TW200519473A - Inspection device and method of polarizer - Google Patents
Inspection device and method of polarizerInfo
- Publication number
- TW200519473A TW200519473A TW094101399A TW94101399A TW200519473A TW 200519473 A TW200519473 A TW 200519473A TW 094101399 A TW094101399 A TW 094101399A TW 94101399 A TW94101399 A TW 94101399A TW 200519473 A TW200519473 A TW 200519473A
- Authority
- TW
- Taiwan
- Prior art keywords
- polarizer
- monochrome light
- inspection device
- receiving module
- polarization
- Prior art date
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Liquid Crystal (AREA)
Abstract
The present invention relates to an inspection device of polarizer and method thereof. A inspection device includes a monochrome light generation device capable of providing a monochrome light source, an optical receiving module for corresponding to the monochrome light generation device to convert an optical signal of the monochrome light source into an analyzable data, and an adjustment base disposed between the monochrome light and the optical receiving module to carry a polarizer to be inspected. After the monochrome light passes through the polarizer to be inspected, it is received by the optical receiving module for inspection. The polarizer inspection device further includes a fixing base where is located between the monochrome light generation device and the adjustment base for carrying a polarization polarizer such that the monochrome light passes through the polarization polarizer and generates the monochrome light with polarization.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094101399A TW200519473A (en) | 2005-01-18 | 2005-01-18 | Inspection device and method of polarizer |
JP2005244422A JP2006201152A (en) | 2005-01-18 | 2005-08-25 | Device and method for measuring polarizing plate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094101399A TW200519473A (en) | 2005-01-18 | 2005-01-18 | Inspection device and method of polarizer |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200519473A true TW200519473A (en) | 2005-06-16 |
Family
ID=36959267
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094101399A TW200519473A (en) | 2005-01-18 | 2005-01-18 | Inspection device and method of polarizer |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2006201152A (en) |
TW (1) | TW200519473A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102279094A (en) * | 2011-03-16 | 2011-12-14 | 中国科学院上海技术物理研究所 | Apparatus and method for calibrating transmission axis of polaroid |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011074806A2 (en) * | 2009-12-18 | 2011-06-23 | 주식회사 이테크넷 | Substrate inspection apparatus and substrate inspection method using same |
KR100975645B1 (en) | 2009-12-18 | 2010-08-17 | 주식회사 이테크넷 | Appartus for inspecting substrate and method using the same |
WO2017061419A1 (en) * | 2015-10-08 | 2017-04-13 | シャープ株式会社 | Polarization axis detecting device, polarization axis detecting method, display device manufacturing method, and display device manufactured using same |
CN108020843A (en) * | 2017-12-13 | 2018-05-11 | 苏州科瓴精密机械科技有限公司 | Automatic running device and automatic running device alignment system |
JP7314026B2 (en) * | 2019-11-14 | 2023-07-25 | 東芝テック株式会社 | Detection device and substrate |
CN111766732B (en) * | 2020-07-30 | 2023-04-11 | 京东方科技集团股份有限公司 | Display panel, manufacturing method thereof and display device |
-
2005
- 2005-01-18 TW TW094101399A patent/TW200519473A/en unknown
- 2005-08-25 JP JP2005244422A patent/JP2006201152A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102279094A (en) * | 2011-03-16 | 2011-12-14 | 中国科学院上海技术物理研究所 | Apparatus and method for calibrating transmission axis of polaroid |
Also Published As
Publication number | Publication date |
---|---|
JP2006201152A (en) | 2006-08-03 |
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