SG99412A1 - Probe contact apparatus for display panel inspection - Google Patents
Probe contact apparatus for display panel inspectionInfo
- Publication number
- SG99412A1 SG99412A1 SG200206788A SG200206788A SG99412A1 SG 99412 A1 SG99412 A1 SG 99412A1 SG 200206788 A SG200206788 A SG 200206788A SG 200206788 A SG200206788 A SG 200206788A SG 99412 A1 SG99412 A1 SG 99412A1
- Authority
- SG
- Singapore
- Prior art keywords
- display panel
- carrying leg
- press block
- probe
- probe contact
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/94—Holders formed as intermediate parts for linking a counter-part to a coupling part
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Liquid Crystal (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
<P>PROBLEM TO BE SOLVED: To miniaturize a probe contact device when inspecting a display panel. <P>SOLUTION: A plurality of probes 22a are provided on the tip of a probe carrying leg 14, and a press block carrying leg 16 for opening and closing relatively to the probe carrying leg 14 is provided. A press block 24 provided on the tip of the press block carrying leg 16 faces relatively to the probes 22a across the display panel 12 with a prescribed pressing force. Hereby, the relative pressing force between the probe carrying leg 14 and the press block carrying leg 16 is never applied to a support part or the display panel. <P>COPYRIGHT: (C)2004,JPO
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002106557A JP2003302439A (en) | 2002-04-09 | 2002-04-09 | Probe contact device for display panel inspection |
Publications (1)
Publication Number | Publication Date |
---|---|
SG99412A1 true SG99412A1 (en) | 2003-10-27 |
Family
ID=28786431
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200206788A SG99412A1 (en) | 2002-04-09 | 2002-11-11 | Probe contact apparatus for display panel inspection |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP2003302439A (en) |
KR (1) | KR100525818B1 (en) |
CN (1) | CN1450356A (en) |
SG (1) | SG99412A1 (en) |
TW (1) | TW200305023A (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100740010B1 (en) * | 2005-11-18 | 2007-07-16 | 주식회사 파이컴 | Inspecting system of flat panel display |
KR100768713B1 (en) * | 2006-05-04 | 2007-10-19 | 주식회사 대우일렉트로닉스 | Test device of organic electro display panel |
KR100768712B1 (en) * | 2006-05-04 | 2007-10-19 | 주식회사 대우일렉트로닉스 | Test device of organic electro display panel |
JP4808135B2 (en) * | 2006-11-09 | 2011-11-02 | 株式会社日本マイクロニクス | Probe positioning method, movable probe unit mechanism, and inspection apparatus |
KR102171682B1 (en) * | 2019-08-07 | 2020-10-30 | 주식회사 디엠엔티 | Detachment device of probe block for display panel inspection |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10302640A (en) * | 1997-04-25 | 1998-11-13 | Osaki Eng Kk | Plasma display panel lighting inspection device |
JP2000147044A (en) * | 1998-11-17 | 2000-05-26 | Micronics Japan Co Ltd | Device and method for inspecting plate-shaped object to be inspected |
JP2001050858A (en) * | 1999-08-04 | 2001-02-23 | Micronics Japan Co Ltd | Inspection apparatus for display panel board |
JP2001059972A (en) * | 1999-08-24 | 2001-03-06 | Ricoh Co Ltd | Device for lighting and inspecting liquid crystal display panel |
JP2001318116A (en) * | 2000-05-11 | 2001-11-16 | Micronics Japan Co Ltd | Inspection apparatus for display panel board |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09127154A (en) * | 1995-10-31 | 1997-05-16 | Oki Electric Ind Co Ltd | Probe positioner device |
JP3958875B2 (en) * | 1998-07-24 | 2007-08-15 | 株式会社日本マイクロニクス | Prober and probe needle contact method |
KR100350513B1 (en) * | 2000-04-03 | 2002-08-28 | 박태욱 | Probe apparatus testing an electrode of Plasma Display Panel |
JP3569486B2 (en) * | 2000-07-14 | 2004-09-22 | シャープ株式会社 | Inspection probe device |
-
2002
- 2002-04-09 JP JP2002106557A patent/JP2003302439A/en active Pending
- 2002-11-04 TW TW091132467A patent/TW200305023A/en unknown
- 2002-11-11 SG SG200206788A patent/SG99412A1/en unknown
- 2002-11-22 KR KR10-2002-0073186A patent/KR100525818B1/en not_active IP Right Cessation
- 2002-11-27 CN CN02153626A patent/CN1450356A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10302640A (en) * | 1997-04-25 | 1998-11-13 | Osaki Eng Kk | Plasma display panel lighting inspection device |
JP2000147044A (en) * | 1998-11-17 | 2000-05-26 | Micronics Japan Co Ltd | Device and method for inspecting plate-shaped object to be inspected |
JP2001050858A (en) * | 1999-08-04 | 2001-02-23 | Micronics Japan Co Ltd | Inspection apparatus for display panel board |
JP2001059972A (en) * | 1999-08-24 | 2001-03-06 | Ricoh Co Ltd | Device for lighting and inspecting liquid crystal display panel |
JP2001318116A (en) * | 2000-05-11 | 2001-11-16 | Micronics Japan Co Ltd | Inspection apparatus for display panel board |
Also Published As
Publication number | Publication date |
---|---|
JP2003302439A (en) | 2003-10-24 |
KR100525818B1 (en) | 2005-11-03 |
CN1450356A (en) | 2003-10-22 |
KR20030080986A (en) | 2003-10-17 |
TW200305023A (en) | 2003-10-16 |
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