200921598 ——._ 'W 24448twf.doc/p 九、發明說明： 【發明所屬之技術領域】 本發明是有關於—種顯示驅動器，且特別是有關於一 種内建測试電路之顯示驅動器及其測試方法。 【先前技術】 近年來，液晶顯示器(Liquid Crystal Display，LCD)被 普遍地接文與使用，並取代了傳統陰極射線管顯示器 (Cathode Ray Tube Display ’ CRT Display)。隨著光電與半 V體技術的蓬勃發展，使得液晶顯示器具有低耗電功率、 薄型化、無輻射、低電磁干擾、高解析度、高色彩飽和度 與使用竒命長專優點，因而廣泛地應用在行動電話、筆記 型電腦、桌上型電腦的液晶螢幕與液晶電視(LCD τν)等與 生活息息相關之電子產品。由於電子產品對於液晶顯示器 的需求愈來愈高，面板廠商紛紛建構新一代產線來因應市 %對於產置以及品質的要求。其中，顯示面板的良莠是決 定液晶顯示器品質的重要關鍵。 4、 J 於是，為了確保液晶顯示器的品質，檢測產品的組裝 品質在生產的過程中是必要的„環。傳統的液晶顯示模铁 檢測方法是使用具有時序控制器之測試治鼻來產生測試樣 本（kstpattern)，並將此測試樣本輸出至顯示面板模組， 而顯示，板則依據測試樣本來顯示晝面。因此’藉由、顯示 面板所f現的晝面即可看出其缺陷所在，進而可判辦出液 晶顯不器的生產過程中組裝品質的優劣。 200921598 ------ ’W 24448twf.doc/p200921598 ——._ 'W 24448twf.doc/p IX. Description of the Invention: [Technical Field] The present invention relates to a display driver, and more particularly to a display driver having a built-in test circuit and testing method. [Prior Art] In recent years, liquid crystal displays (LCDs) have been commonly used and replaced, and have replaced the conventional cathode ray tube display (CRT Display). With the vigorous development of optoelectronic and semi-V body technology, liquid crystal displays have the advantages of low power consumption, thinness, no radiation, low electromagnetic interference, high resolution, high color saturation and long life. It is used in mobile phones, notebook computers, LCD screens for desktop computers, and LCD TVs (LCD τν). As electronic products are increasingly demanding for liquid crystal displays, panel makers have built a new generation of production lines to meet the market's requirements for production and quality. Among them, the goodness of the display panel is an important key to determine the quality of the liquid crystal display. 4, J Therefore, in order to ensure the quality of the liquid crystal display, the assembly quality of the test product is necessary in the production process. The traditional liquid crystal display mold iron detection method uses a test with a timing controller to generate a test sample. (kstpattern), and output the test sample to the display panel module, and the display, the board displays the kneading surface according to the test sample. Therefore, by using the display surface of the display panel, the defect can be seen. Furthermore, it is possible to determine the quality of the assembly quality during the production process of the liquid crystal display device. 200921598 ------ 'W 24448twf.doc/p
圖1是說明傳統技術使用測試治具來測試顯示面板模 組之組裝品質。圖1中將各種時脈信號、控制信號等均省 略而未繪製。顯示面板模組包括χ電路板（x_b〇ard) 11〇、 顯示驅動器122、顯示面板130以及連接於與13〇之 間的軟性電路板120。X電路板110上配置有輸入焊墊 (pad) 111與時序控制器112。在正常狀況下，輸入焊墊 111被用來連接至前級電路（未繪示），使得時序控制器 112可以透過輸入焊墊U1接收前級電路（未繪示）所提 供之影像資料。於是，時序控制器U2便將所接收之影像 資料依據預定時序傳送給各個顯示驅動器122。在此顯示 驅動器122例如是以COF(chip〇nfllm)封裝，亦即顯示驅 動器122被配置在軟性電路板12〇上。顯示驅動器122透 過複數條導線而與齡面板⑽魏連接。顯轉動器122 具有多個轉單元（在此僅以第―_單元123、第二驅 動單元丨24與第三驅動單元125代表之）。每一驅動單元 依據其輸入端之資料而驅動顯示面板13〇之1中一條資料 自包括咖與數位類比轉換 程中在彳 ==:板模組之_質的過 通承疋利用抽α具140之多根測⑷盥χ 電路板110的輸入焊墊U1相互接觸。 ” 透❹Μ針Η1將脑m樣本_科序 是，時序控制器112便將所接收之測試^ ^ 於 傳送給各個顯示驅動器122。透過時序_ 112預= 序 200921598 fW 24448twf.doc/p 顯不驅動If 122之驅動單元123〜125便依據時序控制哭 Π2所輸出之之測試樣本而驅動顯示面板13〇。 由於測試治具HG可以透過_針⑷將職樣本輪 出至顯示φ減組之時序控制器Π2，故在職治具直接 與X電路板11G壓合後即可進行測試。錢，贱治呈_ 的測試針頭141頗為昂貴，使得廠商在測試液晶顯示、写的 組裝品質時必須增加許多成本。因此，綠以較少的㈣ 針來完成喊品質賴，不僅可讓生產成本大大地降低， 還能提升測試效率及簡化測試過程。 【發明内容】 本發明提供—種顯示驅動器，可以在測試過程中以少 數的測試針來進行職，@此能充 測試效率與降低生產成本。 拉幵 本發明另提出—種測試方法，其使时數的測試針即 =產生_樣本，而不需使用時序控制器來產生測試樣 因此此有效解決先前技術所面臨到的問題。 。本發明提出—種顯示驅動器，其可以透過複數條導線 而驅動顯=面板。此顯雜動ϋ包括.1_單元以及測試電 ^ "動單元依據其輸入端之資料而驅動顯示面板。測試 控制單元以及切換單元。測試控制單元依據 號而決定測試模式，其中_模式包含第-模式 /、弟一模式。切換單元耦接至驅動單元之輸入端，豆 於Κ控财元。是故，切換單元在第—模式時，其會將 200921598 fW 24448twf.doc/p 一第一測試資料傳送給驅動I_ 時，其會將一第二測試資料傳在第二模式 測試-顯示面板。首先，依出—種測試方法，用於 其中測試模式包含—第—模 j ^號*決定測試模式’ 一模式時選擇將-第=二模式。接著’在第 驅動單心紐，在第二模式^鱗資料而傳送給— 為選擇資料而傳送給驅動單將If則試資料做 式將選擇㈣轉換為-驅動作、’’動早兀在測試模 動單元於一正常模欢改蔣0儿，以驅動顯示面板。而驅 動顯示面板。 影_轉換為驅動信號以驅 本發明是採用在顯示驅動器巾内建 式，讓顯示驅動器可以產生測·路的方 制器即可達刺試目的’因此除了能簡化職過程 剛試速度之外，還能有效解決習知技術所面臨到的問題。 為讓本發明之上述特徵和優點能更明顯易懂 舉較佳實施例，並配合所附圖式，作詳細說明如 ' 【實施方式】 ° 以下的敘述將伴隨著實施例的圖示，來詳細對本 所提出之實施例進行說明4各圖示中所使用相同或/目似 的參考標號’是用來敘述相同或相似的部份。須要、主音的 疋’圖示都已經精簡過而不是精確的比例。另外，、 揭露的技術’僅以適當和清晰為目的，而例如上、下' 、 右、在上方、在下方、在以上、在以下、較低、在背=、 200921598 TW 24448twf.doc/p 在前等方向性的用詞，都僅用來表 明相關領域具有通常知識者當知 =的圖不。本發 用來限定本發明的精神。 —向性的用詞不應 如上所述，由於圖丨中測試治具 頗為昂貴，使得薇商在測試液 針頭⑷ 增加許多成本。再者，對^^；_組裝品質時必須BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a diagram showing the conventional technique of using a test fixture to test the assembly quality of a display panel module. In Fig. 1, various clock signals, control signals, and the like are omitted and not drawn. The display panel module includes a χ circuit board (x_b〇ard) 11 〇, a display driver 122, a display panel 130, and a flexible circuit board 120 connected between the 〇 and 〇. An input pad 111 and a timing controller 112 are disposed on the X circuit board 110. Under normal conditions, the input pad 111 is used to connect to a front stage circuit (not shown), so that the timing controller 112 can receive the image data provided by the front stage circuit (not shown) through the input pad U1. Thus, the timing controller U2 transmits the received image data to the respective display drivers 122 in accordance with a predetermined timing. Here, the display driver 122 is packaged, for example, in a COF (chip) package, that is, the display driver 122 is disposed on the flexible circuit board 12A. The display driver 122 is connected to the age panel (10) via a plurality of wires. The display rotator 122 has a plurality of rotation units (here only represented by the __ unit 123, the second drive unit 丨24 and the third drive unit 125). Each driving unit drives a piece of data in the display panel 13 according to the data of the input end thereof. In the conversion process including the coffee and the digital analogy, the 过==: the quality of the board module is utilized. More than 140 (4) 输入 The input pads U1 of the circuit board 110 are in contact with each other. Through the ❹Μ Η 1 , the brain m sample _ the sequence is, the timing controller 112 transmits the received test ^ ^ to each display driver 122. Through the timing _ 112 pre = 200921598 fW 24448twf.doc / p The driving units 123 to 125 driving the If 122 drive the display panel 13 according to the test sample outputted by the timing control crying 2. Since the test fixture HG can rotate the job sample through the _ pin (4) to display the timing of the φ reduction group The controller Π2, so the test fixture can be directly tested with the X board 11G. The test needle 141 of Qian, Zhizhi _ is quite expensive, so that the manufacturer must increase the assembly quality of the liquid crystal display and writing. There are many costs. Therefore, green uses less (four) needles to complete the quality of the call, which not only greatly reduces the production cost, but also improves the test efficiency and simplifies the test process. [Invention] The present invention provides a display driver that can In the test process, a small number of test pins are used for the job, which can charge the test efficiency and reduce the production cost. The present invention further proposes a test method, which makes the test pin of the hour = Generate a sample without using a timing controller to generate a test sample. This effectively solves the problems faced by the prior art. The present invention proposes a display driver that can drive a display panel through a plurality of wires. The display unit includes a .1_ unit and a test unit. The dynamic unit drives the display panel according to the data of the input terminal. The test control unit and the switching unit. The test control unit determines the test mode according to the number, wherein the _ mode includes the first - mode /, mode one. The switching unit is coupled to the input end of the driving unit, and the bean is controlled by the financial unit. Therefore, when the switching unit is in the first mode, it will be the first one of 200921598 fW 24448twf.doc/p When the test data is transmitted to the driver I_, it will pass a second test data to the second mode test-display panel. First, according to the test method, the test mode includes - the first mode j ^ number * decision Test mode 'When a mode is selected - the second = second mode. Then 'in the first drive single heart, in the second mode ^ scale data is transferred to - to select the data and send to the drive list If the test data method will select (4) to convert to - drive, ''moving early in the test mode unit in a normal mode to change the Jiang 0 children to drive the display panel. And drive the display panel. Shadow_convert to drive The signal is driven by the invention. The display driver is built-in in the display, so that the display driver can generate the measuring method of the road to achieve the purpose of the test. Therefore, in addition to simplifying the test process speed, it can effectively solve the problem. The above-mentioned features and advantages of the present invention will become more apparent from the detailed description of the embodiments of the invention. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The same or similar reference numerals are used to describe the same or similar parts. The 疋' icons of the need and the lead have been streamlined rather than precise. In addition, the disclosed technology 'is only for the sake of properness and clarity, such as up and down', right, above, below, above, below, lower, at back =, 200921598 TW 24448twf.doc/p The words used in the omnidirectional direction are only used to indicate that the relevant field has the usual knowledge of the figure. This disclosure is intended to define the spirit of the invention. The word for directionality should not be as described above. Because the test fixture in the figure is quite expensive, Weishang adds a lot of cost to the test liquid needle (4). Furthermore, it is necessary to assemble the quality of ^^;_
O _如〇產品而言，時序控制器-般被配置:；iLCD U-b—上;可是對於液晶顯示塑電 = 反 產品而言，時序控制騎不—定被配置在^電 = 些產品基於設計或需求，有可能將時序控制器配^ ^ 外的另—塊控制電路板上。針對沒有配置時序押制 模組的組裳品質。因此，以下== 需要時序難的前提下，來測試:晶; 圖2A I會示為依據本發明一實施例說明 驅動器方塊圖。…將各種時脈信= 等均省略而未緣製。顯示面板模組包括X電路板 -贿1) 208、顯示驅動器2〇〇、顯示面板2〇2以及連 接於208與202之間的軟性電路板2〇1。χ電路板2〇8上 酉己置有輸入焊墊（pad) 2()5。在正常狀況下，輪入焊塾2〇5 ^用來連接至前級電路（例如時序控制器，未緣示），使 =級電路可以透過輸入焊塾2〇5將影像資料傳送給各個 ’、、、不驅動器200。在本實施例中，顯示驅動器200例如是 200921598 __________rW 24448twf.doc/p 以COF (chip on film)封裝，亦即顯示驅動器200被配置在 軟性電路板201上。顯示驅動器2〇〇透過複數條導線而與 顯示面板202電性連接。因此，顯示面板模組操作在正常 模式時，顯示驅動器200可以將影像資料轉換為驅動信號 以驅動顯示面板202。 於圖2A中，顯示驅動器2〇〇包括測試控制單元21〇、 切換單元220以及多個驅動單元（在此以第一驅動單元 230、第二驅動單元250、第三驅動單元27〇代表之）。顯 示面板模組操作在正常模式時，驅動單元23〇、25〇與27〇 可以透過切換單元220與焊墊組205接收影像資料，並且 將影像資料轉換為驅動信號以驅動顯示面板202。每—驅 動單兀可能各自包括閂鎖器、準位移位器（level shifter) 與數位類比轉換器（digitaMo_anal〇gc〇nverter)。在此， 驅動單元230、25〇、270可以任何技術實現之。 測試控制單元210透過焊墊203與2〇4耦接至χ 板观。X電路板應上另酉己置有焊塾209。本實施例3 測顯不面板模組201之組農品質的過程中，可以利用測試 治具280之二根測試針281分別***又電路板的焊墊 209。經由測試針28卜焊墊2〇9與焊墊2〇3、2〇4，測試治 具280可以將控制信號acc〇unt與致能信二 AUTO—TEST輸出至測試控制單元2 j〇。測試控制單元2⑺ 依據控制錢ACCOUNT與缝錄AUTQ_TEST之 發’而決定測試模式。其中，測試模式包含多個模式。於 本實施例中，測試控制單元21()藉由自動地產生晝面控制 10 200921598 --------——-TW 24448twf.doc/p 信號Frame—R、Frame—G與Frame B來定義各種測試模 式。上述控制信號Frame_R、Frame G與FrameJB用以控 制切換單元220。 切換單元220耦接至驅動單元230之輸入端。受控於 測試控制單元210所輪出之晝面控制信號Frame_R、O _ 〇 〇 〇 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序 时序Or demand, it is possible to equip the timing controller with another block control board. For the quality of the group without the configuration of the timing control module. Therefore, the following == requires time series to test: crystal; FIG. 2A I will show a block diagram of the driver according to an embodiment of the invention. ...and all kinds of clocks and so on are omitted. The display panel module includes an X board - bribe 1) 208, a display driver 2, a display panel 2〇2, and a flexible circuit board 2〇1 connected between 208 and 202. On the circuit board 2〇8, the input pad (pad) 2()5 is placed. Under normal conditions, the wheel welder 2〇5 ^ is used to connect to the pre-stage circuit (such as the timing controller, not shown), so that the = level circuit can transmit the image data to each through the input pad 2〇5. , , , and no drive 200. In the present embodiment, the display driver 200 is, for example, 200921598 __________rW 24448 twf.doc/p packaged in COF (chip on film), that is, the display driver 200 is disposed on the flexible circuit board 201. The display driver 2 is electrically connected to the display panel 202 through a plurality of wires. Therefore, when the display panel module operates in the normal mode, the display driver 200 can convert the image data into a driving signal to drive the display panel 202. In FIG. 2A, the display driver 2 includes a test control unit 21, a switching unit 220, and a plurality of driving units (here represented by the first driving unit 230, the second driving unit 250, and the third driving unit 27). . When the display panel module is operating in the normal mode, the driving units 23, 25, and 27 can receive image data through the switching unit 220 and the pad group 205, and convert the image data into driving signals to drive the display panel 202. Each of the drive units may each include a latch, a level shifter, and a digital analog converter (digitaMo_anal〇gc〇nverter). Here, the drive units 230, 25A, 270 can be implemented by any technique. The test control unit 210 is coupled to the raft view through the pads 203 and 2〇4. The X board should be equipped with a solder 209. In the third embodiment, in the process of measuring the group quality of the panel module 201, the test pads 281 of the test fixture 280 can be respectively inserted into the pads 209 of the circuit board. The test fixture 280 can output the control signal acc〇unt and the enable signal II AUTO-TEST to the test control unit 2 via the test pin 28 pads 2〇9 and pads 2〇3, 2〇4. The test control unit 2 (7) determines the test mode based on the control money ACCOUNT and the record AUTQ_TEST. Among them, the test mode contains multiple modes. In the present embodiment, the test control unit 21() automatically generates the facet control 10 200921598 --------——-TW 24448twf.doc/p signals Frame_R, Frame_G and Frame B To define various test modes. The above control signals Frame_R, Frame G and FrameJB are used to control the switching unit 220. The switching unit 220 is coupled to the input end of the driving unit 230. Controlled by the face control signal Frame_R, which is rotated by the test control unit 210,
Frame_G與FrameJB，切換單元220可以在正常模式時， 將通過焊墊組205的影像資料傳輸到驅動單元230、250、 270專。受控於晝面控制信號Frame_R、Frame G與 Frame—B ’第一切換單元22〇也可以於測試模式之第一模 式中選擇讓第一測試資料傳送給驅動單元230、250、270 等；以及於第二模式中選擇讓第二測試資料傳送給驅動單 几230、25〇、270等。驅動單元230、25〇、27〇等依據其 輸入端之資料而驅動顯示面板202。 於本實施例中’測試模式除了第一模式與第二模式之 外’還可能包括有第三模式及/或第四模式。因此，切換單 兀220可以於第三模式中選擇第三測試資料做為選擇資 料’而於第四模式中選擇讓第四測試資料做為選擇資料。 於本實施例中’上述第一測試資料、第二測試資料、第三 測試資料與第四測試資料可以是切換單元22〇内部產生的 固定樣本資料。例如，第一測試資料可能是紅色畫面資料， 第二測試資料可能是綠色晝面資料，第三測試資料可能是 藍色晝面資料’而第四測試資料則可能是白色畫面資料。 切換單元220將選擇資料傳送至第一驅動單元23〇之輸入 端。此選擇資料會在230、250、270等驅動單元之間逐級 11 200921598 rw 24448twf.doc/p 傳遞。依據適當的閂鎖時序（未繪示），23〇、25〇、27〇 等驅動單元會對應地閂鎖資料。因此，驅動單元23〇、25〇、 27〇等可以於賴模式將前述選擇資料轉換為驅動信號， 以驅動顯示面板202。驅動單元23〇、25〇、27〇等亦可於 正常模式改將影像資料轉換為驅動信號以驅動顯示面板 202。前述影像資料是前級電路（未繪示）經由焊墊組2〇5 與切換單元220提供給驅動單元23〇、25〇、27〇等的。依 據上述顯不驅動态200之驅動，顯示面板202可以於第一 模式、第二模式、第三模式、第四模式分別顯示出第一顏 色晝面（例如紅色晝面）、第二顏色晝面（例如綠色畫面）、 第三顏色晝面（例如藍色晝面）、第四顏色晝面（例如白 色晝面）。 在不需時序控制器的情況下，可以將測試治具280之 探針281放在X電路板2〇8上的接觸點（焊塾2〇9)來進 行顯示面板模組的組裝品質檢測，如圖2A所示。在另— ^例中’亦可以將測試治具280之探針281放在顯示驅 、 動為、2〇0的輸入端以進行測試。® 2B緣示為依據本發明 另-實施例說明-種内建測試電路之顯示驅動器方塊圖。 圖2B中將各種時脈信號、控制信號等均省略而未緣製。 於此實施例中，是直接將測試治具28〇之探針281放在 性電路板201上的焊墊加與綱來檢測顯示面板模 組裝品質。 、幻 圖3是依據本發明說明在四種測試模式下圖2A或圄 2B中測试控制單元21()之實施範例。測試控制單元 12 200921598 TW 24448twf.doc/p 包括計數單元410以及邏輯單元42〇。計數單元41〇經由 焊墊204接收控制信號ACC〇UNT。依據控制訊號 ACCOUNT之觸發來產生_計數值。邏輯單元42〇依據計 數單兀410所輸出之計數值而選擇啟用第一模式、第二模 式弟一模式、或弟四模式。如前所述，邏輯單元420將 利用畫面控制k號Frame一R、Frame一G與Frame B來定義 正系模式與各種測試模式。藉由輸出晝面控制信號The frame_G and the FrameJB, the switching unit 220 can transmit the image data passing through the pad set 205 to the driving units 230, 250, 270 in the normal mode. Controlled by the facet control signals Frame_R, Frame G and Frame_B', the first switching unit 22 can also select to transfer the first test data to the drive units 230, 250, 270, etc. in the first mode of the test mode; In the second mode, the second test data is selected to be transmitted to the driver list 230, 25, 270, and the like. The drive unit 230, 25A, 27A, etc. drives the display panel 202 in accordance with the data of its input. In the present embodiment, the 'test mode' may include a third mode and/or a fourth mode in addition to the first mode and the second mode. Therefore, the switching unit 220 can select the third test data as the selection data in the third mode and select the fourth test data as the selection data in the fourth mode. In the embodiment, the first test data, the second test data, the third test data, and the fourth test data may be fixed sample data generated internally by the switching unit 22 . For example, the first test data may be red picture data, the second test data may be green face data, the third test data may be blue face data, and the fourth test data may be white picture data. The switching unit 220 transmits the selection data to the input terminal of the first driving unit 23A. This selection data will be passed between the drive units of 230, 250, 270, etc. 11 200921598 rw 24448twf.doc/p. Depending on the appropriate latch timing (not shown), drive units such as 23〇, 25〇, 27〇 will latch the data accordingly. Therefore, the driving unit 23〇, 25〇, 27〇, etc. can convert the aforementioned selection data into a driving signal in the Lai mode to drive the display panel 202. The drive unit 23〇, 25〇, 27〇, etc. can also convert the image data into a drive signal in the normal mode to drive the display panel 202. The image data is supplied from the pad group 2〇5 and the switching unit 220 to the driving units 23〇, 25〇, 27〇, etc. via the pad group 2〇5. According to the driving of the display driving state 200, the display panel 202 can display the first color surface (for example, the red surface) and the second color surface in the first mode, the second mode, the third mode, and the fourth mode, respectively. (for example, a green screen), a third color face (for example, a blue face), and a fourth color face (for example, a white face). In the case where the timing controller is not required, the probe 281 of the test fixture 280 can be placed on the contact point (welding pad 2〇9) on the X circuit board 2〇8 to perform assembly quality inspection of the display panel module. As shown in Figure 2A. In another example, the probe 281 of the test fixture 280 can also be placed at the input of the display drive, motion, and 2〇0 for testing. ® 2B is shown as a block diagram of a display driver of a built-in test circuit in accordance with another embodiment of the present invention. In FIG. 2B, various clock signals, control signals, and the like are omitted and are not produced. In this embodiment, the test pads of the test fixture 28 are directly placed on the flexible circuit board 201 to test the display panel assembly quality. Fig. 3 is an illustration of an embodiment of the test control unit 21() in Fig. 2A or B2B in four test modes in accordance with the present invention. The test control unit 12 200921598 TW 24448twf.doc/p includes a counting unit 410 and a logic unit 42A. The counting unit 41 receives the control signal ACC UNT UNT via the pad 204. The _count value is generated according to the trigger of the control signal ACCOUNT. The logic unit 42 selects to enable the first mode, the second mode, or the fourth mode according to the count value output by the counting unit 410. As previously mentioned, logic unit 420 will use the picture control k-frames Frame-R, Frame-G, and Frame B to define the normal mode and various test modes. Output kneading control signal
Frame—R、Frame—G與FrameJB，邏輯單元420可以控制 切換單元220。 ^ 請參照圖3，計數單元410包括第一正反器411以及 第二正反！ 412。第-正反器411之觸發端接收控制訊號 ACCOUNT。苐一正反器411之輸入端D與反相輸出端qb 相互耦接二第二正反器412輸入端D與反相輪出端qb相 互耦接。第二正反器412之觸發端耦接至第一正反器411 之反相輸出端。於本實施例中，第一正反器411之輸出端 Q與反相輸出端QB (分別輸出計數值位元與， 以及第二正反器412之輸出端Q與反相輪出端QB (分別 輸出計數值位元D1與D1B)，四者所輸出之值即為計數 單元410所輸出之計數值。於是，依據控制訊號Acc〇unt 之觸發，便可取得如下表所示的計數值。 D1 D0 0 0 0 1 13 200921598 TW 24448twf.doc/p 1 0 1 1 故可將計數值（D1 DO)中的第一組(〇〇)設定為第一模式， 以下則依此類推。然而’在本領域具有通常知識者應知， 計數單元410的架構並非僅限於圖3所繪示的實施方式。 請參照圖3，邏輯單元420包括第一及閘42卜第二及 〇 閘422、第三及閘423、第四及閘424、第五及閘428、第 六及閘429、第七及閘430、第一或閘425、第二或閘426 以及第三或閘427。第一及閘421第一輸入端耦接至第一 正反為411之輸出端Q (接收計數值位元do )，其第二輸 入端耦接至第二正反器412之輸出端Q (接收計數值位元 〇1 )。第二及閘422之第一輸入端耦接至第一正反器411 之反相輸出端QB (接收計數值位元D0B)，其第二輸入 端耦接至第二正反器412之反相輸出端QB (接收計數值 I 位元D1B)。第三及閘423之第一輸入端耦接至第—正反 ’ 器411之輪出端Q (接收計數值位元D0)，其第二輸入端 耦接至第二正反器412之反相輸出端QB (接收計數值位 几DIB)。第四及閘424之第一輸入端耦接至第一正反器 411之反相輸出端QB (接收計數值位元D0B)，其第二輸 入端耦接至第二正反器412之輸出端Q (接收計數值位元 D1)。 第一或閘425之第一輸入端耦接至第一及閘421之輸 出端，其第二輸入端耦接至第二及閘422之輸出端。第二 14 FW 24448twf.doc/p 200921598 或閘426之第一輸入端柄接至第一及閘421之輪出端，其 弟一輸入私麵接至弟二及閘423之輪出端。第二或門42^ 之第一輸入端耦接至第一及閘421之輪出端，f第二輸入 端耦接至第四及閘424之輸出端。 ^ 一則 於是，在計數單元410輪出一計數值後，或閘425、 426與427的輸出端分別輸出晝面控制信號FR、F〇盥fb， 來定義出各種測試模式。因此，邏輯單元42〇之特i生可以 下列的真值表說明之。 測試模式 D1 D0 FR F(i FR 第一模式 0 0 1 0 0 第二模式 0 1 0 1 0 弟二模式 1 0 0 0 1 第四模式 1 1 1 1 1 及閘428之第一輸入端耦接至或閘425之輸出端（接 收晝面控制信號F R )。及閘429之第一輸入端耦接至或閘 426之輸出端（接收畫面控制信號FG)。及閘430之第一 輸入端耦接至或閘427之輪出端（接收晝面控制信號 FB ) °及閘428-430之第二輸入端均接收致能信號 AUTO—TEST。因此，邏輯單元42〇之輸出可以下列的真 值表明之。The frame-R, Frame_G, and FrameJB, the logic unit 420 can control the switching unit 220. ^ Referring to FIG. 3, the counting unit 410 includes a first flip-flop 411 and a second positive and negative! 412. The trigger terminal of the first-reactor 411 receives the control signal ACCOUNT. The input terminal D of the first flip-flop 411 and the inverting output terminal qb are coupled to each other. The input terminal D of the second flip-flop 412 is coupled to the inverted wheel terminal qb. The trigger terminal of the second flip-flop 412 is coupled to the inverting output terminal of the first flip-flop 411. In this embodiment, the output terminal Q of the first flip-flop 411 and the inverting output terminal QB (output the count value bit and the output terminal Q of the second flip-flop 412 and the inverted wheel terminal QB, respectively). The count value bits D1 and D1B) are respectively output, and the value output by the four is the count value output by the counting unit 410. Thus, according to the trigger of the control signal Acc〇unt, the count value shown in the following table can be obtained. D1 D0 0 0 0 1 13 200921598 TW 24448twf.doc/p 1 0 1 1 Therefore, the first group (〇〇) in the count value (D1 DO) can be set to the first mode, and so on. It should be understood by those skilled in the art that the architecture of the counting unit 410 is not limited to the embodiment illustrated in Figure 3. Referring to Figure 3, the logic unit 420 includes a first gate 422 and a second gate 422, The third gate 423, the fourth gate 424, the fifth gate 428, the sixth gate 429, the seventh gate 430, the first gate 425, the second gate 426, and the third gate 427. The first input end of the gate 421 is coupled to the output terminal Q of the first front and back 411 (receiving the count value bit do), and the second input end is coupled to The output terminal Q of the second flip-flop 412 (receives the count value bit 〇1). The first input terminal of the second AND gate 422 is coupled to the inverted output terminal QB of the first flip-flop 411 (received count value bit) The second input terminal is coupled to the inverting output terminal QB of the second flip-flop 412 (receiving the count value I bit D1B). The first input terminal of the third sum gate 423 is coupled to the first The round output Q of the inverter 411 (receives the count value bit D0), and the second input end thereof is coupled to the inverted output terminal QB of the second flip-flop 412 (the receiving count value is several DIB). The first input terminal of the gate 424 is coupled to the inverting output terminal QB of the first flip-flop 411 (the receiving counter value bit D0B), and the second input terminal is coupled to the output terminal Q of the second flip-flop 412 ( The first input terminal of the first OR gate 425 is coupled to the output end of the first AND gate 421, and the second input end is coupled to the output end of the second AND gate 422. The second 14 FW 24448twf.doc/p 200921598 or the first input end of the gate 426 is connected to the wheel end of the first and the gate 421, and the other input is connected to the wheel of the second and the gate 423. The first loss of 42^ The terminal is coupled to the first and second gates 421, and the second input is coupled to the output of the fourth gate 424. ^ Then, after the counting unit 410 rotates a count value, or the gate 425, The output of the 426 and 427 outputs the kneading control signals FR, F〇盥fb, respectively, to define various test modes. Therefore, the logic unit 42 can be described in the following truth table. Test mode D1 D0 FR F (i FR first mode 0 0 1 0 0 second mode 0 1 0 1 0 second mode 1 0 0 0 1 fourth mode 1 1 1 1 1 and the first input coupling of gate 428 Connected to the output of the OR gate 425 (receiving the facet control signal FR), and the first input of the gate 429 is coupled to the output of the OR gate 426 (receive picture control signal FG). The first input of the gate 430 The second input terminal coupled to the wheel terminal (receiving face control signal FB) of the OR gate 427 and the second input terminal of the gate 428-430 receives the enable signal AUTO_TEST. Therefore, the output of the logic unit 42 can be as follows. The value indicates it.
D1 DO AUTO Frame Frame Frame —〜---- TEST R G B 15 200921598 rW 24448twf.doc/p 測 第一模式 0 0 1 1 0 0 言式 第二模式 0 1 1 0 1 0 模 第三模式 1 0 1 0 0 1 式 第四模式 1 1 1 1 1 1 正常模式 X X 0 0 0 0 受控於測試控制單元210所輸出之晝面控制信號 Frame_R、Frame_G與Frame_B，切換單元220可以在正 常模式時將通過焊墊組205的影像資料傳輸到驅動單元 230、250、270等。另外，第一切換單元220也可以受控 於晝面控制信號Frame R、Frame_G與Frame_B，而於測 試模式之第一模式、第二模式、第三模式及第四模式中分 別選擇讓切換單元220自己所產生之第一測試資料、第二 測試資料、第三測試資料、第四測試資料傳送給驅動單元 230、250、270等。驅動單元230、250、270等便依據切 換單元220所輸出之資料而驅動顯示面板202。上述第一 測試資料、第二測試資料、第三測試資料與第四測試資料 可以分別是紅色晝面資料、綠色晝面資料、藍色晝面資料 與白色晝面資料。因此依據上述顯示驅動器200之驅動， 顯示面板202可以於第一模式、第二模式、第三模式、第 四模式分別顯示出第一顏色畫面（例如紅色晝面）、第二 顏色晝面（例如綠色晝面）、第三顏色晝面（例如藍色晝 面）與第四顏色晝面（例如白色晝面）。 16 TW 24448twf.doc/p 200921598 乡示上所述，以下提供一種測試方法之實施例，用以測 試顯示面板。測試方法包括：首先，依據控制信號而決定 測試模式’其中賴模式包含第—模式與第二模式。其次， 於第-模式中選擇將第一測試資料傳送給第一驅動單元， 做為選擇資料。其後，於第二模式中選擇將第二測試資料 傳送給第-驅動單元，做為選擇資料。其中，第一驅動單 元於測試模士將選擇資料轉換為驅動信號，以驅動顯示面 Ϊ動ί:驅動單元於正常模式改將影像資料轉換為 驅動指號以驅動顯示面板。 在上述本發明實施例中，第—模 顯示第一顏色晝面盥第—声自备金二 ，、μ弟一模式刀别 步驟，接著，於第I二時進—步包括以下 二驅動單元，做為第二測試資料傳送給第D1 DO AUTO Frame Frame Frame —~---- TEST RGB 15 200921598 rW 24448twf.doc/p First mode 0 0 1 1 0 0 Second mode 0 1 1 0 1 0 Mode third mode 1 0 1 0 0 1 Formula 4 mode 1 1 1 1 1 1 Normal mode XX 0 0 0 0 Controlled by the face control signals Frame_R, Frame_G and Frame_B output by the test control unit 210, the switching unit 220 can pass in the normal mode. The image data of the pad group 205 is transmitted to the driving units 230, 250, 270, and the like. In addition, the first switching unit 220 may also be controlled by the facet control signals Frame R, Frame_G, and Frame_B, and respectively select the switching unit 220 in the first mode, the second mode, the third mode, and the fourth mode of the test mode. The first test data, the second test data, the third test data, and the fourth test data generated by itself are transmitted to the driving units 230, 250, 270, and the like. The drive unit 230, 250, 270, etc. drives the display panel 202 in accordance with the data output by the switching unit 220. The first test data, the second test data, the third test data and the fourth test data may be red kneading data, green kneading data, blue kneading data and white kneading data, respectively. Therefore, according to the driving of the display driver 200, the display panel 202 can respectively display a first color picture (eg, a red face) and a second color face in the first mode, the second mode, the third mode, and the fourth mode (eg, Green face), third color face (for example, blue face) and fourth color face (for example, white face). 16 TW 24448twf.doc/p 200921598 As described above, an embodiment of a test method for testing a display panel is provided below. The test method includes: first, determining a test mode according to the control signal, wherein the mode includes the first mode and the second mode. Secondly, in the first mode, the first test data is selected to be transmitted to the first driving unit as the selected data. Thereafter, in the second mode, the second test data is selected to be transmitted to the first drive unit as the selection data. The first driving unit converts the selected data into a driving signal to drive the display surface. The driving unit converts the image data into a driving index to drive the display panel in the normal mode. In the above embodiment of the present invention, the first mode displays the first color, the first sound, the second mode, and the second mode, and then the following two driving units. , as the second test data is transmitted to the first
O 擇讓第四測試資料傳動时後’於弟一模式中選 料。在此方法中，Α中签;:監動早兀，做為第二選擇資 擇資料轉換為第二驅二:二驅動單元於測試模式將第二選 單元於該正常模切示面板。第二驅動 號以驅動該顯示面板。、—影像資料轉換為第二驅動信 步包括以下步驟^:更包ί第三模式，且測試方法進一 料傳送給第三驅動單元，模式中選擇讓第五測試資 -模式與第二模式中選=二選擇貧料。接著，於第 單元，做為第三選擇資料°。t賴資料傳送給第三驅動 二測試資料傳送給 ，後’於第三模式中選擇讓第 ㊈勖早元，而做為選擇資料。1後， 200921598 rw 24448twf.doc/p 並於第三模式中選擇讓第四傳 元，做為第二選擇資料。要補充明是、二第二驅動單 = 弟二選擇資料轉換為第三驅—1 社動该顯示面板。第三驅動單元於正常模 ^’以 板於該第：槿式可滿^ 不面在此，該顯示面 弟一杈式ΊΓ視為顯示第三顏色畫面。 o 在上述實施例中，其中測試模式進—步可包 式，且測試方法更包括：首先帛模 核 測試資料偯料笛一“於第果式中選擇讓第-钭傳运、·Ό弟一驅動單元，做為選擇資料；接基^ ^四模式中選擇讓第三測 —； 一 ^擇貝枓，/'一人，於第四模式中選擇讓該黛石、目卜+、 貧料傳送給第三.鶴單元，料第擇'"，械 示面板於該第四模式顯示第：畫，抖’在此該顯 综上所述’在本發明採用在齡軸器巾内建 動試電路控制多個切換單元，使得顯^ 可產生賴樣本，故無驗料柄難即可達到 ’、n的’因此除了㈣化職過程與提相試速度之 還月b有效解決先前技術所面臨到的問題。 —雖然本發明已以較佳實施例揭露如上，然其並非用以 限定本發明，任何所屬技術領域中具有通常知識者，在不 脫離本發明之精神和範圍内，當可作些許之更動與潤飾， 因此本發明之保護範圍當視後附之申請專利範圍所界定 為準。 【圖式簡單說明】 18 ；W 24448twf.doc/p 200921598 圖1是說明傳統技術使用測試治具來測試顯示面板模 組之組裝品質。 圖2A繪示為依據本發明實施例說明一種内建測試電 路之顯示驅動器方塊圖。 圖2B繪示為依據本發明另一實施例說明一種内建測 試電路之顯示驅動器方塊圖。 圖3是依據本發明說明在四種測試模式下圖2中測試 控制單元之實施範例。 【主要元件符號說明】 110、 208 : X 電路板（X-board) 111、 203〜205、209 :焊墊 120、201 :軟性電路板 122、200 :顯示驅動器 123〜125、230、250、270 :驅動單元 130、202 :顯示面板 140、 280 :測試治具 141、 281 :測試針 210 :測試控制單元 220 :切換單元 410 :計數單元 420 :邏輯單元 411、412 :正反器 421 〜424、428〜430 :及閘 425〜427 :或閘 19O After selecting the fourth test data transmission, select the material in the mode. In this method, the Α Α ;;: monitoring early, as the second selection of the data is converted to the second drive two: the second drive unit in the test mode will be the second selection unit in the normal die cutting panel. The second drive number drives the display panel. - converting the image data into the second driving step comprises the following steps: further, the third mode is selected, and the test method is sent to the third driving unit, and the mode selects the fifth test mode and the second mode. = two choose poor materials. Next, in the first unit, as the third selection data °. The data is transmitted to the third driver. The test data is transmitted to the user, and then the third mode is selected to make the ninth 勖 early element as the selection data. After 1st, 200921598 rw 24448twf.doc/p and select the fourth cell in the third mode as the second choice material. To add Ming, the second second driver list = the second brother chooses the data to be converted into the third drive - 1 social movement of the display panel. The third driving unit is in the normal mode ^', and the display is in the form of a third color picture. o In the above embodiment, the test mode can be packaged in a step-by-step manner, and the test method further includes: firstly, the model test data of the 帛 model is 一 一 “ “ “ “ “ 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择 选择A drive unit, as a selection of materials; select the base ^ ^ four mode to choose the third test -; a ^ choose Bellow, / 'one person, in the fourth mode choose to let the meteorite, eye +, poor Transferred to the third crane unit, the first choice '", the mechanical display panel in the fourth mode shows the first: painting, shaking 'herein the above-mentioned invented' in the present invention using the built-in axle towel The test circuit controls a plurality of switching units so that the display can produce a sample, so that it is difficult to achieve ', n' without the inspection handle. Therefore, in addition to (4) the process of refining the phase and the speed of the phase-up test, the prior art is effectively solved. The present invention has been described above with reference to the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention. Can make some changes and retouching, so the scope of protection of the present invention The definition of the patent application is subject to the definition of the patent application. [Simplified illustration] 18; W 24448twf.doc/p 200921598 Figure 1 is a diagram showing the conventional technology using test fixtures to test the assembly quality of the display panel module. FIG. 2B is a block diagram showing a display driver of a built-in test circuit according to another embodiment of the present invention. FIG. 3 is a block diagram showing a display driver of a built-in test circuit according to another embodiment of the present invention. Example of test control unit in Figure 2 in four test modes. [Main component symbol description] 110, 208: X circuit board (X-board) 111, 203~205, 209: pads 120, 201: flexible circuit Boards 122, 200: display drivers 123 to 125, 230, 250, 270: drive units 130, 202: display panels 140, 280: test fixtures 141, 281: test pins 210: test control unit 220: switching unit 410: counting Unit 420: logic units 411, 412: flip-flops 421 to 424, 428 to 430: and gates 425 to 427: or gate 19