TW201332228A - Test socket with stopper member - Google Patents
Test socket with stopper member Download PDFInfo
- Publication number
- TW201332228A TW201332228A TW101144089A TW101144089A TW201332228A TW 201332228 A TW201332228 A TW 201332228A TW 101144089 A TW101144089 A TW 101144089A TW 101144089 A TW101144089 A TW 101144089A TW 201332228 A TW201332228 A TW 201332228A
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- Prior art keywords
- test socket
- conductive portion
- insert
- conductive
- stopper
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/716—Coupling device provided on the PCB
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
本發明是有關於一種具有止擋部的測試插座，且特別是有關於一種具有即使***件下降時不穩定，仍可讓***件以均勻的壓力安全地移動物件裝置以穩定地接觸物件裝置的止擋部的測試插座。 BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to a test socket having a stop, and more particularly to a device that allows the insert to safely move the article device with uniform pressure to stably contact the object device even if the insert is unstable when lowered. Test socket for the stop.
一般來說，測試插座是用以檢查確認製造的物件裝置是否為缺陷。也就是說，為了檢查確認物件裝置是否為缺陷，執行一種預先的電性檢查，且物件裝置與檢查裝置藉由一測試插座非直接但間接地彼此接觸進行檢查。間接接觸的原因在於檢查裝置相對地昂貴，而且假如檢查裝置頻繁地直接接觸物件裝置，檢查裝置不但會摩耗或受損且又難以更換，進而使成本相當高。於是，一種容易更換的測試插座安裝於檢查裝置頂部，且物件裝置並非接觸檢查裝置而是測試插座以電性連接檢查裝置。於是，一種從檢查裝置傳送的檢查訊號藉由測試插座被發送至物件裝置。 In general, the test socket is used to check to see if the manufactured object device is defective. That is, in order to check to confirm whether the object device is defective, a prior electrical inspection is performed, and the object device and the inspection device are inspected by indirect but indirect contact with each other by a test socket. The reason for the indirect contact is that the inspection device is relatively expensive, and if the inspection device frequently contacts the object device frequently, the inspection device is not only worn or damaged but also difficult to replace, thereby making the cost relatively high. Thus, an easily replaceable test socket is mounted on the top of the inspection device, and the object device does not contact the inspection device but the test socket to electrically connect the inspection device. Thus, an inspection signal transmitted from the inspection device is transmitted to the object device by the test socket.
圖1是一種習知的測試插座110的分解立體圖。圖2繪示圖1的測試插座110於結合狀態的視圖。圖3繪示圖1的測試 插座110沿截面線III-III的剖面圖。圖4繪示圖1的測試插座110於操作狀態的視圖。 FIG. 1 is an exploded perspective view of a conventional test socket 110. FIG. 2 is a view showing the test socket 110 of FIG. 1 in a coupled state. Figure 3 shows the test of Figure 1 A cross-sectional view of the socket 110 along section line III-III. 4 is a view of the test socket 110 of FIG. 1 in an operational state.
在物件裝置100被製作之後，物件裝置100可被移動到檢查裝置140而被安裝在預定的托盤，且一***件120在此用以將物件裝置100從托盤輸送至檢查裝置140。然後，藉由***件120被傳送至檢查裝置140的物件裝置100安全地安裝於測試插座110，如圖1及圖2所示，以藉由一推動裝置130施壓並從而與測試插座110緊密地結合。 After the article device 100 is fabricated, the article device 100 can be moved to the inspection device 140 to be mounted on a predetermined tray, and an insert 120 is used herein to transport the article device 100 from the tray to the inspection device 140. Then, the object device 100 transported to the inspection device 140 by the insert 120 is securely mounted to the test socket 110, as shown in FIGS. 1 and 2, to be pressed by a pushing device 130 and thereby tightly coupled to the test socket 110. Ground combination.
圖3是圖2的剖面圖，繪示設置於被安裝在物件裝置100中的測試插座110上的***件120，設置於***件120內的物件裝置100，以及施壓於物件裝置100的推動裝置130並被設置於物件裝置100的上方。此外，用以施壓於物件裝置100的彈簧131被設置於推動裝置130。 3 is a cross-sectional view of FIG. 2 illustrating the insert 120 disposed on the test socket 110 mounted in the article device 100, the article device 100 disposed within the insert 120, and the push applied to the article device 100. The device 130 is also disposed above the object device 100. Further, a spring 131 for applying pressure to the object device 100 is provided to the pushing device 130.
固定測試插座110的位置的插座導引部111被設置在測試插座110的邊緣，且插座導引部111也執行避免***件120下降量多於預定距離的功能。也就是說，插座導引部111接觸正在下降的***件120並從而避免***件120下降多於預定距離並且允許設置於***件120內的物件裝置100去接觸測試插座110的導通部。 The socket guide 111 that fixes the position of the test socket 110 is disposed at the edge of the test socket 110, and the socket guide 111 also performs a function of preventing the insertion of the insert 120 by more than a predetermined distance. That is, the socket guide 111 contacts the insert 120 that is descending and thereby prevents the insert 120 from falling more than a predetermined distance and allows the article device 100 disposed within the insert 120 to contact the conductive portion of the test socket 110.
