TW200944817A - Dual test base transporting apparatus for printed circuit board tester - Google Patents
Dual test base transporting apparatus for printed circuit board tester Download PDFInfo
- Publication number
- TW200944817A TW200944817A TW97114567A TW97114567A TW200944817A TW 200944817 A TW200944817 A TW 200944817A TW 97114567 A TW97114567 A TW 97114567A TW 97114567 A TW97114567 A TW 97114567A TW 200944817 A TW200944817 A TW 200944817A
- Authority
- TW
- Taiwan
- Prior art keywords
- axis
- test
- carrier
- printed circuit
- circuit board
- Prior art date
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
Description
.200944817 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種印刷電路板測試機,尤指該印刷電 路板測試機中來往於載料區與測試區中輸送印刷電路板的 輸送裝置,本發明更進一步設計為雙測試座式輸送裝置, •使其可有效縮短測試作業,提昇測試效率者。 【先前技術】 於印刷電路板製造過程,為確保產品的品質,於製造 ®完成後,通常會透過測試機檢測其線路是否有開路或短路 的it事,藉以篩選出不良品,以避免後續電子元件焊接於 該印刷電路板時不必要的損失。 為減少人工測試的失誤及提高測試效率,目前習知的 印刷電路板測試機均採用自動化測試設備。所述的印刷電 路板測試機主要係於裝設單一組測試座,所述的測試座並 連接一驅動機組,使該測試座可被驅動於機台預定的載料 區與測忒區間來往移動,另於機台預定的測試區上方設有 © 一組測試裝置,於機台鄰近載料區處設有一上載/下載裝 置,藉此,利用上載/下載裝置將待測印刷電路板上載至 °亥'則忒座上,次由驅動機組推動測試座及其上的印刷電路 板移動至測試區’再由測試裝置對測試座上的印刷電路板 、行測忒’於測試完成後,由驅動機組拉動該測試座及其 上70成測減之印刷電路板移動至載料區,由上載/下截裝 置自忒測甙座下載完成測試之印刷電路板,再上載另一待 、|J P刷電路板至該測試座,再重新進行前述的步驟,如此 5BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a printed circuit board testing machine, and more particularly to a conveying device for transporting printed circuit boards in a loading area and a test area in the printed circuit board testing machine. The invention is further designed as a double test seat conveyor, which makes it possible to effectively shorten the test operation and improve the test efficiency. [Prior Art] In the manufacturing process of printed circuit boards, in order to ensure the quality of the products, after the completion of the manufacturing, the test machine is usually used to check whether the circuit has an open circuit or a short circuit, so as to screen out defective products to avoid subsequent electronic products. Unnecessary loss of components soldered to the printed circuit board. In order to reduce manual test errors and improve test efficiency, conventional printed circuit board testers use automated test equipment. The printed circuit board testing machine is mainly for installing a single group of test sockets, and the test socket is connected to a driving unit, so that the test socket can be driven to move between the predetermined loading zone and the measuring section of the machine. Further, there is a set of test devices located above the predetermined test area of the machine, and an uploading/downloading device is arranged adjacent to the loading area of the machine table, thereby uploading the printed circuit board to be tested to the screen by using the uploading/downloading device. On the squat, the drive unit pushes the test rig and the printed circuit board on it to the test area, and then the test board tests the printed circuit board on the test pedestal. After the test is completed, the drive is driven. The unit pulls the test socket and the 70% of the printed circuit board on the test panel is moved to the loading area, and the printed circuit board of the test is completed by the uploading/lower cutting device from the measuring socket, and then another waiting, |JP brush is uploaded. Circuit board to the test socket, and then repeat the above steps, so 5
200944817 反復進行而達到自動化印刷電路板的測試作業。 惟前述印刷電路板測試作業中,該測試裝置於一印刷 電^板完全測試後,至下_印刷電路板準備測試之間的等 待工閒時間’係經歷了印刷電路板自測試區移送至載料區 :下載完成測試的印刷電路板、上載待測印刷電路板以: ::印刷電路板移至測試區等階段,該測試裝置於前述階 Μ間内係屬閒置狀態’以致對於印刷電路板測試作 s有執行效率不彰之缺點。 ' 【發明内容】 雙測之主要目的在於提供一種印刷電路板測試機之 測1機中t輸送裝置,希藉此設計,使其應用於印刷電路 測试機中改善先前既有印刷電路測試機測 為達成前揭目的,本發明所設計之印刷電 之雙測試座式輸送裝置係包括: 二基架,係沿X軸方向間隔平行排列; 第一X軸向輸送機組,其係包括至少一 向輸送組件設於所述的基架上; 路板測試機 組第一 X軸 第一 X轴向輸送機組, 向輸送組件設於所述的基架上 其係包括至少一 組第二X轴 —第一載具, 軸向輪送機組,用 其係架設於該二基架上並連接該200944817 Repeated testing to automate printed circuit boards. However, in the above test of the printed circuit board, the test device is subjected to the test of the printed circuit board after the complete test of the printed circuit board, and the waiting for the idle time between the printed circuit board and the test board is transferred from the test area to the load. Material area: download the printed circuit board that has completed the test, upload the printed circuit board to be tested to: :: the printed circuit board is moved to the test area, etc., and the test device is in an idle state in the preceding stage, so that the printed circuit board is Test s has the shortcomings of poor execution efficiency. The content of the dual test is to provide a t-transfer device for the test machine of the printed circuit board tester. It is designed to be used in the test circuit to improve the previous test circuit of the existing printed circuit. The pre-existing purpose of the present invention is to design a printed electric double test stand conveyor comprising: two base frames arranged in parallel along the X-axis direction; a first X-axis transport unit comprising at least one direction The conveying assembly is disposed on the base frame; the first X-axis first X-axis conveying unit of the road board testing unit, and the conveying assembly is disposed on the base frame, and the system comprises at least one set of second X-axis- a carrier, an axial wheeling unit, is erected on the two base frames and connected thereto
基架作X軸方向 -X 位移 —第二載具,The base frame is in the X-axis direction - X displacement - the second carrier,
其係架設於該二基架上並連接該第二X 6 200944817 轴向輸送機組’用以被驅動沿著該二基架相對於第一載具 下方處作X軸方向位移; =第一Y轴向輸送組件,其係裝設於該第—載且上; 一第二Y軸向輸送組件,其係裝設於該第二載具上; 一第一測試座’係裝設於第_載具上,並連接第一γ 轴向輸送組件,用以被驅動沿γ轴方向位移;以及 Ο 一第二測試座’係裝設於第二載具上,並連接第二Υ 軸向輸送組件’用以被驅動沿γ軸方向位移。 .本發明藉由前揭雙測試座式輸送裝置設計,其特點在 1 又則忒座式輸送裝置應用於印刷電路板測試機後, 當進行印刷電路板測試作業時,其係由第-測試座承載著 寺則ρ刷電路板移送至測試區,由測試裝置對該待測印刷 電路板進行測試步驟,並於測試的同日夺,第二測試座係移 至載料區’提供待測印刷電路板上載至該第二測試座,並 於第/ 4座上之印刷電路板測試完成後移回載料區之時 ,同時由第二測試座承載著待測印刷電路板移送至測試區 進行測試’兩者交替位置,並於測試的同日夺,該第一測試 座上已完成測試的印刷電路板被下載,接續將另一待測印 刷電路板上載至該第一測試座上,如此利用雙測試座交替 位移之輸送機制,可大大地縮短該測試裝置每二次印刷電 路板測試步驟間的間置時間,進而有效地提昇該印刷電路 板自動化測試的執行效率。 【實施方式】 如第一至五圖所示,係揭示本發明印刷電路板測試機 200944817 之雙測試座式輸送裝置之—較佳實補,㈣中 ’該雙測試座式輸送褒置之組成主要係包括二基架^及 )、-第-X軸向輸送機組(2〇)…第二^軸向輪= 機組(:〇)、-第-載具(40)、—第二載具、 ) '-第-y軸向輸送組件(60)、一第二”向輪送The system is erected on the two base frames and connected to the second X 6 200944817 axial transport unit 'for being driven to be displaced in the X-axis direction along the bottom of the two base frames relative to the first carrier; An axial conveying assembly is mounted on the first carrier; and a second Y axial conveying assembly is mounted on the second carrier; a first test socket is installed in the first a carrier is coupled to the first gamma axial transport assembly for being driven to be displaced along the gamma axis direction; and a second test socket is mounted on the second carrier and coupled to the second crucible for axial transport The assembly 'is used to be displaced in the γ-axis direction. The invention adopts the pre-examination double test seat type conveying device design, and the characteristics thereof are as follows: after the squat seat type conveying device is applied to the printed circuit board testing machine, when the printed circuit board test operation is performed, the first test is performed by the first test. The seat carries the temple and the brush circuit board is transferred to the test area, and the testing device performs the test step on the printed circuit board to be tested, and the second test seat is moved to the loading area to provide the printing to be tested. The circuit board is uploaded to the second test socket, and when the printed circuit board on the fourth/seat is tested and returned to the loading area, the second test socket carries the printed circuit board to be tested and transferred to the test area. Test 'the alternate position of the two, and on the same day of the test, the printed circuit board that has been tested on the first test stand is downloaded, and then another printed circuit board to be tested is uploaded to the first test stand, so that The transfer mechanism of the double test seat alternate displacement can greatly shorten the inter-set time between the test steps of the test device every two times, thereby effectively improving the execution of the automated test of the printed circuit board effectiveness. [Embodiment] As shown in the first to fifth figures, it is disclosed that the double test seat type conveying device of the printed circuit board testing machine 200944817 of the present invention is better complemented, and (4) the composition of the double test seat type conveying device Mainly includes two base frames ^ and ), - first -X axial conveying unit (2 〇)... second ^ axial wheel = unit (: 〇), - first - carrier (40), - second vehicle , ''---- axial transport assembly (60), a second" to the wheel
㈣(7〇)、-第-測試座(8…及一第二測試座 (9 0 ),其中: I 戶斤述之二基架(i 0)係沿又軸方向間隔平行排列, 該二基架(10)頂面之相對外側邊形成沿χ軸方向延伸 之第一承載面(11),該-其 忒一基木(1 〇 )頂面之相對内 側邊形成沿X軸方向延伸之第二承載面(工2 ),各基架 (1 0 )之第-承載面(丄"與第二承載面(丄2)形 成高低差,於本較佳實施例中,該第—承載面(丄丄)高 於第二承載面(12),所述之二基架(1〇)尚可分別 於所述之第-承載面(11)裝設—第一χ轴導軌(13 ),分別於所述之第二承載面(i 2 )上裝設轴導 執(14),用以提供第-載具(4〇)及第二載具(5 〇)於X軸方向移動所依循的軌道,前述之第一X軸導軌 (13)及第二X軸導軌(14)除可為凸出第一承載面 (1 1 )、第二承載面(1 2 )之軌條設計,亦可設計成 下凹的直線滑槽予以取代。 所述第一X軸向輸送機組(2〇)包括至少一組第一 X轴向輸送組件(2 1 )’於本較佳實施例中,係包括二 組第一 X軸向輸送組件(2 1 )分設組設於該二基架(1 8 200944817 〇)相對之外側面上,所述第—χ軸向輸送組件(2 可為伺服馬達(2 2 )及連接該伺服馬達(2 2 )心轴之 螺桿(2 3 )·组合,或可為其他線性驅動機構予以取代。 所述第二X軸向輪送機組(3 0)包括至少一組第二 X軸向輸送組件(3 1 ),於本較佳實施例係包括二組第 •二X軸向輸送組件(3 1 )分設組設於該二基架(i 〇 ) 相對之内側面上,所述第二χ軸向輸送組件(3工)可為 伺服馬達(3 2 )及連接該飼服馬達(3 2 )心轴之螺桿 (3 3 )組合,或可為其他線性驅動機構予以取代。 所述第一載具(40)係架設於該二基架(1〇)上 .亥第一载具(4 〇 )並可被驅動沿著該二基架(丄〇 ) 作X軸方向位移,該第一載具(4〇)侧邊設有從動構件 (41)連接所述的第_χ軸向輸送機組(2〇),於本 較佳實施例中’該第一載具(4 〇 )兩側邊各設有從動構 件(4 1 ),為相對應之第—χ軸輸送組件(2丄)之螺 ◎桿(23)貫穿螺接其中,第一載具(4〇)底面設有滑 塊(4 2 )可滑移地設置於該第一 χ軸導軌(丄3 )上, 使該第-載具(4 0 )可為伺服馬達(2 2 )經由螺捍( 23)驅動而沿基架(1〇)上的第一χ軸導執(丄3) 作X軸方向位移;另所述的第—載具(4〇)丨可成形一 對位開口(4 3),該第一載具(4〇)上尚進一步裝設 二第一Y轴導軌(4 4 )呈丫軸方向間隔平行排列。 所述第二載具(50)係架設於該二基架(i 上 ,邊第二載具並可被驅動沿著該二基架(1 〇 )及相對於 .200944817 Ο 第一載具(4 0)下方處作χ軸方向位移,該第二載具( 5 0)側邊設有從動構件(5 1 )連接該第二X軸向輸送 機組(3 0 ),於本較佳實施例中,該第二載具(5 〇 ) 兩侧邊各設有一從動構件(5 1 ),並分別為一組第二χ 軸輸送組件(3 1 )之螺桿(3 3 )貫穿螺接其中,第二 載具(5 0 )底面設有滑塊(5 2 )可滑移地設置於該第 —X軸導軌(1 4)上,使該第二載具(5 〇)可為伺服 馬達(3 2 )經由螺桿(3 3 )驅動而沿基架(丄〇 )上 的第二X軸導#( 1 4)作X轴方向位移,另該第二载具 (50)上尚進一步裝設二第二¥軸導執(54)呈丫軸 方向間隔平行排列。 所述之第一γ軸向輪送組件(6 0)係裝設於該第一 載具(4 0 ) Y轴方向之侧邊處,所述之第一γ轴向輸送 件(6 0 )可為伺服馬達(6 1 )及連接該伺服馬達( 6 1 )心軸之螺桿(9、 人 Z )組a,或可為其他線性驅動機 構予以取代,前述之越f 嘴柃(6 2 )係沿Y軸方向延伸,且 平行於第一Υ軸導執(4 4 )。 〇輸送組件(,^ y Ί尔衣铁於琢第二 栽具(5 G ) Y軸方向之側邊處,所述之第二γ軸向輸^ 組件(7 0 )可為飼服@ 巧服馬達(7 1 )及連接該伺服馬達( 1 轴之螺梓(7 2 )組合’或可為其他線性驅動機 構予以取代’前述之螺#(72)係沿γ轴方向延伸,: 平行於第二Y軸導軌(54)。 所述之第-測試座(8〇)係可被驅動作7軸方向移 200944817 動地裝設於第—巷星r」 取具(40)上’並連接該第一γ軸向輸 送組件(6 〇 ),於士“ 聆本較佳實施例中,該第一測試座 0)係設於該第—恭 戰具(4 0 )底面,第一測試座(8 〇 )於其γ軸向之二伽、嘉“ υ J邊各设有滑塊分別設於第一 γ軸導軌 (4 4 )上,且於γ軸向的一侧邊設有一從動 )連接該第一 γ站南#、¥ . 1 0 ^ D輪送組件(6 0 ),於本較佳實施例 ❹ ❹ 中,該從動構件(82)係為該第一γ轴輸送組件(6〇 )之螺柃(6 2 ) I穿螺接其中,使該第-測試座(8 〇 )可為第-γ軸輸送組件(6 〇 )之伺服馬達(6 i )經 由螺桿(6 2 )驅動而沿第一載具(4 〇 ) 導軌(44)作丫轴方向位移。 Y轴 所遂之第二測試座(9 〇 )係可被驅動作Y軸方向移 :地裝設於第二減(50)上,並連接該第二¥轴= 送組件(70) ’於本較佳實施例中,該第二測試座(9 〇)係設:該第二載具(5〇)頂面,與第-測試座(8 〇 )呈等回之狀嘘’第二測試座(9 〇 )於其Y軸向之二 側邊各設有滑塊分別設於第軸導# ( : Υ軸向的-側邊設有-從動構件(9 2) $接該第站 向輸送組件(70) ’於本較佳實施例中,該從動 9 2)係為該第二γ軸輸送組件(7〇)之螺帛 貫穿螺接其中’使該第二測試座(9 〇 )彳為第二 送組件(7 0 )之飼服馬達(7工)經由螺桿( 動而沿第二載I ( 5 〇 )上的第二γ軸導軌(5(4) (7〇), - the first test seat (8... and a second test seat (9 0), wherein: I the two base frames (i 0) are arranged in parallel along the axial direction, the two The opposite outer side of the top surface of the base frame (10) forms a first bearing surface (11) extending in the direction of the yaw axis, and the opposite inner side of the top surface of the base (1 〇) is formed along the X-axis direction Extending the second bearing surface (Work 2), the first bearing surface of each base frame (10) forms a height difference with the second bearing surface (丄2). In the preferred embodiment, the first - the bearing surface (丄丄) is higher than the second bearing surface (12), and the two base frames (1〇) can be respectively installed on the first bearing surface (11) - the first y-axis guide rail ( 13), respectively, a shaft guide (14) is disposed on the second bearing surface (i 2 ) for providing the first carrier (4〇) and the second carrier (5〇) in the X-axis direction The first X-axis guide rail (13) and the second X-axis guide rail (14) may be rails protruding from the first bearing surface (1 1 ) and the second bearing surface (1 2 ). The design can also be designed to be replaced by a concave linear chute. The first X The axial conveyor unit (2〇) includes at least one set of first X-axis transport assemblies (2 1 )' in the preferred embodiment, comprising two sets of first X-axis transport assemblies (2 1 ) Provided on the opposite outer side of the two pedestal (1 8 200944817 〇), the first χ axial conveying assembly (2 can be a servo motor (2 2 ) and a screw connecting the servo motor (2 2 ) spindle (2 3 )· combination, or may be replaced by other linear drive mechanisms. The second X-axis transfer unit (30) includes at least one set of second X-axis transport assemblies (3 1 ). The preferred embodiment includes two sets of the second and second X-axis conveying assemblies (31) which are respectively disposed on the opposite inner side surfaces of the two base frames (i 〇), and the second χ axial conveying assembly (3 gongs) It may be a combination of a servo motor (32) and a screw (33) connected to the spindle of the feeding motor (32), or may be replaced by other linear drive mechanisms. The first carrier (40) is erected. The first carrier (4 〇) on the two pedestal (1 〇) and can be driven to be displaced along the two pedestal (丄〇) in the X-axis direction, the first carrier (4 〇) side side The driven member (41) is provided to connect the first χ axial conveying unit (2〇), and in the preferred embodiment, the first carrier (4 〇) is provided with a driven member on both sides (4 1 ), for the corresponding first-axis transmission component (2丄), the screw ◎ rod (23) is screwed therein, and the bottom surface of the first carrier (4〇) is provided with a slider (4 2 ) for sliding The grounding device is disposed on the first axle guide rail (丄3) such that the first carrier (4 0 ) can be driven by the servo motor (2 2 ) via the screw (23) along the base frame (1〇) The first axis guide (丄3) is displaced in the X-axis direction; the other first carrier (4〇) can form a pair of position openings (43), the first carrier (4〇) Further, two first Y-axis guide rails (4 4 ) are arranged in parallel in the z-axis direction. The second carrier (50) is mounted on the two base frames (i, the second carrier can be driven along the two base frames (1 〇) and relative to the .200944817 Ο first carrier ( 4 0) The lower side is displaced in the direction of the yaw axis, and the second carrier (5 0) is provided with a driven member (5 1 ) connected to the second X-axis conveying unit (30), which is preferably implemented In the example, the second carrier (5 〇) is provided with a driven member (5 1 ) on both sides, and a screw (3 3 ) of the second set of the second shaft conveying assembly (3 1 ) is respectively through the screw Wherein, the bottom surface of the second carrier (50) is provided with a slider (52) slidably disposed on the first X-axis guide rail (14), so that the second carrier (5 〇) can be a servo The motor (3 2 ) is driven by the screw (3 3 ) to be displaced in the X-axis direction along the second X-axis guide #(1 4) on the pedestal, and the second carrier (50) is further The second and second axle guides (54) are arranged in parallel in the axial direction. The first gamma axial wheeling assembly (60) is mounted on the first carrier (40). At the side of the direction, the first gamma axial conveying member (60) may be a servo The motor (6 1 ) and the screw (9, human Z) group a connected to the spindle of the servo motor (6 1 ) may be replaced by other linear drive mechanisms, and the aforementioned f mouth (6 2 ) is along the Y Extending in the axial direction and parallel to the first axis guide (4 4 ). 〇 conveying assembly (, ^ y 衣 衣 琢 in the second plant (5 G) at the side of the Y-axis direction, said The second gamma axial transmission component (7 0 ) can be used for the feeding service @ 服服motor (7 1 ) and the servo motor (1 shaft screw (7 2 ) combination) or can be replaced by other linear drive mechanisms 'The aforementioned screw # (72) extends in the γ-axis direction: parallel to the second Y-axis guide rail (54). The first-test seat (8〇) can be driven to move in the 7-axis direction 200944817 Installed on the first lane finder r" (40) and connected to the first gamma axial transport assembly (6 〇), in the preferred embodiment, the first test seat 0 The first test seat (8 〇) is disposed on the bottom surface of the first gamma warfare (4 0 ), and the sliders are respectively disposed on the first γ-axis guide rails of the two gamma axes of the gamma axis. 4 4 ) upper, and in the γ axial direction a slave side is connected to the first gamma station south #, ¥ 1 0 ^ D wheeling assembly (60). In the preferred embodiment, the driven member (82) is The thread (6 2 ) of the first γ-axis conveying assembly (6 )) is threaded into the servo motor of the first γ-axis conveying assembly (6 〇). 6 i ) is driven by the screw (6 2 ) and displaced along the first carrier (4 〇) rail (44) in the x-axis direction. The second test seat (9 〇) of the Y-axis can be driven to move in the Y-axis direction: the ground is mounted on the second minus (50), and the second ¥ axis is connected to the sending component (70) In the preferred embodiment, the second test seat (9 〇) is configured to: the top surface of the second carrier (5 〇) is in the same state as the first test seat (8 〇) 第二 'second test The seat (9 〇) is provided with a slider on each of the two sides of the Y-axis, respectively, on the first axis guide # ( : Υ axial - side side - driven member (9 2) $ connected to the first station To the transport assembly (70) 'in the preferred embodiment, the follower 92 is the thread of the second gamma-axis transport assembly (7〇) through which the second test seat is made 〇) 饲 is the second delivery component (70) of the feeding motor (7 workers) via the screw (moving along the second y-axis guide on the second carrier I (5 〇) (5
軸方向位移。 T Y 11 200944817 有關本發明雙測試座式輸送裝置應用於印刷電路板測 試機,當進行印刷電路板測試作業時,如第六至十圖所示 ’其係由第-測試座(8Q)承載著待測印刷電路板,並 透過第-載具(40) I驅動沿χ軸方向移送至測試區( A ),由測試裝置對該待測印刷電路板進行測試步驟,於 測試的同時,第二測試座(9 0 )係於載料區(B ),提 供待測印刷電路板上載至該第二測試座(9〇),待第一Displacement in the axial direction. TY 11 200944817 The double test stand conveyor of the present invention is applied to a printed circuit board tester, and when performing a test of a printed circuit board, as shown in the sixth to tenth drawings, it is carried by the first test stand (8Q). The printed circuit board to be tested is transported along the x-axis direction to the test area (A) through the first carrier (40) I, and the test device performs the test step on the printed circuit board to be tested, and at the same time as the test, the second The test socket (90) is attached to the loading area (B), and the printed circuit board to be tested is uploaded to the second test seat (9〇), waiting for the first
測試座(8 0 )上之印刷電路板測試完錢,第一測試座 (8 0 )、第二測試座(9 〇 )分別於¥軸之相反方向移 動,之後’承載著已測試印刷電路板之第一測試座(8 〇 )透過第—載具(4Q)被驅動沿X軸方向移回載料區( B )之時,同時承载著待測印刷電路板之第二測試座(9 0 )透過第二載具(5 〇 )淨皮驅動沿χ軸方向移送至測試 區(A )進行測試’兩者交替位置,並於測試的同時,該 第-測試座(8 0 )上已完成測試的印刷電路板被下載, 接續將另一待測印刷電路板上載至該第一測試座(8 〇 ) 上,如此利用雙測試座交替位移之輸送機帝】,使測試裝置 於兩次印刷電路板測試間的空閒,僅為第一、第二載具( 4 0 ) ( 5 0 )於載料區(B )與測試區(a )間單程移 動的時間’如此,本發明可大大地縮短該測試裝置每二次 印刷電路板測試步驟間的閒置時間,㈣有效地提昇該印 刷電路板自動化測試的執行效率。 據上所述,本發明藉由該雙測試座式輸送裝置設計, 使其應用於印刷電路板測試機中,確可有效提昇其自動化 12 200944817 明 式的執行效率,實為一項極具產業利用價值之創新發 【圖式簡單說明】 第圖係本發明印刷電路板測試機之雙測試座式輸送 裝置之一較佳實施例之立體外觀示意圖。 第二圖係第一圖所示印刷電路板測試機之雙測試座式 輸送裝置較佳實施例之立體分解示意圖。 〇The printed circuit board on the test socket (800) is tested, and the first test socket (80) and the second test socket (9 〇) move in opposite directions of the ¥ axis, respectively, and then carry the tested printed circuit board. The first test socket (8 〇) is driven by the first carrier (4Q) to move back to the loading zone (B) along the X-axis direction, and simultaneously carries the second test socket of the printed circuit board to be tested (90) Passing the second carrier (5 〇) net drive to the test zone (A) in the direction of the x-axis for testing 'the alternate position of both, and at the same time as the test, the first test stand (800) has been completed The printed circuit board of the test is downloaded, and another printed circuit board to be tested is uploaded onto the first test socket (8 〇), so that the test device is alternately printed by the double test stand, so that the test device is printed twice. The idleness between the board test rooms is only the time for the first and second carriers (40) (50) to move one-way between the loading zone (B) and the test zone (a). Thus, the present invention can greatly Shorten the idle time between the test steps of the test device every two printed circuit boards, (4) effectively improve the Print board automation test execution efficiency. According to the above description, the invention is designed to be applied to a printed circuit board testing machine by the double test seat type conveying device, and can effectively improve the execution efficiency of the automation 12 200944817, which is a very industry. Innovative use of value [Simplified description of the drawings] The figure is a schematic perspective view of a preferred embodiment of a dual test stand conveyor of the printed circuit board tester of the present invention. The second drawing is a perspective exploded view of a preferred embodiment of the dual test stand conveyor of the printed circuit board tester shown in the first figure. 〇
_第三圖係第一圖所示印刷電路板測試機之雙測試座式 輸送裝置較佳實施例之俯視平面示意圖。 —第四圖係第三圖所示雙測試座式輸送裝置較佳實施例 副面線位置之側視剖面示意圖。 第五圖係第一圖所示印刷電路板測試機之雙測試座式 輸送裝置較佳實施例之側視平面示意圖。 第/、、七圖係第一圖所示印刷電路板測試機之雙測試 座式輪送裝置較佳實施例之俯視平面及立體狀態使用狀鲅 參考圖(一^ , —第八圖係第一圖所示印刷電路板測試機之雙測試座式 輸送裝置較佳實施例之使用狀態參考圖(二)》 第九圖係第一圖所示印刷電路板測試機之雙 輪 w壯 ^ 1迗凌置較佳實施例之使用狀態參考圖(三)。 -第十圖係第一圖所示印刷電路板測試機之雙測試座式 輪送裝置較佳實施例之使用狀態參考圖(四)。 【主要元件符號說明】 (1〇)基架 (11)第一承載面 13 200944817 (12)第二承載面 (13)第一X軸導軌 (14)第二X軸導軌 (20)第一X轴向輸送機組 (2 1 )第一 X軸向輸送組件 (2 2 )伺服馬達 (2 3 )螺桿 (3 0 )第二X軸向輸送機組The third figure is a top plan view of a preferred embodiment of the dual test stand conveyor of the printed circuit board tester shown in the first figure. - Figure 4 is a side cross-sectional view of the preferred embodiment of the dual test pedestal transport device shown in the third figure. Figure 5 is a side plan view of a preferred embodiment of a dual test stand conveyor of the printed circuit board tester shown in Figure 1. The first, seventh, and seventh figures are the top view plane and the three-dimensional state of the preferred embodiment of the dual test seat type wheel transfer device of the printed circuit board tester shown in the first figure. Figure 1 shows the state of use of the preferred embodiment of the dual test socket conveyor of the printed circuit board tester. Figure 9 shows the two wheels of the printed circuit board tester shown in the first figure. Referring to FIG. 3 in the state of use of the preferred embodiment of the preferred embodiment - FIG. 10 is a reference view of the use state of the preferred embodiment of the dual test socket type transfer device of the printed circuit board tester shown in FIG. [Main component symbol description] (1〇) base frame (11) first bearing surface 13 200944817 (12) second bearing surface (13) first X-axis guide rail (14) second X-axis guide rail (20) An X-axis conveying unit (2 1 ) a first X-axis conveying assembly (2 2 ) a servo motor (2 3 ) a screw (30) a second X-axis conveying unit
(31)第二X轴向輸 (3 2 )伺服馬達 (4 0 )第一載具 (4 2 )滑塊 (44)第一Y軸導軌 (5 0 )第二載具 (5 2 )滑塊 (60)第一Y軸向輸 (6 1 )伺服馬達 (70)第二Y軸向輸 (7 1 )伺服馬達 (8 0 )第一測試座 (9 0 )第二測試座 (9 2 )從動構件 (A )測試區 送組件 (3 3 )螺桿 (4 1 )從動構件 (4 3 )對位開口 (5 1 )從動構件 (54)第二Y軸導軌 送組件 (6 2 )螺桿 送組件 (7 2 )螺桿 (8 2 )從動構件 (9 1 )滑塊 (B )載料區 14(31) Second X-axis transmission (3 2 ) servo motor (4 0 ) First carrier (4 2 ) Slider (44) First Y-axis guide (5 0 ) Second carrier (5 2 ) slippery Block (60) first Y-axis transmission (6 1 ) servo motor (70) second Y-axis transmission (7 1 ) servo motor (80) first test socket (90) second test socket (9 2 ) Follower member (A) Test zone feed assembly (3 3 ) Screw (4 1 ) Follower member (4 3 ) Alignment opening (5 1 ) Follower member (54) Second Y-axis guide rail feed assembly (6 2 Screw feed assembly (7 2 ) screw (8 2 ) driven member (9 1 ) slider (B) load zone 14
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW97114567A TW200944817A (en) | 2008-04-22 | 2008-04-22 | Dual test base transporting apparatus for printed circuit board tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW97114567A TW200944817A (en) | 2008-04-22 | 2008-04-22 | Dual test base transporting apparatus for printed circuit board tester |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200944817A true TW200944817A (en) | 2009-11-01 |
Family
ID=44869510
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW97114567A TW200944817A (en) | 2008-04-22 | 2008-04-22 | Dual test base transporting apparatus for printed circuit board tester |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200944817A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CZ304545B6 (en) * | 2013-10-15 | 2014-06-25 | České Vysoké Učení Technické V Praze, Fakulta Elektrotechnická | Measuring system for accelerated characterization of service life of concentric printed circuits |
CN104614666A (en) * | 2015-02-05 | 2015-05-13 | 深圳创维-Rgb电子有限公司 | Automatic testing device of circuit board |
CN113608107A (en) * | 2021-08-06 | 2021-11-05 | 深圳市鸿发鑫科技有限公司 | Circuit board test equipment with double channels |
-
2008
- 2008-04-22 TW TW97114567A patent/TW200944817A/en unknown
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CZ304545B6 (en) * | 2013-10-15 | 2014-06-25 | České Vysoké Učení Technické V Praze, Fakulta Elektrotechnická | Measuring system for accelerated characterization of service life of concentric printed circuits |
CN104614666A (en) * | 2015-02-05 | 2015-05-13 | 深圳创维-Rgb电子有限公司 | Automatic testing device of circuit board |
CN104614666B (en) * | 2015-02-05 | 2017-07-07 | 深圳创维-Rgb电子有限公司 | Automatic tester for circuitboard |
CN113608107A (en) * | 2021-08-06 | 2021-11-05 | 深圳市鸿发鑫科技有限公司 | Circuit board test equipment with double channels |
CN113608107B (en) * | 2021-08-06 | 2024-05-10 | 深圳市鸿发鑫科技有限公司 | Circuit board test equipment with double channels |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4879914B2 (en) | Electronic component transfer apparatus and method | |
CN109225931B (en) | Full-automatic integrated test assembly line | |
CN104267330B (en) | Multifunctional power panel testing production line | |
JP4471011B2 (en) | Component testing apparatus and component conveying method | |
CN106249134A (en) | Electronic product test production line and method of testing thereof | |
KR101365097B1 (en) | Substrate inspection apparatus | |
TW201430356A (en) | Electronic component operation unit, operation method and operation apparatus applied thereof | |
CN101472459B (en) | Movable loading device capable of ensuring accurate contraposition of electronic element | |
CN204256094U (en) | The automatic checkout equipment of touch-screen | |
CN211014913U (en) | Liquid crystal display panel detection device | |
KR101286250B1 (en) | Array test apparatus having multiple head unit | |
TW200944817A (en) | Dual test base transporting apparatus for printed circuit board tester | |
CN110921278A (en) | Automatic detector for electronic element performance | |
CN110850270A (en) | Feeding and discharging mechanism, test equipment with mechanism and test system with mechanism | |
CN205067041U (en) | A cyclic delivery positioner for instrument vibration testing | |
DE102017116042A1 (en) | Method and placement machine for equipping component carriers with electronic components | |
CN106501707A (en) | Test machine and its method of testing | |
CN106443413A (en) | PCBA (Printed Circuit Board Assembly) test equipment | |
CN116698284B (en) | Full-automatic rotor mass reduction dynamic balance correction equipment and correction method | |
JP4450081B2 (en) | Parts testing equipment | |
CN210429871U (en) | Line production work platform of mini-LED full-automatic die bonder | |
DE102009033956B4 (en) | Method for adjusting objects for testing in test benches | |
CN108398603B (en) | Modular EMV test bench mechanism | |
US6232766B1 (en) | Test station for sequential testing | |
KR101771905B1 (en) | Alignment system for replacing printed circuit board |