TW200716944A - Apparatus for and method of measuring image - Google Patents
Apparatus for and method of measuring imageInfo
- Publication number
- TW200716944A TW200716944A TW095137725A TW95137725A TW200716944A TW 200716944 A TW200716944 A TW 200716944A TW 095137725 A TW095137725 A TW 095137725A TW 95137725 A TW95137725 A TW 95137725A TW 200716944 A TW200716944 A TW 200716944A
- Authority
- TW
- Taiwan
- Prior art keywords
- image
- ccd camera
- capturing
- captured
- outputting
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/04—Measuring microscopes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0271—Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0181—Memory or computer-assisted visual determination
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Geometry (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
An image measuring apparatus for enhancing an accuracy of an image captured by an optical system and a method thereof are disclosed. The apparatus includes a CCD camera for capturing the object and outputting the captured image, a lamp for generating white light to illuminate a capturing area of the object, an illumination controller for controlling the lamp to be turned on, a piezoelectric actuator for controlling a minute height of the optical system with respect to the object, an image capturing device for acquiring the image captured by the CCD camera, a driving signal generator for outputting a driving signal to the illumination controller and the piezoelectric actuator when an enable signal is generated from the CCD camera, and an image signal processor for estimating height information of the object from data transmitted from the image capturing unit.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050098853A KR100740249B1 (en) | 2005-10-19 | 2005-10-19 | Apparatus and method for measuring image |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200716944A true TW200716944A (en) | 2007-05-01 |
TWI294959B TWI294959B (en) | 2008-03-21 |
Family
ID=37962690
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095137725A TWI294959B (en) | 2005-10-19 | 2006-10-13 | Apparatus for and method of measuring image |
Country Status (5)
Country | Link |
---|---|
US (1) | US8155483B2 (en) |
JP (1) | JP2009511932A (en) |
KR (1) | KR100740249B1 (en) |
TW (1) | TWI294959B (en) |
WO (1) | WO2007046626A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8005290B2 (en) | 2007-07-05 | 2011-08-23 | Industrial Technology Research Institute | Method for image calibration and apparatus for image acquiring |
TWI794909B (en) * | 2021-07-29 | 2023-03-01 | 日商雅馬哈智能機器控股股份有限公司 | Three-dimensional image generation device and three-dimensional image generation method |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100946640B1 (en) * | 2008-03-24 | 2010-03-09 | 홍광표 | Visual Caliper |
KR100956854B1 (en) * | 2008-04-04 | 2010-05-11 | 선문대학교 산학협력단 | Method and apparatus for more fast measurement of 3-dimensional object |
KR100956853B1 (en) * | 2008-04-04 | 2010-05-11 | 선문대학교 산학협력단 | Method and apparatus for fast measurement of 3-dimensional object |
US8799769B2 (en) * | 2011-02-08 | 2014-08-05 | Ebay Inc. | Application above-the-fold rendering measurements |
KR101341189B1 (en) | 2011-03-10 | 2014-01-06 | 엄두간 | Light sensor for detecting surface angle and sensing method using the same |
KR101401395B1 (en) | 2012-02-07 | 2014-06-02 | 엄두간 | Photosensor for measuring surface and measuring method of 3D depth and surface using thereof |
TWI663380B (en) * | 2018-09-19 | 2019-06-21 | 致茂電子股份有限公司 | Image capturing system and image capturing method |
CN111781394A (en) * | 2020-06-16 | 2020-10-16 | 江西寻准智能科技有限责任公司 | White light speedometer |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2730203B2 (en) * | 1989-08-17 | 1998-03-25 | オムロン株式会社 | Optical information recording / reproducing device |
JPH04295709A (en) | 1991-03-25 | 1992-10-20 | Ricoh Co Ltd | Intereference measuring apparatus and method for receiving image data of interference fringe |
DE4335143A1 (en) * | 1993-10-15 | 1995-04-20 | Hell Ag Linotype | Method and device for converting color values |
JP3381924B2 (en) * | 1995-03-10 | 2003-03-04 | 株式会社 日立製作所 | Inspection device |
US5793371A (en) * | 1995-08-04 | 1998-08-11 | Sun Microsystems, Inc. | Method and apparatus for geometric compression of three-dimensional graphics data |
JPH09149207A (en) * | 1995-11-24 | 1997-06-06 | Minolta Co Ltd | Image reader |
US6208416B1 (en) * | 1996-03-22 | 2001-03-27 | Loughborough University Innovations Limited | Method and apparatus for measuring shape of objects |
US5748904A (en) * | 1996-09-13 | 1998-05-05 | Silicon Integrated Systems Corp. | Method and system for segment encoded graphic data compression |
US5926647A (en) * | 1996-10-11 | 1999-07-20 | Divicom Inc. | Processing system with dynamic alteration of a color look-up table |
US6065746A (en) * | 1997-02-18 | 2000-05-23 | Unisys Corporation | Apparatus and method of automatically adjusting a document deceleration rate |
JP2000171209A (en) * | 1998-12-09 | 2000-06-23 | Nikon Corp | Interference measuring instrument |
US6552806B1 (en) * | 2000-02-03 | 2003-04-22 | Veeco Instruments Inc. | Automated minimization of optical path difference and reference mirror focus in white-light interference microscope objective |
JP2002214129A (en) | 2001-01-16 | 2002-07-31 | Japan Science & Technology Corp | Mireau interferometer type vertical section image measuring device by heterodyne detection |
KR100434445B1 (en) * | 2001-12-28 | 2004-06-04 | (주) 인텍플러스 | Tree demensional shape/surface illumination measuring apparatus |
KR100615576B1 (en) | 2003-02-06 | 2006-08-25 | 주식회사 고영테크놀러지 | Three-dimensional image measuring apparatus |
-
2005
- 2005-10-19 KR KR1020050098853A patent/KR100740249B1/en active IP Right Grant
-
2006
- 2006-10-13 TW TW095137725A patent/TWI294959B/en active
- 2006-10-18 JP JP2008536491A patent/JP2009511932A/en active Pending
- 2006-10-18 WO PCT/KR2006/004225 patent/WO2007046626A1/en active Application Filing
- 2006-10-18 US US12/090,592 patent/US8155483B2/en active Active
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8005290B2 (en) | 2007-07-05 | 2011-08-23 | Industrial Technology Research Institute | Method for image calibration and apparatus for image acquiring |
US8237933B2 (en) | 2007-07-05 | 2012-08-07 | Industrial Technology Research Institute | Method for image calibration and apparatus for image acquiring |
TWI794909B (en) * | 2021-07-29 | 2023-03-01 | 日商雅馬哈智能機器控股股份有限公司 | Three-dimensional image generation device and three-dimensional image generation method |
Also Published As
Publication number | Publication date |
---|---|
KR100740249B1 (en) | 2007-07-18 |
US20080260204A1 (en) | 2008-10-23 |
TWI294959B (en) | 2008-03-21 |
US8155483B2 (en) | 2012-04-10 |
KR20070042841A (en) | 2007-04-24 |
JP2009511932A (en) | 2009-03-19 |
WO2007046626A1 (en) | 2007-04-26 |
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