也就是說，插座導引部111可避免發生因***件120過度下降而傷害物件裝置100的端部或測試插座110的導通部。 That is, the socket guide 111 can avoid the occurrence of damage to the end of the article device 100 or the conduction portion of the test socket 110 due to excessive drop of the insert 120.
然而，關於習知技術仍有以下缺陷：設置在測試插座110的插座導引部111接觸***件120的邊緣以避免***件120的下降多於預定距離，且在此由於推動裝置130、***件120或其他的製程偏差，在一定程度上，***件120下降並非在一水平狀態而是在一類似傾斜的狀態。在此情況下，***件120只有一側接觸插座導引部111且***件120的另一側可能不會接觸插座導引部111，因此，一距離S就被形成。 However, the conventional technique still has the following drawbacks: the socket guide 111 provided at the test socket 110 contacts the edge of the insert 120 to prevent the insertion of the insert 120 more than a predetermined distance, and here the pushing device 130, the insert 120 or other process variations, to some extent, the insert 120 is not lowered in a horizontal state but in a similarly inclined state. In this case, only one side of the insert 120 contacts the socket guide 111 and the other side of the insert 120 may not contact the socket guide 111, and thus, a distance S is formed.
假如***件120只有一側接觸插座導引部111，如圖4所繪示，進入***件120的物件裝置100也以傾斜角度接觸測試插座110的導通部，進而干擾了與測試插座110的導通部的均勻接觸。也就是說，如同圖4的放大左側視圖所繪示，物件裝置100的一側可能會以過大的壓力接觸測試插座110的導通部，且如同圖4的放大右側視圖所繪示，物件裝置100的另一側可能無法接觸測試插座110的導通部或以較小的壓力接觸，因而難以均勻接觸。 If only one side of the insert 120 contacts the socket guide 111, as shown in FIG. 4, the object device 100 entering the insert 120 also contacts the conductive portion of the test socket 110 at an oblique angle, thereby interfering with the conduction with the test socket 110. Uniform contact of the part. That is, as shown in the enlarged left side view of FIG. 4, one side of the object device 100 may contact the conductive portion of the test socket 110 with excessive pressure, and as shown in the enlarged right side view of FIG. 4, the object device 100 The other side may not be able to contact the conductive portion of the test socket 110 or contact with a small pressure, so that it is difficult to uniformly contact.
假如物件裝置100的端部並未以均勻的壓力接觸測試插座110的導通部，可能無法確保電性連接，這將不能進行準確的檢查。此外，因為物件裝置100壓力過多，導通部的一部分可能會過壓並容易受損。 If the end of the object device 100 does not contact the conduction portion of the test socket 110 with a uniform pressure, an electrical connection may not be ensured, which will not allow an accurate inspection. In addition, because the object device 100 is over-stressed, a portion of the conductive portion may be over-pressurized and easily damaged.
本發明提供一種具有止擋部的測試插座，據此，物件裝 置能夠以水平狀態接觸測試插座的導通部，使得物件裝置的端部能夠均勻地接觸測試插座的導通部並依此提供可靠的檢查結果。 The invention provides a test socket with a stop portion, according to which the object is loaded The conduction portion capable of contacting the test socket in a horizontal state enables the end portion of the article device to uniformly contact the conduction portion of the test socket and thereby provide a reliable inspection result.
在本發明的一方面，提供了一種測試插座，其具有止擋部以電性連接物件裝置的端部以及檢測裝置的腳墊。測試插座包括：在厚度方向具有導通性的導電部，導電部包括對應物件裝置的端部的位置而形成的導通部；環設於導電部並支撐導電部的支撐部，其中支撐部的上表面在比導電部的上表面較低的位置，以創造***件可進入的空間，其中***件下降以安裝物件裝置進入測試插座內；以及形成於且凸出自支撐部的上表面的止擋部，使得進入的***件可在預定高度停止下降並接觸***件的下表面。 In an aspect of the invention, a test socket is provided having a stop to electrically connect an end of the article device and a foot pad of the detection device. The test socket includes: a conductive portion having conductivity in a thickness direction, the conductive portion includes a conductive portion formed corresponding to a position of an end portion of the object device; a support portion annularly disposed on the conductive portion and supporting the conductive portion, wherein an upper surface of the support portion At a lower position than the upper surface of the conductive portion to create a space into which the insert can enter, wherein the insert is lowered to mount the article device into the test socket; and a stop formed on and projecting from the upper surface of the support portion, The incoming insert is allowed to stop descending at a predetermined height and contact the lower surface of the insert.
在本發明的一實施例中，上述的預定高度為進入***件的物件裝置的端部以均勻壓力接觸各導電部時的高度。 In an embodiment of the invention, the predetermined height is the height at which the end of the article device entering the insert contacts the conductive portions with uniform pressure.
在本發明的一實施例中，上述的止擋部與支撐部為一體地成形。 In an embodiment of the invention, the stopper portion and the support portion are integrally formed.
在本發明的一實施例中，上述的止擋部附著於支撐部。 In an embodiment of the invention, the stopper is attached to the support portion.
在本發明的一實施例中，上述的止擋部與支撐部由不同的材料形成。 In an embodiment of the invention, the stop portion and the support portion are formed of different materials.
在本發明的一實施例中，上述的止擋部包括由金屬或塑膠構成的板件以及支撐板件的彈性件，彈性件連接板件且具有彈力。 In an embodiment of the invention, the stopping portion comprises a plate member made of metal or plastic and an elastic member supporting the plate member, and the elastic member connects the plate member and has an elastic force.
在本發明的一實施例中，上述的彈性件包括矽橡膠與彈 簧的其中之一。 In an embodiment of the invention, the elastic member comprises a rubber and a bullet One of the springs.
在本發明的一實施例中，上述的止擋部連續地圍繞導電部形成以圍繞導電部。 In an embodiment of the invention, the stop portion is continuously formed around the conductive portion to surround the conductive portion.
在本發明的一實施例中，止擋部沿著導電部的周邊以預定區間彼此分離。 In an embodiment of the invention, the stoppers are separated from each other by a predetermined interval along the circumference of the conductive portion.
在本發明的一實施例中，上述的導電部具有包含有導電性粒子的彈性材料的結構。 In an embodiment of the invention, the conductive portion has a structure including an elastic material of conductive particles.
在本發明的一實施例中，上述的導通部由***於殼體的針元件形成，開孔形成於對應物件裝置的端部的位置，且彈簧構件彈性地支撐針元件。 In an embodiment of the invention, the conductive portion is formed by a needle member inserted into the housing, the opening is formed at a position corresponding to an end of the object device, and the spring member elastically supports the needle member.
在本發明的一實施例中，上述的止擋部的厚度在0.1mm至0.4mm之間。 In an embodiment of the invention, the stop portion has a thickness between 0.1 mm and 0.4 mm.
依據本發明的實施例的測試插座，接觸***件的下表面以避免***件下降的止擋部被設置在環繞導電部的支撐部內。因此，物件裝置的端部可穩定地接觸測試插座的導通部從而最大限度地提高檢查的可靠性。 According to the test socket of the embodiment of the invention, the stopper that contacts the lower surface of the insert to prevent the insert from falling is disposed in the support portion surrounding the conductive portion. Therefore, the end of the article device can stably contact the conduction portion of the test socket to maximize the reliability of the inspection.
10、110‧‧‧測試插座 10, 110‧‧‧ test socket
11、111‧‧‧插座導引部 11, 111‧‧‧ socket guide
20‧‧‧導電部 20‧‧‧Electrical Department
21‧‧‧導通部 21‧‧‧Training Department
22、31‧‧‧絕緣部 22, 31‧‧‧Insulation Department
30‧‧‧支撐部 30‧‧‧Support
32‧‧‧框架板 32‧‧‧Frame board
40‧‧‧止擋部 40‧‧‧stop
41‧‧‧板件 41‧‧‧ boards
42‧‧‧彈性件 42‧‧‧Flexible parts
50、100‧‧‧物件裝置 50, 100‧‧‧ object device
51‧‧‧端部 51‧‧‧End
60、140‧‧‧檢查裝置 60, 140‧‧‧ inspection device
70、130‧‧‧推動裝置 70, 130‧‧‧ pusher
80、120‧‧‧***件 80, 120‧‧‧ inserts
131‧‧‧彈簧 131‧‧ ‧ spring
211‧‧‧電極 211‧‧‧electrode
212‧‧‧彈性導通部 212‧‧‧Flexible Conduction
213‧‧‧針元件 213‧‧‧needle components
221‧‧‧薄膜 221‧‧‧film
222‧‧‧彈性支撐部 222‧‧‧elastic support
S‧‧‧距離 S‧‧‧ distance
藉由詳細的描述示例性實施例的參照附圖使得本發明的上述及其他的特徵及優點將變得更加明顯，其中：圖1是依據習知的一種測試插座的分解狀態的立體圖。 The above and other features and advantages of the present invention will become more apparent from the detailed description of the exemplary embodiments.
圖2繪示圖1的測試插座於結合狀態的視圖。 2 is a view showing the test socket of FIG. 1 in a coupled state.
圖3為圖2的測試插座沿截面線III-III的剖面圖。 3 is a cross-sectional view of the test socket of FIG. 2 taken along section line III-III.
圖4繪示圖1的測試插座於操作狀態的示意圖。 4 is a schematic diagram of the test socket of FIG. 1 in an operating state.
圖5為本發明的一實施例的測試插座的剖面圖。 Figure 5 is a cross-sectional view of a test socket in accordance with an embodiment of the present invention.
圖6為圖5的測試插座的平面視圖。 Figure 6 is a plan view of the test socket of Figure 5.
圖7為圖5的測試插座的展開狀態的剖面圖。 Figure 7 is a cross-sectional view showing the unfolded state of the test socket of Figure 5.
圖8至圖11繪示本發明其他實施例的測試插座。 8 through 11 illustrate test sockets of other embodiments of the present invention.
在下文中，將參照附圖詳細描述根據本發明的實施例的測試插座。 Hereinafter, a test socket according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings.
圖5為根據本發明的一實施例的測試插座的剖面圖。圖6為圖5的測試插座的平面視圖。圖7為圖5的測試插座的放大剖視圖。圖8至圖11繪示本發明其他實施例的測試插座。 Figure 5 is a cross-sectional view of a test socket in accordance with an embodiment of the present invention. Figure 6 is a plan view of the test socket of Figure 5. Figure 7 is an enlarged cross-sectional view of the test socket of Figure 5. 8 through 11 illustrate test sockets of other embodiments of the present invention.
根據本發明的一實施例的測試插座10被設置於物件裝置50及檢查裝置60之間且電性連接物件裝置50的端部51至檢查裝置60。測試插座10被安裝在檢查裝置60的頂部，且經裝設而與被***件80推動的物件裝置50的端部51接觸。 A test socket 10 according to an embodiment of the present invention is disposed between the object device 50 and the inspection device 60 and electrically connects the end portion 51 of the object device 50 to the inspection device 60. The test socket 10 is mounted on the top of the inspection device 60 and is mounted to be in contact with the end 51 of the article device 50 that is pushed by the insert 80.
測試插座10包括導電部20、支撐部30以及止擋部40。導電部20在厚度方向具有導電性，並包括對應物件裝置50的各端部51的位置的導通部21。絕緣部22設置於各導通部21之間。 The test socket 10 includes a conductive portion 20, a support portion 30, and a stopper portion 40. The conductive portion 20 has conductivity in the thickness direction and includes a conductive portion 21 corresponding to the position of each end portion 51 of the object device 50. The insulating portion 22 is provided between the respective conductive portions 21 .
導通部21各包括設置於頂部且位於對應物件裝置50的 各端部51位置的電極211，以及設置於電極211下且具有包含有導電性粒子的彈性材料的結構的彈性導通部212。彈性材料較佳地可為具有交聯(cross-linking)結構的聚合物材料。為了形成一種可固化的聚合物材料的材料，其可被使用以產出彈性材料的範例可包括共軛二烯類橡膠例如是聚丁二烯橡膠(polybutadiene rubber)、天然橡膠(natural rubber)、聚異戊二烯橡膠(polyisoprene rubber)、苯乙烯-丁二烯共聚物橡膠(styrene-butadiene copolymer rubber)、丙烯腈-丁二烯共聚物橡膠(acrylonitrile butadiene copolymer rubber)及其氫化產物，嵌段共聚物橡膠(block copolymer rubber)例如是苯乙烯-丁二烯-二烯嵌段共聚物橡膠(styrene-butadiene-diene block copolymer rubber)，苯乙烯-異戊二烯嵌段共聚物橡膠(styrene-isoprene block copolymer rubber)，或其氫化產物，氯丁橡膠(chloroprene rubber)，聚氨酯橡膠(urethane rubber)，聚酯類橡膠(polyester-based rubber)，表氯醇橡膠(epichlorohydrin rubber)，矽橡膠(silicon rubber)，乙烯-丙烯共聚物橡膠(ethylene-propylene copolymer rubber)或乙烯-丙烯二烯共聚物橡膠(ethylene-propylene-diene copolymer rubber)。 The conductive portions 21 each include a top portion and are located at the corresponding object device 50. An electrode 211 at a position of each end portion 51 and an elastic conduction portion 212 provided under the electrode 211 and having a structure of an elastic material containing conductive particles. The elastic material may preferably be a polymer material having a cross-linking structure. Examples of materials which can be used to form a curable polymer material to produce an elastic material may include conjugated diene-based rubbers such as polybutadiene rubber, natural rubber, Polyisoprene rubber, styrene-butadiene copolymer rubber, acrylonitrile butadiene copolymer rubber and hydrogenated product thereof, block The block copolymer rubber is, for example, styrene-butadiene-diene block copolymer rubber, styrene-isoprene block copolymer rubber (styrene- Isoprene block copolymer rubber), or its hydrogenated product, chloroprene rubber, urethane rubber, polyester-based rubber, epichlorohydrin rubber, silicone Rubber), ethylene-propylene copolymer rubber or ethylene-propylene-diene Copolymer rubber).
假如產出的導通部21被要求有防水功能，比起其他橡膠共軛二烯系橡膠可優先被使用，且特別地，矽橡膠可優先被使用因其成形加工性與電性特性的方面 If the produced conductive portion 21 is required to have a waterproof function, it can be used preferentially compared to other rubber conjugated diene rubbers, and in particular, the ruthenium rubber can be preferentially used because of its form processability and electrical properties.
交聯或冷凝液體矽橡膠成形的矽橡膠可優先選用。液體 矽橡膠其在變形速度10-1秒時黏性為105 P為較佳，且可為具有乙烯基或羥基的縮合型液體矽橡膠、相加型液體矽橡膠或液態矽的任一。詳細而言，矽橡膠的例子包括二甲基矽生橡膠(dimethyl silicon)，甲基乙烯基矽生橡膠(methyl vinyl silicon raw rubber)，及甲基苯基乙烯基矽生橡膠(methyl phenyl vinyl silicon raw rubber)。 Crosslinked or condensed liquid 矽 rubber formed 矽 rubber is preferred. The liquid helium rubber preferably has a viscosity of 10 5 P at a deformation speed of 10 -1 second, and may be any of a condensation type liquid helium rubber having a vinyl group or a hydroxyl group, an additive liquid helium rubber or a liquid helium. In detail, examples of the ruthenium rubber include dimethyl silicon, methyl vinyl silicon raw rubber, and methyl phenyl vinyl silicon. Raw rubber).
磁性的導電粒子可被使用作為導電粒子。導電粒子的範例包括具有磁性的金屬粒子，例如鐵、鈷或鎳，以及合金的粒子或含有金屬的粒子，藉由使用這些粒子產出的粒子作為核心粒子並電鍍具有高導電性的金屬，例如是金、銀、鈀或銠於核心粒子的表面，且藉由使用無機材料粒子或聚合物粒子，例如是非磁性金屬粒子或者玻璃珠的粒子作為核心粒子並電鍍一導通磁性金屬，例如是鎳或鈷於核心粒子的表面。 Magnetic conductive particles can be used as the conductive particles. Examples of the conductive particles include magnetic metal particles such as iron, cobalt or nickel, and alloy particles or metal-containing particles, by using particles produced by these particles as core particles and plating a metal having high conductivity, for example, Is a surface of gold, silver, palladium or rhodium on the core particles, and by using inorganic material particles or polymer particles, such as non-magnetic metal particles or particles of glass beads as core particles and electroplating a conductive magnetic metal, such as nickel or Cobalt is on the surface of the core particles.
從上述，藉由使用鎳粒子產出的粒子作為核心粒子並於核心粒子的表面電鍍一具有高導通性金屬可優先被使用。 From the above, it is preferred to use a particle produced by using nickel particles as a core particle and plating a highly conductive metal on the surface of the core particle.
絕緣部22由連接電極211以支撐電極211的薄膜221及支撐彈性導電部212的彈性支撐部222構成。薄膜221可以薄片材的形式形成，例如是聚酰亞胺(polyimide)或聚丙烯(polypropylene)。另外，彈性支撐部222可以與作為彈性導通部212的相同的材料形成。詳細而言，彈性支撐部222可以矽橡膠成形，但本發明並不限於此，其他的材料也可形成上述之構件。 The insulating portion 22 is composed of a film 221 that connects the electrode 211 to support the electrode 211 and an elastic supporting portion 222 that supports the elastic conductive portion 212. The film 221 may be formed in the form of a sheet material such as polyimide or polypropylene. In addition, the elastic support portion 222 may be formed of the same material as the elastic conductive portion 212. In detail, the elastic supporting portion 222 may be formed of a rubber, but the present invention is not limited thereto, and other materials may also form the above-described members.
支撐部30環設於導電部20以支撐導電部20。支撐部30 沿著導電部20的邊緣延伸。詳細而言，支撐部30由整體沿著導電部20的邊緣延伸的絕緣部31以及耦接於絕緣部31且為金屬構成的框架板32所構成。開孔形成於框架板32各邊緣的角落以便確定測試插座10的位置且在需求位置定位測試插座10。支撐部30的上表面可較佳地低於導電部20的上表面。詳細而言，支撐部30的上表面在設置在比導電部20的上表面較低的位置時，支撐部30的上表面自導電部20延伸，以便相關於導電部20的上表面形成斷差。當支撐部30的上表面如上述形成在比導電部20的上表面較低的位置時，移動以將物件裝置50安裝在測試插座10內的***件80，可進入由斷差構成的空間。 The support portion 30 is annularly disposed on the conductive portion 20 to support the conductive portion 20 . Support portion 30 It extends along the edge of the conductive portion 20. In detail, the support portion 30 is composed of an insulating portion 31 that extends along the entire edge of the conductive portion 20 and a frame plate 32 that is coupled to the insulating portion 31 and that is made of metal. Openings are formed in the corners of each edge of the frame plate 32 to define the position of the test socket 10 and position the test socket 10 at a desired location. The upper surface of the support portion 30 may preferably be lower than the upper surface of the conductive portion 20. In detail, when the upper surface of the support portion 30 is disposed at a position lower than the upper surface of the conductive portion 20, the upper surface of the support portion 30 extends from the conductive portion 20 so as to form a gap with respect to the upper surface of the conductive portion 20. . When the upper surface of the support portion 30 is formed at a position lower than the upper surface of the conductive portion 20 as described above, the insert 80 that is moved to mount the object device 50 in the test socket 10 can enter a space constituted by the step.
亦即，***件80的下端部具有L形的截面支撐物件裝置50，且作為***件80的下端部通常是低於物件裝置50。假如支撐部30高於或齊平於導電部20，將無空間讓***件80進入。因此，物件裝置50的端部51將難以接觸測試插座10的導通部21。 That is, the lower end portion of the insert 80 has an L-shaped cross-section support member device 50, and the lower end portion as the insert member 80 is generally lower than the object device 50. If the support portion 30 is higher or flush with the conductive portion 20, there will be no space for the insert 80 to enter. Therefore, the end portion 51 of the object device 50 will have difficulty in contacting the conductive portion 21 of the test socket 10.
因此，根據本發明的目前的實施例，支撐部30成形於低的位置以形成斷差，且***件80能夠下降而不會與斷差干涉。 Therefore, according to the current embodiment of the present invention, the support portion 30 is formed at a low position to form a gap, and the insert 80 can be lowered without interfering with the trouble.
止擋部40為支撐部30凸出上表面的部分並接觸***件80的下表面。詳細而言，止擋部40從支撐部30的上表面凸出使得進入由斷差構成的空間的***件80在預定高度停止。在此，較佳的止擋部40的厚度可具有一高度，在此高度進入到***件80的物件裝置50的端部51能以均勻壓力接觸各導通部21。舉例而 言，止擋部40較佳的厚度可為0.1mm至0.4mm。 The stopper 40 is a portion where the support portion 30 protrudes from the upper surface and contacts the lower surface of the insert 80. In detail, the stopper 40 protrudes from the upper surface of the support portion 30 so that the insert 80 entering the space constituted by the step is stopped at a predetermined height. Here, the thickness of the preferred stop portion 40 can have a height at which the end portion 51 of the article device 50 that enters the insert 80 can contact the respective conductive portions 21 with uniform pressure. For example The stopper 40 preferably has a thickness of 0.1 mm to 0.4 mm.
止擋部40可與支撐部30為一體地成形，且可與支撐部30為同樣的材料構成。同樣地，止擋部40可為連續地環繞導電部21形成使其圍繞導電部20，如圖6所示。 The stopper portion 40 can be integrally formed with the support portion 30 and can be made of the same material as the support portion 30. Likewise, the stop 40 can be formed to continuously surround the conductive portion 21 to surround the conductive portion 20, as shown in FIG.
在圖示中，參考數字11、60、70及80各自代表插座導引部、檢查裝置、推動裝置以及***件。 In the drawings, reference numerals 11, 60, 70, and 80 each represent a socket guide, an inspection device, a pushing device, and an insert.
插座導引部11被形成使得其上表面接觸***件80的下表面，以支撐測試插座10並避免***件80的下降超過預定的距離。詳細而言，插座導引部11設置於測試插座10的邊緣。 The socket guide 11 is formed such that its upper surface contacts the lower surface of the insert 80 to support the test socket 10 and prevent the insertion of the insert 80 beyond a predetermined distance. In detail, the socket guide 11 is provided at the edge of the test socket 10.
檢查裝置60藉由施加電訊號至物件裝置50進行檢查，且多個腳墊(未繪示)設置在檢查裝置60。 The inspection device 60 performs inspection by applying an electrical signal to the object device 50, and a plurality of foot pads (not shown) are disposed at the inspection device 60.
推動裝置70施壓於被***件80輸送的物件裝置50，且朝向測試插座10使得物件裝置50的端部51可確實接觸測試插座10的導通部21。 The pushing device 70 applies pressure to the article device 50 transported by the insert 80, and toward the test socket 10 causes the end portion 51 of the object device 50 to positively contact the conductive portion 21 of the test socket 10.
***件80傳送物件裝置50。***件80具有中央開孔，且經由中央開孔使物件裝置50能夠***，且抓住物件裝置50的卡勾部形成於***件80底部的中央區域。 The insert 80 conveys the object device 50. The insert 80 has a central opening, and the article device 50 can be inserted through the central opening, and the hook portion of the grasping object device 50 is formed in a central region of the bottom of the insert 80.
依據本發明目前的實施例，藉由使用測試插座10可得到以下的功效：首先，當***件80被安裝於測試插座10且推動裝置70施壓於物件裝置50，被***件80傳送的物件裝置50接觸測試插 座10的導通部21。***件80的底部邊緣部的下降高於預定距離可***座導引部11阻擋，從而避免物件裝置50過壓測試插座10的導通部21。在此，當檢查裝置施加預定訊號時，電訊號經過測試插座10被傳送至物件裝置50從而執行預定的電性檢查。 According to the present embodiment of the present invention, the following effects can be obtained by using the test socket 10: First, when the insert 80 is mounted to the test socket 10 and the pushing device 70 is pressed against the object device 50, the object transported by the insert 80 Device 50 contacts test plug The conduction portion 21 of the seat 10. The lowering of the bottom edge portion of the insert 80 above the predetermined distance can be blocked by the socket guide 11, thereby preventing the object device 50 from overpressing the conductive portion 21 of the test socket 10. Here, when the inspection device applies the predetermined signal, the electrical signal is transmitted to the object device 50 through the test socket 10 to perform a predetermined electrical inspection.
然而，依據本發明目前的實施例，接觸***件80的下表面的止擋部40形成在支撐部30的上表面，因而確實防止了***件80的過度下降而與插座導引部11在一起。特別地，設置在支撐部30的上表面的止擋部40設置在相鄰導電部20的週邊，因此，即使當儀器的偏差導致偏心接觸時，止擋部40執行最終的止擋功能，使得***件80可在需求位置確實被停止。 However, according to the present embodiment of the present invention, the stopper portion 40 of the lower surface of the contact insert 80 is formed on the upper surface of the support portion 30, thereby surely preventing the excessive drop of the insert member 80 from being in contact with the socket guide portion 11 . In particular, the stopper portion 40 provided on the upper surface of the support portion 30 is provided at the periphery of the adjacent conductive portion 20, and therefore, even when the deviation of the instrument causes eccentric contact, the stopper portion 40 performs the final stopper function, so that The insert 80 can be stopped at the desired location.
尤其是，當止擋部40以彈性矽橡膠成形時，來自物件裝置50的端部51的衝擊可被止擋部40吸收，因此施加於以彈性材料製作的導通部21的衝擊可被減少。 In particular, when the stopper portion 40 is formed of the elastic 矽 rubber, the impact from the end portion 51 of the object device 50 can be absorbed by the stopper portion 40, and thus the impact applied to the conduction portion 21 made of the elastic material can be reduced.
尤其是，止擋部40沿著導電部20的周邊延伸以防止物件裝置50以傾斜狀態接觸測試插座10的導電部21。因此，均勻的接觸壓力可被施加於導通部21。此外，物件裝置50的端部51能夠接觸測試插座10的導通部21，從而顯著地提高了檢查的可靠性。 In particular, the stopper portion 40 extends along the periphery of the conductive portion 20 to prevent the article device 50 from contacting the conductive portion 21 of the test socket 10 in an inclined state. Therefore, a uniform contact pressure can be applied to the conduction portion 21. Further, the end portion 51 of the article device 50 can contact the conduction portion 21 of the test socket 10, thereby remarkably improving the reliability of the inspection.
依據本發明目前的實施例，測試插座10可有以下的變形：依據本發明目前的實施例，上述的止擋部40連續地圍繞導電部20形成。然而，止擋部40並不限於此，也可為非連續地 形成，如圖8及圖9繪示。舉例而言，如圖8所繪示，止擋部40可被分割為以一定間距圍繞導電部20的多個部分，或者如圖9所示，一對止擋部40可只被設置在一個方向上延伸並彼此分離。 According to the present embodiment of the present invention, the test socket 10 can be modified in that the above-described stopper 40 is continuously formed around the conductive portion 20 in accordance with the present embodiment of the present invention. However, the stopper 40 is not limited thereto, and may be discontinuously Formed as shown in Figures 8 and 9. For example, as illustrated in FIG. 8 , the stopper 40 may be divided into a plurality of portions surrounding the conductive portion 20 at a certain interval, or as shown in FIG. 9 , the pair of stoppers 40 may be disposed only in one Extend in direction and separate from each other.
此外，止擋部40可包括單獨的構件並被連接到所述的支撐部30，取代一體地連接至支撐部30的止擋部40。在此，止擋部40與支撐部30也可以不同的材料代替同樣的材料被成形。舉例而言，如圖10所繪示，止擋部40可由板件41構成，板件41可為由膜片221，金屬，塑膠，和印刷電路板(PCB)的材料的其中之一所構成，且支撐板件41的彈性件42與板件41連接並具有彈力。彈性件42可為矽橡膠但並不限於此；彈性件42可為一彈簧。 Further, the stop 40 may include a separate member and be coupled to the support portion 30 instead of being integrally coupled to the stop portion 40 of the support portion 30. Here, the stopper 40 and the support portion 30 may be formed of different materials instead of the same material. For example, as shown in FIG. 10, the stopper 40 may be composed of a plate member 41, which may be composed of one of the materials of the diaphragm 221, metal, plastic, and printed circuit board (PCB). And the elastic member 42 of the support plate member 41 is connected to the plate member 41 and has an elastic force. The elastic member 42 may be a rubber but is not limited thereto; the elastic member 42 may be a spring.
依據本發明目前的實施例的導通部21可採用上述結構以外的探針(pogo pin)結構。舉例而言，如圖11所示，導通部21可分別由***於殼體對應物件裝置50的端部51的位置成形的通孔的針元件213，以及彈性地支撐針元件213且位於通孔內的彈性件(未繪示)所構成。 The conduction portion 21 according to the current embodiment of the present invention may adopt a pogo pin structure other than the above structure. For example, as shown in FIG. 11, the conductive portion 21 may be respectively provided by a needle member 213 of a through hole formed at a position of the end portion 51 of the housing corresponding object device 50, and elastically supporting the needle member 213 and located in the through hole. The inner elastic member (not shown) is formed.
依據本發明的實施例的測試插座，接觸***件的下表面以避免***件下降的止擋部被設置於環繞導電部的支撐部。因此，物件裝置的端部可穩定地接觸測試插座的導通部，從而最大限度地提高檢查的可靠性。 According to the test socket of the embodiment of the invention, the stopper that contacts the lower surface of the insert to prevent the insert from falling is provided to the support portion surrounding the conductive portion. Therefore, the end of the article device can stably contact the conduction portion of the test socket, thereby maximizing the reliability of the inspection.
雖然本發明已特別地展示並參照示例性實施例描述，任 何所屬技術領域中具有通常知識者，應當理解形式上的各種改變並在不脫離由下面的權利要求所限定的本發明的精神和範圍的情況下，在其中進行形式和細節上的各種改變。 Although the invention has been particularly shown and described with respect to the exemplary embodiments, Various changes in form and detail may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
10‧‧‧測試插座 10‧‧‧Test socket
20‧‧‧導電部 20‧‧‧Electrical Department
21‧‧‧導通部 21‧‧‧Training Department
22‧‧‧絕緣部 22‧‧‧Insulation
30‧‧‧支撐部 30‧‧‧Support
40‧‧‧止擋部 40‧‧‧stop
Claims (12)
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020110123069A KR101256994B1 (en) | 2011-11-23 | 2011-11-23 | Test socket with stopper member |
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| Publication Number | Publication Date |
|---|---|
| TW201332228A true TW201332228A (en) | 2013-08-01 |
| TWI497838B TWI497838B (en) | 2015-08-21 |
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| TW101144089A TWI497838B (en) | 2011-11-23 | 2012-11-23 | Test socket with stopper member |
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| KR (1) | KR101256994B1 (en) |
| TW (1) | TWI497838B (en) |
| WO (1) | WO2013077671A1 (en) |
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| KR101659769B1 (en) * | 2014-11-21 | 2016-09-26 | 박종복 | sensor inspection device with a cover for isolation from the outside environment |
| TWI674411B (en) * | 2018-10-15 | 2019-10-11 | 致茂電子股份有限公司 | Electronic component transfer device with positioning function, testing apparatus having the same and transfer method thereof |
| KR102342480B1 (en) * | 2020-08-21 | 2021-12-23 | (주)티에스이 | Test socket and test apparatus having the same |
| KR102626152B1 (en) * | 2021-07-01 | 2024-01-17 | 주식회사 아이에스시 | Connector for electrical connection |
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| KR100486412B1 (en) * | 2000-10-18 | 2005-05-03 | (주)테크윙 | Insert of test tray for test handler |
| CN101882720B (en) * | 2003-06-12 | 2011-11-30 | Jsr株式会社 | Anisotropc conductive connector device and production method therefor and circuit device inspection device |
| KR100575214B1 (en) * | 2004-02-26 | 2006-05-02 | 주식회사 디와이엘텍 | Socket for inspecting packeg of semiconductor |
| KR100843273B1 (en) | 2007-02-05 | 2008-07-03 | 삼성전자주식회사 | Test socket for testing semiconductor chip and test apparatus including the same, method for testing the semiconductor chip |
-
2011
- 2011-11-23 KR KR1020110123069A patent/KR101256994B1/en active IP Right Grant
-
2012
- 2012-11-23 TW TW101144089A patent/TWI497838B/en active
- 2012-11-23 WO PCT/KR2012/009984 patent/WO2013077671A1/en active Application Filing
Also Published As
| Publication number | Publication date |
|---|---|
| WO2013077671A1 (en) | 2013-05-30 |
| KR101256994B1 (en) | 2013-04-26 |
| TWI497838B (en) | 2015-08-21 |
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