TW201423125A - Detecting system for electronic components on circuit board and circuit board functions and method thereof - Google Patents
Detecting system for electronic components on circuit board and circuit board functions and method thereof Download PDFInfo
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一種檢測系統及其方法，尤其是指一種電路板上電子元件與電路板功能檢測的系統及其方法。 A detection system and method thereof, in particular, a system and method for detecting electronic components and circuit boards on a circuit board.
在伺服器的硬體組成中，常以主機板、背板(SASBP)、風扇控制電路板(FCB)、電源控制電路板(PDB)…等電路板組成，而對於各個電路板的功能測試，現有的做法是開發嵌入式的測試設備。 In the hardware composition of the server, it is often composed of a motherboard such as a motherboard, a backplane (SASBP), a fan control circuit board (FCB), a power control circuit board (PDB), etc., and for functional testing of each circuit board, The current practice is to develop embedded test equipment.
而對於測試設備採用嵌入式系統，通常設計會比較複雜，需要考慮的方面很多，例如：需要設計好硬體電路，預留好硬體介面、選擇晶片、設計PCB、打板子、硬體的整體工序都需要進行考慮。 For test equipment using embedded systems, the design is usually more complicated, and there are many aspects to consider. For example, you need to design a hardware circuit, reserve a good hardware interface, select a chip, design a PCB, play a board, and hardware. Processes need to be considered.
然後開發系統上下位機的程式，開發這種測試設備的軟體和硬體的成本會很高的，測試設備的硬體介面功能(例如：IIC、GPIO、SPI、SGPIO…等介面)和數量需要在設計時就預留好，將來如果介面不夠或者需要擴展，很有可能需要硬體升級，成本進一步上升，後期維護的時候，還會遇到下位機韌體(firmware)版本升級等，成本的花費是不斷且高昂的。 Then develop the program of the system upper and lower machine, the cost of developing the software and hardware of the test equipment will be very high, the hardware interface function of the test equipment (such as: IIC, GPIO, SPI, SGPIO, etc.) and the quantity required It is reserved at the time of design. If the interface is not enough or needs to be expanded in the future, it is very likely that hardware upgrade is required, and the cost is further increased. When the maintenance is later, the firmware version of the lower-end firmware will be upgraded. The cost is constant and high.
故由於設計的複雜，實現的工序多，以及後期的維護，使得測試設備的開發非常昂貴。 Therefore, due to the complexity of the design, the number of processes implemented, and the later maintenance, the development of test equipment is very expensive.
綜上所述，可知先前技術中長期以來一直存在檢測電路板上電子元件與電路板功能設計開發不易的問題，因此有必要提出改進的技術手段，來解決此一問題。 In summary, it can be seen that in the prior art, there has been a long-standing problem that the design and development of electronic components and circuit boards on the detection circuit board are not easy, and therefore it is necessary to propose an improved technical means to solve this problem.
有鑒於先前技術存在檢測電路板上電子元件與電路板功能設計開發不易的問題，本發明遂揭露一種電路板上電子元件與電路板功能檢測的系統及其方法，其中：本發明所揭露的電路板上電子元件與電路板功能檢測的系統，其包含：訊號控制端、訊號轉換電路板以及檢測電路板，其中：訊號轉換電路板更包含：訊號傳輸介面、邊界掃描晶片(Boundary Scan Chip，BS晶片)以及多個檢測連接介面。 In view of the prior art, there is a problem that the design and development of electronic components and circuit boards on the detection circuit board are not easy, and the present invention discloses a system and method for detecting the function of electronic components and circuit boards on a circuit board, wherein: the circuit disclosed in the present invention A system for detecting electronic components and circuit boards on a board includes: a signal control terminal, a signal conversion circuit board, and a detection circuit board, wherein: the signal conversion circuit board further comprises: a signal transmission interface, a boundary scan chip (Boundary Scan Chip, BS) Wafer) and multiple detection connection interfaces.
訊號控制端是用以提供檢測資訊以及判斷檢測結果；訊號轉換電路板的訊號傳輸介面是用以與訊號控制端形成電性連接，並自訊號控制端獲得檢測資訊，與提供檢測結果至訊號控制端；訊號轉換電路板的邊界掃描晶片與訊號傳輸介面形成電性連接，邊界掃描晶片具有多個資料傳輸接腳，依據邊界掃描(Boundary Scan)技術將檢測資訊由邊界掃描晶片內的邊界掃描鏈(Boundary Scan Chain)推送至指定的資料傳輸接腳，與推送指定的資料傳輸接腳的檢測結果至測試資料輸出接腳(Test Data Output，TDO)並電性連接至訊號傳輸介面；訊號轉換電路板的多個檢測連接介面分別與邊界掃描晶片指定的資料傳輸接腳電性連接，每一個檢測連接介面用以傳輸指定的資料傳輸接腳的檢測資訊以及傳輸檢測結果；檢測電路板與檢測連接介面其中之一電性連接，並自電性連接的檢測連接介面獲得檢測資訊，以依據檢測資訊進行檢測電路板中電子元件與電路板功能的檢測，並透過檢測連接介面反饋檢測結果。 The signal control terminal is used for providing detection information and judging the detection result; the signal transmission interface of the signal conversion circuit board is used to form an electrical connection with the signal control terminal, and the detection information is obtained from the signal control terminal, and the detection result is provided to the signal control. The boundary scan chip of the signal conversion circuit board is electrically connected to the signal transmission interface, and the boundary scan chip has a plurality of data transmission pins, and the Boundary Scan technology is used to scan the boundary scan chain in the wafer by the boundary scan. (Boundary Scan Chain) is pushed to the specified data transmission pin, and pushes the detection result of the specified data transmission pin to the test data output pin (Test Data Output, TDO) and is electrically connected to the signal transmission interface; the signal conversion circuit The plurality of detection connection interfaces of the board are electrically connected to the data transmission pins designated by the boundary scan chip, and each detection connection interface is used for transmitting the detection information of the specified data transmission pin and transmitting the detection result; detecting the circuit board and detecting the connection One of the interfaces is electrically connected, and the connection of the self-electrical connection is Obtaining detection information detected by the detector circuit board for the electronic component and the circuit board functions according to the detection information, and detecting the interface connection through the detection result of the feedback.
本發明所揭露的電路板上電子元件與電路板功能檢測的方 法，其包含下列步驟：首先，訊號轉換電路板的訊號傳輸介面與訊號控制端形成電性連接，並自訊號控制端獲得檢測資訊；接著，訊號轉換電路板的邊界掃描晶片(Boundary Scan Chip，BS晶片)與訊號傳輸介面形成電性連接，邊界掃描晶片具有多個資料傳輸接腳，依據邊界掃描(Boundary Scan)技術將檢測資訊由邊界掃描晶片內的邊界掃描鏈(Boundary Scan Chain)推送至指定的資料傳輸接腳；接著，訊號轉換電路板的多個檢測連接介面分別與邊界掃描晶片指定的資料傳輸接腳電性連接，每一個檢測連接介面用以傳輸指定的資料傳輸接腳的檢測資訊；接著，檢測電路板與檢測連接介面其中之一電性連接，並自電性連接的檢測連接介面獲得檢測資訊，以依據檢測資訊進行檢測電路板中電子元件與電路板功能的檢測，並透過檢測連接介面反饋檢測結果；接著，將檢測結果由邊界掃描晶片內的邊界掃描鏈推送至測試資料輸出接腳(Test Data Output，TDO)並電性連接至訊號傳輸介面，以由訊號傳輸介面提供檢測結果至訊號控制端；最後，訊號控制端判斷檢測結果。 The method for detecting the function of electronic components and circuit boards on the circuit board disclosed in the present invention The method includes the following steps: first, the signal transmission interface of the signal conversion circuit board is electrically connected to the signal control terminal, and the detection information is obtained from the signal control terminal; and then, the Boundary Scan Chip of the signal conversion circuit board (Boundary Scan Chip, The BS wafer is electrically connected to the signal transmission interface, and the boundary scan wafer has a plurality of data transmission pins, and the detection information is pushed by the Boundary Scan Chain in the boundary scan wafer according to the Boundary Scan technology. The specified data transmission pin; then, the plurality of detection connection interfaces of the signal conversion circuit board are electrically connected to the data transmission pins designated by the boundary scan chip, and each detection connection interface is used for transmitting the detection of the specified data transmission pin. Then, the detecting circuit board is electrically connected to one of the detecting connection interfaces, and the detecting information is obtained from the detecting connection interface of the electrical connection, so as to detect the function of the electronic component and the circuit board in the detecting circuit board according to the detecting information, and Transmitting the detection result through the detection connection interface; then, the detection result is from the side The boundary scan chain in the boundary scan chip is pushed to the test data output pin (Test Data Output (TDO) and electrically connected to the signal transmission interface to provide the detection result to the signal control end by the signal transmission interface; finally, the signal control terminal judges Test results.
本發明所揭露的系統與方法如上，與先前技術之間的差異在於本發明透過訊號轉換電路板的邊界掃描晶片將檢測資訊依據邊界掃描技術推送至指定的資料傳輸接腳，即可由對應的檢測連接介面將檢測資訊提供至檢測電路板，檢測電路板以依據檢測資訊進行檢測電路板中電子元件與電路板功能的檢測，並透過檢測連接介面反饋檢測結果，藉由訊號轉換電路板即可模擬出檢測電路板上不同電子元件的檢測所需要資料與協議，以及模擬出檢測電路板的不同電路功能測試所需要的資料與通信協議，有效的提升 檢測電路板的檢測效率以及避免檢測硬體設計的困難度。 The system and method disclosed in the present invention are as above, and the difference from the prior art is that the present invention scans the wafer through the boundary of the signal conversion circuit board to push the detection information to the designated data transmission pin according to the boundary scan technology, so that the corresponding detection can be performed. The connection interface provides detection information to the detection circuit board, and the detection circuit board detects the function of the electronic components and the circuit board in the detection board according to the detection information, and feeds back the detection result through the detection connection interface, and can simulate by using the signal conversion circuit board. Effectively improve the data and communication protocols required to detect different electronic components on the test board and simulate the different circuit function tests required to detect the circuit board. Detect the detection efficiency of the board and avoid the difficulty of detecting the hardware design.
透過上述的技術手段，本發明可以達成快速且簡易檢測電路板上電子元件與電路板功能的技術功效。 Through the above technical means, the present invention can achieve the technical effect of quickly and easily detecting the functions of electronic components and circuit boards on a circuit board.
以下將配合圖式及實施例來詳細說明本發明的實施方式，藉此對本發明如何應用技術手段來解決技術問題並達成技術功效的實現過程能充分理解並據以實施。 The embodiments of the present invention will be described in detail below with reference to the drawings and embodiments, so that the application of the technical means to solve the technical problems and achieve the technical effects can be fully understood and implemented.
以下首先要說明本發明電路板上電子元件與電路板功能檢測的系統，並請參考「第1圖」所示，「第1圖」繪示為本發明電路板上電子元件與電路板功能檢測的系統方塊圖。 The following is a description of the system for detecting the function of the electronic components and the circuit board on the circuit board of the present invention. Please refer to the "Fig. 1", and the "Fig. 1" shows the function detection of the electronic components and the circuit board on the circuit board of the present invention. System block diagram.
本發明所揭露的電路板上電子元件與電路板功能檢測的系統，其包含：訊號控制端10、訊號轉換電路板20以及檢測電路板30，其中：訊號轉換電路板20更包含：訊號傳輸介面21、邊界掃描晶片22以及多個檢測連接介面23。 The system for detecting the function of the electronic components and the circuit board on the circuit board of the present invention comprises: a signal control terminal 10, a signal conversion circuit board 20 and a detection circuit board 30, wherein: the signal conversion circuit board 20 further comprises: a signal transmission interface 21. A boundary scan wafer 22 and a plurality of detection connection interfaces 23.
訊號控制端10可以是筆記型電腦、平板電腦、手持式裝置(例如：智慧型手機、個人數位助理(Personal Digital Assistant，PDA)…等)，並且訊號控制端10可透過通用序列匯流排(Universal Serial Bus，USB)介面或聯合測試工作群組(Joint Test Action Group，JTAG)介面(在此僅為舉例說明之，並不以此侷限本發明的應用範疇)與訊號轉換電路板20的訊號傳輸介面21形成電性連接，而訊號轉換電路板20的訊號傳輸介面21一般是採用聯合測試工作群組介面以配合與訊號轉換電路板20的邊界掃描晶片22(Boundary Scan Chip，BS晶片)之間依據邊界掃描技術形成電性連接。 The signal control terminal 10 can be a notebook computer, a tablet computer, a handheld device (for example, a smart phone, a personal digital assistant (PDA), etc.), and the signal control terminal 10 can pass through a universal serial bus (Universal). Serial Bus, USB) interface or Joint Test Action Group (JTAG) interface (herein for illustrative purposes only, not limiting the scope of application of the present invention) and signal transmission of signal conversion board 20 The interface 21 is electrically connected, and the signal transmission interface 21 of the signal conversion circuit board 20 generally uses a joint test work group interface to match the boundary scan chip 22 (BS wafer) of the signal conversion circuit board 20. Electrical connections are made in accordance with boundary scan techniques.
上述當訊號控制端10是透過聯合測試工作群組介面與訊號轉換電路板20的訊號傳輸介面21時，則不需要進行任何的介面轉換即可將訊號控制端10與訊號轉換電路板20的訊號傳輸介面21形成電性連接；而當訊號控制端10是透過通用序列匯流排介面與訊號轉換電路板20的訊號傳輸介面21時，則需要透過介面轉換連接器40以將並列傳輸的通用序列匯流排介面轉換為串列傳輸的聯合測試工作群組介面，訊號控制端10即可透過訊號轉換電路板20的訊號傳輸介面21提供檢測資訊。 When the signal control terminal 10 communicates with the signal transmission interface 21 of the signal conversion circuit board 20, the signal control terminal 10 and the signal conversion circuit board 20 can be transmitted without any interface conversion. The transmission interface 21 is electrically connected; and when the signal control terminal 10 is transmitted through the universal serial bus interface and the signal transmission interface 21 of the signal conversion circuit board 20, the interface conversion connector 40 is required to merge the common sequence of parallel transmissions. The interface interface is converted into a joint test work group interface for serial transmission, and the signal control terminal 10 can provide detection information through the signal transmission interface 21 of the signal conversion circuit board 20.
訊號轉換電路板20的邊界掃描晶片22是需要支援JTAG1149.1規範，而現有可支援JTAG1149.1規範例如有Intel80386TM和Intel80486以上處理器，Motorola公司的68040微處理器，Xilinx公司的XC3000以上系列FPGA，Texas Instruction公司的C40系列DSP晶片，DEC的Alpha 21164系列RISC晶片…等，並且訊號轉換電路板20的邊界掃描晶片22可以為電子抹除式可複寫唯讀晶片(Electrically-Erasable Programmable Read-Only Memory，EEPROM)、非易失性隨機訪問記憶體(Non-Volatile Random Access Memory)或快閃晶片(Flash Memory)，在此僅為舉例說明之，並不以此侷限本發明的應用範疇。 The boundary scan chip 22 of the signal conversion circuit board 20 needs to support the JTAG1149.1 specification, and the existing JTAG1149.1 specifications can support the Intel 80386TM and Intel 80486 processors, the Motorola 68040 microprocessor, and the Xilinx XC3000 series FPGA. The C40 series DSP chip of Texas Instruction, the Alpha 21164 series RISC chip of DEC, etc., and the boundary scan chip 22 of the signal conversion circuit board 20 can be an electrically erasable rewritable read-only wafer (Electrically-Erasable Programmable Read-Only) Memory, EEPROM, Non-Volatile Random Access Memory, or Flash Memory are for illustrative purposes only and are not intended to limit the scope of application of the present invention.
訊號轉換電路板20的多個檢測連接介面23分別與訊號轉換電路板20的邊界掃描晶片22指定的資料傳輸接腳電性連接，藉此當訊號轉換電路板20的邊界掃描晶片22獲得檢測資訊時，即可透過邊界掃描技術將檢測資訊由訊號轉換電路板20的邊界掃描晶片22內的邊界掃描鏈推送至指定的資料傳輸接腳，藉此模擬出檢測電路板30上電子元件的檢測所需要資料與協議，以及模擬出 檢測電路板30的電路功能測試所需要的資料與通信協議，並可透過訊號轉換電路板20的檢測連接介面23將檢測資訊進行輸出。 The plurality of detection connection interfaces 23 of the signal conversion circuit board 20 are electrically connected to the data transmission pins designated by the boundary scan chip 22 of the signal conversion circuit board 20, whereby the boundary scan wafer 22 of the signal conversion circuit board 20 obtains detection information. The detection information can be pushed by the boundary scan technology from the boundary scan chain in the boundary scan wafer 22 of the signal conversion circuit board 20 to the designated data transmission pin, thereby simulating the detection device of the electronic component on the detection circuit board 30. Need data and protocols, and simulate The data and communication protocol required for the circuit function test of the circuit board 30 are detected, and the detection information can be output through the detection connection interface 23 of the signal conversion circuit board 20.
上述訊號轉換電路板20的檢測連接介面23包含內部整合電路(Inter-Integrated Circuit，IIC)介面、通用型輸入輸出(General Purpose I/O，GPIO)介面、串列周邊介面(Serial Peripheral Interface，SPI)以及串列通用型輸入輸出(Serial General Purpose I/O，SGPIO)介面，在此僅為舉例說明之，並不以此侷限本發明的應用範疇。 The detection connection interface 23 of the signal conversion circuit board 20 includes an Inter-Integrated Circuit (IIC) interface, a General Purpose I/O (GPIO) interface, and a Serial Peripheral Interface (SPI). And the serial general purpose I/O (SGPIO) interface, which is merely illustrative here, and is not intended to limit the scope of application of the present invention.
檢測電路板30與訊號轉換電路板20的檢測連接介面23其中之一電性連接，並且檢測電路板30透過訊號轉換電路板20的檢測連接介面23獲得電源供應，檢測電路板30即可自電性連接的檢測連接介面23獲得檢測資訊，亦即獲得模擬出檢測電路板30上電子元件的檢測所需要資料與協議，以及模擬出檢測電路板30的電路功能測試所需要的資料與通信協議，檢測電路板30即可以依據檢測資訊進行檢測電路板30中電子元件與電路板功能的檢測，並透過訊號轉換電路板20的檢測連接介面23反饋檢測結果。 The detection circuit board 30 is electrically connected to one of the detection connection interfaces 23 of the signal conversion circuit board 20, and the detection circuit board 30 obtains power supply through the detection connection interface 23 of the signal conversion circuit board 20, and the detection circuit board 30 can be self-powered. The detection connection interface 23 of the sexual connection obtains the detection information, that is, obtains the data and protocol required for simulating the detection of the electronic components on the detection circuit board 30, and simulates the data and communication protocol required for the circuit function test of the detection circuit board 30, The detecting circuit board 30 can detect the function of the electronic component and the circuit board in the detecting circuit board 30 according to the detection information, and feed back the detection result through the detecting connection interface 23 of the signal conversion circuit board 20.
在訊號轉換電路板20的邊界掃描晶片22自訊號轉換電路板20的檢測連接介面23獲得檢測結果之後，會藉由邊界掃描晶片內的邊界掃描鏈推送指定的資料傳輸接腳的檢測結果至測試資料輸出接腳(Test Data Output，TDO)，而測試資料輸出接腳會與訊號轉換電路板20的訊號傳輸介面21電性連接。 After the boundary scan chip 22 of the signal conversion circuit board 20 obtains the detection result from the detection connection interface 23 of the signal conversion circuit board 20, the detection result of the specified data transmission pin is pushed to the test by the boundary scan chain in the boundary scan wafer. The data output pin (Test Data Output, TDO) is electrically connected to the signal transmission interface 21 of the signal conversion circuit board 20.
當然當訊號控制端10是透過聯合測試工作群組介面與訊號轉換電路板20的訊號傳輸介面21時，則不需要進行任何的介面轉換即可將訊號控制端10與訊號轉換電路板20的訊號傳輸介面 21形成電性連接，並可直接透過訊號轉換電路板20的訊號傳輸介面21提供串列格式的檢測結果至訊號控制端10，訊號控制端10即可對檢測結果進行判斷，以進行檢測電路板30中電子元件與電路板功能的檢測。 Of course, when the signal control terminal 10 passes through the joint test work group interface and the signal transmission interface 21 of the signal conversion circuit board 20, the signal of the signal control terminal 10 and the signal conversion circuit board 20 can be performed without any interface conversion. Transmission interface The electrical connection is formed, and the detection result of the serial format is directly transmitted to the signal control terminal 10 through the signal transmission interface 21 of the signal conversion circuit board 20. The signal control terminal 10 can judge the detection result to perform the detection circuit board. 30 electronic component and board function detection.
而當訊號控制端10是透過通用序列匯流排介面與訊號轉換電路板20的訊號傳輸介面21時，則需要透過介面轉換連接器40以將並列傳輸的通用序列匯流排介面轉換為串列傳輸的聯合測試工作群組介面，訊號轉換電路板20的訊號傳輸介面21所提供的串列格式的檢測結果會透過介面轉換連接器40轉換為並列格式的檢測結果，才能提供至訊號控制端10，訊號控制端10即可對檢測結果進行判斷，以進行檢測電路板30中電子元件與電路板功能的檢測。 When the signal control terminal 10 is transmitted through the universal serial bus interface and the signal transmission interface 21 of the signal conversion circuit board 20, the interface conversion connector 40 is required to convert the parallel serial transmission bus interface into serial transmission. The test result of the serial format provided by the signal transmission interface 21 of the signal conversion circuit board 20 is converted into the parallel detection result through the interface conversion connector 40, and can be provided to the signal control terminal 10, the signal The control terminal 10 can judge the detection result to detect the function of the electronic component and the circuit board in the detection circuit board 30.
藉由上述訊號轉換電路板20即可模擬出檢測電路板30上不同電子元件的檢測所需要資料與協議，以及模擬出檢測電路板30的不同電路功能測試所需要的資料與通信協議，有效的提升檢測電路板30的檢測效率以及避免檢測硬體設計的困難度。 By means of the above-mentioned signal conversion circuit board 20, the data and protocol required for detecting the detection of different electronic components on the circuit board 30 can be simulated, and the data and communication protocol required for testing different circuit functions of the detection circuit board 30 can be simulated. The detection efficiency of the detection circuit board 30 is improved and the difficulty in detecting the hardware design is avoided.
接著，以下將以一個實施例來解說本發明的運作方式及流程，以下的實施例說明將同步配合「第1圖」以及「第2圖」所示進行說明，「第2圖」繪示為本發明電路板上電子元件與電路板功能檢測的方法流程圖。 Next, the operation mode and flow of the present invention will be described below by way of an embodiment. The following embodiments will be described with reference to "first figure" and "second figure", and "second figure" is shown as A flow chart of a method for detecting electronic components and circuit boards on a circuit board of the present invention.
請同時參考「第3圖」所示，「第3圖」繪示為本發明電路板上電子元件與電路板功能檢測的系統架構示意圖。 Please refer to "Figure 3" at the same time. "Figure 3" shows the system architecture of the function detection of electronic components and circuit boards on the circuit board of the present invention.
訊號控制端10是透過介面轉換連接器30將訊號控制端10的通用序列匯流排(Universal Serial Bus，USB)介面與訊號轉換電 路板20的訊號傳輸介面21為聯合測試工作群組(Joint Test Action Group，JTAG)介面形成電性連接(步驟110)。 The signal control terminal 10 converts the universal serial bus (USB) interface and the signal to the signal control terminal 10 through the interface conversion connector 30. The signal transmission interface 21 of the circuit board 20 forms an electrical connection for the Joint Test Action Group (JTAG) interface (step 110).
依據邊界掃描(Boundary Scan)技術將訊號轉換電路板20的訊號傳輸介面21電性連接至訊號轉換電路板20的邊界掃描晶片22(步驟120)，訊號轉換電路板20的邊界掃描晶片22是以晶片“EPM1270”作為實現，並且訊號轉換電路板20的第一檢測連接介面231與邊界掃描晶片22的資料傳輸接腳140至資料傳輸接腳143電性連接(步驟130)；第二檢測連接介面232與邊界掃描晶片22的資料傳輸接腳150至資料傳輸接腳152電性連接(步驟130)；第三檢測連接介面233分別與邊界掃描晶片22的資料傳輸接腳153至資料傳輸接腳160電性連接(步驟130)；並且訊號轉換電路板20的第一檢測連接介面231、第二檢測連接介面232與第三檢測連接介面233會分別與電源電性連接，即可透過訊號轉換電路板20的第一檢測連接介面231、第二檢測連接介面232與第三檢測連接介面233提供檢測電路板30的電源。 The signal transmission interface 21 of the signal conversion circuit board 20 is electrically connected to the boundary scan wafer 22 of the signal conversion circuit board 20 according to the Boundary Scan technology (step 120). The boundary scan wafer 22 of the signal conversion circuit board 20 is The chip "EPM1270" is implemented, and the first detecting connection interface 231 of the signal conversion circuit board 20 is electrically connected to the data transmission pin 140 to the data transmission pin 143 of the boundary scan chip 22 (step 130); the second detection connection interface 232 is electrically connected to the data transmission pin 150 to the data transmission pin 152 of the boundary scan wafer 22 (step 130); the third detection connection interface 233 and the data transmission pin 153 to the data transmission pin 160 of the boundary scan wafer 22, respectively. Electrical connection (step 130); and the first detection connection interface 231, the second detection connection interface 232 and the third detection connection interface 233 of the signal conversion circuit board 20 are electrically connected to the power supply respectively, that is, the signal conversion circuit board can be transmitted. The first detection connection interface 231, the second detection connection interface 232, and the third detection connection interface 233 of 20 provide power to the detection circuit board 30.
檢測電路板30的第一連接介面31與訊號轉換電路板20的第一檢測連接介面231電性連接(步驟140)，並且檢測電路板30的第一連接介面31與檢測電路板30的燈號控制元件32電性連接；檢測電路板30的第二連接介面33與訊號轉換電路板20的第二檢測連接介面232電性連接(步驟140)，並且檢測電路板30的第二連接介面33與檢測電路板30的解碼元件34電性連接；檢測電路板30的第三連接介面35與訊號轉換電路板20的第三檢測連接介面233電性連接(步驟140)，並且檢測電路板30的第三連接介面35與檢測電路板30的解碼元件34電性連接。 The first connection interface 31 of the detection circuit board 30 is electrically connected to the first detection connection interface 231 of the signal conversion circuit board 20 (step 140), and detects the first connection interface 31 of the circuit board 30 and the signal of the detection circuit board 30. The control device 32 is electrically connected; the second connection interface 33 of the detection circuit board 30 is electrically connected to the second detection connection interface 232 of the signal conversion circuit board 20 (step 140), and the second connection interface 33 of the detection circuit board 30 is The decoding component 34 of the detection circuit board 30 is electrically connected; the third connection interface 35 of the detection circuit board 30 is electrically connected to the third detection connection interface 233 of the signal conversion circuit board 20 (step 140), and the detection circuit board 30 is The three connection interface 35 is electrically connected to the decoding element 34 of the detection circuit board 30.
由訊號控制端10透過介面轉換連接器40以提供串列格式的第一檢測資訊41以及第二檢測資訊42至訊號轉換電路板20的訊號傳輸介面21(步驟110)。 The signal control terminal 10 transmits the first detection information 41 and the second detection information 42 in the serial format to the signal transmission interface 21 of the signal conversion circuit board 20 through the interface conversion connector 40 (step 110).
訊號轉換電路板20的邊界掃描晶片22即可將第一檢測資訊41透過邊界掃描技術將第一檢測資訊41由訊號轉換電路板20的邊界掃描晶片22內的邊界掃描鏈推送至邊界掃描晶片22的資料傳輸接腳140至資料傳輸接腳143(步驟120)，即可透過訊號轉換電路板20的第一檢測連接介面231將第一檢測資訊41提供至檢測電路板30的第一連接介面31(步驟130)，而檢測電路板30的燈號控制元件32即可依據第一檢測資訊41進行燈號的控制，透過判斷燈號的顯示正確與否即可進行檢測電路板30中電子元件與電路板功能的檢測(步驟140)。 The boundary scan wafer 22 of the signal conversion circuit board 20 can push the first detection information 41 to the boundary scan wafer 22 by the boundary scan chain in the boundary scan wafer 22 of the signal conversion circuit board 20 through the boundary scan technique. The data transmission pin 140 to the data transmission pin 143 (step 120) can provide the first detection information 41 to the first connection interface 31 of the detection circuit board 30 through the first detection connection interface 231 of the signal conversion circuit board 20. (Step 130), and the lamp number control component 32 of the detection circuit board 30 can perform the control of the lamp number according to the first detection information 41, and can perform the detection of the electronic components in the circuit board 30 by determining whether the display of the lamp number is correct or not. Detection of board functionality (step 140).
訊號轉換電路板20的邊界掃描晶片22即可將第二檢測資訊42透過邊界掃描技術將第二檢測資訊42由訊號轉換電路板20的邊界掃描晶片22內的邊界掃描鏈推送至邊界掃描晶片22的資料傳輸接腳150至資料傳輸接腳152(步驟120)，即可透過訊號轉換電路板20的第二檢測連接介面232將第二檢測資訊42提供至檢測電路板30的第二連接介面33(步驟130)，而檢測電路板30的解碼元件34即可依據第二檢測資訊42進行檢測電路板30的解碼元件34的解碼，並將檢測結果43(即第二檢測資訊42的解碼結果)由檢測電路板30的第三連接介面35反饋回訊號轉換電路板20的第三檢測連接介面233(步驟140)。 The boundary scan wafer 22 of the signal conversion circuit board 20 can push the second detection information 42 to the boundary scan wafer 22 from the boundary scan chain in the boundary scan wafer 22 of the signal conversion circuit board 20 through the boundary scan technique. The data transmission pin 150 to the data transmission pin 152 (step 120) can provide the second detection information 42 to the second connection interface 33 of the detection circuit board 30 through the second detection connection interface 232 of the signal conversion circuit board 20. (Step 130), the decoding component 34 of the detection circuit board 30 can perform decoding of the decoding component 34 of the detection circuit board 30 according to the second detection information 42, and the detection result 43 (ie, the decoding result of the second detection information 42) The third connection interface 233 of the signal conversion circuit board 20 is fed back to the third connection interface 35 of the detection circuit board 30 (step 140).
訊號轉換電路板20的第三檢測連接介面233在獲得檢測結果43之後，會藉由邊界掃描晶片20內的邊界掃描鏈推送指定的資料 傳輸接腳153至資料傳輸接腳160的檢測結果43至測試資料輸出接腳(Test Data Output，TDO)，而會再由介面轉換連接器40將串列格式的檢測結果43轉換為並列格式的檢測結果43，以供並列格式的檢測結果43至訊號控制端10(步驟150)，訊號控制端10即可對檢測結果43進行判斷(步驟160)，以進行檢測電路板30中電子元件與電路板功能的檢測。 After the detection result 43 is obtained, the third detection connection interface 233 of the signal conversion circuit board 20 pushes the specified data by the boundary scan chain in the boundary scan wafer 20. The detection result 43 of the transmission pin 153 to the data transmission pin 160 is to the Test Data Output (TDO), and the detection result 43 of the serial format is converted into the parallel format by the interface conversion connector 40. The detection result 43 is used for the detection result 43 of the parallel format to the signal control terminal 10 (step 150), and the signal control terminal 10 can judge the detection result 43 (step 160) to perform detection of the electronic components and circuits in the circuit board 30. Detection of board function.
藉由上述訊號轉換電路板20即可模擬出檢測電路板30上不同電子元件的檢測所需要資料與協議，以及模擬出檢測電路板30的不同電路功能測試所需要的資料與通信協議，有效的提升檢測電路板30的檢測效率以及避免檢測硬體設計的困難度。 By means of the above-mentioned signal conversion circuit board 20, the data and protocol required for detecting the detection of different electronic components on the circuit board 30 can be simulated, and the data and communication protocol required for testing different circuit functions of the detection circuit board 30 can be simulated. The detection efficiency of the detection circuit board 30 is improved and the difficulty in detecting the hardware design is avoided.
綜上所述，可知本發明與先前技術之間的差異在於本發明透過訊號轉換電路板的邊界掃描晶片將檢測資訊依據邊界掃描技術推送至指定的資料傳輸接腳，即可由對應的檢測連接介面將檢測資訊提供至檢測電路板，檢測電路板以依據檢測資訊進行檢測電路板中電子元件與電路板功能的檢測，並透過檢測連接介面反饋檢測結果，藉由訊號轉換電路板即可模擬出檢測電路板上不同電子元件的檢測所需要資料與協議，以及模擬出檢測電路板的不同電路功能測試所需要的資料與通信協議，有效的提升檢測電路板的檢測效率以及避免檢測硬體設計的困難度。 In summary, it can be seen that the difference between the present invention and the prior art is that the present invention pushes the detection information to the designated data transmission pin according to the boundary scan technology through the boundary scan chip of the signal conversion circuit board, and the corresponding detection connection interface can be used. The detection information is provided to the detection circuit board, and the detection circuit board detects the function of the electronic component and the circuit board in the detection circuit board according to the detection information, and detects the detection result through the detection connection interface, and simulates the detection by using the signal conversion circuit board. The data and protocol required for the detection of different electronic components on the board, and the data and communication protocols required to simulate the different circuit functions of the test board, effectively improve the detection efficiency of the detection board and avoid the difficulty of detecting the hardware design. degree.
藉由此一技術手段可以來解決先前技術所存在檢測電路板上電子元件與電路板功能設計開發不易的問題，進而達成快速且簡易檢測電路板上電子元件與電路板功能的技術功效。 By means of this technical means, the problem that the electronic component and the circuit board function design and development on the detecting circuit board of the prior art are difficult to be solved can be solved, thereby achieving the technical effect of quickly and easily detecting the functions of the electronic components and the circuit board on the circuit board.
雖然本發明所揭露的實施方式如上，惟所述的內容並非用以直接限定本發明的專利保護範圍。任何本發明所屬技術領域中具 有通常知識者，在不脫離本發明所揭露的精神和範圍的前提下，可以在實施的形式上及細節上作些許的更動。本發明的專利保護範圍，仍須以所附的申請專利範圍所界定者為準。 While the embodiments of the present invention have been described above, the above description is not intended to limit the scope of the invention. Any of the technical fields of the present invention A person skilled in the art can make some changes in the form and details of the implementation without departing from the spirit and scope of the invention. The scope of the invention is to be determined by the scope of the appended claims.
10‧‧‧訊號控制端 10‧‧‧ Signal Control Terminal
20‧‧‧訊號轉換電路板 20‧‧‧Signal Conversion Board
21‧‧‧訊號傳輸介面 21‧‧‧Signal transmission interface
22‧‧‧邊界掃描晶片 22‧‧‧Boundary Scan Wafer
23‧‧‧檢測連接介面 23‧‧‧Detection connection interface
231‧‧‧第一檢測連接介面 231‧‧‧First detection connection interface
232‧‧‧第二檢測連接介面 232‧‧‧Second detection connection interface
233‧‧‧第三檢測連接介面 233‧‧‧ third detection connection interface
30‧‧‧檢測電路板 30‧‧‧Detection board
31‧‧‧第一連接介面 31‧‧‧First connection interface
32‧‧‧燈號控制元件 32‧‧‧Light control components
33‧‧‧第二連接介面 33‧‧‧Second connection interface
34‧‧‧解碼元件 34‧‧‧Decoding components
35‧‧‧第三連接介面 35‧‧‧ third connection interface
40‧‧‧介面轉換連接器 40‧‧‧Interface conversion connector
41‧‧‧第一檢測資訊 41‧‧‧First test information
42‧‧‧第二檢測資訊 42‧‧‧Second test information
43‧‧‧檢測結果 43‧‧‧Test results
步驟110‧‧‧訊號轉換電路板的訊號傳輸介面與訊號控制端形成電性連接，並自訊號控制端獲得檢測資訊 Step 110‧‧‧ The signal transmission interface of the signal conversion circuit board is electrically connected with the signal control terminal, and the detection information is obtained from the signal control terminal
步驟120‧‧‧訊號轉換電路板的邊界掃描晶片與訊號傳輸介面形成電性連接，邊界掃描晶片具有多個資料傳輸接腳，依據邊界掃描技術將檢測資訊由邊界掃描晶片內的邊界掃描鏈推送至指定的資料傳輸接腳 Step 120‧‧‧ The boundary scan chip of the signal conversion circuit board is electrically connected to the signal transmission interface, and the boundary scan chip has a plurality of data transmission pins, and the detection information is pushed by the boundary scan chain in the boundary scan wafer according to the boundary scan technology To the specified data transfer pin
步驟130‧‧‧訊號轉換電路板的多個檢測連接介面分別與邊界掃描晶片指定的資料傳輸接腳電性連接，每一個檢測連接介面用以傳輸指定的資料傳輸接腳的檢測資訊 Step 130‧‧‧ The plurality of detection connection interfaces of the signal conversion circuit board are respectively electrically connected to the data transmission pins designated by the boundary scan chip, and each detection connection interface is used for transmitting the detection information of the designated data transmission pin
步驟140‧‧‧檢測電路板與檢測連接介面其中之一電性連接，並自電性連接的檢測連接介面獲得檢測資訊，以依據檢測資訊進行檢測電路板中電子元件與電路板功能的檢測，並透過檢測連接介面反饋檢測結果 Step 140‧‧‧ The detection circuit board is electrically connected to one of the detection connection interfaces, and the detection information is obtained from the detection connection interface of the electrical connection, so as to detect the function of the electronic component and the circuit board in the detection circuit board according to the detection information, And feedback detection results through the detection connection interface
步驟150‧‧‧將檢測結果由邊界掃描晶片內的邊界掃描鏈推送至測試資料輸出接腳並電性連接至訊號傳輸介面，以由訊號傳輸介面提供檢測結果至訊號控制端 Step 150‧‧‧ The test result is pushed from the boundary scan chain in the boundary scan chip to the test data output pin and electrically connected to the signal transmission interface to provide the detection result to the signal control end by the signal transmission interface
步驟160‧‧‧訊號控制端判斷檢測結果 Step 160‧‧‧ Signal control terminal judges the test result
第1圖繪示為本發明電路板上電子元件與電路板功能檢測的系統方塊圖。 FIG. 1 is a block diagram showing the system for detecting the function of electronic components and circuit boards on the circuit board of the present invention.
第2圖繪示為本發明電路板上電子元件與電路板功能檢測的方法流程圖。 FIG. 2 is a flow chart showing the method for detecting the function of the electronic components and the circuit board on the circuit board of the present invention.
第3圖繪示為本發明電路板上電子元件與電路板功能檢測的系統架構示意圖。 FIG. 3 is a schematic diagram showing the system architecture of the function detection of the electronic components and the circuit board on the circuit board of the present invention.
10‧‧‧訊號控制端 10‧‧‧ Signal Control Terminal
20‧‧‧訊號轉換電路板 20‧‧‧Signal Conversion Board
21‧‧‧訊號傳輸介面 21‧‧‧Signal transmission interface
22‧‧‧邊界掃描晶片 22‧‧‧Boundary Scan Wafer
23‧‧‧檢測連接介面 23‧‧‧Detection connection interface
30‧‧‧檢測電路板 30‧‧‧Detection board
40‧‧‧介面轉換連接器 40‧‧‧Interface conversion connector
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW101146549A TW201423125A (en) | 2012-12-11 | 2012-12-11 | Detecting system for electronic components on circuit board and circuit board functions and method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
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| TW101146549A TW201423125A (en) | 2012-12-11 | 2012-12-11 | Detecting system for electronic components on circuit board and circuit board functions and method thereof |
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| Publication Number | Publication Date |
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| TW201423125A true TW201423125A (en) | 2014-06-16 |
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| TW101146549A TW201423125A (en) | 2012-12-11 | 2012-12-11 | Detecting system for electronic components on circuit board and circuit board functions and method thereof |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI569238B (en) * | 2014-10-13 | 2017-02-01 | 群創光電股份有限公司 | Display panel and method for automatically detecting the same |
| US10095209B2 (en) | 2015-01-29 | 2018-10-09 | I Hsueh CHEN | Programming system for device control |
| TWI783549B (en) * | 2021-06-24 | 2022-11-11 | 英業達股份有限公司 | Improving test coverage rate system for pin of tested circuit board and method thereof |
-
2012
- 2012-12-11 TW TW101146549A patent/TW201423125A/en unknown
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI569238B (en) * | 2014-10-13 | 2017-02-01 | 群創光電股份有限公司 | Display panel and method for automatically detecting the same |
| US10089912B2 (en) | 2014-10-13 | 2018-10-02 | Innolux Corporation | Display panel and automatic detection method thereof |
| US10095209B2 (en) | 2015-01-29 | 2018-10-09 | I Hsueh CHEN | Programming system for device control |
| TWI783549B (en) * | 2021-06-24 | 2022-11-11 | 英業達股份有限公司 | Improving test coverage rate system for pin of tested circuit board and method thereof |
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