TW200620185A - Electrostatic discharge integrated protection circuit with cell test function - Google Patents
Electrostatic discharge integrated protection circuit with cell test functionInfo
- Publication number
- TW200620185A TW200620185A TW093137871A TW93137871A TW200620185A TW 200620185 A TW200620185 A TW 200620185A TW 093137871 A TW093137871 A TW 093137871A TW 93137871 A TW93137871 A TW 93137871A TW 200620185 A TW200620185 A TW 200620185A
- Authority
- TW
- Taiwan
- Prior art keywords
- thin film
- film transistor
- protection circuit
- gate
- source
- Prior art date
Links
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Liquid Crystal (AREA)
Abstract
There is provided an electrostatic discharge (ESD) integrated protection circuit with cell test function. Each ESD unit protection circuit includes: a first thin film transistor short-circuited with the gate and drain of a second thin film transistor and connected to a signal line; a third thin film transistor having a gate connected to the source of the first thin film transistor, and a drain connected to the source of the second thin film transistor; a fourth thin film transistor short-circuited with the gate and drain of a fifth thin film transistor, and connected in combination with the source of the third thin film transistor to a common electrode; and a sixth thin film transistor having a drain connected to the source of the fourth thin film transistor. The source of the fifth thin film transistor is connected to the gate of the sixth thin film transistor, and the gate and drain of the sixth thin film transistor are connected to corresponding test switch pads respectively. The sixth thin film transistor is used as a thin film transistor (TFT) switch so as to construct the cell test function in the ESD unit protection circuit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW93137871A TWI253605B (en) | 2004-12-08 | 2004-12-08 | Electrostatic discharge integrated protection circuit with cell test function |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW93137871A TWI253605B (en) | 2004-12-08 | 2004-12-08 | Electrostatic discharge integrated protection circuit with cell test function |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI253605B TWI253605B (en) | 2006-04-21 |
TW200620185A true TW200620185A (en) | 2006-06-16 |
Family
ID=37586666
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW93137871A TWI253605B (en) | 2004-12-08 | 2004-12-08 | Electrostatic discharge integrated protection circuit with cell test function |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI253605B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105813365A (en) * | 2016-05-23 | 2016-07-27 | 京东方科技集团股份有限公司 | Static electricity protection circuit, display panel and display device |
CN105976745A (en) * | 2016-07-21 | 2016-09-28 | 武汉华星光电技术有限公司 | Array substrate test circuit, display panel and flat panel display device |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI453517B (en) * | 2008-08-26 | 2014-09-21 | Chunghwa Picture Tubes Ltd | Pixel array substrate of liquid crystal display |
CN113834992A (en) * | 2021-09-24 | 2021-12-24 | 昆山龙腾光电股份有限公司 | Test circuit and display panel |
-
2004
- 2004-12-08 TW TW93137871A patent/TWI253605B/en not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105813365A (en) * | 2016-05-23 | 2016-07-27 | 京东方科技集团股份有限公司 | Static electricity protection circuit, display panel and display device |
CN105976745A (en) * | 2016-07-21 | 2016-09-28 | 武汉华星光电技术有限公司 | Array substrate test circuit, display panel and flat panel display device |
CN105976745B (en) * | 2016-07-21 | 2018-11-23 | 武汉华星光电技术有限公司 | Array substrate tests circuit, display panel and flat display apparatus |
Also Published As
Publication number | Publication date |
---|---|
TWI253605B (en) | 2006-04-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |