TW200624834A - Mass production type LED tester - Google Patents
Mass production type LED testerInfo
- Publication number
- TW200624834A TW200624834A TW094101183A TW94101183A TW200624834A TW 200624834 A TW200624834 A TW 200624834A TW 094101183 A TW094101183 A TW 094101183A TW 94101183 A TW94101183 A TW 94101183A TW 200624834 A TW200624834 A TW 200624834A
- Authority
- TW
- Taiwan
- Prior art keywords
- integrating sphere
- leds
- test
- mass production
- type led
- Prior art date
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Led Devices (AREA)
Abstract
A mass production type LED tester consists of a control module, at least an integrating sphere test module and at least a test board. The integrating sphere test module is connected to the control module and each integrating sphere test module has electrical and optical outputs and an optical input. The test boards are installed opposite to the integrating sphere test modules and there are plural LEDs on each test board. The optical input has a preset area opening and can cover a preset quantity of LEDs therein. The integrating sphere test module contains plural probes corresponding to the preset quantity of LEDs and can simultaneously probe the electrical characteristics of the preset quantity of LEDs, in a one-to-one contact fashion.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94101183A TWI258590B (en) | 2005-01-14 | 2005-01-14 | Mass-production light-emitting diode testing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94101183A TWI258590B (en) | 2005-01-14 | 2005-01-14 | Mass-production light-emitting diode testing device |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200624834A true TW200624834A (en) | 2006-07-16 |
TWI258590B TWI258590B (en) | 2006-07-21 |
Family
ID=37765349
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW94101183A TWI258590B (en) | 2005-01-14 | 2005-01-14 | Mass-production light-emitting diode testing device |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI258590B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102645276A (en) * | 2011-02-16 | 2012-08-22 | 台湾超微光学股份有限公司 | Spectrum sensing equipment, system and method |
CN116482505A (en) * | 2023-06-26 | 2023-07-25 | 东莞市亿晶源光电科技有限公司 | LED light-emitting module detection method and system |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010095810A2 (en) * | 2009-02-20 | 2010-08-26 | (주)큐엠씨 | Led chip classifying apparatus |
CN102032984B (en) * | 2009-09-25 | 2012-01-11 | 惠特科技股份有限公司 | Method for measuring properties of light of LED |
TW201237389A (en) * | 2011-03-15 | 2012-09-16 | Lextar Electronics Corp | Die inspection machine with multi-wave domain searching light source |
CN102435958B (en) * | 2011-10-24 | 2013-07-24 | 天津市中环电子计算机有限公司 | Pneumatic double-plate optical fiber tester for LED (Light Emitting Diode) indicating lamp |
-
2005
- 2005-01-14 TW TW94101183A patent/TWI258590B/en not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102645276A (en) * | 2011-02-16 | 2012-08-22 | 台湾超微光学股份有限公司 | Spectrum sensing equipment, system and method |
CN116482505A (en) * | 2023-06-26 | 2023-07-25 | 东莞市亿晶源光电科技有限公司 | LED light-emitting module detection method and system |
CN116482505B (en) * | 2023-06-26 | 2023-08-18 | 东莞市亿晶源光电科技有限公司 | LED light-emitting module detection method and system |
Also Published As
Publication number | Publication date |
---|---|
TWI258590B (en) | 2006-07-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW200624834A (en) | Mass production type LED tester | |
TW200602649A (en) | Parallel calibration system for a test device | |
TW200710412A (en) | Apparatus for testing electronic devices | |
SG134304A1 (en) | Surgical instrument having a feedback system | |
TW200704809A (en) | Test equipment of semiconductor devices | |
SG135138A1 (en) | Electronic device test set and contact used therein | |
TW200615556A (en) | Electronic component testing apparatus and method for configuring electronic component testing apparatus | |
TW201129814A (en) | Electrical connecting apparatus and testing system using the same | |
WO2008117664A1 (en) | Terahertz antenna module | |
TW200602644A (en) | Cantilever probe with dual plane fixutre and probe apparatus therewith | |
MY154575A (en) | Loaded printed circuit board test fixture and method for manufacturing the same | |
TW200739952A (en) | Light emitting device and illumination instrument | |
CN108732438A (en) | One kind being used for the measurement jig and method of general purpose I/O port | |
TW200801530A (en) | Air bridge structures and method of making and using air bridge structures | |
HK1163821A1 (en) | Contact-connection unit for a test apparatus for testing printed circuit boards | |
TW200721347A (en) | Film-type semiconductor package and method using test pads shared by output channels, and test device, semiconductor device and method using patterns shared by test channels | |
MY159941A (en) | Test adapter for computer chips | |
TW200730833A (en) | Test apparatus for holding signal terminals | |
MY143637A (en) | Test apparatus for the testing of electronic components | |
TW200510743A (en) | Test apparatus | |
CN204576255U (en) | A kind of high frequency electric source controller test fixture | |
DE50106269D1 (en) | MODULE FOR A TEST APPARATUS FOR TESTING PCB | |
CN206459764U (en) | A kind of circuit measured many places node temperature in charging pile | |
TW200642175A (en) | Method of testing ball grid array packed device in real system and test socket assembly therefor | |
RU2008102709A (en) | METHOD FOR SIMULATING ELECTRICAL AND INFORMATION INTERACTION OF ROCKET WITH CARRIER EQUIPMENT AND DEVICE FOR ITS IMPLEMENTATION |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |