TW200707209A - Testing system and testing method for link control card - Google Patents

Testing system and testing method for link control card

Info

Publication number
TW200707209A
TW200707209A TW094127460A TW94127460A TW200707209A TW 200707209 A TW200707209 A TW 200707209A TW 094127460 A TW094127460 A TW 094127460A TW 94127460 A TW94127460 A TW 94127460A TW 200707209 A TW200707209 A TW 200707209A
Authority
TW
Taiwan
Prior art keywords
testing
lcc
mcu
terminal
fibre channel
Prior art date
Application number
TW094127460A
Other languages
Chinese (zh)
Other versions
TWI309779B (en
Inventor
Kang Wu
Wei Zhang
Jun Huang
Original Assignee
Hon Hai Prec Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hon Hai Prec Ind Co Ltd filed Critical Hon Hai Prec Ind Co Ltd
Priority to TW94127460A priority Critical patent/TWI309779B/en
Publication of TW200707209A publication Critical patent/TW200707209A/en
Application granted granted Critical
Publication of TWI309779B publication Critical patent/TWI309779B/en

Links

Abstract

A system for testing a Link Control Card (LCC) is provided. The system includes a host with a host bus adaptor, a testing device array and a middle plane (MP). The host is connected to the testing device array for sending out testing orders and receiving testing results. The host is connected to a first terminal of the LCC for transmitting fibre channel signals. A first terminal of the MP is connected to a second terminal of the LCC. A second terminal of the MP is connected to the testing device array. The testing device array includes a plurality of testing devices. Each testing device includes a Micro Controller Unit (MCU), a connector connected to the MCU for receiving fibre channel signals, a fibre channel hub connected to the connector for testing the fibre channel signals, a voltage margin unit connected to the MCU for controlling working voltage source of the LCC, an address setting unit connected to the MCU, a serial interface A used for outputting the testing results. The present invention also provides an LCC testing method.
TW94127460A 2005-08-12 2005-08-12 Testing system and testing method for link control card TWI309779B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94127460A TWI309779B (en) 2005-08-12 2005-08-12 Testing system and testing method for link control card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94127460A TWI309779B (en) 2005-08-12 2005-08-12 Testing system and testing method for link control card

Publications (2)

Publication Number Publication Date
TW200707209A true TW200707209A (en) 2007-02-16
TWI309779B TWI309779B (en) 2009-05-11

Family

ID=45072102

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94127460A TWI309779B (en) 2005-08-12 2005-08-12 Testing system and testing method for link control card

Country Status (1)

Country Link
TW (1) TWI309779B (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI482016B (en) * 2013-03-05 2015-04-21 Wistron Corp Test method for a storage device and computer program product executing the same
US11034157B2 (en) 2018-12-03 2021-06-15 Hewlett-Packard Development Company, L.P. Logic circuitry
TWI741408B (en) * 2018-12-03 2021-10-01 美商惠普發展公司有限責任合夥企業 Logic circuitry
US11250146B2 (en) 2018-12-03 2022-02-15 Hewlett-Packard Development Company, L.P. Logic circuitry
US11292261B2 (en) 2018-12-03 2022-04-05 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11298950B2 (en) 2018-12-03 2022-04-12 Hewlett-Packard Development Company, L.P. Print liquid supply units
US11312145B2 (en) 2018-12-03 2022-04-26 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11338586B2 (en) 2018-12-03 2022-05-24 Hewlett-Packard Development Company, L.P. Logic circuitry
US11366913B2 (en) 2018-12-03 2022-06-21 Hewlett-Packard Development Company, L.P. Logic circuitry
US11407229B2 (en) 2019-10-25 2022-08-09 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11429554B2 (en) 2018-12-03 2022-08-30 Hewlett-Packard Development Company, L.P. Logic circuitry package accessible for a time period duration while disregarding inter-integrated circuitry traffic
US11479047B2 (en) 2018-12-03 2022-10-25 Hewlett-Packard Development Company, L.P. Print liquid supply units

Cited By (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI482016B (en) * 2013-03-05 2015-04-21 Wistron Corp Test method for a storage device and computer program product executing the same
US11345158B2 (en) 2018-12-03 2022-05-31 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11298950B2 (en) 2018-12-03 2022-04-12 Hewlett-Packard Development Company, L.P. Print liquid supply units
US11345159B2 (en) 2018-12-03 2022-05-31 Hewlett-Packard Development Company, L.P. Replaceable print apparatus component
US11292261B2 (en) 2018-12-03 2022-04-05 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11351791B2 (en) 2018-12-03 2022-06-07 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11312145B2 (en) 2018-12-03 2022-04-26 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11312146B2 (en) 2018-12-03 2022-04-26 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11318751B2 (en) 2018-12-03 2022-05-03 Hewlett-Packard Development Company, L.P. Sensor circuitry
US11331924B2 (en) 2018-12-03 2022-05-17 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11331925B2 (en) 2018-12-03 2022-05-17 Hewlett-Packard Development Company, L.P. Logic circuitry
US11338586B2 (en) 2018-12-03 2022-05-24 Hewlett-Packard Development Company, L.P. Logic circuitry
US11366913B2 (en) 2018-12-03 2022-06-21 Hewlett-Packard Development Company, L.P. Logic circuitry
US11345157B2 (en) 2018-12-03 2022-05-31 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11034157B2 (en) 2018-12-03 2021-06-15 Hewlett-Packard Development Company, L.P. Logic circuitry
US11250146B2 (en) 2018-12-03 2022-02-15 Hewlett-Packard Development Company, L.P. Logic circuitry
TWI741408B (en) * 2018-12-03 2021-10-01 美商惠普發展公司有限責任合夥企業 Logic circuitry
US11345156B2 (en) 2018-12-03 2022-05-31 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11364724B2 (en) 2018-12-03 2022-06-21 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11364716B2 (en) 2018-12-03 2022-06-21 Hewlett-Packard Development Company, L.P. Logic circuitry
US11787194B2 (en) 2018-12-03 2023-10-17 Hewlett-Packard Development Company, L.P. Sealed interconnects
US11407228B2 (en) 2018-12-03 2022-08-09 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11427010B2 (en) 2018-12-03 2022-08-30 Hewlett-Packard Development Company, L.P. Logic circuitry
US11429554B2 (en) 2018-12-03 2022-08-30 Hewlett-Packard Development Company, L.P. Logic circuitry package accessible for a time period duration while disregarding inter-integrated circuitry traffic
US11479047B2 (en) 2018-12-03 2022-10-25 Hewlett-Packard Development Company, L.P. Print liquid supply units
US11479046B2 (en) 2018-12-03 2022-10-25 Hewlett-Packard Development Company, L.P. Logic circuitry for sensor data communications
US11511546B2 (en) 2018-12-03 2022-11-29 Hewlett-Packard Development Company, L.P. Logic circuitry package
US11625493B2 (en) 2018-12-03 2023-04-11 Hewlett-Packard Development Company, L.P. Logic circuitry
US11738562B2 (en) 2018-12-03 2023-08-29 Hewlett-Packard Development Company, L.P. Logic circuitry
US11407229B2 (en) 2019-10-25 2022-08-09 Hewlett-Packard Development Company, L.P. Logic circuitry package

Also Published As

Publication number Publication date
TWI309779B (en) 2009-05-11

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees