TW200514968A - Transducer-based sensor system and method - Google Patents

Transducer-based sensor system and method

Info

Publication number
TW200514968A
TW200514968A TW093115522A TW93115522A TW200514968A TW 200514968 A TW200514968 A TW 200514968A TW 093115522 A TW093115522 A TW 093115522A TW 93115522 A TW93115522 A TW 93115522A TW 200514968 A TW200514968 A TW 200514968A
Authority
TW
Taiwan
Prior art keywords
transducer
binding partner
immobilized binding
drive signal
sample
Prior art date
Application number
TW093115522A
Other languages
English (en)
Other versions
TWI266864B (en
Inventor
Daniel R Blakley
Original Assignee
Hewlett Packard Development Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Development Co filed Critical Hewlett Packard Development Co
Publication of TW200514968A publication Critical patent/TW200514968A/zh
Application granted granted Critical
Publication of TWI266864B publication Critical patent/TWI266864B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02—Analysing fluids
    • G01N29/022—Fluid sensors based on microsensors, e.g. quartz crystal-microbalance [QCM], surface acoustic wave [SAW] devices, tuning forks, cantilevers, flexural plate wave [FPW] devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/40—Detecting the response signal, e.g. electronic circuits specially adapted therefor by amplitude filtering, e.g. by applying a threshold or by gain control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/014—Resonance or resonant frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/015—Attenuation, scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/025—Change of phase or condition
    • G01N2291/0255—(Bio)chemical reactions, e.g. on biosensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/025—Change of phase or condition
    • G01N2291/0256—Adsorption, desorption, surface mass change, e.g. on biosensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/0289—Internal structure, e.g. defects, grain size, texture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0426—Bulk waves, e.g. quartz crystal microbalance, torsional waves

Landscapes

  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
TW093115522A 2003-10-31 2004-05-31 Method of performing rupture event scanning and transducer-based sensor system TWI266864B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/698,834 US6978656B2 (en) 2003-10-31 2003-10-31 Transducer-based sensor system and method

Publications (2)

Publication Number Publication Date
TW200514968A true TW200514968A (en) 2005-05-01
TWI266864B TWI266864B (en) 2006-11-21

Family

ID=34423425

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093115522A TWI266864B (en) 2003-10-31 2004-05-31 Method of performing rupture event scanning and transducer-based sensor system

Country Status (6)

Country Link
US (1) US6978656B2 (zh)
EP (1) EP1528394A3 (zh)
JP (1) JP4129450B2 (zh)
KR (1) KR20050041915A (zh)
CA (1) CA2486295A1 (zh)
TW (1) TWI266864B (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7570125B2 (en) * 2003-04-17 2009-08-04 Akubio Limited Crystal oscillator
US7130727B2 (en) * 2003-12-05 2006-10-31 Full-View-Matic, Inc. Vehicle safety system having methods and apparatus configurable for various vehicle geometries
JP4487662B2 (ja) * 2004-07-12 2010-06-23 セイコーエプソン株式会社 圧電アクチュエータの駆動方法、圧電アクチュエータの駆動装置、電子機器
US20060179918A1 (en) * 2005-02-15 2006-08-17 Honeywell International Gas chromatograph and quartz crystal microbalance sensor apparatus
FR2905277B1 (fr) * 2006-08-29 2009-04-17 Centre Nat Rech Scient Dispositif de traitement volumique de tissus biologiques
BRPI1014254A2 (pt) * 2009-04-10 2016-04-12 Prad Res & Dev Ltd sistema de fundo de poço configurado para operação de fundo de poço, dentro de um poço, ferramentaconfigurada para ser posicionada no fundo do poço para amostragem e caracterização de fluidos de formação localizaos em um reservatório petrolífero no fundo de poço, sistema para caracterização de fluidos em fundo de poço configurado para operação em fundo de poço, sistema configurado para operação em fundo de poço, em um ou mais poços, e método de caracterização de fluidos de formação em fundo de poço utilizando uma ferramenta para fundo de poço.
US9331656B1 (en) * 2010-06-17 2016-05-03 Steven M. Gottlieb Audio systems and methods employing an array of transducers optimized for particular sound frequencies
US10133702B2 (en) * 2015-03-16 2018-11-20 Rockwell Automation Technologies, Inc. System and method for determining sensor margins and/or diagnostic information for a sensor
US10730744B2 (en) 2018-12-28 2020-08-04 Industrial Technology Research Institute MEMS device with movable stage

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3582838A (en) * 1966-09-27 1971-06-01 Zenith Radio Corp Surface wave devices
US3983424A (en) * 1973-10-03 1976-09-28 The University Of Southern California Radiation detector employing acoustic surface waves
US4055072A (en) * 1975-09-19 1977-10-25 Nasa Apparatus for measuring a sorbate dispersed in a fluid stream
JPS5540967A (en) 1978-09-18 1980-03-22 Toshiba Corp Surface acoustic wave unit
US4788466A (en) * 1987-11-09 1988-11-29 University Of Arkansas Piezoelectric sensor Q-loss compensation
US5201215A (en) * 1991-10-17 1993-04-13 The United States Of America As Represented By The United States Department Of Energy Method for simultaneous measurement of mass loading and fluid property changes using a quartz crystal microbalance
JP3315984B2 (ja) * 1992-01-03 2002-08-19 シーメンス アクチエンゲゼルシヤフト 無線で問い合わせ可能な受動的表面波センサ
JPH0750548A (ja) * 1993-05-31 1995-02-21 Canon Inc 弾性表面波素子
EP0647022A3 (en) * 1993-10-05 1996-10-02 Matsushita Electric Ind Co Ltd Surface-semiconductor acoustic wave composite device.
US5719324A (en) * 1995-06-16 1998-02-17 Lockheed Martin Energy Systems, Inc. Microcantilever sensor
US6167748B1 (en) * 1998-08-31 2001-01-02 Lockheed Martin Energy Research Corporation Capacitively readout multi-element sensor array with common-mode cancellation
GB9823410D0 (en) * 1998-10-26 1998-12-23 Smithkline Beecham Plc Novel device
US6289717B1 (en) * 1999-03-30 2001-09-18 U. T. Battelle, Llc Micromechanical antibody sensor
GB9909308D0 (en) 1999-04-22 1999-06-16 Univ Cambridge Tech Measurement and use of molecular interactions
JP2001257554A (ja) * 2000-01-07 2001-09-21 Tdk Corp 弾性表面波装置
US6848295B2 (en) * 2002-04-17 2005-02-01 Wayne State University Acoustic wave sensor apparatus, method and system using wide bandgap materials
US6826949B1 (en) * 2003-06-13 2004-12-07 Becton, Dickinson And Company Method and apparatus for guiding a liquid sample towards a sensing surface

Also Published As

Publication number Publication date
EP1528394A3 (en) 2007-08-29
JP2005134386A (ja) 2005-05-26
JP4129450B2 (ja) 2008-08-06
TWI266864B (en) 2006-11-21
US6978656B2 (en) 2005-12-27
US20050092088A1 (en) 2005-05-05
EP1528394A2 (en) 2005-05-04
CA2486295A1 (en) 2005-04-30
KR20050041915A (ko) 2005-05-04

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees