112^ 112^ 729 、發明説明： 明戶斤属之技術領域】 本發明係關於一種接觸式電子檢驗模組，尤指一種應 用在接觸式積體電路（1C)及其他電子產品檢驗設備之接 式電子檢驗模組。 【先前技術】 /般積體電路（1C)及其他電子產品製造完成時，必 需經過多項檢驗，以確保產品的良率。習知的積體電路（ic) 及其他電子產品的檢驗方式，主要分為非接觸式檢驗及接 觸式檢驗二種，非接觸式檢驗是應用光學設備檢驗，接觸 式檢驗則將積體電路或其他電子產品放置在檢測裝置上， 透過檢測裝置的探針（端子）與積體電路或其他電子產品 的接點作接觸’藉此取得檢驗數據，用以驗證立品質。 為了使接觸式檢驗設備可以適應多種積體電路（IC) 及其他電子產品，相關業者提出一種接觸式檢測裝置（模 組）。習知的接觸式檢測裝置如第丨圖所示，係具有一矩形 的载座10’在縣10設树數魅較形式制的通孔 101，各通孔101中植入複數個金屬球20，並在通孔1〇1 上端及下端分別設有一上導接部30及一下導接部40，上導 接部30的端面鍍設有金屬膜3〇1，下導接部4〇的端面結合 有導電膠膜4(H。但’這種接觸式檢測裳置，通過金屬膜 3〇!與積體電路或其他電子產品的接點作接觸，導致金屬膜 3〇1容易被磨損；而且，當金屬膜3〇1使用一段時間被磨㈣ 201124729 時，不容易實施更換及修復，只能將整組檢測裝置淘汰， 造成資源浪費、檢驗成本增加；另者，通過複數個金屬球 20接通上、下導接部30、40 ’容易產生多個縫隙而影響導 電性，繼而發生導電不良等問題，導致檢測結果的信^度 不佳。 、 如第2圖所示，習知另一種接觸式檢測襞置，採用沖 壓製成的金屬探針50,並將金屬探針5〇結合在載座仞的 通孔101中，使各個金屬探針5〇上端5〇1突出在載座1〇 | 上，下端502與檢驗設備（例如電腦等）連接。這種金屬 探針50的上端501雖然不容易被磨損，而且可能可以=替 換，但是金屬探針50的彈性係數不足或結構設計不良，反 而容易磨損積體電路或其他電子產品的接點（例如^損用 以增進導接性的鍍層）’甚至於破壞積體電路的接點。由此 可見，習知應用在積體電路及其他電子產品的接觸式 裝置，存在許多亟待改進的缺撼。 、 • 0此’如何發明出一種接觸式電子檢驗模la，可以鹿 用在積體電路（1C)及其他電子產品的檢驗程序上，以： 電子檢驗模組的導接端子達到可以防止被磨損、可以抽 替換、能保護積體電路及其他電子產品的接點、以及増取 導電性的效果，將是本發明所欲積極揭露之處。 進 【發明内容】 有鑑於上述習知技術之缺憾’發明人有感其未壤於6 善，遂竭其心智悉心研究克服，憑其從事該項產業多年= 201124729 =子Γ研發出一種接觸式電子檢驗模組，以期達 ==防止被磨損、導接端子可以抽取替換'保 - ,、他電子產品的聽、纽增電性之目 的。 其葬之主要目的在提供—種接觸式電子檢驗模組， ==及複數個導接端子的結構設計，致使其導接 優良的彈性餘，可以與積體電路（ic)及其他112^112^ 729, invention description: the technical field of Minghujin] The present invention relates to a contact type electronic inspection module, especially to a contact integrated circuit (1C) and other electronic product inspection equipment Electronic test module. [Prior Art] When the integrated circuit (1C) and other electronic products are manufactured, a number of tests must be performed to ensure the yield of the product. The conventional integrated circuit (ic) and other electronic products are mainly classified into two types: non-contact type inspection and contact type inspection. Non-contact type inspection is applied optical equipment inspection, and contact inspection is integrated circuit or Other electronic products are placed on the detecting device, and the probes (terminals) of the detecting device are brought into contact with the contacts of the integrated circuits or other electronic products to obtain inspection data for verifying the standing quality. In order to enable contact inspection equipment to accommodate a variety of integrated circuits (ICs) and other electronic products, the related art has proposed a contact detection device (module). The conventional contact type detecting device has a rectangular carrier 10' having a rectangular through hole 101 in the county 10, and a plurality of metal balls 20 are implanted in each of the through holes 101, as shown in the figure. And an upper guiding portion 30 and a lower guiding portion 40 are respectively disposed at the upper end and the lower end of the through hole 1〇1, and the end surface of the upper guiding portion 30 is plated with a metal film 3〇1, and an end surface of the lower guiding portion 4〇 Combined with a conductive film 4 (H. But 'this type of contact detection, through the metal film 3 〇! Contact with the integrated circuit or other electronic product contacts, resulting in metal film 3 〇 1 easy to wear; and When the metal film 3〇1 is used for a period of time (4) 201124729, it is not easy to implement replacement and repair, and only the entire group of detection devices can be eliminated, resulting in waste of resources and increased inspection costs. In addition, through a plurality of metal balls 20 The upper and lower guiding portions 30, 40' are likely to generate a plurality of slits to affect the conductivity, and subsequently cause problems such as poor conduction, resulting in poor reliability of the detection result. As shown in Fig. 2, another conventional one is shown. Contact detection device, metal probe 50 made by stamping, and gold The probe 5 is coupled to the through hole 101 of the carrier, so that the upper end 5〇1 of each metal probe 5 protrudes on the carrier 1〇|, and the lower end 502 is connected to an inspection device (such as a computer, etc.). Although the upper end 501 of the probe 50 is not easily worn, and may be replaced, the metal probe 50 has insufficient elastic modulus or poor structural design, and is liable to wear the joint of the integrated circuit or other electronic products (for example, damage). In order to improve the conductivity of the plating layer, 'even to break the joint of the integrated circuit. It can be seen that there are many defects in the contact device of the integrated circuit and other electronic products, and there are many defects that need to be improved. This method of how to invent a contact electronic test module, can be used in the inspection circuit of integrated circuit (1C) and other electronic products, to: The conductive terminal of the electronic test module can be prevented from being worn and can be pumped. The replacement, the protection of the contacts of the integrated circuit and other electronic products, and the effect of extracting the conductivity will be actively disclosed in the present invention. The insufficiency of the 'inventor's feeling that it is not in the 6 good, exhausted his mind to study and overcome, relying on its involvement in the industry for many years = 201124729 = Zikai developed a contact electronic test module, in order to achieve == prevent The worn and conductive terminals can be used to replace the 'protection', the purpose of his electronic products, and the purpose of the electronic product. The main purpose of the funeral is to provide a contact electronic test module, == and multiple guides. The structural design of the terminal results in excellent flexibility for the connection, and can be integrated with the integrated circuit (ic) and others.
構，淮α=接點作接觸’並具有可與承載座分離的卡合結 取替換、/到導接端子可以防止被磨損、導接端子可以抽 導電性之目 1積體電路及其他電子產品的接點、以及增進 容係述:的，本發明接觸式電子檢驗模組之實施内 及複數個分別;’該承载座上設有複數個端子孔； 二端分別露出中的導接端子，料接端子的 端子包含1性纟=上、下面’其特徵在於··該導接 的導電絲，該導料^條或一條以上埋設在彈性柱中央 部，並使二端3令間的一段彈性部及二端的導接 ^的導接部露出在彈性枉的二端。 該導接部電絲的彈性部係為螺旋狀結構， 丨你刀別考折在彈性柱二 丹 :彈性桎係為㈣⑽ic_)基射，該導接端 的彈性杈係具有—上端面、一下端面構成；該導接端子 露电在承載座上面，該下端面d的权體，該 該側面設有—卡合在承载座端子孔中的^承戴座下面， 如此使導電i S] 5 201124729 > 絲二端的導接部分別露出在彈性柱的上端面與下端面。另 者，該承載座的端子孔靠近上端設有一往内縮的階級面， =彈性柱的凸部下端抵靠在階級面上；該承載座上面可結 有固疋元件，固疋元件設有對應端子孔的通孔，使彈 性柱的上端面穿過通孔露出在固定元件上面，並使該通孔 的邊緣抵壓在彈性柱的凸部上端；該承載座上面設有一凹 : 槽使固疋元件結合在凹槽中；該承載座上面可設有一定 .鲁 位凸部，該固定元件設有一與定位凸部結合的定位凹部。 藉此，本發明之一種接觸式電子檢驗模組，使導接端 子可以防止被磨損、導接端子可以抽取替換、保護積體電 路及其他電子產品的接點、以及增進導電性之功效。 【實施方式】 為充分瞭解本發明之目的、特徵及功效，茲藉由下述 具體之實施例，並配合所附之圖式，對本發明做一詳細說 _ 日月’說明如後： ' 參閱第3圖、第4圖及第5圖所示，本發明之接觸式 電子檢驗模組，較佳的實施例包含有··一承载座1，該承载 座1係為矩形或其他形狀的絕緣座體，在承載座1上設有 複數個排列的端子孔U，如圖所示可以排列在承载座i上 相應的二侧，亦可以採用其他幾何形狀的排列方式；及複 數個分別結合在端子孔n中的導接端子2 ’使該導接端子 2的二端分別露出在承載座1的上面與下面。其特徵在於： 如第4圖所示，該導接端子2包含有一彈性柱2卜及一條⑺ 6 201124729 或一條以上垂直埋設在彈性柱21中央的導電絲22，該導電 絲22包含有中間的一段彈性部221及二端的導接部222， 並使二端的導接部222露出在彈性柱21的二端，藉此組成 接觸式電子檢驗模組，提供積體電路（Ic)及其他電子產 品放置在承載座1上，使積體電路（IC)及其他電子產品 的，點可以與導接端子2的上導接部222接觸，再通過導 i^子2的下導接部222連接到電子檢驗設備，以進行接 觸式的檢驗程序，確保品質良率。 復如第4圖所示，本發明導接端子2為了增進彈性係 、較佳的實施例包含：該導接端子2的導電絲的彈 P 221係為螺旋狀結構或反復曲折結構，使彈性部221 I以跟隨著彈性柱21伸縮。該導接端子2的導電絲二 =導接部222係分別彎折在彈性柱二端的片體或其他足 乍電性連接的結構。且該導電絲22可為金（Au)、銀 阻銅（〇0或其合金所構成，具有高導電率、低電 佳的/。又，該導接端子2的彈性柱21係為彈性係數較 且右Γ同（版隱，俗稱石夕膠）基質添加硬化劑’或其他 較佳材質所構成。如第6圖及第7圖所示，本發明 —^轭例更包含.該導接端子2的彈性柱21係構成有 命^端面211、一下端面212及一側面213的圓形或其他幾 /狀的杈體，該上端面211露出在承載座丨上面該下 承面212露出在承載座丨下面，該側面213設有一卡合在 二，座1端子孔n中的凸部214，並使上述該導電絲a? —端的導接部222分別露出在彈性柱21的上端面211與下[^ 7 201124729 Λ 端面212 ’可以分別與積體電路（IC)及其他電子產品的接 點’以及電子檢驗設備電性連接。 如第7圖、第8圖及第9圖所示，本發明之承載座i 為了使導接端子2可以替換，其較佳的實施例包含：該承 載座1的端子孔11罪近上端設有一往内縮的階級面13，如 此使該導接端子2彈性柱21的凸部214下端抵靠在階級面 13上。該承載座1上面結合有一矩形片或其他形狀的固定 : 元件3，該固定元件3設有對應各端子孔u的通孔31，如 -·· 此使該導接端子2彈性柱21上段的穿過通孔31，進而使上 端面211及導電絲22的上導接部222露出在固定元件3上 面’並利用該通孔31的邊緣抵壓在彈性柱21的凸部214 上端，將導接端子2固定在各端子孔u中。又，該承載座 1上面可以設有一凹槽12 ’使上述該端子孔n設置在凹槽 12中，旅使該固定元件3定位結合在凹槽12中。為了使承 載座1與固定元件3可以精準定位結合，該承载座丨上面 可設有至少一定位凸部Μ ’該定位凸部14可為圓柱；而該 固定元件3設有至少一與定位凸部14結合的定位凹部32， 該定位凹部32可為匹配圓桎的圓孔。 藉本發明上述之接觸式電子檢驗模組設計，其應用實 ' 施成為積體電路（IC)及其他電子產品的接觸式檢驗裝置 時，如第10圖及第Π圖所示，可以將封裝完成的積體電 路4或其他電子產品放置在承載座i上，使積體電路4的 接點41與導接端子2的導電絲Μ上端的導接部2D形成 電性連接，如此通過導電絲22下端的導接部222連接到檢[^ 8 201124729 驗設備（例如電腦等）’就能進行積體電路4及 產品的接觸式檢測程序。 ’、電子 由於本發明該導接端子2的彈性柱21 (SiHcone)基質所構成，其具有良好的彈性係數^ 此當導接端子2的上端面211及導電絲22上端的因 222接觸到積體電路4的接點41或其他電子產口日士導接部 形成收縮與緩衝的效果，降低操作人員或自動機能 體電路4的衝擊力，藉此防止導電絲22上端的導接積 被磨損，並能避免導接端子2或導接部222磨損或破 體電路4的接點41。而且如帛u圖所示，本發明 早 2能夠使彈性體21的上接觸面211對積體電路*的接點μ 形成包覆接觸及定位作用’藉此獲致良好的電性導接效 果。又’本發明利用金（Au)、銀（Ag)、銅（a)或盆 合金構成導電絲22而作為導接的媒介，避免如第i圖所^ 習知技術可能發生縫隙的缺憾，因此能降低電阻、增進導 電性，以確保檢驗數據的正確性與可信賴度，減少^進行 功能性測試時產生誤判’有效地避免瑕疲品流出市面。另 外，本發明具有可替換導接端子2的結構設計，當有需要 替換導接端子2時，<以將上述的固定元件3拆開，如此 就能抽出使用壽命已達成的導接端子2，再替換新的導接端 子2或重新矩陣排列’達到導接端子2可以抽取替換之功 效，俾降低檢驗成本。 如上所述，本發明完全符合專利三要件：新穎性、進 步性和產#上的可利錄。叫酿和進步性而言，本發⑸ 9 201124729 明藉著承載座及複數個導接端子的結構設計，致使其導接 端子具有優良的彈性係數，可以與積體電路（ic)及其他 電子產品的接點作接觸，並具有可與承載座分離的卡合結 構，進而達到導接端子可以防止被磨損、導接端子可以抽 取替換、保護積體電路及其他電子產品的接點、以及增進 導電性的效用。就產業上的可利用性而言，利用本發明所 衍生的產品，當可充分滿足目前市場的需求。 本發明在上文中已以較佳實施例揭露，然熟習本項技 術者應理解的是，該實施例僅用於描繪本發明，而不應解 讀為限制本發明之範圍。應注意的是，舉凡與該實施例等 效之變化與置換，均應設為涵蓋於本發明之範疇内。因此， 本發明之保護範圍當以下文之申請專利範圍所界定者為 準。 【圖式簡單說明】 第1圖為習知接觸式檢測裝置之示意圖。 第2圖為習知另一種接觸式檢測裝置之示意圖。 第3圖為本發明較佳實施例之組合立體圖。 第4圖為本發明導接端子較佳實施例之剖面圖。 第5圖為本發明較佳實施例之分解立體圖。 第6圖為本發明較佳實施例之組合侧視圖。 第7圖為本發明第6圖A部分之放大示意圖。 第8圖為本發明較佳實施例之分解侧視圖。 第9圖為本發明第7圖B部分之放大示意圖。 [S1 10 201124729 第ίο圖為本發明較佳實施例之應用狀態示意圖。 第11圖為本發明第10圖c部分之放大示意圖。 【主要元件符號說明】Structure, Huai α = contact for contact 'and has a snap-fit replacement that can be separated from the carrier, / to the terminal to prevent wear, the conductive terminal can be conductive and the other integrated circuit and other electronics The contact point of the product, and the improvement of the capacity: the implementation of the contact electronic test module of the present invention and a plurality of separate; 'the carrier is provided with a plurality of terminal holes; the two ends respectively expose the conductive terminals The terminal of the material connection terminal includes a 1-character 纟=upper and lower sides. The characteristic is that the conductive wire of the guide wire is embedded in the central portion of the elastic column and the two ends are arranged between the two ends. A portion of the elastic portion and the guiding portion of the two ends of the guiding portion are exposed at the two ends of the elastic jaw. The elastic portion of the wire of the guiding portion is a spiral structure, and the bending of the wire is in the elastic column: the elastic 桎 is (4) (10) ic_), and the elastic 杈 of the guiding end has an upper end surface and a lower end surface. The conductive terminal is exposed on the upper surface of the bearing block, and the side surface is provided to be engaged under the bearing seat in the terminal hole of the bearing seat, so that the conductive i S] 5 201124729 > The guiding portions of the two ends of the wire are respectively exposed at the upper end surface and the lower end surface of the elastic column. In addition, the terminal hole of the bearing seat is provided with a downwardly-retracted class surface near the upper end, and the lower end of the convex portion of the elastic column abuts against the class surface; the carrier seat may be provided with a solid-state component, and the solid-state component is provided Corresponding to the through hole of the terminal hole, the upper end surface of the elastic column is exposed on the fixing component through the through hole, and the edge of the through hole is pressed against the upper end of the convex portion of the elastic column; the carrier is provided with a concave surface: a groove The fixing element is combined in the groove; the bearing seat may be provided with a certain lumbar convex portion, and the fixing element is provided with a positioning concave portion combined with the positioning convex portion. Accordingly, the contact type electronic inspection module of the present invention can prevent the conductive terminal from being worn, the terminal can be removed, the contacts of the integrated circuit and other electronic products are protected, and the conductivity is improved. [Embodiment] In order to fully understand the object, features and effects of the present invention, the present invention will be described in detail by the following specific embodiments and the accompanying drawings. 3, 4 and 5, the preferred embodiment of the contact electronic test module of the present invention comprises a carrier 1, which is a rectangular or other shape of insulation. The base body is provided with a plurality of terminal holes U arranged on the bearing base 1, which can be arranged on the corresponding two sides of the bearing base i as shown in the figure, and other geometric shapes can also be adopted; and a plurality of respectively are combined The terminal 2' in the terminal hole n exposes the two ends of the terminal 2 to the upper surface and the lower surface of the carrier 1, respectively. The conductive terminal 22 includes an elastic column 2 and a (7) 6 201124729 or more than one conductive wire 22 vertically embedded in the center of the elastic column 21, and the conductive wire 22 includes an intermediate portion. a portion of the elastic portion 221 and the two ends of the guiding portion 222, and the two ends of the guiding portion 222 are exposed at the two ends of the elastic column 21, thereby forming a contact electronic verification module, providing an integrated circuit (Ic) and other electronic products. Placed on the carrier 1 so that the integrated circuit (IC) and other electronic products can be in contact with the upper guiding portion 222 of the guiding terminal 2, and then connected to the lower guiding portion 222 of the guiding device 2 Electronic inspection equipment for contact inspection procedures to ensure quality yield. As shown in FIG. 4, in order to improve the elastic system, the conductive terminal of the present invention includes: the elastic P 221 of the conductive wire of the conductive terminal 2 has a spiral structure or a repeated meandering structure to make the elastic The portion 221 I is expanded and contracted following the elastic column 21. The conductive wire 2 of the conductive terminal 2 is a structure in which the guiding portion 222 is bent at the two ends of the elastic column or the other is electrically connected. The conductive wire 22 can be made of gold (Au) or silver-resistant copper (〇0 or its alloy, and has high conductivity and low electric power. Moreover, the elastic column 21 of the conductive terminal 2 is elastic coefficient. It is composed of a matrix-adding hardener or other preferred materials. As shown in Figures 6 and 7, the present invention further includes a guide. The elastic column 21 of the terminal 2 is formed into a circular or other several-shaped body having a life end surface 211, a lower end surface 212 and a side surface 213. The upper end surface 211 is exposed on the bearing seat and the lower bearing surface 212 is exposed. The side surface 213 is provided with a convex portion 214 which is engaged in the second terminal hole n of the second socket, and the guiding portion 222 of the conductive wire a-end is respectively exposed on the upper end surface 211 of the elastic column 21. And the next [^ 7 201124729 端面 end face 212 ' can be electrically connected to the integrated circuit (IC) and other electronic products' and electronic inspection equipment. As shown in Figure 7, Figure 8, and Figure 9, In order to replace the guiding terminal 2, the preferred embodiment of the carrier i includes: the terminal of the carrier 1 11 is near the upper end, and has a tapered face 13 so that the lower end of the convex portion 214 of the elastic terminal 21 of the guiding terminal 2 abuts against the level surface 13. The carrier 1 is combined with a rectangular piece or other shape. Fixing: component 3, the fixing component 3 is provided with a through hole 31 corresponding to each terminal hole u, such as -·· such that the upper end of the elastic column 21 of the guiding terminal 2 passes through the through hole 31, thereby making the upper end surface 211 and conductive The upper guiding portion 222 of the wire 22 is exposed on the upper surface of the fixing member 3 and is pressed against the upper end of the convex portion 214 of the elastic column 21 by the edge of the through hole 31, and the guiding terminal 2 is fixed in each terminal hole u. The carrier 1 can be provided with a recess 12 ′ so that the terminal hole n is disposed in the recess 12, and the fixing component 3 is positioned and coupled in the recess 12. The carrier 1 and the fixing component 3 can be accurately positioned. The positioning base can be provided with at least one positioning protrusion Μ 'The positioning protrusion 14 can be a cylinder; and the fixing element 3 is provided with at least one positioning recess 32 combined with the positioning protrusion 14 , the positioning recess 32 can be a circular hole matching the round 。. By the above contact current of the present invention When the test module is designed to be used as a contact test device for integrated circuits (ICs) and other electronic products, as shown in Fig. 10 and Fig. 3, the packaged integrated circuit 4 or other may be completed. The electronic product is placed on the carrier i, and the contact 41 of the integrated circuit 4 is electrically connected to the guiding portion 2D of the upper end of the conductive wire of the guiding terminal 2, and thus connected through the guiding portion 222 of the lower end of the conductive wire 22. By the inspection [^ 8 201124729 inspection equipment (such as a computer, etc.), the contact detection procedure of the integrated circuit 4 and the product can be performed. ', the electron is composed of the elastic column 21 (SiHcone) matrix of the conduction terminal 2 of the present invention. , which has a good elastic coefficient. When the upper end surface 211 of the conductive terminal 2 and the upper end of the conductive wire 22 are contacted by the contact 41 of the integrated circuit 4 or the other electronic product, the Japanese guiding portion forms a contraction and buffer. The effect of reducing the impact force of the operator or the automatic function body circuit 4, thereby preventing the conductive joint of the upper end of the conductive wire 22 from being worn, and avoiding the wear of the conductive terminal 2 or the guiding portion 222 or the connection of the breaking circuit 4 Point 41. Further, as shown in Fig. 5, the present invention enables the upper contact surface 211 of the elastic body 21 to form a coating contact and positioning effect on the contact μ of the integrated circuit*, thereby achieving a good electrical guiding effect. Further, the present invention utilizes gold (Au), silver (Ag), copper (a) or pot alloy to form the conductive filament 22 as a medium for guiding, thereby avoiding the possibility of gaps in the prior art as shown in FIG. It can reduce the resistance and improve the conductivity, so as to ensure the correctness and reliability of the test data, and reduce the misjudgment when performing the functional test to effectively prevent the fatigue from flowing out of the market. In addition, the present invention has a structural design of the replaceable conductive terminal 2, when it is necessary to replace the conductive terminal 2, <to disassemble the above-mentioned fixed component 3, so that the lead terminal 2 whose service life has been achieved can be extracted. , then replace the new lead terminal 2 or re-array arrangement 'to reach the terminal 2 can extract the effect of replacement, 俾 reduce the inspection cost. As described above, the present invention fully complies with the three requirements of the patent: novelty, advancement, and profitability on production #. In terms of brewing and progressiveness, the present invention (5) 9 201124729 has a structural design of the carrier and a plurality of conductive terminals, so that its conductive terminals have excellent elastic modulus, and can be integrated with integrated circuits (ic) and other electronic The contacts of the product make contact and have a snap-fit structure that can be separated from the carrier, thereby achieving the contact terminals to prevent wear, the terminal can be removed, the contacts of the integrated circuit and other electronic products are protected, and the contacts are improved. The utility of electrical conductivity. In terms of industrial availability, the products derived from the present invention can fully satisfy the needs of the current market. The invention has been described above in terms of the preferred embodiments thereof, and it is understood by those skilled in the art that the present invention is not intended to limit the scope of the invention. It should be noted that variations and permutations that are equivalent to the embodiments are intended to be within the scope of the present invention. Therefore, the scope of the invention is defined by the scope of the following claims. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic view of a conventional contact type detecting device. Figure 2 is a schematic illustration of another conventional touch detection device. Figure 3 is a perspective view of a combination of a preferred embodiment of the present invention. Figure 4 is a cross-sectional view showing a preferred embodiment of the conductive terminal of the present invention. Figure 5 is an exploded perspective view of a preferred embodiment of the present invention. Figure 6 is a side view of the combination of the preferred embodiment of the present invention. Figure 7 is an enlarged schematic view of a portion A of Fig. 6 of the present invention. Figure 8 is an exploded side elevational view of a preferred embodiment of the present invention. Figure 9 is an enlarged schematic view of a portion B of Figure 7 of the present invention. [S1 10 201124729] FIG. 10 is a schematic diagram of an application state of a preferred embodiment of the present invention. Figure 11 is an enlarged schematic view of a portion of Figure 10c of Figure 10 of the present invention. [Main component symbol description]
1 承載座 11 端子孔 12 凹槽 13 階級面 14 定位凸部 2 導接端子 21 彈性柱 211 上端面 212 下端面 213 側面 214 凸部 22 導電絲 221 彈性部 222 導接部 3 固定元件 31 通孔 32 定位凹部 4 積體電路 41 接點1 Carrier 11 Terminal hole 12 Groove 13 Class face 14 Positioning projection 2 Lead terminal 21 Elastic post 211 Upper end face 212 Lower end face 213 Side 214 Projection 22 Conductor wire 221 Elastic part 222 Guide part 3 Fixing element 31 Through hole 32 positioning recess 4 integrated circuit 41 contact