SU1433333A1 - Device for measurement of surface photo-emf of semiconductors - Google Patents
Device for measurement of surface photo-emf of semiconductorsInfo
- Publication number
- SU1433333A1 SU1433333A1 SU4098373/25A SU4098373A SU1433333A1 SU 1433333 A1 SU1433333 A1 SU 1433333A1 SU 4098373/25 A SU4098373/25 A SU 4098373/25A SU 4098373 A SU4098373 A SU 4098373A SU 1433333 A1 SU1433333 A1 SU 1433333A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- output
- input
- controlled
- electronic switch
- controlled electronic
- Prior art date
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
FIELD: semiconductor technology. SUBSTANCE: the device has pulsed light source 1, capacitor cell 2 with a semitransparent electrode, pulse amplifier 3, indicator 4, synchronizer 5, test pulse generator 6, first controlled commutator 7 with reversal of output voltage polarity, second controlled commutators with reversal of output voltage polarity, comparison circuit 9, reference signal unit 10, comparator 11, resistor 12, first controlled electronic switch 13, second controlled electronic switch 14 and third controlled electronic switch 15. The pulse amplifier is made controllable, and its control input is connected to the comparison circuit output, and the output is additionally connected to the comparator input, whose output is connected to the control inputs of the first and second commutators. The inputs of the second and third controlled electronic switches are connected via the semitransparent electrode of the capacitor cell. The output of the third controlled electronic switch is connected to the input of the pulse amplifier. The synchronizer first output is connected to the synchronizing input of the test pulse generator, the second input - to the control inputs of all electronic switches, and the third output - to the synchronizing input of the pulsed light source. EFFECT: enhanced accuracy of measurement of value and determination of polarity of surface photo-emf. 1 dwg
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU4098373/25A SU1433333A1 (en) | 1986-07-30 | 1986-07-30 | Device for measurement of surface photo-emf of semiconductors |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU4098373/25A SU1433333A1 (en) | 1986-07-30 | 1986-07-30 | Device for measurement of surface photo-emf of semiconductors |
Publications (1)
Publication Number | Publication Date |
---|---|
SU1433333A1 true SU1433333A1 (en) | 1994-06-15 |
Family
ID=60536091
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU4098373/25A SU1433333A1 (en) | 1986-07-30 | 1986-07-30 | Device for measurement of surface photo-emf of semiconductors |
Country Status (1)
Country | Link |
---|---|
SU (1) | SU1433333A1 (en) |
-
1986
- 1986-07-30 SU SU4098373/25A patent/SU1433333A1/en active
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