200819720 九、發明說明： 【#明所屬之技術領域】 本發明涉及一種發光二極體檢測裝置及方法。 【先前技術】 壽命長、高亮度的發光二極體（Light Emitting Diode， LED)被廣泛用於越來越多的領域，尤其是顯示領域，例 如，LED被用於交通警示標諸、商店、火車站、加油站等 戶外場所作爲顯示裝置。 隨著電腦技術的發展，LED作爲電腦設備的一個元 件’對電腦産品的功能性檢測產生至關重要的作用，例如， 用戶透過觀察LED的顏色，確定該電腦設備的電源是否接 通’透過在主機板的中央處理器（Central Processing Unit， CPU )旁安裝一個LED燈，利用不同的顏色顯示該CPU 是否出現故障。 主機板上LED產品的功能性檢測，一直以來都是産線 作業出現問題的重點。傳統的做法是，作業員透過人眼觀 察接通電源的LED是否爲亮，該方法受到檢測人員目視檢 測等人爲疏失的影響較爲嚴重，例如檢測人員看錯，或檢 測人員可能在檢測一定量的LED後，便開始疏忽，以至回 報結果失真。 【發明内容】 鑒於以上内容，有必要提供一種主機板發光二極體 (Light Emitting Diode，LED)檢測裝置及方法，透過光 敏電阻感應主機板待測LED的光線，以自動化的方式進行 200819720 主機板LED的檢測，降低人爲目視檢測所造成的疏失。 一種主機板發光二極體檢測裝置，用於檢測主機板上 的發光二極體（Light Emitting Diode，LEO)，其中，該裝 置包括一模板、一單晶片板及一電腦。所述模板置於所述 主機板上，該模板上設有感應與傳輸該主機板上待測LEd 的光線的光纖。所述單晶片板透過光纖與所述模板相連， 該單晶片板包括至少一光敏電阻、一類比/數位轉換器、一 電壓位準轉換晶片及一單晶片處理器。其中，所述光敏電 阻用於感應主機板待測LED的光線以獲得類比感應訊號。 所述類比/數位轉換器將所述類比感應訊號轉換為數彳立感 應值。所述電壓位準轉換晶片，用於將所述數位感應值進 行電壓位準調整和轉換。所述單晶片處理器，用於處理所 述轉換後的感應值，並透過一^固串列蜂傳送所述感應值。 所述電腦用於控制主機板待測L E D的光照度使得所述待測 LED為亮或滅，並接收所述感應值，當待測led為亮時判 斷所述感應值是否在所述光敏電阻對應的受光感應範圍 内’及當待測LED為滅時根據所述感應值判斷所述光敏電 阻的電阻值是否等於所述光敏電阻對應的暗電阻，以確定 主機板待測LED的檢測結果。 一種主機板發光二極體檢測方法，包括步驟如下：將 主機板上的所有待測LED設置為滅；所述光敏電阻分別感 應所述待測LED以得到類比感應訊號；將所述類比感應訊 號轉換為數位感應值，並對所述數位感應值進行電壓位準 調整；所述單晶片處理器處理上述調整後的感應值；所述 7 200819720 電壓位準轉換晶片對處理後的感應值進行電壓位準轉換， 並蔣轉換後的感應值傳送給一電腦；該電腦根據所述感應 值判斷所述光敏電阻的電阻值是否都等於所述光敏電阻的 暗電阻；若所有光敏電阻的電阻值都等於所述光敏電阻的 暗電阻，則設置主機板上的所有待測LED為亮；統計感應 值在受光感應範圍内的光敏電阻的個數；及判斷所述在受 光感應範圍内的光敏電阻的個數是否等於待測LED的個 數，以確定主機板待測LED的檢測結果。 相較於習知技術，所述之主機板發光二極體檢測裝置 及方法，透過光敏電阻感應主機板待測LED的光線，以確 定主機板LED的檢測結果，該檢測方法以自動化的方式進 行了主機板LED的檢測，減低或避免了人爲因素所造成疏 失的可能性，提高了檢測品質。 【實施方式】 如圖1所示，係本發明主機板發光二極體檢測裝置較 佳實施例之結構圖。該主機板發光二極體檢測裝置用於檢 測主機板1上的發光二極體（Light Emitting Diode，LED)， 包括一模板2、一單晶片板3及一台電腦5。所述模板2置於 主機板1上，該模板2上鋪著光纖4。模板2透過光纖4與主機 板1相連’且該模板2透過光纖4還與單晶片板3連接。所述 主機板1與電腦5相連。本實施例中的主機板1可以爲電腦5 内安裝的主機板。 所述主機板1包括多個元件10和至少一LED12。所述元 件1〇是指主機板1上的中央處理器（Central Processing 200819720200819720 IX. Description of the invention: [Technical field to which the invention belongs] The present invention relates to a device and method for detecting a light-emitting diode. [Prior Art] Long-life, high-brightness Light Emitting Diodes (LEDs) are widely used in more and more fields, especially in the field of display. For example, LEDs are used in traffic warning signs, stores, Outdoor places such as train stations and gas stations are used as display devices. With the development of computer technology, LED as a component of computer equipment has a vital role in the functional testing of computer products. For example, by observing the color of the LED, the user determines whether the power of the computer device is turned on. An LED is installed next to the central processing unit (CPU) of the motherboard to display whether the CPU is faulty in different colors. The functional testing of LED products on the motherboard has always been the focus of problems in production line operations. Traditionally, the operator observes through the human eye whether the LED that is connected to the power supply is bright. This method is seriously affected by human error caused by visual inspection by the tester, for example, the tester is wrong, or the tester may be detecting a certain After the amount of LEDs, it began to be negligent, and the return results were distorted. SUMMARY OF THE INVENTION In view of the above, it is necessary to provide a device and a light emitting diode (LED) detecting device and method for sensing a light of an LED to be tested on a motherboard through a photoresistor, and performing an automated method on the 200819720 motherboard. The detection of LEDs reduces the loss caused by human visual inspection. A motherboard light emitting diode detecting device for detecting a Light Emitting Diode (LEO) on a motherboard, wherein the device comprises a template, a single wafer board and a computer. The template is placed on the motherboard, and the template is provided with an optical fiber that senses and transmits light of the LEd to be tested on the motherboard. The single wafer board is coupled to the template via an optical fiber, the single wafer board including at least one photoresistor, an analog/digital converter, a voltage level conversion wafer, and a single wafer processor. The photosensitive resistor is used to sense the light of the LED to be tested on the motherboard to obtain an analog sensing signal. The analog/digital converter converts the analog sense signal into a number of sensed values. The voltage level conversion chip is configured to perform voltage level adjustment and conversion of the digital sensing value. The single-chip processor is configured to process the converted sensed value and transmit the sensed value through a fixed-serial bee. The computer is configured to control the illuminance of the LED to be tested on the motherboard such that the LED to be tested is turned on or off, and receives the sensing value, and when the LED to be tested is bright, it is determined whether the sensing value corresponds to the photosensitive resistor. And determining whether the resistance value of the photoresistor is equal to the dark resistance corresponding to the photoresistor according to the sensing value when the LED to be tested is off, and determining the detection result of the LED to be tested on the motherboard. A method for detecting a light-emitting diode of a motherboard includes the following steps: setting all the LEDs to be tested on the motherboard to be off; the photosensitive resistors respectively sensing the LEDs to be tested to obtain an analog sensing signal; and analogizing the analog signals Converting to a digital sensing value and performing voltage level adjustment on the digital sensing value; the single-chip processor processes the adjusted sensing value; and the 7 200819720 voltage level conversion chip performs voltage on the processed sensing value The level conversion, and the sensed value after the conversion is transmitted to a computer; the computer determines whether the resistance value of the photoresistor is equal to the dark resistance of the photoresistor according to the sensing value; if the resistance values of all the photoresistors are Equal to the dark resistance of the photoresistor, setting all the LEDs to be tested on the motherboard to be bright; counting the number of photoresistors whose sensing values are within the range of receiving light; and determining the photoresistor within the range of receiving light. Whether the number is equal to the number of LEDs to be tested to determine the detection result of the LED to be tested on the motherboard. Compared with the prior art, the motherboard light emitting diode detecting device and method sense the light of the LED to be tested on the motherboard through the photoresistor to determine the detection result of the LED of the motherboard, and the detecting method is performed in an automated manner. The detection of the LED of the motherboard reduces or avoids the possibility of loss caused by human factors and improves the quality of detection. [Embodiment] As shown in Fig. 1, it is a structural view of a preferred embodiment of a light-emitting diode detecting device for a motherboard of the present invention. The motherboard LED detection device is configured to detect a Light Emitting Diode (LED) on the motherboard 1, and includes a template 2, a single wafer board 3, and a computer 5. The template 2 is placed on a motherboard 1 on which an optical fiber 4 is laid. The template 2 is connected to the main board 1 through the optical fiber 4, and the template 2 is also connected to the single wafer board 3 through the optical fiber 4. The motherboard 1 is connected to a computer 5. The motherboard 1 in this embodiment may be a motherboard installed in the computer 5. The motherboard 1 includes a plurality of components 10 and at least one LED 12. The component 1〇 refers to a central processing unit on the motherboard 1 (Central Processing 200819720)
Unit，CPU)、電阻、電容、日日日片、南北橋、晶振等。所述 LED12可以爲主機板；！的電源LED、cpu電壓調節元件 1^、顺1^时的任何_種或幾種_。電腦5用於控制 待測LED12的光照度，即控制1^1)12的亮或滅。 所述模板2會依據主機板_不同而設計，該模板：的 大小與主機板1的大小相當。在主機板丄需要插治具或有元 件10的地方，模板2與之相對應的位置有鏤空，例如，在主 機板1的元件10相對應的位置，模板2有元件鏤空2〇，在主 機板1的LED12相對應的位置，模板2有LED鏤空22，如此 設計，使得模板2可以完好的覆蓋在主機板χ上。 所述早晶片板3包括一電源開關30、至少一光敏電p且 31、一類比/數位（Analog to Digita卜 A/D)轉換器 32、一 電壓位準轉換晶片33、一單晶片處理器34、一串列琿35及 一LED燈36。所述模板2分別在對應於待測LED12的位置上 有一條管道，所述管道内裝有光纖4，如圖2所示，係本發 明的待測LED12與模板2之間的光纖4連接示意圖。該模板2 透過所述光纖4將主機板1的待測分別與單晶片板3 上的光敏電阻31相連，該光纖4起到傳輸待測LED12光線的 作用。其中，光纖4的個數、光敏電阻31的個數大於或等於 待測LED12的個數，即製造單晶片板3時’會選定足夠多數 量的光纖4和光敏電阻31來應付主機板1上的LED12的數 0 在電源開關3〇打開的情況下’所述光敏電阻31透過光 纖4感應待測LED12的光線，以得到類比感應訊號。光敏電 9 200819720 阻31是利用具有光電效應的半導體材料，如硫化鎘、硫化 鉛：銻化銦等製作的一種光電元件，能夠將光照度的變化 直接轉變成電訊號的感測器，該光敏電阻31的電阻值會隨 光照強度的增大而減小。不同製程技術的光敏電阻31，其 電阻特性也不同。光敏電阻31的主要參數包括亮電阻和暗 電阻。所述亮電阻是指用400至600流明（Lux)的光照射 光敏電阻31兩小時後，在標準光源（色溫2854K)下，用 lOLux光測量光敏電阻31所得到的值。所述暗電阻是指關 閉lOLux光照後，光敏電阻31第10秒的電阻值，具體而言， 待測LED12爲亮時，光敏電阻31受光並對應一亮電阻，待 測LED12爲滅時，光敏電阻31無受光且對應一暗電阻，例 如，型號爲GL3516的光敏電阻31，其亮電阻爲5-10ΚΩ， 暗電阻爲0.6ΜΩ。在電路給定電壓的情況下，電流會依照 光敏電阻31的電阻值而變化，進而經過光敏電阻31的電壓 也隨著變化，因此，光敏電阻31會對應一變化的電壓值， 如圖4所示，係光敏電阻3][之電壓變化示意圖。該變化的電 壓值範圍就是光敏電阻31在受光時對應的受光感應範圍。 本實施例以單晶片板3上的所有光敏電阻31爲同一種材質 和製程技術爲例進行說明。 所述A/ D轉換器3 2將光敏電阻31的類比感應訊號轉換 為數位感應值，即每個光敏電阻31分別對應一個感應值。 電壓位準轉換晶片33將所述數位感應值進行電壓位準調 整’然後將调整後的感應值傳送給單晶片處理器料進行處 理。由於電腦5的埠的電氣性能與單晶片處理器討的電氣性 200819720 能不同，因此，電壓位準轉換晶片33需再將單晶片處理器 34處理後的感應值進行電壓位準轉換，使得單晶片板3所傳 送的感應值與電腦5的埠相容。所述串列珲35的型號可以為 RS-232。所述單晶片處理器34可以為微處理器。 電腦5用於確定主機板1的待測LED12的檢測結果，具 體而言，當LED12為亮時，電腦5判斷每個光敏電阻31的感 應值是否在所述光敏電阻31對應的受光感應範圍内；當 LED12為滅時，電腦5根據所述光敏電阻31的感應值計算每 個光敏電阻3的電阻值及判斷所計算出的電阻值是否等於 所述暗電阻。所述LED燈36利用不同的顏色顯示主機板丄 的待測LED12的不同檢測結果，例如，當待測LED12通過 檢測時，LED燈36顯示綠色，當待測LED12檢測失敗時， LED燈36顯示紅色。 如圖3所示，係本發明電腦5之功能單元圖。所述電腦 5包括一控制單元50、一判斷單元52、一統計單元54、一結 果反饋單元56和一偵測單元58。 所述控制單元50,用於控制所述待測LED12的光照度 使得待測LED12為亮或滅，並控制所述光敏電阻31感應主 機板1的待測LED12,及控制單晶片處理器34和電壓位準轉 換晶片33處理所述光敏電阻31的感應值。 所述判斷單元52，用於主機板待測LED12設置為亮時 判斷是否所有光敏電阻31的感應值都在所述受光感應範圍 内，待測LED12設置為滅時根據所述光敏電阻31的感應值 計算每個光敏電阻3的電阻值及判斷所計算出的電阻值是 11 200819720 否等於所述暗電阻。例如，當待測LED12為滅時，光敏電 阻31對應一個暗電阻；當待測LED12為亮時，光敏電阻31 根據光照度的不同受光後的電阻值也不同，此時，光敏電 阻31對應一個電壓值範圍，若待測LED12設置為滅，則光 敏電阻31感應所述待測LED12，判斷單元52透過查看光敏 電阻31的電壓值是否變化就能確定光敏電阻31的電阻值是 否等於所述暗電阻；若待測LED12設置為亮，則光敏電阻 31受光，使得該光敏電阻31依感應值做電阻大小的變化， 而對應的電壓大小也隨著變化，因此，光敏電阻31會得到 一個電壓值範圍，判斷單元52將光敏電阻31的感應值即受 光後的電壓值與所述電壓值範圍進行比較，以確定光敏電 阻31的感應值是否在所述受光感應範圍内。 所述統計單元54,用於主機板1的待測LED12設置為亮 時統計感應值在受光感應範圍内的光敏電阻31的個數。 所述判斷單元52還用於主機板待測LED12設置為亮時 、判斷所述在受光感應範圍内的光敏電阻31的個數是否等於 待測LED12的個數，以確定待測LED12的檢測結果。所述 結果回饋單元56將該檢測結果回饋給單晶片板3,由該單晶 片板3上的LED燈36利用不同的顏色顯示不同的檢測結果。 所述偵測單元58，用於主機板1的待測LED12檢測失敗 時找出導致檢測失敗的LED12。在本實施例中，偵測單元 58可以事先為每一個待測LED12及與其相連的光敏電阻31 做好編號，以利於待測LED12檢測失敗後判斷出現故障的 LED12。本實施例還可以利用一多工器（Multiplexer)依 12 200819720 序選擇與待測LED12相連的光敏電阻31的順序。 如圖5所示，係本發明主機板發光二極體檢測方法較 佳實施例之作業流程圖。在檢測主機板1的1^〇12之前，用 戶需將所述鏤空的模板2置於主機板1上，並透過模板2上的 光纖4連接所述待測LED12和光敏電阻31。 控制皁元50將所述待測LED12設置為滅，並控制光敏 電阻31感應所述待測LED 12以得到類比感應訊號，a/d轉 換器32將所述類比感應訊號轉換為數位感應值，電壓位準 轉換晶片33對所述數位感應值進行電壓位準調整，單晶片 處理器34處理所述調整後的感應值，並將單晶片處理器34 處理後的感應值再傳送給電壓位準轉換晶片33進行電壓位 準轉換，以消除串列埠35與電腦5的電氣性能差異（步驟 si〇〇) 〇 判斷單元52接收電壓位準轉換晶片33轉換後的感應 值，並根據所述感應值判斷是否所有光敏電阻31的電阻值 、都等於所述光敏電阻31對應的暗電阻，具體而言，已知光 敏電阻31對應的暗電阻為心，當待測LED12設置為滅時， 判斷單元52透過查看光敏電阻31所對應的電壓值是否變化 就能確定該光敏電阻31的電阻值是否等於所述暗電阻心 (步驟S102)。 若所有光敏電阻31的電阻值都等於所述暗電阻，則控 制單元50透過控制待測LED12的光照度將所述待測LED12 設置為亮，控制光敏電阻31感應所述待測LED12以得到類 比感應訊號，並用步驟S100中的方法轉換並處理所述類比 13 200819720 感應訊號，從而得到與電腦5的串列埠相容的感應值（步驟 S104) 〇 判斷單元52判斷是否所有光敏電阻31的感應值都在 所述受光感應範圍内，統計單元54統計感應值在受光感應 範圍内的光敏電阻31的個數，具體而言，已知光敏電阻31 根據製程技術對應一亮電阻，且受光後的光敏電阻31對應 一電壓值範圍V2，若待測LED12設置為亮，則光敏電阻31 感應所述待測LED12，使得該光敏電阻31依感應值做電阻 大小的變化，而對應的電壓大小也隨著變化，從而，光敏 電阻31會得到一變化的電壓值形成所述電壓值範圍，判斷 單元52將光敏電阻31感應後的電壓值與所述電壓值範圍 V2進行比較，以確定光敏電阻31的感應值是否在所述受光 感應範圍内（步驟S106)。 判斷單元52判斷所述在受光感應範圍内的光敏電阻 31的個數是否等於待測LED12的個數，以確定主機板待測 LED的檢測結果，結果回饋單元56將該檢測結果回饋給單 晶片板3 (步驟S108)。 若所述在受光感應範圍内的光敏電阻31的個數等於 待測LED12的個數，則主機板待測LED12檢測通過，單晶 片板3上的LED燈36以一種顏色顯示該檢測結果，例如綠色 (步驟 S11 〇 )。 若所述在受光感應範圍内的光敏電阻31的個數小於 待測LED12的個數，則所述主機板待測LED12檢測失敗， 所述LED燈36以不同於上述綠色的顏色顯示該檢測結果， 200819720 例如紅色（步驟S112)。 Λ偵測單元58可以根據事先為光敏電阻31做好的編 號，找出導致待測LED12檢測失敗的LED12 (步驟S114)。 本發明雖以較佳實施例揭露如上，然其並非用以限定 本發明。任何熟悉此項技藝者，在不脫離本發明之精神和 範圍内，當可做更動與潤飾，因此本發明之保護範圍當視 後附之申請專利範圍所界定者為準。 【圖式簡單說明】 圖1係本發明主機板發光二極體檢測裝置較佳實施例 之結構圖。 圖2係本發明待測發光二極體與模板之間之光纖連接 示意圖。 圖3係本發明電腦之功能單元圖。 圖4係光敏電阻之電壓變化示意圖。 圖5係本發明主機板發光二極體檢測方法較佳實施例 之作業流程圖。 【主要元件符號說明】 主機板 1 模板 2 早晶片板 3 光纖 4 電腦 5 元件 10 二極體 12 15 200819720 元件鏤空 20 LED鏤空 22 電源開關 30 光敏電阻 31 類比/數位轉換器 32 電壓位準轉換晶片 33 單晶片處理器 34 串列埠 35 LED燈 36 控制單元 60 統計單元 62 判斷單元 64 結果反饋單元 66 偵測單元 68 16Unit, CPU), resistors, capacitors, daily and Japanese films, north and south bridges, crystal oscillators, etc. The LED 12 can be a motherboard; The power LED, cpu voltage adjustment component 1^, any _ or _ of _1. The computer 5 is used to control the illumination of the LED 12 to be tested, that is, to control the on or off of 1^1)12. The template 2 is designed according to the motherboard s: the size of the template is equivalent to the size of the motherboard 1. Where the motherboard needs to be inserted into the fixture or has the component 10, the corresponding position of the template 2 is hollowed out, for example, at the position corresponding to the component 10 of the motherboard 1, the template 2 has components hollowed out, at the host The LED 12 of the board 1 corresponds to the position, and the template 2 has an LED cutout 22, so that the template 2 can be perfectly covered on the motherboard. The early wafer board 3 includes a power switch 30, at least one photosensitive power p and 31, an analog to digital (A/D) converter 32, a voltage level conversion chip 33, and a single chip processor. 34. A series of columns 35 and an LED lamp 36. The template 2 has a pipe at a position corresponding to the LED 12 to be tested, and the pipe is provided with an optical fiber 4, as shown in FIG. 2, which is a connection diagram of the optical fiber 4 between the LED 12 to be tested and the template 2 of the present invention. . The template 2 connects the to-be-measured portions of the motherboard 1 to the photoresistor 31 on the single-chip board 3 through the optical fiber 4, and the optical fiber 4 functions to transmit the light of the LED 12 to be tested. Wherein, the number of the optical fibers 4 and the number of the photoresistors 31 are greater than or equal to the number of the LEDs 12 to be tested, that is, when the single-chip board 3 is manufactured, a sufficient number of optical fibers 4 and photoresistors 31 are selected to cope with the motherboard 1 The number of LEDs 12 is 0. When the power switch 3 is turned on, the photoresistor 31 senses the light of the LED 12 to be tested through the optical fiber 4 to obtain an analog sensing signal. Photosensitive power 9 200819720 Resistor 31 is a photoelectric element made of a semiconductor material having a photoelectric effect, such as cadmium sulfide, lead sulfide: indium antimonide, etc., which can directly convert a change in illuminance into a sensor of an electric signal, the photoresistor The resistance value of 31 decreases as the light intensity increases. The photoresistor 31 of different process technologies also has different resistance characteristics. The main parameters of the photoresistor 31 include a bright resistor and a dark resistor. The bright resistance refers to a value obtained by measuring the photoresistor 31 with a lOLux light under a standard light source (color temperature 2854 K) after irradiating the photoresistor 31 with light of 400 to 600 lumens for two hours. The dark resistance refers to the resistance value of the photoresistor 31 after the lOLux illumination is turned off. Specifically, when the LED 12 to be tested is bright, the photoresistor 31 receives light and corresponds to a bright resistance, and when the LED 12 to be tested is off, the photosensitive The resistor 31 has no light and corresponds to a dark resistor. For example, the photoresistor 31 of the type GL3516 has a bright resistance of 5-10 Ω and a dark resistance of 0.6 ΜΩ. In the case where the circuit is given a voltage, the current changes according to the resistance value of the photoresistor 31, and the voltage passing through the photoresistor 31 also changes. Therefore, the photoresistor 31 corresponds to a varying voltage value, as shown in FIG. Shown is a schematic diagram of the voltage change of the photoresistor 3]. The range of the voltage value of the change is the corresponding light-sensing range of the photoresistor 31 when it is received. In this embodiment, all the photoresistors 31 on the single wafer board 3 are made of the same material and process technology as an example. The A/D converter 32 converts the analog signal of the photoresistor 31 into a digital sense value, that is, each of the photoresistors 31 corresponds to an induced value. The voltage level conversion chip 33 performs voltage level adjustment on the digital sensed value and then transfers the adjusted sensed value to the single wafer processor for processing. Since the electrical performance of the computer 5 can be different from the electrical property of the single-chip processor 200819720, the voltage level conversion chip 33 needs to perform the voltage level conversion of the processed value processed by the single-chip processor 34, so that the single The sensing value transmitted by the wafer board 3 is compatible with the enthalpy of the computer 5. The serial port 35 may be of the RS-232 type. The single wafer processor 34 can be a microprocessor. The computer 5 is used to determine the detection result of the LED 12 to be tested of the motherboard 1 . Specifically, when the LED 12 is bright, the computer 5 determines whether the sensing value of each photoresistor 31 is within the light receiving range corresponding to the photoresistor 31 . When the LED 12 is off, the computer 5 calculates the resistance value of each of the photoresistors 3 according to the sensing value of the photoresistor 31 and determines whether the calculated resistance value is equal to the dark resistance. The LED lamp 36 displays different detection results of the LED 12 to be tested of the motherboard panel by using different colors. For example, when the LED 12 to be tested passes the detection, the LED lamp 36 displays green. When the LED 12 to be tested fails to be detected, the LED lamp 36 displays red. As shown in FIG. 3, it is a functional unit diagram of the computer 5 of the present invention. The computer 5 includes a control unit 50, a determination unit 52, a statistics unit 54, a result feedback unit 56, and a detection unit 58. The control unit 50 is configured to control the illuminance of the LED 12 to be tested such that the LED 12 to be tested is turned on or off, and control the photoresistor 31 to sense the LED 12 to be tested of the motherboard 1 and control the single-chip processor 34 and the voltage. The level shifting wafer 33 processes the induced value of the photoresistor 31. The determining unit 52 is configured to determine whether the sensing values of all the photoresistors 31 are within the light receiving sensing range when the LED 12 to be tested is set to be bright, and the sensing according to the photoresistor 31 when the LED 12 to be tested is set to be off. The value is calculated as the resistance value of each of the photoresistors 3 and it is judged that the calculated resistance value is 11 200819720 or not equal to the dark resistance. For example, when the LED 12 to be tested is off, the photoresistor 31 corresponds to a dark resistance; when the LED 12 to be tested is bright, the photoresistor 31 receives different resistance values according to the illuminance, and the photoresistor 31 corresponds to a voltage. The value range, if the LED 12 to be tested is set to off, the photoresistor 31 senses the LED 12 to be tested, and the determining unit 52 determines whether the resistance value of the photoresistor 31 is equal to the dark resistance by checking whether the voltage value of the photoresistor 31 changes. If the LED 12 to be tested is set to be bright, the photoresistor 31 receives light, so that the photoresistor 31 changes the resistance according to the sensed value, and the corresponding voltage varies accordingly. Therefore, the photoresistor 31 obtains a range of voltage values. The determining unit 52 compares the induced value of the photoresistor 31, that is, the received voltage value, with the voltage value range to determine whether the sensing value of the photoresistor 31 is within the light receiving sensing range. The statistic unit 54 is configured to count the number of the photoresistors 31 in the light-sensing range when the LED 12 to be tested of the motherboard 1 is set to be bright. The determining unit 52 is further configured to determine whether the number of the photoresistors 31 in the light receiving range is equal to the number of the LEDs 12 to be tested when the LED 12 to be tested is set to be bright, to determine the detection result of the LED 12 to be tested. . The result feedback unit 56 feeds the detection result back to the wafer board 3, and the LED lamps 36 on the single crystal chip 3 display different detection results using different colors. The detecting unit 58 is configured to find the LED 12 that causes the detection failure when the LED 12 of the motherboard 1 fails to detect. In this embodiment, the detecting unit 58 can number each LED 12 to be tested and the photoresistor 31 connected thereto in advance to facilitate the determination of the LED 12 that has failed after the LED 12 fails to be detected. In this embodiment, the order of the photoresistors 31 connected to the LEDs 12 to be tested can be selected by a multiplexer according to the sequence of 12 200819720. As shown in Fig. 5, it is a flowchart of a preferred embodiment of the method for detecting a light-emitting diode of the motherboard of the present invention. Before detecting the 1/12 of the motherboard 1, the user needs to place the hollow template 2 on the motherboard 1 and connect the LED 12 to be tested and the photoresistor 31 through the optical fiber 4 on the template 2. The control soap element 50 sets the LED 12 to be tested to be off, and controls the photoresistor 31 to sense the LED 12 to be tested to obtain an analog sensing signal, and the a/d converter 32 converts the analog sensing signal into a digital sensing value. The voltage level conversion chip 33 performs voltage level adjustment on the digital sensing value, and the single-chip processor 34 processes the adjusted sensing value and transmits the processed value processed by the single-chip processor 34 to the voltage level. The conversion wafer 33 performs voltage level conversion to eliminate the difference in electrical performance between the serial port 35 and the computer 5 (step si〇〇). The determination unit 52 receives the converted value of the voltage level conversion wafer 33 after conversion, and according to the sensing The value is determined whether the resistance values of all the photoresistors 31 are equal to the dark resistance corresponding to the photoresistor 31. Specifically, the dark resistance corresponding to the photoresistor 31 is known as a heart. When the LED 12 to be tested is set to be off, the determining unit 52 can determine whether the resistance value of the photoresistor 31 is equal to the dark resistance core by checking whether the voltage value corresponding to the photoresistor 31 changes (step S102). If the resistance values of all the photoresistors 31 are equal to the dark resistance, the control unit 50 sets the LED 12 to be tested to be bright by controlling the illuminance of the LED 12 to be tested, and controls the photoresistor 31 to sense the LED 12 to be tested to obtain analog sensing. The signal is converted and processed by the method in step S100 to obtain the analog signal of the serial number 13 200819720, thereby obtaining a sensing value compatible with the serial port of the computer 5 (step S104). The determining unit 52 determines whether the sensing value of all the photoresistors 31 is The statistical unit 54 counts the number of the photosensitive resistors 31 whose sensing values are within the light receiving range. Specifically, the photosensitive resistor 31 is known to correspond to a bright resistance according to the process technology, and is photosensitive after receiving light. The resistor 31 corresponds to a voltage value range V2. If the LED 12 to be tested is set to be bright, the photoresistor 31 senses the LED 12 to be tested, so that the photoresistor 31 changes the resistance according to the induced value, and the corresponding voltage also follows The change, so that the photoresistor 31 obtains a varying voltage value to form the voltage value range, and the determining unit 52 senses the photoresistor 31. Pressure value is compared with the range of voltage values V2, to determine whether the value of the photoresistor 31 of the sensing (step S106) receiving the light sensing range. The determining unit 52 determines whether the number of the photoresistors 31 in the light receiving range is equal to the number of LEDs 12 to be tested, to determine the detection result of the LED to be tested on the motherboard, and the feedback unit 56 returns the detection result to the single chip. Board 3 (step S108). If the number of the photoresistors 31 in the light-sensing range is equal to the number of LEDs 12 to be tested, the LED 12 to be tested of the motherboard is detected, and the LEDs 36 on the single-chip board 3 display the detection result in a color, for example. Green (step S11 〇). If the number of the photoresistors 31 in the light-sensing range is smaller than the number of the LEDs 12 to be tested, the LED 12 of the motherboard to be tested fails to be detected, and the LEDs 36 display the detection result in a color different from the green color. , 200819720 For example, red (step S112). The Λ detecting unit 58 can find the LED 12 that causes the LED 12 to be tested to fail to be detected based on the number previously made for the photoresistor 31 (step S114). The present invention has been described above by way of a preferred embodiment, and is not intended to limit the invention. The scope of the present invention is defined by the scope of the appended claims, unless otherwise claimed. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a structural view showing a preferred embodiment of a light-emitting diode detecting device for a motherboard of the present invention. Fig. 2 is a schematic view showing the optical fiber connection between the light-emitting diode to be tested and the template of the present invention. Figure 3 is a functional unit diagram of the computer of the present invention. Figure 4 is a schematic diagram showing the voltage change of the photoresistor. Fig. 5 is a flow chart showing the operation of a preferred embodiment of the method for detecting a light-emitting diode of the motherboard of the present invention. [Main component symbol description] Motherboard 1 template 2 early wafer board 3 fiber 4 computer 5 component 10 diode 12 15 200819720 component hollow 20 LED hollow 22 power switch 30 photoresistor 31 analog / digital converter 32 voltage level conversion chip 33 single-chip processor 34 serial 埠 35 LED light 36 control unit 60 statistical unit 62 determination unit 64 result feedback unit 66 detection unit 68 16