TW200626908A - Contact unit and inspection system - Google Patents

Contact unit and inspection system

Info

Publication number
TW200626908A
TW200626908A TW094136665A TW94136665A TW200626908A TW 200626908 A TW200626908 A TW 200626908A TW 094136665 A TW094136665 A TW 094136665A TW 94136665 A TW94136665 A TW 94136665A TW 200626908 A TW200626908 A TW 200626908A
Authority
TW
Taiwan
Prior art keywords
contacters
holding board
conductive
holding
contact unit
Prior art date
Application number
TW094136665A
Other languages
Chinese (zh)
Other versions
TWI375802B (en
Inventor
Makoto Umino
Youichi Ueda
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW200626908A publication Critical patent/TW200626908A/en
Application granted granted Critical
Publication of TWI375802B publication Critical patent/TWI375802B/en

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Liquid Crystal (AREA)

Abstract

This invention provides a contact unit that is capable of easily aligning the terminals formed on an article to be inspected and conductive contacters, and an inspection system employing such contact unit. The contact unit (2) comprises conductive contacters (3) disposed in a line pattern corresponding to the terminals formed on the article to be inspected for receiving and transmitting signals, a holding board (4) for holding conductive contacters (3), a contact block (5) disposed in a region on the holding board (4) and corresponding to a holding region of the conductive contacters (3), and a fixing member (6) for fixing the contact block (5) on the holding board (4). The fixing member (6) is fixed on the holding board (4) with screw members (13) in a central side of the holding board with respect to the region where the conductive contacters (3) are held, the fixing member (6) has a function of fixing the contact block (5) on the holding board (4) by applying a pressure through a pressing surface (11a) on a block member (11) forming the contact block (5) against the holding board (4).
TW094136665A 2004-10-20 2005-10-20 Con tact unit and inspection system TWI375802B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004305738A JP4395429B2 (en) 2004-10-20 2004-10-20 Contact unit and inspection system using contact unit
PCT/JP2005/019235 WO2006043607A1 (en) 2004-10-20 2005-10-19 Contact unit and inspection system

Publications (2)

Publication Number Publication Date
TW200626908A true TW200626908A (en) 2006-08-01
TWI375802B TWI375802B (en) 2012-11-01

Family

ID=36203022

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094136665A TWI375802B (en) 2004-10-20 2005-10-20 Con tact unit and inspection system

Country Status (4)

Country Link
JP (1) JP4395429B2 (en)
CN (1) CN100504399C (en)
TW (1) TWI375802B (en)
WO (1) WO2006043607A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5101060B2 (en) * 2006-07-31 2012-12-19 日本発條株式会社 Probe card parallelism adjustment mechanism
JP5300431B2 (en) * 2008-11-17 2013-09-25 株式会社日本マイクロニクス Substrate alignment device
CN102353480B (en) * 2011-07-12 2013-05-08 北京邮电大学 Normal pressure applying device
JP2012215591A (en) * 2012-08-03 2012-11-08 Nhk Spring Co Ltd Parallelism adjustment mechanism of probe card
JP2019053161A (en) * 2017-09-14 2019-04-04 日本電産サンキョー株式会社 Inspection device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3442137B2 (en) * 1993-12-17 2003-09-02 日本発条株式会社 Conductive contact unit
KR100212169B1 (en) * 1996-02-13 1999-08-02 오쿠보 마사오 Probe, manufacture of same, and vertically operative type probe card assembly employing the same
JPH11108954A (en) * 1997-10-03 1999-04-23 Eejingu Tesuta Kaihatsu Kyodo Kumiai Contact probe
EP1496366A4 (en) * 2002-04-16 2005-09-14 Nhk Spring Co Ltd Holder for conductive contact

Also Published As

Publication number Publication date
CN100504399C (en) 2009-06-24
TWI375802B (en) 2012-11-01
WO2006043607A1 (en) 2006-04-27
JP2006118932A (en) 2006-05-11
CN101044407A (en) 2007-09-26
JP4395429B2 (en) 2010-01-06

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees