenna element, emulating the stable and repeatable signal path loss typically associated with a conductive signal path environment Environment, using a radiation signal environment inside a shielded enclosure. At the same time, the time required to adjust the phase shifter Belonging to a portion of the overall test time, this adjustment time is significantly less than the time required to connect and disassemble the test cable, and may provide additional benefits including real-world testing of the antenna element.
更者，如上所述與下述進一步細節，本發明例示性實施例提供使用具有一寬頻帶寬度之信號(例如電機電子工程學(IEEE)標準802.11ac中所述的160兆赫(MHz)寬信號)之無線受測裝置(DUT)的無纜線測試，同時可達成與使用傳導信號路徑(例如測試纜線)測試等量的測試準確性與測量可重複性。藉由調整提供給該天線元件的該測試信號之相位，該屏蔽測試外殼內所接收的該寬頻帶信號可產生一實質平坦的信號響應。一旦驅動該個別天線元件之個別測試信號相位被調整以產生此一平坦信號響應環境，使用該寬頻帶信號的該測試可直接進行無需經過進一步調整，如同於有纜線的測試環境中進行一般。雖然該屏蔽外殼內的該受測裝置(DUT)之位置可影響該頻道響應的平坦性，此位置敏感性介於信號標準(例如，IEEE 802.11ac)中所述的該測量允許誤差以內。 Furthermore, as described above and in further detail below, exemplary embodiments of the present invention provide for the use of signals having a wide frequency bandwidth (e.g., 160 megahertz (MHz) wide signals as described in the Electrical Engineering of Electrical Engineering (IEEE) standard 802.11ac. The cable-free test of the wireless device under test (DUT), while achieving the same amount of test accuracy and measurement repeatability as using a conductive signal path (eg, test cable). The wideband signal received within the shielded test enclosure produces a substantially flat signal response by adjusting the phase of the test signal provided to the antenna element. Once the individual test signal phases that drive the individual antenna elements are adjusted to produce this flat signal response environment, the test using the wideband signals can be performed directly without further adjustments, as in a cabled test environment. While the location of the device under test (DUT) within the shielded enclosure can affect the flatness of the channel response, this location sensitivity is within the measurement tolerances described in the signal standard (eg, IEEE 802.11ac).
更甚者，根據例示性實施例，該同一屏蔽外殼內的多重受測裝置(DUT)可同時進行此無纜線測試。藉由適當控制與調整驅動該多重天線元件之測試信號的相位與大小，可使用一屏蔽外殼內的一輻射測試信號環境以模仿傳導信號路徑的低串音干擾信號環境。一旦驅動該天線元件的該測試信號之相位與增益(或衰減)根據該例示性實施例被調整後，該多重受測裝置(DUT)之天線所接收的信號將與使用纜線信號路徑所接收的信號等量。例如，此可藉由最大化該頻道矩陣的直接-耦合係數同時最小化該頻道矩陣的交叉-耦合係數(例如，產生該直接-與交叉-耦合係數之間至少10分貝 的差值)達成。 Moreover, according to an exemplary embodiment, the multiple test device (DUT) within the same shielded enclosure can perform this cableless test simultaneously. By properly controlling and adjusting the phase and magnitude of the test signal driving the multiple antenna elements, a radiation test signal environment within the shielded enclosure can be used to mimic the low crosstalk interference signal environment of the conducted signal path. Once the phase and gain (or attenuation) of the test signal driving the antenna element are adjusted in accordance with the exemplary embodiment, the signal received by the antenna of the multiple device under test (DUT) will be received using the cable signal path. The signal is equal. For example, this can be achieved by maximizing the direct-coupling coefficient of the channel matrix while minimizing the cross-coupling coefficient of the channel matrix (eg, generating at least 10 dB between the direct-and cross-coupling coefficients) The difference) is reached.
參考圖10，根據例示性實施例，一受測裝置(DUT)200a係位於該屏蔽外殼300內用於傳送信號測試。經由該受測裝置(DUT)之天線202a所傳送的測試信號203a，係由多重天線元件102a，102b，…，102n接收。所產生之接收信號105a、105b、…、105n的個別信號相位，係由個別相位控制電路236a，236b，…，236n控制與調整。 Referring to FIG. 10, in accordance with an exemplary embodiment, a device under test (DUT) 200a is located within the shielded enclosure 300 for transmitting signal testing. The test signal 203a transmitted via the antenna 202a of the device under test (DUT) is received by the multiple antenna elements 102a, 102b, ..., 102n. The individual signal phases of the generated received signals 105a, 105b, ..., 105n are controlled and adjusted by individual phase control circuits 236a, 236b, ..., 236n.
根據一些例示性實施例，所產生之相位受控測試信號237a、237b、…、237n被送達到一控制系統242(進一步詳述於以下)與信號結合電路234。該控制系統242提供相位控制信號243a、243b、…、243n給相位控制電路236a、236b、…、236n。該結合(例如，加總)之相位受控測試信號237a、237b、…、237n產生用於下游分析例如，VSA(圖未示)的一複合測試信號235。 According to some exemplary embodiments, the generated phase controlled test signals 237a, 237b, ..., 237n are sent to a control system 242 (described in further detail below) and signal combining circuit 234. The control system 242 provides phase control signals 243a, 243b, ..., 243n to the phase control circuits 236a, 236b, ..., 236n. The combined (e.g., summed) phase controlled test signals 237a, 237b, ..., 237n generate a composite test signal 235 for downstream analysis, such as a VSA (not shown).
根據其他實施例，相位受控測試信號237a、237b、…、237n係於信號結合器234中結合以產生複合測試信號235。該複合測試信號235被送達到一替代控制系統244(進一步詳述於以下)，其隨後提供相位控制信號245a、245b、…、245n給相位控制電路236a、236b、…、236n。 According to other embodiments, phase controlled test signals 237a, 237b, ..., 237n are combined in signal combiner 234 to produce composite test signal 235. The composite test signal 235 is sent to an alternate control system 244 (described in further detail below) which then provides phase control signals 245a, 245b, ..., 245n to the phase control circuits 236a, 236b, ..., 236n.
參考圖11，根據一例示性實施例，線上控制系統242包括用於測量相位受控測試信號237a、237b、…、237n的個別功率位準之功率測量電路242aa、242ab、…、242an。所產生之顯示個別測試信號功率位準之功率測量信號243aa、243ab、…、243an，係提供給控制電路242b(例如為數位信號處理器(DSP)形式)，其隨後提供適當相位控制信號243ba、243bb、…、243bn給相位控制電路236a、236b、…、236n。 Referring to Figure 11, in accordance with an exemplary embodiment, on-line control system 242 includes power measurement circuits 242aa, 242ab, ..., 242an for measuring individual power levels of phase-controlled test signals 237a, 237b, ..., 237n. The resulting power measurement signals 243aa, 243ab, ..., 243an that display the individual test signal power levels are provided to control circuitry 242b (e.g., in the form of a digital signal processor (DSP)), which then provides appropriate phase control signals 243ba, 243bb, ..., 243bn are given to phase control circuits 236a, 236b, ..., 236n.
參考圖12，根據一例示性實施例，圖11中該測試環境的操作方式410可如顯示進行。第一，於步驟411中初始化該移相器236a、236b、…、236n，例如設定所有相位位移值為一相同參考相位值或個別參考相位值。接著，於步驟412中測量相位受控信號237a、237b、…、237n的功率位準。接著，於步驟413中加總該測量功率值，於步驟414中比較該累計測量信號功率與一先前累計測量信號功率。於步驟415中，若該目前累計測量功率高於該先前累計測量功率，則儲存該目前相位位移值與累計測量功率，而後，於步驟416中比較該些儲存值與該期望準則(例如，一最大化累計測量功率)。於步驟417中，若滿足此準則，則停止調整該測試信號相位。若否，則繼續調整該測試信號相位。 Referring to Figure 12, in accordance with an exemplary embodiment, the mode of operation 410 of the test environment of Figure 11 can be performed as shown. First, the phase shifters 236a, 236b, ..., 236n are initialized in step 411, for example, setting all phase shift values to a same reference phase value or individual reference phase values. Next, the power levels of the phase controlled signals 237a, 237b, ..., 237n are measured in step 412. Then, the measured power value is summed in step 413, and the accumulated measured signal power and a previously accumulated measured signal power are compared in step 414. In step 415, if the current cumulative measured power is higher than the previous accumulated measured power, the current phase shift value and the accumulated measured power are stored, and then the stored values are compared with the expected criterion (eg, one in step 416). Maximize cumulative measurement power). In step 417, if the criterion is met, the adjustment of the phase of the test signal is stopped. If not, continue to adjust the phase of the test signal.
同樣地，在步驟414中，若該目前累計測量功率不高於該先前累計測量功率，則繼續調整該測試信號。因此，於步驟418中，移相器236a、236b、…、236n係根據例如一基因演算法(GA)或一粒子群聚演算法(PSA)調整，以給予接收測試信號105a、105b、…、105n另一個相位位移值的組合或排列。該步驟後，重複功率的測量412、加總413與比較414，直到滿足該期望準則。 Similarly, in step 414, if the current accumulated measured power is not higher than the previous accumulated measured power, the test signal is continuously adjusted. Therefore, in step 418, the phase shifters 236a, 236b, ..., 236n are adjusted according to, for example, a genetic algorithm (GA) or a particle swarm optimization algorithm (PSA) to give received test signals 105a, 105b, ..., 105n A combination or permutation of another phase shift value. After this step, the power measurement 412 is repeated, summed 413 and compared 414 until the desired criterion is met.
參考圖13，根據另一例示性實施例，該替代下游控制系統244(圖10)其包括功率測量電路244a(例如，一VSA)與控制電路244b(例如，一數位信號處理器(一DSP))。複合信號235的功率位準係由功率測量電路244a測量，以提供功率測量資料245a給控制電路244b。隨後，控制電路244b提供適當相位控制信號245ba、245bb、…、245bn給移相器236a、236b、…、236n。 Referring to Figure 13, in accordance with another exemplary embodiment, the alternate downstream control system 244 (Figure 10) includes a power measurement circuit 244a (e.g., a VSA) and a control circuit 244b (e.g., a digital signal processor (a DSP) ). The power level of the composite signal 235 is measured by the power measurement circuit 244a to provide power measurement data 245a to the control circuit 244b. Control circuit 244b then provides appropriate phase control signals 245ba, 245bb, ..., 245bn to phase shifters 236a, 236b, ..., 236n.
參考圖14，如圖之13中該測試環境的操作方式420可如顯示進行。第一，於步驟421中，藉由預先設定一或多個個別相位位移值以初始化移相器236a、236b、…、236n。接著，於步驟422中，測量複合信號235的功率位準，而後於步驟423中，比較該目前測量功率與一先前測量功率位準。於步驟424中，若該目前測量功率位準高於該先前測量功率位準，則儲存該目前相位位移值與測量功率，並於步驟425中用於決定是否已滿足該期望準則(例如，一最大化測量功率位準)。於步驟426中，若滿足該期望準則，則停止調整相位。若不滿足該期望準則，則繼續調整相位。 Referring to Figure 14, the mode of operation 420 of the test environment as shown in Figure 13 can be performed as shown. First, in step 421, phase shifters 236a, 236b, ..., 236n are initialized by setting one or more individual phase shift values in advance. Next, in step 422, the power level of the composite signal 235 is measured, and then in step 423, the current measured power and a previously measured power level are compared. In step 424, if the current measured power level is higher than the previous measured power level, the current phase shift value and the measured power are stored, and used in step 425 to determine whether the desired criterion has been met (eg, one Maximize measurement power level). In step 426, if the desired criterion is met, the phase adjustment is stopped. If the desired criterion is not met, the phase is continuously adjusted.
同樣地，若該目前測量功率不高於該先前測量功率，則繼續調整相位。因此，移相器236a、236b、…、236n係據一最佳化演算法(例如，一GA或PSA)調整，以給予接收測試信號105a、105b、…、105n另一組相位位移值。 Similarly, if the current measured power is not higher than the previously measured power, the phase is continuously adjusted. Thus, phase shifters 236a, 236b, ..., 236n are adjusted according to an optimization algorithm (e.g., a GA or PSA) to give another set of phase shift values for receiving test signals 105a, 105b, ..., 105n.
參考圖15，根據另一個例示性實施例，該線上(in-line)系統242(圖10)包括相位偵測電路242ca、242cb、…、242cn與控制電路242d(例如，一DSP)。相位偵測器242ca、242cb、…、242cn可偵測相位受控信號237a、237b、…、237n的個別信號相位，並提供對應的相位資料243ca、243cb、…、243cn給控制電路242d。根據此資料，控制電路242d提供適當相位控制信號243da、243db、…、243dn給移相器236a、236b、…、236n。 Referring to Figure 15, in accordance with another exemplary embodiment, the in-line system 242 (Figure 10) includes phase detection circuits 242ca, 242cb, ..., 242cn and control circuitry 242d (e.g., a DSP). The phase detectors 242ca, 242cb, ..., 242cn can detect the individual signal phases of the phase controlled signals 237a, 237b, ..., 237n and provide corresponding phase data 243ca, 243cb, ..., 243cn to the control circuit 242d. Based on this information, control circuit 242d provides appropriate phase control signals 243da, 243db, ..., 243dn to phase shifters 236a, 236b, ..., 236n.
參考圖16，如圖15中之該測試環境的操作方式430可如顯示進行。第一，於步驟431中，藉由給予一或多個個別相位位移值初始化移相器236a、236b…、236n。接著，於步驟432中，測量相位受控信號237a、237b、…237n的個別相位(例如，相對於一相同或參考信號相位)。 Referring to Figure 16, the mode of operation 430 of the test environment as in Figure 15 can be performed as shown. First, in step 431, phase shifters 236a, 236b..., 236n are initialized by giving one or more individual phase shift values. Next, in step 432, the individual phases of the phase controlled signals 237a, 237b, ... 237n are measured (e.g., relative to an identical or reference signal phase).
接著，根據該測量之測試信號相位，於步驟433中根據最佳化相位位移值，配置移相器236a、236b…、236n的相位調整。該步驟後，於步驟434中，測量複合信號235的功率位準，以確認達到該期望複合信號功率位準，而後於步驟435中停止相位調整。 Next, based on the measured test signal phase, the phase adjustment of the phase shifters 236a, 236b, ..., 236n is configured in accordance with the optimized phase shift value in step 433. After this step, in step 434, the power level of the composite signal 235 is measured to confirm that the desired composite signal power level is reached, and then the phase adjustment is stopped in step 435.
參考圖17，從恆定功率之受測裝置(DUT)200a的寬頻帶天線202a輻射發出之例示性接收信號203，於屏蔽外殼300內(例如，圖6)具有介於700到6000MHz頻率範圍的良好響應，其實質如該圖所示。可清楚理解到，基於屏蔽外殼300內富有多路徑信號環境，其功率分布圖並不平坦。以根據IEEE標準802.11ac進行通訊的封包資料信號為例，特別重點為介於5000到5160MHz之間的160MHz的寬頻率頻帶。如圖所示，在此頻率頻帶511之內(如信號203分布圖的擴大部份510所示)，該接收信號顯示出大約25分貝(dB)的功率變異。根據例示性實施例，使用如上述之測試環境，並使用多重移相器控制用於驅動該多重天線元件的測試信號相位，本分布圖可經由補償以使該重點頻率頻帶511呈現實質平坦。 Referring to Figure 17, an exemplary received signal 203 radiated from the wideband antenna 202a of a constant power device under test (DUT) 200a has a good frequency range of 700 to 6000 MHz within the shielded enclosure 300 (e.g., Figure 6). In response, its essence is as shown in the figure. It can be clearly understood that the power profile is not flat based on the rich multipath signal environment within the shielded enclosure 300. For example, a packet data signal that communicates according to the IEEE standard 802.11ac is used, with a particular focus on a 160 MHz wide frequency band between 5000 and 5160 MHz. As shown, within this frequency band 511 (as indicated by the enlarged portion 510 of the signal 203 profile), the received signal exhibits a power variation of approximately 25 decibels (dB). According to an exemplary embodiment, using the test environment as described above and using a multiple phase shifter to control the phase of the test signal used to drive the multiple antenna elements, the present map may be compensated such that the focused frequency band 511 is substantially flat.
參考圖18，根據一例示性實施例，此目標可藉由使用多重(例如，16)天線元件102與對應的移相器236來達成。例如，藉由使用一最佳化演算法(進一步詳述於以下)，並僅使用0、90、180與270度的正交相位調整，如此則可能達成一最佳化平坦響應條件523。如示，於補償前，響應分布圖522在本例示性測試信號的160MHz頻帶寬度511之間有高於5分貝的變異。更者，即使該天線陣列已在頻率中點5080MHz達成功率位準的最佳化，如該上部分布圖521所示，接收信號之變異仍為大約5分貝。但是當多重相位調整器236a、236b、…、236p經過適當調整時，即使限制僅使用正 交相位調整，還是可能可以達成變異不高於0.5分貝的響應分布圖523。， Referring to FIG. 18, this object can be achieved by using multiple (e.g., 16) antenna elements 102 and corresponding phase shifters 236, in accordance with an exemplary embodiment. For example, an optimized flat response condition 523 may be achieved by using an optimization algorithm (further detailed below) and using only quadrature phase adjustments of 0, 90, 180, and 270 degrees. As shown, the response profile 522 has a variation of more than 5 dB between the 160 MHz bandwidth 511 of the exemplary test signal prior to compensation. Moreover, even if the antenna array has been optimized for power level at a frequency midpoint of 5080 MHz, as shown in the upper profile 521, the variation of the received signal is still about 5 decibels. However, when the multiple phase adjusters 236a, 236b, ..., 236p are properly adjusted, even if the limit is only used positively With the phase adjustment, it is still possible to achieve a response profile 523 with a variation of no more than 0.5 dB. ,
參考圖19，於圖18中所示的該補償可藉由使用所示流程440加以達成。第一，於步驟441中，定義該期望信號頻帶寬度內的多個頻率數值，而後於步驟442中，定義用於移相器的一組初始相位位移值。於步驟443中，使用此定義相位值設定該移相器，並於步驟444中，測量每一頻率之功率。接著，於步驟445中，運算多對定義頻率的測量功率之差值，並於步驟446中，加總用於評估一函數F，其等於定義最大功率差值與運算功率加總差值之間的差值。 Referring to Figure 19, the compensation shown in Figure 18 can be achieved by using the illustrated flow 440. First, in step 441, a plurality of frequency values within the desired signal bandwidth are defined, and in step 442, a set of initial phase shift values for the phase shifter is defined. In step 443, the phase shifter is set using the defined phase value, and in step 444, the power of each frequency is measured. Next, in step 445, the difference between the measured powers of the plurality of pairs of defined frequencies is calculated, and in step 446, the sum is used to evaluate a function F which is equal to between the defined maximum power difference and the calculated power plus total difference. The difference.
若該目前運算函數F目前大於一先前運算函數F舊有，則於步驟448中保留該移相器值，與並於步驟449中決定是否滿足一期望條件(例如，達成一最大化運算函數F)。若滿足，則於步驟450停止相位調整。若不滿足該期望準則，則繼續調整相位。同樣地，若該目前運算函數F目前不大於一先前運算函數F舊有，則繼續調整相位。於步驟451中，藉由定義移相器值的另一組值繼續調整該些相位，並重複調整相位的步驟443、測量功率步驟444、運算功率差值步驟445與評估該運算函數F步驟446。重複本流程直到於步驟449中滿足該條件。 If the current calculation function F is greater than a previous operation of the current function of the old F, the phase shifter is retained values in Step 448, and the decision in step 449 satisfies a desired condition (e.g., to achieve a maximization operation function F ). If so, the phase adjustment is stopped at step 450. If the desired criterion is not met, the phase is continuously adjusted. Similarly, if the current calculation function F is not greater than a previous operation of the current function of the old F, continue adjusting the phase. In step 451, the phase is further adjusted by defining another set of values of the phase shifter values, and the phase adjustment step 443, the measurement power step 444, the operational power difference step 445, and the evaluation of the operational function F step 446 are repeated. . This process is repeated until the condition is met in step 449.
參考圖20，根據例示性實施例，當進行多重無線受測裝置(DUT)的無纜線測試時，於屏蔽外殼300內使用交叉-耦合信號的情況下，可達成類似補償。(為了本實例之目的，使用二天線陣列235a、235b進行二受測裝置(DUT)200a、200b的測試。然而，可清楚了解在此亦可使用其他數量的受測裝置與天線陣列。更者，應可清楚了解在此所描述的分別的「受測裝置(DUT)」200a、200b可為一單一MIMO受測裝置(DUT)200內的個別接 受器。)如上所述，信號源(例如，VSG)110可提供測試信號111，並以信號分配器234進行複製以提供測試信號235的複本，其用於藉由多重移相器231進行相位位移以驅動該天線陣列235的該天線元件102。該些天線陣列235a、235b提供輻射信號分量103aa、103ab、103ba、103bb，其對應於該頻道矩陣H(例如，如上所述)的直接-耦合與交叉-耦合係數。該些信號分量103aa、103ab、103ba、103bb被受測裝置(DUT)200a、200b的天線202a、202b接收。接收信號資料201a、201b係由受測裝置(DUT)200a、200b提供給控制系統206(例如，一DSP)，其隨後提供適當相位控制信號207ap、207bp給移相器236aa、…、236am、236ba，…、236bm，以用於控制由天線陣列235a、235b的天線元件102aa、…、102am、102ba、…102bm輻射發出的信號之相位。 Referring to FIG. 20, similar compensation can be achieved using a cross-coupled signal within the shielded enclosure 300 when cableless testing of multiple wireless devices under test (DUT) is performed, in accordance with an exemplary embodiment. (For the purposes of this example, two antenna arrays 235a, 235b are used for testing of the two devices under test (DUT) 200a, 200b. However, it will be apparent that other numbers of devices under test and antenna arrays may be used herein. It should be clearly understood that the respective "device under test (DUT)" 200a, 200b described herein can be an individual connection within a single MIMO device (DUT) 200. Receiver. As described above, a signal source (e.g., VSG) 110 can provide a test signal 111 and replicate with signal distributor 234 to provide a copy of test signal 235 for phase shifting by multiple phase shifters 231 to drive The antenna element 102 of the antenna array 235. The antenna arrays 235a, 235b provide radiated signal components 103aa, 103ab, 103ba, 103bb that correspond to direct-coupling and cross-coupling coefficients of the channel matrix H (eg, as described above). The signal components 103aa, 103ab, 103ba, 103bb are received by the antennas 202a, 202b of the devices under test (DUT) 200a, 200b. The received signal data 201a, 201b is provided by the device under test (DUT) 200a, 200b to a control system 206 (e.g., a DSP), which then provides appropriate phase control signals 207ap, 207bp to phase shifters 236aa, ..., 236am, 236ba. , ..., 236bm, for controlling the phase of the signal radiated by the antenna elements 102aa, ..., 102am, 102ba, ... 102bm of the antenna arrays 235a, 235b.
藉由反覆調整該輻射信號的相位，如上所述，可最大化該直接-耦合頻道矩陣H係數103aa、103ba並最小化該交叉-耦合係數103ab、103bb(例如，藉由使最終的該交叉-耦合係數理想地變成低於該直接-耦合係數至少10分貝)。 By repeatedly adjusting the phase of the radiated signal, as described above, the direct-coupled channel matrix H coefficients 103aa, 103ba can be maximized and minimized by the cross-coupling coefficients 103ab, 103bb (eg, by making the final crossover - The coupling coefficient desirably becomes at least 10 dB below the direct-coupling coefficient).
參考圖21，根據另一例示性實施例，控制系統206可進一步經配置以提供增益控制信號207ag、207bg，以控制經複製的該測試信號111a、111b的大小，以供傳送到該受測裝置(DUT)200a、200b。控制信號增益級(例如，變異增益擴大器或信號衰減器)232a、232b可控制該些信號大小。其可利於進一步最佳化該頻道矩陣H之直接-耦合係數103aa、103ba與交叉-耦合係數103ab、103bb的該相對大小。例如，可標準化直接-耦合係數103aa、103ba的該大小，同時仍可保留足夠的交叉-耦合係數103ab、103bb 衰減(例如，10分貝或更高)。 Referring to Figure 21, in accordance with another exemplary embodiment, control system 206 can be further configured to provide gain control signals 207ag, 207bg to control the size of the replicated test signals 111a, 111b for transmission to the device under test (DUT) 200a, 200b. Control signal gain stages (e.g., variation gain amplifiers or signal attenuators) 232a, 232b can control the signal sizes. It may be advantageous to further optimize the relative size of the direct-coupling coefficients 103aa, 103ba and the cross-coupling coefficients 103ab, 103bb of the channel matrix H. For example, the size of the direct-coupling coefficients 103aa, 103ba can be normalized while still retaining sufficient cross-coupling coefficients 103ab, 103bb Attenuation (for example, 10 decibels or higher).
本發明結構與操作方法的各種其他修改或變更，在不脫離本發明之精神及範疇的情況下，對本領域具通常知識者而言係顯而易見的。儘管已藉由特定較佳實施例說明本發明，應理解本發明如所申請的不應不當地受限於該較佳實施例。吾人意欲以下列的申請專利範圍界定本發明的範疇以及該申請專利範圍內之結構與方法從而涵蓋該等結構與方法之等效者。 Various other modifications and alterations of the present invention will be apparent to those skilled in the art without departing from the scope of the invention. Although the present invention has been described in terms of specific preferred embodiments, it should be understood that the invention should not be The scope of the present invention and the structures and methods within the scope of the claims are intended to cover the equivalent of the structures and methods.
20a‧‧‧矩陣 20a‧‧‧Matrix
22‧‧‧對角 22‧‧‧ diagonal
24a,24b‧‧‧交叉-耦合係數 24a, 24b‧‧‧cross-coupling coefficient
100a‧‧‧測試器 100a‧‧‧Tester
102‧‧‧天線 102‧‧‧Antenna
102a,102b,102n‧‧‧測試器天線 102a, 102b, 102n‧‧‧ tester antenna
104‧‧‧導電信號連接器 104‧‧‧Conductive signal connector
104a,104b,104n‧‧‧測試器連接器 104a, 104b, 104n‧‧‧ tester connector
106a‧‧‧測試纜線 106a‧‧‧Test cable
107a‧‧‧頻道 107a‧‧ Channel
110,110a,110b,110n‧‧‧信號源 110, 110a, 110b, 110n‧‧‧ signal source
111‧‧‧射頻(RF)測試信號 111‧‧‧RF (RF) test signal
200a‧‧‧受測裝置(DUT) 200a‧‧‧Device under test (DUT)
202,202a,202b,202n‧‧‧天線 202,202a,202b,202n‧‧‧Antenna
204‧‧‧導電信號連接器 204‧‧‧Conductive signal connector
204a,204b,204n‧‧‧受測裝置(DUT)連接器 204a, 204b, 204n‧‧‧Device under test (DUT) connector
210a,210b,210n‧‧‧射頻(RF)信號接收器 210a, 210b, 210n‧‧‧ Radio Frequency (RF) Signal Receiver
211‧‧‧傳達測試信號 211‧‧‧Communication test signal
211a,211b,211n‧‧‧射頻(RF)測試信號 211a, 211b, 211n‧‧‧ radio frequency (RF) test signals
Claims (12)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/912,410 US8811461B1 (en) | 2013-03-15 | 2013-06-07 | System and method for testing radio frequency wireless signal transceivers using wireless test signals |
| US13/912,410 | 2013-06-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201448488A true TW201448488A (en) | 2014-12-16 |
| TWI625045B TWI625045B (en) | 2018-05-21 |
Family
ID=52008486
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW103118384A TWI625045B (en) | 2013-06-07 | 2014-05-27 | System and method for testing radio frequency wireless signal transceivers using wireless test signals |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP6464151B2 (en) |
| KR (1) | KR20160018560A (en) |
| CN (1) | CN105283770B (en) |
| TW (1) | TWI625045B (en) |
| WO (1) | WO2014197185A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI816468B (en) * | 2022-07-14 | 2023-09-21 | 國立臺灣大學 | Array RF system |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9485038B2 (en) * | 2014-03-06 | 2016-11-01 | Litepoint Corporation | System and method for enabling automated testing of wireless data packet signal transceivers |
| US10826630B2 (en) * | 2015-01-30 | 2020-11-03 | Rohde & Schwarz Gmbh & Co. Kg | Measuring device, system and method for wirelessly measuring radiation patterns |
| EP3312619B1 (en) * | 2016-10-19 | 2022-03-30 | Rohde & Schwarz GmbH & Co. KG | Test system and method for testing a device under test |
| US9954279B1 (en) * | 2017-06-14 | 2018-04-24 | Rohde & Schwarz Gmbh & Co. Kg | Test system and test method |
| US10658751B2 (en) | 2017-06-21 | 2020-05-19 | Rohde & Schwarz Gmbh & Co. Kg | System and method for phase calibration of an antenna array |
| SE541521C2 (en) * | 2018-01-17 | 2019-10-29 | Bluetest Ab | Apparatus and method for production testing of devices with wireless capability |
| EP3565135B8 (en) * | 2018-04-30 | 2022-06-22 | Rohde & Schwarz GmbH & Co. KG | System and method for inverting a radio channel for broadband signals |
| CN108732489B (en) * | 2018-08-31 | 2023-09-05 | 长鑫存储技术有限公司 | Test method, test equipment, test carrier plate and test system |
| WO2020042906A1 (en) | 2018-08-31 | 2020-03-05 | Changxin Memory Technologies, Inc. | Test methods, tester, load board and test system |
| US11579179B2 (en) * | 2018-09-11 | 2023-02-14 | Jabil Inc. | Method for providing an antenna probe array for a compact anechoic chamber for active and passive antenna over-the-air testing |
| CN110311832B (en) * | 2019-06-25 | 2021-02-05 | 深圳市吉祥腾达科技有限公司 | Wireless signal amplifier working stability test system |
| CN110380216B (en) * | 2019-07-30 | 2021-09-03 | 西安天和防务技术股份有限公司 | Phase configuration method, device, equipment and storage medium in phased array radar |
| JP7405600B2 (en) * | 2019-12-24 | 2023-12-26 | 株式会社アドバンテスト | Electronic component handling equipment, electronic component testing equipment, and sockets |
| CN113890644B (en) * | 2021-11-10 | 2024-03-19 | 广东明创软件科技有限公司 | Radio frequency test method and device, storage medium and electronic equipment |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6657214B1 (en) * | 2000-06-16 | 2003-12-02 | Emc Test Systems, L.P. | Shielded enclosure for testing wireless communication devices |
| US7035594B2 (en) * | 2001-07-02 | 2006-04-25 | Qualcomm Inc. | Method and apparatus for testing and evaluating wireless communication devices |
| JP2005252844A (en) * | 2004-03-05 | 2005-09-15 | Sharp Corp | Receiving apparatus |
| US7599618B2 (en) * | 2005-01-06 | 2009-10-06 | Circadiant Systems, Inc. | Method and apparatus for self-testing of test equipment |
| US8138778B1 (en) * | 2005-03-31 | 2012-03-20 | Stephen William Smith | Apparatus for high density low cost automatic test applications |
| US20070243826A1 (en) * | 2006-04-13 | 2007-10-18 | Accton Technology Corporation | Testing apparatus and method for a multi-paths simulating system |
| WO2008070504A2 (en) * | 2006-11-28 | 2008-06-12 | Aviation Communication & Surveillance Systems Llc | Systems and methods for monitoring transponder performance |
| KR101085564B1 (en) * | 2007-04-27 | 2011-11-24 | 가부시키가이샤 어드밴티스트 | Test instrument and test method |
| US8412112B2 (en) * | 2009-05-06 | 2013-04-02 | Ets-Lindgren, L.P. | Systems and methods for simulating a multipath radio frequency environment |
| US9002287B2 (en) * | 2009-10-09 | 2015-04-07 | Apple Inc. | System for testing multi-antenna devices |
| FR2959894B1 (en) * | 2010-05-07 | 2012-08-03 | Satimo Ind | SYSTEM FOR SIMULATION OF ELECTROMAGNETIC ENVIRONMENTS COMPRISING A NETWORK OF A PLURALITY OF PROBES |
| JP2011257326A (en) * | 2010-06-11 | 2011-12-22 | Panasonic Corp | Antenna evaluation system and antenna evaluation method |
| CN102761378B (en) * | 2011-04-29 | 2014-04-30 | 鸿富锦精密工业（深圳）有限公司 | Radiofrequency detector |
-
2014
- 2014-05-16 JP JP2016518328A patent/JP6464151B2/en not_active Expired - Fee Related
- 2014-05-16 KR KR1020157035587A patent/KR20160018560A/en active Search and Examination
- 2014-05-16 CN CN201480032129.9A patent/CN105283770B/en not_active Expired - Fee Related
- 2014-05-16 WO PCT/US2014/038338 patent/WO2014197185A1/en active Application Filing
- 2014-05-27 TW TW103118384A patent/TWI625045B/en not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI816468B (en) * | 2022-07-14 | 2023-09-21 | 國立臺灣大學 | Array RF system |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2014197185A1 (en) | 2014-12-11 |
| CN105283770A (en) | 2016-01-27 |
| CN105283770B (en) | 2018-01-05 |
| JP6464151B2 (en) | 2019-02-06 |
| JP2016528759A (en) | 2016-09-15 |
| TWI625045B (en) | 2018-05-21 |
| KR20160018560A (en) | 2016-02-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI625045B (en) | System and method for testing radio frequency wireless signal transceivers using wireless test signals | |
| TWI606703B (en) | System and method for testing radio frequency wireless signal transceivers using wireless test signals | |
| TWI606701B (en) | System and method for testing radio frequency wireless signal transceivers using wireless test signals | |
| TWI632782B (en) | System and method for testing radio frequency wireless signal transceivers using wireless test signals | |
| US9774406B2 (en) | System and method for testing radio frequency wireless signal transceivers using wireless test signals | |
| US8917761B2 (en) | System and method for testing radio frequency wireless signal transceivers using wireless test signals | |
| US9439086B2 (en) | Near-field MIMO wireless test systems, structures, and processes | |
| US8811461B1 (en) | System and method for testing radio frequency wireless signal transceivers using wireless test signals | |
| TWI622274B (en) | System and method for testing radio frequency wireless signal transceivers using wireless test signals |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |