TW200834100A - Survey circuit and survey instrument - Google Patents

Survey circuit and survey instrument

Info

Publication number
TW200834100A
TW200834100A TW96143248A TW96143248A TW200834100A TW 200834100 A TW200834100 A TW 200834100A TW 96143248 A TW96143248 A TW 96143248A TW 96143248 A TW96143248 A TW 96143248A TW 200834100 A TW200834100 A TW 200834100A
Authority
TW
Taiwan
Prior art keywords
voltage
main amplifier
survey
dut
current
Prior art date
Application number
TW96143248A
Other languages
Chinese (zh)
Other versions
TWI347446B (en
Inventor
Kenji Obara
Takuya Hasumi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200834100A publication Critical patent/TW200834100A/en
Application granted granted Critical
Publication of TWI347446B publication Critical patent/TWI347446B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Amplifiers (AREA)

Abstract

The present invention provides a survey circuit used for inputting a DC voltage to a DUT (Device Under Testing) and surveying a DC current passing the DUT. The survey circuit contains: a main amplifier which generates the DC voltage according to an input voltage and supplies the DC voltage to the DUT; a series resistor connecting serially between an output of the main amplifier and an input of the DUT; and a clamping circuit which limits a current value of the DC current outputted from the main amplifier. The clamping circuit includes: a first limit voltage output unit which receives the DC voltage from the main amplifier and outputs a first limit voltage having a voltage difference, which corresponds to a limit value of the DC current, with the DC voltage; and a first clamping unit which limits the DC current outputted from the main amplifier according to the first limit voltage and the voltage difference at both ends of the series resistor.
TW096143248A 2006-11-16 2007-11-15 Survey circuit and survey instrument TWI347446B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006310358 2006-11-16

Publications (2)

Publication Number Publication Date
TW200834100A true TW200834100A (en) 2008-08-16
TWI347446B TWI347446B (en) 2011-08-21

Family

ID=39401573

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096143248A TWI347446B (en) 2006-11-16 2007-11-15 Survey circuit and survey instrument

Country Status (5)

Country Link
JP (1) JP5022377B2 (en)
KR (1) KR101026128B1 (en)
CN (1) CN101542304B (en)
TW (1) TWI347446B (en)
WO (1) WO2008059766A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5461379B2 (en) * 2010-12-15 2014-04-02 株式会社アドバンテスト Test equipment
CN102288899B (en) * 2011-07-18 2013-06-12 电子科技大学 Precise constant-current constant-voltage applying test circuit
CN103926499B (en) * 2013-12-27 2017-01-18 武汉天马微电子有限公司 Device and method for detecting multiple-time programming circuit automatically
JP7337723B2 (en) * 2020-02-07 2023-09-04 日置電機株式会社 Current supply circuit and resistance measuring device
US11940496B2 (en) 2020-02-24 2024-03-26 Analog Devices, Inc. Output voltage glitch reduction in ate systems

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2136473Y (en) * 1992-07-30 1993-06-16 蔡冰 Clamp-on tester
JPH1082837A (en) * 1996-09-06 1998-03-31 Advantest Corp Lsi test device
JP2002277505A (en) 2001-03-21 2002-09-25 Advantest Corp Power unit for dc characteristic measurement and semiconductor tester

Also Published As

Publication number Publication date
TWI347446B (en) 2011-08-21
KR101026128B1 (en) 2011-04-05
CN101542304B (en) 2011-11-16
JPWO2008059766A1 (en) 2010-03-04
JP5022377B2 (en) 2012-09-12
WO2008059766A1 (en) 2008-05-22
CN101542304A (en) 2009-09-23
KR20090084936A (en) 2009-08-05

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees