TW200620185A - Electrostatic discharge integrated protection circuit with cell test function - Google Patents

Electrostatic discharge integrated protection circuit with cell test function

Info

Publication number
TW200620185A
TW200620185A TW093137871A TW93137871A TW200620185A TW 200620185 A TW200620185 A TW 200620185A TW 093137871 A TW093137871 A TW 093137871A TW 93137871 A TW93137871 A TW 93137871A TW 200620185 A TW200620185 A TW 200620185A
Authority
TW
Taiwan
Prior art keywords
thin film
film transistor
protection circuit
gate
source
Prior art date
Application number
TW093137871A
Other languages
Chinese (zh)
Other versions
TWI253605B (en
Inventor
Ja-Fu Tsai
Wen-Jun Wang
Original Assignee
Wintek Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wintek Corp filed Critical Wintek Corp
Priority to TW93137871A priority Critical patent/TWI253605B/en
Application granted granted Critical
Publication of TWI253605B publication Critical patent/TWI253605B/en
Publication of TW200620185A publication Critical patent/TW200620185A/en

Links

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Liquid Crystal (AREA)

Abstract

There is provided an electrostatic discharge (ESD) integrated protection circuit with cell test function. Each ESD unit protection circuit includes: a first thin film transistor short-circuited with the gate and drain of a second thin film transistor and connected to a signal line; a third thin film transistor having a gate connected to the source of the first thin film transistor, and a drain connected to the source of the second thin film transistor; a fourth thin film transistor short-circuited with the gate and drain of a fifth thin film transistor, and connected in combination with the source of the third thin film transistor to a common electrode; and a sixth thin film transistor having a drain connected to the source of the fourth thin film transistor. The source of the fifth thin film transistor is connected to the gate of the sixth thin film transistor, and the gate and drain of the sixth thin film transistor are connected to corresponding test switch pads respectively. The sixth thin film transistor is used as a thin film transistor (TFT) switch so as to construct the cell test function in the ESD unit protection circuit.
TW93137871A 2004-12-08 2004-12-08 Electrostatic discharge integrated protection circuit with cell test function TWI253605B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW93137871A TWI253605B (en) 2004-12-08 2004-12-08 Electrostatic discharge integrated protection circuit with cell test function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW93137871A TWI253605B (en) 2004-12-08 2004-12-08 Electrostatic discharge integrated protection circuit with cell test function

Publications (2)

Publication Number Publication Date
TWI253605B TWI253605B (en) 2006-04-21
TW200620185A true TW200620185A (en) 2006-06-16

Family

ID=37586666

Family Applications (1)

Application Number Title Priority Date Filing Date
TW93137871A TWI253605B (en) 2004-12-08 2004-12-08 Electrostatic discharge integrated protection circuit with cell test function

Country Status (1)

Country Link
TW (1) TWI253605B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105813365A (en) * 2016-05-23 2016-07-27 京东方科技集团股份有限公司 Static electricity protection circuit, display panel and display device
CN105976745A (en) * 2016-07-21 2016-09-28 武汉华星光电技术有限公司 Array substrate test circuit, display panel and flat panel display device

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI453517B (en) * 2008-08-26 2014-09-21 Chunghwa Picture Tubes Ltd Pixel array substrate of liquid crystal display
CN113834992A (en) * 2021-09-24 2021-12-24 昆山龙腾光电股份有限公司 Test circuit and display panel

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105813365A (en) * 2016-05-23 2016-07-27 京东方科技集团股份有限公司 Static electricity protection circuit, display panel and display device
CN105976745A (en) * 2016-07-21 2016-09-28 武汉华星光电技术有限公司 Array substrate test circuit, display panel and flat panel display device
CN105976745B (en) * 2016-07-21 2018-11-23 武汉华星光电技术有限公司 Array substrate tests circuit, display panel and flat display apparatus

Also Published As

Publication number Publication date
TWI253605B (en) 2006-04-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees