201137342 六、發明說明： 【發明所屬之技術領域】 本發明是有關於一種測試裴置，且特別是有關於一種用於 測試顯示面板的測試裝置。 ' 【先前技術】 在顯示面板製作完成後’測試人員需對顯示面板進行電性 測試及目視檢測，以檢測顯示面板是否能正常運作，並檢查顯 示面板在顯示時是否有瑕庇。 圖1是習知一種測試裝置的示意圖。請參照圖1，習知測 鲁 试裝置1〇〇包括承載板11〇以及探針板120，其中探針板120 透過枢軸130而樞接於承載板110。探針板12〇可掀起或蓋上， 而圖1係繪示探針板120處於蓋上的狀態。此外，承載板11〇 具有用以置放顯示面板50的置放槽112。探針板120具有用 以測試顯示面板50的探針122，以及暴露出顯示面板5〇的開 孔124。另外，習知測試裝置1〇〇更包括配置於承載板11()下 方的背光模組140，且置放槽112的底部設有開孔114，以暴 露出背光模組140。背光模組140用以提供面光源142至顯示 φ 面板5〇。 習知測試裝置100的測試方法是先掀起探針板120，以將 顯示面板50放至置放槽112。之後，再蓋上探針板120，以使 探針板120的探針122接觸顯示面板50的測試線路52，進而 對顯示面板50進行電性測試及目視檢測。在測試過程中，背 光模組140係發出高亮度的面光源142，以利測試人員進行目 視檢測。然而，在更換顯示面板50時，背光模組140亦持續 發出相同亮度的面光源142。所以，當取下顯示面板50時， 高亮度的面光源142容易經由開孔114、124而直接傳遞至測 201137342 試人員的眼睛，導致測試人員的眼睛容易疲勞，甚至對測試人 員的眼睛造成傷害。此外，測試人員在眼睛疲勞的情況下更換 顯示面板50時，容易發生顯示面板5〇碰撞到其他物體的情 形，導致顯示面板50受損。 【發明内容】 本發明提供-種測試裝置，以保護測試人員的眼睛。 為達上述優點，本發明提出一種測試裝置，其包括背光模201137342 VI. Description of the Invention: [Technical Field] The present invention relates to a test device, and more particularly to a test device for testing a display panel. [Prior Art] After the display panel is completed, the tester needs to perform electrical test and visual inspection on the display panel to check whether the display panel can operate normally and check whether the display panel is displayed when it is displayed. Figure 1 is a schematic illustration of a conventional test apparatus. Referring to FIG. 1, the conventional test device 1A includes a carrier plate 11A and a probe card 120. The probe card 120 is pivotally connected to the carrier plate 110 through a pivot 130. The probe card 12 can be picked up or covered, and FIG. 1 shows the state in which the probe card 120 is on the cover. Further, the carrier board 11A has a placement slot 112 for placing the display panel 50. The probe card 120 has a probe 122 for testing the display panel 50, and an opening 124 for exposing the display panel 5''. In addition, the conventional test device 1 further includes a backlight module 140 disposed under the carrier board 11 (), and the bottom of the placement slot 112 is provided with an opening 114 to expose the backlight module 140. The backlight module 140 is configured to provide the surface light source 142 to the display φ panel 5〇. The test method of the conventional test apparatus 100 is to first pick up the probe card 120 to place the display panel 50 in the placement slot 112. Thereafter, the probe card 120 is further covered so that the probe 122 of the probe card 120 contacts the test line 52 of the display panel 50, thereby electrically and visually detecting the display panel 50. During the test, the backlight module 140 emits a high-brightness surface light source 142 for the tester to perform visual inspection. However, when the display panel 50 is replaced, the backlight module 140 also continues to emit the surface light source 142 of the same brightness. Therefore, when the display panel 50 is removed, the high-brightness surface light source 142 is easily transmitted directly to the eye of the test person through the openings 114 and 124, causing the tester's eyes to be easily fatigued and even causing damage to the tester's eyes. . Further, when the tester replaces the display panel 50 in the case of eye fatigue, it is liable to cause the display panel 5 to collide with other objects, resulting in damage to the display panel 50. SUMMARY OF THE INVENTION The present invention provides a test device to protect the eyes of a tester. In order to achieve the above advantages, the present invention provides a test apparatus including a backlight mold
Ϊ於、切換件、至少—探針機構及控制單元。承載板配 置於皮巧組上方，而切換件配置於承載板上。承餘具有開 i 模組從開孔出光提供面光源。探針機構包括探針 J動Ϊίίί載板連接，且適於在原始位置與測試位置之間 板位於原始位置時，切換件處於第-狀態， 板將切換件切換至第二狀態。 原始位置時，t讀件回歸第—狀態。 〜、a針板處於 上㈣奐件為微動開關。 體。發月之實把例中，上述之背光模組包括至少一發光 在本發明之一實施例中，者 模紐的發光亮度低於 =換，處於第-狀態時，背光 在本發明之— 201137342 模組的發光亮度介於1100燭光（candela) /平方公尺（以下 稱Cd/m2)至膽ed/m2。當切換件處於第二狀態時，背^ 組的發光亮度介於5900 cd/m2至6100 ed/m2。 、 在本發明之-實施例中，上述之探針機構更包括基座 探針板係可移動地固定於基座。 在本發明之-實施例巾，上述之基麵接於承载板 緣。 在本發明之-實施例中，上述之探針機構更包括施力& 件。此施力組件可滑動地設置於基座，並連接探針板。 在本發明之-實施例中，上述之探針板係樞接於承載板。 在本發明之測試裝置中，探針板可絲切換切換件的狀 態’且控制單元可根據切換件的狀態來控制背光模組的發光真 度。所以，本發明之測試裝置可在更換顯示面板時，降低背^ 模組的發光亮度，以保護測試人員的眼睛。 為讓本發明之上述和其他㈣、特徵和優點能更明顯易 懂，下文特舉較佳實施例，並配合所附圖式，作詳細說明如下。 【實施方式】 圖2A與圖2B是本發明-實施例之一種測試裝置處於不 同狀態時的局部示意圖。請先參照圖2A，本實施例之測試裝 置200包括背光模組210、承載板220、切換件230、至少一 探針機構240 (本實施例以一個為例）及控制單（ 承載板22〇配置於背光模組210上方，而切換件23(〇H 載板220上。承載板220具有開孔222，且此開孔222暴露出 背光模組210之出光面212。背光模組210從開孔222出光提 供面光源。承載板220可更具有置放槽224,而開孔222例如 是位於置放槽224底部。此外’探針機構24〇包括探針板242。 201137342Ϊ, switching parts, at least - probe mechanism and control unit. The carrier board is disposed above the leather camera group, and the switching member is disposed on the carrier board. The bearing has an open i module to provide a surface light source from the opening. The probe mechanism includes a probe J and a carrier connection, and is adapted to be in the first state when the board is in the home position between the home position and the test position, and the board switches the switch to the second state. At the original position, the t-reader returns to the first state. ~, a needle plate is on (4) The device is a micro switch. body. In the example, the backlight module includes at least one illuminating light in one embodiment of the present invention, wherein the illuminating brightness of the dies is lower than =, and when in the first state, the backlight is in the present invention - 201137342 The brightness of the module is between 1100 candelas/square meters (hereinafter referred to as Cd/m2) to the bili/d2. When the switching member is in the second state, the luminance of the backlight is between 5900 cd/m2 and 6100 ed/m2. In the embodiment of the invention, the probe mechanism further includes a base probe plate movably fixed to the base. In the embodiment of the present invention, the base surface is attached to the edge of the carrier sheet. In an embodiment of the invention, the probe mechanism described above further includes a force applying & The force applying assembly is slidably disposed on the base and connected to the probe card. In an embodiment of the invention, the probe card is pivotally attached to the carrier plate. In the test apparatus of the present invention, the probe card can switch the state of the switching member and the control unit can control the luminance of the backlight module according to the state of the switching member. Therefore, the test device of the present invention can reduce the brightness of the backlight module when the display panel is replaced to protect the eyes of the tester. The above and other aspects, features and advantages of the present invention will become more apparent from the following description. [Embodiment] Figs. 2A and 2B are partial schematic views showing a test apparatus of the present invention in an embodiment in a different state. Referring to FIG. 2A , the testing device 200 of the embodiment includes a backlight module 210 , a carrier 220 , a switching component 230 , at least one probe mechanism 240 (for example, one embodiment), and a control panel (the carrier 22 〇 The backlight module 210 has an opening 222, and the opening 222 exposes the light emitting surface 212 of the backlight module 210. The backlight module 210 is opened. The aperture 222 emits light to provide a surface light source. The carrier plate 220 can further have a placement slot 224, and the aperture 222 is located, for example, at the bottom of the placement slot 224. Further, the probe mechanism 24 includes a probe card 242. 201137342
探針板242與承載板220連接，且適於在原始位置（如圖2A 所示）與測試位置（如圖2B所示）之間移動。當探針板242 位於原始位置時，切換件230處於第一狀態，當探針板242位 於測試位置時，探針板242將切換件23〇切換至第二狀態。控 制單元電性連接至背光模組21〇、切換件230與探針板242， 且控制單元適於根據切換件230的狀態控制背光模組21〇的發 光亮度。 更詳細地說，本實施例之探針機構24〇例如更包括基座 244與施力組件246。基座244例如是連接於承載板22()的邊 緣，探針板242係可移動地固定於基座244，而施力組件246 係可滑動地設置於基座244，並連接探針板242。亦即，探針 板242透過基座244而與承載板220連接。 如圖2A所不，當進行測試時，測試人員可施力於施力組 件246，使施力組件246沿方向D1水平移動，以推動探針板 242從原始位置沿方向D1水平移動一段預設距離。如圖邡所 示、，由於探針板242具有斷差結構243，當探針板242移動了 上述預汉距離後，繼續沿水平方向D1的施力組件246的推動 鲁部247會沿著斷差結構243移動至斷差結構243的上層，以推 動探針板242從沿垂直方向D2向下移動一段距離而抵達測試 位置。此時，探針板242的探針241可與待測試的顯示面板電 性連接，而控制單元所提供的測試訊號可經由探針241傳遞至 顯示面板。 承上述，上述之切換件230例如為微動開關，當探針板 242被下壓至測試位置時，探針板242係壓縮切換件，以 將切換件230切換至第二狀態。此外，當測試人員沿著相反於 水平方向D1的方向推動施力組件246時，施力組件2仏的推 201137342 動部247會沿著斷差結構243移動至斷差結構243的下層，以 使探針板242移回原始位置，進而使切換件23〇回歸第一狀 態。在本實施例中，探針板242可藉由彈簧的彈性恢復力而移 回原始位置。也就是說，探針機構240可更包括彈簧（圖未 示），當探針板242移動至測試位置時，施力組件246的推動 邛247係抵住探針板242，所以探針板242會壓縮彈簧❶當測 試人員沿著相反於水平方向D1的方向推動施力組件246 &推The probe card 242 is coupled to the carrier plate 220 and is adapted to move between an original position (as shown in Figure 2A) and a test position (shown in Figure 2B). When the probe card 242 is in the home position, the switching member 230 is in the first state, and when the probe card 242 is in the test position, the probe card 242 switches the switching member 23 to the second state. The control unit is electrically connected to the backlight module 21, the switching member 230 and the probe card 242, and the control unit is adapted to control the brightness of the backlight module 21 according to the state of the switching member 230. In more detail, the probe mechanism 24 of the present embodiment further includes, for example, a base 244 and a force applying assembly 246. The base 244 is, for example, connected to the edge of the carrier plate 22, the probe card 242 is movably fixed to the base 244, and the force applying assembly 246 is slidably disposed on the base 244 and connected to the probe card 242. . That is, the probe card 242 is coupled to the carrier plate 220 through the base 244. As shown in FIG. 2A, when performing the test, the tester can apply the force applying component 246 to move the force applying component 246 horizontally in the direction D1 to push the probe card 242 horizontally from the original position in the direction D1 by a preset. distance. As shown in FIG. ,, since the probe card 242 has a stepped structure 243, after the probe plate 242 moves the pre-element distance, the push portion 246 of the force applying component 246 continuing in the horizontal direction D1 is broken. The differential structure 243 moves to the upper layer of the fault structure 243 to push the probe card 242 down a distance in the vertical direction D2 to reach the test position. At this time, the probe 241 of the probe card 242 can be electrically connected to the display panel to be tested, and the test signal provided by the control unit can be transmitted to the display panel via the probe 241. In the above, the switching member 230 is, for example, a micro switch. When the probe card 242 is pressed down to the test position, the probe card 242 compresses the switching member to switch the switching member 230 to the second state. In addition, when the tester pushes the force applying assembly 246 in a direction opposite to the horizontal direction D1, the pusher 201137342 moving portion 247 of the force applying member 2仏 moves along the sectional structure 243 to the lower layer of the sectional structure 243, so that The probe card 242 is moved back to the original position, thereby causing the switching member 23 to return to the first state. In this embodiment, the probe card 242 can be moved back to the original position by the elastic restoring force of the spring. That is, the probe mechanism 240 can further include a spring (not shown). When the probe card 242 is moved to the test position, the pusher 247 of the force applying assembly 246 is against the probe card 242, so the probe card 242 Will compress the spring when the tester pushes the force applying component 246 & in the direction opposite to the horizontal direction D1
動部247移至斷差結構243的下層時，彈簧的彈性恢復力會驅 使探針板242移回原始位置。 當切換件230處於第一狀態時，代表探針板242位於原始 位置，所以測試人員會在此狀態下進行更換顯示面板的動作。 當切換件230處於第二狀態時，代表探針板242位於測試位 置’所以測試人員會在此狀態下進行電性測試及目視檢測的動 作。為了避免測試人員在更換顯示面板時受到強光的影響導致 眼，容易疲勞或受到損害，當切換件23()處於第—狀態時，控 制單元可控制背光模組21〇的發光亮度低於切換件23()處於^ 二狀態時的發光亮度。舉例來說，當切換件23()處於第二狀態 時，2背光模210的發光亮度例如是介於59〇〇 至二 c— ’而當切換件23()處於第一狀態時，背光模組21〇的發 先梵度例如是被調低至介於議ed/m2至聽ed/m2。如此， 目:Ϊί::式人員的在更換顯示面板時受到強光的影響導致眼 ^疲勞或受到損害，進而達到保護測試人員之眼睛的效果。另 換狀態時f光模組的低亮度光源可供測試人員作為 ^ ^ 及降低測試人S的眼睛疲勞，使得測試人員 在更換，不面板時碰撞到顯示面板的機率減少。 值得一提的是，由於本實施例是利用探針板242來切換切 S3 7 201137342 換件230的狀態，賴人員不需另外進行切換動作來切換切換 件230的狀態，所以可節省時間。此外，為了能迅速調整背光 模組2U)的發光亮度，可使用發光二極體作為背光模組21〇的 發光源。另外，在一實施例中，切換件23〇處於第一狀態時， 背光模組210的發光亮度可被調低至零，亦 ^ 於第一狀態時關閉背光模組210。 換仵23〇處 圖3A與圖3B是本發明另-實施例之—種測試裝置處於 不同狀態時的局部示意圖。請先參照圖3A，本實施例之測試 裝置300包括背光模組310、承載板320、切換件33〇、至少 -探錢構鳩（本實施_ -個為例）及控解元（圖未示）。 承載板320配置於背光模組31〇上方，而切換件33〇配置於承 載板320上。承載板320具有開孔322，此開孔322暴露出背 光模組310之出光面312。承載板32〇可更具有置放槽似， 而開孔322例如是位於置放槽324底部。此外，探針機構_ 包括探針板342。探針板342位於承载板32〇上方，並透過樞 袖344而樞接於承載板32〇。探針板342具有可用以測試顯示 面板的探針343，以及可暴露出顯示面板的開孔345。 • 在本實施例中，探針板342適於在原始位置（如圖3八所 示）與測試位置（如圖3B所示）之間移動。當探針板料2位 於原始位置時（即掀起探針板342時），切換件33〇處於未被 壓縮的第一狀態。當探針板342位於測試位置時（即蓋上探針 板342時），探針板342壓縮切換件33〇，以將切換件33〇切 換至第一狀態。此切換件330例如是微動開關。控制單元電性 連接至背光模組310、切換件330與探針板342，控制單元適 於根據切換件330的狀態控制背光模組31〇的發光亮度。 有關於控制單元㈣背_組31()的發光亮度的方式與 [S] 8 201137342 上述實施例相似，在此將不再重述。此外，本實施例之測3式裝 置300的優點與上述測試裝置2〇〇相似’在此亦不再重述β 雖然本發明已以較佳實施例揭露如上，然其並非用以限定 本發明，本發明所屬技術領域中具有通常知識者，在不脫離本 發明之精神和範_ ’當可作些許之更動與卿，因此本發明 之保護範圍當視後附之申請專利範圍所界定 【圖式簡單說明】 马準。When the movable portion 247 is moved to the lower layer of the sectional structure 243, the elastic restoring force of the spring drives the probe plate 242 to return to the original position. When the switching member 230 is in the first state, the representative probe card 242 is in the original position, so the tester performs the action of replacing the display panel in this state. When the switching member 230 is in the second state, it represents that the probe card 242 is in the test position. Therefore, the tester performs an electrical test and a visual inspection operation in this state. In order to prevent the tester from being affected by strong light when the display panel is replaced, the eye is easily fatigued or damaged. When the switching member 23() is in the first state, the control unit can control the illumination brightness of the backlight module 21〇 to be lower than the switching. The brightness of the light when the piece 23() is in the second state. For example, when the switching member 23 () is in the second state, the luminance of the backlight of the backlight module 210 is, for example, 59 〇〇 to 2 c ′′ and when the switching member 23 ( ) is in the first state, the backlight module For example, the 21st 发 梵 梵 梵 is reduced to between ed/m2 and ed/m2. In this way, the eyes of the Ϊί:: person are affected by the strong light when the display panel is replaced, causing the eye to be fatigued or damaged, thereby achieving the effect of protecting the eyes of the tester. In the other state, the low-brightness light source of the f-light module can be used as a ^ ^ and reduce the eye strain of the tester S, so that the probability of the tester colliding with the display panel when the panel is replaced is not reduced. It is worth mentioning that, since the probe board 242 is used to switch the state of the replacement member 230 by using the probe card 242, the person does not need to perform another switching operation to switch the state of the switching member 230, thereby saving time. Further, in order to quickly adjust the luminance of the backlight module 2U), a light-emitting diode can be used as a light source of the backlight module 21A. In addition, in an embodiment, when the switching member 23 is in the first state, the brightness of the backlight module 210 can be lowered to zero, and the backlight module 210 is also turned off in the first state. Fig. 3A and Fig. 3B are partial schematic views of a test apparatus according to another embodiment of the present invention in different states. Referring to FIG. 3A, the testing device 300 of the embodiment includes a backlight module 310, a carrier board 320, a switching component 33, at least a detection structure (this embodiment is an example), and a control solution element (not shown). Show). The carrier board 320 is disposed above the backlight module 31〇, and the switching member 33〇 is disposed on the carrier board 320. The carrying plate 320 has an opening 322 that exposes the light emitting surface 312 of the backlight module 310. The carrier plate 32 can be more like a placement slot, and the aperture 322 is, for example, at the bottom of the placement slot 324. Further, the probe mechanism_ includes a probe card 342. The probe card 342 is located above the carrier 32 , and is pivotally connected to the carrier 32 through the pivot sleeve 344. The probe card 342 has a probe 343 that can be used to test the display panel, and an opening 345 that can expose the display panel. • In this embodiment, the probe card 342 is adapted to move between the home position (as shown in Figure 3) and the test position (as shown in Figure 3B). When the probe sheet 2 is in the home position (i.e., when the probe card 342 is picked up), the switching member 33 is in the first state of being uncompressed. When the probe card 342 is in the test position (i.e., when the probe card 342 is closed), the probe card 342 compresses the switching member 33A to switch the switching member 33 to the first state. This switching member 330 is, for example, a micro switch. The control unit is electrically connected to the backlight module 310, the switching member 330 and the probe card 342, and the control unit is adapted to control the brightness of the backlight module 31 according to the state of the switching member 330. The manner of the luminance of the backlight of the control unit (4) back_group 31() is similar to that of [S] 8 201137342, and will not be repeated here. In addition, the advantages of the measuring device 300 of the present embodiment are similar to those of the testing device 2 described above. 'There is no restatement of β here. Although the present invention has been disclosed above in the preferred embodiment, it is not intended to limit the present invention. It is to be understood that the scope of the present invention is defined by the scope of the appended claims. Brief description] Ma Zhun.
—種測試裝置處於不 圖1是習知一種測試裝置的示意圖。 圖2Α與圖2Β是本發明一實施例之 同狀態時的局部示意圖。 一種測試裝置處於 圖3Α與圖3Β是本發明另一實施例之 不同狀態時的局部示意圖。 【主要元件符號說明】 50 ·顯不面板 52 :測試線路 100、200、300 :測試裝置 110、220、320:承載板 112、224、324 :置放槽 114、124、222、322、345 :開孔 120、242、342 :探針板 122、241、343 :探針 130、344 :樞軸 140、210、310 :背光模組 142 :面光源 212、312 :出光面 230、330 :切換件 201137342 240、340 :探針機構 243 :斷差結構 244 :基座 246 :施力組件 247 :推動部 D1 :水平方向 D2 :垂直方向A test device is not shown in Fig. 1 is a schematic view of a conventional test device. 2A and 2B are partial schematic views showing the same state of an embodiment of the present invention. A test apparatus is shown in Fig. 3A and Fig. 3A is a partial schematic view of a different state of another embodiment of the present invention. [Main component symbol description] 50 · Display panel 52: Test lines 100, 200, 300: Test devices 110, 220, 320: carrier boards 112, 224, 324: placement slots 114, 124, 222, 322, 345: Openings 120, 242, 342: probe cards 122, 241, 343: probes 130, 344: pivots 140, 210, 310: backlight module 142: surface light sources 212, 312: light-emitting surfaces 230, 330: switching parts 201137342 240, 340: probe mechanism 243: step structure 244: base 246: force applying unit 247: pushing unit D1: horizontal direction D2: vertical direction