TW200632591A - Exposure method, manufacturing method of electronic device, exposure device, and illuminating optical device - Google Patents
Exposure method, manufacturing method of electronic device, exposure device, and illuminating optical deviceInfo
- Publication number
- TW200632591A TW200632591A TW095106265A TW95106265A TW200632591A TW 200632591 A TW200632591 A TW 200632591A TW 095106265 A TW095106265 A TW 095106265A TW 95106265 A TW95106265 A TW 95106265A TW 200632591 A TW200632591 A TW 200632591A
- Authority
- TW
- Taiwan
- Prior art keywords
- exposure
- exposure method
- electronic device
- manufacturing
- diffraction gratings
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 6
- 230000003287 optical effect Effects 0.000 title abstract 3
- 238000004519 manufacturing process Methods 0.000 title 1
- 230000002452 interceptive effect Effects 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70408—Interferometric lithography; Holographic lithography; Self-imaging lithography, e.g. utilizing the Talbot effect
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
- G02B27/4222—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant in projection exposure systems, e.g. photolithographic systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4272—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having plural diffractive elements positioned sequentially along the optical path
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4272—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having plural diffractive elements positioned sequentially along the optical path
- G02B27/4277—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having plural diffractive elements positioned sequentially along the optical path being separated by an air space
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
- G02B5/1838—Diffraction gratings for use with ultraviolet radiation or X-rays
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
- G02B5/1866—Transmission gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B27/00—Photographic printing apparatus
- G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
- G03B27/42—Projection printing apparatus, e.g. enlarger, copying camera for automatic sequential copying of the same original
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/7035—Proximity or contact printers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/14—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation
- G02B13/143—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation for use with ultraviolet radiation
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005052158 | 2005-02-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200632591A true TW200632591A (en) | 2006-09-16 |
TWI408505B TWI408505B (zh) | 2013-09-11 |
Family
ID=36927443
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095106265A TWI408505B (zh) | 2005-02-25 | 2006-02-24 | 曝光方法、電子元件製造方法以及曝光裝置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US20090011368A1 (zh) |
EP (1) | EP1852894A1 (zh) |
JP (2) | JP4822022B2 (zh) |
KR (1) | KR101152713B1 (zh) |
CN (1) | CN101128917B (zh) |
TW (1) | TWI408505B (zh) |
WO (1) | WO2006090807A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI559075B (zh) * | 2012-05-16 | 2016-11-21 | 信越化學工業股份有限公司 | 半色調相位移光罩基板及半色調相位移光罩之製造方法 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8431328B2 (en) | 2007-02-22 | 2013-04-30 | Nikon Corporation | Exposure method, method for manufacturing flat panel display substrate, and exposure apparatus |
WO2012165281A1 (ja) * | 2011-06-01 | 2012-12-06 | コニカミノルタアドバンストレイヤー株式会社 | 複眼ユニット |
DE102011081110A1 (de) * | 2011-08-17 | 2013-01-03 | Carl Zeiss Smt Gmbh | Vorrichtung und Verfahren zur Interferenzlithographie |
JP2013238670A (ja) * | 2012-05-11 | 2013-11-28 | Canon Inc | 露光装置、露光方法、デバイスの製造方法及び開口板 |
WO2017222919A1 (en) * | 2016-06-20 | 2017-12-28 | Nikon Corporation | Dense line extreme ultraviolet lithography system with distortion matching |
US10705214B2 (en) * | 2017-07-14 | 2020-07-07 | Microsoft Technology Licensing, Llc | Optical projector having switchable light emission patterns |
WO2019181457A1 (ja) * | 2018-03-19 | 2019-09-26 | ソニーセミコンダクタソリューションズ株式会社 | 光源システム、光学回折素子製造方法、および測距システム、ならびに光学回折素子 |
JP7193304B2 (ja) * | 2018-03-19 | 2022-12-20 | ソニーセミコンダクタソリューションズ株式会社 | 光源システム、光学回折素子製造方法、および測距システム、ならびに光学回折素子 |
US11422292B1 (en) * | 2018-06-10 | 2022-08-23 | Apple Inc. | Super-blazed diffractive optical elements with sub-wavelength structures |
CN109100871B (zh) * | 2018-09-14 | 2021-09-03 | 京东方科技集团股份有限公司 | 光调制装置以及光谱检测*** |
JP7227775B2 (ja) * | 2019-01-31 | 2023-02-22 | キヤノン株式会社 | 照明光学系、露光装置および物品製造方法 |
US11042098B2 (en) | 2019-02-15 | 2021-06-22 | Applied Materials, Inc. | Large area high resolution feature reduction lithography technique |
JP7362763B2 (ja) * | 2019-03-27 | 2023-10-17 | ユーリタ アクチエンゲゼルシャフト | 変化するデューティサイクルを有する周期的なパターンを印刷するための方法および装置 |
US11754767B1 (en) | 2020-03-05 | 2023-09-12 | Apple Inc. | Display with overlaid waveguide |
CN116755297B (zh) * | 2023-08-17 | 2023-10-27 | 鹏城实验室 | 曝光分辨率优化方法、装置、电子设备及存储介质 |
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JP2995820B2 (ja) * | 1990-08-21 | 1999-12-27 | 株式会社ニコン | 露光方法及び方法,並びにデバイス製造方法 |
US5703675A (en) * | 1992-01-17 | 1997-12-30 | Nikon Corporation | Projection-exposing apparatus with deflecting grating member |
JPH05217839A (ja) * | 1992-02-04 | 1993-08-27 | Nikon Corp | 投影露光装置 |
JP3250563B2 (ja) * | 1992-01-17 | 2002-01-28 | 株式会社ニコン | フォトマスク、並びに露光方法及びその露光方法を用いた回路パターン素子製造方法、並びに露光装置 |
JPH05326365A (ja) * | 1992-05-21 | 1993-12-10 | Nikon Corp | 投影露光装置 |
KR970003593B1 (en) * | 1992-09-03 | 1997-03-20 | Samsung Electronics Co Ltd | Projection exposure method and device using mask |
US5636003A (en) * | 1992-11-05 | 1997-06-03 | Nikon Corporation | Illumination optical apparatus and scanning exposure apparatus |
JP3368654B2 (ja) * | 1994-03-23 | 2003-01-20 | 株式会社ニコン | 照明光学装置及び転写方法 |
JP3428055B2 (ja) * | 1992-11-05 | 2003-07-22 | 株式会社ニコン | 照明光学装置、露光装置、半導体製造方法および露光方法 |
EP0627666B1 (en) * | 1993-05-24 | 2003-02-05 | Holtronic Technologies Plc | Apparatus and method for changing the scale of a printed pattern |
KR950034472A (ko) * | 1994-04-06 | 1995-12-28 | 가나이 쓰토무 | 패턴형성방법 및 그것에 사용되는 투영노광장치 |
JPH08316124A (ja) * | 1995-05-19 | 1996-11-29 | Hitachi Ltd | 投影露光方法及び露光装置 |
JPH08316125A (ja) * | 1995-05-19 | 1996-11-29 | Hitachi Ltd | 投影露光方法及び露光装置 |
US6233044B1 (en) * | 1997-01-21 | 2001-05-15 | Steven R. J. Brueck | Methods and apparatus for integrating optical and interferometric lithography to produce complex patterns |
US6741394B1 (en) * | 1998-03-12 | 2004-05-25 | Nikon Corporation | Optical integrator, illumination optical apparatus, exposure apparatus and observation apparatus |
JP4032501B2 (ja) * | 1998-04-22 | 2008-01-16 | 株式会社ニコン | 投影光学系の結像特性計測方法及び投影露光装置 |
JP3711810B2 (ja) * | 1999-10-13 | 2005-11-02 | セイコーエプソン株式会社 | 画像変換装置、記憶媒体および画像変換方法 |
DE10062579A1 (de) * | 1999-12-15 | 2001-06-21 | Nikon Corp | Optischer Integrierer,optische Beleuchtungseinrichtung, Photolithographie-Belichtungseinrichtung,und Beobachtungseinrichtung |
US20020149757A1 (en) * | 2001-02-28 | 2002-10-17 | Optical Switch Corporation | Polarization vector alignment for interference lithography patterning |
US6693701B2 (en) * | 2001-05-29 | 2004-02-17 | Ibsen Photonics A/S | Method and apparatus for diffractive transfer of a mask grating |
JP4005881B2 (ja) * | 2002-08-30 | 2007-11-14 | 株式会社東芝 | 露光装置の検査方法 |
US7005235B2 (en) * | 2002-12-04 | 2006-02-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and systems to print contact hole patterns |
US8110345B2 (en) * | 2002-12-04 | 2012-02-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | High resolution lithography system and method |
US7170588B2 (en) * | 2003-07-25 | 2007-01-30 | Smith Bruce W | Reduction Smith-Talbot interferometer prism for micropatterning |
US20050074698A1 (en) * | 2003-10-07 | 2005-04-07 | Intel Corporation | Composite optical lithography method for patterning lines of significantly different widths |
CN100510964C (zh) * | 2004-08-05 | 2009-07-08 | 中国科学院光电技术研究所 | 一种采用光栅组合的成像干涉光刻方法及其光刻*** |
JP4389791B2 (ja) * | 2004-08-25 | 2009-12-24 | セイコーエプソン株式会社 | 微細構造体の製造方法および露光装置 |
US20060109532A1 (en) * | 2004-11-19 | 2006-05-25 | Savas Timothy A | System and method for forming well-defined periodic patterns using achromatic interference lithography |
CN101103442B (zh) * | 2005-01-14 | 2011-05-11 | 株式会社尼康 | 照明光学装置 |
US20090068597A1 (en) * | 2005-01-14 | 2009-03-12 | Naomasa Shiraishi | Exposure method and apparatus, and electronic device manufacturing method |
WO2007077855A1 (ja) * | 2005-12-28 | 2007-07-12 | Nikon Corporation | エンコーダ |
US7561252B2 (en) * | 2005-12-29 | 2009-07-14 | Asml Holding N.V. | Interferometric lithography system and method used to generate equal path lengths of interfering beams |
US8431328B2 (en) * | 2007-02-22 | 2013-04-30 | Nikon Corporation | Exposure method, method for manufacturing flat panel display substrate, and exposure apparatus |
-
2006
- 2006-02-23 WO PCT/JP2006/303333 patent/WO2006090807A1/ja active Application Filing
- 2006-02-23 JP JP2007504788A patent/JP4822022B2/ja active Active
- 2006-02-23 EP EP06714473A patent/EP1852894A1/en not_active Withdrawn
- 2006-02-23 KR KR1020077021502A patent/KR101152713B1/ko not_active IP Right Cessation
- 2006-02-23 CN CN200680005833.0A patent/CN101128917B/zh not_active Expired - Fee Related
- 2006-02-23 US US11/884,891 patent/US20090011368A1/en not_active Abandoned
- 2006-02-24 TW TW095106265A patent/TWI408505B/zh not_active IP Right Cessation
-
2011
- 2011-06-24 JP JP2011141210A patent/JP5494577B2/ja active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI559075B (zh) * | 2012-05-16 | 2016-11-21 | 信越化學工業股份有限公司 | 半色調相位移光罩基板及半色調相位移光罩之製造方法 |
Also Published As
Publication number | Publication date |
---|---|
TWI408505B (zh) | 2013-09-11 |
KR20070115982A (ko) | 2007-12-06 |
JP2011181979A (ja) | 2011-09-15 |
US20090011368A1 (en) | 2009-01-08 |
KR101152713B1 (ko) | 2012-06-15 |
WO2006090807A1 (ja) | 2006-08-31 |
JP4822022B2 (ja) | 2011-11-24 |
EP1852894A1 (en) | 2007-11-07 |
CN101128917A (zh) | 2008-02-20 |
CN101128917B (zh) | 2011-11-23 |
JPWO2006090807A1 (ja) | 2008-07-24 |
JP5494577B2 (ja) | 2014-05-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |