SG11202102625VA - Semiconductor memory device - Google Patents
Semiconductor memory deviceInfo
- Publication number
- SG11202102625VA SG11202102625VA SG11202102625VA SG11202102625VA SG11202102625VA SG 11202102625V A SG11202102625V A SG 11202102625VA SG 11202102625V A SG11202102625V A SG 11202102625VA SG 11202102625V A SG11202102625V A SG 11202102625VA SG 11202102625V A SG11202102625V A SG 11202102625VA
- Authority
- SG
- Singapore
- Prior art keywords
- memory device
- semiconductor memory
- semiconductor
- memory
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
- G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3436—Arrangements for verifying correct programming or erasure
- G11C16/344—Arrangements for verifying correct erasure or for detecting overerased cells
- G11C16/3445—Circuits or methods to verify correct erasure of nonvolatile memory cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/32—Timing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
- G11C2216/12—Reading and writing aspects of erasable programmable read-only memories
- G11C2216/20—Suspension of programming or erasing cells in an array in order to read other cells in it
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2018/041195 WO2020095361A1 (en) | 2018-11-06 | 2018-11-06 | Semiconductor storage device |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202102625VA true SG11202102625VA (en) | 2021-04-29 |
Family
ID=70611763
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202102625VA SG11202102625VA (en) | 2018-11-06 | 2018-11-06 | Semiconductor memory device |
Country Status (6)
Country | Link |
---|---|
US (3) | US11532363B2 (en) |
JP (1) | JP7105911B2 (en) |
CN (1) | CN112655044B (en) |
SG (1) | SG11202102625VA (en) |
TW (3) | TWI786714B (en) |
WO (1) | WO2020095361A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112655044B (en) * | 2018-11-06 | 2023-12-19 | 铠侠股份有限公司 | Semiconductor memory device with a memory cell having a memory cell with a memory cell having a memory cell |
KR20210106119A (en) * | 2020-02-20 | 2021-08-30 | 에스케이하이닉스 주식회사 | Memory system |
JP2022128812A (en) * | 2021-02-24 | 2022-09-05 | キオクシア株式会社 | semiconductor storage device |
JP2023141561A (en) * | 2022-03-24 | 2023-10-05 | キオクシア株式会社 | semiconductor storage device |
Family Cites Families (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5822244A (en) * | 1997-09-24 | 1998-10-13 | Motorola, Inc. | Method and apparatus for suspending a program/erase operation in a flash memory |
JP4004811B2 (en) * | 2002-02-06 | 2007-11-07 | 株式会社東芝 | Nonvolatile semiconductor memory device |
JP2004348788A (en) | 2003-05-20 | 2004-12-09 | Sharp Corp | Semiconductor memory device and portable electronic equipment |
US7099226B2 (en) * | 2003-10-14 | 2006-08-29 | Atmel Corporation | Functional register decoding system for multiple plane operation |
JP2006286048A (en) * | 2005-03-31 | 2006-10-19 | Toshiba Corp | Semiconductor memory device |
US7562180B2 (en) * | 2006-03-28 | 2009-07-14 | Nokia Corporation | Method and device for reduced read latency of non-volatile memory |
JP2009032324A (en) | 2007-07-26 | 2009-02-12 | Spansion Llc | Nonvolatile storage device equipped with two or more memory blocks |
JP5142692B2 (en) | 2007-12-11 | 2013-02-13 | 株式会社東芝 | Nonvolatile semiconductor memory device |
JP2009158015A (en) * | 2007-12-26 | 2009-07-16 | Toshiba Corp | Nonvolatile semiconductor storage device |
US8068365B2 (en) | 2008-02-04 | 2011-11-29 | Mosaid Technologies Incorporated | Non-volatile memory device having configurable page size |
JP2009238874A (en) | 2008-03-26 | 2009-10-15 | Toshiba Corp | Semiconductor memory and method for manufacturing the same |
JP5283960B2 (en) | 2008-04-23 | 2013-09-04 | 株式会社東芝 | Three-dimensional stacked nonvolatile semiconductor memory |
JP2009266944A (en) | 2008-04-23 | 2009-11-12 | Toshiba Corp | Three-dimensional stacked nonvolatile semiconductor memory |
JP2010199235A (en) | 2009-02-24 | 2010-09-09 | Toshiba Corp | Nonvolatile semiconductor storage device |
JP2011044222A (en) | 2009-07-22 | 2011-03-03 | Toshiba Corp | Nand type flash memory |
JP5378326B2 (en) * | 2010-08-17 | 2013-12-25 | 株式会社東芝 | Nonvolatile semiconductor memory device and control method thereof |
JP2012069205A (en) | 2010-09-22 | 2012-04-05 | Toshiba Corp | Nonvolatile semiconductor memory |
KR101903095B1 (en) * | 2011-11-21 | 2018-10-02 | 삼성전자주식회사 | Nonvolatile memory device and oeprating method of controller controlling nonvolailte memory device |
JP2013232263A (en) | 2012-04-27 | 2013-11-14 | Toshiba Corp | Semiconductor memory |
US9910594B2 (en) | 2015-11-05 | 2018-03-06 | Micron Technology, Inc. | Apparatuses and methods for concurrently accessing multiple memory planes of a memory during a memory access operation |
JP6538597B2 (en) * | 2016-03-14 | 2019-07-03 | 東芝メモリ株式会社 | Storage device |
US10203884B2 (en) * | 2016-03-30 | 2019-02-12 | Intel Corporation | Methods and apparatus to perform erase-suspend operations in memory devices |
JP2017212021A (en) * | 2016-05-24 | 2017-11-30 | 東芝メモリ株式会社 | Semiconductor memory |
WO2018011926A1 (en) | 2016-07-13 | 2018-01-18 | 東芝メモリ株式会社 | Storage device |
JP6659494B2 (en) * | 2016-08-19 | 2020-03-04 | キオクシア株式会社 | Semiconductor storage device and memory system |
JP2018045741A (en) * | 2016-09-12 | 2018-03-22 | 東芝メモリ株式会社 | Semiconductor storage device and memory system |
KR20180050862A (en) * | 2016-11-07 | 2018-05-16 | 에스케이하이닉스 주식회사 | Memory system and operating method thereof |
KR102580945B1 (en) * | 2016-11-17 | 2023-09-20 | 삼성전자주식회사 | Non-volatile memory device including decoupling circuit |
JP6783682B2 (en) | 2017-02-27 | 2020-11-11 | キオクシア株式会社 | Semiconductor storage and memory system |
CN112655044B (en) * | 2018-11-06 | 2023-12-19 | 铠侠股份有限公司 | Semiconductor memory device with a memory cell having a memory cell with a memory cell having a memory cell |
JP7195913B2 (en) | 2018-12-19 | 2022-12-26 | キオクシア株式会社 | semiconductor storage device |
JP7159036B2 (en) | 2018-12-25 | 2022-10-24 | キオクシア株式会社 | memory device |
JP2021174565A (en) | 2020-04-24 | 2021-11-01 | キオクシア株式会社 | Semiconductor storage device |
-
2018
- 2018-11-06 CN CN201880097194.8A patent/CN112655044B/en active Active
- 2018-11-06 WO PCT/JP2018/041195 patent/WO2020095361A1/en active Application Filing
- 2018-11-06 SG SG11202102625VA patent/SG11202102625VA/en unknown
- 2018-11-06 JP JP2020556385A patent/JP7105911B2/en active Active
-
2019
- 2019-02-27 TW TW110124992A patent/TWI786714B/en active
- 2019-02-27 TW TW108106688A patent/TWI735848B/en active
- 2019-02-27 TW TW111143188A patent/TWI817826B/en active
-
2021
- 2021-03-15 US US17/200,996 patent/US11532363B2/en active Active
-
2022
- 2022-10-26 US US17/973,549 patent/US11783899B2/en active Active
-
2023
- 2023-09-07 US US18/243,258 patent/US20230420054A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
US20210202007A1 (en) | 2021-07-01 |
US20230420054A1 (en) | 2023-12-28 |
JP7105911B2 (en) | 2022-07-25 |
US20230052383A1 (en) | 2023-02-16 |
CN112655044B (en) | 2023-12-19 |
WO2020095361A1 (en) | 2020-05-14 |
TWI817826B (en) | 2023-10-01 |
TW202018720A (en) | 2020-05-16 |
TWI735848B (en) | 2021-08-11 |
US11532363B2 (en) | 2022-12-20 |
TWI786714B (en) | 2022-12-11 |
JPWO2020095361A1 (en) | 2021-09-02 |
TW202329130A (en) | 2023-07-16 |
CN112655044A (en) | 2021-04-13 |
US11783899B2 (en) | 2023-10-10 |
TW202207235A (en) | 2022-02-16 |
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