TW200627675A - Growth of Ⅲ-nitride light-emitting devices on textured substrates - Google Patents
Growth of Ⅲ-nitride light-emitting devices on textured substratesInfo
- Publication number
- TW200627675A TW200627675A TW094132540A TW94132540A TW200627675A TW 200627675 A TW200627675 A TW 200627675A TW 094132540 A TW094132540 A TW 094132540A TW 94132540 A TW94132540 A TW 94132540A TW 200627675 A TW200627675 A TW 200627675A
- Authority
- TW
- Taiwan
- Prior art keywords
- iii
- growth
- nitride light
- emitting devices
- textured substrates
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title abstract 3
- 239000000463 material Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0066—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound
- H01L33/007—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound comprising nitride compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02378—Silicon carbide
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/0242—Crystalline insulating materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/02428—Structure
- H01L21/0243—Surface structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02455—Group 13/15 materials
- H01L21/02458—Nitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/0254—Nitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/20—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/08—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a plurality of light emitting regions, e.g. laterally discontinuous light emitting layer or photoluminescent region integrated within the semiconductor body
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Led Devices (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/950,000 US7633097B2 (en) | 2004-09-23 | 2004-09-23 | Growth of III-nitride light emitting devices on textured substrates |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200627675A true TW200627675A (en) | 2006-08-01 |
TWI407580B TWI407580B (zh) | 2013-09-01 |
Family
ID=35457652
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094132540A TWI407580B (zh) | 2004-09-23 | 2005-09-20 | 紋理基底上iii族氮化物發光裝置之成長 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7633097B2 (zh) |
EP (1) | EP1641051B1 (zh) |
JP (1) | JP5420137B2 (zh) |
TW (1) | TWI407580B (zh) |
Cited By (14)
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US8878245B2 (en) | 2006-11-30 | 2014-11-04 | Cree, Inc. | Transistors and method for making ohmic contact to transistors |
US9911781B2 (en) | 2009-09-17 | 2018-03-06 | Sionyx, Llc | Photosensitive imaging devices and associated methods |
US9939251B2 (en) | 2013-03-15 | 2018-04-10 | Sionyx, Llc | Three dimensional imaging utilizing stacked imager devices and associated methods |
USD826871S1 (en) | 2014-12-11 | 2018-08-28 | Cree, Inc. | Light emitting diode device |
TWI639243B (zh) | 2010-03-24 | 2018-10-21 | 美商矽安尼克斯有限責任公司 | 具有加強電磁輻射偵測之裝置與相關方法 |
US10224359B2 (en) | 2012-03-22 | 2019-03-05 | Sionyx, Llc | Pixel isolation elements, devices and associated methods |
US10229951B2 (en) | 2010-04-21 | 2019-03-12 | Sionyx, Llc | Photosensitive imaging devices and associated methods |
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US10505054B2 (en) | 2010-06-18 | 2019-12-10 | Sionyx, Llc | High speed photosensitive devices and associated methods |
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EP1597777B1 (en) | 2003-02-26 | 2013-04-24 | Cree, Inc. | Composite white light source and method for fabricating |
JP2006525682A (ja) * | 2003-04-30 | 2006-11-09 | クリー インコーポレイテッド | 高出力固体発光素子パッケージ |
US7005679B2 (en) * | 2003-05-01 | 2006-02-28 | Cree, Inc. | Multiple component solid state white light |
JP2006324324A (ja) * | 2005-05-17 | 2006-11-30 | Sumitomo Electric Ind Ltd | 発光装置、発光装置の製造方法および窒化物半導体基板 |
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JP2007300069A (ja) * | 2006-04-04 | 2007-11-15 | Toyoda Gosei Co Ltd | 発光素子、この発光素子を用いた発光装置及びこの発光素子の製造方法 |
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US9318327B2 (en) * | 2006-11-28 | 2016-04-19 | Cree, Inc. | Semiconductor devices having low threading dislocations and improved light extraction and methods of making the same |
US7663148B2 (en) * | 2006-12-22 | 2010-02-16 | Philips Lumileds Lighting Company, Llc | III-nitride light emitting device with reduced strain light emitting layer |
US20080149946A1 (en) * | 2006-12-22 | 2008-06-26 | Philips Lumileds Lighting Company, Llc | Semiconductor Light Emitting Device Configured To Emit Multiple Wavelengths Of Light |
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US9431589B2 (en) | 2007-12-14 | 2016-08-30 | Cree, Inc. | Textured encapsulant surface in LED packages |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1300859C (zh) * | 1997-01-31 | 2007-02-14 | 松下电器产业株式会社 | 发光元件 |
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JP4352473B2 (ja) * | 1998-06-26 | 2009-10-28 | ソニー株式会社 | 半導体装置の製造方法 |
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JP3455512B2 (ja) * | 1999-11-17 | 2003-10-14 | 日本碍子株式会社 | エピタキシャル成長用基板およびその製造方法 |
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KR100632760B1 (ko) * | 2001-03-21 | 2006-10-11 | 미츠비시 덴센 고교 가부시키가이샤 | 반도체 발광 소자 |
JP3595277B2 (ja) * | 2001-03-21 | 2004-12-02 | 三菱電線工業株式会社 | GaN系半導体発光ダイオード |
US6630692B2 (en) * | 2001-05-29 | 2003-10-07 | Lumileds Lighting U.S., Llc | III-Nitride light emitting devices with low driving voltage |
JP4055503B2 (ja) * | 2001-07-24 | 2008-03-05 | 日亜化学工業株式会社 | 半導体発光素子 |
JP4948720B2 (ja) * | 2001-08-29 | 2012-06-06 | シャープ株式会社 | 窒素化合物半導体積層物、発光素子、光ピックアップシステム、および窒素化合物半導体積層物の製造方法。 |
JP2003282447A (ja) * | 2002-03-20 | 2003-10-03 | Fuji Photo Film Co Ltd | 半導体素子用基板の製造方法および半導体素子用基板ならびに半導体素子 |
JP3991823B2 (ja) * | 2002-09-04 | 2007-10-17 | 昭和電工株式会社 | Iii族窒化物半導体結晶、その製造方法、iii族窒化物半導体エピタキシャルウェーハ |
JP2004153089A (ja) * | 2002-10-31 | 2004-05-27 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子及びその製造方法 |
US7071494B2 (en) * | 2002-12-11 | 2006-07-04 | Lumileds Lighting U.S. Llc | Light emitting device with enhanced optical scattering |
JP4442093B2 (ja) * | 2002-12-24 | 2010-03-31 | 日亜化学工業株式会社 | 窒化物半導体積層用基板の製造方法 |
KR20060059891A (ko) * | 2003-06-04 | 2006-06-02 | 유명철 | 수직 구조 화합물 반도체 디바이스의 제조 방법 |
KR100576854B1 (ko) * | 2003-12-20 | 2006-05-10 | 삼성전기주식회사 | 질화물 반도체 제조 방법과 이를 이용한 질화물 반도체 |
-
2004
- 2004-09-23 US US10/950,000 patent/US7633097B2/en active Active
-
2005
- 2005-09-15 EP EP05108467.1A patent/EP1641051B1/en active Active
- 2005-09-20 TW TW094132540A patent/TWI407580B/zh active
- 2005-09-22 JP JP2005307807A patent/JP5420137B2/ja active Active
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10374109B2 (en) | 2001-05-25 | 2019-08-06 | President And Fellows Of Harvard College | Silicon-based visible and near-infrared optoelectric devices |
US10741399B2 (en) | 2004-09-24 | 2020-08-11 | President And Fellows Of Harvard College | Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate |
US10361083B2 (en) | 2004-09-24 | 2019-07-23 | President And Fellows Of Harvard College | Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate |
US8878245B2 (en) | 2006-11-30 | 2014-11-04 | Cree, Inc. | Transistors and method for making ohmic contact to transistors |
US10361232B2 (en) | 2009-09-17 | 2019-07-23 | Sionyx, Llc | Photosensitive imaging devices and associated methods |
US9911781B2 (en) | 2009-09-17 | 2018-03-06 | Sionyx, Llc | Photosensitive imaging devices and associated methods |
TWI639243B (zh) | 2010-03-24 | 2018-10-21 | 美商矽安尼克斯有限責任公司 | 具有加強電磁輻射偵測之裝置與相關方法 |
US10229951B2 (en) | 2010-04-21 | 2019-03-12 | Sionyx, Llc | Photosensitive imaging devices and associated methods |
US10505054B2 (en) | 2010-06-18 | 2019-12-10 | Sionyx, Llc | High speed photosensitive devices and associated methods |
US10269861B2 (en) | 2011-06-09 | 2019-04-23 | Sionyx, Llc | Process module for increasing the response of backside illuminated photosensitive imagers and associated methods |
US10244188B2 (en) | 2011-07-13 | 2019-03-26 | Sionyx, Llc | Biometric imaging devices and associated methods |
US10224359B2 (en) | 2012-03-22 | 2019-03-05 | Sionyx, Llc | Pixel isolation elements, devices and associated methods |
US9939251B2 (en) | 2013-03-15 | 2018-04-10 | Sionyx, Llc | Three dimensional imaging utilizing stacked imager devices and associated methods |
US10347682B2 (en) | 2013-06-29 | 2019-07-09 | Sionyx, Llc | Shallow trench textured regions and associated methods |
US11069737B2 (en) | 2013-06-29 | 2021-07-20 | Sionyx, Llc | Shallow trench textured regions and associated methods |
USD826871S1 (en) | 2014-12-11 | 2018-08-28 | Cree, Inc. | Light emitting diode device |
Also Published As
Publication number | Publication date |
---|---|
US7633097B2 (en) | 2009-12-15 |
EP1641051A2 (en) | 2006-03-29 |
JP2007128925A (ja) | 2007-05-24 |
EP1641051A3 (en) | 2011-09-21 |
EP1641051B1 (en) | 2019-01-23 |
TWI407580B (zh) | 2013-09-01 |
JP5420137B2 (ja) | 2014-02-19 |
US20060060888A1 (en) | 2006-03-23 |
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