TW200615897A - Method and apparatus for testing TFT array - Google Patents

Method and apparatus for testing TFT array

Info

Publication number
TW200615897A
TW200615897A TW094125009A TW94125009A TW200615897A TW 200615897 A TW200615897 A TW 200615897A TW 094125009 A TW094125009 A TW 094125009A TW 94125009 A TW94125009 A TW 94125009A TW 200615897 A TW200615897 A TW 200615897A
Authority
TW
Taiwan
Prior art keywords
pixel selecting
drain
source
tft array
selecting transistor
Prior art date
Application number
TW094125009A
Other languages
English (en)
Inventor
Kiyoshi Chikamatsu
Kayoko Tajima
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of TW200615897A publication Critical patent/TW200615897A/zh

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/10Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00Aspects of the constitution of display devices
    • G09G2300/08Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809Several active elements per pixel in active matrix panels
    • G09G2300/0842Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00Control of display operating conditions
    • G09G2320/02Improving the quality of display appearance
    • G09G2320/0233Improving the luminance or brightness uniformity across the screen

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Electroluminescent Light Sources (AREA)
  • Control Of El Displays (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW094125009A 2004-08-13 2005-07-22 Method and apparatus for testing TFT array TW200615897A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004236090A JP2006053439A (ja) 2004-08-13 2004-08-13 Tftアレイ試験方法および試験装置

Publications (1)

Publication Number Publication Date
TW200615897A true TW200615897A (en) 2006-05-16

Family

ID=35799369

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094125009A TW200615897A (en) 2004-08-13 2005-07-22 Method and apparatus for testing TFT array

Country Status (5)

Country Link
US (1) US20060033447A1 (zh)
JP (1) JP2006053439A (zh)
KR (1) KR20060050394A (zh)
CN (1) CN1734273A (zh)
TW (1) TW200615897A (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100938675B1 (ko) * 2007-12-17 2010-01-25 한국전자통신연구원 박막 트랜지스터의 소스-드레인 전류 모델링 방법 및 장치
CN106932456B (zh) * 2010-06-30 2020-02-21 生命科技公司 用于测试isfet阵列的方法和装置
CN103185842B (zh) * 2011-12-29 2015-03-11 北京大学 用于测量大规模阵列器件统计涨落的电路

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100324914B1 (ko) * 1998-09-25 2002-02-28 니시무로 타이죠 기판의 검사방법
JP3437152B2 (ja) * 2000-07-28 2003-08-18 ウインテスト株式会社 有機elディスプレイの評価装置および評価方法
JP3701924B2 (ja) * 2002-03-29 2005-10-05 インターナショナル・ビジネス・マシーンズ・コーポレーション Elアレイ基板の検査方法及びその検査装置
JP3527726B2 (ja) * 2002-05-21 2004-05-17 ウインテスト株式会社 アクティブマトリクス基板の検査方法及び検査装置

Also Published As

Publication number Publication date
JP2006053439A (ja) 2006-02-23
CN1734273A (zh) 2006-02-15
US20060033447A1 (en) 2006-02-16
KR20060050394A (ko) 2006-05-19

Similar Documents

Publication Publication Date Title
US11705069B2 (en) Data voltage compensation method, a display driving method, and a display apparatus
US10249239B2 (en) Driving circuit of pixel unit and driving method thereof, and display device
KR101125595B1 (ko) 화소회로, 발광표시장치 및 그 구동방법
US8847942B2 (en) Method and circuit for compensating pixel drift in active matrix displays
WO2016150079A1 (zh) Oled显示装置和用于矫正oled显示装置的残像的方法
TW200609891A (en) Display device and driving method thereof
CN101740606B (zh) 有机电致发光显示器件及其驱动方法
JP2011523720A5 (zh)
TW200620179A (en) Drive circuit and display apparatus
EP2660867A3 (en) Testing circuit, wafer, measuring apparatus, device manufacturing method and display device
EP1756799A4 (en) LIQUID CRYSTAL DISPLAY DEVICE, METHOD FOR EXCITATION THEREOF, LIQUID CRYSTAL TELEVISION COMPRISING LIQUID CRYSTAL DISPLAY DEVICE, AND LIQUID CRYSTAL DISPLAY COMPRISING THE LIQUID CRYSTAL DISPLAY DEVICE
WO2004066250A8 (en) Active matrix electroluminescent display devices
TW201003607A (en) Display apparatus, driving method for display apparatus and electronic apparatus
WO2020207117A9 (zh) 检测方法、驱动方法、显示装置和补偿查找表的构建方法
US20190197978A1 (en) Scan signal compensating method, scan signal compensating circuit and display device
Kim et al. Short channel amorphous In–Ga–Zn–O thin-film transistor arrays for ultra-high definition active matrix liquid crystal displays: Electrical properties and stability
CN1873489B (zh) 液晶显示器的制造方法、液晶显示器、以及老化***
TW200615897A (en) Method and apparatus for testing TFT array
US7486100B2 (en) Active matrix panel inspection device and inspection method
TW200620674A (en) Method and apparatus for testing TFT array
TW200609870A (en) System for manufacturing display panel, method to be used in same, and testing apparatus therefore
RU2016123717A (ru) Способ и система для компенсации цветовых оттенков на панели жидкокристаллического дисплея
JP2010243644A (ja) 表示装置、および検査装置
Pappas et al. A new threshold‐voltage compensation technique of poly‐Si TFTs for AMOLED display pixel circuits
KR102189444B1 (ko) 박막트랜지스터의 누설전류 측정방법