TW201042651A - Automatic test system capable of enhancing testing quality - Google Patents

Automatic test system capable of enhancing testing quality Download PDF

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Publication number
TW201042651A
TW201042651A TW98116380A TW98116380A TW201042651A TW 201042651 A TW201042651 A TW 201042651A TW 98116380 A TW98116380 A TW 98116380A TW 98116380 A TW98116380 A TW 98116380A TW 201042651 A TW201042651 A TW 201042651A
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Taiwan
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test
test system
pin
automated test
automatic test
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TW98116380A
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Chinese (zh)
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TWI408690B (en
Inventor
Tsung-Yao Chang
Yao-Te Hsu
Chien-Chung Yao
Chih-Chieh Chang
Cheng-Chang Huang
Jen-Ho Sun
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Wistron Corp
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Abstract

The present invention discloses an automatic test system capable of enhancing testing quality for testing a unit having a plurality of probes. The automatic test system includes an automatic test equipment, a plurality of transition pins coupled to the automatic test equipment, a tray including a plurality of pin slot for embedding the plurality of probes of the unit, a grounding plate for providing grounding, and a plurality of coaxial cables each coupled to a pin slot, a transition pin, and the grounding plate, for transmitting signals between the pin slot and the transition pin.

Description

201042651 六、發明說明: 【發明所屬之技術領域】 本發明係指一種可提升測試品質的自動化測試系統,尤指一種 可避免測試訊號受到外在干擾,進而提升測試的穩定性與準確度的 自動化測試系統。 ◎ 【先前技術】 自動化測試設備(Automatic Test Equipment,ATE)是一種通 過電腦控制進行器件、電路板和子系統等測試的設備,其可透過電 腦編程取代人工勞動,自動化地完成測試序列。然而,隨著單封裝 系統(System-in-packet,SIP)及單晶片系統(System-on-chip)的 不斷發展’自動化測試流程變得更加複雜,也衍生許多測試上的不 〇 確定因素。 請參考第1圖,第1圖為習知一自動化測試系統10之示意圖。 在第1圖中,自動化測試系統10透過一自動化測試設備1〇〇測試一 待測元件102。當待測元件102固定於托盤後,待測元# 1〇2的探 針PR1、PR2會嵌合於-針盤1〇4的針槽pm、pm,使得待測 元件102與自動化測試設備剛透過探針pm、pR2、針槽psTi、 PST2、單心線簡、麗及轉接針加、TR2進行訊號^換以 201042651 進行相關測試。其中’由於探針PR卜PR2的位置不一定符人轉接 針TIU、TR2的位置’因此,用來嵌合探針PIU、PR2的針槽PST1、 PST2浦接針TIU、TR2間需透過單心線WR卜術連結。單心 線WR卜WR2係由單一金屬線所形成之傳輸線,其外圍一般會塗 佈-層絕緣及保護塗料涔心線㈣、WR2在短距離傳輪上的應 用非常廣泛’但其抗雜職力及抗f磁干擾能力卻非常低,使得高 頻測試訊號易受電磁干擾’而低頻職訊號容易失真,造成測試不 〇穩、定。 舉例來說,請參考第2圖,第2圖為第i圖之自動化測試設備 議以方波ικ號測試待測元件102之示意圖。如第2圖所示,由於 單心線WIU、WR2對外部的干擾信號無任何屏蔽作用,使得單心 線WIU、WR2在信號傳輸時容易受到外界的干擾造成傳輸的信 號不穩定,影響測試結果。 ® 【發明内容】 因此本發月之主要目的即在於提供一種可提升測試的自 測就备絲。 本毛月揭露種可提升測試品質的自動化測試系統,用來測試 包3複數飾狀-軸元件,該自娜_統包含有—自動化 測試設備;複數個轉接針,接於該自動化測試設備;-針盤,包 5 201042651 含複數個針槽,用來嵌合該待測元件之該複數個探針;一接地板 用來提供接地;以及複數個同軸電纜,每一同轴電纜耦接於該複數 個針槽之一針槽、該複數個轉接針之一轉接針及該接地板,用來於 該針槽與該轉接針間傳遞訊號。 ' 【實施方式】 ❹請參考第3A ® ’第3A ®為本發明實齡卜自動化測試系統 3〇之示意圖。自動化測試系統30用來測試一待測元件3〇2,其包含 有一自動化測試設備300、轉接針TRa、TRb、一針盤3〇4、一接地 板306及同軸電纜CRa、CRb。比較第3A圖及第1圖可知,自動 化測試系統30與自動化測試系統⑴之架構相同,運作方式亦相同, 不同之處在於自動化測試系統3〇以同軸電纜CRa、CRb取代了單 線WR1、WR2 ’並增力口 了接地板。因此,當^^寺測元件固 &於托盤後,待測元件3G2的探針PRa、PRb會嵌合於針盤3〇4的 針槽PSTa、PSTb,使得待測元件3〇2與自動化測試設備3〇〇透過 抓針PRa、PRb、針槽psTa、PSTb、同軸電纜CRa、⑽及轉接針 TRa、TRb進行訊號錢,以進行相關測試。其中,同軸電纖⑽、 CRb,了金屬導線外,另包含有一金屬屏蔽層,連接於接地板挪, 用來提供L卜界干擾信號,避免干擾到其内金屬導線所傳輸的信 號進而達到測試穩定的目的。請繼續參考帛犯圖,第圖為同 1電、覽CRa與其它元件之連接方式的示意圖。如第3B圖所示,同 、纜CRa的導線用來於轉接針撕與探針pRa間交換訊號,同 6 201042651 時’同軸電纜CRa外圍的屏蔽層連接於接地板306,用來避免外部 干擾。另外’同軸電纜CRb的連接方式亦類似於同軸電纜CRa,故 不贅述。 簡言之’自動化測試系統30係利用同轴電纜CRa、CRb優異 的抗干擾能力,避免探針PRa、PRb與轉接針TRa、TRb的測試訊 號爻到外在雜訊的干擾,進而提升測試的穩定性與準確度。需注意 ❹的是,本發明所使用之同軸電纜CRa、CRb其不限於特定種類、材 質、尺寸等。例如,第4圖為習知一同軸電纜40之剖面示意圖。同 軸電纜40用來實現同軸電繞㈣或娜,其包含有一導線彻、 -絕緣層4〇2、-屏蔽層4〇4及一保護層·。導線彻用來傳遞訊 號。絕緣層4〇2用來隔絕導線彻與屏蔽層4〇4。屏蔽層4〇4則接 地,用來屏蔽外界干擾訊號。保護層4〇6包覆屏蔽層姻,用來保 護同軸電纜40。 〇 透過__CRa、CRb,自動化職系統3G可避免高頻測試 訊號受電磁干擾’並避免低頻測試訊號失真,以提升測試穩定度。 舉例來說’請參考第5圖’第5圖為第3八圖之自動化測試設備期 以方波訊號測試待測元件3〇2之示意圖。如第5圖所示,由於同轴 魏CRa、CRb财顯的抗干_力,可魏外界的干擾,提升 傳輸信號的穩定度,確保測試結果的準確性。 在第】圖中,由於單心線刪、㈣對外部的干擾信號無任 7 201042651 ·, 何屏蔽作用’使得單讀丽、聰在信號雜時容易受到外界 的干擾,造成傳輪的信號不穩定,影響測試結果。相較之下,本發 明係以同軸電纔CRa、CRb取代單心線wiU、WR2,並增加了接 地板306 ’利用同軸電鐵CRa、CRb優異的抗干擾能力,避免測試 讯就爻到外在干擾,進而提升測試的穩定性與準確度。 細上所述,針對自動化測試系統,本發明可避免測試訊號受到 〇 外在干擾,進而提升測試的穩定性與準確度。 以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍 所做之均等變倾修飾,皆應屬本發明之涵蓋範圍。 【®式簡單說明】 ^ 第1圖為習知一自動化測試系統之示意圖。 第2圖為第1圖之一自動化測試設備以方波訊號測試一待測元件之 不意圖。 第3A圖為本發明實施例一自動化測試系統之示意圖。 第3B圖第3A圖中一同軸電纜與其它元件之連接方式的示意圖。 第4圖為習知―同轴電、纜之剖面示意圖。 第5圖為第3A圖之一自動化測試設備以方波訊號測試一待測元件 之示意圖。 8201042651 VI. Description of the Invention: [Technical Field] The present invention relates to an automated test system capable of improving test quality, and more particularly to an automation that avoids external interference of test signals and thereby improves test stability and accuracy. Test system. ◎ [Prior Art] Automatic Test Equipment (ATE) is a device that tests devices, boards, and subsystems through computer control. It can replace manual labor through computer programming and automatically complete test sequences. However, as the system-in-packet (SIP) and the system-on-chip continue to evolve, the automated test process has become more complex and has led to many test-indetermined factors. Please refer to FIG. 1 , which is a schematic diagram of a conventional automated test system 10 . In Fig. 1, the automated test system 10 tests a device under test 102 through an automated test equipment. When the device under test 102 is fixed to the tray, the probes PR1 and PR2 of the device to be tested #1〇2 are fitted to the pin slots pm and pm of the dial 1〇4, so that the device under test 102 and the automated test equipment are just Through the probe pm, pR2, needle groove psTi, PST2, single core line Jane, 丽 and adapter needle plus, TR2 signal ^ to 201042651 for related tests. In the 'probability of the position of the probe PR b, the position of the probe TIU, TR2 is not necessarily the position of the transfer pin TIU, TR2. Therefore, the pin groove PST1, PST2 used to fit the probe PIU, PR2 need to pass through the single pin. Heartline WR connection. Single-core WR WR2 is a transmission line formed by a single metal wire. The periphery of the WR2 is generally coated with a layer of insulation and protective coating. (4), WR2 is widely used on short-distance transmission wheels. The force and anti-f magnetic interference ability is very low, making the high-frequency test signal susceptible to electromagnetic interference' and the low-frequency job signal is easily distorted, resulting in the test is not stable and stable. For example, please refer to FIG. 2, and FIG. 2 is a schematic diagram of the automatic test equipment of the i-th diagram, which is tested by the square wave ικ number. As shown in Fig. 2, since the single-core wires WIU and WR2 do not have any shielding effect on the external interference signals, the single-core wires WIU and WR2 are easily subjected to external interference during signal transmission, causing the transmitted signals to be unstable, affecting the test results. . ® [Invention] Therefore, the main purpose of this month is to provide a self-testing wire that can improve the test. This month's month reveals an automated test system that can improve the quality of the test. It is used to test the package 3 complex-axis components. The self-contained system includes automated test equipment; a plurality of transfer pins are connected to the automated test equipment. ;-Pin, package 5 201042651 includes a plurality of needle slots for fitting the plurality of probes of the component to be tested; a ground plate for providing grounding; and a plurality of coaxial cables, each coaxial cable coupled One of the plurality of needle slots, one of the plurality of transfer pins, and the grounding plate for transmitting a signal between the needle slot and the transfer pin. 'Embodiment】 ❹Please refer to the 3A ® '3A ® is the schematic diagram of the automated test system of the invention. The automated test system 30 is used to test a device under test 3〇2, which includes an automated test equipment 300, transfer pins TRa, TRb, a dial 3〇4, a ground plate 306, and coaxial cables CRa, CRb. Comparing Figure 3A with Figure 1, the automated test system 30 has the same architecture and operation as the automated test system (1). The difference is that the automated test system 3 replaces the single-wire WR1, WR2 with coaxial cables CRa and CRb. And increase the strength of the grounding plate. Therefore, when the ^^ temple measuring component is solidified and mounted on the tray, the probes PRa, PRb of the device under test 3G2 are fitted to the pin grooves PSTa, PSTb of the dial 3〇4, so that the component to be tested 3〇2 and the automation The test device 3 performs signal transmission through the needles PRa, PRb, the needle slots psTa, PSTb, the coaxial cable CRa, (10), and the transfer pins TRa, TRb for correlation testing. Among them, the coaxial electric fiber (10), CRb, and the metal wire, and a metal shielding layer, connected to the grounding plate, is used to provide the L-border interference signal, to avoid interference with the signal transmitted by the metal wire therein to achieve the test. Stable purpose. Please continue to refer to the 帛 图 diagram, the figure is a schematic diagram of the connection of the same electric, CRa and other components. As shown in Fig. 3B, the wire of the same cable CRa is used to exchange signals between the transfer pin tear and the probe pRa, and the shield of the periphery of the coaxial cable CRa is connected to the ground plate 306 at the same time as 6 201042651, to avoid external interference. In addition, the connection mode of the coaxial cable CRb is similar to that of the coaxial cable CRa, and therefore will not be described. In short, the 'automated test system 30 system uses the excellent anti-interference ability of the coaxial cable CRa and CRb to avoid the interference of the test signals of the probes PRa, PRb and the transfer pins TRa and TRb to the external noise, thereby improving the test. Stability and accuracy. It is to be noted that the coaxial cables CRa, CRb used in the present invention are not limited to a specific kind, material, size, and the like. For example, FIG. 4 is a schematic cross-sectional view of a conventional coaxial cable 40. The coaxial cable 40 is used to realize a coaxial electrical winding (four) or nano, which comprises a wire, an insulating layer 4, a shielding layer 4, 4 and a protective layer. The wire is used to transmit the signal. The insulating layer 4〇2 is used to isolate the wire from the shield layer 4〇4. The shield 4〇4 is grounded to shield external interference signals. The protective layer 4〇6 is covered with a shield to protect the coaxial cable 40.透过 Through __CRa, CRb, the automated service system 3G can avoid high frequency test signals from electromagnetic interference ‘and avoid low frequency test signal distortion to improve test stability. For example, 'Please refer to Figure 5'. Figure 5 is the schematic diagram of the automatic test equipment period of Figure 38. The square wave signal is used to test the component to be tested 3〇2. As shown in Figure 5, due to the anti-dry _ force of the coaxial Wei CRa and CRb, the interference from the outside world can be improved, and the stability of the transmitted signal can be improved to ensure the accuracy of the test results. In the first picture, because the single-heart line is deleted, (4) the external interference signal is not available, the shielding effect is such that the single-reading Li and Cong are easily interfered by the outside world when the signal is mixed, resulting in the signal of the transmitting wheel. Stable, affecting test results. In contrast, the present invention replaces the single-core wires wiU and WR2 with the coaxial electric power CRa and CRb, and increases the grounding plate 306' excellent anti-interference ability by using the coaxial electric irons CRa and CRb, thereby avoiding the test signal. In the interference, thereby improving the stability and accuracy of the test. As described above, for the automated test system, the present invention can avoid the external interference of the test signal, thereby improving the stability and accuracy of the test. The above are only the preferred embodiments of the present invention, and all modifications made to the scope of the present invention should be within the scope of the present invention. [A simple description of the ®] ^ Figure 1 is a schematic diagram of a conventional automated test system. Figure 2 is a schematic diagram of one of the automated test equipment of Figure 1 testing a component to be tested with a square wave signal. FIG. 3A is a schematic diagram of an automated test system according to an embodiment of the present invention. Figure 3B is a schematic view showing the manner in which a coaxial cable is connected to other components. Figure 4 is a schematic cross-sectional view of a conventional "coaxial electric cable". Figure 5 is a schematic diagram of an automated test equipment of Figure 3A with a square wave signal to test a component under test. 8

201042651 【主要元件符號說明】 10、30 100、300 102 、 302 104 、 304 PR 卜 PR2、PRa、PRb PST卜 PST2、PSTa、PSTb WR1、WR2 TIU、TR2、TRa、TRb 306 CRa、CRb 自動化測試系統 自動化測試設備 待測元件 針盤 探針 針槽 單心線 轉接針 接地板 同軸電纜201042651 [Explanation of main component symbols] 10, 30 100, 300 102, 302 104, 304 PR Bu PR2, PRa, PRb PST BU PST2, PSTa, PSTb WR1, WR2 TIU, TR2, TRa, TRb 306 CRa, CRb automated test system Automated test equipment to be tested component needle probe needle slot single core wire transfer pin ground plate coaxial cable

Claims (1)

201042651 * 七、 申請專利範圍: 1. 一種可提升測試品質的自動化測試系統,用來測試包含複數個 探針之一待測元件,該自動化測試系統包含有: 一自動化測試設備; 複數個轉接針,耦接於該自動化測試設備; 一針盤’包含複數個針槽,用來嵌合該待測元件之該複數個探針; 一接地板’用來提供接地;以及 〇 複數個同軸電纜,每一同軸電纜耦接於該複數個針槽之一針槽、 該複數個轉接針之一轉接針及該接地板’用來於該針槽與該 轉接針間傳遞訊號。 2. 如請求項1所述之自動化測試系統,其中該複數個同軸電纜之 每一同軸電纜包含有: 一導線,耦接於該複數個針槽之一針槽與該複數個轉接針之一轉 〇 接針; 一絕緣層,包覆於該導線; 一屏蔽層,包覆於該絕緣層,並耦接於該接地板’·以及 一保護層,包覆於該屏蔽層。 八、 圖式:201042651 * VII. Patent application scope: 1. An automated test system that can improve test quality. It is used to test one component of a plurality of probes. The automated test system includes: an automated test device; multiple transfer a pin coupled to the automated test device; a dial 'comprising a plurality of pin slots for fitting the plurality of probes of the component to be tested; a ground plate 'for providing grounding; and a plurality of coaxial cables Each of the coaxial cables is coupled to one of the plurality of pin slots, the one of the plurality of transfer pins, and the ground plate for transmitting a signal between the pinch and the transfer pin. 2. The automated test system of claim 1, wherein each of the plurality of coaxial cables comprises: a wire coupled to one of the plurality of pin slots and the plurality of adapter pins An insulating layer covering the wire; a shielding layer covering the insulating layer and coupled to the grounding plate and a protective layer covering the shielding layer. Eight, schema:
TW98116380A 2009-05-18 2009-05-18 Automatic test system capable of enhancing testing quality TWI408690B (en)

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US4961050A (en) * 1989-02-10 1990-10-02 Cascade Microtech, Inc. Test fixture for microstrip assemblies
US5477159A (en) * 1992-10-30 1995-12-19 Hewlett-Packard Company Integrated circuit probe fixture with detachable high frequency probe carrier
JP2004108898A (en) * 2002-09-17 2004-04-08 Advantest Corp Performance board and test system
US7119547B2 (en) * 2004-02-10 2006-10-10 Advantest Corporation Testing apparatus
US7372287B2 (en) * 2004-03-12 2008-05-13 Advantest Corporation Semiconductor device testing apparatus and device interface board
WO2006134644A1 (en) * 2005-06-14 2006-12-21 Advantest Corporation Coaxial cable unit, device interface apparatus and electronic component testing apparatus

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