200815770 九、發明說明： 【發明所屬之技術領域】 Η作本種可利用測試機於測試站之第-、二測試區 效祕職站之停滯等待時間，以大幅 』 之電子元件電性檢測方法及裝置。 欢』玍座效月b 【先前技術】 在現今’電子元件於生產過程中係歷經多道加 ί 子f件製作完成後’均會進行多項電性測言t 菜以知體电路（integrated circuit，簡稱j 〇盔初夂 2係具有眾多接聊’該接腳型式有導線式接腳、球狀接腳° 各接腳，設計而使I C具林同躲，gjM c_作德， 即會進行卩舰/試、短 、 ! C於製作過程中，是否遭受損壞，進而六叫欢測 由於I c電性檢測之作業時間不一 ^ f站數量也相對改變，請參閱第1圖所示 間短而配置單一測試站之檢測裝置示意圖H因寺 1 1、收料機構1 2、測試站丄3、第枓， ，機構15及測試機丄6，其中，該供料^ =以f3 ，待測K ’收料機構1 2係用以容置複==谷= ，站1 3係設有一具複數個測試座1 3 11之測G 1ς{;艾 =座1 3 1 !分別具有數個測試接點，並^置^^ 1 ’各 可對測，匹配連結測試站1 3之測試區1 “，並 測試結果傳輸至機台之中央〆 〔 f f生測试作業，且將 制各機構配合作動，而當測二;(^不出）’由中央控制器控 業時，第-移料機構^之ϋ c 2 1於執行檢測作 取出下-制！ c 2 21 4 1财於供料機構11處 0 5 200815770 請參閱第2圖所示，當測試站i 3 i c 21電性檢測作業後第_m執行完 1 5 1將測試區1 q Ί 士 17弟一移科械構1 5即以一移料器 構1 2處依測^結果分類^^ 並移载至收料機 料機構1 5將完測I C2l敢㈣弟一移料機構1 4則於第二移 測試區1 3 i之測試座工乂 將;測1 C 2 2置入於 每當測試座i 3 !内之T rj·/中依序執仃電性測試作業，·惟， 仃完測1 c及待測I c之交換料作 /顿構1 4、1 5進 嚴重影響檢測的產能。、"4乍業，而此一父換料作業時間即 【發明内容】 置’包含有供料元件電性檢測方法及裝 其測試站係設有至少第巧、移料機構、測試站及測試機， 應各測試區，而將各測气巴測試機則係可各別匹配對 當第一測試區完成電子元件測試區内備料， 二切換’而轉換對第二測 式機立即作電200815770 IX. Invention: [Technical field of invention] This type of test can be used to test the stagnation waiting time of the first and second test zones in the test station. And equipment.欢 玍 玍 效 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 , referred to as j 〇 夂 夂 夂 夂 系 系 系 具有 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该Carry out the squid/test, short, ! C in the production process, whether it is damaged, and then the six calls for joy because the I c electrical detection of the working time is not the same, the number of stations also relatively changed, please refer to Figure 1 Schematic diagram of the detection device for a short test station with a single test station H, the temple 1 1 , the receiving mechanism 1 2, the test station 丄 3, the third 枓, the mechanism 15 and the test machine 丄 6, wherein the supply ^ = f3, K's receiving mechanism 1 2 is used to accommodate complex == valley =, station 1 3 is equipped with a plurality of test sockets 1 3 11 G 1ς{; Ai = seat 1 3 1 ! Test points, and ^^^1 ' each can be tested, match the test area 1 of the test station 1 ", and the test results are transmitted to the center of the machine 〆 [ ff raw test operation, and will be coordinated with each organization, and when measuring two; (^ not out) 'when the central controller controls the industry, the first - transfer mechanism ^ ϋ c 2 1 in the execution of the test for removal Down-system! c 2 21 4 1 Finance at the feeding mechanism 11 0 5 200815770 Please refer to Figure 2, when the test station i 3 ic 21 electrical test operation, the first _m is completed 1 5 1 test area 1 q Ί 士士17弟一移科械结构1 5 is a shifter structure 1 2 according to the test ^ results classification ^^ and transferred to the receiving machine material mechanism 1 5 will be completed I C2l dare (four) brother one The transfer mechanism 14 is placed in the test block of the second shift test zone 1 3 i; the test 1 C 2 2 is placed in the T rj·/ in the test stand i 3 ! Test operation, ·,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, That is to say, the content of the invention includes the electrical detection method of the feeding component and the test station is equipped with at least a dexterous, material-feeding mechanism, a test station and a testing machine, and each test zone should be tested. Machines can be matched individually When the first test area completes the preparation of the electronic component test area, the second switch 'turns and the switch immediately powers the second test machine
業’該移料機構則將第一測貝電子兀件執行電性檢測作 至收料機構上分類收置；子讀依測試結果移载 性切換的連結’以接續對乂『，式機可於各測試區間作電 作業，而可有效縮短測試二二2待測電子元件執行電性檢測 幅提升檢啦能之實^益。仃又、料之等待時間，進而達到大 【實施方式】 I 實—明作更進—步之_，兹舉-較佳 圖’ 於檢測1 c電性之示意 200815770 U以容置至少〜盛裝複數個制1 c之料盤； :目ϋ R η ◦:係用以容置至少—盛裝複數個完測1 C之料盤； Η私5 0 :係設有至少第〜測試區5丄及第二測試區5 2 ’、該第一、二測試區5 1、5 2各設有複數個具測 減接點之測試座5 1 1、r 9 1 ·The 'transporting mechanism' will perform the electrical detection of the first measuring electronic components to the receiving organization for classification and storage; the sub-reading will be based on the connection of the test results of the transfer of the matching. It can be used for electric operation in each test interval, and can effectively shorten the actual benefit of testing the electrical detection of the electronic components to be tested.仃 、 、 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 料 2008 2008 2008 2008 Multiple 1 c trays; :Mesh R η ◦: used to accommodate at least one of the complete 1 C trays; Η 5 50: at least the first test area 5 丄The second test area 5 2 ', the first and second test areas 5 1 , 5 2 are each provided with a plurality of test seats 5 1 1 and r 9 1 with measurement and reduction contacts.
測試機6 Q :係可各赃轉應_站5 0之第-、二測試區 g1、5 2，且其電性連結於測試站5 〇之第一、 1 ' 52，而可於第-測試區5 1及第 試區丄5 2間作電性切換，以對第一測試區5丄 了測趣5 2内之待湏"C交換執行電性檢測 第一移料機構7 〇 三万向（如入 - 诹杖有可作第_、二 之移料器71，用以於供料機構3 〇 =?〇之第一、二測試區51、52間移載 第二移料機構8 0 :係 ζ太a、/1 乍弟一、二、三方向（如χ — γ一 第_ α -立移之移料器81，用以於測試站5 0之 完測匕測試區51、52及收料機構4〇間移載 空麵構9Q :係用以容置空 =執行1C電性檢測之上;： (Α)喷參閱第4圖所示侈 區51之各測試座53f係可先於測試站5〇第-測試 配之測試機6 〇雷；内置入待夠I C101，並使匹 待測1 C i 於第—測試區5 1，而對立内之 構7 〇係以移料業，此時，該第-移料機 I c!〇 2 ; ^71於供料機構3 0處取出下一待測之 (B)請參閱第5圖+ …嗍試站50之第一測試區51執行 7 200815770 . 7 1即將待測之i 料機構7 0之移料器 ⑹請參閱第6圖所示之備料； 試：1内之1 c 1 〇 1執行完電性=52之f 2 -電性切換連結至第 1細卿錢’立即作 5 2中之待測I C i 而接續對第二測試區 換之時間極短，而可測作業’由於電性切 時，該第二移料機構8 〇之:0之停滯等待時間，此 • 區5工處，用二即位移至第一測試 1=器71則於供料機二 中’以完成第-測試區各測試座 之移料器8 1則將完測j c丄 移料機構8 0 依檢測結果而分類收置。 移载至收料機構40處 而利用一測試區執 試機之，個測試區，進 換:料，而使交換料作業完全不試區進行交 測試站之各測試區間的電性切^ 、甘〃、行，而測試機於 間，可有效改善料交f碰之祕切換時 能之效益。 4寺^間’達到大幅提升檢測產 【圖式簡單說明】 第1圖：習式檢測裝置執杆 _ f 2圖：習式檢測裝置執行J ci性(―)。 ，3圖：本發明檢测裝置之示意圖。欢"不忍圖（二）。 巧圖·本發明第一測試區執行】 弟5圖：本铜-顧峨跑備料 200815770 第6圖 之示意圖。 •本發明第二測試區執行Ic電性檢測及第一測試區出料 之示意圖。 第7圖：本發明第一測試區備料及移料機構將完測Ic敕巷γ 料機構之枝目。 移载至收 【主要元件符號說明】 〔習式〕 測試區：131 移料器：141 移料器：151 I C ： 2 2Test machine 6 Q: can be transferred to the first and second test areas g1, 5 2 of the station 5, and it is electrically connected to the first, 1 '52 of the test station 5, and can be - The test area 5 1 and the test area 丄 5 2 are electrically switched to take the test in the first test area 5 and the waiting time in the 5th is performed. The C exchange performs electrical detection of the first transfer mechanism 7 Universal (for example, the in-cane can be used as the first and second shifters 71 for transferring the second moving mechanism between the first and second test zones 51 and 52 of the feeding mechanism 3 〇=?〇 8 0 : The system is a, a, /1, the first, second, and third directions (such as χ - γ - _ α - vertical shifting feeder 81, used to test the test station 5 0 test area 51 , 52 and the receiving mechanism 4 transfer between the empty surface structure 9Q: used to accommodate empty = perform 1C electrical detection above;: (Α) spray see the test area 53f of the exclusion zone 51 shown in Figure 4 It can be tested before the test station 5 〇 first test with the test machine 6 ; 雷; built into the I C101, and the test 1 C i in the first test area 5 1, and the opposite structure 7 In the transfer industry, at this time, the first-feeder I c!〇2; ^71 is taken out at the feeding mechanism 30. Test (B) Please refer to Figure 5 + ... 第一 Test Station 50 in the first test area 51 Execution 7 200815770 . 7 1 The I-to-be-tested material mechanism 7 0 of the shifter (6), please refer to Figure 6. Prepare: Test: 1 in 1 c 1 〇1 Execution of electricity = 52 f 2 - Electrical switching to the first fine money 'immediately to test IC 1 in 5 2 and continue to the second test area The replacement time is extremely short, and the measurable operation 'because of the electrical cutting, the second transfer mechanism 8 〇: 0 stagnation waiting time, this area 5 work, use two to shift to the first test 1 = In the feeder 2, the feeders 8 of the test chambers in the first test zone are completed, and the jc丄 transfer mechanism 80 is sorted and collected according to the detection result. Transfer to the receiving mechanism At 40 places, a test area is used to test the machine, and a test area is exchanged: the material is exchanged, and the exchange material operation is completely untested, and the electrical cuts, the sweets, and the rows of the test stations of the test station are exchanged. The test machine can effectively improve the benefits of switching the secrets of the material f. The 4th room of the temple can achieve a substantial increase in detection and production [simplified description of the drawing] Figure 1: The lever _ f 2 diagram: the routine detection device performs J ci (()., 3: the schematic diagram of the detection device of the present invention. Huan" does not bear the picture (2). The first test area of the invention Execution] Brother 5: This copper-Gu Yu Run preparation 200815770 Figure 6 is a schematic diagram of the second test area of the present invention performs Ic electrical detection and the first test area discharge. Figure 7: The first The test area preparation and transfer mechanism will complete the branch of the γ material mechanism of the Ic Lane. Transfer to receiving [Main component symbol description] [Literature] Test area: 131 Pipe feeder: 141 Pipe feeder: 151 I C : 2 2
供料機構：1 1 收料機構：1 2 測試站：1 3 測試座：1311 弟一移料機構：14 第二移料機構：15 測試機:1 6 I C ： 2 1 〔本發明〕 供料機構：3 0Feeding mechanism: 1 1 Receiving mechanism: 1 2 Test station: 1 3 Test stand: 1311 Brother one transfer mechanism: 14 Second transfer mechanism: 15 Test machine: 1 6 IC : 2 1 [Invention] Feed Organization: 3 0
收料機構：4 0 測試站：5 0 測試座：5 1 1 測試座：5 2 1 測試機：6 0 第一移料機構：7 0 第二移料機構：8 0 空匣機構：9 0 I C ： 1 〇 1 I C ： 1 〇 3 第一測試區：51 第二測試區：5 2 移料器：71 移料器：81 I C ： 1 〇 2 9Receiving agency: 4 0 Test station: 5 0 Test stand: 5 1 1 Test stand: 5 2 1 Test machine: 6 0 First transfer mechanism: 7 0 Second transfer mechanism: 8 0 Open mechanism: 9 0 IC : 1 〇 1 IC : 1 〇 3 First test area : 51 Second test area : 5 2 Loader : 71 Loader : 81 IC : 1 〇 2 9